Fully automated flying probe first article testing equipment
CN309915952SActive Publication Date: 2026-04-14SHENZHEN JIE DENG INTELLIGENT CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- SHENZHEN JIE DENG INTELLIGENT CO LTD
- Filing Date
- 2025-06-23
- Publication Date
- 2026-04-14
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Figure 000007_ABST
Abstract
1. Name of the product in this design: Fully Automatic Flying Probe First Article Testing Equipment. 2. Application of this design: This design is mainly used in the electronics assembly industry for visual and parameter inspection of components on the first PCB board produced each shift. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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