Circuit Board Inductor Batch Testing Device and Testing System
By designing a modular inductance tester, the adaptability problem of inductance testing for different types of circuit boards was solved, achieving cost reduction and accuracy improvement.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- CAMELOT QINGYUAN HYTEC TECH INVESTMENT
- Filing Date
- 2025-05-30
- Publication Date
- 2026-05-26
Smart Images
Figure CN224287075U_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to the technical field of circuit board testing, and in particular to a batch testing device and system for circuit board inductors. Background Technology
[0002] Currently, circuit boards are produced in batches, and the traditional method of randomly testing coils on circuit boards using inductance, capacitance, and resistance meters is no longer sufficient to meet production demands. For these reasons, most manufacturers use automated testing devices for circuit board inductance, such as those provided in Chinese patent document CN208125823U. However, since the number of coils varies across different circuit board models, it is necessary to design circuit board inductance testing devices specifically tailored to each model, which increases production costs. Utility Model Content
[0003] The purpose of this disclosure is to overcome the shortcomings of the prior art and provide a batch testing device and system for circuit board inductance that can adapt to different models of circuit boards.
[0004] The purpose of this disclosure is achieved through the following technical solution:
[0005] A batch testing device for circuit board inductors, comprising:
[0006] A testing fixture, used to hold circuit boards;
[0007] The display screen is used to display test data;
[0008] The circuit board inductance batch testing device also includes a modular inductance tester.
[0009] The modular inductance tester includes a housing and at least two data processing units. The housing has at least two mounting positions, each capable of detachably mounting one of the data processing units, with an anti-interference gap between adjacent data processing units. The testing fixture has at least two probe groups. Each probe group is used to contact a corresponding coil on the circuit board to acquire a data signal. The signal input terminal of each data processing unit is electrically connected to one of the probe groups, and the data output terminal of each data processing unit is electrically connected to the display screen. The data processing unit is used to obtain the test data based on the data signal.
[0010] In some embodiments, at least two guide groove groups are formed on the inner wall of the outer casing, and one guide groove group is provided at each of the mounting positions; each guide groove group includes two guide grooves, and the side portion of each data processing main body is slidably disposed in one of the guide grooves.
[0011] In some embodiments, the inner wall of the outer casing is formed with a plurality of vertical guide rib groups, each of the vertical guide rib groups having two vertical ribs, and the guide groove is formed between the two vertical ribs located in the same vertical guide rib group.
[0012] In some embodiments, the width of the anti-interference gap is 18 mm to 20 mm.
[0013] In some embodiments, the detection fixture includes a fixture container, at least two transmission harnesses, and at least two probe groups; each probe group is installed inside the fixture container, which is used to house a circuit board; a first end of each transmission harness is electrically connected to at least one of the probe groups; and a second end of each transmission harness forms a connector, which is plugged in and electrically connected to the signal input interface of the data processing unit.
[0014] In some embodiments, the connector extends toward the edge end face of the housing and forms a locking lug; the locking lug is locked to the housing.
[0015] In some embodiments, the transmission harness includes multiple conductors, which are arranged in sequence from the inside out as a signal transmission layer, an inner insulation layer, a shielding layer, and an outer insulation layer.
[0016] In some of these embodiments, each of the probe groups includes at least one probe.
[0017] In some embodiments, the data processing unit has a signal amplifier for amplifying the data signal.
[0018] A testing system includes a batch testing device for circuit board inductors according to any of the above embodiments.
[0019] Compared with the prior art, this disclosure has at least the following advantages:
[0020] The aforementioned circuit board inductance batch testing device, after the circuit board is placed in the testing fixture, allows data signals from each coil on the circuit board to be acquired by each probe group contacting a corresponding coil on the circuit board. A data processing unit is detachably installed at each mounting position within the housing. The signal input terminal of each data processing unit is electrically connected to a probe group, and the data output terminal of each data processing unit is electrically connected to a display screen. This allows the data signal from each coil to be processed by the corresponding data processing unit to obtain test data, which is then displayed on the screen. Compared to existing technologies, users can flexibly install and remove the data processing unit according to the number of coils on the circuit board, thereby adapting to different circuit board models and reducing production costs. Furthermore, an anti-interference gap is formed between adjacent data processing units, reducing interference between them and improving the accuracy of the test data. Attached Figure Description
[0021] To more clearly illustrate the technical solutions of the embodiments of this disclosure, the accompanying drawings used in the embodiments will be briefly described below. It should be understood that the following drawings only show some embodiments of this disclosure and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.
