Anti-deviation positioning clamp for semiconductor test probe

Abstract

The utility model discloses semiconductor test probe anti -drifting positioning fixture applies in the technical field of clamp, including fixed base, the bottom of fixed base is provided with connecting seat, the inside sliding connection of connecting seat has the mounting seat, one side of mounting seat is provided with first clamping seat, the inside of first clamping seat is provided with second clamping seat, the symmetrical bolt of first clamping seat is connected with the sliding guide rod of mounting seat sliding connection, the buffer spring of sliding guide rod sleeve is set up between mounting seat and first clamping seat symmetry, the utility model discloses through first clamping seat upper installation with the sliding guide rod of mounting seat sliding connection, sleeve has the buffer spring on cooperation sliding guide rod top, can when the probe of the clamp top is pressed down by external stroke equipment, the probe can have certain buffer retraction space when contacting semiconductor, prevent probe and semiconductor direct rigid contact, avoid the emergence of both damaged situation.

Description

Technical Field

[0001] This utility model belongs to the field of fixture technology, and specifically relates to a semiconductor test probe anti-displacement positioning fixture. Background Technology

[0002] Semiconductor test probes are mainly used in the chip design verification, wafer testing, and finished product testing of semiconductors. They are core components that connect chips / wafers with test equipment for signal transmission and play an important role in the quality control of semiconductor products.

[0003] Currently, the installation of semiconductor test probes requires the use of positioning fixtures. These fixtures are used to mount the probes onto external travel devices. Traditional positioning fixtures can fine-tune the position of the probes to prevent errors during testing. However, there are still some problems in their use. For example, traditional positioning fixtures lack a downward pressure buffer structure. The distance the probe on the positioning fixture descends is adjusted by the operator, but even slight errors in the adjustment data can easily lead to hard contact between the probe and the semiconductor, affecting either the probe or the semiconductor. In addition, traditional positioning fixtures generally use bolts and nuts to fix the probes. Although this achieves a stable fixation, disassembly is relatively troublesome when the probe needs to be replaced, increasing the difficulty of replacement. Utility Model Content

[0004] The purpose of this invention is to provide a positioning fixture for preventing displacement of semiconductor test probes, which has the advantages of preventing pressure damage and being easy to disassemble.

[0005] The above-mentioned technical objective of this utility model is achieved through the following technical solution: a semiconductor test probe anti-offset positioning fixture, including a fixed base, a connecting base provided at the bottom of the fixed base, a mounting base slidably connected inside the connecting base, a first clamping base provided on one side of the mounting base, a second clamping base provided inside the first clamping base, sliding guide rods symmetrically bolted to the first clamping base and slidably connected to the mounting base, buffer springs symmetrically arranged between the mounting base and the first clamping base and sleeved on the sliding guide rods, slots provided on both sides of the second clamping base, and plugs slidably connected to both sides of the first clamping base and inserted into the slots, and a magnetic block magnetically attracted to the plugs fixed inside the slots.

[0006] The above technical solution is as follows: This utility model has a sliding guide rod mounted on the first clamping seat, which is slidably connected to the mounting seat. A buffer spring is sleeved on the sliding guide rod. When the probe on the clamp is pressed down by an external travel device, there is a certain upward buffering and retraction space when the probe contacts the semiconductor, preventing direct hard contact between the probe and the semiconductor and avoiding damage to both. This utility model also has a plug inserted into the first clamping seat and a slot on the second clamping seat. When the second clamping seat and the first clamping seat are engaged, the plug is inserted into the slot and held in place by a magnetic block in the slot, firmly securing the second clamping seat inside the first clamping seat. This facilitates probe disassembly and replacement while ensuring stable fixation.

[0007] The present invention is further configured such that a first adjusting screw is rotatably connected inside the fixed base, and an adjusting block fixedly connected to the connecting base is screwed onto the surface of the first adjusting screw.

[0008] The above technical solution is adopted: by designing a first adjusting screw, when the first adjusting screw is rotated, the adjusting block can be moved inside the fixed seat, thereby driving the connecting seat to make fine adjustments left and right.

[0009] The present invention is further configured such that a second adjusting screw is screwed to the back of the connecting seat, the second adjusting screw passing through the interior of the connecting seat and threadedly connected to the mounting seat.

[0010] Using the above technical solution: when the second adjusting screw is rotated, because the mounting base and the connecting base are slidably connected, the mounting base can move back and forth inside the connecting base under the action of the second adjusting screw, so as to achieve the purpose of fine adjustment of position.

[0011] The present invention is further configured such that a mounting sleeve is fixedly connected to the top of the fixed base, and the mounting sleeve is used in conjunction with the external travel device mounting part.

[0012] The above technical solution is adopted: the mounting sleeve is designed on the top of the fixed base for fixing with the external travel device, so that the whole clamp is fixed on the external travel device.

[0013] The present invention is further configured such that the first clamping seat has symmetrically provided limiting holes inside, and the second clamping seat has a limiting rod fixedly connected to the side of the limiting hole near the limiting hole, which is inserted into the limiting hole.

