Data detection device for NAND flash chip

Abstract

The utility model provides NAND Flash chip's data detection equipment belongs to chip detection technical field, NAND Flash chip's data detection equipment, including the detection box of waiting, the bottom one side of waiting detection box is equipped with transmission mouth, the side surface fixed connection of waiting detection box has detection table, the inside of detection table is equipped with detection storehouse, detection storehouse links to each other with transmission mouth, the inner wall bottom of detection storehouse fixedly connected with detection board, the top fixed connection of detection table has display. The utility model has, through putting the chip of waiting detection into the detection box, conveying device pushes chip to detection table inside in proper order, after detecting, chip is removed from the side of detection table automatically, and the staff only needs to add chip in the detection box, can realize continuous detection, and this kind of mode does not need to stop frequently and carry out the feeding and drawing, reduces the idle time of equipment, saves the manpower cost, improves the stability and reliability of production.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and in particular to a data testing device for NAND Flash chips. Background Technology

[0002] NAND Flash chips are non-volatile memory chips widely used in various electronic devices for storing data. They are a type of flash memory chip and feature fast read / write speeds, high storage density, and low power consumption.

[0003] In the semiconductor industry, data testing of NAND Flash chips is a critical step in ensuring their performance. However, most existing testing equipment relies on frequent manual loading and unloading operations, which is not only inefficient but also prone to inaccurate testing due to human error. Manual loading and unloading is time-consuming, increases equipment waiting time, and reduces overall testing efficiency. In addition, the instability of manual operation may damage the chips or cause contamination, affecting the yield rate.

[0004] Therefore, this invention proposes a data detection device for NAND Flash chips. Utility Model Content

[0005] The purpose of this invention is to provide a data detection device for NAND Flash chips to solve the above-mentioned problems.

[0006] To achieve the above objectives, this utility model provides the following technical solution:

[0007] A data testing device for NAND Flash chips includes a test box, a transmission port on one side of the bottom of the test box, a test platform fixedly connected to the side of the test box, a test chamber inside the test platform, the test chamber being connected to the transmission port, a test plate fixedly connected to the bottom of the inner wall of the test chamber, and a display fixedly connected to the top of the test platform.

[0008] The testing station is equipped with a limiting mechanism inside, the bottom end of which is aligned with the testing plate, and the bottom end of the box to be tested is fixedly connected to a pushing mechanism.

[0009] Furthermore, the pushing mechanism includes two sets of side baffles, and toothed chains are provided on the opposite sides of the two sets of side baffles. Two sets of gears are meshed inside the toothed chains. A second transmission shaft is fixedly sleeved inside each of the two sets of gears. The outer walls of the two sets of second transmission shafts are movably sleeved with the side baffles. The output end of a motor is fixedly connected to the outer wall of one set of side baffles.

[0010] Furthermore, the bottom of the test box is provided with a push card groove, and the bottom two sides of the push card groove are fixedly connected to two sets of side baffles. A push block is movably sleeved inside the push card groove, and the bottom end of the push block is fixedly connected to the toothed chain.

[0011] Furthermore, the inside of the test box is provided with two sets of sliding grooves, and each set of sliding grooves is fixedly connected to a limiting post. One end of the second feeding belt is slidably sleeved on the outer wall of the limiting post, and one set of first transmission shafts is movably sleeved on the inner wall of the other end of the second feeding belt. Both ends of the first transmission shaft are fixedly connected to the inner wall of the test platform. The inner wall of the test platform is movably sleeved with two other sets of first transmission shafts, and the outer walls of the two sets of first transmission shafts are movably sleeved with two sets of first feeding belts. The two sets of first feeding belts are respectively aligned with the two sets of second feeding belts.

[0012] Furthermore, the limiting mechanism includes a cylinder, the top of which is fixedly connected to the inner wall of the detection platform, a push plate is fixedly connected to the output end of the cylinder, and side limiting plates are fixedly connected to both sides of the push plate, with the bottom inner side of the side limiting plate being arc-shaped.

[0013] Furthermore, two sets of sliding grooves are provided on both sides of the push plate, and the inner walls of the sliding grooves are slidably fitted with limit fixing blocks, and the outer walls of the limit fixing blocks are fixedly connected to the inner walls of the testing platform.

[0014] The technical effects and advantages of this utility model are as follows:

[0015] 1. By placing the chip to be tested into the test box, the conveying device pushes the chip sequentially into the testing station. Then, the output end of the cylinder extends and retracts to push the push plate, making the chip fit tightly against the testing plate, ensuring a stable and reliable testing process. After testing, the chip is automatically removed from the side of the testing station. The operator only needs to add the chip to the test box to achieve continuous testing. This method eliminates the need for frequent machine stops for loading and unloading, reduces equipment downtime, improves testing speed and production efficiency, reduces manual intervention, lowers the risk of operational errors, saves labor costs, and improves the stability and reliability of production.

