A test chart and test chart assembly

Abstract

The utility model discloses a kind of test picture cards and test picture card components, it is related to image sensor test technical field, test picture card includes base layer, pattern layer and drive module, pattern layer includes first pattern layer and second pattern layer;First pattern layer is set on base layer, first pattern layer is provided with first pattern, and first pattern is used for the static performance test of image sensor;Drive module is set on base layer, second pattern layer is set on drive module, drive module is used to drive second pattern layer movement, second pattern layer is provided with second pattern, and second pattern in motion state is used for the dynamic performance test of image sensor.The above technical solution, through first pattern layer to image sensor carries out static performance test, through the dynamic performance test of second pattern layer to image sensor in motion, so that test picture card can be used for simultaneously the static performance test and dynamic performance test of image sensor, improves test efficiency.

Description

Technical Field

[0001] This utility model relates to the field of image sensor testing technology, and in particular to a test chart and a test chart assembly. Background Technology

[0002] In the field of image sensor technology, active pixel sensors (APS), event-based vision sensors (EVS), and hybrid vision sensors (HVS) that combine APS and EVS are among the most studied types of image sensors. Test charts, serving as a "benchmark" for evaluating the optical performance of image sensors, can transform the complex optical characteristics of image sensors into quantifiable data through relevant testing methods. This allows for performance testing and ensures that the sensors meet imaging quality requirements in real-world scenarios.

[0003] In existing technologies, image sensors are typically tested using independent static and dynamic test charts, which results in low testing efficiency.

[0004] Therefore, there is an urgent need for a test chart and test chart components to improve testing efficiency. Utility Model Content

[0005] This invention provides a test pattern card and a test pattern card assembly to improve the testing efficiency of image sensors.

[0006] In a first aspect, this utility model provides a test pattern card, which includes a substrate layer, a pattern layer, and a driving module. The pattern layer includes a first pattern layer and a second pattern layer. The first pattern layer is disposed on the substrate layer and has a first pattern. The first pattern is used for static performance testing of the image sensor. The driving module is disposed on the substrate layer, and the second pattern layer is disposed on the driving module. The driving module is used to drive the second pattern layer to move. The second pattern layer has a second pattern. The second pattern in motion is used for dynamic performance testing of the image sensor.

[0007] Furthermore, the substrate layer has a first surface and a second surface disposed opposite to each other, a first pattern layer is disposed on the first surface of the substrate layer, and a driving module is disposed on the first surface of the substrate layer.

[0008] Furthermore, the first pattern layer is arranged around the second pattern layer, or the first pattern layer and the second pattern layer are arranged side by side.

[0009] Furthermore, the substrate layer has a first surface and a second surface disposed opposite to each other. The first pattern layer is disposed on the first surface of the substrate layer, and the driving module is disposed on the second surface of the substrate layer. Further, the substrate layer includes n+1 independent sub-substrates, which are arranged side-by-side and spaced apart from each other. The first pattern layer is disposed on one of the sub-substrates. The test pattern card includes n driving modules, and the pattern layer includes n second pattern layers. The n driving modules are disposed one-to-one on the other n sub-substrates, and the n second pattern layers are disposed one-to-one on the n driving modules, where n is an integer greater than or equal to 1.

[0010] Furthermore, the drive module is used to drive the second pattern layer to rotate and / or move, and the corresponding rotation speed, moving speed, and moving trajectory are adjustable.

[0011] Furthermore, the first pattern layer is detachably connected to the substrate layer, the driving module is detachably connected to the substrate layer, and the second pattern layer is detachably connected to the driving module.

[0012] Furthermore, the first pattern includes at least one of the following: a pattern for testing resolution and detail capture, a pattern for testing dynamic range, a pattern for testing color reproduction, a pattern for evaluating noise and signal-to-noise ratio, a pattern for detecting distortion and uniformity, a pattern for evaluating edge brightness decay or color inhomogeneity, and a pattern for testing focus accuracy and analyzing sharpness.

[0013] Furthermore, the first pattern includes at least one of a standard pattern card, a grayscale gradient pattern card, a geometric pattern, a white field pattern card, a star pattern card, a portrait pattern card, and a high-texture object pattern card.

