Test fixture, test apparatus, and test method

Abstract

The present application relates to a kind of test fixture, test equipment and test method, it is related to test equipment technical field.The test fixture of the present application includes upper platen assembly, lower platen assembly and test component;Upper platen assembly can move along up and down direction;Lower platen assembly is detachably connected with the upper platen assembly;Test component is located below the lower platen assembly, and the test component is used to place and test the circuit board to be measured;Wherein, the lower platen assembly can move along up and down direction with the upper platen assembly, to compress the circuit board to be measured, so that the detection point on the element face of the circuit board to be measured is contacted with the test component.The technical scheme disclosed in the present application can reduce material consumption, reduce production cost.

Description

Technical Field

[0001] This invention relates to the field of testing equipment technology, and in particular to a testing fixture, testing equipment, and testing method. Background Technology

[0002] With the continuous development of electronic technology, electronic products are constantly enriching our lives. Circuit boards, as one of the most important components, directly affect the performance and quality of electronic products. Therefore, circuit board testing is necessary to ensure their quality.

[0003] Test fixtures are important devices in the circuit board testing process. Test fixtures can ensure effective testing of the component side of the circuit board. Test fixtures include a top plate and a bed of probes. The top plate can move up and down to press the circuit board, so that the component side of the circuit board comes into contact with the probes on the bed of probes, thereby completing the test.

[0004] However, the inventors discovered that the existing technology has at least the following problems: the top plate is usually an integral structure that is inconvenient to disassemble. In order to match different types of circuit boards, the entire top plate needs to be replaced, which increases material consumption and production costs. Summary of the Invention

[0005] This invention provides a test fixture, test equipment, and test method that can reduce material consumption and lower production costs.

[0006] In a first aspect, embodiments of the present invention provide a test fixture, comprising:

[0007] The upper plate component can move vertically.

[0008] The lower pylon assembly is detachably connected to the upper pylon assembly; and

[0009] A test component is located below the lower top plate assembly, and the test component is used to place and test the circuit board under test;

[0010] The lower datum plate assembly can move along the vertical direction with the upper datum plate assembly to press the circuit board under test, so that the detection points on the component surface of the circuit board under test come into contact with the test assembly.

[0011] The upper and lower assemblies are detachably connected, forming a relatively independent split structure. Therefore, when the model of the circuit board under test changes, only the lower assemblies need to be replaced, without replacing the upper assemblies, which can be used as a universal structure. This saves materials and reduces production costs.

[0012] In one embodiment, the upper celestial plate assembly includes a fixing clip, and the lower celestial plate assembly includes fixing members that correspond one-to-one with the fixing clip;

[0013] The fixing clip can clamp or loosen the corresponding fixing member so that the lower celestial plate assembly can be detachably connected to the upper celestial plate assembly.

[0014] The lower and upper pylon assemblies can be detachably connected by using a clamp and a fastener, which is convenient, quick, and improves testing efficiency.

[0015] In one embodiment, the upper disk assembly includes:

[0016] The first upper plate is used to move along the vertical direction under the action of a drive; and

[0017] The second upper ceiling plate is detachably connected to the side of the first upper ceiling plate near the lower ceiling plate assembly, and the fixing clip is disposed on the second upper ceiling plate;

[0018] The second upper plate is equipped with a positioning component.

[0019] By setting up a detachable first and second upper ceiling panels, the upper ceiling assembly is a relatively independent split structure. When the first or second upper ceiling panel is damaged, only the first or second upper ceiling panel can be replaced, without replacing the entire upper ceiling assembly, thereby further saving materials and reducing production costs.

[0020] In one embodiment, the first upper plate / or the second upper plate is provided with a plurality of perforations.

[0021] The weight of the upper plate assembly is reduced by setting multiple perforations.

[0022] In one embodiment, the lower celestial assembly includes:

[0023] The lower ceiling panel, wherein the fastener is disposed on the lower ceiling panel; and

[0024] A pressure bar is disposed on the side of the lower top plate away from the upper top plate assembly, and the pressure bar is used to press the circuit board under test;

[0025] The lower top plate is provided with positioning holes that correspond one-to-one with the positioning components, and the positioning holes are used for inserting the corresponding positioning components.

