Chip testing rack capable of fast positioning

Abstract

This utility model discloses a chip test fixture with rapid positioning, including a base, a lead screw slide, a cross slide rail, and a probe module. The lead screw slide is installed at the middle of the upper end of the base. A positioning seat is set on the movable seat of the lead screw slide by screws, and a positioning groove is formed in the middle of the positioning seat. Support arms are symmetrically arranged at the rear of the upper end of the base, and a cross slide rail is fixedly installed at the upper end of the support arms. A fixing block is fixedly installed on the sliding block of the cross slide rail. In this utility model, the cross slide rail moves the protective shell and probe module downwards. The telescopic part of the positioning component at the lower end of the protective shell first contacts the upper end of the chip located in the positioning groove. As the protective shell and probe module continue to move downwards until the probe group on the probe module contacts the contacts on the chip, the chip is pressed tightly by the elastic element inside the positioning component. After the test is completed, the chip is quickly released as the protective shell and probe module move upwards, achieving rapid chip positioning and effectively improving the testing efficiency.

Description

Technical Field

[0001] This utility model relates to the field of testing equipment technology, specifically a chip test fixture that can be quickly positioned. Background Technology

[0002] The chip manufacturing process is very complex, requiring a variety of high-tech processes and equipment, including chip processing, chip packaging, and testing. The performance and quality of chips are affected by many factors, including semiconductor materials, manufacturing processes, and packaging methods.

[0003] Application No. 202222585104.6 discloses a chip test fixture with a limiting function, including a base, a cover plate hinged to the rear top of the base, and a detection plate provided on the inner side wall of the cover plate; a chip body placed on the inner top of the base, and limiting plates provided on both the front and rear sides of the top of the base, the limiting plates being correspondingly provided on the front and rear side walls of the chip body; the detection plate corresponding to the chip body, and a clamping plate fixedly connected to the inner side wall of the limiting plate, the clamping plate having a rubber clamping pad sleeved on the inner side wall, the inner side wall of the clamping plate being in contact with the front and rear side walls of the chip body.

[0004] In the above solution, the limiting plate can only clamp and fix the front and rear ends of the chip, but cannot clamp and fix the left and right sides of the chip. When the staff places the chip on the base, because the left and right directions of the chip cannot play a limiting role, it is difficult for the center of the chip to be aligned with the center of the detection board, making it impossible to quickly position the chip and affecting the detection efficiency.

[0005] Therefore, those skilled in the art have provided a chip test fixture that can be quickly positioned to solve the problems mentioned in the background art. Utility Model Content

[0006] The purpose of this invention is to provide a chip test fixture that can be quickly positioned, so as to solve the problems mentioned in the background art.

[0007] To achieve the above objectives, this utility model provides the following technical solution:

[0008] A chip test fixture with rapid positioning includes a base, a lead screw slide, a cross slide rail, and a probe module. The lead screw slide is installed in the middle of the upper end of the base. A positioning seat is set on the movable seat on the lead screw slide by screws. A positioning groove is opened in the middle of the positioning seat. Support arms are symmetrically arranged at the rear of the upper end of the base. A cross slide rail is fixedly installed at the upper end of the support arms. A fixing block is fixedly installed on the sliding block on the cross slide rail. A protective shell is fixedly installed at the lower end of the fixing block. A probe module is arranged in the middle of the protective shell. A positioning bracket is fixedly installed at the lower end of the protective shell. Positioning components are symmetrically arranged at the lower end of the positioning bracket. The positioning components are located on both sides of the probe group on the probe module.

[0009] Preferably, the lead screw slide is a dual-position slide structure, which can alternately pick up and place chips, and can make reasonable use of the detection interval time to load and unload chips, thereby effectively improving detection efficiency.

[0010] Preferably, the positioning base has clearance grooves on both the front and rear sides of the positioning groove, and the depth of the clearance grooves is greater than the depth of the positioning groove, which makes it easier for a hand or mechanical gripper to grasp the chip through the clearance grooves.

[0011] Preferably, the protective shell is an integrated structure with an open bottom. The probe module is installed inside the protective shell, which serves to protect the probe module. Locking knobs are threaded to the lower two side walls of the protective shell. Tightening the locking knobs causes the screw part of the locking knob to press against the outer side wall of the probe module, thus fixing it in place. Fixing the probe module by the locking knobs facilitates the disassembly and assembly of the probe module and makes it easier for future maintenance and replacement.

