Chip test auxiliary device

Abstract

The utility model discloses a chip test auxiliary device, which comprises a test seat, a test groove is arranged in the test seat, a plurality of test pins are arranged below the test groove of the test seat, an auxiliary frame is arranged above the test seat, a frame body groove hole is arranged in the auxiliary frame, and a plurality of test pins are arranged in the frame body groove hole. An alignment plate is arranged in a frame body groove hole of the auxiliary frame, a bottom hole is formed in the lower portion of the interior of the alignment plate, a positioning groove is formed in the upper portion of the interior of the alignment plate, the bottom hole is communicated with the positioning groove, side grooves are symmetrically formed in the interior of the test seat along the two sides of the test groove respectively, and the side grooves are communicated with the test groove. According to the utility model, the auxiliary alignment capability is realized, and the practicability is improved, so that the problem that the bottom surface of a chip is scratched by a test needle due to the fact that accurate alignment cannot be realized and the position needs to be adjusted through translation when the chip is placed in a test seat is solved.

Description

Technical Field

[0001] This utility model relates to the field of auxiliary device technology, specifically a chip testing auxiliary device. Background Technology

[0002] A chip, or integrated circuit, is a core component in modern electronic devices. It achieves miniaturization and high integration of circuits by integrating a large number of transistors, resistors, capacitors and other components onto a tiny silicon chip. Before a chip is put into use, its performance needs to be tested to avoid the potential problems caused by defective chips. Chip testing requires the use of a chip test socket.

[0003] For example, the patent with announcement number CN222704642U (a chip test socket) includes a base, and a groove for testing the chip is opened in the middle of the top surface of the base. Four sets of pressure plates for pressing against the chip are arranged in the groove. Limiting components for controlling the movement of the four sets of pressure plates are also arranged in the groove.

[0004] While the aforementioned existing technologies can effectively perform positioning tests on chips of different specifications, they lack an auxiliary alignment structure. Consequently, when the chip is placed inside the test socket, it cannot be accurately aligned and requires translational adjustment, which can cause the test probe to scratch the bottom surface of the chip, resulting in poor practicality. Therefore, there is an urgent need in the market to develop a chip testing auxiliary device to help people solve the existing problems. Utility Model Content

[0005] The purpose of this invention is to provide a chip testing auxiliary device to solve the problem mentioned in the background art that when the chip is placed inside the test socket, it cannot be accurately aligned and needs to be moved and adjusted, which causes the test probe to scratch the bottom surface of the chip and results in poor practicality.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a chip testing auxiliary device, including a test socket, a test slot is provided inside the test socket, a plurality of test pins are provided below the test slot, an auxiliary frame is provided above the test socket, a frame slot is provided inside the auxiliary frame, an alignment plate is provided inside the frame slot, a bottom hole is provided below the alignment plate, a positioning groove is provided above the alignment plate, and the bottom hole communicates with the positioning groove.

[0007] Preferably, the test base has symmetrically arranged side grooves along both sides of the test groove inside, and the side grooves are connected to the test groove. Side plates are symmetrically fixedly installed on both sides of the auxiliary frame. A vertical plate is provided at the upper end of the side plate, and the lower end of the vertical plate slides through the side plate and extends into the interior of the side groove and is fixedly connected to the test base.

[0008] Preferably, a threaded rod 2 is threadedly installed on the upper side of one side of the side plate, one end of the threaded rod 2 extends into the interior of the side plate and contacts the vertical plate, and a handwheel 2 is fixedly installed on the other end of the threaded rod 2.

[0009] Preferably, columns are symmetrically and rotatably installed on both sides above the auxiliary frame, a flat plate is fixedly installed on the top of the columns, a pressure plate is provided on one side below the flat plate, and a rubber pad is fixedly installed below the pressure plate.

[0010] Preferably, a threaded rod is rotatably mounted above the pressure plate, the upper end of the threaded rod is threadedly connected to the plate and passes through the plate, and a handwheel is fixedly mounted above the threaded rod.

[0011] Preferably, bottom grooves are symmetrically arranged on both sides below the alignment plate, and a limiting strip is provided inside the bottom groove, which is fixedly connected to the auxiliary frame.

[0012] Preferably, the alignment plate has symmetrically arranged side grooves on both sides of the positioning groove inside, and the side grooves are connected to the positioning groove.

[0013] Compared with the prior art, the beneficial effects of this utility model are:

[0014] This utility model features an auxiliary frame above the test holder, with an alignment plate inside the auxiliary frame having a positioning slot corresponding to the chip size. During testing, simply placing the chip into the positioning slot will naturally align the test pins without requiring manual fine-tuning. This eliminates the risk of scratching the chip's bottom surface during translation and adjustment, improves operational efficiency, and increases practicality.