[0026] The pressure bar presses the circuit board under test (TBT) firmly, ensuring contact between the TT and the probe, thus guaranteeing electrical conductivity between the TT and external testing instruments. The positioning holes and positioning components work together to quickly align the clamp and the fixing component, thereby increasing testing speed.

[0027] In one implementation, the test component includes:

[0028] A needle bed, comprising a main body and a probe disposed on the side of the main body near the lower pylon assembly;

[0029] A tray is movably disposed on the side of the main body near the lower top plate assembly, and the tray is used to place the circuit board under test;

[0030] The tray can move relative to the needle bed in the vertical direction under the action of the lower tray assembly, so that the probe passes through the tray and contacts the detection point on the component surface of the circuit board under test.

[0031] By setting up a tray, not only is a structural basis provided for placing the circuit board under test, but it also acts as a buffer between the circuit board under test and the probe, reducing the impact force from the lower plate assembly and preventing damage to the test points and probes due to excessive impact force.

[0032] In one embodiment, the tray is provided with a probe hole through which the probe passes.

[0033] By setting probe holes, a structural basis is provided for the probe to pass through the tray.

[0034] In one implementation, the test component includes:

[0035] The main directional axis is located on the side of the tray near the main body.

[0036] A main linear bearing is disposed on the side of the main body near the tray, and the main linear bearing is engaged with the main guide shaft;

[0037] An elastic element is located between the tray and the main body, with one end connected to the tray and the other end connected to the main body.

[0038] By setting up a matching main guide shaft and main linear bearing, the movement of the tray in the vertical direction is guided, ensuring that the tray can only move in the vertical direction. The elastic element not only resets the tray but also provides a cushioning function, reducing the impact force between the tray and the needle bed.

[0039] In one embodiment, the lower pylon assembly is provided with a secondary guide shaft, and the test assembly is provided with a secondary linear bearing that cooperates with the secondary guide shaft.

[0040] By setting up matching auxiliary guide shafts and auxiliary linear bearings, the movement of the lower pylon assembly in the vertical direction is guided.

[0041] Secondly, embodiments of the present invention provide a testing device, including the testing fixture as described above.

[0042] Thirdly, embodiments of the present invention provide a testing method, including:

[0043] Select the lower-side disk component based on the circuit board under test;

[0044] Assemble the upper celestial plate assembly and the lower celestial plate assembly, wherein the upper celestial plate assembly and the lower celestial plate assembly are detachably connected;

[0045] Place the circuit board under test on the test assembly;

[0046] The upper disk assembly is moved downwards, causing the lower disk assembly to press against the circuit board under test, so that the detection points on the component surface of the circuit board under test come into contact with the test assembly, and the circuit board under test is tested.

[0047] Compared with the prior art, the advantages of the embodiments of the present invention are that the upper and lower assemblies are detachably connected, forming a relatively independent split structure. Since the specific structure of the lower assemblies is related to the model of the circuit board under test, and the upper assemblies are used to connect with the driving components that can drive its up and down movement, once the model of the circuit board under test changes, only the lower assemblies need to be replaced, without replacing the upper assemblies which can be used as a universal structure. This allows for the matching of different models of circuit boards under test, thereby saving materials, reducing production costs, and solving the problem that existing assemblies require the replacement of the entire assemblies to match different types of circuit boards, increasing material consumption and production costs. Attached Figure Description

[0048] The invention will now be described in more detail with reference to embodiments and the accompanying drawings.

[0049] Figure 1 This is a three-dimensional structural schematic diagram of the test fixture provided in an embodiment of the present invention;

[0050] Figure 2 yes Figure 1 A three-dimensional structural diagram of the upper disk assembly provided in the Chinese embodiment;

[0051] Figure 3 yes Figure 1 A front view of the upper disk assembly provided in the Chinese embodiment;

[0052] Figure 4 yes Figure 1 A three-dimensional structural diagram of the lower pylon assembly provided in the Chinese embodiment;

[0053] Figure 5 yes Figure 1 Front view of the test fixture provided in the embodiment;

[0054] Figure 6 yes Figure 1 Right view of the test fixture provided in the Chinese embodiment.

