An auxiliary device for IGBT breakdown voltage test

Abstract

This utility model discloses an auxiliary device for IGBT breakdown voltage testing, comprising: a base, a base plate, first baffles, a back plate, a mounting plate, an elbow clamp, slide rails, sliders, quick-connect plugs, a probe assembly, and a tray. The base plate is connected to the base, the back plate is located at one end of the base and connected to the upper end of the base plate, first baffles are provided on both sides of the base, the tray is located on the base and between the two first baffles, the mounting plate and two slide rails are provided at one end of the back plate, the two slide rails are arranged opposite each other, the mounting plate is located between the two slide rails, the elbow clamp is located on the mounting plate, a slider is slidably provided on each slide rail, the probe assembly is connected to the two sliders on both sides, the probe assembly is arranged opposite to the tray, and a quick-connect plug is located on the probe assembly. Through the application of this utility model, an auxiliary device for IGBT breakdown voltage testing is proposed, which can provide a stable and uniform clamping force for the IGBT, effectively avoiding the shaking of the IGBT during the testing process and ensuring the accuracy of its position during testing.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor device testing technology, and in particular to an auxiliary device for IGBT breakdown voltage testing. Background Technology

[0002] In the field of semiconductor device testing, the accurate testing of the breakdown voltage of IGBTs (Insulated Gate Bipolar Transistors) is crucial as an important power electronic device. However, there are still some problems affecting the efficiency and accuracy of IGBT breakdown voltage testing.

[0003] Traditional IGBT breakdown voltage testing often lacks specialized auxiliary equipment, and the IGBT is often fixed haphazardly during testing. Testers may simply place the IGBT on the test bench and hold it in place manually or with simple clamps. This method not only requires significant effort from the tester to maintain stability but also makes it difficult to ensure the IGBT remains in the ideal test position throughout the test. Even slight movement can lead to data deviations and affect the accuracy of the results. Furthermore, with the continuous development of IGBT technology, modular design is becoming the trend, but traditional test equipment performs poorly in terms of modular compatibility. Different types and specifications of IGBT modules differ in size, pin layout, etc., and traditional equipment struggles to quickly and easily adapt to these different modules, limiting its application in diverse IGBT testing scenarios. Utility Model Content

[0004] In view of this, in order to solve the above problems, the purpose of this utility model is to provide an auxiliary device for IGBT breakdown voltage testing, comprising: a base, a base plate, a first baffle, a back plate, a mounting plate, an elbow clamp, slide rails, sliders, quick-connect plugs, a probe assembly, and a tray. The upper end of the base plate is connected to the base. The back plate is disposed at one end of the base and connected to the upper end of the base plate. The first baffles are disposed on both sides of the base. The tray is disposed on the base and located between the two first baffles. The mounting plate and two slide rails are disposed at one end of the back plate. The two slide rails are arranged opposite each other. The mounting plate is located between the two slide rails. The elbow clamp is disposed on the mounting plate. A slider is slidably disposed on each slide rail. The probe assembly is connected to the two sliders on both sides. The probe assembly is arranged opposite to the tray. The quick-connect plug is disposed on the probe assembly.

[0005] In another preferred embodiment, the probe assembly includes: a pressure plate, a transition plate, probes, and a probe plate. The two sides of the pressure plate are respectively connected to the two sliders. The transition plate is connected to the lower end of the pressure plate. The probe plate is disposed inside the transition plate and is directly opposite the tray. The probe plate is provided with a plurality of probes. The quick-connect plug is disposed on the transition plate.

[0006] In another preferred embodiment, it further includes: side plates disposed on both sides of one end of the back plate, the lower ends of the side plates being connected to the bottom plate.

[0007] In another preferred embodiment, it further includes: a storage platform and a measuring tool mounting bracket, the storage platform being disposed on the upper end of the back plate, and the measuring tool mounting bracket being disposed on the storage platform.

[0008] In another preferred embodiment, it further includes a second stop bar, which is disposed at one end of the base.

[0009] In another preferred embodiment, the output end of the elbow clamp is connected to the pressure plate via two nuts.

[0010] In another preferred embodiment, the first stop bar has a plurality of connecting holes, and a first cylindrical pin is provided in the connecting holes. The IGBT is connected to the first stop bar through the first cylindrical pin.

[0011] In another preferred embodiment, the pressure plate has a plurality of first mounting holes, and the transition plate has a plurality of second mounting holes. The first mounting holes and the second mounting holes are arranged opposite each other, and a second cylindrical pin is provided in the first mounting holes and the second mounting holes. The pressure plate and the transition plate are connected by the second cylindrical pin.

[0012] The present invention, by adopting the above-mentioned technical solution, has the following positive effects compared with the prior art: By applying the present invention, an auxiliary device for IGBT breakdown voltage testing is proposed. This device not only provides a stable and uniform clamping force for the IGBT, effectively preventing IGBT shaking during testing and ensuring its positional accuracy, but also allows for the replacement of appropriate trays according to the size of different IGBT modules. This enables the device to adapt to various IGBT modules of different sizes and pin layouts, improving its adaptability to diverse IGBT testing. Furthermore, the device can precisely adjust the probe position, ensuring good and stable contact between the probe and the IGBT pins, reducing test errors caused by poor contact. Attached Figure Description

[0013] Figure 1This is a schematic diagram of an auxiliary device for IGBT breakdown voltage testing according to the present invention.