[0016] 2. By precisely moving the chip directly above the detection board and ensuring close contact, detection performance can be improved. Close contact effectively avoids signal interference caused by poor contact, significantly enhancing the accuracy and reliability of detection data. Precise alignment and close contact ensure that the chip remains stable throughout the detection process, reducing the risk of misjudgment and minimizing repeated detections caused by positional deviations or contact problems, thereby improving detection efficiency and providing a dual guarantee of high efficiency and accuracy for the chip detection process. Attached Figure Description

[0017] Figure 1 This is an external view of the data detection device for the NAND Flash chip of this utility model;

[0018] Figure 2 This is a cross-sectional view of the data detection device for the NAND Flash chip of this utility model;

[0019] Figure 3 This is a bottom structural diagram of the data detection device for the NAND Flash chip of this utility model;

[0020] Figure 4 This is a partial cross-sectional view of the data detection device for the NAND Flash chip of this utility model.

[0021] Explanation of reference numerals in the attached figures:

[0022] 1. Box to be tested; 2. Testing table; 3. Display; 4. Gear chain; 5. Gear; 6. Push block; 7. Feed belt II; 8. Push plate; 9. Cylinder; 10. Side limit plate; 11. Motor; 12. Side baffle; 13. Feed belt I; 14. Drive shaft I; 15. Limiting block; 16. Testing plate; 17. Drive shaft II; 18. Limiting post. Detailed Implementation

[0023] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0024] Example 1

[0025] Please see Figures 1 to 4 As shown, the data testing device for NAND Flash chips provided by this utility model includes a test box 1, a transmission port is provided on one side of the bottom end of the test box 1, a test platform 2 is fixedly connected to the side of the test box 1, a test chamber is provided inside the test platform 2, the test chamber is connected to the transmission port, a test plate 16 is fixedly connected to the bottom end of the inner wall of the test chamber, and a display 3 is fixedly connected to the top end of the test platform 2.

[0026] The testing station 2 is equipped with a limiting mechanism inside. The bottom end of the limiting mechanism is aligned with the testing plate 16, and the bottom end of the box to be tested 1 is fixedly connected to a pushing mechanism.

[0027] The pushing mechanism includes two sets of side baffles 12. A toothed chain 4 is provided on the opposite side of the two sets of side baffles 12. Two sets of gears 5 are meshed inside the toothed chain 4. A second transmission shaft 17 is fixedly sleeved inside the two sets of gears 5. The outer walls of the two sets of transmission shafts 17 are movably sleeved with the side baffles 12. The output end of a motor 11 is fixedly connected to the outer wall of one set of side baffles 12.

[0028] The bottom of the test box 1 is provided with a push card groove. The bottom two sides of the push card groove are fixedly connected to two sets of side baffles 12. The push card groove is movably sleeved with a push block 6. The bottom of the push block 6 is fixedly connected to the toothed chain 4.

[0029] The inside of the test box 1 has two sets of sliding grooves. The inside of each set of sliding grooves is fixedly connected to a limiting post 18. One end of the second feeding belt 7 is slidably sleeved on the outer wall of the limiting post 18. One set of drive shafts 14 is movably sleeved on the inner wall of the other end of the second feeding belt 7. Both ends of the drive shafts 14 are fixedly connected to the inner wall of the test platform 2. Two other sets of drive shafts 14 are movably sleeved on the inner wall of the test platform 2. Two sets of feed belts 13 are movably sleeved on the outer wall of the two sets of drive shafts 14. The two sets of feed belts 13 are respectively aligned with the two sets of feed belts 7.

[0030] When chip testing is required, the operator places the chips to be tested face up into the testing box 1. After starting the motor 11, its output drives a set of transmission shafts 17 to rotate within the two sets of side baffles 12. This set of transmission shafts 17 drives the gear chain 4 to rotate synchronously through gear 5, and then drives another set of transmission shafts 17 to rotate synchronously on the opposite side of the side baffles 12 through another set of gears 5. When the gear chain 4 rotates, the push block 6 fixed on its outer wall also rotates. When the push block 6 rotates to the inside of the testing box 1, it is slightly higher than the bottom of the inner wall of the testing box 1, thereby pushing the bottommost chip to move through the transfer port into the testing stage 2. Gear 5 and gear chain The transmission mechanism of 4 ensures the precise movement of push block 6, improving the accuracy of chip pushing. At the same time, the movement of the chip drives the second feeding belt 7 to rotate synchronously between the limiting post 18 and the first transmission shaft 14. During the process of the chip moving towards the inside of the detection stage 2, it comes into contact with the surface of the first feeding belt 13, so that the first feeding belt 13 and the second feeding belt 7 jointly hold the chip. The synergistic effect of the first feeding belt 13 and the second feeding belt 7 ensures that the chip remains stable during the movement, reduces positional deviation, and ensures the stability of chip movement, thus smoothly feeding the chip into the detection stage 2. The automated feeding system driven by motor 11 reduces manual intervention and improves detection efficiency.

[0031] Example 2

[0032] Based on Example 1, please refer to Figures 1 to 4 As shown, the limiting mechanism includes a cylinder 9, the top of the cylinder 9 is fixedly connected to the inner wall of the detection table 2, the output end of the cylinder 9 is fixedly connected to a push plate 8, and both sides of the push plate 8 are fixedly connected to side limiting plates 10, the bottom inner side of the side limiting plate 10 is arc-shaped.

