A comprehensive testing system for LEDs
By designing an integrated LED testing system that combines light strip, microscope, and ESD testing, and simulating various interference environments, the system solves the problem of low efficiency in single-testing of existing equipment, and achieves efficient LED performance evaluation.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- CHANGZHOU XINGYU AUTOMOTIVE LIGHTING SYST CO LTD
- Filing Date
- 2025-07-28
- Publication Date
- 2026-07-07
AI Technical Summary
Existing LED testing equipment is limited and cannot simulate various interference conditions in real-world environments, resulting in low testing efficiency.
An integrated LED testing system was designed, which includes a light stripe testing device, a microscope analysis device, a probe station, and an ESD testing device. Through an integrating sphere, a temperature control device, a robotic arm, and a host computer system, it simulates various interference environments and integrates testing to improve testing efficiency.
It enables centralized testing of LEDs under simulated high temperature, low temperature and electrostatic interference environments, improving testing efficiency, obtaining results quickly, and locating problems through microscopic analysis and voltage-current curves.
Smart Images
Figure CN224471237U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of LED testing technology, specifically relating to a comprehensive LED testing system. Background Technology
[0002] LED testing is an industrial testing technology for evaluating the performance and reliability of light-emitting diodes. It is mainly used in the fields of semiconductor, lighting and display technology. Its core objective is to verify parameters such as luminous flux and lifespan of devices through testing during the production stage, so as to meet the industry's requirements for luminous efficacy and reliability.
[0003] Common LED testing devices are often single devices that can only test common parameters, such as electrical and optical parameters. They cannot simulate various external interferences to test LED parameters. The testing devices are scattered and cannot quickly obtain test results. Utility Model Content
[0004] The purpose of this invention is to provide a comprehensive LED testing system to solve the technical problems of existing LED testing equipment being singular, unable to simulate LEDs under various interference conditions in real environments, requiring separate testing, and resulting in low testing efficiency. The goal is to achieve centralized testing equipment, simulate various external interference conditions, and improve testing efficiency.
[0005] To solve the above-mentioned technical problems, this utility model provides a comprehensive LED testing system, including: a light stripe testing device, the light stripe testing device including an integrating sphere, a testing stage and a temperature control device, the testing stage being movably connected to the bottom end of the integrating sphere, an LED being placed on the testing stage, and the temperature control device being used to adjust the temperature of the integrating sphere;
[0006] The ESD testing device includes an electrostatic gun and an electrostatic generator that are electrically connected, with the output end of the electrostatic gun close to the light strip testing device.
[0007] Furthermore, the optical strip testing device also includes a lifting device, which is connected to the testing platform and is used to drive the testing platform to connect with the integrating sphere;
[0008] The integrating sphere is used to test the optical parameters of the LED.
[0009] Furthermore, a microscope analysis device is provided on one side of the light band testing device. The microscope analysis device includes a metallurgical microscope and a first support base. The metallurgical microscope is mounted on the first support base, and the test stage is placed on the metallurgical microscope.
[0010] Furthermore, a probe station is also provided on one side of the optical strip testing device. The probe station includes a probe, a programmable power supply box, and a second support base. The probe is electrically connected to the programmable power supply box.
[0011] The probe and the programmable power supply box are both mounted on the second support base, and the test platform is also placed on the second support base.
[0012] Furthermore, the ESD testing device also includes a robotic arm, which is connected to the electrostatic gun.
[0013] Furthermore, the light band testing device, the microscope analysis device, and the probe station are all electrically connected to a host computer system;
[0014] A sealed box is provided on the outside of the optical band testing device. The host computer system passes through the sealed box and is electrically connected to the integrating sphere. The metallographic microscope is electrically connected to the host computer system. The programmable power supply box is electrically connected to the host computer system.
[0015] Furthermore, the robotic arm is used to drive the electrostatic gun to approach the light strip testing device, the microscope analysis device, and the probe station, respectively.