[0012] Preferably, the positioning bracket includes a mounting block and a positioning frame. The positioning frame is a square frame structure. Mounting blocks are fixedly installed on both sides of the upper end of the positioning frame. The mounting blocks are right-angle bent structures. The mounting blocks are fixed to the lower end of the protective shell by screws. Mounting holes are symmetrically opened on the positioning frame near the inner frame groove. The mounting holes are threaded to the positioning components.

[0013] Preferably, the positioning component includes a threaded connector, which is threadedly connected to the mounting hole on the positioning frame. A sleeve is fixedly connected to the lower end of the threaded connector. A slidable slide column is provided inside the sleeve. A spring is provided on the upper part of the inner side of the sleeve, located at the upper end of the slide column. A limit cap is threadedly connected to the lower end of the sleeve. A sliding hole is opened in the middle of the lower end of the limit cap. A guide rod is fixedly provided at the center of the lower end of the slide column. The lower end of the guide rod passes through the sliding hole and extends to the outside of the limit cap. During the process of the protective shell and the probe module moving down until the probe group on the probe module contacts the contact point on the chip, the lower end of the guide rod first contacts the upper end of the chip. Then, the guide rod moves upward, pushing the slide column upward to compress the spring. Under the action of the elastic force, the guide rod presses the chip tightly, quickly fixing the chip.

[0014] Preferably, a protective cap is fitted over the lower part of the guide rod. The protective cap is made of rubber and can prevent the guide rod from damaging the chip.

[0015] Compared with the prior art, the beneficial effects of this utility model are:

[0016] 1. The cross slide rail of this utility model moves the protective shell and probe module directly above the positioning seat, and then moves the protective shell and probe module downward. The telescopic part of the positioning component at the lower end of the protective shell first contacts the upper end of the chip located in the positioning groove. As the protective shell and probe module continue to move downward until the probe group on the probe module contacts the contacts on the chip, the telescopic part of the positioning component is compressed. Under the action of the elastic element inside the positioning component, the chip is pressed tightly and the chip is pressed tightly in the positioning groove. After the test is completed, the chip is quickly released during the upward movement of the protective shell and probe module, realizing rapid positioning of the chip and effectively improving the testing efficiency.

[0017] 2. The protective shell of this utility model is a combined structure with an opening at the lower end. The probe module is installed inside the protective shell, which serves to protect the probe module. Locking knobs are threaded to the lower two side walls of the protective shell. Tightening the locking knobs causes the screw part of the locking knobs to press against the outer side wall of the probe module, thus fixing it. Fixing the probe module by the locking knobs facilitates the disassembly and assembly of the probe module and makes it easy to maintain and replace it later. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of a chip test fixture that allows for rapid positioning.

[0019] Figure 2 This is a top view of a chip test fixture that allows for rapid positioning.

[0020] Figure 3 This is a partial structural diagram of a chip test fixture that allows for rapid positioning.

[0021] Figure 4 This is a schematic diagram of the positioning component in a chip test fixture that allows for rapid positioning.

[0022] Figure 5 This is a top view of the positioning bracket in a chip test fixture that allows for rapid positioning.

[0023] In the diagram: 1-base, 2-screw slide, 3-support arm, 4-cross slide rail, 5-fixing block, 6-protective shell, 7-locking knob, 8-positioning component, 81-sleeve, 82-threaded joint, 83-spring, 84-slide column, 85-guide rod, 86-limit cap, 87-protective cap, 9-positioning bracket, 91-mounting block, 92-positioning frame, 10-probe module, 11-positioning seat, 12-positioning groove, 13-avoidance groove. Detailed Implementation