[0014] In the attached image:

[0015] 1. Base; 2. Base plate; 3. First stop bar; 4. Back plate; 5. Mounting plate; 6. Elbow clamp; 7. Slide rail; 8. Slider; 9. Quick connector; 10. Tray; 11. Pressure plate; 12. Transition plate; 13. Probe; 14. Probe plate; 15. Side plate; 16. Storage platform; 17. Measuring tool mounting bracket; 18. Second stop bar; 19. First cylindrical pin; 20. Second cylindrical pin. Detailed Implementation

[0016] The technical solution of this utility model will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this utility model. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0017] In the description of this utility model, it should be understood that the orientation or positional relationship indicated by terms such as "upper", "lower", "left", "right", "inner", "outer", "front", "back", "horizontal", and "vertical" are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model, and are not intended to indicate or imply that the device or component referred to must have a specific orientation, and therefore should not be construed as a limitation of this utility model.

[0018] It should be noted that the terms "horizontal" and "vertical" in this utility model are used to describe approximate positional relationships, and not strictly "horizontal plane" or "vertical plane".

[0019] like Figure 1The diagram illustrates an auxiliary device for IGBT breakdown voltage testing according to a preferred embodiment, comprising: a base 1, a base plate 2, first baffles 3, a back plate 4, a mounting plate 5, an elbow clamp 6, slide rails 7, a slider 8, a quick-connect plug 9, a probe assembly, and a tray 10. The upper end of the base plate 2 is connected to the base 1. The back plate 4 is disposed at one end of the base 1 and connected to the upper end of the base plate 2. First baffles 3 are disposed on both sides of the base 1. The tray 10 is disposed on the base 1 and located between the two first baffles 3. The back plate 4 has a mounting plate 5 and two slide rails 7 disposed at one end, with the two slide rails 7 facing each other. The mounting plate 5 is located between the two slide rails 7. Between them, the elbow clamp 6 is set on the mounting plate 5, and a slider 8 is slidably set on each slide rail 7. The two sides of the probe assembly are connected to the two sliders 8. The probe assembly is set opposite to the tray 10. The tray 10 is used to support the IGBT and provide a placement platform for the IGBT. At the same time, it works with the first stop bar 3 and the first cylindrical pin 19 to position the IGBT and ensure that the position of the IGBT is relatively fixed during the test. Different specifications and types of trays 10 can be selected according to the different specifications and types of IGBTs so that they can be adapted to different IGBTs. The quick connector 9 is set on the probe assembly.

[0020] Furthermore, in a preferred embodiment, the probe assembly includes: a pressure plate 11, a transition plate 12, probes 13, and a probe plate 14. The two sides of the pressure plate 11 are connected to two sliders 8 respectively. The transition plate 12 is connected to the lower end of the pressure plate 11. The probe plate 14 is disposed inside the transition plate 12, facing the tray 10. A plurality of probes 13 are disposed on the probe plate 14. A quick-connect plug 9 is disposed on the transition plate 12. Furthermore, the up-and-down movement of the pressure plate 11 can drive the sliders 8 to slide along the slide rail 7. The sliding of the sliders 8, in turn, reacts on the pressure plate 11, ensuring that the pressure plate 11 can only move up and down along the slide rail 7 without deviation, thereby maintaining a stable movement trajectory of the pressure plate 11.

[0021] Furthermore, as a preferred embodiment, the probes 13 are preferably arranged in a matrix to ensure the uniformity of electrical contact between the probes 13 and the IGBT.

[0022] Furthermore, as a preferred embodiment, it also includes: a side plate 15, which is disposed on both sides of one end of the back plate 4, and the lower end of the side plate 15 is connected to the bottom plate 2.

[0023] Furthermore, as a preferred embodiment, it also includes: a storage platform 16 and a measuring tool mounting bracket 17, wherein the storage platform 16 is disposed on the upper end of the back plate 4, and the measuring tool mounting bracket 17 is disposed on the storage platform 16.

[0024] Furthermore, as a preferred embodiment, it further includes a second stop bar 18, which is disposed at one end of the base 1. The second stop bar 18 can be used to limit the position of the IGBT on the base 1, ensuring the stability of the IGBT during testing and preventing the IGBT from shifting during the test.

[0025] Furthermore, as a preferred embodiment, the output end of the elbow clamp 6 is connected to the pressure plate 11 via two nuts.

[0026] Furthermore, in a preferred embodiment, the output end of the elbow clamp 6 passes through the pressure plate 11 and the transition plate 12. Two nuts are disposed on the output end of the elbow clamp 6, one nut abutting against the upper end of the pressure plate 11 and the other nut abutting against the lower end of the transition plate 12. Furthermore, by rotating the elbow clamp 6, the positions of the pressure plate 11 and the transition plate 12 can be adjusted, thereby achieving the clamping or loosening operation of the IGBT.