[0016] The beneficial effects of this utility model are:
[0017] 1. This utility model sets up an ESD testing device. The robotic arm drives the electrostatic gun to reach or approach the LED inside the integrating sphere. The electrostatic gun can directly contact or release electrostatic pulses to the object under test through the air, so that the LED is in an electrostatic interference environment. The temperature control device keeps the LED in a high temperature or low temperature environment. Thus, the LED is tested in simulated high temperature, low temperature, electrostatic interference and other environments. The LED is tested in a centralized manner, which has high testing efficiency and speeds up the time to obtain test results.
[0018] 2. This utility model uses a microscope analysis device to observe the tested LED with a metallographic microscope, accurately see its internal structure, capture images and display them on the host computer system, identify differences from normal LEDs, analyze the cause of failure, and facilitate the identification of LED problems.
[0019] 3. This utility model sets up a probe station, and the programmable power supply box provides different voltages and currents. Then, the probe is placed on the LED after testing. The probe applies the test voltage to the LED, and the host computer system displays the voltage and current curve of the LED, thereby locating the problem.
[0020] To make the above-mentioned objectives, features and advantages of this utility model more apparent and understandable, preferred embodiments are described below in detail with reference to the accompanying drawings. Attached Figure Description
[0021] To more clearly illustrate the specific embodiments of this utility model or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.
[0022] Figure 1 This is a schematic diagram of the structure of a comprehensive LED testing system according to this utility model;
[0023] Figure 2 This is a schematic diagram of the structure of the optical band testing device of this utility model;
[0024] Figure 3 This is a schematic diagram of the integrating sphere and test stage of this utility model;
[0025] Figure 4 This is a schematic diagram of the microscope analysis device of this utility model;
[0026] Figure 5 This is a schematic diagram of the probe station of this utility model;
[0027] Figure 6 This is a schematic diagram of the ESD testing device of this utility model.
[0028] In the picture:
[0029] 1. Light band testing device; 11. Integrating sphere; 12. Test stage; 13. Sealed chamber; 2. Microscopic analysis device; 21. Metallurgical microscope; 22. First support base; 3. Probe station; 31. Probe; 32. Programmable power supply box; 33. Second support base; 4. ESD testing device; 41. Robotic arm; 42. Electrostatic gun; 43. Electrostatic generator; 5. Host computer system. Detailed Implementation
[0030] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this utility model. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.
[0031] Example:
[0032] like Figures 1 to 6As shown, an integrated LED testing system includes: a light strip testing device 1, a microscope analysis device 2, a probe station 3, and an ESD testing device 4. The microscope analysis device 2, the probe station 3, and the ESD testing device 4 are all located on one side of the light strip testing device 1. The LED is tested within the light strip testing device 1. The probe station 2 can test the voltage and current curves of the LED. The ESD testing device 4 can simulate the testing of the LED under electrostatic interference environment, thereby enabling the LED to be tested under various interference conditions, improving the testing efficiency of the LED, and thus accelerating the acquisition of test results. The light strip testing device 1, the microscope analysis device 2, the probe station 3, and the ESD testing device 4 are all located in an electromagnetically shielded room.
[0033] like Figure 2 As shown, the light stripe testing device 1 includes an integrating sphere 11, a testing stage 12, and a temperature control device. The testing stage 12 is movably connected to the bottom end of the integrating sphere 11. An LED is placed on the testing stage 12. The temperature control device is used to adjust the temperature of the integrating sphere 11. The light stripe testing device 1 also includes a lifting device, which is connected to the testing stage 12. The lifting device is used to drive the testing stage 12 to connect with the integrating sphere 11. The integrating sphere 11 is used to test the optical parameters of the LED. A sealed box 13 is provided on the outside of the light stripe testing device 1.
