Test adapter for testing an electrical assembly or component

The test adapter addresses inflexibility and damage risks by using a movable support and fixing mechanism to safely and securely test electrical assemblies, ensuring even loading and secure contact.

DE102022203186B4Active Publication Date: 2026-06-11YAMAICHI ELECTRONICS DEUTSCHLAND GMBH

Patent Information

Authority / Receiving Office
DE · DE
Patent Type
Patents
Current Assignee / Owner
YAMAICHI ELECTRONICS DEUTSCHLAND GMBH
Filing Date
2022-03-31
Publication Date
2026-06-11

AI Technical Summary

Technical Problem

Existing test adapters for electrical assemblies are inflexible and can cause mechanical or electrical damage during testing, failing to securely hold and adapt to different assemblies.

Method used

A test adapter with a movable second support element and a fixing mechanism that allows safe mounting and dismounting of electrical assemblies, featuring a translational movement of the fixing element and a locking mechanism to prevent improper contact during closure.

Benefits of technology

Ensures safe and adaptable testing by evenly loading the electrical assembly, preventing mechanical stress and ensuring secure electrical contact, thus protecting the assembly during functional testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

Test adapter (10) for testing an electrical assembly or component, comprising: - a first support element (12) which provides a receiving space (14) for receiving a test module, wherein an electrical assembly to be tested can be arranged on the test module; - a second support member (20) pivotably mounted relative to the first support member (12), wherein in an open position of the test adapter, the second support member (20) is pivoted upwards relative to the first support member, and in a closed position of the test adapter, the second support member (20) is lowered onto the first support member (12); - a fixing element (26) movably mounted on the second support link (20), which is designed to accommodate a fixing module for fixing the electrical assembly to be tested to the test module; - an operating unit (22) pivotably mounted on the second support member (20), which is connected to the fixing member (26) by means of a guide member (28), wherein the closed or open position can be assumed by moving the operating unit (22); and - a locking element (36) rotatably mounted on the second support member (20), which can assume a locking position in which movement of the guide member (28) relative to the second support member (20) is blocked, and an unlocking position in which movement of the guide member (28) relative to the second support member (20) is released, wherein by lowering the second support member (20) onto the first support member (12) into the locking position, the first support member (12) and the locking element (36) form a support (46) and the locking element (36) assumes the unlocked position, and wherein a further pivoting of the control unit (22) relative to the second support member (20) subjects the guide member (28) to a guided movement, wherein the guided movement causes an essentially translational movement of the fixing member (26) into a fixing position in which the fixing module fixes the electrical assembly to be tested to the test module.
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Description

[0001] The invention relates to a test adapter for testing an electrical assembly or an electrical component.

[0002] A test adapter can be used to test an electrical assembly, in particular to perform a functional test on the assembly. The test adapter is designed to hold the electrical assembly under test and make electrical contact with it. Furthermore, it may be possible to connect a test system to the test adapter to perform a functional test on the assembly. Alternatively, the test adapter itself, i.e., without the use of a test system, can perform a functional test on the electrical assembly.

[0003] As a rule, the electrical assemblies to be tested, for example a semiconductor component or an electronic assembly containing a semiconductor component, are sensitive to mechanical and electrical influences and can be damaged by these influences.

[0004] Therefore, when mounting and replacing the electrical assembly under test on the test adapter, it is necessary to avoid improper stress on the assembly. Furthermore, the electrical assembly under test must be properly and securely connected to the test adapter to prevent damage during functional testing. Additionally, the test adapter should be flexibly adaptable to different electrical assemblies.

