Device network

Abstract

Device network for operating at least one test adapter used in a manufacturing plant for the electrical functional testing of test objects, in particular devices or device components manufactured in the manufacturing plant, wherein the test adapter determines at least one operating status information, wherein the at least one operating status information is read from the operating data memory of the test adapter by means of a service device that can be wirelessly coupled to the test adapter and is stored by the service device in a service device memory, and wherein the service device transmits the operating status information stored in the service device memory via a data transmission network to an external data processing unit, which stores the operating status information in a data space.

Description

[0001] The invention relates to a device assembly for operating at least one test adapter used in a manufacturing plant for the electrical functional testing of test objects, in particular for the electrical functional testing of devices or device components manufactured in the manufacturing plant, wherein the test adapter comprises a housing and at least one test contact unit arranged in the housing for contacting at least one test object contact during a test sequence, and a line arranged in the housing from the at least one test contact unit to a connection provided on the housing, at least one sensor arranged on or in the test adapter, and a data acquisition unit for acquiring values ​​from the sensor, wherein the test adapter is associated with an operating data memory which acquires the values ​​of the at least one sensor acquired by the data acquisition unit and derives at least one operating status information from them.wherein at least one operating status information is read from the operating data memory of the test adapter by means of a service device that can be wirelessly coupled to the test adapter and stored by the service device in a service device memory, and wherein the service device transmits the operating status information stored in the service device memory via a data transmission network to an external data processing unit, which stores the operating status information in a data space.

[0002] The advantage of the solution according to the invention is that the operating data storage in the test adapter is limited with regard to the operating state information to be stored and can therefore only store and evaluate a small volume of operating state information, while the data space of the external data processing unit offers a large number of storage and evaluation options.

[0003] Furthermore, such a test adapter is often located in a manufacturing area where there is no access to a generally usable data transmission network, for example, no internet access.

[0004] For this reason, the solution according to the invention provides that the operating status information is read from a service device and stored in a service device memory, and that the service device is able at another time and place to transmit the operating status information stored in the service device memory via a transmission network, for example the Internet, to an external data processing unit, which then stores the operating status information in a data room.

[0005] This solution also has the advantage that the user of the service device is simultaneously enabled to analyze the operating status information stored in the service device's memory.

[0006] Such a service device is usually available to a service employee or an employee responsible for the manufacturing operation, in order to enable them to intervene if necessary in the event of malfunctions.

[0007] Since a sufficiently large data space can be provided to the external data processing unit, an advantageous solution provides that the external data processing unit also evaluates the transmitted operational status information in addition to storing it.

[0008] Such an evaluation process can take place in many different ways.

[0009] One advantageous solution involves the external data processing unit evaluating the operational status information by comparing it with reference data.

[0010] Such reference data can be older data from the same test adapter, or the reference data can be data from test adapters of the same type.

[0011] Such evaluations can be geared towards a wide variety of results.

[0012] One possibility is that the external data processing unit, as a result of the evaluation, predicts maintenance or future maintenance cycles of the respective test adapter.

[0013] This does not contradict the fact that the test adapter itself can detect and display short-term maintenance needs; however, predicting future maintenance requires a far more complex evaluation process, particularly using data over a longer period than can be stored in the test adapter, and possibly also using data from comparable test adapters of the same type, which are also collected over a longer period.

[0014] Furthermore, the external data processing unit may suggest replacement parts for the predicted maintenance of the respective test adapter.

[0015] Another possibility is that the external data processing unit presents instructions for maintenance, for example in the form of drawings, in particular exact drawings of the components of the test adapter and / or exploded views of the test adapter and / or instructions, for example video instructions, for carrying out the maintenance.

[0016] In order to obtain the most comprehensive data set possible for the respective test adapter, it is particularly advantageous if the external data processing unit creates a complete documentation of the test adapter from the operating status information and / or the evaluations carried out and, in particular, saves this in the data space.

[0017] In connection with the previous explanations regarding the device system according to the invention, the function of the service device was not discussed in detail.

[0018] One particularly advantageous embodiment of the device system provides that the service device communicates with the test adapter via a near-field communication unit.

[0019] This solution offers the possibility of getting relatively close to the test adapter with the service device in order to then start communication.

[0020] For example, it is provided that the service device, after detecting the test adapter, activates wireless near-field communication between the test adapter and the service device, whereby the service device recognizes the test adapter with regard to its data.

[0021] For this near-field communication, it is preferably provided that the test adapter has an internal near-field communication element which is connected to the operating data memory and, in conjunction with a near-field communication element of the service device, enables data exchange between the operating data memory of the test adapter and a service device memory of the service device.

[0022] Such data exchange, especially of operating status information, is triggered in particular by the fact that a triggering process for the operating status information stored in the test adapter can be initiated in the service device.

[0023] In particular, it is provided that an internal communication unit of the test adapter securely transmits the operating status information to a communication unit of the service device.

[0024] Such secure transmission of operating status information between the two communication units of the test adapter and the service device takes place, for example, via Bluetooth or another comparable transmission protocol, but not via the Internet, since Internet communication is often not available in a production area.

[0025] In particular, the transmission of operating status information also takes place in combination with the detailed specifications of the respective test adapter.

[0026] In order to enable a service technician or a production employee to access the operating status information in the event of a service call, it is preferably provided that the service device displays the operating status information of the test adapter stored in the service device memory on a screen, in particular simultaneously with the specifications of the test adapter, which are also transmitted during the transmission of the operating status information.

[0027] In addition, as already explained above, if the service device can be connected to a data transmission network, such as the Internet, the operating status information is transferred from the service device memory to the data space of the external data processing unit, so that all operating status data is transferred to the data space of the external data processing unit during the entire lifespan or operating period of the test adapter.

[0028] This transmission can be read on the service device or initiated when the service device is within range of the data transmission network, such as the Internet.

[0029] Additionally, an advantageous solution for the device network provides that data relating to the respective test adapter can be transferred from the data space of the external data processing unit to the service device's memory using the service device.

[0030] This makes it possible to use the service device to read the current operating status information from the test adapter, but also – for example, for service activities – to access all data available in the data space of the external data processing unit for the respective test adapter.

[0031] It is particularly advantageous if the data from the data room of the external data processing unit can be displayed on the screen of the service device.

[0032] In this context, it is particularly advantageous if operational status information documented and / or evaluated by the service device can be retrieved from the data space of the external data processing unit.

[0033] Furthermore, it has proven particularly advantageous in service situations if all data relating to the detected test adapter are accessible in the data space of the external data processing unit via the service device.

[0034] This applies in particular to maintenance and / or repair documentation available for the respective test adapter, such as detailed illustrations and drawings, maintenance instructions, spare parts lists and spare parts documents, but also to all maintenance forecasts created for each test adapter of the user, including spare parts ordering instructions and spare parts requests, as well as all condition and / or service life forecasts created, and any special information provided to the user for the respective specific test adapter, especially for the specific application of the test adapter.

[0035] In addition to the components described so far, the device network also includes, for example, a reading device, which allows access to the external data processing unit.

[0036] There are several ways to train this reading device.

[0037] One possibility is that the reader is a stationary, especially user-specific, reader, for example a PC or a laptop, with which a connection to the test adapter can be established via a data line, and thus data for identifying the test adapter as well as data for accessing the external data processing unit can be transmitted from the test adapter.

[0038] As an alternative to providing a stationary reading device, an advantageous solution is for the reading device to be a mobile reading device.

[0039] In the case of a mobile reader, it is particularly advantageous if the reader detects an identification unit arranged on the test adapter for the purpose of identifying the test adapter, especially when the reader is brought close to the test adapter.

[0040] In this case, it is specifically intended that the identification unit includes and reads out an optical identification element and / or a near-field communication element arranged on the test adapter.

[0041] For further communication with the external data processing unit, it is preferably provided that the identification element and / or the near-field communication element transmits data from the respective test adapter to the reader.

[0042] It is particularly advantageous if the optical identification element and / or the near-field communication element transmits connection data for communication with the external data processing unit along with the data from the respective test adapter.

[0043] In particular, communication between the reader and the external data processing unit takes place via a communication unit of the reader with the communication unit of the external data processing unit.

[0044] Thus, data stored in a data room on the external data processing unit of the respective operating adapter can preferably be read using the reading device.

[0045] In order to prevent unauthorized persons from accessing all data in the data room of the external data processing facility, it is preferably provided that the data stored in the data room of the external data processing unit is divided into a publicly accessible area and an authorizedly accessible area, and that data in the publicly accessible area can always be viewed with the reading device, while an access code is required to view data in the authorizedly accessible area.

[0046] Such an access code can be provided separately to the user of a mobile reader, and in the case of a stationary reader, the access code may already be stored in the stationary reader, since such a stationary reader can only be used by the operator of the test adapter.

[0047] Further features of the test adapter will be described below.

[0048] In particular, the device assembly according to the invention comprises a test adapter for electrical functional testing of test objects, comprising a housing and at least one test contact unit arranged in the housing for contacting at least one test object contact of the test object during a test sequence and a line arranged in the housing from the at least one test contact unit to a connection provided on the housing, at least one sensor arranged on or in the test adapter and a data acquisition unit for acquiring values ​​of the sensor.

[0049] Such a test adapter serves, particularly in a production plant, to contact a large number of successive test objects, for example electrical circuits or electrical devices or electrical current / voltage sources, and to check them, for example, by measuring voltage and / or current flow.

[0050] Therefore, such a test adapter, especially its test contact unit, is subject to very high wear, whereas, on the other hand, it is necessary for the testing of the test specimen, especially in the area of ​​the contacting of the test specimen contact, to find identical conditions for each test specimen in order to be able to reliably evaluate the measured values.

[0051] In a test adapter of the type described above, it is provided according to the invention that the test adapter is assigned an operating data storage device with a state acquisition unit, which records the values ​​of the at least one sensor recorded by the data acquisition unit and determines an operating state information with this and by evaluating the same.

[0052] The advantage of this solution is that it allows the operating state of the test adapter to be recorded, thus generating operating state information about the extent to which the electrical parameters of the device under test determined by means of the test adapter reliably represent the state of the device under test.

[0053] It is particularly advantageous if the condition monitoring unit uses at least one predefined evaluation process to determine the operating condition information from the values ​​of the at least one sensor recorded by the data acquisition unit.