[0034] It should be noted that the integrating sphere 11 is a hollow sphere with its inner wall coated with a white diffuse reflective material. One or more windows are opened on the sphere wall to serve as light inlets and receiving holes for placing light receiving devices. The inner wall of the sphere is coated with an ideal diffuse reflective material, that is, a material with a diffuse reflectance coefficient close to 1. Commonly used materials are magnesium oxide or barium sulfate. After being mixed evenly with a glue adhesive, it is sprayed onto the inner wall. The magnesium oxide coating has a spectral reflectance of more than 99% in the visible spectrum. In this way, the light entering the integrating sphere 11 is reflected multiple times by the inner wall coating, forming a uniform illuminance on the inner wall, thereby testing the optical parameters of the LED.
[0035] In this embodiment, the LED to be tested is placed on the test platform 12. The lifting device pushes the test platform 12 up until it is connected to the bottom of the integrating sphere 11, thereby installing the LED inside the integrating sphere 11. The ambient temperature of the LED is adjusted by the temperature control device to high or low temperature, thereby testing the performance of the LED under different temperature conditions. The light strip test device 1 is placed in the sealed box 13 to avoid the LED being affected by the external environment under temperature test, so as to make the test results more accurate.
[0036] like Figure 4 As shown, the microscope analysis device 2 includes a metallurgical microscope 21 and a first support 22. The metallurgical microscope 21 is mounted on the first support 22, and a test stage 12 is placed on the metallurgical microscope 21. After the LED is tested in the light band testing device 1, the test stage 12 is removed and placed on the metallurgical microscope 21 for observation.
[0037] The metallurgical microscope 21 includes an eyepiece, a material converter, and an objective lens. The metallurgical microscope 21 is a well-known technology in the field. By observing the internal structure of the tested LED with the metallurgical microscope 21, the differences can be found by comparing it with normal LEDs, thereby analyzing the cause of failure.
[0038] like Figure 5 As shown, the probe station 3 includes a probe 31, a programmable power supply box 32, and a second support base 33. The probe 31 is electrically connected to the programmable power supply box 32. Both the probe 31 and the programmable power supply box 32 are mounted on the second support base 33, and a test stage 12 is also placed on the second support base 33.
[0039] In this embodiment, the test stage 12 can be moved to the probe station 3 before and after the LED test. The programmable power supply box 32 provides different voltages and currents. The probe applies the test voltage to the LED under test, thereby measuring the voltage and current curve of the LED and thus locating the problem.
[0040] like Figure 6 As shown, the ESD testing device 4 includes a robotic arm 41, an electrostatic gun 42 electrically connected to it, and an electrostatic generator 43. The output end of the electrostatic gun 42 is close to the light strip testing device 1, and the robotic arm 41 is connected to the electrostatic gun 42. The electrostatic generator 43 generates voltage pulses, which are released to the object under test by the electrostatic gun 42. The electrostatic gun 42 can release electrostatic pulses to the object under test by directly contacting it or releasing them through the air by changing the gun head. Through the telescopic robotic arm 41, the electrostatic gun 42 can test the LED at different distances and directions. The robotic arm 41 is a technology known in the art. The robotic arm 41 can move and rotate in space. The robotic arm 41 is used to drive the electrostatic gun 42 to approach the light strip testing device 1, the microscope analysis device 2, and the probe station 3 respectively.
[0041] In this embodiment, the light stripe testing device 1, the microscope analysis device 2, and the probe station 3 are all electrically connected to a host computer system 5. The host computer system 5 is electrically connected to the integrating sphere 11 through the sealed box 13, the metallurgical microscope 21 is electrically connected to the host computer system 5, and the programmable power supply box 32 is electrically connected to the host computer system 5. The host computer system 5 connected to the light stripe testing device 1 can display LED information at different temperatures, the host computer system 5 connected to the microscope analysis device 2 can display the observed LED information, and the host computer system 5 connected to the probe station 3 can display the LED voltage and current curves. By clearly and quickly observing the LED information through the host computer system 5, problems can be located.