[0014] Furthermore, the second pattern includes a central pattern and lines distributed around the central pattern and extending outwards. The central pattern is a non-circular pattern, and there are no intersections between the lines.

[0015] Secondly, this utility model embodiment also provides a test pattern card assembly, which includes a test pattern card and a backplate as described in any of the first aspects, with the test pattern card disposed on the backplate.

[0016] The technical solution of this utility model embodiment provides a test chart with a first pattern layer and a second pattern layer. The static performance of the image sensor is tested through the first pattern layer, and the dynamic performance of the image sensor is tested through the second pattern layer, which moves under the drive of the driving module. In this way, the static and dynamic performance of the image sensor can be compatiblely tested through the test chart, thereby improving the efficiency of image sensor performance testing.

[0017] The description of the second aspect of this utility model can be referred to the detailed description of the first aspect; and the beneficial effects of the description of the second aspect can be referred to the analysis of the beneficial effects of the first aspect, which will not be repeated here.

[0018] In this invention, the name of the driver module in the aforementioned test chart does not limit the module itself. In actual implementation, the driver module can appear under other names. As long as the function of the module is similar to that of this invention, it falls within the scope of the claims of this invention and its equivalents.

[0019] These or other aspects of this utility model will become more apparent from the following description. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 A schematic diagram of a test chart provided for an embodiment of this utility model;

[0022] Figure 2 A schematic diagram of a pattern layer in a test chart provided by an embodiment of this utility model;

[0023] Figure 3 A schematic diagram of another test chart provided in an embodiment of this utility model;

[0024] Figure 4 This is a schematic diagram of a test chart component provided in an embodiment of this utility model.

[0025] Icon labels:

[0026] 100 - Test pattern card, 110 - Substrate layer, 1101, 1102, 1103 - Sub-substrate layer, 120 - Pattern layer, 1210 - First pattern layer, 1220 - Second pattern layer, 130 - Driver module, 200 - Backplane. Detailed Implementation

[0027] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the scope of the invention. Furthermore, it should be noted that, for ease of description, the accompanying drawings show only the parts relevant to the present invention, and not the entire structure.

[0028] In this article, the term "and / or" is merely a description of the relationship between related objects, indicating that there can be three relationships. For example, A and / or B can represent three situations: A exists alone, A and B exist simultaneously, and B exists alone.

[0029] The terms "first" and "second," etc., in the specification and drawings of this utility model are used to distinguish different objects or to distinguish different treatments of the same object, rather than to describe a specific order of objects.

[0030] Furthermore, the terms "comprising" and "having," and any variations thereof, used in the description of this utility model are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not limited to the steps or units listed, but may optionally include other steps or units not listed, or may optionally include other steps or units inherent to such processes, methods, products, or devices.

[0031] It should be noted that in the embodiments of this utility model, the words "exemplary" or "for example" are used to indicate that they are examples, illustrations, or descriptions. Any embodiment or design that is described as "exemplary" or "for example" in the embodiments of this utility model should not be construed as being more preferred or advantageous than other embodiments or design solutions. Specifically, the use of the words "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0032] In the description of this utility model, unless otherwise stated, "a plurality of" means two or more.

[0033] When performing performance testing on an APS, static and dynamic test charts are used to conduct static and dynamic performance tests respectively. When performing performance testing on an EVS, since the EVS outputs events through changes in light intensity, a dynamic test chart is generally required. When performing performance testing on an HVS, a static test chart is used to test the static performance of the APS it integrates, and a dynamic test chart is used to test the dynamic performance of both the APS and the EVS it integrates.

[0034] In existing technologies, static performance testing of APS often uses completely static test charts, while dynamic performance testing of APS and EVS requires additional dynamic test charts, resulting in low testing efficiency.

[0035] Therefore, this utility model proposes a test chart that can be used for at least APS performance testing, EVS performance testing and HVS performance testing, thereby improving testing efficiency.

[0036] The test chart proposed in this utility model will be described in detail below with reference to the illustrations and embodiments.

