A film heat distortion testing apparatus

By designing an adjustable clamping part and heating chamber for testing the thermal deformation of thin films, the problem that existing equipment cannot adapt to thin film samples of different lengths has been solved, and efficient and accurate thermal shrinkage rate measurement has been achieved.

CN224383181UActive Publication Date: 2026-06-19CHANGZHOU BIOLEGEEN ECOTECH MATERIAL CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
CHANGZHOU BIOLEGEEN ECOTECH MATERIAL CO LTD
Filing Date
2025-08-15
Publication Date
2026-06-19

AI Technical Summary

Technical Problem

Existing thin film heat distortion testing equipment cannot effectively adjust the fixtures to accommodate thin film samples of different lengths, thus limiting the applicability of the testing equipment.

Method used

A thin film thermal deformation detection device was designed, comprising an adjustable clamping part and a heating chamber. The device achieves flexible adjustment of the clamp and adaptive fixation of the thin film through components such as electric cylinders, air cylinders and magnets, and performs accurate measurements by combining encoders and temperature sensors.

Benefits of technology

It enables the detection of thermal shrinkage rate of thin film samples of different lengths, improving the applicability and measurement accuracy of the equipment.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application discloses a kind of film thermal deformation detection equipment, belong to film performance detection equipment technical field.Mainly including box, the box has platform, the upper end of platform is installed with stand, the lower end of stand has gap, electric cylinder is installed in the upper end of stand, first clamping part is installed in the output end of electric cylinder, second clamping part is arranged in the lower end of first clamping part, traction line is fixedly arranged in the lower end of second clamping part, encoder is installed on platform, the encoder has rotating wheel, rotating shaft is installed in gap, winding wheel is installed on rotating shaft, weight is installed in the end of traction line.The film thermal deformation detection equipment of the application, by being provided with adjustable clamping part, so that when the thermal shrinkage of different length film samples is detected, the length of film can be adjusted according to the length of film.
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Description

Technical Field

[0001] This application relates to the technical field of thin film performance testing equipment, specifically a thin film thermal deformation testing equipment. Background Technology

[0002] Thin film heat distortion testing equipment is a key tool for evaluating the performance changes of thin film materials under heating conditions. The main measurement parameters include heat shrinkage rate, heat shrinkage force, cold shrinkage force, heat distortion temperature and coefficient of thermal expansion.

[0003] Polymer films, including synthetic and natural polymer films, are widely used in packaging, electronics, automotive, and construction industries. Most polymer films have a certain degree of heat shrinkage, which affects the packaging performance of the film. A suitable heat shrinkage rate can make the packaged product look full, tight, and fit well. A stable heat shrinkage rate is also necessary to maintain the uniformity of the packaged product size. Therefore, quantitative detection of heat shrinkage rate is of great significance.

[0004] For example, patent CN115479969 A discloses a device for measuring the heat shrinkage performance of a thin film. This patent includes a base, a main frame, a sample mounting assembly, and a heat insulation cover. The heat insulation cover is equipped with a heating element. When the heat insulation cover is lowered, it closes the mounting space. The sample mounting assembly includes a horizontal hanging rod, a sample guide rod, an upper clamp, and a lower clamp. The base is equipped with a displacement sensor corresponding to the sample guide rod to detect the displacement of the lower end of the sample. The upper clamp is mounted on the horizontal hanging rod and is spaced apart from the sample guide rod. A tension sensor is provided on the base, and the lower clamp is connected to the tension sensor.

[0005] While the aforementioned patent can detect film shrinkage, it cannot effectively adjust the film sample length when it exceeds the distance between the two sets of clamps, requiring clamp replacement. This reduces the applicability of the testing equipment. Therefore, it is necessary to provide a film thermal deformation detection device to solve the above problems.

[0006] It should be noted that the information disclosed in this background section is only for understanding the background technology of this application concept, and therefore may include information that does not constitute prior art. Utility Model Content

[0007] Based on the aforementioned problems in the existing technology, the problem to be solved by this application is to provide a thin film thermal deformation testing device that can adaptively adjust the fixture according to the length of the film when testing the thermal shrinkage rate of thin film samples of different lengths.