[0033] Two sets of sliding grooves are provided on both sides of the push plate 8. The inner wall of each sliding groove is slidably fitted with a limiting fixing block 15. The outer wall of the limiting fixing block 15 is fixedly connected to the inner wall of the detection table 2.

[0034] Once the chip is moved to the appropriate position, cylinder 9 is activated, and its output drives push plate 8 to move downwards. The side limiting plates 10 fixed on both sides of push plate 8 descend synchronously, and the arc-shaped surface on the inner side of its bottom end precisely pushes the chip to the center position, ensuring that the chip is aligned with the bottom detection plate 16. The arc-shaped surface design of the side limiting plate 10 ensures precise chip alignment and reduces detection errors caused by positional deviations. As push plate 8 continues to move downwards, the chip and detection plate 16 are tightly fitted together. The synergistic effect of cylinder 9 and push plate 8 ensures that the chip and detection plate 16 are tightly fitted together, improving the stability and reliability of the detection. The detection then starts, and the detection information is displayed on display 3 in real time. The real-time display of the detection information on display 3 allows staff to monitor the detection process in a timely manner and quickly identify and resolve problems.

[0035] After testing, cylinder 9 drives push plate 8 upward until side limit plate 10 is higher than the transmission port of test box 1. At this time, motor 11 starts again, pushing the next chip into test station 2, while pushing the tested chip out from the side of test station 2, realizing continuous testing. Workers only need to periodically replenish chips in test box 1 to maintain an efficient continuous testing process. This reduces frequent manual loading and unloading operations, lowering labor costs. Through automation, continuous chip testing is achieved, significantly improving testing efficiency.

[0036] In addition, by setting the limiting fixing block 15, the minimum height of the push plate 8 is precisely controlled, which effectively avoids excessive squeezing of the chip, prevents chip damage, and ensures the stability and reliability of the testing process. This not only improves the testing efficiency but also reduces the risk of production interruption due to equipment failure or operational errors, further optimizing the entire testing process and improving the overall production efficiency.

[0037] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A data detection device for a NAND flash chip, characterized by, The test box (1) is included. A transmission port is provided on one side of the bottom end of the test box (1). A test platform (2) is fixedly connected to the side of the test box (1). A test chamber is provided inside the test platform (2). The test chamber is connected to the transmission port. A test plate (16) is fixedly connected to the bottom of the inner wall of the test chamber. A display (3) is fixedly connected to the top of the test platform (2). The detection platform (2) is equipped with a limiting mechanism inside. The bottom end of the limiting mechanism is aligned with the detection plate (16). The bottom end of the box to be tested (1) is fixedly connected to a pushing mechanism.

2. The data detection apparatus of a NAND Flash chip according to claim 1, wherein, The pushing mechanism includes two sets of side baffles (12), and a toothed chain (4) is provided on the opposite side of the two sets of side baffles (12). Two sets of gears (5) are meshed inside the toothed chain (4). A second transmission shaft (17) is fixedly sleeved inside the two sets of gears (5). The outer walls of the two sets of transmission shafts (17) are movably sleeved with the side baffles (12). The output end of a motor (11) is fixedly connected to the outer wall of one set of side baffles (12).

3. The data detection apparatus of a NAND Flash chip according to claim 1, wherein, The bottom end of the test box (1) is provided with a push card groove. The bottom two sides of the push card groove are fixedly connected to two sets of side baffles (12). The push card groove is movably sleeved with a push block (6). The bottom end of the push block (6) is fixedly connected to the toothed chain (4).

4. The data detection apparatus of a NAND Flash chip according to claim 1, wherein, The test box (1) has two sets of sliding grooves inside. Each set of sliding grooves is fixedly connected to a limiting post (18). One end of the second feeding belt (7) is slidably sleeved on the outer wall of the limiting post (18). One set of transmission shafts (14) is movably sleeved on the inner wall of the other end of the second feeding belt (7). Both ends of the first driving shaft (14) are fixedly connected to the inner wall of the test platform (2). The inner wall of the test platform (2) is movably sleeved with two other sets of first driving shafts (14). The outer walls of the two sets of first driving shafts (14) are movably sleeved with two sets of first feeding belts (13). The two sets of first feeding belts (13) are respectively aligned with the two sets of second feeding belts (7).

5. The data detection apparatus of a NAND Flash chip according to claim 1, wherein, The limiting mechanism includes a cylinder (9), the top of the cylinder (9) is fixedly connected to the inner wall of the detection platform (2), the output end of the cylinder (9) is fixedly connected to a push plate (8), and both sides of the push plate (8) are fixedly connected to side limiting plates (10), the bottom inner side of the side limiting plate (10) is arc-shaped.

6. The data detection apparatus of a NAND Flash chip according to claim 5, wherein, Two sets of sliding grooves are provided on both sides of the push plate (8), and the inner wall of the sliding groove is slidably fitted with a limiting fixing block (15). The outer wall of the limiting fixing block (15) is fixedly connected to the inner wall of the detection table (2).

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