Electronic component test adapter

Abstract

This utility model relates to the field of test adapter technology, specifically disclosing an electronic component test adapter, including a base, an adapter fixedly mounted on the base, and a cover plate disposed on the adapter. An outlet is provided on one side of the bottom of the adapter. A movable plate is slidably disposed on the bottom side of the adapter away from the outlet. A movable rod is slidably disposed on the side of the adapter. The end of the movable rod is fixedly installed to the side of the movable plate. A disc is fixedly mounted on the outer end of the movable rod. A spring is fixedly installed between the adapter and the disc. An movable opening is provided on the side of the adapter. A baffle is slidably disposed on the movable opening. A sealing plate is vertically slidably disposed at the outlet of the adapter. This electronic component test adapter can automatically eject the chip from the test socket after the chip transfer test is completed, effectively avoiding the inconvenience of manually removing the chip, improving testing efficiency and operational convenience, and is highly practical.

Description

Technical Field

[0001] This utility model belongs to the field of test adapter technology, and particularly relates to test adapters for electronic components. Background Technology

[0002] Electronic component test adapters connect electronic components under test (DUTs) to test equipment, enabling accurate transmission of signals and power from the test equipment to the DUTs and simultaneously transmitting feedback signals from the DUTs back to the test equipment. This effectively solves the connection problem between DUTs and test equipment with different specifications and interfaces, improving the convenience and efficiency of testing and ensuring the smooth progress of electronic component testing.

[0003] Existing chip test adapters often leave the chip tightly stuck in the slot after positioning and testing, requiring operators to manually and laboriously remove it. This is not only inconvenient but also prone to damaging the chip during removal, affecting testing efficiency and chip safety. Improvements are needed, hence the proposed electronic component test adapter. Utility Model Content

[0004] The purpose of this invention is to provide an electronic component test adapter to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, the present invention adopts the following technical solution: an electronic component testing adapter, including a base, an adapter fixedly mounted on the base, and a cover plate disposed on the adapter. An outlet is provided on one side of the bottom of the adapter. A movable plate is slidably disposed on the bottom side of the adapter away from the outlet. A movable rod is slidably disposed on the side of the adapter. The end of the movable rod is fixedly mounted to the side of the movable plate. A disc is fixedly mounted on the outer end of the movable rod. A spring is fixedly installed between the adapter and the disc. An movable opening is provided on the side of the adapter, and a baffle is slidably disposed on the movable opening.

[0006] As a further description of the above solution: by setting up the base, adapter, cover plate, outlet, movable plate, movable rod, disc, spring, movable port, and the cooperation between the baffle, the chip can be automatically ejected from the test socket after the chip transfer test is completed, which effectively avoids the inconvenience of manually removing the chip, improves the testing efficiency and operation convenience, and is highly practical.

[0007] Preferably, the adapter seat is vertically slidably provided with a sealing plate at the outlet, and a symmetrical electric push rod is fixedly installed on the side of the adapter seat. A connecting rod is fixedly installed at the end of the output shaft of the electric push rod, and the end of the connecting rod is fixedly installed with the side of the sealing plate.

[0008] As a further description of the above solution: the cooperation between the sealing plate, the electric push rod, and the connecting rod can seal the outlet during chip testing and open the outlet when the chip is ejected, effectively improving the stability of chip testing.

[0009] Preferably, a damping mechanism is provided between the baffle and the movable opening.

[0010] As a further description of the above solution: a damper is provided between the baffle and the movable port to prevent the baffle from sliding randomly, thereby improving the stability of the movable plate in the adapter.

[0011] Preferably, a support plate is fixedly installed on the base on the outlet side.

[0012] As a further description of the above solution: a support plate is fixedly installed on the base on the exit side, which can support the ejected chip.

[0013] Preferably, a pad is laid on the surface of the bearing plate, and the pad is made of rubber.

[0014] As a further description of the above solution: the surface of the carrier plate is covered with a rubber pad, which can protect the ejected chip.

[0015] Preferably, the cover plate is snap-fitted onto the top of the adapter.