[0022] Figure 1 This is a schematic diagram of the structure of a circuit board inductor batch testing device according to an embodiment of the present disclosure;
[0023] Figure 2 for Figure 1 The enlarged view shown at point A in the middle;
[0024] Figure 3 for Figure 1 A partial top view of the circuit board inductance batch testing device shown;
[0025] Figure 4 for Figure 3 The enlarged view shown at point B in the middle;
[0026] Figure 5 for Figure 1 The enlarged view shown at point C in the middle;
[0027] Figure 6 for Figure 3 A cross-sectional view of the wires in the circuit board inductance batch testing device shown;
[0028] Figure 7 This is a partial physical diagram of a circuit board inductor batch testing device according to another embodiment of this disclosure.
[0029] Figure label:
[0030] 100. Testing fixture; 110. Fixture container; 120. Transmission harness; 121. Socket; 1210. Wire; 1211. Signal transmission layer; 1212. Inner insulation layer; 1213. Shielding layer; 1214. Outer insulation layer; 130. Probe set; 1310. Probe;
[0031] 200. Display screen;
[0032] 300. Modular inductance tester; 310. Housing; 3101. Mounting position; 3102. Vertical rib; 3103. Guide groove; 320. Data processing unit; 3201. Anti-interference gap; 3210. Signal input interface; 3211. Locking lug. Detailed Implementation
[0033] To facilitate understanding of this disclosure, a more complete description will be given below with reference to the accompanying drawings, which illustrate preferred embodiments of the present disclosure. However, this disclosure can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a more thorough and complete understanding of the disclosure.
[0034] It should be noted that when an element is referred to as being "fixed to" another element, it can be directly attached to the other element or there may be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.
[0035] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of this disclosure. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.
[0036] To better understand the technical solutions and beneficial effects of this disclosure, the following detailed description is provided in conjunction with specific embodiments:
[0037] Please see Figure 1 and Figure 2An embodiment of a circuit board inductance batch testing device includes a testing fixture 100, a modular inductance tester 300, and a display screen 200. The testing fixture 100 is used to place the circuit board; the display screen 200 is used to display test data; the modular inductance tester 300 includes a housing 310 and at least two data processing units 320; the housing 310 has at least two mounting positions 3101 formed inside, each mounting position 3101 is detachably mounted with a data processing unit 320, and an anti-interference gap 3201 is formed between two adjacent data processing units 320; the testing fixture 100 has at least two probe groups 130; each probe group 130 is used to contact a corresponding coil on the circuit board to obtain a data signal; the signal input terminal of each data processing unit 320 is electrically connected to a probe group 130, and the data output terminal of each data processing unit 320 is electrically connected to the display screen 200, and the data processing unit 320 is used to obtain test data based on the data signal.
[0038] It is understood that after the circuit board is placed on the testing fixture 100, each probe group 130 contacts a corresponding coil on the circuit board, enabling the acquisition of data signals from each coil. A data processing unit 320 can be detachably installed at each mounting position 3101 within the housing 310. The signal input terminal of each data processing unit 320 is electrically connected to a probe group 130, and the data output terminal of each data processing unit 320 is electrically connected to the display screen 200. This allows the data signals from each coil to be processed by the corresponding data processing unit 320 to obtain test data, which is then displayed on the display screen 200. Compared to existing technologies, users can flexibly install and remove the data processing unit 320 according to the number of coils on the circuit board, thereby adapting to different circuit board models and reducing production costs. Furthermore, an anti-interference gap 3201 is formed between adjacent data processing units 320, reducing interference between them and improving the accuracy of the test data.
[0039] It should be noted that the method by which the data processing entity 320 obtains test data based on the data signal is prior art and is not within the scope of protection of this disclosure, so it will not be described in detail here.
[0040] In another embodiment, the data processing entity is an MCU processor. It is understood that the MCU processor is a known processor, and therefore will not be described further here.
[0041] Please see Figure 3 and Figure 4In some embodiments, at least two guide groove groups are formed on the inner wall of the outer casing 310, with one guide groove group provided at each mounting position 3101; each guide groove group includes two guide grooves 3103, and the side portion of each data processing main body 320 is slidably disposed within one guide groove 3103. It can be understood that by allowing the side portion of each data processing main body 320 to be slidably disposed within one guide groove 3103, each data processing main body 320 can be smoothly installed or removed from its corresponding mounting position 3101 via the guide grooves 3103.
[0042] Please see Figure 4 In some embodiments, the inner wall of the outer casing 310 is formed with a plurality of vertical guide rib groups, each vertical guide rib group having two vertical protrusions 3102, and a guide groove 3103 is formed between the two vertical protrusions 3102 located in the same vertical guide rib group. It can be understood that the guide groove 3103 being formed between the two vertical protrusions 3102 located in the same vertical guide rib group allows the vertical protrusions 3102 to interfere with the side of the data processing body 320, thereby enabling the data processing body 320 to remain stable during installation or disassembly.
