An infrared signal testing platform
By designing an infrared signal testing platform, using photoelectric sensors and signal amplifiers to convert infrared signals into electrical signals and process them, the problem of inconvenient operation of infrared signal detection in smoke detectors is solved, and efficient and accurate detection results are achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- 真诺测量仪表(上海)有限公司
- Filing Date
- 2025-07-03
- Publication Date
- 2026-07-03
Smart Images
Figure CN224457027U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of signal processors, and more particularly to an infrared signal test bench. Background Technology
[0002] Smoke detectors are crucial for ensuring fire safety, as they can detect smoke promptly, buying valuable time for evacuation and firefighting. The installation location of smoke detectors requires that there be no obstructions around them; otherwise, the smoke may be blocked, preventing the detector from detecting it accurately and promptly. Generally, smoke detectors are installed in the center of the ceiling for quick smoke detection.
[0003] Smoke detectors with obstacle detection capabilities typically have multiple infrared emitters and receivers distributed around their perimeter. The infrared emitters emit infrared light to detect obstacles in front of, behind, to the left and right of the installation location. If the infrared receivers detect infrared light reflected from an obstacle, the smoke detector automatically indicates that the installation location is incorrect.
[0004] To ensure the quality of smoke detectors, the infrared signal of the infrared emitter needs to be tested after the smoke detector is manufactured. However, the current testing method involves placing an obstacle directly in front of the infrared emitter after the smoke detector is powered on, and then relying on the smoke detector's own feedback to determine if the function is normal. This method is inconvenient and inefficient. Utility Model Content
[0005] To simplify testing operations and improve testing efficiency, this application provides an infrared signal testing station. The technical solution adopted is as follows:
[0006] An infrared signal testing station includes a testing station body and a signal testing device; the testing station body is provided with a detection area for placing the product to be tested; the signal testing device is provided in multiple parts and surrounds the detection area;
[0007] The signal testing device includes a photoelectric sensor and a signal amplifier; the photoelectric sensor is used to receive infrared light signals emitted by the product under test and convert them into electrical signals; the signal amplifier is electrically connected to the photoelectric sensor and is used to receive electrical signals.
[0008] The main body of the test bench has a signal processing terminal; the signal processing terminal is electrically connected to a signal amplifier.
[0009] By adopting the above technical solution, the product to be tested can be placed in the testing area. The photoelectric sensors of multiple signal testing devices surrounding the testing area receive the infrared light signals emitted by the product to be tested and convert them into electrical signals. The electrical signals are then received by the signal amplifier and finally processed by the signal processing terminal, thereby simplifying the testing operation and improving the testing efficiency.
[0010] Preferably, the signal amplifier includes a first operational amplifier and a second operational amplifier; the first operational amplifier is electrically connected to the photoelectric signal sensor for preprocessing the signal; the second operational amplifier is electrically connected to the first operational amplifier for secondary amplification of the signal.
[0011] By adopting the above technical solution, the electrical signal output by the photoelectric sensor can be preprocessed and amplified in sequence, making the signal more conducive to subsequent analysis and detection, which helps to simplify the detection operation and improve the detection efficiency.
[0012] Preferably, the photoelectric signal sensor is connected in parallel with an adjustable potentiometer.
[0013] By adopting the above technical solution, the adjustable potentiometer can compensate the signal amplitude output by the photoelectric signal sensor to the required photoelectric signal level.
[0014] Preferably, the first operational amplifier has two outputs, one of which is electrically connected to the input terminal of the first operational amplifier to provide a negative feedback signal, and the other output is electrically connected to the input terminal of the second operational amplifier.
[0015] By adopting the above technical solution, the first operational amplifier of the signal amplifier preprocesses the electrical signal converted by the photoelectric sensor, and the second operational amplifier performs secondary amplification processing; one output of the first operational amplifier provides a negative feedback signal to stabilize the signal processing process, and the other output is connected to the input terminal of the second operational amplifier to realize subsequent secondary amplification processing.
[0016] Preferably, the second operational amplifier includes a first-stage amplifier, the input terminal of which is electrically connected to the output terminal of the first operational amplifier; the output terminal of the first-stage amplifier serves as the output terminal of the second operational amplifier.
[0017] By adopting the above technical solution, the first-stage amplifier can further amplify the signal, providing a signal of appropriate strength for subsequent signal processing.
[0018] Preferably, the output terminal of the second operational amplifier is connected to a gain control potentiometer.
[0019] By adopting the above technical solution, the gain of the amplified amplifier can be controlled within the range required by the process by connecting the output terminal of the second operational amplifier to the gain control potentiometer.