[0015] This utility model extends the lower end of the vertical plate into the side groove and is fixedly connected to the test base, making the connection between the auxiliary frame and the test base more stable. During the test, it can effectively prevent the auxiliary frame from shaking or shifting, ensuring the stability of the contact between the chip and the test probe, and increasing its practicality.

[0016] This utility model, through the setting of a column, a plate, a pressure plate, and a threaded rod, allows the pressure plate to move downwards by rotating the threaded rod after the chip is placed in the positioning groove. The rubber pad contacts the chip and applies pressure, which can firmly fix the chip in the positioning groove, prevent the chip from shaking up and down during the test, ensure the stability of the test, and increase its practicality. Attached Figure Description

[0017] Figure 1 This is a front view of a chip testing auxiliary device according to the present invention;

[0018] Figure 2 This is a cross-sectional view of a chip testing auxiliary device according to the present invention;

[0019] Figure 3 This is an enlarged schematic diagram of part A of this utility model.

[0020] In the diagram: 1. Test base; 101. Test slot; 102. Side slot; 2. Auxiliary frame; 201. Frame slot; 3. Alignment plate; 301. Bottom hole; 302. Positioning slot; 303. Side slot; 304. Bottom slot; 4. Side plate; 5. Vertical plate; 6. Column; 7. Flat plate; 8. Pressure plate; 9. Test probe; 10. Threaded rod one; 11. Handwheel one; 12. Rubber pad; 13. Limiting strip; 14. Threaded rod two. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0022] Please see Figure 1-3 This utility model provides an embodiment of a chip testing auxiliary device, including a test base 1. The test base 1 has a test slot 101 inside, and a plurality of test pins 9 are arranged at the lower part of the test slot 101 inside the test base 1. An auxiliary frame 2 is arranged above the test base 1. The auxiliary frame 2 has a frame slot 201 inside, and an alignment plate 3 is arranged inside the frame slot 201. The alignment plate 3 has a bottom hole 301 at the lower part of its interior and a positioning groove 302 at the upper part of its interior. The bottom hole 301 communicates with the positioning groove 302. The alignment plate 3 is movably arranged in the auxiliary frame 2, so that when testing different chips, the alignment plate 3 with a positioning groove 302 corresponding to the chip size can be replaced, which facilitates the accurate positioning and placement of the chip in the alignment plate 3.

[0023] During chip testing, by setting up an alignment plate 3 with a positioning slot 302, the chip can be placed in the positioning slot 302 for auxiliary positioning. The bottom of the chip is exposed through the bottom hole 301. Then, the auxiliary frame 2 is moved down to make the chip contact the test probe for testing. During testing, the chip is simply placed in the positioning slot 302 to naturally align with the test probe, eliminating the need for manual fine-tuning. This eliminates the risk of scratching the bottom of the chip by the test probe during translation and adjustment, and improves operational efficiency. This modular design also gives the device strong compatibility. By replacing the alignment plate 3 with different specifications, it can be adapted to chips of various sizes, greatly expanding the applicability of the equipment while ensuring testing accuracy.

[0024] Furthermore, the test base 1 has symmetrically arranged side grooves 102 on both sides of the test groove 101 inside, and the side grooves 102 are connected to the test groove 101. The auxiliary frame 2 has symmetrically fixedly installed side plates 4 on both sides. The upper end of the side plate 4 is provided with a vertical plate 5. The lower end of the vertical plate 5 slides through the side plate 4 and extends into the interior of the side groove 102 and is fixedly connected to the test base 1.

[0025] During the test, it can effectively prevent the auxiliary frame 2 from shaking or shifting, ensuring the stability of the contact between the chip and the test probe, thereby improving the accuracy of the test.

[0026] Furthermore, a threaded rod 14 is threadedly installed on the upper side of one side of the side plate 4. One end of the threaded rod 14 extends into the interior of the side plate 4 and contacts the vertical plate 5. A handwheel 2 is fixedly installed on the other end of the threaded rod 14.

[0027] By rotating the second handwheel, the second threaded rod 14 is rotated, which presses the second threaded rod 14 tightly against the vertical plate 5, thus fixing the position of the side plate 4 and increasing the stability of the auxiliary frame 2.

[0028] Furthermore, two symmetrical columns 6 are mounted on the upper sides of the auxiliary frame 2. A plate 7 is fixedly mounted on the upper part of the columns 6. The rotatable setting of the columns 6 allows the plate 7 to be rotated when the chip is placed and removed, so that the end of the plate 7 away from the columns 6 leaves the space above the alignment plate 3. A pressure plate 8 is provided on one side below the plate 7. A rubber pad 12 is fixedly mounted on the lower part of the pressure plate 8. A threaded rod 10 is rotatably mounted on the upper part of the pressure plate 8. The upper end of the threaded rod 10 is threadedly connected to the plate 7 and passes through the plate 7. A handwheel 11 is fixedly mounted on the upper part of the threaded rod 10.