[0043] Please see Figure 1 In some embodiments, the width of the anti-interference gap 3201 is 18mm to 20mm. It is understood that by setting the width of the anti-interference gap 3201 to 18mm to 20mm, electromagnetic interference between adjacent data processing units 320 can be effectively reduced, improving the accuracy of the test data. Specifically, the width of the anti-interference gap 3201 is 18mm, 19mm, or 20mm; the specific width is not limited here, and those skilled in the art can make other choices as needed.
[0044] Please see Figure 1 , Figure 2 and Figure 5 In some embodiments, the testing fixture 100 includes a fixture container 110, at least two transmission harnesses 120, and at least two probe groups 130; each probe group 130 is installed within the fixture container 110, which is used to house circuit boards; a first end of each transmission harness 120 is electrically connected to at least one probe group 130; a second end of each transmission harness 120 forms a connector 121, which is plugged in and electrically connected to a signal input interface 3210 of the data processing unit 320. It is understood that by allowing the connector 121 to be plugged in and electrically connected to the signal input interface 3210 of the data processing unit 320, assembly by the user is facilitated.
[0045] Please see Figure 5In some embodiments, the connector 121 extends toward the edge end face of the housing 310 and forms a locking lug 3211; the locking lug 3211 is locked to the housing 310. It is understood that by locking the locking lug 3211 to the housing 310, the connector 121 can maintain a more secure electrical connection with the signal input interface 3210 of the data processing unit 320.
[0046] Please see Figure 3 and Figure 6 In some embodiments, the transmission harness 120 includes multiple conductors 1210, which, from the inside out, consist of a signal transmission layer 1211, an inner insulating layer 1212, a shielding layer 1213, and an outer insulating layer 1214. It is understood that because the conductors 1210, from the inside out, consist of a signal transmission layer 1211, an inner insulating layer 1212, a shielding layer 1213, and an outer insulating layer 1214, the data signals acquired by the probe group 130 can be transmitted through the signal transmission layer 1211, and electromagnetic interference between adjacent conductors 1210 can be reduced through the shielding layer 1213. The shielding layer 1213 is a metallic shielding layer 1213. The inner insulating layer 1212 is used to block electrical conduction between the signal transmission layer 1211 and the shielding layer 1213, and the outer insulating layer 1214 is used to prevent leakage. Specifically, the signal transmission layer 1211, the inner insulation layer 1212, the shielding layer 1213, and the outer insulation layer 1214 are coaxially arranged from the inside to the outside.
[0047] Please see Figure 2 In some embodiments, each probe group 130 includes at least one probe 1310. It is understood that the number of probes 1310 in the probe group 130 may be one, two or more, and is not limited here. Those skilled in the art may make other choices as needed.
[0048] In some embodiments, the data processing unit 320 includes a signal amplifier (not shown) for amplifying the data signal. It is understood that amplifying the data signal acquired by the probe group 130 through the signal amplifier of the data processing unit 320 can improve the transmission stability of the data signal. The data signal includes the voltage or current signal corresponding to the detection inductor used for testing the circuit board.
[0049] In this embodiment, the circuit board inductance batch testing device adopts a dynamic parameter calibration algorithm, which automatically compensates the probe contact resistance (compensation range 0.1-5Ω) based on a real-time impedance matching network (IMN); it integrates a deep learning model (CNN-LSTM hybrid network) to predict the impact of temperature drift and correct the measured values based on historical data.
[0050] In one embodiment, the circuit board inductor batch testing device further includes an excitation module and a data acquisition module; the excitation module is a programmable signal source (outputting a 1kHz-1GHz sweep frequency signal) to a power divider, and the power divider is electrically connected to the probe matrix through a 32-channel isolation amplifier. The data acquisition module is a high-precision ADC (24bit / 100MSPS) output to a digital downconverter, and the digital downconverter uses an embedded FPGA to perform real-time Q-value calculation.
[0051] In one embodiment, the circuit board inductor batch testing device has the following test process: 1) Pre-scanning stage: apply 0.1Vpp white noise signal to quickly locate short-circuit / open-circuit units; Main test stage: 2) Segmented scanning (1-10MHz to test Ls, 10-100MHz to test SRF); 3) Data fusion to generate equivalent circuit model (RLCG parameter matrix); Post-processing stage: 4) compare design tolerance bands, mark out-of-tolerance items and output failure mode (FAIL) classification.