[0054] Such a predefined evaluation process can be designed in such a way that, depending on the electrical parameters to be recorded by the test adapter, it evaluates the values ​​recorded by the data acquisition unit of the at least one sensor according to a predefined scheme in order to obtain, with the operating status information, as accurate information as possible about the quality of the measurement of the electrical parameters to be recorded.

[0055] One advantageous solution, for example, provides that the condition monitoring unit uses values ​​determined by at least one sensor during a test sequence to determine the operating condition information in the evaluation process.

[0056] This solution has the advantage that the sensor values ​​determined during the test procedure provide the best opportunity for assessing the quality of the electrical parameter measurements to be performed.

[0057] An advantageous solution involves the condition monitoring unit recording the operating condition information determined during several test sequences and then checking whether this operating condition information is within a tolerance defined for the respective operating condition information or not.

[0058] The tolerance range is defined in particular by at least one reference value, and / or several reference values ​​and / or a tolerance band.

[0059] In the simplest case, it is provided that the tolerance range for the respective operating state information is specified for the condition detection unit.

[0060] However, it is also conceivable that the condition monitoring unit determines the tolerance range.

[0061] For example, it is conceivable that the condition monitoring unit determines the tolerance range based on an evaluation of previous operating condition information.

[0062] For example, this is achieved by the condition monitoring unit determining the tolerance range for the respective operating state information by evaluating the operating state information during a sequence of predefined test procedures, assuming unrestricted functionality of the test adapter.

[0063] For example, it is conceivable that unrestricted functionality is recognized by the fact that the values ​​of certain sensors lie within a fixed, narrow tolerance range.

[0064] In connection with the previous explanation of the solution according to the invention, it was assumed that the values ​​of at least one sensor are used to determine the operating state information.

[0065] It is even more advantageous if the condition monitoring unit, in order to determine the operating condition information, correlates the values ​​of at least two sensors during an evaluation process and thereby determines test sequence information as operating condition information, so that conclusions regarding the quality of the recording of the electrical parameters of the test object can be drawn from the test sequence information, i.e. the information about the respective test sequence.

[0066] For the correlated evaluation of the values ​​from at least two sensors, different correlation possibilities are conceivable.

[0067] One particularly simple way to correlate the values ​​is to perform the correlated evaluation of the values ​​via a time correlation, meaning that the respective values ​​are correlated with each other at the same time.

[0068] Another advantageous solution provides that the condition monitoring unit evaluates a value profile of the values ​​of at least one sensor over time in an evaluation process to determine the operating state information, so that operating state information can be generated directly from the value profile and, for example, conclusions can be drawn about the quality of the measurement of the electrical parameters.

[0069] It is particularly advantageous if the condition monitoring unit evaluates a sub-area of ​​the value profile of at least one sensor that occurs during the respective test sequence in order to determine the operating status information, since in this case it is not always necessary to evaluate the entire value profile.

[0070] The specific sub-area can be chosen differently.

[0071] One simple possibility is that the condition monitoring unit, in order to determine the operating condition information, records and evaluates a maximum value and / or a minimum value of the value curve of at least one sensor, for example using it for correlation.

[0072] Another advantageous solution involves the condition monitoring unit averaging operating state information within a first event window and also averaging within subsequent event windows, comparing the averaged operating state information, and generating a warning message if the averaged operating state information changes continuously.

[0073] It is particularly advantageous if the change in the averaged operating state information of an event window relative to the preceding event windows must average more than 5% to generate a warning.

[0074] Within the framework of the solution according to the invention, the determination of the operating state information during the evaluation process by correlating the values ​​of at least two sensors is not limited to a single correlation, but the operating state information obtained by correlating the values ​​of at least two sensors can also be further correlated with values ​​or value trends or values ​​obtained by correlation from the same or further sensors.

[0075] No further details have yet been provided regarding the type of operational status information.

[0076] One advantageous solution provides that the condition monitoring unit identifies conditions that could endanger the test adapter as operating state information during the execution of a first evaluation process.

[0077] Determining such conditions is of considerable advantage in order to detect damage to the test adapter as early as possible.

[0078] In particular, it is provided that the condition monitoring unit, during the execution of the first evaluation process, checks the values ​​of the at least one sensor to see whether they fall below or exceed a defined threshold, so that, for example, if a defined threshold is exceeded, a condition that could endanger the test adapter cannot be ruled out and is reported by the condition monitoring unit by means of a warning message.

[0079] Another advantageous solution provides that the condition monitoring unit determines test sequence information, for example the execution of a plug-in cycle of the test adapter, in particular the complete and then finished execution of a plug-in cycle, as operating state information during the execution of a second evaluation process.

[0080] In particular, it is provided that the condition monitoring unit evaluates current values ​​and acceleration values ​​of the test adapter in a correlated manner to determine the test sequence information, especially of a plug-in cycle.

[0081] Alternatively, it is also conceivable that the condition monitoring unit evaluates sound intensity values ​​and / or current values ​​and / or temperature values ​​and / or voltage data and / or touch data in a correlated manner to determine the test sequence information, in particular a plug-in cycle, of the test adapter.

[0082] In particular, when the condition monitoring unit detects plug-in cycles, it is preferably provided that the condition monitoring unit sums up the number of executed plug-in cycles and, if a maintenance reference value corresponding to a certain number of plug-in cycles is exceeded, generates a maintenance notification, so that the test sequence information results in maintenance information as operating condition information.

[0083] The maintenance reference value can be a fixed value that defines the number of accumulated plug cycles.

[0084] However, since the wear of the test adapter also depends, for example, on the accelerations acting on the test adapter, an advantageous solution provides that the condition monitoring unit changes the maintenance reference value for determining the maintenance instruction depending on the magnitude of the accelerations recorded during the plug-in cycles.

[0085] This means that, for example, accelerations above an acceleration reference value reduce the maintenance reference value for the plug-in cycles, while, for example, accelerations below an acceleration reference value increase the maintenance reference value of the plug-in cycles for determining the maintenance indication.

[0086] Another advantageous solution provides that the condition monitoring unit changes the maintenance reference value to determine the maintenance instruction depending on temperature values, in particular those detected by a sensor near the contact point.

[0087] This means that, for example, the maintenance reference value is reduced if the temperature values ​​of the sensor near the contact point are above a temperature reference value, while the maintenance reference value can be increased if the temperature values ​​of the sensor near the contact point are lower than the temperature reference value.

[0088] Furthermore, it is preferably provided that the condition monitoring unit changes the maintenance reference value to determine the maintenance instruction depending on the current values ​​recorded during the plug-in cycles.

[0089] For example, it is intended that the maintenance reference value will be increased if the current values ​​are lower than a current reference value, or decreased if the current values ​​are higher than a maintenance reference value.

[0090] Furthermore, it is preferably provided that the condition monitoring unit stores temperature values ​​and / or current values ​​and / or acceleration values ​​and / or tolerance messages and / or maintenance instructions.

[0091] In particular, it is intended that the condition monitoring unit will automatically issue tolerance messages and / or maintenance instructions.

[0092] This means that, for example, the condition monitoring unit displays tolerance messages or maintenance instructions acoustically and / or visually, for example by means of light elements or on a screen by means of symbols.

[0093] Furthermore, it is specifically intended that the condition monitoring unit sends messages or maintenance instructions in the form of data to a recipient.

[0094] Another advantageous solution provides that the condition monitoring unit determines wear information, particularly concerning the test contact unit, as operating condition information during the execution of a third evaluation process.

[0095] In particular, it is provided that, during the execution of the third evaluation process, the condition monitoring unit checks at least a defined sub-area of ​​the value profile of the at least one sensor to determine whether this sub-area lies within a tolerance band.

[0096] Furthermore, it is particularly advantageous if the condition monitoring unit checks the operating condition information to see if it shows changes compared to previous operating condition information that are significantly larger than the fluctuations of previous operating condition information, and generates a message in this case.

[0097] It is particularly advantageous if the condition monitoring unit generates a message when the change is greater than twice the fluctuations of corresponding preceding operating condition information.

[0098] Another advantageous solution provides that the condition monitoring unit, during the execution of a fourth evaluation process, determines a future change in condition as operating condition information.

[0099] Using such a future change in state as operating state information makes it possible to predict, in particular, how long the respective test adapter can still be used effectively with reliable measurement results of the electrical quantities.

[0100] In particular, it is provided that, during the execution of the fourth evaluation process within an event window, the state detection unit averages over the same sub-areas of the value progression of at least one sensor and compares the mean values ​​of successive event windows with each other.

[0101] Another advantageous solution provides that the condition monitoring unit records anomalies in test sequences as operating condition information during the execution of a fifth evaluation process.

[0102] Such anomalies can be of any kind, for example, parts that come loose or detach, altered test specimens, especially altered test specimen contacts, or changing movement sequences of the test adapter.

[0103] In particular, it is provided that the condition monitoring unit, during the fifth evaluation process, records at least one value spectrum of the at least one sensor, in particular a spectral distribution of determined sound intensities, during a test sequence and compares it with the value spectrum of previous test sequences, so that anomalies can be inferred from changes in the value spectrum.

[0104] Furthermore, the aforementioned task is solved by a test adapter in which at least one sensor is an acoustic sensor.

[0105] Such an acoustic sensor makes it possible to detect and evaluate any type of sound wave.

[0106] A particularly advantageous solution provides that the acoustic sensor detects frequencies in the frequency range of 20 Hz to 20 kHz, preferably 50 Hz to 10 kHz.

[0107] In the present case, it is preferably provided that the acoustic sensor detects structure-borne sound of the test adapter.

[0108] However, it is also conceivable to arrange the acoustic sensor in such a way that it detects sound from the vicinity of the test adapter.

[0109] In the simplest case, it is intended that the sound intensity detected by the acoustic sensor is recorded as a whole.

[0110] Another advantageous solution involves using a structure-borne sound spectrum of the test adapter and / or an ambient sound spectrum for evaluation.

[0111] Furthermore, it is preferably provided that the condition monitoring unit evaluates the sound intensity or the frequency spectrum correlated with the time of measurement.

[0112] Another advantageous solution to the aforementioned problem provides that the sensor is a temperature sensor, the temperature values ​​of which are recorded in particular by the state detection unit.