[0055] Figure label:

[0056] 10. Ascending plate assembly; 110. Fixing clamp; 120. First ascending plate;

[0057] 1201, Auxiliary slot; 130, Second upper plate; 140, Positioning component;

[0058] 20. Lower top plate assembly; 210. Lower top plate; 2101. Positioning holes;

[0059] 220. Pressure bar; 230. Secondary guide shaft; 240. Fixing component;

[0060] 30. Test component; 310. Needle bed; 3101. Main body;

[0061] 3102, probe; 320, tray; 330, main guide axis;

[0062] 340. Main linear bearing; 350. Elastic element; 360. Secondary linear bearing;

[0063] 40. Hollow hole; 50. Support rod. Detailed Implementation

[0064] The invention will now be further described with reference to the accompanying drawings.

[0065] Fixtures are primarily tools used to assist in controlling position or movement. Fixtures can be categorized into three types: process assembly fixtures, project testing fixtures, and circuit board testing fixtures. Circuit board testing fixtures are crucial devices in the circuit board testing process. They ensure effective inspection of the component surfaces of the circuit board. A circuit board testing fixture includes a top plate and a bed of probes. The top plate can move vertically to press the circuit board, bringing the component surfaces into contact with the probes on the bed of probes, thus completing the test.

[0066] However, the inventors discovered that the existing technology has at least the following problems: the top plate is usually an integral structure that is inconvenient to disassemble. In order to match different types of circuit boards, the entire top plate needs to be replaced, which increases material consumption and production costs.

[0067] To address the aforementioned technical problems, at least one embodiment of the present invention provides a test fixture, including an upper upper plate assembly 10, a lower upper plate assembly 20, and a test component 30; the upper upper plate assembly 10 is movable in the vertical direction; the lower upper plate assembly 20 is detachably connected to the upper upper plate assembly 10; the test component 30 is located below the lower upper plate assembly 20, and the test component 30 is used to place and test the circuit board under test; wherein, the lower upper plate assembly 20 can move with the upper upper plate assembly 10 in the vertical direction to press the circuit board under test, so that the detection points on the component surface of the circuit board under test come into contact with the test component 30.

[0068] As can be seen from the above, the upper and lower assemblies 10 are detachably connected, forming a relatively independent split structure. Since the specific structure of the lower assembly 20 is related to the model of the circuit board under test, and the upper assembly is used to connect with the drive component that can drive its up and down movement, once the model of the circuit board under test changes, only the lower assembly 20 needs to be replaced, without replacing the upper assembly 10, which can be used as a universal structure. This allows for the matching of different models of circuit boards under test, thereby saving materials, reducing production costs, and solving the problem that existing assemblies need to be replaced to match different types of circuit boards, which increases material consumption and production costs.

[0069] like Figure 1 As shown, the test fixture includes an upper plate assembly 10, a lower plate assembly 20, and a test component 30; the upper plate assembly 10 is movable in the vertical direction; the lower plate assembly 20 is detachably connected to the upper plate assembly 10; the test component 30 is located below the lower plate assembly 20 and is used to place and test the circuit board to be tested.

[0070] Compared to existing test fixtures where the top plate is a fixed, inconvenient structure that requires complete replacement to match the corresponding circuit board under test, this invention allows for a detachable connection between the upper top plate assembly 10 and the lower top plate assembly 20. This creates a relatively independent, separate structure for the upper and lower top plate assemblies. Only the non-standard lower top plate assembly 20 needs to be replaced, without replacing the standard upper top plate assembly 10. This reduces the number of upper top plates required, saves material consumption, and lowers production costs.

[0071] The lower top plate assembly 20 can move vertically along with the upper top plate assembly 10 to press the circuit board under test, so that the detection points on the component surface of the circuit board under test come into contact with the test assembly 30.

