USB interface life plug-in test fixture
By introducing buffering and clamping mechanisms into the USB interface lifespan plug-in/plug-out test fixture, the problem of physical damage to the USB interface during plug-in/plug-out testing is solved, thereby improving the durability and reliability of the equipment.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN SCIENCE & TECHNOLOGY INSPECTION & TESTING SERVICES CO LTD
- Filing Date
- 2025-07-31
- Publication Date
- 2026-05-26
AI Technical Summary
Existing USB interface lifespan plug-in/plug-out test fixtures lack a buffer structure in their design, which can cause misalignment and impact between the plug and the interface, resulting in equipment vibration and permanent damage.
A USB interface life insertion and removal test fixture including a buffer mechanism and a clamping mechanism was designed. The buffer mechanism absorbs the impact force through elastic deformation, and the clamping mechanism prevents vibration displacement, thus protecting the USB interface and the test mold.
It effectively protects the integrity of the USB interface plating and pins, prevents device vibration, and extends the device's lifespan.
Smart Images

Figure CN224286367U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of insertion and removal test fixtures, and specifically relates to a USB interface life insertion and removal test fixture. Background Technology
[0002] A USB interface lifespan insertion / removal test fixture is a testing device used to simulate repeated insertion and removal of USB interfaces in actual use, aiming to evaluate the durability and reliability of USB interfaces. However, if the fixture lacks a buffer structure in its design, it will have significant drawbacks in actual use. When the USB interface enters the fatigue stage during the test, the plug-in may undergo slight deformation due to long-term stress, leading to a decrease in alignment accuracy. At this time, if the fixture lacks a buffer mechanism and cannot provide fault tolerance space through elastic deformation, the misalignment between the plug-in and the interface will cause the plug-in to collide with the interface, causing the entire device to vibrate and causing permanent damage to the interface structure. Therefore, we hope to design a USB interface lifespan insertion / removal test fixture to solve this problem. Utility Model Content
[0003] In view of the shortcomings of the existing technology, the purpose of this utility model is to provide a USB interface lifespan plug-in / plug-out test fixture to solve the problems mentioned in the background technology.
[0004] This utility model is achieved through the following technical solution: a USB interface life insertion and removal test fixture, comprising: a base, an mounting plate fixedly connected to the upper end of the base, a test cylinder fixedly mounted on the lower end of the mounting plate, a buffer mechanism provided at the telescopic end of the test cylinder, a mold groove fixedly connected to the upper surface of the base, a clamping mechanism provided inside the base, and a test mold provided inside the mold groove through the clamping mechanism.
[0005] The buffer mechanism includes a mounting block, which is fixedly connected to the telescopic end of the test cylinder. A groove is formed on the upper surface of the mounting block, and a slide rail is fixedly connected inside the groove. A slider is slidably sleeved on the outside of the slide rail, and a spring is also provided on the outside of the slide rail. By setting up the buffer mechanism, the impact force can be effectively absorbed during the insertion and removal process, avoiding physical damage to the USB interface caused by the instantaneous contact during insertion and removal. When the plug-in becomes fatigued during the testing stage and cannot be aligned due to deformation, the buffer mechanism can provide fault tolerance space through elasticity, reduce the hard impact force and avoid vibration of the entire device. This protects the integrity of the USB interface plating and pins, as well as the test mold interface, and extends the service life of the device.
[0006] In a preferred embodiment, one end of the spring is fixedly connected to the inner wall of the groove, and the other end of the spring is fixedly connected to the slider.
[0007] In a preferred embodiment, a support plate is fixedly connected to the upper end of the slider, a U-shaped frame is fixedly connected to the support plate, a threaded rod is threaded through the inside of the U-shaped frame, and a pressure plate is sleeved at the lower end of the threaded rod through a bearing.
[0008] In a preferred embodiment, the contact surfaces of the support plate, pressure plate, and mold groove are all provided with anti-slip rubber pads.
[0009] In a preferred embodiment, the clamping mechanism includes a support rod. The left end of the support rod is sleeved inside the base through a bearing, and the right end passes through the base through a bearing. Both ends of the support rod are provided with clamping threads. A clamping block is screwed onto the outside of the support rod through the threads. By setting up the clamping mechanism, vibration during the testing process is prevented from causing the test mold to vibrate and shift, which would lead to the insertion not being aligned.
[0010] In a preferred embodiment, the thread paths of the two clamping threads are opposite, so that the clamping blocks can move in opposite directions or in opposite directions.
[0011] In a preferred embodiment, the clamping mechanism further includes a telescopic rod, one end of which is fixedly connected to the inner wall of the base, and the telescopic end of which is fixedly connected to the outer surface of the clamping block.
[0012] In a preferred embodiment, a rubber pad for increasing surface friction is fixedly connected to the inner surface of the clamping block.