[0005] Furthermore, DE 10 2015 119 181 A1 relates to a test device for a test object comprising a printed circuit board, comprising a first support (10) providing a holder and / or support for the test object, in particular a specimen carrier, and a second support (12) pivotable about a preferably horizontal pivot axis relative to the first support by manual actuation, in particular a test carrier, which is pivotally connected to the first support so as to allow movement between a test position enabling test contact with the test object and an opening position enabling the insertion or replacement of the test object, wherein the second support is designed and mounted such that two sections of the second support, which are guided to move relative to each other, perform a relative movement to each other during a pivoting between the opening position and the test position, in particular sliding against each other and / or moving against each other.wherein the test position is designed in two stages as a maximally lowered first pivot position and a second pivot position of the second carrier arranged by a differential pivot stroke from the first pivot position, such that in the first pivot position a first plurality of first test pins and in the second pivot position a plurality of second test pins, in particular a reduced plurality compared to the first plurality of first test pins, can be brought into an electrically contacting test contact with the test object, wherein locking means acting on the two sections guided relatively movably to each other are assigned to the second carrier, which are designed such that, after pivoting the second carrier from the first pivot position to the second pivot position by manual actuation, they lock and / or secure the second carrier in the second pivot position.

[0006] DE 10 2019 007 774 A1 relates to a lockable basic module for a modular test system for testing electrical assemblies.

[0007] The CN 1 05 445 502 A refers to a compound sliding mechanism consisting of a needle loading plate module, an upper frame module and a lower box module.

[0008] The CN 1 08 872 829 A refers to a compound sliding mechanism consisting of a needle loading plate module, an upper frame module and a lower box module.

[0009] Furthermore, US 4 812 754 A relates to a device for connecting a printed circuit board to a test system.

[0010] It is therefore an object of the present invention to provide a test adapter for testing an electrical assembly which is flexibly adaptable to different electrical assemblies and which enables safe arrangement and replacement of the electrical assembly.

[0011] This problem is solved by a test adapter having the features specified in claim 1. Preferred embodiments are defined in the dependent claims.

[0012] According to a first aspect, the underlying problem is solved by a test adapter for testing an electrical assembly or component, described in more detail below. The test adapter has a first support element that provides a receiving space for a test module, on which an electrical assembly to be tested can be arranged. A second support element, mounted so that it is movable and / or pivotable relative to the first support element, is provided on the first support element. A fixing element is movably mounted on the second support element, in particular relative to the second support element, and the fixing element is designed to receive a fixing module for fixing the electrical assembly to be tested to the test module.

[0013] In an intended operating position of the test adapter, the first support element may be positioned on a surface, preferably a horizontal one. Furthermore, the test adapter may assume an open position in which the test module is interchangeable. In the open position, the second support element may be pivoted upwards relative to the first support element. The test adapter may also have a closed position in which the second support element is lowered, particularly completely, onto the first support element. In the closed position, the test module may not be interchangeable. To switch between the open and closed positions, the second support element may be moved or pivoted relative to the first support element. Specifically, the second support element may be pivoted about a first axis.to be rotated, with the first axis running essentially horizontally in the operating position of the test adapter.

[0014] The test module can be specifically tailored to the electrical assembly under test. In particular, the test module can have a mounting section that accommodates the electrical assembly under test, or onto which the electrical assembly can be placed when the test module is located in the test adapter or the first support element. For example, the mounting section can have a socket that accommodates the electrical assembly under test. The electrical assembly under test can be, for example, a semiconductor device.

[0015] The test module may also include an electrical contact element that electrically contacts a complementary electrical connection of the electrical assembly when the electrical assembly is mounted on the test module. Furthermore, the test module may have an electrical connection that can be electrically connected to a test system, and through which the electrical assembly can be electrically connected to the test system via the electrical contact element, enabling the test system to perform a functional test on the electrical assembly. Alternatively, the test adapter itself may be designed to perform a functional test on the electrical assembly. The electrical connection provided on the test module may be externally accessible if the test module is located in and / or on the receiving space of the first support element.In particular, the first support element may have an opening through which the electrical connection is accessible. It is understood that the test module may have a variety of electrical contact elements for electrically contacting the electrical component.