[0072] The test component 30 is used to connect the circuit board under test (PCB) to an external test instrument, so that the electronic components and circuit information of the PCB under test are transmitted to the test instrument. The test instrument analyzes and compares the data to determine whether the electronic components and circuits of the PCB under test are normal, and finally judges whether the PCB under test is qualified.

[0073] It should be noted that, as Figure 1 As shown, the vertical direction is parallel to the Z direction.

[0074] It should also be noted that the circuit board under test includes a component side and a non-component side that are set opposite to each other, and electronic components are mounted on the component side.

[0075] It should also be noted that the test fixture includes a drive unit connected to the upper plate assembly 10. The drive unit is used to drive the upper plate assembly 10 to reciprocate in the vertical direction. The drive unit includes, but is not limited to, cylinders and electric push rods.

[0076] It should also be noted that because the specific structure of the lower mounting plate assembly 20 is related to the model of the circuit board under test (TBT), the lower mounting plate assembly 20 is a non-universal structure. If the TBT circuit board changes, the lower mounting plate assembly 20 needs to be replaced. The upper mounting plate assembly 10, on the other hand, is used to connect to the drive components. The specific structure of the upper mounting plate assembly 10 is not related to the model of the TBT circuit board, so the upper mounting plate assembly 10 is a universal structure and can be used with various TBT circuit boards. Even if the TBT circuit board changes, the upper mounting plate assembly 10 does not need to be replaced.

[0077] like Figures 2-4 As shown, in some embodiments, the upper celestial plate assembly 10 includes a fixing clip 110, and the lower celestial plate assembly 20 includes a fixing member 240 corresponding to the fixing clip 110; wherein the fixing clip 110 can clamp or loosen the corresponding fixing member 240 so that the lower celestial plate assembly 20 is detachably connected to the upper celestial plate assembly 10.

[0078] The lower pylon assembly 20 and the upper pylon assembly 10 are detachably connected by the cooperation of the fixing clip 110 and the fixing piece 240, which is convenient, quick and improves the testing efficiency.

[0079] It should be noted that there can be multiple fixing clips 110 and multiple fixing pieces 240, with each fixing clip 110 corresponding to a different fixing piece 240. For example, ... Figure 3 As shown, there are two fixing clips 110.

[0080] It should also be noted that both the fixing clamp 110 and the fixing component 240 are purchased components. The fixing clamp has a clamping function, and the fixing clamp 110 includes, but is not limited to, pneumatic clamps, electric clamps, and manual clamps. For example, the fixing clamp 110 and the fixing component 240 adopt a push-button clamp in the manual clamp. The fixing clamp 110 is an insert-type self-locking clamp in the push-button clamp, and the fixing component 240 is a clamping pin in the push-button clamp. When the clamping pin is inserted into the insert-type self-locking clamp, it can achieve clamping and self-locking of the clamping pin, thereby realizing the connection between the upper plate assembly 10 and the lower plate assembly 20. When the button on the insert-type self-locking clamp is pressed, the insert-type self-locking clamp can release the clamping pin, thereby disconnecting the connection between the upper plate assembly 10 and the lower plate assembly 20.

[0081] like Figure 2 , Figure 3 As shown, in some embodiments, the upper plate assembly 10 includes a first upper plate 120 and a second upper plate 130; the first upper plate 120 is used to move in the vertical direction under the driving action; the second upper plate 130 is detachably connected to the side of the first upper plate 120 near the test assembly 30, and a fixing clip 110 is disposed on the second upper plate 130; wherein, a positioning member 140 is disposed on the second upper plate 130.

[0082] By setting up a detachable first upper plate 120 and a second upper plate 130, the upper plate assembly 10 is a relatively independent split structure. When the first upper plate 120 or the second upper plate 130 is damaged, only the first upper plate 120 and the second upper plate 130 can be replaced, without replacing the entire upper plate assembly 10, thereby further saving costs.