[0113] The temperature sensor can be used in a variety of different ways.

[0114] One advantageous solution involves arranging the temperature sensor in a housing of the test adapter.

[0115] The temperature sensor is located either in the contact housing or in the adapter housing of the test adapter.

[0116] In order to measure, in particular, the temperatures in the housing that may result from, for example, heating connection points or electrical faults in the housing, especially cable breaks, broken solder joints or possible short circuits or other unforeseen circumstances, it is preferably provided that the temperature sensor detects an air temperature in the housing and / or a temperature near the housing representing the housing temperature.

[0117] In order to be able to detect the temperature of the test contact unit, in particular its heating, with a temperature sensor, it is preferably provided that the temperature sensor is arranged on a side of the housing, in particular a contact housing, facing the test contact unit.

[0118] It is even more advantageous if the temperature sensor is coupled to the at least one test contact unit via physical heat conduction.

[0119] It is particularly advantageous if the temperature sensor is arranged close to the contact point on at least one test contact unit and, in particular, detects a temperature proportional to the temperature at the contact point.

[0120] It is particularly advantageous if the temperature sensor is connected to the data acquisition unit, which records the temperature values ​​transmitted by the temperature sensor.

[0121] Furthermore, it is preferably provided that the data acquisition unit records the temperature values ​​transmitted by the temperature sensor in correlation with the respective test sequence, whereby the correlation can be time-related or event-related.

[0122] Furthermore, the aforementioned problem is also solved according to the invention in a test adapter in which the sensor is a current sensor that detects a current in a connecting line leading to the test contact unit.

[0123] In particular, the current sensor is designed in such a way that it detects the current in the connecting line without contact.

[0124] Different principles could be used in this process.

[0125] One advantageous solution involves the current sensor detecting the current in the connecting line via its magnetic field.

[0126] In particular, the current sensor is designed as a clamp-on current sensor that encompasses the connecting cable.

[0127] A particularly advantageous embodiment of a clamp-on current sensor provides that it is designed as an old-age current meter.

[0128] Furthermore, an advantageous solution provides that the current sensor is connected to the data acquisition unit, which records current values ​​transmitted by the current sensor.

[0129] It is preferably provided that the data acquisition unit records the current values ​​correlated with the respective test procedure, in particular correlated with time.

[0130] Another advantageous solution involves using a voltage sensor to detect the voltage at the test contacts.

[0131] Another solution to the aforementioned problem involves using an accelerometer to detect the accelerations of the test adapter.

[0132] Preferably, the acceleration sensor is designed as an acceleration sensor that detects accelerations in at least one spatial direction.

[0133] Furthermore, the acceleration sensor is advantageously connected to the data acquisition unit, which includes the acceleration values, particularly with respect to the respective spatial direction.

[0134] With regard to the design of the accelerometer, it has proven particularly advantageous if the accelerometer detects acceleration values ​​in all spatial directions.

[0135] Furthermore, it is particularly advantageous if the acceleration sensor includes both acceleration values ​​and position values ​​relative to the direction of gravity.

[0136] Alternatively or additionally to the detection of accelerations, another advantageous solution involves detecting the touching of the test object by a touch sensor.

[0137] For data storage, it is particularly advantageous if a data storage unit is assigned to the status monitoring unit.

[0138] The data storage unit serves in particular to store data from the data acquisition unit and the status acquisition unit.

[0139] Furthermore, it is also possible to design the data storage unit to store at least one of the following types of data, such as article data, identification data, manufacturing data, maintenance data, process data, operational data, and messages from the condition monitoring unit.

[0140] Furthermore, it is preferably provided that a data communication unit is assigned to the condition monitoring unit, which is connected to at least one of the units, such as the condition monitoring unit, the data storage unit and the data acquisition unit, and exchanges data with an external communication unit.

[0141] The exchange of data with the data communication unit can take place either via a wired connection or wirelessly.

[0142] Furthermore, it is preferably provided that the data communication unit exchanges data via a standard communication protocol.

[0143] Furthermore, the invention also relates to a method for operating at least one test adapter used in a manufacturing plant.