[0008] The technical solution adopted by this application to solve its technical problem is as follows: a thin film heat deformation detection device, including a box body, the box body having a platform, a column installed at the upper end of the platform, and a notch at the lower end of the column; an electric cylinder installed at the upper end of the column; a first clamping part installed at the output end of the electric cylinder; a second clamping part disposed at the lower end of the first clamping part, and a traction line fixedly installed at the lower end of the second clamping part; an encoder installed on the platform, the encoder having a rotating wheel; a rotating shaft rotatably installed in the notch, and a winding wheel installed on the rotating shaft; and a weight installed at the end of the traction line.

[0009] Furthermore, two sets of slide rails are fixedly installed on the upper end of the platform, and two sets of sliders are slidably installed on the two sets of slide rails. The two sets of sliders are arranged opposite to each other, and a slide rod is fixedly installed on each set of sliders. A bottom sealing plate is fixedly installed on one set of slide rods on the same side. A shielding cloth is fixedly installed on the upper end of the bottom sealing plate, and a top sealing plate is fixedly installed on the upper end of the shielding cloth. An electric heating plate is provided on the bottom sealing plate.

[0010] Furthermore, the platform is equipped with two sets of cylinders, and the output ends of the two sets of cylinders are respectively connected to the slider.

[0011] Furthermore, both the bottom sealing plate and the top sealing plate are provided with clearance holes.

[0012] Furthermore, the inner sides of the two sets of slide rods are provided with magnets that attract each other.

[0013] Furthermore, a temperature sensor is provided on the top sealing plate.

[0014] Furthermore, the top sealing plate is fixedly installed to the upper end of the slide rod.

[0015] Furthermore, the top sealing plate is slidably mounted on the slide rod.

[0016] The beneficial effects of this application are: the thin film heat deformation testing device provided by this application, by setting an adjustable clamping part, allows the clamp to be adaptively adjusted according to the length of the film when testing the heat shrinkage rate of thin film samples of different lengths.

[0017] In addition to the purposes, features, and advantages described above, this application has other purposes, features, and advantages. A further detailed description of this application will be provided below with reference to the figures. Attached Figure Description

[0018] The accompanying drawings, which form part of this application, are used to provide a further understanding of this application. The illustrative embodiments and descriptions of this application are used to explain this application and do not constitute an undue limitation of this application. In the drawings:

[0019] Figure 1 This is an overall schematic diagram of a thin film thermal deformation testing device according to this application;

[0020] Figure 2 for Figure 1 A partial structural diagram at point A in the middle;

[0021] Figure 3 This is an overall schematic diagram of the heating mechanism in a thin film thermal deformation testing device according to this application;

[0022] The following are the labeling elements in the figure:

[0023] 1. Housing; 2. Display screen; 3. Switch; 4. Column; 5. Electric cylinder; 6. First clamping part; 7. Membrane; 8. Bracket; 9. Encoder; 91. Rotary wheel; 10. Second clamping part; 11. Threading hole; 12. Shaft; 13. Traction line; 14. Rewinding wheel; 15. Weight; 16. Slide rail; 17. Slider; 18. Shelter cloth; 19. Slide rod; 20. Top sealing plate; 21. Clearance hole; 22. Platform; 23. Bottom sealing plate. Detailed Implementation

[0024] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0025] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0026] like Figures 1-2 As shown, this application provides a thin film heat deformation testing device for detecting the thermal shrinkage rate of thin films. The thin film heat deformation testing device includes a housing 1, and a PLC control system is installed inside the housing 1. The PLC control system is used to control the coordinated operation of various electrical components in this application. The PLC control system has a display screen 2 and a switch 3 installed on the housing 1 to facilitate the control of the testing process and to understand the testing results at any time.

[0027] Meanwhile, a platform 22 is fixedly installed at the upper end of the box 1. A column 4 is fixedly installed at the upper end of the platform 22. An electric cylinder 5 is fixedly installed at the upper end of the column 4. The output end of the electric cylinder 5 is vertically downward and hinged to a first clamping part 6. A thin film 7 is clamped on the first clamping part 6.