[0014] Using the above technical solution: when the first clamping seat and the second clamping seat are engaged, the limiting rod is inserted into the limiting hole, thereby achieving the purpose of limiting the second clamping seat.

[0015] The present invention is further configured such that a locking groove is provided on the side of the first clamping seat near the second clamping seat and the side of the second clamping seat near the first clamping seat, and a probe is engaged between the two locking grooves.

[0016] By adopting the above technical solution, when the probe is placed into the slot on the first and second clamping seats, the probe can be limited to prevent it from slipping out.

[0017] The present invention is further configured such that limiting blocks are symmetrically arranged on the top of the mounting base, and the limiting blocks are fixedly connected to the sliding guide rod.

[0018] The above technical solution is adopted: the limiting block is installed on the top of the sliding guide rod to limit the sliding guide rod and prevent it from falling out of the mounting base.

[0019] In summary, this utility model has the following beneficial effects:

[0020] 1. This utility model has a sliding guide rod installed on the first clamping seat and slidably connected to the mounting seat. A buffer spring is sleeved on the sliding guide rod. When the probe on the clamp is pressed down by the external travel device, there is a certain upward buffering space when the probe contacts the semiconductor, which prevents the probe from making direct hard contact with the semiconductor and avoids damage to both.

[0021] 2. This utility model has a first clamping seat with a plug inserted into it and a second clamping seat with a slot. When the second clamping seat and the first clamping seat are engaged, the plug is inserted into the slot and held in place by the magnetic block in the slot, so that the second clamping seat is firmly locked inside the first clamping seat. This not only facilitates the disassembly and replacement of the probe, but also ensures the stability of the fixation. Attached Figure Description

[0022] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0023] Figure 2 This is a sectional view of the fixing base of this utility model;

[0024] Figure 3 This is a partial structural schematic diagram of the present invention;

[0025] Figure 4 This is a partial structural schematic diagram of the present invention;

[0026] Figure 5 This is a partial exploded view of the structure of this utility model.

[0027] Reference numerals in the attached drawings: 1. Fixed seat; 2. Connecting seat; 3. Mounting seat; 4. First clamping seat; 5. Second clamping seat; 6. Sliding guide rod; 7. Buffer spring; 8. Slot; 9. Plug; 10. Magnetic block; 11. First adjusting screw; 12. Adjusting block; 13. Second adjusting screw; 14. Mounting sleeve; 15. Limiting hole; 16. Limiting rod; 17. Locking groove; 18. Probe; 19. Limiting block. Detailed Implementation

[0028] The present invention will be further described in detail below with reference to the accompanying drawings.

[0029] Example 1:

[0030] refer to Figure 1 , Figure 2 , Figure 3 , Figure 4 and Figure 5 A semiconductor test probe anti-offset positioning fixture includes a fixed base 1, with a mounting sleeve 14 fixedly attached to the top of the fixed base 1. The mounting sleeve 14 is used in conjunction with an external travel device mounting part. By setting the mounting sleeve 14, which is designed on the top of the fixed base 1, it is used to fix the fixture to the external travel device, thus fixing the entire fixture on the external travel device. A connecting base 2 is provided at the bottom of the fixed base 1. A first adjusting screw 11 is rotatably connected inside the fixed base 1. An adjusting block 12, which is fixedly connected to the connecting base 2, is screwed onto the surface of the first adjusting screw 11. By setting the first adjusting screw 11 and the adjusting block 12, the first adjusting screw 11 is designed so that when it is rotated, it can drive the adjusting block 12 to move inside the fixed base 1, thereby driving the connecting base 2 to perform left and right fine adjustment. A mounting base 3 is slidably connected inside the connecting base 2, and a second adjusting block 3 is screwed onto the back of the connecting base 2. The lead screw 13, the second adjusting lead screw 13, passes through the interior of the connecting seat 2 and is threadedly connected to the mounting seat 3. By setting the second adjusting lead screw 13, when the second adjusting lead screw 13 is rotated, the mounting seat 3 can move back and forth inside the connecting seat 2 under the action of the second adjusting lead screw 13, so as to achieve the purpose of fine adjustment of position. A first clamping seat 4 is provided on one side of the mounting seat 3. A second clamping seat 5 is provided inside the first clamping seat 4. A sliding guide rod 6 that is symmetrically bolted to the first clamping seat 4 and slidably connected to the mounting seat 3 is provided. A limit block 19 is symmetrically provided on the top of the mounting seat 3. The limit block 19 is fixedly connected to the sliding guide rod 6. By setting the limit block 19, the limit block 19 is installed on the top of the sliding guide rod 6 to limit the sliding guide rod 6 and prevent it from falling out of the mounting seat 3. A buffer spring 7 that is sleeved on the sliding guide rod 6 is symmetrically provided between the mounting seat 3 and the first clamping seat 4.

