Bulk x-ray foreign object detector
CN309907041SActive Publication Date: 2026-04-10CHINA HEFEI TAIHE OPTOELECTRONICS TECH
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- CHINA HEFEI TAIHE OPTOELECTRONICS TECH
- Filing Date
- 2025-08-21
- Publication Date
- 2026-04-10
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Figure 000007_ABST
Abstract
1. The name of the design product: bulk X-ray foreign matter detector. 2. The use of the design product: for bagged material foreign matter rejection, material detection, seal clamping material detection. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.
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