LED lamp test socket
By combining the compact design of the PCB circuit board and metal sleeve with snap-fit components and elastic components, the structural looseness and connection reliability issues of the BA9S LED lamp testing device have been solved, achieving stable electrical signal transmission and structural compactness in various testing scenarios.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHANDONG JINGJIU ELECTRONIC EQUIP FACTORY CO LTD
- Filing Date
- 2025-08-18
- Publication Date
- 2026-07-24
AI Technical Summary
Existing BA9S LED lamp testing devices have a loose structure, the lamp body is prone to loosening, and the connection reliability is poor, making it difficult to maintain the stability of electrical signal transmission and the compactness of the structure under various testing scenarios.
The compact design of the PCB circuit board and metal sleeve, combined with the snap-fit components and elastic components, ensures the lamp body is stably positioned. The reliable electrical connection is achieved through the welding of conductive layers and conductive pads, which compensates for minor displacements and avoids poor contact.
Under harsh conditions such as vibration and extreme temperatures, it ensures stable electrical signal transmission, reduces test data deviation, and improves the installation stability and adaptability of the lamp body in various test scenarios.
Smart Images
Figure CN224553333U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of LED lamp testing technology, and in particular to an LED lamp testing socket. Background Technology
[0002] In the field of electronic components, LED lights are widely used due to their advantages such as low energy consumption and long lifespan. Among them, BA9S is a commonly used LED light, and its performance testing (such as electrical parameters, luminous efficacy, aging life, etc.) is a key link to ensure product quality.
[0003] Currently, BA9S LED lights on the market are typically cylindrical with a protrusion on the lower part of their outer wall. To ensure the accuracy and stability of testing, a dedicated testing device is required for LED lights with the BA9S shape. This testing device must achieve a reliable electrical connection with the LED light and be compatible with equipment for different testing scenarios (such as integrating sphere testing, aging testing, etc.).
[0004] The testing devices for BA9S LED lights are mostly simple structures with many shortcomings: some test sockets use ordinary wires for connection, resulting in poor reliability of the hard connection with the testing system and easy deviation of test data due to poor contact; some test sockets have a loose structural design and lack stable restraint for the LED lights, which can easily cause the lamp body to loosen under harsh testing conditions such as vibration and high and low temperatures, affecting the continuity of testing; at the same time, the electrical connection design between the circuit and the shell of the existing test sockets is unreasonable, making it difficult to balance the stability of electrical signal transmission and the compactness of the structure, thus limiting its applicability in various testing scenarios. Utility Model Content
[0005] To address the problems of loose structure, easy loosening of lamp body, and poor reliability of connection with LED lamps in current test sockets, this utility model provides an LED lamp test socket.
[0006] To solve the above problems, the technical solution adopted by this utility model is as follows: An LED lamp test socket includes a PCB (Printed Circuit Board) circuit board, with power lines connected to the positive and negative solder points of the PCB circuit board. The PCB circuit board is mounted on the bottom surface of a metal sleeve. A conductive pad electrically connected to the PCB circuit board is located inside the metal sleeve. The PCB circuit board is electrically connected to the metal sleeve. A latching assembly is located on the upper part of the metal sleeve to accommodate the LED lamp. This LED lamp test socket achieves a compact structure through the assembly design of the metal sleeve and the PCB circuit board. The upper latching assembly provides a stable hold for the BA9S-shaped LED lamp, solving the problems of loose structure and easy lamp movement in existing test sockets. It can withstand harsh testing conditions such as vibration and high / low temperatures. The electrical connection design between the PCB circuit board and the metal sleeve improves the reliability of hard connections with testing systems, integrating spheres, and other equipment, avoiding test data deviations caused by poor contact. It also balances the stability of electrical signal transmission with structural compactness, thus adapting to various scenarios such as integrating sphere testing, aging testing, and electrical parameter testing.
[0007] Preferably, the bottom surface of the metal sleeve has a groove that mates with the PCB circuit board; a conductive layer is installed on the outer periphery of the PCB circuit board; the PCB circuit board is soldered into the groove using the conductive layer. The groove on the bottom surface of the metal sleeve can position the PCB circuit board, and the soldering connection between the conductive layer on the outer periphery of the PCB and the groove not only enhances the connection stability between the PCB and the metal sleeve through mechanical fixation, effectively avoiding the problem of loose lamps or components caused by loose structure in existing test sockets, and adapting to harsh test conditions such as vibration and high and low temperatures; it also achieves a reliable electrical connection between the PCB and the metal sleeve through the soldering of the conductive layer, replacing the traditional connection method that may have poor contact, ensuring stable electrical signal transmission and reducing test data deviation; at the same time, the combination of the groove and the soldering of the conductive layer balances mechanical fixation and electrical connection functions while ensuring a compact structure, improving adaptability.