[0031] Example 2:

[0032] refer to Figure 1 andFigure 5 A semiconductor test probe anti-displacement positioning fixture includes a fixed base 1, a connecting base 2 at the bottom of the fixed base 1, a mounting base 3 slidably connected inside the connecting base 2, a first clamping base 4 on one side of the mounting base 3, and a second clamping base 5 inside the first clamping base 4. Both the first clamping base 4 and the second clamping base 5 have locking slots 17 on the side near the second clamping base 5 and the side of the second clamping base 5 near the first clamping base 4, respectively. A probe 18 is engaged between the two locking slots 17. By providing locking slots 17, when the probe 18 is placed into the locking slots 17 on the first clamping base 4 and the second clamping base 5, the probe 18 can be limited to prevent slippage. The first clamping base 4 has symmetrically arranged... The limiting hole 15 is provided. A limiting rod 16 that is inserted into the limiting hole 15 is fixedly connected to the side of the second clamping seat 5 near the limiting hole 15. By setting the limiting hole 15 and the limiting rod 16, when the first clamping seat 4 and the second clamping seat 5 are engaged, the limiting rod 16 is inserted into the limiting hole 15, thereby achieving the purpose of limiting the second clamping seat 5. A sliding guide rod 6 that is symmetrically bolted to the first clamping seat 4 and slidably connected to the mounting seat 3 is provided. A buffer spring 7 that is sleeved on the sliding guide rod 6 is symmetrically arranged between the mounting seat 3 and the first clamping seat 4. Slots 8 are opened on both sides of the second clamping seat 5. A plug 9 that is inserted into the slot 8 is slidably connected to both sides of the first clamping seat 4. A magnetic block 10 that is magnetically attracted to the plug 9 is fixedly connected inside the slot 8.

[0033] Brief description of usage: The fixture is installed on the external travel device via the mounting sleeve 14. When it is necessary to test the semiconductor, under the action of the sliding guide rod 6 and the buffer spring 7, the probe 18 on the fixture can be pressed down by the external travel device. When the probe 18 contacts the semiconductor, there is a certain upward buffering and retraction space to prevent the probe 18 from making direct hard contact with the semiconductor and avoid damage to both. A plug 9 is inserted into the first clamping seat 4, and a slot 8 is opened on the second clamping seat 5. When the second clamping seat 5 is engaged with the first clamping seat 4, the plug 9 is inserted into the slot 8 and attracted by the magnetic block 10 in the slot 8, so that the second clamping seat 5 is firmly locked inside the first clamping seat 4. This not only facilitates the disassembly and replacement of the probe 18, but also ensures the stability of the fixation.

[0034] This specific embodiment is merely an explanation of the present utility model and is not intended to limit the present utility model. After reading this specification, those skilled in the art can make modifications to this embodiment without contributing any inventive step, but as long as they are within the scope of the claims of the present utility model, they are protected by patent law.

Claims

1. A semiconductor test probe anti-offset positioning fixture, comprising a fixing base (1), characterized in that: The bottom of the fixed base (1) is provided with a connecting base (2), and the connecting base (2) is slidably connected with a mounting base (3). A first clamping base (4) is provided on one side of the mounting base (3), and a second clamping base (5) is provided inside the first clamping base (4). A sliding guide rod (6) that is slidably connected to the mounting base (3) is symmetrically bolted on the first clamping base (4). A buffer spring (7) that is sleeved on the sliding guide rod (6) is symmetrically provided between the mounting base (3) and the first clamping base (4). Slots (8) are provided on both sides of the second clamping base (5). A plug (9) that is inserted into the slot (8) is slidably connected on both sides of the first clamping base (4). A magnetic block (10) that is magnetically attracted to the plug (9) is fixed inside the slot (8).

2. The semiconductor test probe anti-displacement positioning fixture according to claim 1, characterized in that: The fixed base (1) is rotatably connected to a first adjusting screw (11), and the surface of the first adjusting screw (11) is screwed with an adjusting block (12) that is fixed to the connecting base (2).

3. The semiconductor test probe anti-displacement positioning fixture according to claim 1, characterized in that: The back of the connecting seat (2) is screwed with a second adjusting screw (13), which passes through the interior of the connecting seat (2) and is threadedly connected to the mounting seat (3).

4. The semiconductor test probe anti-displacement positioning fixture according to claim 1, characterized in that: The top of the fixed base (1) is fixedly connected to the mounting sleeve (14), which is used in conjunction with the external travel device mounting part.

5. The semiconductor test probe anti-displacement positioning fixture according to claim 1, characterized in that: The first clamping seat (4) has symmetrically provided limiting holes (15) inside, and the second clamping seat (5) has a limiting rod (16) that is inserted into the limiting hole (15) on the side near the limiting hole (15).

6. The semiconductor test probe anti-displacement positioning fixture according to claim 1, characterized in that: The first clamping seat (4) is provided with a locking groove (17) on the side of the second clamping seat (5) and the second clamping seat (5) is provided with a locking groove (17) on the side of the first clamping seat (4). A probe (18) is engaged between the two locking grooves (17).

7. The semiconductor test probe anti-displacement positioning fixture according to claim 1, characterized in that: The top of the mounting base (3) is symmetrically provided with limiting blocks (19), and the limiting blocks (19) are fixedly connected to the sliding guide rod (6).

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