Semiconductor strain gauge

CN310006707SActive Publication Date: 2026-05-29汤子萱
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
汤子萱
Filing Date
2025-12-09
Publication Date
2026-05-29

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Abstract

1. Name of the designed product: semiconductor strain gauge. 2. Use of the designed product: for stress-strain measurement. 3. Design points of the designed product: in shape. 4. Picture or photo best showing the design points: perspective view 2.
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