Chip testing device
By combining a cylindrical light source assembly and a ring-shaped vision inspection device with an edge computing platform, the problems of glare and low efficiency in the inspection of small-sized BIOS chips are solved, achieving high-precision and high-efficiency chip defect inspection, which is suitable for server motherboard manufacturing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN YIWANKE DATA EQUIP TECH CO LTD
- Filing Date
- 2025-04-10
- Publication Date
- 2026-07-03
AI Technical Summary
Existing chip testing equipment is prone to glare when testing small-sized BIOS chips, making it difficult to provide sufficient light, resulting in unclear images and low testing efficiency. Furthermore, the equipment is too bulky to be installed on existing production lines.
It employs a cylindrical light source assembly and a ring-shaped visual inspection device. The light source assembly is open in the vertical direction, while the visual inspection device moves in the horizontal direction. It combines an edge computing platform for real-time inspection, uses an arched curved surface light source and a ring guide rail in conjunction with oblique angle shooting, and combines a convolutional neural network model for real-time defect identification.
It achieves high-precision and high-efficiency chip defect detection, avoids reflection problems, expands the shooting range, simplifies the equipment structure, facilitates installation on existing production lines, and improves detection efficiency and accuracy.
Smart Images

Figure CN224456594U_ABST