A sensor chip testing fixture

Abstract

This utility model discloses a sensor chip testing fixture, including a base on which a lifting device that moves up and down is fixedly mounted. The lifting device is characterized in that its output end is detachably connected to a pressure plate that moves up and down, and a pin testing section is detachably connected to the pressure plate. A chip fixing section is also detachably connected to the base, located below the pressure plate. The advantages of this utility model are: by setting the chip fixing section, the chip under test and its output pins can be fixed; the pin testing section facilitates electrical connection between the pins of the chip under test and the control board for measurement purposes; the lifting device enables the pin testing section to move up and down, facilitating chip replacement and measurement; and by setting a first chip limiting groove, the bottom and circumferential aspects of the chip can be fixed, and with the help of the elastic column, the upper part of the chip can be further positioned, thus achieving circumferential and axial positioning of the chip under test.

Description

Technical Field

[0001] This utility model relates to the field of chip testing, and in particular to a sensor chip testing fixture. Background Technology

[0002] Patent CN114305360A, entitled "Intelligent Driving Device for Blood Pressure or Hemodynamic Detection Sensor," describes a non-invasive hemodynamic monitoring device that uses a bracelet-like measuring instrument. This device presses on the radial artery at the wrist, and the sensor detects the radial artery's pulsation. The sensor contains a data measurement chip. To test whether the chip's pins are connected to the chip, we typically use a multimeter or solder leads to the output pins to the sensor's circuit board to measure whether the voltage output in a zero-voltage state meets the requirements. However, due to the small size of the chip and the numerous, even smaller pins, both measurement methods are inefficient. Therefore, we propose a sensor chip testing fixture to solve the aforementioned technical problems. Utility Model Content

[0003] The purpose of this invention is to overcome the shortcomings of the prior art and provide a sensor chip testing fixture.

[0004] The objective of this utility model is achieved through the following technical solution:

[0005] A sensor chip testing fixture includes a base, on which a lifting device that moves up and down is fixedly mounted. The output end of the lifting device is detachably connected to a pressure plate that moves up and down, and a pin testing part is detachably connected to the pressure plate. A chip fixing part is also detachably connected to the base, and the chip fixing part is located below the pressure plate.

[0006] A further technical solution is that the pin testing section includes a connecting plate connected to the pressure plate, and the connecting plate is provided with test pins.

[0007] A further technical solution is that the test needle includes a fixed needle, a movable needle, and an elastomer. The fixed needle is fixed inside the connecting plate, and the bottom of the fixed needle is hollow. One end of the movable needle is located inside the fixed needle, and the other end of the movable needle passes through the connecting plate and extends outside the connecting plate. The fixed needle is also provided with an elastomer connected to the movable needle.

[0008] A further technical solution is that the chip fixing part includes a chip fixing plate disposed on the base, the chip fixing plate is provided with a first chip limiting groove, one end of the first chip limiting groove is provided with a chip limiting hole, and the other end of the first chip limiting groove is also provided with a step for supporting the chip pins.

[0009] A further technical solution is that the pressure plate is provided with a second chip limiting groove, and the second chip limiting groove corresponds to the first chip limiting groove. An elastic column is also provided in the second chip limiting groove.

[0010] A further technical solution is that the base is equipped with an electronic control board, and the tip of the test probe is electrically connected to the input end of the electronic control board.

[0011] Compared with the prior art, the beneficial effects of this utility model are:

[0012] 1. This utility model can fix the chip under test and its output pins by setting a chip fixing part, while the pin testing part can easily connect the pins of the chip under test to the control board to achieve the measurement purpose. The existence of the lifting device can enable the pin testing part to be raised and lowered, which facilitates chip replacement and chip measurement.

[0013] 2. By setting a first chip limiting groove, this utility model can fix the bottom and circumferential direction of the chip, and with the help of the elastic column, it can further achieve the upper positioning of the chip, thus realizing the circumferential and axial positioning of the chip to be tested. Attached Figure Description

[0014] Figure 1 This is a three-dimensional schematic diagram of the present invention.

[0015] Figure 2 This is a schematic plan view of the internal structure of the pin testing part of this utility model.

[0016] Figure 3 This is a three-dimensional schematic diagram of the chip fixing part of this utility model.

[0017] Figure 4 This is a schematic diagram of the pressure plate of this utility model viewed from below.

[0018] Figure 5 This is a cross-sectional schematic diagram of the elastic column of this utility model.

[0019] In the figure, 1-base, 2-chip fixing part, 21-chip fixing plate, 22-first chip limiting groove, 23-chip limiting hole, 24-step, 3-pressure plate, 31-second chip limiting groove, 32-elastic column, 4-pin testing part, 41-connecting plate, 42-test pin, 421-fixed pin, 422-movable pin, 423-elastic pin, 5-lifting device. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. The components of the embodiments of this utility model described and shown in the accompanying drawings can typically be arranged and designed in various different configurations.

[0021] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0022] It should be noted that, where there is no conflict, the embodiments and features in the embodiments of this utility model can be combined with each other.

[0023] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0024] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product of this utility model is in use, or the orientation or positional relationship commonly understood by those skilled in the art. They are only used for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model. In addition, the terms "first," "second," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0025] In the description of this utility model, it should also be noted that, unless otherwise explicitly specified and limited, the terms "set," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances. Example

[0026] Please refer to Figure 1 The embodiment shown in Figure 5 includes a sensor chip testing fixture, which includes a hollow base 1. The base 1 has an electronic control board for testing the chip inside, and a chip fixing part 2 can be detachably connected to the base 1.