[0027] Furthermore, as a preferred embodiment, the first stop bar 3 is provided with a plurality of connecting holes, and a first cylindrical pin 19 is provided in the connecting holes. The IGBT is connected to the first stop bar 3 through the first cylindrical pin 19.

[0028] Furthermore, in a preferred embodiment, the pressure plate 11 is provided with a plurality of first mounting holes, and the transition plate 12 is provided with a plurality of second mounting holes. The first mounting holes and the second mounting holes are arranged opposite each other, and a second cylindrical pin 20 is provided in the first mounting holes and the second mounting holes. The pressure plate 11 and the transition plate 12 are connected by the second cylindrical pin 20.

[0029] Furthermore, as a preferred embodiment, the base plate 2, base 1, side plate 15, slider 8, pressure plate 11, tray 10, storage platform 16, measuring tool mounting bracket 17, mounting plate 5 and back plate 4 are preferably made of aluminum.

[0030] Furthermore, as a preferred embodiment, the transition plate 12 is preferably made of polyethylene material.

[0031] The working principle of this utility model is as follows: In actual use, the IGBT is first placed on the tray 10 and connected to the first stop bar 3 through the first cylindrical pin 19, thereby achieving the initial positioning of the IGBT. Then, the elbow clamp 6 is adjusted to move the pressure plate 11 and the transition plate 12 downward. The movement of the pressure plate 11 and the transition plate 12 drives the probe plate 14 and the probe 13 to move downward, so that the IGBT is clamped and fixed while the probe 13 can contact the electrode of the IGBT module. After that, the external test line is connected to the probe assembly through the quick connector 9, and the IGBT breakdown voltage test can be started. During the test, the tester can install relevant measuring tools, such as a multimeter, on the measuring tool mounting bracket 17 of the platform 16, and then read the readings on the relevant measuring tools to obtain the measurement results.

[0032] The above description is only a preferred embodiment of the present utility model and does not limit the implementation method and protection scope of the present utility model. Those skilled in the art should realize that all solutions obtained by equivalent substitutions and obvious changes made based on the description and illustrations of the present utility model should be included within the protection scope of the present utility model.

Claims

1. An auxiliary device for IGBT breakdown voltage test, characterized in that, include: The device comprises a base, a base plate, a first stop bar, a back plate, a mounting plate, an elbow clamp, slide rails, sliders, a quick-connect plug, a probe assembly, and a tray. The upper end of the base plate is connected to the base. The back plate is disposed at one end of the base and connected to the upper end of the base plate. The first stop bars are disposed on both sides of the base. The tray is disposed on the base and located between the two first stop bars. The mounting plate and two slide rails are disposed at one end of the back plate. The two slide rails are arranged opposite each other. The mounting plate is located between the two slide rails. The elbow clamp is disposed on the mounting plate. A slider is slidably disposed on each slide rail. The probe assembly is connected to the two sliders on both sides. The probe assembly is arranged opposite the tray. The quick-connect plug is disposed on the probe assembly.

2. The auxiliary device for IGBT breakdown voltage test according to claim 1, characterized in that, The probe assembly includes: a pressure plate, a transition plate, probes, and a probe plate. The two sides of the pressure plate are respectively connected to the two sliders. The transition plate is connected to the lower end of the pressure plate. The probe plate is disposed inside the transition plate and is directly opposite the tray. The probe plate is provided with a plurality of probes. The quick-connect plug is disposed on the transition plate.

3. The auxiliary device for IGBT breakdown voltage test according to claim 1, characterized in that, Also includes: Side panels are disposed on both sides of one end of the back panel, and the lower end of the side panels is connected to the bottom plate.

4. The auxiliary device for IGBT breakdown voltage test according to claim 1, characterized in that, Also includes: A storage platform and a measuring tool mounting bracket are provided, wherein the storage platform is disposed on the upper end of the back plate and the measuring tool mounting bracket is disposed on the storage platform.

5. The auxiliary device for IGBT breakdown voltage test according to claim 1, characterized in that, Also includes: The second stop bar is disposed at one end of the base.

6. The auxiliary device for IGBT breakdown voltage test according to claim 2, characterized in that, The output end of the elbow clamp is connected to the pressure plate via two nuts.

7. The auxiliary device for IGBT breakdown voltage test according to claim 1, characterized in that, The first stop bar has several connecting holes, and a first cylindrical pin is provided in each connecting hole. The IGBT is connected to the first stop bar through the first cylindrical pin.

8. The auxiliary device for IGBT breakdown voltage testing according to claim 2, characterized in that, The pressure plate has a plurality of first mounting holes, and the transition plate has a plurality of second mounting holes. The first mounting holes and the second mounting holes are arranged opposite each other. A second cylindrical pin is provided in the first mounting holes and the second mounting holes. The pressure plate and the transition plate are connected by the second cylindrical pin.

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