[0052] This disclosure also provides a testing system, including the circuit board inductor batch testing device of any of the above embodiments. It is understood that by applying the circuit board inductor batch testing device of this disclosure to the testing system, after the circuit board is placed in the testing fixture 100, data signals of each coil on the circuit board can be obtained by contacting a corresponding coil on the circuit board with each probe group 130. A data processing unit 320 is detachably installed in each mounting position 3101 within the housing 310. The signal input terminal of each data processing unit 320 is electrically connected to a probe group 130, and the data output terminal of each data processing unit 320 is electrically connected to the display screen 200, so that the data signal of each coil can be processed by the corresponding data processing unit 320 to obtain test data, and the test data can be displayed on the display screen 200. Compared with existing technologies, users can flexibly disassemble and assemble the data processing unit 320 according to the number of coils on the circuit board, thereby adapting to different models of circuit boards and reducing production costs. At the same time, an anti-interference gap 3201 is formed between two adjacent data processing units 320, which can reduce interference between data processing units 320 and improve the accuracy of test data.
[0053] Compared with the prior art, this disclosure has at least the following advantages:
[0054] The aforementioned circuit board inductance batch testing device, after the circuit board is placed in the testing fixture 100, obtains the data signal of each coil on the circuit board by having each probe group 130 contact a corresponding coil on the circuit board. A data processing unit 320 is detachably installed in each mounting position 3101 within the housing 310. The signal input terminal of each data processing unit 320 is electrically connected to a probe group 130, and the data output terminal of each data processing unit 320 is electrically connected to the display screen 200. This allows the data signal of each coil to be processed by the corresponding data processing unit 320 to obtain test data, which is then displayed on the display screen 200. Compared with existing technologies, users can flexibly install and remove the data processing unit 320 according to the number of coils on the circuit board, thereby adapting to different circuit board models and reducing production costs. Simultaneously, an anti-interference gap 3201 is formed between adjacent data processing units 320, which reduces interference between the data processing units 320 and improves the accuracy of the test data.
[0055] The embodiments described above are merely illustrative of several implementations of this disclosure, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this disclosure, and these all fall within the protection scope of this disclosure. Therefore, the protection scope of this patent should be determined by the appended claims.
Claims
1. A batch testing device for circuit board inductors, comprising: A testing fixture, used to hold circuit boards; The display screen is used to display test data; The circuit board inductance batch testing device is characterized in that it further includes a modular inductance tester; The modular inductance tester includes a housing and at least two data processing units. The housing has at least two mounting positions, each capable of detachably mounting one of the data processing units, with an anti-interference gap between adjacent data processing units. The testing fixture has at least two probe groups. Each probe group is used to contact a corresponding coil on the circuit board to acquire a data signal. The signal input terminal of each data processing unit is electrically connected to one of the probe groups, and the data output terminal of each data processing unit is electrically connected to the display screen. The data processing unit is used to obtain the test data based on the data signal.
2. The apparatus according to claim 1, wherein At least two guide groove groups are formed on the inner wall of the outer casing, and one guide groove group is provided at each of the mounting positions; each guide groove group includes two guide grooves, and the side portion of each data processing main body is slidably disposed in one of the guide grooves.
3. The circuit board inductance batch testing device according to claim 2, characterized in that, The inner wall of the outer shell is formed with a plurality of vertical guide rib groups, each of the vertical guide rib groups having two vertical protrusions, and the guide groove is formed between the two vertical protrusions located in the same vertical guide rib group.
4. The circuit board inductance batch testing device according to claim 1, characterized in that, The width of the anti-interference gap is 18mm to 20mm.
5. The circuit board inductance batch testing device according to claim 1, characterized in that, The testing fixture includes a fixture container, at least two transmission harnesses, and at least two probe groups; each probe group is installed inside the fixture container, which is used to place a circuit board; a first end of each transmission harness is electrically connected to at least one probe group; a second end of each transmission harness forms a connector, which is plugged in and electrically connected to the signal input interface of the data processing unit.
6. The circuit board inductance batch testing device according to claim 5, characterized in that, The connector extends toward the edge end face of the housing and forms a locking lug; the locking lug is locked to the housing.
7. The circuit board inductance batch testing device according to claim 5, characterized in that, The transmission harness includes multiple conductors, which, from the inside out, consist of a signal transmission layer, an inner insulation layer, a shielding layer, and an outer insulation layer.
8. The circuit board inductance batch testing device according to claim 1, characterized in that, Each of the probe groups includes at least one probe.
9. The circuit board inductance batch testing device according to claim 1, characterized in that, The data processing unit has a signal amplifier, which is used to amplify the data signal.
10. A detection system, characterized in that, The circuit board inductance batch testing device includes any one of claims 1 to 9.