[0083] It should be noted that the first upper ceiling panel 120 and the second upper ceiling panel 130 are detachably connected. For example, as... Figure 2 As shown, a support rod 50 is provided between the first upper ceiling plate 120 and the second upper ceiling plate 130. Both ends of the support rod 50 are connected to the first upper ceiling plate 120 and the second upper ceiling plate 130 respectively by screws. By setting the support rod 50, a preset distance is maintained between the first upper ceiling plate 120 and the second upper ceiling plate 130, and the height of the support rod 50 is equal to the preset distance, thus ensuring the successful installation of the fixing clamp 110. If the distance between the first upper ceiling plate 120 and the second upper ceiling plate 130 is too small, structural interference will occur between the fixing clamp 110 and the first upper ceiling plate 120, resulting in the fixing clamp 110 not being installed properly.

[0084] It should also be noted that, such as Figure 2 As shown, an auxiliary groove 1201 is provided on the first upper plate 120. The auxiliary groove 1201 corresponds one-to-one with the fixing clamp 110 so that the fixing clamp 110 can be operated to clamp or release the fixing member 240.

[0085] In one embodiment, the first upper plate 120 and / or the second upper plate 130 are provided with a plurality of perforations 40. The weight of the upper plate assembly 10 is reduced by providing a plurality of perforations 40.

[0086] It should be noted that, as Figure 2 As shown, both the first upper plate 120 and the second upper plate 130 are provided with multiple perforated holes 40.

[0087] like Figure 4 As shown, in one embodiment, the lower top plate assembly 20 includes a lower top plate 210 and a pressure bar 220; a fixing member 240 is disposed on the lower top plate 210; the pressure bar 220 is disposed on the side of the lower top plate 210 away from the upper top plate assembly 10, and the pressure bar 220 is used to press the circuit board to be tested; wherein, the lower top plate 210 is provided with positioning holes 2101 corresponding to the positioning members 140, and the positioning holes 2101 are used for the corresponding positioning members 140 to be inserted.

[0088] The pressure bar 220 presses the circuit board under test (TBT) to ensure contact between the TT and probe 3102, thereby ensuring conductivity between the TT and external testing instruments and enabling the TT to complete the test smoothly. The positioning hole 2101, in conjunction with the positioning component 140, positions the lower mounting plate assembly 20 on the upper mounting plate assembly 10, allowing the fixing clamp 110 and fixing component 240 to align quickly, thus improving testing speed.

[0089] It should be noted that the specific location and number of pressure bars 220 are related to the model of the circuit board under test. The pressure bars 220 correspond to the blank areas on the non-component side of the circuit board under test so that the pressure bars 220 avoid the locations of pins, solder joints, etc., and avoid the pressure bars 220 affecting the test of the circuit board under test, resulting in inaccurate test results.

[0090] It should also be noted that the shape of the positioning hole 2101 is adapted to the shape of the positioning member 140, and the shape of the positioning hole 2101 is not limited to being circular.

[0091] It should also be noted that there can be multiple positioning holes 2101 and positioning elements 140, with each positioning element 140 corresponding one-to-one with a positioning hole 2101. For example, as... Figure 3 , Figure 4 As shown, there are four positioning holes 2101 and four positioning pieces 140. The four positioning holes 2101 are located at the corners of the lower top plate 210, and the four positioning pieces 140 are located at the corners of the second upper top plate 130.

[0092] In one embodiment, the test assembly 30 includes a needle bed 310 and a tray 320; the needle bed 310 includes a main body 3101 and probes 3102 disposed on the side of the main body 3101 near the lower top plate assembly 20; the tray 320 is movably disposed on the side of the main body 3101 near the lower top plate assembly 20, and the tray 320 is used to place the circuit board to be tested; wherein, the tray 320 can move in the vertical direction relative to the needle bed 310 under the action of the lower top plate assembly 20, so that the probes 3102 pass through the tray 320 and contact the test points on the component surface of the circuit board to be tested.

[0093] The tray 320 not only provides a structural basis for placing the circuit board under test (TBD), but also acts as a buffer between the TBD and the probe 3102, reducing the impact force from the lower mounting plate assembly 20 and preventing damage to the test points and probe 3102 due to excessive impact. The probe 3102 connects the TBD to the testing instrument, providing a structural basis for the testing of the TBD.