[0042] In summary, the LED under test is placed on the test stage 12 and connected to the bottom of the integrating sphere 11, thus installing the LED inside the integrating sphere 11. The ambient temperature of the LED is adjusted by a temperature control device to high or low temperatures, thereby testing the LED's performance under different temperature conditions. The telescopic robotic arm 41 drives the electrostatic gun 42 to simulate an electrostatic interference environment for the LED, thereby testing the LED's performance under electrostatic conditions. After the LED is tested in the light strip test device 1, the test stage 12 is removed and placed in the metallographic microscope 21 to observe the internal structure, compare it with normal LEDs to find differences, and thus analyze the cause of failure. After the LED is tested, the test stage 12 is moved to the probe station 3, and the probe applies the test voltage to the LED under test, thereby measuring the LED's voltage and current curves and thus locating the problem. The information obtained from the light strip test device 1, the microscope analysis device 2, the probe station 3, and the ESD test device 4 is all displayed on the host computer system 5 for easy observation.
[0043] All the devices selected in this application are general standard parts or components known to those skilled in the art. Their structures and principles can be learned by those skilled in the art through technical manuals or conventional experimental methods.
[0044] In the description of the embodiments of this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.
[0045] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.
[0046] Based on the above-described preferred embodiments of this utility model, and through the foregoing description, those skilled in the art can make various changes and modifications without departing from the technical concept of this utility model. The technical scope of this utility model is not limited to the contents of the specification, but must be determined according to the scope of the claims.
Claims
1. A comprehensive testing system for LEDs, characterized in that, include: A light stripe testing device (1) includes an integrating sphere (11), a testing stage (12), and a temperature control device. The testing stage (12) is movably connected to the bottom end of the integrating sphere (11). An LED is placed on the testing stage (12). The temperature control device is used to adjust the temperature of the integrating sphere (11). ESD testing device (4), the ESD testing device (4) includes an electrostatic gun (42) and an electrostatic generator (43) that are electrically connected, and the output end of the electrostatic gun (42) is close to the light strip testing device (1).
2. The comprehensive LED testing system as described in claim 1, characterized in that, The light strip testing device (1) also includes a lifting device, which is connected to the test platform (12) and is used to drive the test platform (12) to connect with the integrating sphere (11). The integrating sphere (11) is used to test the optical parameters of the LED.
3. The comprehensive LED testing system as described in claim 1, characterized in that, A microscope analysis device (2) is provided on one side of the light band testing device (1). The microscope analysis device (2) includes a metallurgical microscope (21) and a first support base (22). The metallurgical microscope (21) is mounted on the first support base (22), and the test stage (12) is placed on the metallurgical microscope (21).
4. The comprehensive LED testing system as described in claim 3, characterized in that, A probe station (3) is also provided on one side of the optical band testing device (1). The probe station (3) includes a probe (31), a programmable power supply box (32), and a second support base (33). The probe (31) is electrically connected to the programmable power supply box (32). The probe (31) and the programmable power supply box (32) are both mounted on the second support base (33), and the test platform (12) is also placed on the second support base (33).
5. The comprehensive LED testing system as described in claim 4, characterized in that, The ESD testing device (4) also includes a robotic arm (41), which is connected to the electrostatic gun (42).
6. The comprehensive LED testing system as described in claim 4, characterized in that, The light band testing device (1), the microscope analysis device (2) and the probe station (3) are all electrically connected to a host computer system (5); The outer side of the light band testing device (1) is provided with a sealed box (13). The host computer system (5) passes through the sealed box (13) and is electrically connected to the integrating sphere (11). The metallographic microscope (21) is electrically connected to the host computer system (5). The programmable power supply box (32) is electrically connected to the host computer system (5).
7. The comprehensive LED testing system as described in claim 5, characterized in that, The robotic arm (41) is used to drive the electrostatic gun (42) to approach the light band testing device (1), the microscope analysis device (2) and the probe station (3) respectively.