[0144] The foregoing description of solutions according to the invention thus includes in particular the various combinations of features defined by the following numbered embodiments: 1. Device assembly for operating at least one test adapter (10) used in a manufacturing plant for the electrical functional testing of test objects, in particular devices or device components manufactured in the manufacturing plant, wherein the test adapter (10) comprises a housing (12) and at least one test contact unit (22) arranged in the housing (12) for contacting at least one test object contact (32) of the test object (30) during a test sequence, and a line (42, 52) arranged in the housing (12) from the at least one test contact unit (22) to a connection (44, 54) provided on the housing (12), at least one sensor (38, 62, 56, 66, 82, 92, 102) arranged on or in the test adapter (10), and a data acquisition unit (72) for acquiring values ​​from the sensor (38, 62).56, 66, 82, 92, 102), wherein the test adapter (10) is associated with an operating data storage unit (78), which records the values ​​(T, S, B, SI) of the at least one sensor (38, 62, 56, 66, 82, 92, 102) recorded by the data acquisition unit (72) and determines at least one operating status information from this. wherein at least one operating status information is read from the operating data memory (78) of the test adapter (10) by means of a service device (210) that can be wirelessly coupled to the test adapter (10) and stored by the service device (210) in a service device memory (216), that the service device (210) transmits the operating status information stored in the service device memory (216) via a data transmission network to an external data processing unit (240), which stores the operating status information in a data room (244). 2. Device network according to embodiment 1, wherein the external data processing unit (240) evaluates the transmitted operating status information. 3. Device network according to embodiment 2, wherein the external data processing unit (240) evaluates the operating status information by comparison with reference data. 4. Device network according to embodiment 2 or 3, wherein the data processing unit (240) predicts maintenance of the respective test adapter (10) as a result of the evaluation. 5. Device network according to embodiment 4, wherein the external data processing unit (240) suggests replacement parts for the predicted maintenance. 6. Device network according to embodiment 4 or 5, wherein the external data processing unit (240) presents instructions for the predicted maintenance. 7. Device network according to one of the preceding embodiments, wherein the external data processing unit (240) creates a complete documentation of the test adapter (10) from the operating status information and / or the evaluations. 8. Device network according to one of the preceding embodiments, wherein the service device (210) communicates with the test adapter (10) by means of a near field communication unit (200). 9. Device network according to embodiment 8, wherein the service device (210) activates wireless near-field communication between the test adapter (10) and the service device (210) after detecting the test adapter (10), wherein the service device (210) detects the test adapter (10) with regard to its data. 10. Device assembly according to embodiment 9, wherein the test adapter (10) has an internal near-field communication element (202) which is connected to the operating data storage (78) and, in conjunction with a near-field communication element (206) of the service device (210), enables data exchange between the operating data storage of the test adapter (10) and a service device storage (216) of the service device (210). 11. Device network according to embodiment 10, wherein a readout process for the operating status information stored in the test adapter (10) can be triggered in the service device (210). 12. Device network according to embodiment 10 or 11, wherein an internal communication unit (212) of the test adapter (10) securely transmits the operating status information of a communication unit (214) of the service device (210). 13. Device group according to embodiment 12, wherein the service device (210) displays the operating status information of the test adapter (10) stored in the service device memory (216) on a screen (218) of the same. 14. Device network according to embodiment 12 or 13, wherein the service device (210) can be connected to the external data processing unit (240) via the data transmission network for the purpose of receiving data from the external data processing unit (240). 15. Device network according to one of the preceding embodiments, wherein data relating to the respective test adapter (10) can be transferred from the data space (244) of the external data processing unit (240) to the service device memory (216) using the service device (210). 16. Device network according to embodiment 14 or 15, wherein the data from the data space (244) of the external data processing unit (240) can be displayed on the screen (218) of the service device (210). 17. Device network according to embodiment 15 or 16, wherein operating status information documented and / or evaluated with the service device (210) can be retrieved from the data space (244) of the external data processing unit (240). 18. Device network according to one of embodiments 15 to 17, wherein all data relating to the detected test adapter (10) are accessible in the data space (244) of the external data processing unit by means of the service device (210). 19. Device group according to one of the preceding embodiments, wherein access to the external data processing unit (240) is possible by means of a reading device (260). 20. Device assembly according to one of embodiments 1 to 19, wherein the reader (300) is a stationary reader. 21. Device assembly according to one of embodiments 1 to 19, wherein the reader (260) is a mobile reader. 22. Device assembly according to embodiment 19, wherein the reader (260) detects an identification unit (280) arranged on the test adapter (10) for the purpose of identifying the test adapter (10). 23. Device assembly according to embodiment 22, wherein the identification unit (280) reads an optical identification element (282) arranged on the test adapter (10) and / or a near field communication element (264). 24. Device assembly according to embodiment 23, wherein the identification element (282) and / or the near field communication element (264) transmits data from the respective test adapter (10) to the reader (260). 25. Device assembly according to embodiment 23 or 24, wherein the optical identification element (282) and / or the near-field communication element (264) transmits connection data for communication with the external (240) data processing unit with the data of the respective test adapter (10). 26. Device group according to one of embodiments 19 to 25, wherein the reading device (260, 300) communicates with the communication unit (242) of the external data processing unit (240) by means of a communication unit (268, 308). 27. Device group according to embodiment 26, wherein data of the respective test adapter (10) stored on the external data processing unit (240) in a data room (244) can be read out using the reading device (260, 300). 28. Device network according to embodiment 27, wherein the data stored in the data space (244) of the external data processing unit (240) are divided into a generally accessible area (246) and an authorized accessible area (248), and that data in the generally accessible area (246) can be viewed with the reading device (260, 300) in any case, and an access code is required to view data in the authorized accessible area (248). 29. Method for operating at least one test adapter (10) used in a manufacturing plant for the electrical functional testing of test objects, in particular devices or device components manufactured in the manufacturing plant, wherein the test adapter (10) comprises a housing (12) and at least one test contact unit (22) arranged in the housing (12) for contacting at least one test object contact (32) of the test object (30) during a test sequence, and a line (42, 52) arranged in the housing (12) from the at least one test contact unit (22) to a connection (44, 54) provided on the housing (12), at least one sensor (38, 62, 56, 66, 82, 92, 102) arranged on or in the test adapter (10), and a data acquisition unit (72) for acquiring values ​​from the sensor (38, 62).56, 66, 82, 92, 102), wherein the test adapter (10) is associated with an operating data storage device (78), which records the values ​​(T, S, B, SI) of the at least one sensor (38, 62, 56, 66, 82, 92, 102) recorded by the data acquisition unit (72) and determines at least one operating status information from this, wherein the at least one operating status information is read from the operating data storage device (78) of the test adapter (10) by means of a service device (210) that can be wirelessly coupled to the test adapter (10) and is stored by the service device (210) in a service device memory (216), that the service device (210) transmits the operating status information stored in the service device memory (216) via a data transmission network to an external data processing unit (240), which stores the operating status information in a data space (244). 30. Method according to embodiment 29, wherein the external data processing unit (240) evaluates the transmitted operating state information. 31. Method according to embodiment 30, wherein the external data processing unit (240) evaluates the operating state information by comparison with reference data. 32. Method according to embodiment 30 or 31, wherein the data processing unit (240) predicts maintenance of the respective test adapter (10) as a result of the evaluation. 33. Method according to embodiment 32, wherein the external data processing unit (240) suggests replacement parts for the predicted maintenance. 34. Method according to embodiment 32 or 33, wherein the external data processing unit (240) presents instructions for the predicted maintenance. 35. Method according to one of embodiments 29 to 34, wherein the external data processing unit (240) creates a complete documentation of the test adapter (10) from the operating state information and / or the evaluations. 36. Method according to one of embodiments 29 to 35, wherein the service device (210) communicates with the test adapter (10) by means of a near field communication unit (200). 37. Method according to embodiment 36, wherein the service device (210) activates wireless near-field communication between the test adapter (10) and the service device (210) after detecting the test adapter (10), wherein the service device (210) detects the test adapter (10) with regard to its data. 38. Method according to embodiment 37, wherein the test adapter (10) has an internal near-field communication element (202) which is connected to the operating data storage (78) and, in conjunction with a near-field communication element (206) of the service device (210), enables data exchange between the operating data storage of the test adapter (10) and a service device storage (216) of the service device (210). 39. Method according to embodiment 38, wherein a readout process for the operating status information stored in the test adapter (10) can be triggered in the service device (210). 40. Method according to embodiment 38 or 39, wherein an internal communication unit (212) of the test adapter (10) securely transmits the operating status information of a communication unit (214) of the service device (210). 41. Method according to embodiment 40, wherein the service device (210) displays the operating status information of the test adapter (10) stored in the service device memory (216) on a screen (218) of the same. 42. Method according to embodiment 40 or 41, wherein the service device (210) can be connected to the external data processing unit (240) via the data transmission network for the purpose of receiving data from the external data processing unit (240). 43. Method according to one of embodiments 29 to 42, wherein data relating to the respective test adapter (10) can be transferred from the data space (244) of the external data processing unit (240) to the service device memory (216) using the service device (210). 44. Method according to embodiment 42 or 43, wherein the data from the data space (244) of the external data processing unit (240) can be displayed on the screen (218) of the service device (210). 45. Method according to embodiment 43 or 44, wherein operating status information documented and / or evaluated with the service device (210) can be retrieved from the data space (244) of the external data processing unit (240). 46. ​​Method according to one of embodiments 43 to 45, wherein all data relating to the detected test adapter (10) are accessible in the data space (244) of the external data processing unit by means of the service device (210). 47. Method according to one of embodiments 29 to 46, wherein access to the external data processing unit (240) is possible by means of a reading device (260). 48. Method according to one of embodiments 29 to 47, wherein the reading device (300) is a stationary reading device. 49. Method according to one of embodiments 29 to 47, wherein the reading device (260) is a mobile reading device. 50. Method according to embodiment 49, wherein the reader (260) detects an identification unit (280) arranged on the test adapter (10) for the purpose of identifying the test adapter (10). 51. Method according to embodiment 50, wherein the identification unit (280) reads out an optical identification element (282) arranged on the test adapter (10) and / or a near field communication element (264). 52. Method according to embodiment 51, wherein the identification element (282) and / or the near field communication element (264) transmits data from the respective test adapter (10) to the reader (260). 53. Method according to embodiment 51 or 52, wherein the optical identification element (282) and / or the near-field communication element (264) transmits connection data for communication with the external data processing unit (240) using the data from the respective test adapter (10). 54. Test adapter for electrical functional testing of test objects (30), comprising a housing (12) and at least one test contact unit (22) arranged in the housing (12) for contacting at least one test object contact (32) of the test object (30) during a test sequence, and a line (42, 52) arranged in the housing (12) from the at least one test contact unit (22) to a connection (44, 54) provided on the housing (12), at least one sensor (62, 66, 82, 92, 102) arranged on or in the test adapter (10), and a data acquisition unit (72) for acquiring values ​​from the sensor (62, 66, 82, 92, 102), wherein a status sensing unit (76) is assigned to the test adapter, which records the values ​​(T, S, B, SI) of the at least one sensor (62, 66, 82, 92, 102) acquired by the data acquisition unit (72). 66, 82, 92, 102) were recorded and an operating status information was determined by evaluating them. 55. Test adapter according to embodiment 54, wherein the condition detection unit (76) determines the operating condition information from the values ​​(T, S, B, SI) of the at least one sensor (62, 66, 82, 92, 102) acquired by the data acquisition unit (72) by means of at least one predefined evaluation process. 56. Test adapter according to embodiment 54 or 55, wherein the condition detection unit (76) uses values ​​(T, S, B, SI) of the at least one sensor (62, 66, 82, 92, 102) determined during the evaluation process to determine the operating condition information during a test sequence. 57. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) records the operating condition information determined during several test sequences and checks whether this operating condition information is within a tolerance range defined for the respective operating condition information or not. 58. Test adapter according to one of the preceding embodiments, wherein the tolerance range for the respective operating state information is specified for the condition detection unit (76). 59. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) determines the tolerance range. 60. Test adapter according to embodiment 59, wherein the condition detection unit (76) determines the tolerance range based on an evaluation of previous operating condition information. 61. Test adapter according to embodiment 59 or 60, wherein the condition detection unit (76) determines the tolerance range for the respective operating condition information by evaluating the operating condition information during a sequence of predetermined test procedures, assuming unrestricted functionality of the test adapter. 62. Test adapter according to one of embodiments 59 to 61, wherein the unrestricted functionality is recognized by the fact that values ​​of certain sensors lie within a fixed, narrow tolerance range. 63. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) evaluates the values ​​(T, S, B, SI) of at least two sensors (62, 66, 82, 92, 102) in a correlated manner to determine the operating state information during this evaluation process and thereby determines test sequence information as operating state information. 64. Test adapter according to embodiment 63, wherein the correlated evaluation of the value (T, S, B, SI) is carried out via a time correlation. 65. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) evaluates a value profile (TV, SV, BV, SIV) of the values ​​(T, S, B, SI) of the at least one sensor (62, 66, 82, 92, 102) over time (t) in an evaluation process to determine the operating condition information. 66. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) evaluates a partial range (MTV, MSV, MBV, MSIV) of the value profile (TV, SV, BV, SIV) of the at least one sensor (62, 66, 82, 92, 102) occurring during the respective test sequence in order to determine the operating condition information in the evaluation process. 67. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) detects and evaluates a maximum value (MTV, MSV, MBV, MSIV) and / or a minimum value of a value curve (TV, SV, BV, SIV) of the at least one sensor (62, 66, 82, 92, 102) for determining the operating condition information. 68. Test adapter according to the preamble of embodiment 54 or according to one of the preceding embodiments, wherein the condition detection unit averages operating state information within a first event window (EF) and also averages within subsequent event windows (EF), compares the averaged operating state information, and generates a warning message in the event of a continuous change in the averaged operating state information. 69. Test adapter according to embodiment 68, wherein the change in the averaged operating state information of an event window (EF) relative to the preceding event windows (EF) must on average be more than 5% to generate a warning. 70. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) determines conditions endangering the test adapter as operating state information during the execution of a first evaluation process. 71. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) during the execution of the first evaluation process (T, S, B, SI) checks the values ​​of the at least one sensor (62, 66, 82, 92, 102) to see whether they fall below or exceed a defined threshold value (SWT, SSW, BSW, SWS). 72. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) determines test sequence information, for example the execution of a plug-in cycle (SZ) of the test adapter (10), and / or maintenance information as operating condition information during the execution of a second evaluation process. 73. Test adapter according to one of the preceding embodiments, wherein the state detection unit (76) evaluates current values ​​(S) and acceleration values ​​(B) in a correlated manner to determine the test sequence information, in particular to determine a plug-in cycle (SZ) of the test adapter. 74. Test adapter according to embodiment 72 or 73, wherein the condition detection unit (76) sums the number of specified mating cycles (SZ) and generates a maintenance notification when a maintenance reference value corresponding to a certain number of mating cycles is exceeded. 75. Test adapter according to embodiment 74, wherein the condition detection unit (76) changes the maintenance reference value to determine the maintenance instruction depending on the magnitude of the accelerations (B) detected during the plug-in cycles (SZ). 76. Test adapter according to embodiment 74 or 75, wherein the condition detection unit (76) changes the maintenance reference value to determine the maintenance instruction depending on temperature values ​​(T), in particular detected by a contact point sensor (62). 77. Test adapter according to one of embodiments 74 to 76, wherein the condition detection unit (76) changes the maintenance reference value to determine the maintenance instruction depending on the current values ​​(S) detected during the plug-in cycles (SZ). 78. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) stores temperature values ​​(T) and / or current values ​​(S) and / or acceleration values ​​(B) and / or tolerance messages and / or maintenance instructions. 79. Test adapter according to embodiment 78, wherein the condition detection unit (76) automatically outputs tolerance messages and / or maintenance instructions. 80. Test adapter according to embodiment 78 or 79, wherein the condition detection unit (76) optically displays tolerance messages or maintenance instructions. 81. Test adapter according to one of embodiments 78 to 80, wherein the condition detection unit (76) sends tolerance messages or maintenance instructions in the form of data to a receiver. 82. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) determines wear information, in particular relating to the test contact unit, as operating condition information during the execution of a third evaluation process. 83. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) during the execution of the third evaluation process checks at least one defined sub-area (MTV, MSV, MBV, MSIV) of the value profile (TV, SV, BV, SIV) of the at least one sensor (62, 66, 82, 92, 102) to determine whether this sub-area (MTV, MSV, MBV, MSIV) lies within a tolerance band (TB). 84. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) checks the operating state information to see if it shows changes compared to previous operating state information that are significantly larger compared to fluctuations of previous operating state information, and in this case generates a message. 85. Test adapter according to embodiment 84, wherein the condition detection unit (76) then generates a message when the change is greater than 2 times the fluctuations of corresponding preceding operating condition information. 86. Test adapter according to one of the preceding embodiments, wherein the state detection unit (76) determines a future change in state as operating state information during the execution of a fourth evaluation process. 87. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) in the implementation as a fourth evaluation process within an event window (EF) averages over the same sub-areas of the value progression (TV, SV, BV, SIV) of at least one sensor (62, 66, 82, 92, 102) and compares the mean values ​​of successive event windows (EF) with each other. 88. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) detects anomalies in test sequences as operating condition information during the execution of a fifth evaluation process. 89. Test adapter according to one of the preceding embodiments, wherein the condition detection unit (76) during the fifth evaluation process acquires at least one value spectrum (SPV) of the at least one sensor (102) during a test sequence and compares it with the value spectrum (SPV) of previous test sequences. 90. Test adapter according to the preamble of embodiment 54 or according to one of the preceding embodiments, wherein the at least one sensor is an acoustic sensor (102). 91. Test adapter according to embodiment 90, wherein the acoustic sensor (102) detects frequencies in the frequency range from 20 Hz to 20 kHz. 92. Test adapter according to one of embodiments 90 to 91, wherein the acoustic sensor (102) detects sound from the environment of the test adapter (10). 93. Test adapter according to embodiment 90 or 91, wherein the acoustic sensor (102) detects structure-borne sound of the test adapter (10). 94. Test adapter according to one of the embodiments 90 to 93, wherein a structure-borne sound spectrum of the test adapter (10) and / or an ambient sound spectrum is used for evaluation. 95. Test adapter according to one of embodiments 90 to 94, wherein the condition detection unit (76) evaluates the sound intensity or the frequency spectrum (SP) correlated with the time of measurement thereof. 96. Test adapter according to one of the preceding embodiments, wherein the sensor (62) is a temperature sensor. 97. Test adapter according to embodiment 96, wherein the temperature sensor (62') is arranged in a housing (12) of the test adapter (10). 98. Test adapter according to embodiment 96 or 97, wherein the temperature sensor (62) detects the air temperature in the housing (12) and / or near-housing temperature values ​​representing the housing temperature. 99. Test adapter according to embodiment 96 or 98, wherein the temperature sensor (62') is arranged on one side of the housing (12) facing the test contact unit (22). 100. Test adapter according to embodiment 96 or 97, wherein the temperature sensor (62) is coupled to the at least one test contact unit (22) via physical heat conduction. 101. Test adapter according to embodiment 100, wherein the temperature sensor (62) is arranged near the contact point of the at least one test contact unit (22) and detects a temperature proportional to the temperature at the contact point. 102. Test adapter according to one of the preceding embodiments, wherein the at least one temperature sensor (62) is connected to the data acquisition unit (72), which acquires temperature values ​​transmitted by the temperature sensor (62). 103. Test adapter according to one of embodiments 96 to 102, wherein the data acquisition unit (72) records the temperature values ​​transmitted by the temperature sensor (62, 66) correlated with the respective test sequence. 104. Test adapter according to one of the preceding embodiments, wherein the sensor (82) is a current sensor detecting a current in a connecting line (42) leading to the test contact unit (22). 105. Test adapter according to embodiment 104, wherein the current sensor (82) detects the current in the connecting line (42) without contact. 106. Test adapter according to embodiment 105, wherein the current sensor (82) detects the current in the connecting line (42) via its magnetic field. 107. Test adapter according to embodiment 106, wherein the current sensor is designed as a clamp meter (82) encompassing the connecting line (42). 108. Test adapter according to embodiment 107, wherein the clamp meter (82) is designed as a universal current meter. 109. Test adapter according to one of embodiments 104 to 108, wherein the current sensor (82) is connected to the data acquisition unit (72), which acquires current values ​​(S) transmitted by the current sensor (82). 110. Test adapter according to embodiment 109, wherein the data acquisition unit (72) records the current values ​​(S) correlated with the respective test sequence. 111. Test adapter according to one of the preceding embodiments, wherein the sensor is an accelerometer (92). 112. Test adapter according to embodiment 111, wherein the acceleration sensor (92) is designed as an acceleration sensor (92) that detects accelerations in at least one spatial direction. 113. Test adapter according to embodiment 111 or 112, wherein the acceleration sensor (92) is connected to the data acquisition unit (72) which acquires the acceleration values. 114. Test adapter according to one of embodiments 111 to 113, wherein the state detection unit (76) evaluates the acceleration values ​​with regard to the magnitude of the respective acceleration and thus generates acceleration and, in particular, velocity information. 115. Test adapter according to one of the preceding embodiments, wherein a data storage unit (74) is assigned to the condition detection unit (76). 116. Test adapter according to embodiment 115, wherein the data storage unit (74) is coupled to the data acquisition unit (72). 117. Test adapter according to embodiment 115 or 116, wherein the data storage unit (74) stores the data determined by the data acquisition unit (72). 118. Test adapter according to one of the preceding embodiments, wherein the data storage unit (74) stores at least one of the following types of data such as: article data, identification data, manufacturing data, maintenance data, process data and operating data and messages from the condition monitoring unit. 119. Test adapter according to one of the preceding embodiments, wherein a data communication unit (78) is associated with the condition detection unit (76), which is connected to at least one of the units such as condition detection unit (76), data storage unit (74) and data acquisition unit (72) and exchanges data with an external communication unit (100). 120. Test adapter according to embodiment 119, wherein the data communication unit (78) exchanges data via wired or wireless communication. 121. Test adapter according to embodiment 119 or 120, wherein the data communication unit (78) exchanges data via a standard communication protocol.