[0008] Preferably, the conductive pad is installed inside the metal sleeve via an elastic component; the elastic component is located on the bottom surface inside the metal sleeve. The conductive pad, installed on the bottom surface inside the metal sleeve via the elastic component, provides elasticity, ensuring the conductive pad tightly fits the lamp body electrode when the LED lamp is inserted. This effectively compensates for minor displacements caused by insertion / removal, vibration, or high / low temperatures, avoiding the poor contact problems that easily occur with rigid contact in existing test sockets. This ensures stable electrical signal transmission and reduces test data deviation. Simultaneously, the elastic buffering effect reduces the hard impact loss between the lamp body and the LED lamp test socket. Combined with the structural constraints of the metal sleeve, this further enhances the installation stability of the lamp body under harsh testing conditions, preventing loosening and test interruption. Furthermore, the elastic component is built into the bottom surface of the metal sleeve, not occupying excessive additional space, thus maintaining structural compactness and improving adaptability.
[0009] Preferably, the elastic component includes a base plate; the base plate is placed on the bottom surface of the inner side of the metal sleeve; a spring is fixedly installed on the side of the base plate away from the bottom surface of the metal sleeve; the end of the spring away from the base plate abuts against the bottom surface of the conductive pad; a metal contact is provided in the middle of the conductive pad; the metal contact is connected to the negative solder joint of the PCB circuit board through a lead wire. In the elastic assembly, the base plate is fixed to the inner bottom surface of the metal sleeve, providing stable support for the overall structure. The spring continuously pushes the conductive pad through elastic force, ensuring that the metal contact in the middle of the conductive pad can tightly fit the LED lamp electrode. This effectively compensates for the small gaps caused by insertion / removal, vibration, or temperature changes, avoiding the poor contact problems that are prone to occur in the rigid contact of existing LED lamp test sockets. This ensures stable electrical signal transmission and reduces test data deviation. At the same time, the metal contact is directly connected to the negative solder joint of the PCB circuit board through the lead wire, forming a clear and reliable conductive path, reducing signal loss and further improving the reliability of the electrical connection. The elastic buffering effect of the spring can also reduce the hard impact during lamp insertion / removal, protecting the lamp body and test socket components. Combined with the constraint of the metal sleeve, it enhances the installation stability of the lamp body under harsh testing conditions. Moreover, the base plate, spring, and other components are built into the bottom surface of the sleeve, resulting in a compact structure that does not occupy additional space.
[0010] Preferably, a plurality of protrusions are evenly arranged along the circumferential direction on the outer peripheral wall of the conductive pad; an elongated groove is formed on the outer wall of the metal sleeve to match the protrusions. The protrusions on the outer side of the conductive pad and the elongated groove on the outer wall of the metal sleeve can guide the vertical movement of the conductive pad and restrict its circumferential rotation, ensuring that the metal contact in the middle of the conductive pad is always accurately aligned with the LED lamp electrode, avoiding poor contact caused by positional misalignment, and solving the problem of test data deviation caused by unstable component positioning in existing LED lamp test sockets; this concave-convex mating structure can also enhance the movement stability of the conductive pad under the action of the elastic component, reduce shaking under harsh conditions such as vibration and high and low temperatures, and further improve the reliability of the electrical connection between the lamp body and the LED lamp test socket.
[0011] Preferably, the snap-fit assembly includes a snap-fit groove fixedly disposed on the outer wall of the metal sleeve; the snap-fit groove is configured to cooperate with the second protrusion on the lower outer wall of the LED lamp; the snap-fit groove is L-shaped in general. In the snap-fit assembly, the L-shaped snap-fit groove on the outer wall of the metal sleeve cooperates with the second protrusion on the lower part of the LED lamp. Through the lateral limiting and longitudinal clamping action of the L-shaped structure, a stable mechanical constraint can be formed on the lamp body, effectively solving the problem of lamp body loosening caused by insufficient limiting in existing test seats. Especially under harsh test conditions such as vibration and high and low temperatures, it can ensure the stability of the lamp body position and ensure the continuity of testing. At the same time, the L-shaped design takes into account the convenience of installation. After the lamp body is inserted, it can be rotated to complete the clamping. Disassembly is convenient and improves the efficiency of operation. Moreover, this structure is directly integrated into the outer wall of the metal sleeve without occupying additional space, maintaining the overall compactness of the test seat. It is conducive to docking with devices in various scenarios such as integrating spheres and aging test equipment, and indirectly ensures the reliability of electrical connection through stable lamp body positioning, reducing test data deviation caused by lamp body shaking.