[0020] Preferably, the second operational amplifier further includes a secondary amplifier, which is configured as a voltage follower; the input terminal of the secondary amplifier is electrically connected to the output terminal of the primary amplifier.
[0021] By adopting the above technical solution, the secondary amplifier is set as a voltage follower and connected to the output of the primary amplifier, which can reduce the output impedance, reduce signal transmission loss, isolate interference between the preceding and following stages, improve signal reliability and ensure integrity.
[0022] In summary, this application includes at least one of the following beneficial technical effects:
[0023] 1. The main body of the test bench is set up with a testing area where the product to be tested is placed. Multiple signal testing devices surround the testing area, which can simultaneously detect the infrared light signals emitted by the product to be tested, simplifying the testing operation and improving the testing efficiency.
[0024] 2. The photoelectric sensor receives infrared light signals and converts them into electrical signals. These signals are then amplified by a signal amplifier composed of two operational amplifiers, which can effectively detect infrared signals and ensure detection accuracy and efficiency.
[0025] 3. The second operational amplifier consists of a first-stage amplifier and a second-stage amplifier. The first-stage amplifier can further amplify the signal and provide a signal of appropriate strength for subsequent signal processing. The second-stage amplifier is a voltage follower, which can reduce the output impedance, reduce signal transmission loss, isolate interference between the preceding and following stages, improve signal reliability and ensure integrity. Attached Figure Description
[0026] Figure 1 This is a schematic diagram of the circuit module of the infrared signal testing station in the embodiments of this application;
[0027] Figure 2 This is a circuit diagram of the signal testing device in an embodiment of this application.
[0028] The following labels are used in the attached diagram: 1. Photoelectric sensor; 2. Signal amplifier; 21. First operational amplifier; 22. Second operational amplifier; 221. First stage amplifier; 222. Second stage amplifier; 3. Adjustable potentiometer; 4. Gain control potentiometer; 5. Signal processing terminal. Detailed Implementation
[0029] The present application will be further described in detail below with reference to the accompanying drawings.
[0030] This application provides an infrared signal testing station, as shown in the embodiments below. Figure 1 and Figure 2The infrared signal testing platform includes a main body and signal testing devices. Multiple signal testing devices are arranged around the detection area on the main body of the platform, allowing for comprehensive detection of the infrared signals emitted by the product under test. This improves the comprehensiveness and accuracy of the detection, thereby increasing efficiency. In this embodiment, the product under test is a smoke detector. The smoke detector has four infrared emitting tubes and four infrared receiving tubes around its perimeter. The infrared emitting tubes emit infrared light, which is reflected back to the smoke detector and received by the infrared receiving tubes when it encounters an obstacle. This application utilizes the signal testing devices to convert the infrared light signal into an electrical signal and transmit it to the signal processing terminal 5, thereby determining whether the infrared emitting tubes can normally emit infrared light signals. This avoids the cumbersome process of manually manipulating obstacles in traditional detection methods, achieving a simpler and more efficient detection process.
[0031] Specifically, the main body of the test bench adopts a common workbench, the specific structure of which is not shown in the attached drawings. This part is a conventional technical means for those skilled in the art and will not be specifically disclosed. A detection area is provided on the main body of the test bench, which is the area for placing the product to be tested. The detection area can be set as a planar structure with a smooth and flat surface to ensure that the product to be tested can be placed stably. After the product to be tested is placed in the detection area, the infrared light signal emitted by its infrared emitting tube can propagate smoothly to the surroundings.
[0032] Specifically, the signal testing device has multiple sensors arranged around the perimeter of the testing area. The signal testing device includes a photoelectric sensor 1 and a signal amplifier 2. The photoelectric sensor 1 receives the infrared light signal emitted by the product under test and converts it into an electrical signal. The photoelectric sensor 1 can be a common infrared photodiode, which features high sensitivity and fast response. When infrared light shines on the photodiode, a photocurrent is generated, thereby converting the infrared light signal into an electrical signal. Alternatively, an infrared photoresistor can be used, whose resistance changes with the intensity of infrared light; measuring this resistance change also converts the infrared light signal into an electrical signal.
[0033] Signal amplifier 2 is electrically connected to photoelectric sensor 1 and is used to receive electrical signals. Signal amplifier 2 includes a first operational amplifier 21 and a second operational amplifier 22. The first operational amplifier 21 is electrically connected to photoelectric sensor 1 for signal preprocessing. Specifically, the first operational amplifier 21 uses an OPA810 single operational amplifier for weak signal preprocessing. It can initially amplify the weak electrical signal output by photoelectric sensor 1.