[0028] It is understandable that when it is necessary to test the heat shrinkage rate of film 7, one end of film 7 is first clamped on the first clamping part 6. Then, according to the length of film 7, the first clamping part 6 is moved vertically by the electric cylinder 5 so that the position of the first clamping part 6 is adapted to the length of film 7. At this time, the lower end of film 7 is in a free hanging state.

[0029] Continue to refer to Figures 1-2 A second clamping part 10 is provided at the lower end of the first clamping part 6. The second clamping part 10 is used to clamp the lower end of the film 7. At the same time, a thread hole 11 is provided at the lower end of the second clamping part 10, and a traction wire 13 is fixedly installed in the thread hole 11.

[0030] Meanwhile, a notch (not shown in the figure) is provided at the lower end of the column 4. A rotating shaft 12 is rotatably installed in the notch. A winding wheel 14 is fixedly installed on the rotating shaft 12, so that the traction line 13 can be wrapped around the winding wheel 14 from the upper end. A weight 15 is detachably installed at the end of the traction line 13.

[0031] Furthermore, a bracket 8 is fixedly installed on the platform 22, and an encoder 9 is installed on the upper end of the bracket 8. The output end of the encoder 9 has a rotating wheel 91, so that the encoder 9 obtains the angular displacement through the rotation angle of the rotating wheel 91 and converts it into an electrical signal for counting.

[0032] In this application, the traction line 13 is wrapped around the outer ring of the rotating wheel 91 and passes through the bottom of the rotating wheel 91 to the winding wheel 14. At the same time, due to the presence of the weight 15, the traction line 13 is kept taut, thereby straightening the film 7 by a certain force and keeping the film 7 in its initial state.

[0033] It should be noted that the weight of the first clamping part 6 and the second clamping part 10 is much lower than the weight of the weight 15. Therefore, after the traction line 13 is tightened, it can be in a vertical state or at a certain angle to the vertical plane, neither of which will affect the measurement result.

[0034] In order to heat the thin film 7 to a preset temperature, such as Figure 3 As shown, two sets of slide rails 16 are fixedly installed on the upper end of the platform 22, and two sets of sliders 17 are slidably installed on the two sets of slide rails 16. The two sets of sliders 17 are arranged opposite to each other, and a slide rod 19 is fixedly installed on each set of sliders 17.

[0035] It should be noted that two sets of cylinders (not shown in the figure) can be set on the platform 22. The output ends of the two sets of cylinders are respectively connected to the slider 17. Thus, under the drive of the two sets of cylinders, the two sets of sliders 17 can move closer or further away from each other, thereby driving the slide rod 19 to move synchronously.

[0036] Continue to refer to Figure 3 A bottom sealing plate 23 is fixedly installed on a set of sliding rods 19 on the same side. A shielding cloth 18 is fixedly installed on the upper end of the bottom sealing plate 23. A top sealing plate 20 is fixedly installed on the upper end of the shielding cloth 18. The top sealing plate 20 is fixedly installed on the upper end of the sliding rod 19.

[0037] Meanwhile, an electric heating plate (not shown in the figure) is provided on the bottom sealing plate 23. When the two sets of sliding rods 19 approach each other, the shielding cloths 18 on both sides approach each other and form a heating chamber. At this time, the electric heating plate is powered on and heated, which raises the temperature in the heating chamber and heats the film 7.

[0038] Furthermore, clearance holes 21 are provided on both the bottom sealing plate 23 and the top sealing plate 20 to allow clearance between the second clamping part 10 and the first clamping part 6, respectively. Although the clearance holes can lose some heat, they are small and therefore will not affect the overall heating of the film 7.

[0039] Meanwhile, magnets that attract each other can be provided on the inner side of the two sets of slide rods 19 so that when the shielding cloths 18 on both sides come close to each other, the sealing of the heating chamber is better, and the film 7 can be heated quickly.