[0037] Figure 1 A schematic diagram of a test chart provided in an embodiment of this utility model, as shown below. Figure 1 As shown, the test pattern card 100 includes a substrate layer 110, a pattern layer 120, and a driving module 130. The pattern layer 120 includes a first pattern layer 1210 and a second pattern layer 1220. The first pattern layer 1210 is disposed on the substrate layer 110 and has a first pattern. The first pattern is used for static performance testing of the image sensor. The driving module 130 is disposed on the substrate layer 110, and the second pattern layer 1220 is disposed on the driving module 130. The driving module 130 is used to drive the second pattern layer 1220 to move. The second pattern layer 1220 has a second pattern. The second pattern in motion is used for dynamic performance testing of the image sensor.

[0038] The substrate layer 110 can be understood as the support carrier for the test chart 110. The pattern layer 120 includes a first pattern layer 1210 and a second pattern layer 1220. The first pattern layer 1210 is disposed on the substrate layer 110 and is provided with a first pattern. The first pattern is used to test the static performance of the APS. The static performance of the APS includes resolution and detail capture pattern, dynamic range, color depth, noise and signal-to-noise ratio, distortion and uniformity, edge brightness attenuation or color non-uniformity, as well as focus accuracy and analysis sharpness, etc. In order to test these static performances, the first pattern includes a pattern for testing at least one of these performances, and the first pattern provided by the first pattern layer 1210 is replaceable.

[0039] The second pattern layer 1220 is disposed on the driving module 130, which is disposed on the substrate layer 110. The driving module 130 can drive the second pattern layer 1220 to move, and in particular, it can move in different modes. The second pattern is disposed on the second pattern layer 1220, and the second pattern in motion is used for dynamic performance testing of the image sensor.

[0040] The test pattern card provided in this embodiment of the utility model has a first pattern layer and a second pattern layer. The static performance of the image sensor is tested through the first pattern layer, and the dynamic performance of the image sensor is tested through the second pattern layer which moves under the drive module. Thus, the static and dynamic performance of the image sensor can be tested simultaneously through the test pattern card. That is, the static and dynamic testing are compatible through a single test pattern card, which improves the performance testing efficiency of the image sensor.

[0041] This embodiment of the present invention also provides a test pattern card, which is a specific embodiment based on the above embodiments. In this embodiment, the test pattern card 100 includes a substrate layer 110, a pattern layer 120, and a driving module 130. The pattern layer 120 includes a first pattern layer 1210 and a second pattern layer 1220. The first pattern layer 1210 is disposed on the substrate layer 110 and has a first pattern disposed thereon. The first pattern is used for static performance testing of the image sensor. The driving module 130 is disposed on the substrate layer 110, and the second pattern layer 1220 is disposed on the driving module 130. The driving module 130 is used to drive the second pattern layer 1220 to move. The second pattern layer 1220 has a second pattern disposed thereon. The second pattern in motion is used for dynamic performance testing of the image sensor.

[0042] The drive module 130 can be a simple drive structure based on a motor, such as a rotation drive structure or a two-dimensional planar movement drive structure, which can drive the second pattern layer 1220 to rotate or move in a two-dimensional plane. The drive module 130 can also be a complex drive structure based on a motor drive, such as a three-dimensional space movement drive structure or a three-dimensional space movement plus rotation drive, which can drive the second pattern layer 1220 to move and rotate in three-dimensional space, realizing multi-degree-of-freedom motion. The motor can be any type of motor, such as a stepper motor or a servo motor.

[0043] The substrate layer 110 includes a first surface and a second surface disposed opposite to each other. The substrate layer 110 serves as a support carrier for the test pattern card 110. The first pattern layer 1210 included in the pattern layer 120 and the driving module 130 supporting the second pattern layer 1220 can be disposed on the surface of the substrate layer 110.