[0016] Furthermore, the fixing module can be interchangeable to allow for adaptation to the electrical assembly under test. In particular, the fixing module can be detachably connected to the fixing element. In the locked position, the fixing element can also be moved into a fixing position in which the fixing module connected to the fixing element secures the electrical assembly under test to the test module, specifically pressing or holding the electrical assembly against the test module. Additionally, the fixing module can have an electrical contact element with which the electrical assembly held by the test module is electrically contacted. A test system can also be electrically connected to the electrical assembly via the electrical contact element of the fixing module.

[0017] The test adapter according to the invention further comprises an operating unit pivotably mounted on the second support member, which is connected to the fixing member by means of a guide member. Pivoting the operating unit, particularly relative to the second support member, subjects the guide member to a guided movement, which causes a substantially translational movement of the fixing member. Preferably, the operating unit can be pivotable or rotatable about a second axis, wherein the second axis is substantially horizontal in the operating position of the test adapter and, in particular, is substantially parallel to the first axis. Especially when pivoting the operating unit relative to the second support member, the guide member is subjected to the guided movement.The translational movement of the fixing element has the advantage that the electrical assembly arranged on the test module is evenly loaded by the fixing module when assuming the fixing position, thus avoiding an unfavorable mechanical load on the electrical assembly.

[0018] Furthermore, the test adapter according to the invention has a locking element rotatably mounted on the second support member. This locking element can assume a locking position, in which movement of the guide member, particularly relative to the second support member, is blocked, and an unlocking position, in which movement of the guide member, particularly relative to the second support member, is permitted. By lowering the second support member onto the first support member, the first support member and the locking element form a bearing, whereby the locking element assumes the unlocking position. Advantageously, during the lowering of the second support member onto the first support member, relative movement of the guide member with respect to the second support member is blocked, so that the fixing element cannot be moved or guided into the fixing position during the lowering process.Only when the second support member is lowered, preferably completely, onto the first support member is the locking element moved into the unlocked position, allowing relative movement of the guide member with respect to the second support member. With further movement of the operating unit, the guide member is suspended from the guided movement, and the locking element is moved into the locking position during the translational movement. This prevents the locking element from moving into the locking position while the second support member is being lowered onto the first, thus preventing the locking element from assuming the locking position before the second support member is completely lowered onto the first. Accordingly, improper contact of the electrical assembly by the locking module is prevented.

[0019] Preferably, it can be provided that, in the locked position, movement or pivoting of the control unit relative to the second support element is blocked. In particular, by blocking the guide element in the locked position, movement or pivoting of the control unit relative to the second support element can be indirectly blocked.

[0020] The first support element can be frame-shaped and horizontally define the receiving space in the test adapter's operating position. Furthermore, the second support element can also be frame-shaped.

[0021] Preferably, the locking element is in the unlocked position when the second support member is fully lowered onto the first support member. "Fully lowered" means that the second support member is in a predetermined end position of the locking position relative to the first support member. In particular, the first support member may have a bearing point on which the second support member rests when fully lowered.

[0022] In a preferred embodiment, the second support member has an elongated hole extending from a first side of the second support member to a second side of the second support member. Furthermore, the locking element has an actuating element, in particular a bolt, extending through the elongated hole from the first side, where the locking element is rotatably mounted, with the actuating element forming the bearing on the second side of the second support member. In the operating position of the test adapter and with the second support member fully lowered, the elongated hole has a substantially vertical orientation. Furthermore, the longitudinal axis of the actuating element runs substantially parallel to the first and / or second axis.

[0023] In a preferred embodiment, the locking element is pre-tensioned in the locking position, preferably by means of a spring element. Accordingly, the locking element automatically assumes the locking position as soon as the first support member and the locking element no longer form a bearing, e.g., when the second support member is pivoted relative to the first support member or moved upwards in the operating position of the test adapter.

