Diagnostic method and diagnostic device for the remaining service life of a switching device

Abstract

A diagnostic method for the remaining service life of a switching device, wherein performance characteristics of the switching device (1) are obtained with a measuring unit (41, 42) and then used as historical condition value data relating to a deterioration state of the switching device (1), are estimated with a condition value estimation unit (51) on the basis of measurement data obtained by the measuring unit (41, 42); wherein, on the basis of the historical condition value data, a remaining service life estimation unit (53) generates two or more sets of data series, namely - data series in which the state values ​​are plotted, the abscissa indicating the elapsed time during an operating period of the switching device (1); - data series in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device (1) during the operating period of the switching device (1); - data series in which the state values ​​are plotted, the abscissa indicating the non-operative time of the switching device (1) during the operating period of the switching device (1); and - data series in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device (1) during the operating time of the switching device (1); wherein, on the basis of the data series among the generated two or more data series sets for which the correlation between the abscissa values ​​of the generated data series sets and the state values ​​corresponding to the respective abscissa values ​​is the strongest, a first deterioration tendency of the switching device (1) is determined; wherein a first estimated value of the remaining service life of the switching device (1) is calculated on the basis of the first deterioration tendency; wherein the first deterioration trend is removed from the generated two or more data series sets; wherein a second deterioration tendency is determined on the basis of the data series from the two or more data series sets from which the first deterioration tendency has been removed, for which the correlation between the abscissa values ​​of the data series sets from which the first deterioration tendency has been removed and the condition values ​​corresponding to the respective abscissa values ​​is the strongest; wherein a second estimated value of the remaining service life of the switching device (1) is calculated on the basis of the second deterioration tendency; and wherein the remaining service life of the switching device (1) is then determined at least on the basis of the first estimated value and the second estimated value of the remaining service life.

Description

Technical area

[0001] The invention relates to a diagnostic method for the remaining service life of a switching device, in which the remaining service life of a switching device is diagnosed on the basis of the performance characteristics of the switching device, and to a diagnostic device for the remaining service life of a switching device using such a diagnostic method. State of the art

[0002] In general, a switching device, for example a switching device for an electric power supply, which will be referred to as a switching device hereinafter, is provided with a stationary contact, a movable contact which is opposite to the stationary contact, and a drive mechanism which drives the movable contact in such a way that the movable contact makes contact with or is separated from the stationary contact.

[0003] Deterioration or wear in such a switching device develops due to contributing factors such as the time elapsed from the time the switching device began operating, the number of operations, the duration of non-operational time, and foreign matter on or in its moving parts. Beyond a certain point, the performance characteristics of the switching device deviate from a specified operating condition, and its remaining service life decreases.

[0004] Therefore, a condition monitoring device generally monitors the operating condition of the switching device to diagnose the deterioration state of the performance characteristics and the remaining service life.

[0005] A conventional condition monitoring device for a switching device periodically calculates the rate of change of the performance characteristics of a switching device under monitoring. Based on the calculated rate of change of the performance characteristics, the condition monitoring device estimates the time at which the performance characteristics reach a predetermined reference value or a possible number of operations, see, for example, document JP 2002-149230 A.

[0006] DE 11 2005 001 085 T5 discloses a condition detection device for monitoring an electromagnetic actuation system, the actuation system comprising: a fixed iron core; a movable iron core constructed to be movable with respect to the fixed iron core; and at least one electromagnetic coil which is excited by a drive power supply and causes the movable iron core to move, thereby driving a device to be actuated which is connected to the movable iron core, the device to be actuated comprising a fixed contact and a movable contact, the movable contact interacting with the movable iron core, and a compression spring being arranged between the movable contact and the movable iron core, the device to be actuated being configured toto enable separation of the movable contact from the fixed contact by means of the movable iron core, so that the separation comprises two time periods, a first time period in which the compression spring is relaxed but the movable contact is not yet released from the fixed contact, and a second time period in which the movable contact moves away from the fixed contact, wherein the state detection device comprises a measuring device for measuring a current flowing through the electromagnetic coil.

[0007] US 6,880,967 B2 discloses the detection of the temperature of an electrolytic capacitor installed in a device, calculating the remaining service life in actual use based on a temperature-life law, and displaying the remaining service life. A thin-film tape is wrapped around a temperature sensor for insulation, and the electrolytic capacitor and temperature sensor are housed in a heat-shrink tube, with the secondary temperature sensor brought into close contact with the primary electrolytic capacitor.