[0034] Furthermore, in order to compensate the signal amplitude output by the optical signal sensor to the required photoelectric signal level, this application further adds an adjustable potentiometer 3, the two ends of which are connected in parallel with the two ends of the photoelectric signal sensor.
[0035] The OPA810 single op-amp has VIN-, VIN+, and VO pins. The VIN- pin is connected to a photoelectric signal sensor to receive electrical signals, the VIN+ pin is grounded, and the VO pin is used as an output pin.
[0036] Furthermore, the VO pin has two outputs. One output is electrically connected to the VIN pin to provide a negative feedback signal. The other output is electrically connected to the input of the second operational amplifier 22, transmitting the pre-processed signal to the second operational amplifier 22 for secondary amplification.
[0037] The second operational amplifier 22 uses a TL072CDT dual-channel operational amplifier, which includes a first-stage amplifier 221 and a second-stage amplifier 222. The input terminal of the first-stage amplifier 221 is electrically connected to the VO pin of the first operational amplifier 21, thereby further amplifying the signal output by the first operational amplifier 21.
[0038] The output of the first-stage amplifier 221 is also electrically connected to a gain control potentiometer 4. The gain control potentiometer 4 is used to control the gain of the output signal of the first-stage amplifier 221, keeping the amplified gain within the required process range. For example, when different types of products need to be tested, the intensity of their emitted infrared light signals may vary. By adjusting the gain control potentiometer 4, the signal received by the signal processing terminal 5 can be kept within a suitable range, preventing the signal from being too large or too small and affecting the accuracy of the detection results.
[0039] The second-stage amplifier 222 is configured as a voltage follower. The input of the second-stage amplifier 222 is electrically connected to the output of the first-stage amplifier 221. Its function is to reduce output impedance, decrease signal transmission loss, isolate interference between preceding and following stages, and improve signal reliability and integrity. A voltage follower can be implemented using common circuit structures, utilizing transistors or field-effect transistors.
[0040] The main body of the test bench has a signal processing terminal 5, which is electrically connected to the signal amplifier 2. The signal processing terminal 5 can be a computer equipped with corresponding signal processing software, capable of analyzing and processing the electrical signals transmitted from the signal amplifier 2 to determine whether the infrared signal of the product under test is normal. Alternatively, it can be a dedicated signal processing chip integrated inside the main body of the test bench, directly processing the signal and outputting the test results.
[0041] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.
Claims
1. An infrared signal test station, characterized by: It includes a test bench body and signal testing devices; the test bench body is provided with a detection area for placing the product to be tested; the signal testing devices are provided in multiple units and surround the detection area; The signal testing device includes a photoelectric sensor (1) and a signal amplifier (2); the photoelectric sensor (1) is used to receive the infrared light signal emitted by the product under test and convert it into an electrical signal; the signal amplifier (2) is electrically connected to the photoelectric sensor (1) and is used to receive the electrical signal; The main body of the test bench has a signal processing terminal (5); the signal processing terminal (5) is electrically connected to the signal amplifier (2).
2. The infrared signal test station of claim 1, wherein: The signal amplifier (2) includes a first operational amplifier (21) and a second operational amplifier (22); the first operational amplifier (21) is electrically connected to the photoelectric signal sensor for preprocessing the signal; the second operational amplifier (22) is electrically connected to the first operational amplifier (21) for secondary amplification of the signal.
3. The infrared signal test station of claim 2, wherein: The photoelectric signal sensor is connected in parallel with an adjustable potentiometer (3).
4. The infrared signal test station of claim 2, wherein: The first operational amplifier (21) has two outputs, one of which is electrically connected to the input terminal of the first operational amplifier (21) to provide a negative feedback signal, and the other output is electrically connected to the input terminal of the second operational amplifier (22).
5. The infrared signal test station of claim 2, wherein: The second operational amplifier (22) includes a first-stage amplifier (221), the input terminal of which is electrically connected to the output terminal of the first operational amplifier (21); the output terminal of the first-stage amplifier (221) serves as the output terminal of the second operational amplifier (22).
6. The infrared signal test station of claim 5, wherein: The output of the second operational amplifier (22) is connected to a gain control potentiometer (4).
7. The infrared signal test station of claim 5, wherein: The second operational amplifier (22) also includes a secondary amplifier (222), which is configured as a voltage follower; the input terminal of the secondary amplifier (222) is electrically connected to the output terminal of the primary amplifier (221).