[0024] In a preferred embodiment, the locking element is designed to engage behind the guide member in the locked position. In other words, in the locked position, the locking element engages behind the guide member to prevent relative movement of the guide member with respect to the second support member.

[0025] In a preferred embodiment, the fixing member can have a fixing member-side guide element which can be guided by a support member-side guide of the second support member in order to guide the fixing member in the translational movement.

[0026] In a further preferred embodiment, the guide on the support member side can be designed as a cam guide, in particular as an elongated slot. Furthermore, the guide element on the fixing member side can have a first cylindrical section that is guided by the guide on the support member side. In the operating position of the test adapter and with the second support member fully lowered onto the first support member, the elongated slot of the guide on the support member side extends essentially vertically.

[0027] Preferably, the guide member can have a guide member-side guide, wherein by pivoting the operating unit, in particular relative to the second support member, the fixing member-side guide element can be guided along the guide member-side guide.

[0028] In a preferred embodiment, the guide element-side guide can be designed as a cam guide, in particular as a curved cam guide. Furthermore, the guide element-side guide can have a second cylindrical section that can be guided by the guide element-side guide.

[0029] In a preferred embodiment, the first and second sections of the guide element on the fixing member side are arranged axially relative to each other. In other words, the first and second sections are axially spaced apart from each other on an imaginary axis, which preferably runs parallel to the first and second axes.

[0030] The following section describes, by way of example, individual embodiments for solving the problem, illustrated by the figures. Some of the described embodiments exhibit features that are not strictly necessary for carrying out the claimed subject matter, but which provide desirable properties in certain applications. Thus, embodiments that do not possess all the features of the embodiments described below are also considered to be disclosed within the scope of the described technical teaching. Furthermore, to avoid unnecessary repetition, certain features are mentioned only in relation to some of the embodiments described below. It should therefore be noted that the individual embodiments should not only be considered individually, but also in combination.From this overview, the person skilled in the art will recognize that individual embodiments can also be modified by incorporating one or more features from other embodiments. It should be noted that a systematic combination of individual embodiments with one or more features described in relation to other embodiments may be desirable and useful, and should therefore be considered and also be regarded as covered by the description. Brief description of the characters Fig. Figure 1 shows a perspective view of a test adapter in which the test adapter is open. Fig. Figure 2 shows a perspective view of the test adapter in which the test adapter is closed. Fig. Figure 3 shows the test adapter closed with a fixing element in a fixing position. Fig. Figure 4 shows a side view of the test adapter in which the test adapter is closed. Fig. Figure 5 shows a side view of the test adapter in which the test adapter is closed, with one guide member not shown. Fig. Figure 6 shows the test adapter closed in a side view with the fixing element lowered into the fixing position, and Fig. 7 a view of a safety element of the test adapter. Detailed description of the figures

[0031] The positional information chosen in the present description, such as top, bottom, side, etc., refers to the figure directly described and illustrated and should be applied analogously to the new position if the position changes.

[0032] Fig. Figure 1 shows a test adapter 10 for testing an electrical component or assembly (not shown). The electrical component or assembly can, in particular, be a semiconductor component. The test adapter 10 has a first support element 12, which, in the operating position of the test adapter 10, can be positioned on a surface, preferably horizontal. For this purpose, the underside of the first support element 12 has several contact points 13, e.g., four contact points which can be designed as adjustable feet, with which the test adapter 10 can be positioned on the surface.

[0033] The first support element 12 further forms a receiving space 14 into which a test module (not shown) can be inserted. In particular, the first support element 12 limits the receiving space 14 in the horizontal direction. The electrical assembly or component to be tested can be arranged on the test module. In particular, in the operating position of the test adapter 10, the electrical component to be tested can be placed on the test module. The test module can, in particular, have a base that receives the electrical component or assembly to be tested. For electrical contacting the electrical component to be tested, the test module further has at least one electrical contact element.Furthermore, the test module can have an electrical connection by means of which the test module can be electrically connected to a test system in order to subject the electrical assembly under test to a functional test with the test system. The first support element 12 can have an opening 16, which is formed, for example, on the rear of the test adapter 10 or the first support element 12 and through which the connection is accessible from the outside.