[0008] DE 100 07 308 A1 discloses a method and a device for recording operating times, in particular until technical failure, of a product, and for determining the remaining operating time of the product. In order to enable the most accurate, non-model-based service life estimate possible for any product that has an operating data memory or has access to such a memory without storing temporal signal profiles, it is proposed to determine the remaining operating time of the product, record operating times of the products, and determine operating time thresholds based on classified (so-called classified) operating variables. First, weighting factors are determined. The weighting factors are then used to determine weighted, cumulative operating times and operating time thresholds.This allows the reliability of products in series production to be monitored.

[0009] DE 10 2007 038 890 A1 discloses a method for determining the service life of machine components in operation. According to the invention, to determine the service life, characteristic data for the respective machine component, loads acting on the machine component during operation, are determined, and characteristic values ​​that are characteristic of the loads acting on the machine component are determined. The service life is determined based on the characteristic data and the characteristic values ​​for the machine component.

[0010] In a case where the deterioration of the performance characteristics of a switching device is caused by a single contributing factor and the performance characteristics of the switching device evolve monotonically in terms of deterioration, such a conventional condition monitoring device for a switching device is effective to diagnose the deterioration state of the performance characteristics of the switching device or the remaining life of the switching device. Explanation of the invention Problems to be solved by the invention

[0011] In practice, however, the deterioration of a switching device's performance characteristics is caused by two or more interrelated contributing factors. In many cases, the deterioration or change in the performance characteristics of a switching device not only tends to become monotonically worse, but also alternates between temporary deterioration and subsequent recovery.

[0012] Therefore, in a conventional condition monitoring device for a switchgear, it is difficult to perform condition monitoring or prediction of the remaining life depending on the actual condition of the switchgear.

[0013] The present invention is intended to solve the above-mentioned problems in a conventional system. Therefore, the object of the invention is to provide a diagnostic method and a diagnostic device for the remaining service life of a switching device that are capable of accurately estimating the remaining service life of a switching device. Means to solve the problems

[0014] The problem underlying the invention is solved by a diagnostic method having the features of independent patent claim 1 or by a diagnostic device of independent patent claim 4. Advantageous developments of the diagnostic method or the diagnostic device according to the invention are specified in dependent claims 2, 3 and 5 to 7.

[0015] In a diagnostic method for the remaining service life of a switching device according to the invention, accumulated state value data relating to a deterioration state of the switching device, estimated on the basis of measurement data obtained by measuring the performance characteristics of the switching device, are used as historical state value data.

[0016] Based on the accumulated historical state value data, at least one data set is generated: system data in which the state values ​​are plotted, the abscissa indicating at least a portion of the elapsed time during an operating period of the switching device; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during at least a portion of the elapsed time; system data in which the state values ​​are plotted, the abscissa indicating a non-operative time of the switching device during at least a portion of the elapsed time; and system data in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during at least a portion of the elapsed time. Based on the generated system data sets, the remaining service life of the switching device is estimated.

[0017] In the diagnostic method according to the invention, a plurality of system data sets are preferably generated from the previous system data sets, for example the system data in which the state values ​​are plotted, wherein the abscissa indicates at least a portion of the elapsed time during the operating period of the switching device; and system data in which the state values ​​are plotted, wherein the abscissa indicates the number of operations of the switching device during at least a portion of the elapsed time.

[0018] The remaining service life of the switching device is then estimated based on at least one of the generated system data sets. However, depending on the circumstances, only one of the system data sets may be generated, and the remaining service life of the switching device is then diagnosed based on these generated system data sets.

[0019] Furthermore, in a diagnostic method for the remaining service life of a switching device according to the invention, accumulated state value data relating to a deterioration state of the switching device are used as historical state value data, which are estimated on the basis of measurement data determined by measuring performance characteristics of the switching device.

[0020] Based on the accumulated historical state value data, the variance values ​​of the state value data are calculated for each predetermined number of measurements, and then at least one data set is generated: system data in which the variance values ​​are plotted, the abscissa indicating at least a portion of the elapsed time during the operating period of the switching device; system data in which the variance values ​​are plotted, the abscissa indicating the number of operations of the switching device during at least a portion of the elapsed time; system data in which the variance values ​​are plotted, the abscissa indicating the non-operative time of the switching device during at least a portion of the elapsed time; and system data in which the variance values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during at least a portion of the elapsed time.The remaining service life of the switching device is then estimated based on the generated system data sets.

[0021] In the diagnostic method according to the invention, a plurality of system data sets are preferably generated from the previous system data sets, for example the system data in which the state values ​​are plotted, wherein the abscissa indicates at least a portion of the elapsed time during the operating period of the switching device; and system data in which the state values ​​are plotted, wherein the abscissa indicates the number of operations of the switching device during at least a portion of the elapsed time.