[0013] After adopting the above technical solution, the beneficial effects of this utility model are:
[0014] 1. By setting up a buffer mechanism, the impact force can be effectively absorbed during the insertion and removal process, avoiding physical damage to the USB interface caused by the instantaneous contact during insertion and removal. When the plug-in becomes fatigued during the testing phase and cannot be aligned due to deformation, the buffer mechanism can provide fault tolerance space through elasticity, reduce hard impact force and avoid vibration of the whole device, thus protecting the integrity of the USB interface plating and pins, as well as the test mold interface, and extending the service life of the device.
[0015] 2. By setting up a clamping mechanism, vibration during the testing process is prevented from causing the test mold to vibrate and shift, which would lead to misalignment of the inserts. Attached Figure Description
[0016] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0017] Figure 1 This is a three-dimensional view of the overall structure of a USB interface lifespan insertion / removal testing fixture according to this utility model.
[0018] Figure 2 This is a partial cross-sectional view of a USB interface lifespan insertion / removal testing fixture according to the present invention.
[0019] Figure 3 This utility model relates to a USB interface lifespan plug-in / plug-out testing fixture. Figure 2 Enlarged view of part A of the structure.
[0020] Figure 4 This is a partial perspective view of the clamping mechanism of a USB interface lifespan insertion / removal test fixture according to the present invention.
[0021] In the diagram, 1-base, 2-mounting plate, 3-test cylinder, 4-buffer mechanism, 5-mold groove, 6-clamping mechanism, 7-test mold;
[0022] 41-Mounting block, 42-Slide groove, 43-Slide rail, 44-Slider, 45-Spring, 46-Support plate, 47-U-shaped frame, 48-Threaded rod, 49-Pressure plate;
[0023] 61-Support rod, 62-Clamping thread, 63-Clamping block, 64-Telescopic rod. Detailed Implementation
[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0025] Please see Figures 1-3 As the first embodiment of this utility model:
[0026] A USB interface lifespan plug-in / plug-out test fixture includes: a base 1, an mounting plate 2 fixedly connected to the upper end of the base 1, a test cylinder 3 fixedly mounted on the lower end of the mounting plate 2, a buffer mechanism 4 provided at the telescopic end of the test cylinder 3, a mold groove 5 fixedly connected to the upper surface of the base 1, a clamping mechanism 6 provided inside the base 1, and a test mold 7 provided inside the mold groove 5 through the clamping mechanism 6.
[0027] The buffer mechanism 4 includes a mounting block 41, which is fixedly connected to the telescopic end of the test cylinder 3. A groove 42 is provided on the upper surface of the mounting block 41. A slide rail 43 is fixedly connected inside the groove 42. A slider 44 is slidably sleeved on the outside of the slide rail 43. A spring 45 is also provided on the outside of the slide rail 43. By setting the buffer mechanism 4, the impact force can be effectively absorbed during the insertion and removal process, avoiding physical damage to the USB interface caused by the instantaneous contact during insertion and removal. When the plug-in becomes fatigued during the testing stage and cannot be aligned due to deformation, the buffer mechanism can provide fault tolerance space through elasticity, reduce hard impact force and avoid vibration of the entire device. This protects the integrity of the USB interface plating and pins, as well as the interface of the test mold 7, and extends the service life of the device.
[0028] One end of the spring 45 is fixedly connected to the inner wall of the slide 42, and the other end of the spring 45 is fixedly connected to the slider 44.
[0029] A support plate 46 is fixedly connected to the upper end of the slider 44. A U-shaped frame 47 is fixedly connected to the support plate 46. A threaded rod 48 passes through the inside of the U-shaped frame 47 by threads. A pressure plate 49 is sleeved at the lower end of the threaded rod 48 by a bearing.
[0030] The contact surfaces of the support plate 46, the pressure plate 49, and the mold groove 5 are all equipped with anti-slip rubber pads.
[0031] Specifically, when a USB plug-in insertion / removal test is required, the plug-in is first placed on the upper side of the support plate 46. Then, the threaded rod 48 is rotated. During the rotation, the threaded rod 48 moves with the U-shaped frame 47, causing the threaded rod 48 to drive the pressure plate 49 to shift and press the USB plug-in firmly. At the same time, the rubber pad on the lower side of the pressure plate 49 avoids rigid contact, protecting the USB plug-in while increasing the friction between it and the pressure plate 49. Then, the test cylinder 3 is activated. The telescopic end of the test cylinder 3 drives the mounting block 41 and the USB plug-in to reciprocate and engage with the interface of the test mold 7. During the engagement process, the slider 44 compresses the spring 45, which can effectively absorb the impact force and avoid physical damage to the USB interface caused by the instantaneous contact during insertion and removal. When the plug-in becomes fatigued during the testing stage and cannot be aligned due to deformation, the USB plug-in is subjected to resistance, which is transmitted to the support plate 46 and the slider 44. The slider 44 then compresses the spring 45 and shifts to achieve buffering, reducing the hard impact force and preventing the entire device from vibrating. This protects the integrity of the USB interface plating and pins, as well as the interface of the test mold 7, extending the service life of the device.