[0034] The test adapter 10 can be designed to accommodate various test modules (preferably only one at a time), so that the test adapter 10 can be adapted to different electrical assemblies.

[0035] Furthermore, the test adapter 10 has a second support element 20, which is pivotably connected to the first support element 12. The second support element 20 can be pivoted or rotated relative to the first support element 12 about a first imaginary axis A1. In the operating position of the test adapter 10, the axis A1 is essentially horizontal. By pivoting or moving the second support element 20 relative to the first support element 12, the test adapter 10 can assume an open position, as shown in Fig. 1 shown, and a locking position, as shown in the Fig. 2, Fig. 3, Fig. 4, Fig. 5 to Fig. As shown in Figure 6, assume the position. In the open position, the second support element 20 is pivoted upwards about axis A1. In the closed position, the second support element 20 is lowered onto the first support element 12, so that the second support element 20 and the first support element 12 are essentially opposite each other.

[0036] As in Fig. Figure 1 shows the test adapter 10 in the open position; in particular, the second support member 20 is pivoted upwards relative to the first support member 12. In the open position, the receiving chamber 14 is accessible to insert a test module into the receiving chamber 14 or to replace the test module located therein. In contrast, in the closed position of the test adapter 10, as shown, for example, in Fig. Figure 2 shows the test adapter 10 closed, which means that no test module can be inserted into and / or removed from the recording space 14.

[0037] A first control unit 22 is movably or pivotably arranged on the second support element 20. In particular, the first control unit 22 can be moved or pivoted relative to the second support element 20. Preferably, the first control unit 22 can be pivoted about an imaginary axis A2 or rotated in sections. In the operating position of the test adapter 10, the imaginary axis A2 runs essentially horizontally and / or essentially parallel to the imaginary axis A1.

[0038] The first control unit 22 is operable, in particular, by an operator. Preferably, the first control unit 22 can be pivoted by the operator relative to the second support element 20 and moved relative to the first support element 12. In particular, by moving the first control unit 22 downwards, the test adapter 10 can assume the closed position, and by moving the first control unit 22 upwards, it can assume the open position.

[0039] Furthermore, the first support element 12 has a second control unit 24, which is connected to the first support element 12 and is movably mounted on it. The second control unit 24 serves in particular to secure the test module in the receiving chamber 14 or on the first support element 12.

[0040] The test adapter 10 further comprises a fixing element 26, which is movably connected to the second support element 20 or is movably arranged on the second support element 20. The fixing element 26 can, in particular, be arranged on the second support element 20 such that it is movable with a translational movement relative to the second support element 20.

[0041] The fixing element 26 is further designed to accommodate a fixing module (not shown). In particular, the fixing module can be detachably connected to the fixing element 26. In a fixing position of the fixing element 26 (shown in the Fig. 3 and Fig. 6) The fixing module secures the electrical assembly to be tested to the test module. In particular, in the fixing position, the fixing module presses the electrical assembly to be tested against the test module or holds the electrical assembly securely to the test module. In the fixing position, which is preferably assumed in the closed position of the test adapter 10, the fixing element 26 is lowered relative to the second support element 20, which can be verified by comparing the Fig. 5 and Fig. 6 is made clear. In Fig. In section 6, the fixing element 26 is essentially vertically downwards relative to the second support element 20. The fixing module is preferably interchangeable to allow for adaptation to the electrical assembly under test. The fixing module can have one or more electrical contact elements with which the electrical assembly under test is electrically contacted. The electrical contact elements of the fixing module can also be electrically connected to the test system.