[0145] Further features and advantages of the invention are the subject of the following drawings and the graphic representation of some exemplary embodiments.

[0146] The drawing shows: Fig. 1 a schematic representation of a first embodiment of a device system comprising a test adapter in conjunction with a test object, a service device, an external data processing unit and a mobile reading device; Fig. 2 a second embodiment of a device network similar Fig. 1 with a stationary reading device; Fig. 3 a schematic representation of a first evaluation process of a state detection unit according to the invention; Fig. 4 a schematic representation of a second evaluation process of the state detection unit according to the invention; Fig. 5 a schematic representation of a third evaluation process of the state detection unit according to the invention; Fig. 6 a schematic representation of a fourth evaluation process of a state detection unit according to the invention; Fig. 7 a schematic representation of the event windows provided in the fourth embodiment and the mean values ​​assigned to the event windows and Fig. 8 a schematic representation of a fifth embodiment of an evaluation process according to the invention.

[0147] A in Fig. 1. An embodiment of a test adapter 10 according to the invention is shown and comprises a housing 12, which is formed from a contact housing 14 and an adapter housing 16 adjoining the contact housing 14.

[0148] The contact housing 14 contains at least one test contact unit 22, for example at least two test contact units 22a, 22b, wherein each of the test contact units 22 has in particular two contact elements 24, 26 which are constructed in such a way that they are able to act on a test object contact 32 of a test object designated as a whole by 30 on different sides with their contact surfaces 34, 36 and thereby establish an electrical contact to the test object contact 32 on different sides of the same.

[0149] In such test contact units 22, for example, one of the contact elements 24, 26, in the illustrated case the contact element 26, is a current-carrying contact and the corresponding other of the contact elements 24, 26, in the illustrated case the contact element 24, is a measuring contact, so that a voltage measurement can be carried out independently of the electric current supplied to the test object contact 32.

[0150] Furthermore, in the test contact unit 22 according to the invention, the contact elements 24 and 26 are preferably pre-tensioned against each other, for example by additional spring elements or by an inherent elasticity, so that they bear against the respective test specimen contact 32 with the necessary pressure.

[0151] Furthermore, a touch sensor 38 is assigned in the contact housing 14, which, for example, uses a spring-loaded stylus 39 to detect whether or not the test object 30 has been mechanically touched.

[0152] If measurements are carried out on the respective test specimen 30 with current application in the test contact units 22 according to the invention, the contact elements 26a and 26b are connected, for example, via current lines 42a and 42b to current connections 44a and 44b arranged on the adapter housing 16, wherein the current connections 44a and 44b are then connected to external current lines leading to the test adapter 10.

[0153] Furthermore, for example, for the corresponding voltage measurements with the test contact units 22, the contact elements 24a and 24b are connected via measuring lines 52a and 52b to measuring terminals 54a and 54b provided on the adapter housing 16, via which, for example, the voltage measurement at the test object contacts 32 is then carried out via external supply lines.

[0154] In addition, it is also possible to detect the voltages applied to the test contacts in the test adapter 10 using a voltage sensor 56.

[0155] A test adapter 10 according to the invention serves to contact a large number of test objects 30, for example, electrical assemblies such as electrical circuits, electrical devices, batteries, etc., manufactured, for example in a production plant, at their test object contacts 32 in the fastest possible succession and to energize them, for example, by supplying current via the contact elements 26, whereby a measurement, in particular a voltage measurement, is simultaneously carried out via the contact elements 24 at the test object contacts 32 in order to verify the functionality of the test object, for example by measuring its internal resistance R. L , to test.

[0156] This has the consequence that each of the test specimens 30 is usually only contacted and measured once by a test adapter 10 according to the invention, while the test adapter 10 according to the invention must be designed in such a way that it is able to carry out measurements on each of the plurality of test specimens 30 that are as precisely reproducible as possible under the most identical measurement conditions possible over a long period of time, since the evaluability of the measurement results depends on the consistent quality of the contacting of the test specimen contacts 32 by the test contact units 22.

[0157] In particular, the test adapter 10 is subjected to significant mechanical and electrical stresses.