[0044] The first pattern layer 1210 is detachably connected to the substrate layer 110, the driving module 130 is detachably connected to the substrate layer 110, and the second pattern layer 1220 is detachably connected to the driving module 130. In this way, the driving module 130 with different driving modes can be flexibly configured according to the test requirements. It can also be flexibly configured with the first pattern layer 1210 with different first patterns and / or the second pattern layer 1220 with different second patterns according to the test requirements. This can meet more test requirements, further improve the test applicability of the test chart, and further improve the performance test efficiency of the image sensor.

[0045] Specifically, the test pattern card 100 includes at least a plurality of different first pattern layers 1210 and a plurality of different second pattern layers 1220. The first patterns on different first pattern layers 1210 are different, and the second patterns on different second pattern layers 1220 are different, so that the required test pattern can be flexibly disassembled and replaced.

[0046] Furthermore, the test pattern card 100 may also include multiple different substrate layers 110 and drive modules 130. Based on the detachable connection, it can be flexibly disassembled, replaced and reassembled to form test pattern cards 100 of various sizes and specifications. Multiple substrate layers 110 of different sizes and specifications can be adapted to drive modules 130 of different sizes and specifications, first pattern layer 1210 and second pattern layer 1220. Multiple drive modules 130 of different specifications and different drive modes can be adapted to second pattern layer 1220 of various different motion states, so as to further improve test compatibility.

[0047] In one embodiment, the first pattern layer 1210 and the driving module 130 supporting the second pattern layer 1220 can be disposed on the same side of the substrate layer 110, that is, both are disposed on the first surface, such as... Figure 1 As shown, the first surface of the substrate layer 110 has a first region and a second region. The first pattern layer 1210 is disposed on the first region, and the driving module 130 is disposed on the second region. The first region and the second region are not on the same horizontal plane, and there is a height difference between them. The horizontal plane where the first region is located is higher than the horizontal plane where the second region is located. That is to say, the supporting surface of the substrate layer 110 for the driving module 130 is lower.

[0048] Thus, by adjusting the support height of the drive module 130, the vertical height of the second pattern layer 1220 relative to the first pattern layer 1210 can be flexibly adjusted, so that the second pattern layer 1220 and the first pattern layer 1210 are on the same horizontal plane, or the horizontal plane of the second pattern layer 1220 is higher than the horizontal plane of the first pattern layer 1210, or the horizontal plane of the second pattern layer 1220 is lower than the horizontal plane of the first pattern layer 1210, which can meet more testing requirements.

[0049] The drive module 130 includes a drive base, a drive support column, and a support plate. The drive base is disposed on the second region, the drive support column is disposed on the drive base, and the support plate is disposed on the drive support column. The drive base is provided with a complex drive structure based on a motor, which can drive the drive support column and the support plate on it to rotate and move relative to the drive base. For example, it can drive the drive support column and the support plate on it to move up and down in the vertical direction, thereby adjusting the vertical height of the second pattern layer 1220 relative to the first pattern layer 1210. For details of each component in the drive module 130, please refer to the prior art, which will not be repeated here.

[0050] At the same time, such as Figure 1 As shown, ignoring the height difference between the first region and the second region in the vertical direction, they are arranged side by side in the horizontal plane. Thus, the first pattern layer 1210 and the second pattern layer 1220 are also arranged side by side in the horizontal plane.

[0051] It is understood that in other optional embodiments of this utility model, the first region and the second region may be on the same horizontal plane, and the first pattern layer 1210 and the second pattern layer 1220 may not be arranged side by side in the horizontal plane, which can be flexibly set according to actual needs.

[0052] Figure 2 This is a schematic diagram of the pattern layer 120 in a test chart according to another embodiment of the present invention, as shown below. Figure 2 As shown, when the first pattern layer 1210 and the second pattern layer 1220 are both disposed on the same surface of the substrate layer 110, the first pattern layer 1210 is disposed around the second pattern layer 1220 in the horizontal plane, thereby achieving a reasonable layout of the patterns in the test chart 100 and optimizing the relative spatial layout of the first pattern layer 1210 and the second pattern layer 1220.

[0053] It should be noted that the first pattern layer 1210 and the second pattern layer 1220 are respectively disposed on different areas of the substrate layer 110. The patterns on the two can be used independently for the performance testing of the image sensor, and theoretically there is no mutual interference. Therefore, the test chart 100 can be used for static performance testing or dynamic performance testing of the image sensor each time, or it can be used for static performance testing and dynamic performance testing of the image sensor at the same time each time.

