Automatic particle sampling device
By introducing anti-accumulation, anti-stacking, and anti-tilting structures into the sampling device, the problems of material accumulation and spillage are solved, thereby improving the stability and accuracy of the sampling device and ensuring the efficient operation of the sampling process.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- LUOYANG PLUS AUTOMATION TECH EQUIP CO LTD
- Filing Date
- 2025-06-27
- Publication Date
- 2026-06-19
AI Technical Summary
Existing automatic particle sampling devices are prone to material accumulation and scattering on the hopper and extension arm, resulting in material overflow or scattering, which affects sampling accuracy and efficiency.
The device employs an anti-accumulation, anti-stallization, and anti-tipping structure, including a guide plate, an arc-shaped or conical baffle plate, and a support plane, to prevent materials from overflowing, accumulating, and scattering on the hopper and extension arm. The guide plate guides the material, the arc-shaped baffle plate bounces the material back, and the support plane stabilizes the hopper, ensuring the stability and accuracy of the sampling device.
It effectively prevents materials from overflowing, accumulating, and scattering on the hopper and extension arm, improving the stability and detection accuracy of the sampling device, reducing material waste, and enhancing operational convenience.
Smart Images
Figure CN224382876U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of detection equipment technology, and in particular to an automatic particle sampling device. Background Technology
[0002] In the production and manufacturing of fuels, food, medicinal materials, building materials, etc., raw materials need to be made into pellets to meet usage requirements. The main methods of pelletizing include granulation and crushing. In the granulation process, the raw materials are usually small particles or powders with uniform particle size. By controlling parameters, the particle size can be controlled. In the crushing process, there are often problems such as irregular shape of raw material blocks and poor internal uniformity of raw material blocks. It is necessary to sample and test the pellets obtained from crushing.
[0003] To facilitate sampling, those skilled in the art have developed various sampling devices, including hopper sampling and sampling channel sampling. For sampling via a sampling channel, a discharge port is installed on the side of the main channel, and the sampling and discharge are controlled by a valve. For sampling via a hopper, the hopper is driven by a robotic arm, enabling multi-degree-of-freedom movements and automatically conveying the material to the testing equipment.
[0004] Existing automatic particle sampling devices include a receiving arm, a working part of which is equipped with an extension arm, and a hopper at the end of the extension arm. The hopper is moved to a hopper by the robot and the extension arm for material collection. A material collection port that matches the hopper is machined on the side of the hopper to facilitate material collection. During use, material accumulates in the hopper and the extension arm, which causes it to spill outside the material collection port. Utility Model Content
[0005] The purpose of this invention is to overcome the shortcomings of the existing technology and provide an automatic particle sampling device.
[0006] This utility model is achieved through the following technical solution: an automatic particle sampling device, including a robotic arm, the working part of which is provided with an extension arm, the end of which is provided with a hopper, the hopper being connected to an anti-accumulation structure, the anti-accumulation structure including an anti-overflow structure provided at the hopper and an anti-stacking structure provided on the extension arm.
[0007] Furthermore, the anti-overflow structure includes a guide plate disposed at the opening of the hopper, the guide plate being arranged in a ring around the opening of the hopper, with the outer ends of the guide plates close to each other.
[0008] Furthermore, the anti-stacking structure includes an anti-stacking surface disposed at the end of the extension arm, the anti-stacking surface being an upward-facing arc or cone shape.
[0009] Furthermore, an anti-tipping structure is provided between the hopper and the extension arm. The anti-tipping structure includes a support plane provided at the end of the extension arm. The hopper is provided with a bottom plate that cooperates with the support plane. The bottom plate can fit against the support plane.
[0010] Furthermore, the extension arm is also provided with an anti-scattering structure, which has a rebound surface facing the hopper.