[0094] It should be noted that the specific location and number of probes 3102 are related to the model of the circuit board under test. Probes 3102 correspond to the detection points on the component surface of the circuit board under test. Probes 3102 can transmit the electronic components and circuit information of the circuit board under test to the testing instrument of the testing equipment. The testing instrument analyzes and compares the data to determine whether the electronic components and circuits of the circuit board under test are normal or not, and finally judges whether the circuit board under test is qualified.

[0095] It should also be noted that the test points on the component surface of the circuit board under test include, but are not limited to, metal pins.

[0096] In one embodiment, the tray 320 is provided with a probe hole through which the probe 3102 passes. The probe hole provides a structural basis for the probe 3102 to pass through the tray 320.

[0097] It should be noted that the specific location and number of probe holes are related to probe 3102, and there is a one-to-one correspondence between probe holes and probe 3102.

[0098] like Figure 5 , Figure 6 As shown, in one embodiment, the test assembly 30 includes a main guide shaft 330, a main linear bearing 340, and an elastic element 350; the main guide shaft 330 is disposed on the side of the tray 320 near the main body 3101; the main linear bearing 340 is disposed on the side of the main body 3101 near the tray 320, and the main linear bearing 340 cooperates with the main guide shaft 330; the elastic element 350 is located between the tray 320 and the main body 3101, one end of the elastic element 350 is connected to the tray 320 and the other end is connected to the main body 3101.

[0099] By configuring a matching main guide shaft 330 and main linear bearing 340, the vertical movement of the tray 320 is guided, ensuring that the tray 320 can only move in the vertical direction. The elastic element 350 acts as a reset mechanism. When the test begins, the drive unit moves the upper tray assembly 10 and lower tray assembly 20 downwards, the pressure bar 220 presses against the circuit board, and the circuit board and tray 320 move downwards. The elastic element 350 elastically deforms and stores elastic potential energy. When the test ends, the drive unit moves the upper tray assembly 10 and lower tray assembly 20 upwards, the pressure bar 220 leaves the circuit board, and the circuit board and tray 320 move upwards under the elastic potential energy of the elastic element 350, returning to their initial state. Furthermore, the elastic element 350 has a buffering function, reducing the impact force between the tray 320 and the needle bed 310.

[0100] It should be noted that the elastic element 350 has the function of elastic deformation, and the elastic element 350 includes, but is not limited to, a spring.

[0101] It should also be noted that the main linear bearing 340 is a high-precision, low-cost, and low-friction linear motion system. The main linear bearing 340 has a steel ball cage inside its outer ring, containing multiple rolling balls that circulate infinitely. The cage is fixed at both ends with sealing gaskets, and a notch is provided in the linear track direction of each steel ball's working position. This notch allows the loaded steel ball to make rolling contact with the guide shaft, resulting in relative movement with a very low coefficient of friction.

[0102] like Figure 6 As shown, in one embodiment, the lower plate assembly 20 is provided with a secondary guide shaft 230, and the test assembly 30 is provided with a secondary linear bearing 360 that cooperates with the secondary guide shaft 230.

[0103] By setting up a matching secondary guide shaft 230 and secondary linear bearing 360, the movement of the lower top plate assembly 20 in the vertical direction is guided.

[0104] At least one embodiment of the present invention also provides a testing device, including a testing fixture of any embodiment of the present invention, thereby having all the technical effects brought about by the technical solutions of the above embodiments.

[0105] It should be noted that the testing equipment includes a switch and a testing instrument electrically connected to the probe. The switch is used to control the connection or disconnection between the testing instrument and the circuit board under test, thereby controlling the testing time of the circuit board under test to meet the testing requirements.

[0106] At least one embodiment of the present invention also provides a testing method, comprising:

[0107] Select the lower-side disk component based on the circuit board under test;

[0108] Assemble the upper celestial plate assembly and the lower celestial plate assembly, wherein the upper celestial plate assembly and the lower celestial plate assembly are detachably connected;

[0109] Place the circuit board under test on the test assembly;

[0110] The upper disk assembly is moved downwards, causing the lower disk assembly to press against the circuit board under test, so that the detection points on the component surface of the circuit board under test come into contact with the test assembly, and the circuit board under test is tested.