[0054] However, when performing static performance tests and dynamic performance tests of the image sensor simultaneously, the driving module 130 may cause some vibration, which may result in the first pattern layer 1210 and the first pattern on it not being completely still, thus affecting the static performance test and making the test inaccurate.

[0055] Based on this, further isolation and vibration reduction designs can be made. For example, the contact surface between the drive module 130 and the substrate layer 110 can be reduced, or energy-absorbing and vibration-damping components such as rubber pads can be set on the contact surface between the drive module 130 and the substrate layer 110. Alternatively, the relative spatial layout between the drive module 130 and the first pattern layer 1210 can be further optimized to reduce mutual interference between the two.

[0056] In one embodiment, the first pattern layer 1210 and the driving module 130 supporting the second pattern layer 1220 can be disposed on different sides of the substrate layer 110. That is, the first pattern layer 1210 can be disposed on the first surface of the substrate layer 110, and the driving module 130 supporting the second pattern layer 1220 can be disposed on the second surface of the substrate layer 110.

[0057] This further optimizes the relative spatial layout between the driving module 130 and the first pattern layer 1210, reducing the interference of the driving module 130 on the first pattern layer 1210, thereby improving the testing efficiency and accuracy of the synchronous static performance test and dynamic performance test based on the test chart 100.

[0058] In another embodiment, the substrate layer 110 can be divided into multiple (i.e. at least two) independent blocks, and each block is provided with a corresponding drive module 130 or a first pattern layer 1210, so as to reduce the vibration or oscillation of the first pattern layer 1210 caused by the drive of the drive module 130.

[0059] In other words, in this embodiment, the substrate layer 110 includes n+1 independent sub-sub-substrates, which are arranged side by side and spaced apart from each other. The first pattern layer is disposed on one sub-sub-substrate layer. The test pattern card includes n driving modules. The pattern layer includes n second pattern layers. The n driving modules are disposed one-to-one on the other n sub-sub-substrates, and the n second pattern layers are disposed one-to-one on the n driving modules, where n is an integer greater than or equal to 1.

[0060] Figure 3 A schematic diagram of another test chart provided in an embodiment of this utility model, as shown below. Figure 3 As shown, n takes the value of 2. The substrate layer 110 includes three independent sub-substrate layers, namely sub-substrate layers 1101 to 1103. The three sub-substrate layers are arranged side by side and spaced apart from each other. The first pattern layer 1210 is arranged on the middle sub-substrate layer 1101. The test pattern card includes two driving modules 130. The pattern layer 120 includes two second pattern layers 1220. The two driving modules 130 are arranged one-to-one on the other two sub-substrate layers (i.e., sub-substrate layers 1102 to 1103), and the two second pattern layers 1220 are arranged one-to-one on the two driving modules 130.

[0061] Thus, one drive module 130 is disposed on sub-substrate layer 1102 and another drive module 130 is disposed on sub-substrate layer 1103. Neither drive module 130 is directly connected to the sub-substrate layer 1101 corresponding to the adjacent first pattern layer 1210. Therefore, the driving of drive module 130 will hardly cause vibration or oscillation of the first pattern layer 1210. At the same time, the sub-substrate layers corresponding to the two drive modules 130 are also independently isolated from each other, and there is almost no mutual influence between them.

[0062] Furthermore, it is understood that the test pattern card includes two drive modules 130 and two second pattern layers 1220, which can simultaneously form two dynamic patterns, that is, two second patterns in motion, and can be used simultaneously for dynamic performance testing of two image sensors.

[0063] It should be noted that the value of n can be flexibly set according to actual needs. The value of n can be 1, or it can be 3, 4, 5, etc. There is no restriction here.