[0011] The beneficial effects of this utility model are as follows: the anti-accumulation structure includes an anti-overflow structure set at the hopper and an anti-stacking structure set on the extension arm. The anti-overflow structure prevents material from overflowing from the hopper opening, and the anti-stacking structure prevents material from accumulating on the extension arm, thereby avoiding material spillage during the movement of the hopper. Attached Figure Description
[0012] Figure 1 This is a schematic diagram of the structure of Example 1;
[0013] Figure 2 This is a schematic diagram of the extension arm structure in Example 1;
[0014] Figure 3 This is a schematic diagram of the hopper structure in Example 1;
[0015] Figure 4 This is a schematic diagram of the cross-section of the hopper in Example 1;
[0016] Figure 5 This is a schematic diagram of the extension arm structure in Example 2;
[0017] Figure 6 This is a schematic diagram of the bracket structure in Example 2;
[0018] Figure 7 This is a schematic diagram of the extension arm structure in Example 3.
[0019] The components include: 1. robotic arm; 2. hopper; 3. material handling port.
[0020] 4. Extension arm; 401. Extension section; 402. Support plate; 403. Connection hole one; 404. Side plate; 405. End plate; 406. Connection port;
[0021] 5. Feed hopper; 501. Base plate; 502. Guide plate; 503. Connecting hole two;
[0022] 6. Material baffle; 7. Sealing plate; 8. Rebound plate. Detailed Implementation
[0023] In the description of this utility model, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.
[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present utility model.
[0025] Example 1
[0026] like Figure 1-4 As shown, an automatic particle sampling device includes a robotic arm 1, which is a five-axis robotic arm 1, enabling the hopper 5 to move in multiple degrees of freedom. The working part of the robotic arm 1 is equipped with an extension arm 4, which moves the robotic arm 1 away from the hopper 2, reducing the damage to the robotic arm 1 caused by dust and vibration. The end of the extension arm 4 is equipped with the hopper 5, with the opening of the hopper 5 facing upwards. The hopper 2 is a discharge hopper, and the hopper 5 picks up material by receiving it. A material inlet 3 is machined on the side wall of the hopper 2 to cooperate with the hopper 5. The robotic arm 1 drives the hopper 5 to extend into the hopper 2 through the material inlet 3 to receive the material. After receiving the material, the robotic arm 1 drives the hopper 5 to move out of the material inlet 3, and then moves the hopper 5 to the testing equipment. The hopper 5 is flipped over to pour the extracted material into the testing equipment, and then particle size is detected.
[0027] The feeding hopper 5 is connected to an anti-accumulation structure, which includes an anti-overflow structure installed at the feeding hopper 5. In this embodiment, the anti-overflow structure includes guide plates 502 installed at the opening of the feeding hopper 5. The guide plates 502 are distributed in a ring along the opening of the feeding hopper 5, with their outer ends close to each other. The opening of the feeding hopper 5 faces upward, and the outer end of the guide plates 502 refers to the upper end of the guide plates 502, that is, the end facing the receiving direction. The upper ends of the guide plates 502 are close to each other, resulting in a feeding hopper 5 with a large volume at the lower end and a small volume at the upper end. During the material feeding process, when the material exceeds the opening of the feeding hopper 5, it will not accumulate in large quantities at the opening of the feeding hopper 5, and more gaps will be formed at the lower end of the feeding hopper 5. During subsequent movement, the material will move downward to fill the gaps, thereby reducing the material accumulation height and preventing the material from overflowing outside the feeding hopper 5 during the movement. During the test, a pressure sensor was installed at the lower end of the feeding hopper 5 to detect the weight inside the feeding hopper 5. However, the installation of the pressure sensor made the connection stability of the feeding hopper 5 worse, making it easy to shake and resulting in poor detection accuracy.
[0028] The anti-accumulation structure also includes an anti-stacking structure installed on the extension arm 4. In this embodiment, the extension arm 4 is made of a rectangular tube and has high resistance to bending deformation. The anti-stacking structure includes an anti-stacking surface installed at the end of the extension arm 4. The anti-stacking surface is an upward arc or cone shape. Specifically, a baffle plate 6 is fixed at the end of the extension arm 4. The baffle plate 6 is a stainless steel plate. The baffle plate 6 is bent into an arc shape to bounce the material falling to the end of the extension arm 4 and prevent it from accumulating on the extension arm 4, thereby preventing it from scattering during movement. A sealing plate 7 is also installed at the end of the baffle plate 6 to prevent material from entering the cavity formed by the baffle plate 6.