[0042] The second support element 20 further comprises a guide element 28, which connects the first control unit 22 to the fixing element 26. The guide element 28 transmits a relative movement of the first control unit 22 with respect to the second support element 20 to the fixing element 26. In particular, pivoting the first control unit 22 relative to the second support element 20 results in a guided movement of the guide element 28, wherein the guided movement of the guide element 28 causes the translational movement of the fixing element 26, in particular lowering it into the fixing position and / or raising it from the fixing position.

[0043] To convert the relative movement of the first control unit 22 with respect to the second support member 20 into a translational movement of the fixing member 26, the fixing member 26 has a fixing member-side guide element 30. Furthermore, the second support member 20 has a support member-side guide 32, and the guide member 28 has a guide member-side guide 34. The fixing member-side guide element 30 is guided by both the support member-side guide 32 and the guide member-side guide 34.

[0044] As in Fig. As shown in Figure 5, where the guide member 28 is not depicted, the support member-side guide 32 is designed as an elongated slot. In the operating position of the test adapter 10 and when the second support member 20 is fully lowered onto the first support member 12, the support member-side guide 32 extends essentially vertically. Accordingly, when the second support member 20 is fully lowered onto the first support member 12, the fixing member 26 can move in a vertical direction. Furthermore, the fixing member-side guide element 30 has a first section 31, which is essentially cylindrical and is guided in the elongated slot of the support member-side guide 32. Preferably, the first section 31 and the second section 33 are arranged sequentially in the axial direction and on an imaginary axis.

[0045] As in particular in the Fig. 1 and Fig. As shown in Figure 4, the guide element 34 on the guide member side is designed as a curved cam guide. A second section 33 of the guide element 30 on the fixing member side, which is essentially cylindrical, is guided in the curved cam guide. When the first control unit 22 pivots downwards relative to the second support member 20, the guide element 28 is displaced essentially transversely to the guide element 32 on the support member side, causing the fixing member 26 to lower vertically. Conversely, when the first control unit 22 is moved in the opposite direction, in particular pivoting upwards relative to the second support member 20, the guide element 28 is displaced in the opposite direction, causing the fixing member 26 to rise vertically.

[0046] Furthermore, a rotatably mounted locking element 36 is arranged on the second support member 20. The locking element 36 can assume a locking position, in which movement of the guide member 28 relative to the second support member 20 is blocked, and an unlocking position, in which movement of the guide member 28 relative to the second support member 20 is permitted. The locking element 36 can be moved from the locking position to the unlocking position and vice versa, in particular, by pivoting the second support member 20 relative to the first support member 12.

[0047] In the locking position, the locking element 36 in particular blocks a relative movement of the guide member 28 with respect to the second support member 20. Furthermore, the connection of the guide member 28 with the first control unit 22 also blocks a movement of the second control unit 22 relative to the second support member 20.

[0048] By lowering the second support member 20 to the first support member 12 (as, for example, in Fig. (2 shown) the first support member 12 and the securing element 36 form a support 46 (see Fig. 7), which moves the locking element 36 from the locked position to the unlocked position. The locking element 36 thus only releases the fixing member 26 from lowering when the second support member 20 is completely lowered onto the first support member 12. "Completely lowered" means that the second support member 20 assumes a predetermined end position relative to the first support member 12. For example, when completely lowered onto the first support member 12, the second support member 20 may rest on a support point 38 of the first support member 12.