[0012] Preferably, the snap-fit groove includes a vertical groove; a horizontal groove is formed at the lower part of the vertical groove along the peripheral wall of the metal sleeve. The vertical groove of the snap-fit groove provides a smooth insertion path for the second LED lamp boss, while the lower horizontal groove forms a lateral limit after the lamp body rotates, realizing the stable locking of the lamp body.
[0013] Preferably, in the extended state of the spring, the bottom surface of the conductive pad is higher than the top surface of the horizontal slot. This avoids interference between the second boss and the conductive pad during lamp body insertion, ensuring that the second boss can smoothly move down along the vertical slot and rotate to the horizontal slot for fixation. After the lamp body is inserted into the horizontal slot, the spring force pushes the conductive pad upward to adhere to the lamp body electrode, ensuring a tight and reliable electrical connection. This structure solves the problems of lamp body installation jamming or unstable fixation in existing test sockets. Through the synergy of mechanical limiting and elastic conductivity, it ensures that the lamp body does not loosen and the electrical contact is not interrupted under harsh conditions such as vibration and high and low temperatures. It balances installation convenience and testing stability, and is suitable for various scenarios such as integrating sphere and aging tests. Attached Figure Description
[0014] To more clearly illustrate the technical solution of this utility model, the drawings used in the description will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0015] Figure 1 This is a schematic diagram of the structure of the present invention. Figure 1 .
[0016] Figure 2 This is a schematic diagram of the structure of the present invention. Figure 2 .
[0017] Figure 3This is a schematic diagram of the structure of the metal sleeve of this utility model.
[0018] Figure 4 This is a schematic diagram of the structure of this utility model after the metal sleeve is removed.
[0019] Figure 5 This is a schematic diagram of the structure of this utility model in use.
[0020] Figure labeling: 1-PCB circuit board, 2-power cord, 3-metal sleeve, 4-conductive pad, 5-LED light, 6-spring, 7-lead wire, 8-base plate; 101-Conductive layer; 301-Groove; 302-Long strip groove; 303-Snap-fit groove; 401-Metal contact; 402-Boss one; 501-Boss two; 3031-Vertical groove; 3032-Horizontal groove. Detailed Implementation
[0021] To make the objectives, features, and advantages of this utility model more apparent and understandable, the technical solutions of this utility model will be clearly and completely described below with reference to the accompanying drawings of the specific embodiments. Obviously, the embodiments described below are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this patent, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this patent.
[0022] like Figure 1 and Figure 2 As shown, an LED lamp test socket includes a PCB circuit board 1, with power lines 2 connected to the positive and negative solder joints of the PCB circuit board 1 respectively. The PCB circuit board 1 is mounted on the bottom surface of a metal sleeve 3. A conductive pad 4 electrically connected to the PCB circuit board 1 is provided inside the metal sleeve 3. The PCB circuit board 1 is electrically connected to the metal sleeve 3. A snap-fit assembly is provided on the upper part of the metal sleeve 3 to cooperate with the LED lamp 5.
[0023] The LED lamp 5 test holder achieves a compact structure through the assembly design of the metal sleeve 3 and the PCB circuit board 1. With the upper snap-fit component, it can form a stable limit for the BA9S-shaped LED lamp 5, solving the problems of loose structure and easy loosening of lamp body in existing test holders. It can adapt to harsh test conditions such as vibration and high and low temperatures. The electrical connection design between the PCB circuit board 1 and the metal sleeve 3 can improve the reliability of hard connection with test system, integrating sphere and other equipment, avoid test data deviation caused by poor contact, and at the same time take into account the stability of electrical signal transmission and structural compactness, thus adapting to the needs of various scenarios such as integrating sphere testing, aging testing, and electrical parameter testing.
[0024] like Figure 3 , 4As shown in Figure 5, a groove 301 is formed on the bottom surface of the metal sleeve 3 to fit the PCB circuit board 1; a conductive layer 101 is installed on the outer periphery of the PCB circuit board 1; the PCB circuit board 1 is soldered into the groove 301 using the conductive layer 101. A conductive pad 4 is installed inside the metal sleeve 3 via an elastic component; the elastic component is located on the inner bottom surface of the metal sleeve 3. The elastic component includes a base plate 8; the base plate 8 is placed on the inner bottom surface of the metal sleeve 3; a spring 6 is fixedly installed on the side of the base plate 8 away from the bottom surface of the metal sleeve 3; the end of the spring 6 away from the base plate 8 abuts against the bottom surface of the conductive pad 4; a metal contact 401 is provided in the middle of the conductive pad 4; the metal contact 401 is connected to the negative solder joint of the PCB circuit board 1 via a lead wire 7. Several bosses 402 are evenly arranged along the circumferential direction on the outer peripheral wall of the conductive pad 4; a long groove 302 is formed on the outer wall of the metal sleeve 3 to fit the bosses 402.