[0064] Therefore, based on the configuration of the first pattern and the second pattern in motion state, the test pattern card 100 can be further configured with multiple independent sub-substrate layers, corresponding drive modules 130 and corresponding second pattern layers 1220 to form multiple second patterns with different motion states and different patterns. While reducing the vibration or oscillation of the first pattern layer 1210 caused by the drive of the drive module 130, it can also further improve the test applicability range, and can simultaneously perform static performance tests and multiple different dynamic performance tests of the image sensor, thereby improving the performance test efficiency of the image sensor.

[0065] The first pattern layer 1210 can be used for static performance testing of the APS (Image Sensor), and the second pattern layer 1220 disposed on the drive module 130 can be used for dynamic performance testing and EVS (Earthquake Sensor Performance Testing) of the APS. Specifically, when the image sensor is an APS, the dynamic performance of the APS can be tested by moving the second pattern layer 1220 under the drive of the drive module 130. When the image sensor is an EVS, the performance of the EVS can be tested by moving the second pattern layer 1220 under the drive of the drive module 130.

[0066] Understandably, the static performance of APS includes testing resolution and detail capture, dynamic range, color reproduction, noise and signal-to-noise ratio, distortion and uniformity, edge brightness decay or color inhomogeneity, focus accuracy, and analytical sharpness. The first pattern layer 1210 comprises at least one pattern used to test these performance characteristics, and the first pattern is replaceable. Therefore, the first pattern includes at least one of the following: a pattern for testing resolution and detail capture, a pattern for testing dynamic range, a pattern for testing color reproduction, a pattern for evaluating noise and signal-to-noise ratio, a pattern for detecting distortion and uniformity, a pattern for evaluating edge brightness decay or color inhomogeneity, and a pattern for testing focus accuracy and analytical sharpness.

[0067] Among these tests, resolution and detail capture require the use of high-contrast line-pair maps (such as industry-standard charts) or star patterns. This quantifies the APS's extreme resolution capability and tests its ability to clearly reproduce subtle textures. Dynamic range requires testing with grayscale gradient charts, such as those transitioning from pure white to pure black. This measures the APS's ability to simultaneously retain highlight and shadow details, determining the span between its maximum brightness and lowest noise areas. Color reproduction requires testing with standard color charts. By using color patches with known chromaticity values ​​provided by the standard chart, white balance can be calibrated and the APS's color reproduction deviations verified, ensuring consistency in color science. Noise and signal-to-noise ratio require testing with uniform grayscale charts. The tests help quantify the image noise level of the APS, analyze the signal-to-noise ratio under different ISO settings, and determine the performance of the APS in low light. Distortion and uniformity require testing using geometric patterns, such as checkerboard or concentric circles, to identify barrel / pincushion distortion of the lens and achieve distortion and uniformity testing. Edge brightness attenuation or color unevenness requires a white point chart under uniform illumination as a test board to evaluate the brightness attenuation or color unevenness of the APS at the edges. Focusing accuracy and analytical sharpness require testing using beveled edges or Siemens star charts to evaluate the reliability of the autofocus system and calculate sharpness using the edge spread function (ESF) to ensure accurate capture of image details.

[0068] To enable testing of APS static performance, the first pattern included in the first pattern layer 1210 includes at least one of a standard pattern card, a grayscale gradient pattern card, a geometric pattern, a white field pattern card, a star pattern card, a portrait pattern card, and a high-texture object pattern card.

[0069] It is understood that the shape of the first pattern included in the first pattern layer 1210 is not specifically limited. Based on the detachable connection between the first pattern layer 1210 and the substrate layer 110, the first pattern can be replaced. For example, when the first pattern includes a standard pattern card, the test pattern card 100 can test the color reproduction, dynamic performance, and EVS performance of the APS static performance. When the first pattern includes other patterns, the test pattern card 100 can test other corresponding static performance of the APS. Therefore, based on the test pattern card 100 including multiple first pattern layers 1210, different first pattern layers 1210 can be flexibly disassembled and replaced, thereby flexibly changing the first pattern and realizing diversified testing of the APS static performance.