[0158] In order to advantageously detect the operating states of the test adapter 10 according to the invention, a temperature sensor 62 is assigned to the test adapter 10, for example, which in the first embodiment is arranged inside the contact housing 14 on one of the contact elements 24, 26, in particular in the illustrated embodiment on the contact element 26, for example on a side facing away from the contact surface 36 and is coupled to the contact element 26 by physical heat conduction and is connected via a sensor line 64 to a data acquisition unit 72 arranged in the adapter housing 16, which is able to detect the temperature data generated by the temperature sensor 62.

[0159] Furthermore, preferably an additional temperature sensor 66 is provided in the adapter housing 16, which is connected to the data acquisition unit 72 by means of a sensor line 68 in order to detect heatings that could lead to scorching in the adapter housing 16.

[0160] Furthermore, the test adapter 10 is equipped with a current sensor unit designated as a whole by 82 and arranged in the adapter housing 16, which is able to detect the current through one of the power lines 42 without contact.

[0161] Preferably, the current sensor unit 82 is designed as a clamp current sensor, which concentrates the magnetic field occurring in the current line 42 by means of a magnetizable core 84 and supplies it to a Hall sensor 86 in an air gap of the core 84, which is thus able to measure the strength of the magnetic field and generate magnetic field data which are also supplied to the data acquisition unit 72 via a sensor line 88.

[0162] In addition, the voltage data U measured by the voltage sensor 56 is supplied to the data acquisition unit 72 via a sensor line 58.

[0163] Furthermore, the test adapter 10 comprises an acceleration sensor 92 arranged in the adapter housing 16, which is also connected to the data acquisition unit 72 by means of a sensor line 94 and is able to detect accelerations in at least one spatial direction, preferably in two, even better in three spatial directions, and to generate acceleration data which are supplied to the data acquisition unit 72 via the sensor line 94.

[0164] Furthermore, the test adapter 10 includes a sound sensor 102 arranged in the housing 12, which is also connected to the data acquisition unit 72 by means of a sensor line 104, and detects the sound intensity or sound spectrum occurring in the housing, which is composed of the sound spectrum of the environment and the sound spectrum occurring during a test procedure and generates sound data which is transmitted to the data acquisition unit (72) via the sensor line 104.

[0165] Furthermore, the touch data I / N generated by the touch sensor 38 are supplied to the data acquisition unit 72 via a sensor line 40.

[0166] At the in Fig. In the first embodiment shown in Figure 1, the data acquisition unit 72 is thus able to acquire operating data of the test adapter 10, comprising the temperature data of the temperature sensors 62 and / or 66, the magnetic field data of the current sensor unit 82, the voltage data of the voltage sensor 56, the acceleration data of the acceleration sensor 92, the sound data of the sound sensor 102 and the touch data of the touch sensor 38, in particular also correlated with the time window of the measurement, and to store, for example, in a data storage unit 74.

[0167] The state detection unit 76, for example, is a processor, in particular a system-on-a-chip.

[0168] The data storage unit 74 can also non-volatilely store other data stored in it relating to the test adapter 10, such as data on the type, manufacture, maintenance and uses of the test adapter 10.

[0169] For displaying warnings or messages, the status monitoring unit 76 is connected to optical indicator elements 106 and / or a display 108, as shown in Fig. 2 shown.

[0170] In the first instance, in Fig. In the embodiment shown in Figure 1, the temperature sensor 62 was arranged directly on one of the contact elements 24, 26, for example on the contact element 26, and was therefore physically thermally connected to it.

[0171] However, the arrangement of the temperature sensor 62 on one of the contact elements 24, 26 can be problematic, especially in the case of very small contacts and / or spatially confined conditions.

[0172] For this reason, in a second, in Fig. In the embodiment shown in Figure 2, the temperature sensor 62' is arranged inside the contact housing 14, but at a location also facing the contact element 26 in this case, so that there is as narrow an air gap 102 as possible between the contact element 26 and the temperature sensor 62' and thus the temperature measurement by means of the temperature sensor 62' reproduces the temperature of the respective contact element, for example the contact element 26, with the highest possible accuracy.

[0173] Furthermore, the solution according to the second embodiment has the advantage that, particularly in the case of thermally sensitive materials of the contact housing 14, its temperature can be measured as accurately as possible, and thus any damage to the contact housing 14 that may occur can be detected in good time.

[0174] Furthermore, in the second embodiment, the sound sensor 102 is not arranged in the adapter housing 16 as in the first embodiment, but in the contact housing 14.

[0175] Furthermore, all those elements of the second embodiment that are identical to those of the first embodiment are provided with the same reference numerals, so that with regard to their description, full reference can be made to the explanations relating to the first embodiment.

[0176] The state acquisition unit 76, which communicates with the data acquisition unit 72 and / or the storage unit 74, is able to evaluate the operating state data, in this case in particular the temperature values ​​T, the current values ​​S, the acceleration values ​​B and the sound intensity values ​​SF, individually or jointly by applying one or more evaluation processes.

[0177] The condition monitoring unit 76, for example, evaluates in a first step in Fig. In the evaluation process 120 shown in section 3, the temperature values ​​T of the temperature sensor 62 are evaluated to determine whether a temperature profile TV over time t exceeds a fixed threshold SWT for the temperature, which represents a limit of a tolerance range for the temperature, from which it can be deduced that the temperature at the test contact units 22, in particular at their current-carrying contact element 26, exceeds a critical value, from which damage to the contact elements 24, 26 or the contact housing 14 may occur.

[0178] In this case, for example, the state detection unit 76 generates temperature information as operating state information, in particular a temperature warning information WT.

[0179] The condition monitoring unit 76 further evaluates, for example in the first evaluation process 120, the current data determined by the current sensor unit 82 to determine whether, when the respective test objects 30 are energized, the current curve SV has exceeded a fixed current threshold SSW representing a limit of a tolerance range for the current S, so that current information is determined in order to be able to conclude, for example, that the test contact units 22 are worn if the current threshold SSW is exceeded.

[0180] In the first evaluation process 120 shown, it is also possible to record an acceleration profile BV over time t based on the acceleration values ​​generated by the accelerometer 92, as shown in Fig. 3 also shown.

[0181] The acceleration curve BV shows, for example, an acceleration and a deceleration before contacting the test object contacts 32 and also an acceleration and a deceleration after contacting the test object contacts 32.

[0182] The acceleration profile BV can also be analyzed to determine, for example, whether a fixed acceleration threshold BSW, representing a limit of a tolerance range for the acceleration B, is exceeded by bumping the test contact unit 10 against an object.

[0183] Furthermore, in connection with the first evaluation process 120, there is the possibility according to Fig. 3 also to compose a sound intensity profile SIV via the sound sensor 102 and to evaluate with regard to whether a fixed threshold value SWS of the sound intensity SI, representing a limit of a tolerance range for the sound intensity SI, is not exceeded, which would be the case, for example, if the test adapter 10 were not properly connected to a test object contact 32, but were to strike against another object.

[0184] Within the framework of this first evaluation process 120, the temperature profile TV, the current profile SV, the acceleration profile BV and the sound intensity profile SIV can be recorded together over time t, but it is also possible to record and evaluate individual such profiles or any combination of these profiles within the framework of the first evaluation process and thereby, for example, to determine test adapter-endangering conditions as operating state information.

[0185] In a second evaluation process 130, shown in Fig. 4. The condition monitoring unit 76 evaluates several pieces of information transmitted by the data acquisition unit 72, for example, information about the current profile SV and / or the acceleration profile BV, or their correlation can also be used to determine the number of plug-in cycles performed by the test adapter 10, in particular fully performed ones.

[0186] The correlation exploits the fact that in a typical plug-in cycle, the acceleration curve BV initially shows a rise and a fall, which results from the test adapter 10 being plugged onto the test object contact 32; subsequently, there is a rise and a fall in the current curve SV, which is caused by the current being applied to the test object; and then there is another rise and a fall in the acceleration curve BV, which is caused by the test adapter 10 being detached from the test object 30, i.e., in particular, being pulled off the test object contact 32.

[0187] Through this correlation of the acceleration curve BV with the current curve SV, the execution, in particular the complete execution, of a plugging cycle SZ can be clearly determined, and thus the plugging cycles SZ carried out with a test adapter 10 can be counted and summed, so that the number of plugging cycles SZ results in a measure for the operating time of the test adapter 10 which, for example, represents test sequence information as operating state information.

[0188] A defined number of mating cycles (SZ) can represent a measure of wear and thus a limit to a tolerance range for the service life of the test adapter.

[0189] Alternatively or additionally, when recording the number of mating cycles SZ, the temperature profile TV can also be used in the second evaluation process 130, and the temperature profile TV can also be analyzed in correlation with the number of mating cycles SZ, for example, to determine whether the temperature profile TV, which increases with each mating cycle SZ, changes with respect to its maximum MTV, for example, whether it increases or decreases.

[0190] An increase in the respective maximum MTV of the temperature profile TV during the respective plug-in cycle SZ, in conjunction with the number of determined plug-in cycles SZ, provides an even more accurate measure of wear.

[0191] The number of mating cycles SZ and the increase in the maximum MTV of the temperature profile TV determined for the number of mating cycles SZ provide a meaningful measure of the wear of the test contact units 22, for example, by the fact that with a number X of mating cycles SZ and an increase in the maximum MTV of the temperature profile TV in the range of up to 10%, no fixed maintenance reference value representing a tolerance range for wear is reached, which would trigger a warning message, whereas, for example, after X mating cycles SZ and an increase in the maximum of the temperature data profile TDV of more than 10%, a fixed maintenance reference value representing a tolerance range for wear is reached or exceeded, which would trigger a maintenance message from the condition detection unit 76.

[0192] Alternatively or additionally, the number of mating cycles SZ can be related to the maxima MBV of the acceleration profile BV, so that after a number of Y mating cycles SZ and an acceleration profile BV whose maxima MBV are below an acceleration threshold BSW, no maintenance reference value is reached, whereas in the case that after Y mating cycles and each acceleration profile BV whose maxima MBV are above the acceleration threshold BSW, a maintenance reference value is reached that triggers a maintenance notification.

[0193] Alternatively or additionally, a trend of the stress data and / or a trend of the contact data over time can be used alone or in correlation.