[0025] The groove 301 on the bottom surface of the metal sleeve 3 can position the PCB circuit board 1. Combined with the welding connection between the conductive layer 101 on the outer periphery of the PCB and the groove 301, the mechanical fixation enhances the connection stability between the PCB and the metal sleeve 3, effectively avoiding the problem of loose lamps or components caused by the loose structure of existing test sockets, and adapting to harsh test conditions such as vibration and high and low temperatures. At the same time, the welding of the conductive layer 101 realizes a reliable electrical connection between the PCB and the metal sleeve 3, replacing the traditional connection method that may have poor contact, ensuring stable electrical signal transmission and reducing test data deviation. Meanwhile, the combination of the groove 301 and the conductive layer 101 welding takes into account both mechanical fixation and electrical connection functions while ensuring a compact structure, thus improving adaptability. The conductive pad 4 is installed on the bottom surface of the metal sleeve 3 via an elastic component. The elastic component provides elasticity, allowing the conductive pad 4 to fit tightly against the lamp body electrode when the LED lamp 5 is inserted. This effectively compensates for minor displacements caused by insertion / removal, vibration, or high / low temperatures, avoiding the poor contact problems that are common with rigid contact in existing test sockets. This ensures stable electrical signal transmission and reduces test data deviation. At the same time, the elastic buffering effect reduces the hard collision loss between the lamp body and the LED lamp 5 test socket. Combined with the structural constraints of the metal sleeve 3, this further enhances the installation stability of the lamp body under harsh test conditions, preventing loosening and test interruption. Moreover, the elastic component is built into the bottom surface of the metal sleeve 3, without occupying too much extra space, thus maintaining structural compactness and improving adaptability. In the elastic assembly, the base plate is fixed to the inner bottom surface of the metal sleeve 3 to provide stable support for the overall structure. The spring 6 continuously pushes the conductive pad 4 through elastic force, so that the metal contact 401 in the middle of the conductive pad 4 can tightly fit the electrode of the LED lamp 5, effectively compensating for the small gaps caused by insertion and removal, vibration or temperature change, avoiding the contact failure problem that is prone to occur in the rigid contact of the existing LED lamp 5 test socket, ensuring stable electrical signal transmission and reducing test data deviation. At the same time, the metal contact 401 is directly connected to the negative solder joint of the PCB circuit board 1 through the lead wire 7, forming a clear and reliable conductive path, reducing signal loss and further improving the reliability of electrical connection. The elastic buffering effect of the spring 6 can also reduce the hard impact when the lamp body is inserted and removed, protecting the lamp body and test socket components. Combined with the constraint of the metal sleeve 3, it enhances the installation stability of the lamp body under harsh test conditions. Moreover, the base plate, spring 6 and other components are built into the bottom surface of the sleeve, with a compact structure that does not occupy additional space.The protrusion 402 on the outer side of the conductive pad 4 engages with the elongated groove 302 on the outer wall of the metal sleeve 3, which guides the vertical movement of the conductive pad 4 and restricts its circumferential rotation. This ensures that the metal contact 401 in the middle of the conductive pad 4 is always accurately aligned with the electrode of the LED lamp 5, avoiding poor contact caused by positional misalignment. This solves the problem of test data deviation caused by unstable component positioning in existing LED lamp 5 test sockets. This concave-convex mating structure also enhances the movement stability of the conductive pad 4 under the action of the elastic component, reduces shaking under harsh conditions such as vibration and high and low temperatures, and further improves the reliability of the electrical connection between the lamp body and the LED lamp 5 test socket.
[0026] In the above configuration, the snap-fit assembly includes a snap-fit groove 303 fixedly mounted on the outer wall of the metal sleeve 3; the snap-fit groove 303 is configured to cooperate with the second boss 501 on the lower outer wall of the LED lamp 5; the snap-fit groove 303 is L-shaped in general. The snap-fit groove 303 includes a vertical groove 3031; the lower part of the vertical groove 3031 has a horizontal groove 3032 along the circumference of the metal sleeve 3. The snap-fit groove 303 includes a vertical groove 3031; the lower part of the vertical groove 3031 has a horizontal groove 3032 along the circumference of the metal sleeve 3, which avoids interference between the second boss 501 and the conductive pad 4 during the insertion of the lamp body, ensuring that the second boss 501 can smoothly move down along the vertical groove 3031 and rotate to the horizontal groove 3032 to complete the fixation, and after the lamp body is snapped into the horizontal groove 3032, the conductive pad 4 is pushed upward to fit against the lamp body electrode by the elastic force of the spring 6, ensuring a tight and reliable electrical connection. This structure solves the problems of jamming or unstable fixing of existing test lamp bodies, and through the synergy of mechanical limiting and elastic conductivity, it ensures that the lamp body does not loosen and the electrical contact is not interrupted under harsh conditions such as vibration and high and low temperatures. It takes into account both installation convenience and testing stability, and is suitable for various scenarios such as integrating sphere and aging test.