[0070] APS dynamic performance includes frame rate and time response, noise characteristics, linearity, crosstalk, power consumption and thermal stability, and motion artifact suppression. Frame rate and time response require testing with a specific patterned chart, such as a high-speed rotating stripe chart. EVS performance includes dynamic response and time resolution, event detection threshold, dynamic range, noise and false event rate, motion direction and speed sensitivity, and multi-event superposition and conflict. Dynamic response and time resolution are tested using highly moving or rotating high-contrast black and white stripes; event detection threshold is tested using a moving grayscale gradient chart; dynamic range is tested using a moving uniform grayscale pattern; noise and false event rate are tested using a moving neutral gray or pure black pattern chart; motion direction and speed sensitivity are tested using black and white stripes moving at different angles at a controlled speed; and multi-event superposition and conflict are tested using two sets of orthogonally moving stripes.

[0071] In summary, the second pattern set in the second pattern layer 1220 is used to test the dynamic characteristics of APS and the characteristics of EVS. The second pattern can be set to be more complex. For example, the second pattern may include a central pattern and lines distributed around the central pattern and extending outward. The central pattern is a non-circular pattern and there are no intersections between the lines.

[0072] For example, the central pattern is a square or a five-pointed star, and each line can be connected to the central pattern at one end and extend outward to the edge of the first pattern at the other end.

[0073] The drive module 130 is used to drive the second pattern layer 1220 to rotate and / or move, and the corresponding rotation speed, movement speed, and movement trajectory (or movement angle) are adjustable. The second pattern layer 1220 rotating at different speeds and / or moving at different speeds and angles can be used to test the dynamic response and temporal resolution of the EVS; the second pattern layer 1220 rotating at different speeds can be used to test the frame rate and temporal response of the APS; the second pattern layer 1220 moving at different speeds and angles can be used to test the motion direction and speed sensitivity of the EVS; and the second pattern layer 1220 rotating at different speeds and moving at different speeds and angles can be used to test the multi-event superposition and conflict of the EVS.

[0074] The driving module 130 can drive the second pattern layer 1220 and the second pattern thereon to rotate, drive the second pattern layer 1220 and the second pattern thereon to move, and drive the second pattern layer 1220 and the second pattern thereon to rotate and move simultaneously. The corresponding driving structure can be flexibly designed according to actual needs. For details, please refer to the prior art, which will not be elaborated here.

[0075] In summary, this invention, using a test chart 100 comprising a first pattern layer 1210 and a second pattern layer 1220, allows for simultaneous testing of APS static performance, APS dynamic performance, and EVS performance, improving testing efficiency and providing more comprehensive results. Furthermore, the test chart 100 can also be used to test the performance of HVS, which integrates APS and EVS. Additionally, the test chart 100 can simultaneously test single or multiple APS, EVS, and HVS sensors. Therefore, the test chart 100 is suitable for performance testing of various image sensors such as APS, EVS, and HVS, offering better test compatibility and significantly improving testing efficiency.

[0076] The test pattern card provided in this embodiment of the utility model has a first pattern layer and a second pattern layer. The first pattern layer with the first pattern can be used for static performance testing of the image sensor, and the second pattern layer, which moves under the drive of the driving module, can be used for dynamic performance testing of the image sensor. Thus, the test pattern card can be used to test both the static and dynamic performance of the image sensor at the same time, thereby improving the efficiency of image sensor performance testing.

[0077] Figure 4 A schematic diagram of a test chart component provided in an embodiment of this utility model is shown below. Figure 4 As shown, the test pattern assembly includes the test pattern 100 and the back plate 200 described in any of the foregoing embodiments. The test pattern 100 is disposed on the back plate 200, and the back plate 200 is neutral gray in color.

[0078] The test pattern card 100 is detachably connected to the back plate 200. The connection between the test pattern card 100 and the back plate 200 is also designed with isolation and shock absorption, such as reducing the contact area or setting rubber pads. At the same time, at least one test pattern card 100 is provided on one back plate 200. If necessary, two or more test pattern cards 100 can be provided on the back plate 200.

