Calibration device for ICP emission spectrometer
By introducing a calibration device into the ICP emission spectrometer to generate a plasma equivalent light field, the problem of decreased detection accuracy caused by contamination and aging of optical components is solved, achieving non-invasive detection and accurate calibration, and improving the sensitivity and stability of the detector.
CN224456570UActive Publication Date: 2026-07-03THERMO FISHER SCI SHANGHAI INSTR CO LTD +1
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- THERMO FISHER SCI SHANGHAI INSTR CO LTD
- Filing Date
- 2026-05-28
- Publication Date
- 2026-07-03
Smart Images
Figure CN224456570U_ABST
Abstract
This utility model relates to a calibration device for an ICP emission spectrometer, which includes a plasma torch. The calibration device includes: a light source emitting a first emitted light; a collimation module collimating the first emitted light to form a second emitted light containing a collimated beam; a switchable beam splitter converting the second emitted light into axial and / or radial optical paths; a first lens assembly optically processing the axial optical path to match the axial emitted light of the plasma torch; and a second lens assembly optically processing the radial optical path to match the radial emitted light of the plasma torch. This calibration device introduces controllable optical signals into the original optical path without altering the internal optical structure, thereby generating a plasma equivalent light field to simulate the spatial position and beam distribution characteristics of axial and radial plasma emission.
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