[0029] An anti-tilting structure is also installed between the hopper 5 and the extension arm 4. The anti-tilting structure includes a support plane formed at the end of the extension arm 4. In this embodiment, the extension arm 4 is made of a rectangular tube, thus forming its own support plane. The lower end of the hopper 5 has a base plate 501 that matches the support plane. The base plate 501 can fit against the support plane, thereby preventing the hopper 5 from tilting. The base plate 501 and the guide plate 502 are integrally formed. A second connection hole 503 is machined on the base plate 501, and a first connection hole 403 is machined on the extension arm 4. The first connection hole 403 and the second connection hole 503 are connected by bolts, thereby pressing the base plate 501 against the support plane to prevent the hopper 5 from tilting and to prevent stress concentration on the bolts during the overturning process.
[0030] Example 2
[0031] like Figure 5-6As shown, an automatic particle sampling device differs from Embodiment 1 in that the extension arm 4 includes an extension section 401 made of a round tube and a transverse support plate 402 fixedly connected to the end of the extension section 401. The upper end surface of the support plate 402 forms a support plane, and side plates 404 are connected to both sides of the lower end surface of the support plate 402. The lower end of the side plates 404 is inclined inward, which can improve the bending strength of the support plate 402. End plates 405 are fixedly connected between the two ends of the side plates 404 and the support plate 402. One of the end plates 405 is fixed to the extension section 401. A connection port 406 is also processed on the end plate 405. A connecting plate is fixed at the end of the extension section 401. The connecting plate seals the extension section 401. The connecting plate is fitted and fixed to the end plate 405. Welding is performed at the outer edge of the connection between the connecting plate and the end plate 405 and at the connection port 406 to improve the connection stability. A connection hole 403 is processed on the support plate 402.
[0032] Example 3
[0033] like Figure 7 As shown, an automatic particle sampling device differs from Embodiments 1 and 2 in that an anti-scattering structure is also installed on the extension arm 4. The anti-scattering structure has a rebound surface facing the feeding hopper 5. Specifically, the anti-scattering structure includes a rebound plate 8 installed on the extension arm 4. The rebound plate 8 is a stainless steel plate, and the inner side of the rebound plate 8 forms a rebound surface. During the feeding process of the feeding hopper 5 receiving material, the feeding hopper 5 is tilted upwards to avoid accumulation at the opening of the feeding hopper 5. After the material is collected, the feeding hopper 5 is laid flat and removed through the feeding port 3, which can effectively prevent material overflow. However, the material will splash out from the feeding port 3. The rebound plate 8 will rebound the material into the hopper 2, thereby reducing scattering.
[0034] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. An automatic particle sampling device, comprising a robotic arm, wherein the working part of the robotic arm is provided with an extension arm, and the end of the extension arm is provided with a hopper, characterized in that, The hopper is connected to an anti-accumulation structure, which includes an anti-overflow structure at the hopper and an anti-stacking structure on the extension arm.
2. The automatic particle sampling device according to claim 1, characterized in that, The anti-overflow structure includes a guide plate disposed at the opening of the hopper, the guide plate being arranged in a ring around the opening of the hopper, with the outer ends of the guide plates close to each other.
3. The automatic particle sampling device according to claim 1, characterized in that, The anti-stacking structure includes an anti-stacking surface disposed at the end of the extension arm, the anti-stacking surface being an upward-facing arc or cone shape.
4. The automatic particle sampling device according to claim 1, characterized in that, An anti-tilting structure is also provided between the hopper and the extension arm. The anti-tilting structure includes a support plane at the end of the extension arm. The hopper is provided with a bottom plate that cooperates with the support plane. The bottom plate can fit against the support plane.
5. The automatic particle sampling device according to claim 1, characterized in that, The extension arm is also equipped with an anti-scattering structure, which has a rebound surface facing the hopper.