[0049] The process of closing the test adapter 10 is described in more detail below. Starting from the point in Fig. In the open position of the test adapter 10 shown in Figure 1, where the locking element 36 is in the locked position and relative movement of the first operating unit 22 with respect to the second support member 20 and / or relative movement of the guide member 28 with respect to the second support member 20 is blocked, the second support member 20 is lowered onto the first support member 12 to achieve the Fig. to assume the orientation shown in Figure 2. To lower the second support member 20, an operator can guide the first control unit 22 downwards. During this movement, in which the first control unit 22 is moved or pivoted relative to the first support member 12, a relative movement of the first control unit 22 with respect to the second support member 20 is blocked by the locking element 36. As shown in particular in Fig. 4 and Fig. As shown in Figure 7, the locking element 36 is moved into the unlocked position by fully lowering the second support member 20 onto the first support member 12. In the unlocked position, the engagement of an engagement section 40 of the locking element 36 with the guide member 28 is released. This allows relative movement of the guide member 28 relative to the second support member 20. Likewise, relative movement of the first operating unit 22 relative to the second support member 20 is also enabled. When the downward movement of the first operating unit 22 continues ( Fig. 6) The guide member 28 is displaced relative to the first support member 20, preferably essentially in a horizontal direction. Due to the above-described design of the guide element 30 on the fixing member side, the guide 32 on the support member side, and the guide member side guide 34, the fixing member 26 is lowered towards the test module essentially in a vertical direction. This allows the electrical component provided on the test module to be uniformly fixed or loaded by the fixing module.

[0050] The test adapter 10 is opened in reverse order. First, the first control unit 22 is moved upwards ( Fig. 5), which leads to a horizontal displacement of the guide member 28. This causes the fixing member 26 to be raised vertically upwards, releasing the fixing of the electrical assembly under test to the test module. With a further upward movement of the first operating unit 22, the support 46 formed between the locking element 36 and the first support member 12 (see Fig. 7) released, so that the locking element 36, which is pre-tensioned for the locking position by a spring element, assumes the locking position. In this position, the engagement section 40 of the locking element 36 engages a complementary engagement section of the guide member 28. Accordingly, relative movement of the guide member 28 with respect to the second support member 20 is blocked. Consequently, the fixing member 26 is immobile or fixed relative to the second support member 20 during the lowering of the second support member 20 onto the first support member 12 and during the raising of the second support member 20.

[0051] With reference to Fig. Section 7 describes the locking element 36 in more detail. The locking element 36 can be rotatably mounted on a first side of the second support member 20. A first elongated hole 42 can be formed in the second support member 20, through which an actuating element 44 of the locking element 36 projects to a second side of the second support member 20. On the second side of the second support member 20, the actuating element 44 can form a bearing 46 with the first support member 12 when the second support member 20 is completely lowered onto the first support member 12. In this position, viewed from the operating position of the test adapter 10, the actuating element 44 is moved upwards in the elongated hole 42, and the engagement section 40 of the locking element 36 is moved downwards, thus disengaging the locking element 36 from the guide member 28.

[0052] As in Fig.As shown in Figure 1, the first support member 12 can be frame-shaped and limit horizontal displacement of the test module in the receiving space 14. The second support member 20 and the fixing member 26 can also be frame-shaped. The fixing member 26 can, in particular, have four fixing member-side guide elements 30, each formed in a corner region of the fixing member 26. Similarly, the second support member 20 can have four slotted cam guides 32, and the guide member 28 can have four curved cam guides 34, which, as described above, guide the fixing member-side guide elements 30. In particular, each fixing member-side guide element 30 can be guided by either a slotted cam guide 32 or a curved cam guide 34.

[0053] Furthermore, the first support element 12 can be connected to the second support element 20 by means of a first spring damper 48, the first spring damper assisting in the opening and / or closing of the test adapter 10. Furthermore, the second support element 20 and the guide element 28 can be connected by means of a second spring damper 50, which assists in a relative movement of the guide element 28 relative to the second support element 20. The second support element 20 can be rotatably or pivotably connected to the first support element 12, particularly at the rear of the test adapter 10.

[0054] Furthermore, the first control unit 22 can be pivotably or rotatably attached to the second support element 20 on the front of the test adapter 10.