[0032] Please see Figure 1 as well as Figure 4 As a second embodiment of this utility model:
[0033] The clamping mechanism 6 includes a support rod 61. The left end of the support rod 61 is sleeved inside the base 1 through a bearing, and the right end passes through the base 1 through a bearing. Both the left and right ends of the support rod 61 are provided with clamping threads 62. A clamping block 63 is screwed onto the outside of the support rod 61 through the thread. By setting the clamping mechanism 6, vibration during the test process is prevented from causing the test mold 7 to vibrate and shift, which would lead to the plug not being able to be aligned.
[0034] The two clamping threads 62 have opposite thread paths, which are used to make the clamping blocks 63 move in opposite directions or in opposite directions.
[0035] The clamping mechanism 6 also includes a telescopic rod 64 for restricting the linear movement of the clamping block 63. One end of the telescopic rod 64 is fixedly connected to the inner wall of the base 1, and the telescopic end of the telescopic rod 64 is fixedly connected to the outer surface of the clamping block 63.
[0036] The inner surface of the clamp 63 is fixedly connected with a rubber pad to improve its surface friction.
[0037] Based on the above embodiments, before performing the plug-in / plug-out test on the USB plug-in, the test mold 7 is first placed inside the mold slot 5, and then the support rod 61 is rotated. During the rotation, the support rod 61 and the clamping blocks 63 at both ends of it undergo threaded movement, causing the two clamping blocks 63 to move in opposite directions to clamp the test mold 7, thus preventing vibration during the test process from causing the test mold 7 to vibrate and displace, which would result in the plug-in not being aligned.
[0038] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. A USB interface lifespan plug-in / plug-out test fixture, comprising: The base (1) is characterized in that an mounting plate (2) is fixedly connected to the upper end of the base (1), a test cylinder (3) is fixedly installed at the lower end of the mounting plate (2), a buffer mechanism (4) is provided at the telescopic end of the test cylinder (3), a mold groove (5) is also fixedly connected to the upper surface of the base (1), a clamping mechanism (6) is provided inside the base (1), and a test mold (7) is provided inside the mold groove (5) through the clamping mechanism (6); The buffer mechanism (4) includes a mounting block (41), which is fixedly connected to the telescopic end of the test cylinder (3). A groove (42) is provided on the upper surface of the mounting block (41), and a slide rail (43) is fixedly connected inside the groove (42). A slider (44) is slidably sleeved on the outside of the slide rail (43), and a spring (45) is also provided on the outside of the slide rail (43).
2. The USB interface lifespan plug-in / plug-out test fixture as described in claim 1, characterized in that: One end of the spring (45) is fixedly connected to the inner wall of the groove (42), and the other end of the spring (45) is fixedly connected to the slider (44).
3. The USB interface lifespan plug-in / plug-out test fixture as described in claim 1, characterized in that: The upper end of the slider (44) is fixedly connected to a support plate (46), and a U-shaped frame (47) is fixedly connected to the support plate (46). A threaded rod (48) is threaded through the inside of the U-shaped frame (47), and a pressure plate (49) is sleeved at the lower end of the threaded rod (48) through a bearing.
4. The USB interface lifespan plug-in / plug-out test fixture as described in claim 3, characterized in that: The contact surfaces of the support plate (46), pressure plate (49) and mold groove (5) are all provided with anti-slip rubber pads.
5. The USB interface lifespan plug-in / plug-out test fixture as described in claim 1, characterized in that: The clamping mechanism (6) includes a support rod (61). The left end of the support rod (61) is sleeved inside the base (1) through a bearing, and the right end passes through the base (1) through a bearing. Both the left and right ends of the support rod (61) are provided with clamping threads (62). A clamping block (63) is screwed onto the outside of the support rod (61) through the thread.
6. The USB interface lifespan plug-in / plug-out test fixture as described in claim 5, characterized in that: The two clamping threads (62) have opposite thread paths for the clamping block (63) to move in opposite directions or in opposite directions.
7. The USB interface lifespan plug-in / plug-out test fixture as described in claim 5, characterized in that: The clamping mechanism (6) also includes a telescopic rod (64), one end of which is fixedly connected to the inner wall of the base (1), and the telescopic end of which is fixedly connected to the outer surface of the clamping block (63).
8. The USB interface lifespan plug-in / plug-out test fixture as described in claim 7, characterized in that: The inner surface of the clamp (63) is fixedly connected with a rubber pad for improving its surface friction.