[0040] Furthermore, once the test is completed, the two sets of shielding cloths 18 are moved away from each other, which not only facilitates the handling of the film 7, but also allows the heat of the test area to be dissipated quickly to prevent it from affecting the next measurement.

[0041] In summary, when it is necessary to test the heat shrinkage rate of the film 7, the film 7 is clamped by the first clamping part 6 and the second clamping part 10, and then a weight 15 of appropriate weight is installed so that the film 7 is taut under a certain tension. At this time, the encoder 9 performs the first count.

[0042] Then, control the two sides of the shielding cloth 18 to move closer to each other to form a heating chamber, and turn on the electric heating plate to heat the film 7. Of course, a temperature sensor can be set on the top sealing plate 20 so that the film 7 reaches the preset temperature.

[0043] As the temperature rises, the diaphragm 7 will shrink and drive the traction line 13 to move upward synchronously. Due to the friction between the taut traction line 13 and the rotating wheel 91, the rotating wheel 91 will rotate at a certain angle and be fed back to the encoder 9 via an electrical signal. When the diaphragm 7 is stable, the encoder 9 will perform a second count.

[0044] The thermal shrinkage rate of film 7 can be calculated by comparing the values ​​of the first and second counts.

[0045] In this application, the length of the heating chamber can be adjusted by sliding the top sealing plate 20 on the slide rod 19, thereby adapting to the detection of films 7 of different lengths. In order to fix the top sealing plate 20 at different positions, it can be controlled by installing a cylinder on the slide rod 19, or by opening multiple positioning holes along the height direction on the slide rod 19. Of course, other control methods can also be used, which are not limited here.

[0046] Of course, in this application, the film 7 can also be heated by pumping hot air, which can also achieve the effect of raising the temperature of the film 7.

[0047] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A thin film thermal deformation testing device, characterized in that: include: The box (1) has a platform (22) with a column (4) installed at the upper end of the platform (22) and a notch at the lower end of the column (4); An electric cylinder (5) is installed at the upper end of the column (4); A first clamping part (6) is installed at the output end of the electric cylinder (5); The second clamping part (10) is disposed at the lower end of the first clamping part (6), and a traction line (13) is fixedly disposed at the lower end of the second clamping part (10). An encoder (9) is mounted on the platform (22) and has a wheel (91). A rotating shaft (12) is rotatably mounted in the notch, and a winding wheel (14) is mounted on the rotating shaft (12). A weight (15) is installed at the end of the traction line (13).

2. The thin film thermal deformation testing device according to claim 1, characterized in that: Two sets of slide rails (16) are fixedly installed on the upper end of the platform (22). Two sets of sliders (17) are slidably installed on the two sets of slide rails (16). The two sets of sliders (17) are arranged opposite to each other. Each set of sliders (17) is fixedly installed with a slide rod (19). A bottom sealing plate (23) is fixedly installed on a set of sliding rods (19) on the same side. A shielding cloth (18) is fixedly installed on the upper end of the bottom sealing plate (23). A top sealing plate (20) is fixedly installed on the upper end of the shielding cloth (18). An electric heating plate is provided on the bottom sealing plate (23).

3. The thin film thermal deformation testing device according to claim 2, characterized in that: The platform (22) is equipped with two sets of cylinders, and the output ends of the two sets of cylinders are respectively connected to the slider (17).

4. The thin film thermal deformation testing device according to claim 2, characterized in that: Both the bottom sealing plate (23) and the top sealing plate (20) are provided with clearance holes (21).

5. A thin film thermal deformation testing device according to claim 2, characterized in that: The inner sides of the two sets of slide bars (19) are provided with magnets that attract each other.

6. The thin film thermal deformation testing device according to claim 2, characterized in that: A temperature sensor is provided on the top sealing plate (20).

7. A thin film thermal deformation testing device according to claim 2, characterized in that: The top sealing plate (20) is fixedly installed at the upper end of the slide bar (19).

8. A thin film thermal deformation testing device according to claim 2, characterized in that: The top sealing plate (20) is slidably mounted on the slide rod (19).