[0016] As a further description of the above solution: the cover plate is snapped on the top of the adapter, which facilitates easy disassembly and assembly of the cover plate.

[0017] In summary, compared with the prior art, the beneficial effects of this utility model are: by setting up a base, adapter, cover plate, outlet, movable plate, movable rod, disc, spring, movable port, and baffle to work together, the chip can be automatically ejected from the test socket after the chip transfer test is completed, effectively avoiding the inconvenience of manually removing the chip, improving testing efficiency and ease of operation, and making it highly practical. Attached Figure Description

[0018] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0019] Figure 2 This is a structural diagram of the base and test stand of this utility model;

[0020] Figure 3 This utility model Figure 2 Enlarged structural diagram at point A in the middle;

[0021] Figure 4 This is a bottom view of the base and test stand of this utility model.

[0022] Legend:

[0023] 1. Base; 2. Adapter; 3. Cover plate; 4. Outlet; 5. Movable plate; 6. Movable rod; 7. Disc; 8. Spring; 9. Movable opening; 10. Baffle; 11. Sealing plate; 12. Electric push rod; 13. Connecting rod; 14. Bearing plate. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0025] Please see Figure 1-4 This utility model provides a technical solution:

[0026] An electronic component testing adapter 2 includes a base 1, an adapter 2 fixedly mounted on the base 1, and a cover plate 3 disposed on the adapter 2. An outlet 4 is provided on one side of the bottom of the adapter 2. A movable plate 5 is slidably disposed on the side of the bottom of the adapter 2 away from the outlet 4. A movable rod 6 is slidably disposed on the side of the adapter 2. The end of the movable rod 6 is fixedly installed to the side of the movable plate 5. A disc 7 is fixedly installed on the outer end of the movable rod 6. A spring 8 is fixedly installed between the adapter 2 and the disc 7. An movable opening 9 is provided on the side of the adapter 2. A baffle 10 is slidably disposed on the movable opening 9.

[0027] In the electronic component testing adapter 2, the base 1 is used to support the overall installation of the device;

[0028] In the initial state, the baffle 10 abuts against the inside of the disk 7, and the spring 8 is in a stretched state;

[0029] When the chip needs to be tested, the operator opens the cover plate 3 on the top of the adapter 2, puts the chip into the slot of the adapter 2, closes the cover plate 3 again, presses and positions the chip, and then the adapter 2 tests the chip.

[0030] After the chip test is completed, the cover plate 3 is opened, and the operator pulls the baffle 10 to slide away from the disc 7 on the movable port 9. The disc 7 moves to the side of the adapter 2 by the elastic restoring force of the spring 8. The movement of the disc 7 drives the movable rod 6 to move, the movement of the movable rod 6 drives the movable plate 5 to move, and the movement of the movable plate 5 pushes the chip to move, so that the chip is discharged from the outlet 4 of the adapter 2.

[0031] This electronic component test adapter 2 can automatically eject the chip from the test socket after the chip transfer test is completed, effectively avoiding the inconvenience of manually removing the chip, improving testing efficiency and ease of operation, and is highly practical.

[0032] The adapter 2 is vertically slidably provided with a sealing plate 11 at the outlet 4. A symmetrical electric push rod 12 is fixedly installed on the side of the adapter 2. A connecting rod 13 is fixedly installed at the end of the output shaft of the electric push rod 12. The end of the connecting rod 13 is fixedly installed with the side of the sealing plate 11.

[0033] The electric telescopic column on the side of the adapter 2 is activated, and the sealing plate 11 can be vertically raised and lowered at the outlet 4 via the connecting rod 13. During chip testing, the outlet 4 is sealed, and when the chip pops out, the outlet 4 is opened, which effectively improves the stability of chip testing.

[0034] A damper is provided between the baffle 10 and the movable opening 9;

[0035] Damping is provided between the baffle 10 and the movable port 9 to prevent the baffle 10 from sliding freely, thereby improving the stability of the movable plate 5 in the adapter 2.

[0036] The base 1 is fixedly installed with a bearing plate 14 on one side of the outlet 4;

[0037] The base 1 is fixedly installed with a support plate 14 on one side of the outlet 4, which can support the ejected chip.