[0111] In the description of this invention, it should be understood that the terms "upper", "lower", "bottom", "top", "front", "rear", "inner", "outer", "left", "right", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0112] Although the invention has been described with reference to preferred embodiments, various modifications can be made and components can be replaced with equivalents without departing from the scope of the invention. In particular, the technical features mentioned in the various embodiments can be combined in any manner as long as there is no structural conflict. The invention is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.

Claims

1. A test fixture, comprising: include: The upper plate component can move vertically. The lower celestial plate assembly is detachably connected to the upper celestial plate assembly; as well as A test component is located below the lower top plate assembly, and the test component is used to place and test the circuit board under test; The lower top plate assembly can move along the vertical direction with the upper top plate assembly to press the circuit board under test, so that the detection points on the component surface of the circuit board under test come into contact with the test assembly. The upper celestial plate assembly includes a fixing clip, and the lower celestial plate assembly includes fixing members that correspond one-to-one with the fixing clip; The fixing clip can clamp or loosen the corresponding fixing member so that the lower galvanic plate assembly can be detachably connected to the upper galvanic plate assembly; The upper disk assembly includes: The first upper plate is used to move along the vertical direction under the action of a drive; and The second upper ceiling plate is detachably connected to the side of the first upper ceiling plate near the lower ceiling plate assembly, and the fixing clip is disposed on the second upper ceiling plate; The second upper plate is provided with a positioning component, and the lower plate is provided with a positioning hole corresponding to the positioning component. The positioning hole is used for the corresponding positioning component to be inserted. The first upper plate is provided with an auxiliary groove, which corresponds to the fixing clamp to facilitate operation of the fixing clamp.

2. The test fixture of claim 1, wherein, The first upper plate / or the second upper plate is provided with multiple perforations.

3. The test fixture according to claim 1, characterized in that, The lower celestial disk assembly includes: The lower ceiling panel, wherein the fastener is disposed on the lower ceiling panel; and A pressure bar is disposed on the side of the lower top plate away from the upper top plate assembly, and the pressure bar is used to press the circuit board under test; The lower top plate is provided with positioning holes that correspond one-to-one with the positioning components, and the positioning holes are used for inserting the corresponding positioning components.

4. The test fixture according to any one of claims 1-3, characterized in that, The test components include: A needle bed, comprising a main body and a probe disposed on the side of the main body near the lower pylon assembly; A tray is movably disposed on the side of the main body near the lower top plate assembly, and the tray is used to place the circuit board under test; The tray can move relative to the needle bed in the vertical direction under the action of the lower tray assembly, so that the probe passes through the tray and contacts the detection point on the component surface of the circuit board under test.

5. The test fixture according to claim 4, characterized in that, The tray is provided with probe holes through which the probes pass.

6. The test fixture according to claim 5, characterized in that, The test components include: The main directional axis is located on the side of the tray near the main body. A main linear bearing is disposed on the side of the main body near the tray, and the main linear bearing is engaged with the main guide shaft; An elastic element is located between the tray and the main body, with one end connected to the tray and the other end connected to the main body.

7. The test fixture according to any one of claims 1-3, characterized in that, The lower pylon assembly is provided with a secondary guide shaft, and the test assembly is provided with a secondary linear bearing that cooperates with the secondary guide shaft.

8. A testing device, characterized in that, Includes the test fixture as described in any one of claims 1-7.

9. A testing method, characterized in that, It employs the test fixture described in any one of claims 1-7, comprising: Select the lower-side disk component based on the circuit board under test; Assemble the upper celestial plate assembly and the lower celestial plate assembly, wherein the upper celestial plate assembly and the lower celestial plate assembly are detachably connected; Place the circuit board under test on the test assembly; The upper disk assembly is moved downwards, causing the lower disk assembly to press against the circuit board under test, so that the detection points on the component surface of the circuit board under test come into contact with the test assembly, and the circuit board under test is tested.

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