[0194] As part of the second, in Fig. In the evaluation process 130 shown in section 4, depending on how the test specimen 30 is designed and / or functions, any combination of the aforementioned data or evaluations can be used in accordance with the procedures described above to determine a measure of the wear of the test contact units 22 and, if necessary, to trigger a maintenance notification.

[0195] Thus, for example, in the second evaluation process, test procedure information can be generated to determine maintenance information as operating status information.

[0196] In a third, in Fig. In the evaluation process 140 shown in section 5, it is determined whether the maxima MTV of the temperature profile TV lie within a temperature tolerance band TTB representing a tolerance range for the temperature or have left this temperature tolerance band TTB.

[0197] Similarly, it is determined whether, for example, the current waveform SV with its maxima MSV lies within a current tolerance band STB or outside of it.

[0198] In the same way, it can be determined whether the acceleration profile BV with its maximum MBV lies within an acceleration tolerance band BTB that represents a tolerance range for the acceleration.

[0199] Furthermore, it is also possible to determine whether the sound intensity profile SIV lies within a sound intensity tolerance band SITB, which represents a tolerance range for the sound intensity.

[0200] In the third evaluation process 140, the verification with regard to the respective tolerance band is carried out for at least one of the following curves, the temperature curve TV, the current curve SV, the acceleration curve BV and the sound intensity curve SIV or for several of the same.

[0201] This allows the temperature tolerance band TTB, the current tolerance band STB, the acceleration tolerance band BTB and the sound intensity tolerance band SITB to be fixed or determined over the course of a number of reference test runs, whereby the values ​​determined for the maxima MTV, MSV, MBV and MSIV during these reference test runs are averaged and, starting from these average values, one or more tolerance bands are then determined by adding fixed band values ​​to these average values ​​and / or the deviations from the average value during the determination of the average value may result in base values ​​for the tolerance bands multiplied by a factor.

[0202] Reference test procedures include, for example, all Z test procedures after commissioning a new and / or serviced test adapter 10.

[0203] In a fourth, in Fig. 6 and Fig. In the evaluation process 150 shown in section 7, a specific number, for example the number A, of plugging cycles SZ is grouped into an event window EF, so that after each number of, for example, A plugging cycles an event window EF is completed and thus successive event windows EF1, EF2 and EF3 are formed.

[0204] Within each event window EF, the respective maximum values ​​MTV, MSV, MBV, MSIV are summed.

[0205] Thus, after the event window EF1, the sum of the maxima of the temperature profiles MTV1 is obtained, after the event window EF2, the sum of the maxima of the temperature profiles MTV2 is obtained, after the event window EF3, the sum of the maxima of the temperature profiles MTV3 is obtained, and so on.

[0206] Similarly, after the event windows EF1, EF2 and EF3, the sums of the maxima of the current value curve MSV1, MSV2 and MSV3 are formed, as are the sums of the maxima of the acceleration curve MBV1, MBV2 and MBV3 and the sums of the maxima of the sound intensity curve MSIV1, MSIV2, MSIV3.

[0207] This makes it possible, after the Nth event window EFN, to compare the sum of the maxima of this event window EFN with the sums of the maxima of one of the preceding event windows EF and thereby detect gradual changes in the sums of the maxima of the respective trends.

[0208] For example, if a steady increase in the sum of the maxima of the temperature value curve MTV is detected, a maintenance reference value can be reached according to the strength of the increase, which results in a maintenance indication.

[0209] Similarly, any or all of these sums MTV or MSV or MBV or MSIV can be used to detect a gradual change, such as an increase or decrease, which, if the deviation is sufficient, leads to a maintenance reference value.

[0210] In a fifth evaluation process 160, shown in Fig. 8. The sound sensor 102 does not measure the total sound intensity SI, but rather the spectral distribution SPV of the determined sound intensities in respective time windows ZF. Within each time window ZF, correlations are analyzed between the spectral distribution SPV of this time window and the acceleration profile BV, the current profile SV, and the temperature profile TV. For example, the plug-in cycles SZ determined based on the acceleration profile BV and the current profile SV are compared with the spectral profile SPV in the respective time windows ZF, and it is determined whether, for example, the spectral profile SPV of a later plug-in cycle SZ differs from the spectral profile SPV of a preceding plug-in cycle or cycles SZ.

[0211] The condition monitoring unit 76 can perform the evaluation processes 120, 130, 140, 150, 160 described above in a predetermined temporal sequence or essentially in parallel or partially essentially in parallel.

[0212] The data storage unit 74 and the condition acquisition unit 76 together form an operating data storage unit 78, which stores all operating condition information available for the type of test adapter 10 and its operation, as well as information generated during the operation of the test adapter 10, and in particular also the operating condition information generated during the evaluation processes.

[0213] For communication of the operating status information, the test adapter 10 includes a near-field communication element 202 arranged in the adapter housing 16 with an antenna 204 of a near-field communication unit 200 arranged on the adapter housing 16.

[0214] With this near-field communication element 202, a near-field communication element 206 communicates with an antenna 208 of the near-field communication unit 200, which is integrated in a service device 210, when the latter is brought close to the test adapter 10, and initiates communication between the service device 210 and the operating data storage device 78 via a secure communication protocol, for example Bluetooth, by means of a communication unit 212 of the test adapter 10 coupled to the operating data storage device 78 and a communication unit 214 of the service device 210, in order to enable secure data transmission between the operating data storage device 78 and a service device storage device 216.

[0215] In addition, the service device 210 also has a screen 218 for displaying functions and data.

[0216] Since the storage capacity of the operating data storage 78 is limited, a transfer of operating status information from the operating data storage 78 to the service device storage 216 can be initiated using the service device 210.

[0217] This operating status information stored in the service device memory 216 can be inspected, for example, on screen 218.

[0218] By means of the service device 210, when it is connected via the Internet to a communication unit 242 of an external data processing unit 240, for example a server in the cloud, via its communication unit 232, the operating status information is transmitted, which the external data processing unit 240 then stores in a data room 244 in order to make the operating status information available in particular for long-term analyses.

[0219] The currently transmitted operating status information can then be compared and analyzed in the data space 244 of the external data processing unit 240 with previously stored older operating status information of this test adapter 10 and / or other test adapters 10, whereby long-term analyses can be carried out in particular to create service life predictions for the individual components of the test adapter 10 and / or maintenance predictions for the respective test adapter 10 and / or status analyses for the respective test adapter 10.

[0220] In particular, such forecasts and analyses can be created using the operating condition information over the entire lifetime of the respective test adapter 10 or comparable test adapters.

[0221] The external data processing unit 240 also contains at least one of the following pieces of information: - detailed documentation for each user's test adapter 10, - Service instructions for each test adapter 10, - Spare parts information for each user's test adapter 10, - Spare parts request options are accessible for each user's test adapter.

[0222] All this data can be loaded from the service device 210 from the data storage 244 of the external data processing unit 240 into the service storage 216 and viewed on the screen 218.

[0223] The device network includes, as in Fig. 1 shown, also a mobile reading device 260, with which access to the external data processing unit 240 is possible in order to obtain information about the test adapter 10.

[0224] For this purpose, an identification unit 280 can be detected by the mobile reader 260, which is arranged on an outside of the test adapter 10, in particular the adapter housing 16, wherein the identification unit 280 has an optically readable code, for example in the form of a QR code 282, which can be read by means of an optical scanner or a camera 262 of the mobile reader 260 and / or has a near field communication element 284 with an antenna 286, which interacts with a near field communication element 264 with an antenna 266 of the reader 260 when the mobile reader 260 is arranged near the identification unit 280.

[0225] In both cases, the mobile reader 260 reads data from the identification unit 280, which transmits data to a communication unit 268 in the reader 260 for identifying the test adapter 10 as well as data for accessing the external data processing unit 240 via the communication unit 242, so that a connection between the reader 260 and the external data processing unit 240 can be established and the reader 260 can access the data space 244 of the external data processing unit 240.

[0226] However, the data space 244 is preferably divided into a generally accessible data space area 246 and a data space area 248 that is only accessible via an identification code.

[0227] The generally accessible data room area 246 contains data that should be accessible to the public, i.e. also to third parties who do not operate the test adapter 10 identified by means of the identification unit 280.

[0228] For example, data space area 246 contains at least one of the following pieces of information: - general documentation about the test adapter 10 identified by the identification unit 280, - Initial information on the test adapter 10 identified by the identification unit 280, - Request options for service with initial instructions, - Options for requesting spare parts.

[0229] The data space area 248, which is only accessible via an identification code, contains data that should only be accessible to the operator of the identified test adapter 10, whereby a user-specific access code must be entered in the reader 260 to access the data space area 248.

[0230] Data space area 248, for example, includes at least one of the following pieces of information: - Data for all 10 test adapters of a user, - for each test adapter 10 of a user, all operating status information, in particular ordered chronologically over its previous service life, - for each user's test adapter 10, the maintenance and repair documentation, such as detailed illustrations and drawings, maintenance instructions, spare parts lists, spare parts order documents, - for each user's test adapter 10, all created maintenance forecasts with spare parts ordering instructions and spare parts requests, - all created condition and / or lifetime forecasts, - special information provided to the user for the test adapter 10 identified by the identification unit 280, in particular for the specific application of the test adapter 10.

[0231] As in Fig.As shown in Figure 2, it is also possible to use a stationary, user-specific reader 300, for example a PC or a laptop, in the device network instead of the mobile reader 260. This reader can be connected to the test adapter 10 via a data line 302 and thus transmits data for the identification of the test adapter 10 as well as data for accessing the external data processing unit 240 via the communication unit 242 using a communication unit 308 of the reader 300. This allows a connection between the stationary, user-specific reader 300 and the external data processing unit 240 to be established, and the data space 244 of the external data processing unit 240 can be accessed with the stationary reader 300 in the same way and to the same extent as described in connection with the mobile reader 260.