[0038] A pad is laid on the surface of the bearing plate 14, and the pad is made of rubber.

[0039] The surface of the carrier plate 14 is covered with a rubber pad to protect the ejected chip.

[0040] Cover plate 3 is snapped onto the top of adapter 2;

[0041] The cover plate 3 is snapped onto the top of the adapter 2, making it easy to assemble and disassemble the cover plate 3.

[0042] Working principle:

[0043] In the electronic component testing adapter 2, the base 1 is used to support the overall installation of the device;

[0044] In the initial state, the baffle 10 abuts against the inside of the disk 7, and the spring 8 is in a stretched state;

[0045] When the chip needs to be tested, the operator opens the cover plate 3 on the top of the adapter 2, puts the chip into the slot of the adapter 2, closes the cover plate 3 again, presses and positions the chip, and then the adapter 2 tests the chip.

[0046] After the chip test is completed, the cover plate 3 is opened, and the operator pulls the baffle 10 to slide away from the disc 7 on the movable port 9. The disc 7 moves to the side of the adapter 2 by the elastic restoring force of the spring 8. The movement of the disc 7 drives the movable rod 6 to move, the movement of the movable rod 6 drives the movable plate 5 to move, and the movement of the movable plate 5 pushes the chip to move, so that the chip is discharged from the outlet 4 of the adapter 2.

[0047] This electronic component test adapter 2 can automatically eject the chip from the test socket after the chip transfer test is completed, effectively avoiding the inconvenience of manually removing the chip, improving testing efficiency and ease of operation, and is highly practical.

[0048] in,

[0049] The electric telescopic column on the side of the adapter 2 is activated, and the sealing plate 11 can be driven to rise and fall vertically at the outlet 4 via the connecting rod 13. During chip testing, the outlet 4 is sealed, and when the chip pops out, the outlet 4 is opened, which effectively improves the stability of chip testing.

[0050] Damping is provided between the baffle 10 and the movable port 9 to prevent the baffle 10 from sliding freely, thereby improving the stability of the movable plate 5 in the adapter 2.

[0051] The base 1 is fixedly installed with a support plate 14 on one side of the outlet 4, which can support the ejected chip;

[0052] The surface of the support plate 14 is covered with a rubber pad to protect the ejected chip;

[0053] The cover plate 3 is snapped onto the top of the adapter 2, making it easy to assemble and disassemble the cover plate 3.

[0054] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.

Claims

1. An electronic component testing adapter (2), comprising a base (1), an adapter (2) fixedly mounted on the base (1), and a cover plate (3) disposed on the adapter (2), characterized in that, An outlet (4) is provided on one side of the bottom of the adapter (2). A movable plate (5) is slidably provided on the bottom side of the adapter (2) away from the outlet (4). A movable rod (6) is slidably provided on the side of the adapter (2). The end of the movable rod (6) is fixedly installed on the side of the movable plate (5). A disc (7) is fixedly installed on the outer end of the movable rod (6). A spring (8) is fixedly installed between the adapter (2) and the disc (7). An movable opening (9) is provided on the side of the adapter (2). A baffle (10) is slidably provided on the movable opening (9).

2. The electronic component test adapter (2) according to claim 1, characterized in that, The adapter (2) is vertically slidably provided with a sealing plate (11) at the outlet (4). A symmetrical electric push rod (12) is fixedly installed on the side of the adapter (2). A connecting rod (13) is fixedly installed at the end of the output shaft of the electric push rod (12). The end of the connecting rod (13) is fixedly installed with the side of the sealing plate (11).

3. The electronic component test adapter (2) according to claim 1, characterized in that, A damping device is provided between the baffle (10) and the movable opening (9).

4. The electronic component test adapter (2) according to claim 1, characterized in that, The base (1) is fixedly mounted with a bearing plate (14) on one side of the outlet (4).

5. The electronic component test adapter (2) according to claim 4, characterized in that, The surface of the bearing plate (14) is covered with a pad, which is made of rubber.

6. The electronic component test adapter (2) according to claim 1, characterized in that, The cover plate (3) is snapped onto the top of the adapter (2).

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