[0079] It's important to note that neutral gray reduces interference from ambient light reflections (such as stray light and glare), preventing misjudgments by the sensor's metering system due to excessively bright or dark backgrounds. For example, a white background may cause overexposure or a halo effect, while a black background may absorb too much light, making it difficult to accurately assess noise in dark areas. Simultaneously, a neutral gray background can serve as a benchmark for white balance calibration, preventing interference from other colors on the measured color patch (such as ambient color temperature deviation or hue contamination). Image sensors can adjust the gain of each color channel using a neutral gray background to ensure accurate color reproduction in subsequent tests. Neutral gray can also serve as a benchmark for testing the dynamic range and signal-to-noise ratio of image sensors, acting as a midtone reference value to measure the linearity of the image sensor's response in transitional areas between light and dark regions. Furthermore, when the test chart contains high-contrast patterns (such as resolution line pairs or star charts), a neutral gray background can reduce visual fatigue for the human eye or algorithms while highlighting the details of the measured pattern.

[0080] It is understandable that the color of the back panel 200 is not limited to neutral gray; it can also be pure white, pure black, or other colors. The choice can be made flexibly according to actual needs, and no restrictions are imposed here.

[0081] In addition, a framing bounding box is marked on the backplate 200, and the movement range of the second pattern layer 1220 is within the framing bounding box. By marking the framing bounding box on the backplate 200, the position and field of view of the image sensor under test are calibrated, making the testing process and results more accurate and reliable.

[0082] The test chart assembly provided in this embodiment, consisting of a neutral gray backplate and test charts mounted on the backplate, can be used simultaneously for testing APS static performance, APS dynamic performance, EVS performance, and HVS performance, thereby improving the performance testing efficiency of image sensors.

[0083] Note that the above description is merely a preferred embodiment of the present invention and the technical principles employed. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments, and substitutions can be made without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments. Many other equivalent embodiments may be included without departing from the concept of the present invention, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. A test chart, characterized in that, The test pattern card includes a substrate layer, a pattern layer, and a driving module. The pattern layer includes a first pattern layer and a second pattern layer. The first pattern layer is disposed on the substrate layer and has a first pattern. The first pattern is used for static performance testing of the image sensor. The driving module is disposed on the substrate layer, and the second pattern layer is disposed on the driving module. The driving module is used to drive the second pattern layer to move. The second pattern layer has a second pattern. The second pattern in motion is used for dynamic performance testing of the image sensor.

2. The test chart according to claim 1, characterized in that, The substrate layer has a first surface and a second surface disposed opposite to each other, the first pattern layer is disposed on the first surface of the substrate layer, and the driving module is disposed on the first surface of the substrate layer.

3. The test chart according to claim 2, characterized in that, The first pattern layer is disposed around the second pattern layer, or the first pattern layer and the second pattern layer are disposed side by side.

4. The test chart according to claim 1, characterized in that, The substrate layer has a first surface and a second surface disposed opposite to each other, the first pattern layer is disposed on the first surface of the substrate layer, and the driving module is disposed on the second surface of the substrate layer.

5. The test chart according to claim 1, characterized in that, The substrate layer includes n+1 independent sub-sub-substrates, which are arranged side-by-side and spaced apart. The first pattern layer is disposed on one of the sub-sub-substrates. The test pattern card includes n driving modules. The pattern layer includes n second pattern layers. The n driving modules are disposed one-to-one on the other n sub-substrates, and the n second pattern layers are disposed one-to-one on the n driving modules, where n is an integer greater than or equal to 1.

6. The test chart according to claim 1, characterized in that, The drive module is used to drive the second pattern layer to rotate and / or move, and the corresponding rotation speed, movement speed and movement trajectory are adjustable.

7. The test chart according to claim 1, characterized in that, The first pattern layer is detachably connected to the substrate layer, the driving module is detachably connected to the substrate layer, and the second pattern layer is detachably connected to the driving module.

8. The test chart according to any one of claims 1-7, characterized in that, The first pattern is used for static performance testing of active pixel sensors, the second pattern is used for dynamic performance testing of active pixel sensors, and the second pattern is also used for performance testing of event vision sensors.

9. A test chart component, characterized in that, The test pattern assembly includes a test pattern and a backplate as described in any one of claims 1-8, wherein the test pattern is disposed on the backplate.

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