[0027] The chip fixing part 2 includes a chip fixing plate 21 disposed on the base 1. The chip fixing plate 21 is connected to the base 1 by screws. The plate can be replaced as a whole according to different chip testing requirements. The chip fixing plate 21 has a first chip limiting groove 22. The first chip limiting groove 22 is consistent with the size and shape of the chip. The chip can be placed directly in it during testing. One end of the first chip limiting groove 22 has a chip limiting hole 23, and the other end of the first chip limiting groove 22 also has a step 24 for supporting the chip pins. The chip limiting hole 23 is used to hold the support rod at the bottom of the chip. The step 24 is higher than the bottom plane of the first chip limiting groove 22 and is used to place the pins located in the middle of the chip.

[0028] A lifting device 5 that moves up and down is fixed on the base 1. The lifting device 5 can be an electric push rod, a screw jack, a cylinder, or other device that can move up and down. The output end of the lifting device 5 is detachably connected to a pressure plate 3 that moves up and down with the output end of the lifting device. The chip fixing part 2 is located below the pressure plate 3. The pressure plate 3 has a second chip limiting groove 31, which corresponds to the first chip limiting groove 22. The second chip limiting groove 31 can accommodate the chip and prevent the protruding chip from being crushed when the pressure plate 3 is pressed down. An elastic post 32 is also provided in the second chip limiting groove 31, as shown in the attached figure of the specification. Figure 5 As shown, one end is fixed, and the other end is connected to the fixed end through a spring. When the pressure plate 3 is pressed down, the elastic column 32 first contacts the chip body. When the pressure plate 3 continues to move downward, the spring contracts, and the spring force presses the chip body tightly. The spring force can also buffer the downward force.

[0029] A pin testing section 4 is detachably connected to the pressure plate 3. The pin testing section 4 includes a connecting plate 41 connected to the pressure plate 3. The connecting plate 41 moves up and down with the pressure plate 3. The connecting plate 41 is provided with test pins 42. The number of test pins 42 corresponds one-to-one with the number of pins of the chip under test. When the connecting plate 41 is pressed down, the top of the test pin 42 is electrically connected to the input terminal of the electronic control board. The test pin 42 corresponds one-to-one with the chip pins and presses down the pins of the chip under test one by one. Since the test pin 42 is a conductor, it can connect the chip under test to the electronic control board to achieve the purpose of measurement.

[0030] The test needle 42 includes a fixed needle 421, a movable needle 422, and an elastic body 423. The fixed needle 421 is fixed inside the connecting plate 41. The top of the fixed needle 421 is electrically connected to the control board through a wire, and the bottom of the fixed needle 421 is hollow. One end of the movable needle 422 is piston-connected inside the fixed needle 421, and the other end of the movable needle 422 passes through the connecting plate 41 and extends outside the connecting plate 41. The fixed needle 421 is also provided with an elastic body 423 connected to the movable needle 422. The fixed needle 421, the movable needle 422, and the elastic body 423 are all conductors, and the fixed needle 421 and the movable needle 422 are connected through the elastic body 423. The elastic body 423 can be a coil spring, a butterfly spring, a leaf spring, or other elastic workpiece. The existence of the elastic body 423 is to buffer the excessive speed or sudden excessive pressure when the lifting device 5 is pressed down.

[0031] Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A sensor chip testing fixture, comprising a base (1), wherein a lifting device (5) for vertical movement is fixedly mounted on the base (1), characterized in that: The output end of the lifting device (5) is detachably connected to a pressure plate (3) that moves up and down, and a pin test part (4) is detachably connected to the pressure plate (3). A chip fixing part (2) is also detachably connected to the base (1), and the chip fixing part (2) is located below the pressure plate (3). The pin test part (4) includes a connecting plate (41) connected to the pressure plate (3), and a test pin (42) is provided on the connecting plate (41).

2. The sensor chip testing fixture according to claim 1, characterized in that: The test needle (42) includes a fixed needle (421), a movable needle (422), and an elastomer (423). The fixed needle (421) is fixed inside the connecting plate (41), and the bottom of the fixed needle (421) is hollow. One end of the movable needle (422) is located inside the fixed needle (421), and the other end of the movable needle (422) passes through the connecting plate (41) and extends to the outside of the connecting plate (41). The fixed needle (421) is also provided with an elastomer (423) connected to the movable needle (422).

3. The sensor chip testing fixture according to claim 1, characterized in that: The chip fixing part (2) includes a chip fixing plate (21) disposed on the base (1). A first chip limiting groove (22) is provided on the chip fixing plate (21). A chip limiting hole (23) is provided at one end of the first chip limiting groove (22), and a step (24) for supporting the chip pin is provided at the other end of the first chip limiting groove (22).

4. The sensor chip testing fixture according to claim 3, characterized in that: The pressure plate (3) is provided with a second chip limiting groove (31), and the second chip limiting groove (31) corresponds to the first chip limiting groove (22). The second chip limiting groove (31) is also provided with an elastic column (32).

5. The sensor chip testing fixture according to claim 1, characterized in that: The base (1) is equipped with an electrical control board, and the top of the test probe (42) is electrically connected to the input end of the electrical control board.

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