[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0025] Please see Figures 1-5 In this embodiment of the present invention, a chip test fixture capable of rapid positioning includes a base 1, a lead screw slide 2, a cross slide rail 4, and a probe module 10. The lead screw slide 2 is mounted on the upper middle part of the base 1. A positioning seat 11 is mounted on the movable seat of the lead screw slide 2 via screws. A positioning groove 12 is formed in the middle of the positioning seat 11. Support arms 3 are symmetrically arranged at the upper rear part of the base 1. A cross slide rail 4 is fixedly mounted on the upper end of the support arms 3. A fixing block 5 is fixedly mounted on the sliding block of the cross slide rail 4. A protective shell 6 is fixedly mounted on the lower end of the fixing block 5. The probe module 10 is arranged in the middle of the protective shell 6. A positioning bracket 9 is fixedly mounted on the lower end of the protective shell 6. Positioning components 8 are symmetrically arranged on the lower end of the positioning bracket 9. The positioning components 8 are located at... On both sides of the probe group on the probe module 10, the cross slide rail 4 moves the protective shell 6 and the probe module 10 directly above the positioning seat and moves them downwards. The telescopic part of the positioning component 8 at the lower end of the protective shell 6 first contacts the upper end of the chip located in the positioning groove. As the protective shell 6 and the probe module 10 continue to move downwards until the probe group on the probe module contacts the contacts on the chip, the telescopic part of the positioning component 8 is compressed. Under the action of the elastic element inside the positioning component, the chip is pressed tightly and the chip is pressed tightly in the positioning groove 12. After the test is completed, the chip is quickly released during the upward movement of the protective shell 6 and the probe module 10, realizing the rapid positioning of the chip and effectively improving the detection efficiency.

[0026] The lead screw slide 2 is a dual-station slide structure, which can alternately pick up and place chips, and can make reasonable use of the detection interval time to load and unload chips, effectively improving detection efficiency.

[0027] The positioning base 11 has clearance grooves 13 on both the front and rear sides of the positioning groove 12. The depth of the clearance grooves 13 is greater than the depth of the positioning groove 12, making it easier for a hand or mechanical gripper to grasp the chip through the clearance grooves 13.

[0028] The protective housing 6 is a combined structure with an open bottom. The probe module 10 is installed inside the protective housing 6, which serves to protect the probe module 10. The lower two side walls of the protective housing 6 are threaded with locking knobs 7. Tightening the locking knobs 7 causes the screw part of the locking knobs 7 to press against the outer side wall of the probe module 10, thus fixing it in place. The locking knobs 7 fix the probe module 10 in place, making it easy to disassemble and assemble the probe module 10 and facilitate future maintenance and replacement.

[0029] The positioning bracket 9 includes a mounting block 91 and a positioning frame 92. The positioning frame 92 is a square frame structure. Mounting blocks 91 are fixedly installed on both sides of the upper end of the positioning frame 92. The mounting blocks 91 are right-angle bent structures. The mounting blocks 91 are fixed to the lower end of the protective shell 6 by screws. Mounting holes are symmetrically opened on the positioning frame 92 near the inner frame groove. The mounting holes are threaded to the positioning component 8.

[0030] The positioning component 8 includes a threaded connector 82, which is threadedly connected to the mounting hole on the positioning frame 92. The lower end of the threaded connector 82 is fixedly connected to a sleeve 81. A slidable slide post 84 is provided inside the sleeve 81. A spring 83 is provided on the upper part of the inner side of the sleeve 81, located at the upper end of the slide post 84. A limit cap 86 is threadedly connected to the lower end of the sleeve 81. A sliding hole is opened in the middle of the lower end of the limit cap 86. A guide rod 85 is fixedly provided at the center of the lower end of the slide post 84. The lower end of the guide rod 85 extends through the sliding hole to the outside of the limit cap 86. During the process of the protective shell 6 and the probe module 10 moving down until the probe group on the probe module contacts the contact point on the chip, the lower end of the guide rod 85 first contacts the upper end of the chip. Then, the guide rod 85 moves upward, pushing the slide post 84 upward to squeeze the spring 83. Under the action of the elastic force, the guide rod 85 presses the chip tightly, quickly fixing the chip.

[0031] The lower part of the guide rod 85 is fitted with a protective cap 87, which is made of rubber and can prevent the guide rod 85 from damaging the chip.

[0032] The working principle of this utility model is as follows:

[0033] This utility model relates to a chip testing rack with rapid positioning capability. This device is suitable for various testing occasions. In use, the chip to be tested is placed on the stage 3. The control chip 10 starts the cylinder 12 to drive the telescopic rod 19 to move up and down. This, in turn, drives the rack 18 on the telescopic rod 19 to move up and down back and forth. Since the rack 18 is meshed with the left gear 17 and the right gear 20, the rack 18 drives the left gear 17 and the right gear 20 to rotate. At the same time as the left gear 17 and the right gear 20 rotate, the left swing arm 8 and the right swing arm 13 drive the left detection module 7 and the right detection module 14 to move in opposite directions on the same horizontal plane in an arc. This ensures that the left detection head 5 and the right detection head 16 can fully test the chip on the stage 3 during the testing process. It is convenient and quick to use.