[0029] By rotating the handwheel 11, the threaded rod 10 is rotated, causing the pressure plate 8 to move downwards. The rubber pad 12 contacts the chip and applies pressure, which can firmly fix the chip in the positioning groove 302, preventing the chip from shaking up and down during the test and ensuring the stability of the test. In addition, the rubber pad 12 has good elasticity and cushioning performance, which can prevent the pressure plate 8 from applying too much pressure to the chip and damaging the chip, thus protecting the chip.

[0030] Furthermore, bottom grooves 304 are symmetrically arranged on both sides below the alignment plate 3, and a limiting strip 13 is provided inside the bottom groove 304. The limiting strip 13 is fixedly connected to the auxiliary frame 2.

[0031] The limiting strip 13 can limit the position of the alignment plate 3 within the auxiliary frame 2, ensuring the stability of the position of the alignment plate 3 within the auxiliary frame 2.

[0032] Furthermore, side grooves 303 are symmetrically arranged on both sides of the positioning groove 302 inside the alignment plate 3, and the side grooves 303 are connected to the positioning groove 302.

[0033] The side groove 303 facilitates the removal of the chip from the positioning groove 302, increasing its practicality.

[0034] Working principle: During use and testing, replace the appropriate alignment plate 3 according to the chip size, place the chip into the positioning slot 302 to complete the auxiliary positioning, and the bottom of the chip is naturally exposed through the bottom hole 301 and pre-aligned with the test probe 9. Rotate the pressure plate 8 to make the pressure plate 8 above the alignment plate 3, rotate the handwheel 11 to drive the threaded rod 10 to move down, so that the pressure plate 8 with rubber pad 12 flexibly fixes the chip. Then the entire auxiliary frame 2 is moved down, and its side plate 4 slides down stably along the side groove 102 of the test seat 1 through the vertical plate 5, ensuring that the chip and the test probe 9 make accurate contact, which is beneficial to the chip testing work.

[0035] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

Claims

1. A chip testing aid comprising a test seat (1), characterized in that: The test base (1) is provided with a test slot (101) inside. Several test pins (9) are provided below the test slot (101) inside the test base (1). An auxiliary frame (2) is provided above the test base (1). A frame slot (201) is provided inside the auxiliary frame (2). An alignment plate (3) is provided inside the frame slot (201) inside the auxiliary frame (2). A bottom hole (301) is provided below the inside of the alignment plate (3). A positioning groove (302) is provided above the inside of the alignment plate (3). The bottom hole (301) communicates with the positioning groove (302).

2. The chip testing auxiliary device according to claim 1, characterized in that: The test seat (1) has side grooves (102) symmetrically arranged on both sides of the test groove (101) inside, and the side grooves (102) are connected to the test groove (101). The auxiliary frame (2) has side plates (4) symmetrically fixedly installed on both sides. The upper end of the side plate (4) is provided with a vertical plate (5). The lower end of the vertical plate (5) slides through the side plate (4) and extends into the interior of the side groove (102) and is fixedly connected to the test seat (1).

3. The chip testing auxiliary device according to claim 2, characterized in that: A threaded rod (14) is threadedly installed on the upper side of one side of the side plate (4). One end of the threaded rod (14) extends into the interior of the side plate (4) and contacts the vertical plate (5). A handwheel (2) is fixedly installed on the other end of the threaded rod (14).

4. The chip testing auxiliary device according to claim 1, characterized in that: The auxiliary frame (2) is symmetrically mounted on both sides above the support frame (2). A flat plate (7) is fixedly mounted on the top of the support frame (6). A pressure plate (8) is provided on one side below the flat plate (7). A rubber pad (12) is fixedly mounted below the pressure plate (8).

5. The chip testing auxiliary device according to claim 4, characterized in that: A threaded rod (10) is rotatably mounted above the pressure plate (8). The upper end of the threaded rod (10) is threadedly connected to the plate (7) and passes through the plate (7). A handwheel (11) is fixedly mounted above the threaded rod (10).

6. The chip testing auxiliary device according to claim 1, characterized in that: The alignment plate (3) has symmetrical bottom grooves (304) on both sides below it. The bottom grooves (304) are provided with limiting strips (13) inside. The limiting strips (13) are fixedly connected to the auxiliary frame (2).

7. The chip testing auxiliary device according to claim 1, characterized in that: The alignment plate (3) has symmetrically arranged side grooves (303) on both sides of the positioning groove (302) inside, and the side grooves (303) are connected to the positioning groove (302).

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