[0027] In the snap-fit assembly, the L-shaped snap-fit groove 303 on the outer wall of the metal sleeve 3 engages with the protrusion 501 at the bottom of the LED lamp 5. Through the lateral limiting and longitudinal clamping action of the L-shaped structure, a stable mechanical constraint is formed on the lamp body, effectively solving the problem of lamp body loosening caused by insufficient limiting in existing test seats. Especially under harsh test conditions such as vibration and high and low temperatures, it can ensure the stability of the lamp body position and guarantee the continuity of testing. At the same time, the L-shaped design takes into account the convenience of installation. After the lamp body is inserted, it can be rotated to complete the clamping. Disassembly is convenient and improves the efficiency of operation. Moreover, this structure is directly integrated into the outer wall of the metal sleeve 3 without occupying additional space, maintaining the overall compactness of the test seat. It is conducive to docking with devices in various scenarios such as integrating spheres and aging test equipment. It indirectly ensures the reliability of electrical connection through stable lamp body positioning and reduces test data deviation caused by lamp body shaking. The vertical groove 3031 of the snap-fit groove 303 provides a smooth insertion path for the LED lamp 5 boss 501, while the lower horizontal groove 3032 forms a lateral limit after the lamp body rotates, so as to achieve a stable clamping of the lamp body.
[0028] The above description of the disclosed embodiments enables those skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. An LED lamp test socket, comprising a PCB circuit board (1), wherein power lines (2) are respectively connected to the positive and negative solder joints of the PCB circuit board (1), characterized in that, The PCB circuit board (1) is installed on the bottom surface of the metal sleeve (3); the metal sleeve (3) is provided with a conductive pad (4) that is electrically connected to the PCB circuit board (1); the PCB circuit board (1) is electrically connected to the metal sleeve (3); the upper part of the metal sleeve (3) is equipped with a buckle assembly in conjunction with the LED light (5).
2. The LED lamp test socket according to claim 1, characterized in that, The bottom surface of the metal sleeve (3) is fitted with a groove (301) on the PCB circuit board (1); a conductive layer (101) is installed on the outer periphery of the PCB circuit board (1); the PCB circuit board (1) is soldered into the groove (301) using the conductive layer (101).
3. The LED lamp test socket according to claim 2, characterized in that, The conductive pad (4) is installed inside the metal sleeve (3) by an elastic component; the elastic component is located on the bottom surface inside the metal sleeve (3).
4. The LED lamp test socket according to claim 3, characterized in that, The elastic component includes a base plate (8); the base plate (8) is placed on the bottom surface of the inner side of the metal sleeve (3); a spring (6) is fixedly installed on the side of the base plate (8) away from the bottom surface of the metal sleeve (3); the end of the spring (6) away from the base plate (8) abuts against the bottom surface of the conductive pad (4); a metal contact (401) is provided in the middle of the conductive pad (4); the metal contact (401) is connected to the negative solder joint of the PCB circuit board (1) through the lead wire (7).
5. The LED lamp test socket according to claim 4, characterized in that, The conductive pad (4) has several protrusions (402) evenly arranged along the circumferential direction on the outer peripheral wall; the metal sleeve (3) has a long groove (302) on the outer wall to match the protrusions (402).
6. The LED lamp test socket according to claim 5, characterized in that, The snap-fit assembly includes a snap-fit groove (303) fixedly installed on the outer wall of the metal sleeve (3); the snap-fit groove (303) is set in conjunction with the second boss (501) on the lower outer wall of the LED light (5); the snap-fit groove (303) is L-shaped in general.
7. The LED lamp test socket according to claim 6, characterized in that, The snap-fit groove (303) includes a vertical groove (3031); a horizontal groove (3032) is provided at the lower part of the vertical groove (3031) along the peripheral wall of the metal sleeve (3).
8. The LED lamp test socket according to claim 7, characterized in that, When the spring (6) is extended, the bottom surface of the conductive pad (4) is higher than the top surface of the transverse groove (3032).