[0055] The second support member 20 can, in particular, have two elongated components 52 arranged essentially parallel to each other and spaced apart from each other, which are pivotably mounted at one end on the first support member and at the other end of which the first operating unit 22 is pivotably mounted. The fixing member 26 can be arranged between the components 52 and each component 52 can have two guides 32 on the support member side. Reference symbol list 10 test adapters 12 first support link 13 Support point / adjustable foot 14 Recording room 16 Opening 20 second support link 22 first control unit 24 second control unit 26 Fixing element 28 Lead member 30 Fixing element-side guide element 31 first section fixing element-side guide element 32 Support link-side leadership 33 second section fixing element-side guide element 34 leadership-side leadership 36 locking element 38. Support point (first support link) 40 Intervention section 42 elongated holes for locking element 44 Actuating element 46 supports 48 first spring damper 50 second spring damper 52 building elements A1 first axis A2 second axis

Claims

Test adapter (10) for testing an electrical assembly or component, comprising: - a first support member (12) which provides a receiving space (14) for receiving a test module, wherein an electrical assembly to be tested can be arranged on the test module; - a second support member (20) pivotably mounted relative to the first support member (12), wherein in an open position of the test adapter, the second support member (20) is pivoted upwards relative to the first support member, and in a closed position of the test adapter, the second support member (20) is lowered onto the first support member (12); - a fixing member (26) movably mounted on the second support member (20), which is designed to receive a fixing module for fixing the electrical assembly to be tested on the test module; - an operating unit (22) pivotably mounted on the second support member (20),which is connected to the fixing member (26) by means of a guide member (28), wherein the locking position or opening position can be assumed by moving the operating unit (22); and a locking element (36) rotatably mounted on the second support member (20), which can assume a locking position in which movement of the guide member (28) relative to the second support member (20) is blocked, and an unlocking position in which movement of the guide member (28) relative to the second support member (20) is allowed, wherein by lowering the second support member (20) onto the first support member (12) into the locking position, the first support member (12) and the locking element (36) form a support (46) and the locking element (36) assumes the unlocking position,and wherein a further pivoting of the control unit (22) relative to the second support member (20) subjects the guide member (28) to a guided movement, the guided movement being an essentially translational movement of the fixing member (26) into a fixing position in which the fixing module fixes the electrical assembly to be tested to the test module. Test adapter (10) according to claim 1, wherein the locking element (36) is in the unlocked position when the second support member (20) is fully lowered onto the first support member (12). Test adapter (10) according to claim 1 or 2, wherein the second support member (20) has an elongated hole (42) which extends from a first side of the second support member (20) to a second side of the second support member (20), wherein the locking element (36) has an actuating element (44), in particular a bolt, wherein the actuating element (44) extends through the elongated hole from the first side on which the locking element (36) is rotatably mounted, wherein the actuating element (44) forms the support (46) on the second side of the second support member (20). Test adapter (10) according to one of the preceding claims, wherein the locking element (36) is pre-tensioned in the locking position, preferably by means of a spring element. Test adapter (10) according to one of the preceding claims, wherein the locking element (36) engages with the guide member (28) in the locking position. Test adapter (10) according to one of the preceding claims, wherein the fixing member (26) has a fixing member-side guide element (30) which can be guided by a support member-side guide (32) of the second support member (20) in order to guide the fixing member (26) in the translational movement. Test adapter (10) according to claim 6, wherein the support member-side guide (32) is designed as a cam guide, in particular as a slotted cam guide, and the fixing member-side guide element (30) has a first cylindrical section (31) which can be guided by the support member-side guide (32). Test adapter (10) according to claim 6 or 7, wherein the guide member (28) has a guide member-side guide (34), wherein by pivoting the operating unit (22), the fixing member-side guide element (30) can be guided along the guide member-side guide (34). Test adapter (10) according to claim 8, wherein the guide member-side guide (34) is designed as a cam guide, in particular as a curved cam guide, and the fixing member-side guide element (30) has a second cylindrical section (33) which can be guided by the guide member-side guide (34). Test adapter (10) according to claim 9, wherein the first (31) and second (33) sections of the fixing element-side guide element (30) are arranged axially to each other.