[0034] In Example 1, the control equipment that enables the device to operate, including its supporting control system, switches, and drive modules, is provided by the corresponding manufacturers. Apart from this, the power supply module, circuits and electronic components, control module, and related sensors and measuring instruments used on the monitor are all existing technologies that can be fully implemented by those skilled in the art, so there is no need to elaborate. The content protected by this utility model does not involve any improvement to the internal structure and method.

[0035] Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. All other embodiments obtained by those skilled in the art and related fields based on the embodiments of this utility model without creative effort should fall within the protection scope of this utility model. Structures, devices, and operating methods not specifically described and explained in this utility model, unless otherwise specified or limited, shall be implemented according to conventional means in the art.

Claims

1. A chip test fixture capable of rapid positioning, comprising a base (1), a lead screw slide (2), a cross slide rail (4), and a probe module (10), characterized in that, A lead screw slide (2) is installed in the middle of the upper end of the base (1). A positioning seat (11) is set on the movable seat of the lead screw slide (2) by screws. A positioning groove (12) is opened in the middle of the positioning seat (11). Support arms (3) are symmetrically arranged at the rear of the upper end of the base (1). A cross slide rail (4) is fixedly arranged at the upper end of the support arm (3). A fixing block (5) is fixedly installed on the sliding block on the cross slide rail (4). A protective shell (6) is fixedly installed at the lower end of the fixing block (5). A probe module (10) is arranged in the middle of the protective shell (6). A positioning bracket (9) is fixedly arranged at the lower end of the protective shell (6). A positioning component (8) is symmetrically arranged at the lower end of the positioning bracket (9). The positioning component (8) is located on both sides of the probe group on the probe module (10).

2. The chip test fixture with rapid positioning according to claim 1, characterized in that, The lead screw slide (2) is a dual-position slide structure, which can alternately pick up and put down chips; the positioning seat (11) has clearance grooves (13) on the front and rear sides of the positioning groove (12), and the depth of the clearance groove (13) is greater than the depth of the positioning groove (12), making it easier for a hand or mechanical gripper to grab the chip through the clearance groove (13).

3. The chip test fixture with rapid positioning according to claim 1, characterized in that, The protective shell (6) is a combined structure with an opening at the bottom. The probe module (10) is installed inside the protective shell (6). The protective shell (6) serves to protect the probe module (10). The lower two side walls of the protective shell (6) are threaded with locking knobs (7). When the locking knobs (7) are tightened, the screw part of the locking knobs (7) presses against the outer side wall of the probe module (10) to fix it. The probe module (10) is fixed by the locking knobs (7), which facilitates the disassembly and assembly of the probe module (10) and makes it easy to maintain and replace it later.

4. The chip test fixture with rapid positioning according to claim 1, characterized in that, The positioning bracket (9) includes a mounting block (91) and a positioning frame (92). The positioning frame (92) is a square frame structure. Mounting blocks (91) are fixedly installed on both sides of the upper end of the positioning frame (92). The mounting blocks (91) are right-angle bent structures. The mounting blocks (91) are fixed to the lower end of the protective shell (6) by screws. Mounting holes are symmetrically opened on the positioning frame (92) near the inner frame groove. The mounting holes are threaded to the positioning components (8).

5. A chip test fixture capable of rapid positioning according to claim 1, characterized in that, The positioning component (8) includes a threaded connector (82), which is threadedly connected to the mounting hole on the positioning frame (92). A sleeve (81) is fixedly connected to the lower end of the threaded connector (82). A slidable slide post (84) is provided inside the sleeve (81). A spring (83) is provided on the upper part of the inner side of the sleeve (81), located above the slide post (84). A limit cap (86) is threadedly connected to the lower end of the sleeve (81). A sliding hole is opened in the middle of the lower end of the limit cap (86). 84) A guide rod (85) is fixedly installed at the center of the lower end. The lower end of the guide rod (85) extends through the sliding hole to the outside of the limit cap (86). During the process of the protective shell (6) and the probe module (10) moving down until the probe group on the probe module contacts the contact on the chip, the lower end of the guide rod (85) first contacts the upper end of the chip. Then the guide rod (85) moves upward to push the sliding column (84) to move upward to squeeze the spring (83). Under the action of the elastic force, the guide rod (85) presses the chip tightly to quickly fix the chip.

6. The chip test fixture with rapid positioning according to claim 5, characterized in that, The lower part of the guide rod (85) is fitted with a protective cap (87), which is made of rubber and can prevent the guide rod (85) from damaging the chip.

Images