Claims

[1] Device assembly for operating at least one test adapter (10) used in a manufacturing plant for the electrical functional testing of test objects, in particular devices or device components manufactured in the manufacturing plant, wherein the test adapter (10) comprises a housing (12) and at least one test contact unit (22) arranged in the housing (12) for contacting at least one test object contact (32) of the test object (30) during a test sequence and a line (42, 52) arranged in the housing (12) from the at least one test contact unit (22) to a connection (44, 54) provided on the housing (12), at least one sensor (38, 62, 56, 66, 82, 92, 102) arranged on or in the test adapter (10) and a data acquisition unit (72) for acquiring values ​​from the sensor (38, 62).56, 66, 82, 92, 102), wherein the test adapter (10) is associated with an operating data storage device (78), which records the values ​​(T, S, B, SI) of the at least one sensor (38, 62, 56, 66, 82, 92, 102) recorded by the data acquisition unit (72) and determines at least one operating status information from this, wherein the at least one operating status information is read from the operating data storage device (78) of the test adapter (10) by means of a service device (210) that can be wirelessly coupled to the test adapter (10) and is stored by the service device (210) in a service device memory (216), that the service device (210) transmits the operating status information stored in the service device memory (216) via a data transmission network to an external data processing unit (240), which stores the operating status information in a data space (244). [2] Device assembly according to claim 1, characterized by, that the external data processing unit (240) evaluates the transmitted operational status information. [3] Device assembly according to claim 2, characterized by , that the external data processing unit (240) evaluates the operating status information by comparison with reference data. [4] Device assembly according to claim 2 or 3, characterized by , that the data processing unit (240) predicts maintenance of the respective test adapter (10) as a result of the evaluation. [5] Device assembly according to claim 4, characterized by , that the external data processing unit (240) suggests replacement parts for the predicted maintenance. [6] Device assembly according to claim 4 or 5, characterized by , that the external data processing unit (240) presents instructions for the predicted maintenance. [7] Device assembly according to one of the preceding claims, characterized by, that the external data processing unit (240) creates a complete documentation of the test adapter (10) from the operating status information and / or the evaluations. [8] Device assembly according to one of the preceding claims, characterized by , that the service device (210) communicates with the test adapter (10) via a near field communication unit (200). [9] Device assembly according to claim 8, characterized by , that the service device (210) activates wireless near-field communication between the test adapter (10) and the service device (210) after detecting the test adapter (10), wherein the service device (210) detects the test adapter (10) with regard to its data. [10] Device assembly according to claim 9, characterized by, that the test adapter (10) has an internal near-field communication element (202) which is connected to the operating data memory (78) and, in conjunction with a near-field communication element (206) of the service device (210), enables data exchange between the operating data memory of the test adapter (10) and a service device memory (216) of the service device (210). [11] Device assembly according to claim 10, characterized by , that a readout process for the operating status information stored in the test adapter (10) can be triggered in the service device (210). [12] Device assembly according to claim 10 or 11, characterized by , that an internal communication unit (212) of the test adapter (10) securely transmits the operating status information of a communication unit (214) of the service device (210). [13] Device assembly according to claim 12, characterized by, that the service device (210) displays the operating status information of the test adapter (10) stored in the service device memory (216) on a screen (218) of the same. [14] Device assembly according to claim 12 or 13, characterized by , that the service device (210) can be connected to the external data processing unit (240) via the data transmission network to receive data from the external data processing unit (240). [15] Device assembly according to one of the preceding claims, characterized by , that data relating to the respective test adapter (10) can be transferred from the data space (244) of the external data processing unit (240) to the service device memory (216) using the service device (210). [16] Device assembly according to claim 14 or 15, characterized by , that the data from the data room (244) of the external data processing unit (240) can be displayed on the screen (218) of the service device (210). [17] Device assembly according to claim 15 or 16, characterized by , that operating status information documented and / or evaluated with the service device (210) can be retrieved from the data room (244) of the external data processing unit (240). [18] Device assembly according to one of claims 15 to 17, characterized by , that by means of the service device (210) all data relating to the detected test adapter (10) are accessible in the data space (244) of the external data processing unit. [19] Device assembly according to one of the preceding claims, characterized by , that it is possible to access the external data processing unit (240) by means of a reading device (260). [20] Device assembly according to any one of claims 1 to 19, characterized by , that the reader (300) is a stationary reader. [21] Device assembly according to any one of claims 1 to 19, characterized by , that the reader (260) is a mobile reader. [22] Device assembly according to claim 19, characterized by , that the reader (260) detects an identification unit (280) arranged on the test adapter (10) for the purpose of identifying the test adapter (10). [23] Device assembly according to claim 22, characterized by , that the identification unit (280) reads out an optical identification element (282) arranged on the test adapter (10) and / or a near field communication element (264). [24] Device assembly according to claim 23, characterized by , that the identification element (282) and / or the near field communication element (264) transmits data from the respective test adapter (10) to the reader (260). [25] Device assembly according to claim 23 or 24, characterized by , that the optical identification element (282) and / or the near field communication element (264) transmits connection data for communication with the external (240) data processing unit with the data of the respective test adapter (10). [26] Device assembly according to one of claims 19 to 25, characterized by , that the reading device (260, 300) communicates with the communication unit (242) of the external data processing unit (240) by means of a communication unit (268, 308). [27] Device assembly according to claim 26, characterized by , that data of the respective test adapter (10) stored in a data room (244) on the external data processing unit (240) can be read out using the reader (260, 300). [28] Device assembly according to claim 27, characterized by , that the data stored in the data room (244) of the external data processing unit (240) are divided into a publicly accessible area (246) and an authorized accessible area (248) and that with the reading device (260, 300) data in the publicly accessible area (246) can be viewed in any case and an access code is required to view data in the authorized accessible area (248). [29] Method for operating at least one test adapter (10) used in a manufacturing plant for the electrical functional testing of test objects, in particular devices or device components manufactured in the manufacturing plant, wherein the test adapter (10) comprises a housing (12) and at least one test contact unit (22) arranged in the housing (12) for contacting at least one test object contact (32) of the test object (30) during a test sequence, and a line (42, 52) arranged in the housing (12) from the at least one test contact unit (22) to a connection (44, 54) provided on the housing (12), at least one sensor (38, 62, 56, 66, 82, 92, 102) arranged on or in the test adapter (10), and a data acquisition unit (72) for acquiring values ​​from the sensor (38, 62).56, 66, 82, 92, 102), wherein the test adapter (10) is associated with an operating data storage unit (78), which records the values ​​(T, S, B, SI) of the at least one sensor (38, 62, 56, 66, 82, 92, 102) recorded by the data acquisition unit (72) and determines at least one operating status information from this. wherein at least one operating status information is read from the operating data memory (78) of the test adapter (10) by means of a service device (210) that can be wirelessly coupled to the test adapter (10) and stored by the service device (210) in a service device memory (216), that the service device (210) transmits the operating status information stored in the service device memory (216) via a data transmission network to an external data processing unit (240), which stores the operating status information in a data room (244). [30] Method according to claim 29, characterized by, that the external data processing unit (240) evaluates the transmitted operational status information. [31] Method according to claim 30, characterized by , that the external data processing unit (240) evaluates the operating status information by comparison with reference data. [32] Method according to claim 30 or 31, characterized by , that the data processing unit (240) predicts maintenance of the respective test adapter (10) as a result of the evaluation. [33] Method according to claim 32, characterized by , that the external data processing unit (240) suggests replacement parts for the predicted maintenance. [34] Method according to claim 32 or 33, characterized by , that the external data processing unit (240) presents instructions for the predicted maintenance. [35] Method according to any one of claims 29 to 34, characterized by, that the external data processing unit (240) creates a complete documentation of the test adapter (10) from the operating status information and / or the evaluations. [36] Method according to any one of claims 29 to 35, characterized by , that the service device (210) communicates with the test adapter (10) via a near field communication unit (200). [37] Method according to claim 36, characterized by , that the service device (210) activates wireless near-field communication between the test adapter (10) and the service device (210) after detecting the test adapter (10), wherein the service device (210) detects the test adapter (10) with regard to its data. [38] Method according to claim 37, characterized by, that the test adapter (10) has an internal near-field communication element (202) which is connected to the operating data memory (78) and, in conjunction with a near-field communication element (206) of the service device (210), enables data exchange between the operating data memory of the test adapter (10) and a service device memory (216) of the service device (210). [39] Method according to claim 38, characterized by , that a readout process for the operating status information stored in the test adapter (10) can be triggered in the service device (210). [40] Method according to claim 38 or 39, characterized by , that an internal communication unit (212) of the test adapter (10) securely transmits the operating status information of a communication unit (214) of the service device (210). [41] Method according to claim 40, characterized by, that the service device (210) displays the operating status information of the test adapter (10) stored in the service device memory (216) on a screen (218) of the same. [42] Method according to claim 40 or 41, characterized by , that the service device (210) can be connected to the external data processing unit (240) via the data transmission network to receive data from the external data processing unit (240). [43] Method according to any one of claims 29 to 42, characterized by , that data relating to the respective test adapter (10) can be transferred from the data space (244) of the external data processing unit (240) to the service device memory (216) using the service device (210). [44] Method according to claim 42 or 43, characterized by , that the data from the data room (244) of the external data processing unit (240) can be displayed on the screen (218) of the service device (210). [45] Method according to claim 43 or 44, characterized by , that operating status information documented and / or evaluated with the service device (210) can be retrieved from the data room (244) of the external data processing unit (240). [46] Method according to any one of claims 43 to 45, characterized by , that by means of the service device (210) all data relating to the detected test adapter (10) are accessible in the data space (244) of the external data processing unit. [47] Method according to any one of claims 29 to 46, characterized by , that it is possible to access the external data processing unit (240) by means of a reading device (260). [48] ​​Method according to any one of claims 29 to 47, characterized by , that the reader (300) is a stationary reader. [49] Method according to any one of claims 29 to 47, characterized by , that the reader (260) is a mobile reader. [50] Method according to claim 49, characterized by, that the reader (260) detects an identification unit (280) arranged on the test adapter (10) for the purpose of identifying the test adapter (10). [51] Method according to claim 50, characterized by , that the identification unit (280) reads out an optical identification element (282) arranged on the test adapter (10) and / or a near field communication element (264). [52] Method according to claim 51, characterized by , that the identification element (282) and / or the near field communication element (264) transmits data from the respective test adapter (10) to the reader (260). [53] Method according to claim 51 or 52, characterized by , that the optical identification element (282) and / or the near field communication element (264) transmits connection data for communication with the external data processing unit (240) using the data from the respective test adapter (10).

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