[0022] The remaining service life of the switching device is then estimated based on at least one of the generated system data sets. However, depending on the circumstances, it is also possible to generate only one data set from the generated system data sets and then diagnose the remaining service life of the switching device based on the generated system data set.

[0023] Furthermore, in a diagnostic method for the remaining service life of a switching device according to the invention, accumulated state value data relating to a deterioration state of a switching device, estimated on the basis of measurement data obtained by measuring performance characteristics of the switching device, are used as historical state value data.

[0024] The state value data in the accumulated historical state value data is transformed into predetermined state values ​​using a predetermined transformation function, and then at least one data set is generated: system data in which the predetermined state values ​​are plotted, the abscissa indicating at least a portion of the elapsed time during the operating period of the switching device; system data in which the predetermined state values ​​are plotted, the abscissa indicating the number of operations of the switching device during at least a portion of the elapsed time; system data in which the predetermined state values ​​are plotted, the abscissa indicating the non-operational time of the switching device during at least a portion of the elapsed time;and system data in which the predetermined state values ​​are plotted, wherein the abscissa indicates the accumulated operating time of the switching device during at least a portion of the elapsed time. Based on the generated system data sets, the remaining service life of the switching device is estimated.

[0025] In the diagnostic method according to the invention, a plurality of system data sets are preferably generated from the preceding system data sets, for example the system data in which the state values ​​are plotted, wherein the abscissa indicates at least a portion of the elapsed time during the operating period of the switching device; and the system data in which the state values ​​are plotted, wherein the abscissa indicates the number of operations of the switching device during at least a portion of the elapsed time.

[0026] The remaining service life of the switching device is then estimated based on at least one of the generated system data sets. However, depending on the circumstances, it is also possible to generate only one of the system data sets. The remaining service life of the switching device is then diagnosed based on this generated system data set.

[0027] In the diagnostic method according to the invention, the predetermined transformation function is different depending on the respective set of system data records.

[0028] In the diagnostic method for the remaining service life of a switching device according to the invention, accumulated state value data relating to a deterioration state of a switching device, estimated on the basis of measurement data obtained by measuring performance characteristics of the switching device, are used as historical state value data.

[0029] Based on the accumulated historical state value data, at least one data set is generated of system data in which the state values ​​are plotted, the abscissa indicating the total elapsed time during the operating period of the switching device; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the total elapsed time; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device during the total elapsed time; and system data in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during the total elapsed time.

[0030] At the same time, at least one data set is generated of system data in which the state values ​​are plotted, the abscissa indicating the elapsed time during a period after the time in which a predetermined period has elapsed from a time in which the switching device started to operate; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device in the elapsed time during a period after the time in which the predetermined period has elapsed; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device in an elapsed time during a period after the time in which the predetermined period has elapsed;and system data in which the state values ​​are plotted, wherein the abscissa indicates the accumulated operating time of the switching device in the elapsed time during a period after the predetermined period has elapsed. Then, based on the generated system data sets, the remaining service life of the switching device is estimated.

[0031] In the diagnostic method according to the invention, system data sets are preferably generated in which the state values ​​are plotted, the abscissa indicating the total elapsed time during an operating period of the switching device; and system data in which the state values ​​are plotted, the abscissa indicating the total number of operations of the switching device during the elapsed time.

[0032] At the same time, system data are generated in which the state values ​​are plotted, the abscissa indicating the elapsed time during a period after the time in which the predetermined period has elapsed, from a time at which the switching device started to operate; and system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device in the elapsed time during a period from the time in which the predetermined period has elapsed. Then, based on at least one of the generated system data sets, the remaining service life of the switching device is estimated.

[0033] However, it is also possible, depending on the circumstances, to generate only one data set of system data in which the state values ​​are plotted, the abscissa indicating the total elapsed time during an operating period of the switching device; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the total elapsed time; system data in which the state values ​​are plotted, the abscissa indicating the non-operative time of the switching device during the total elapsed time; and system data in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during the total elapsed time.

[0034] At the same time, only one data set is generated of system data in which the state values ​​are plotted, the abscissa indicating the elapsed time during a period from the time in which the predetermined period has elapsed, namely from a time in which the switching device has started to operate; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device in the elapsed time during a period from the time in which the predetermined period has elapsed; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device in the elapsed time during a period after the time in which the predetermined period has elapsed;and system data in which the state values ​​are plotted, with the abscissa indicating the accumulated operating time of the switching device in the elapsed time during a period from the time in which the predetermined period has elapsed. Then, based on the two generated system data sets, the remaining service life of the switching device is estimated.

[0035] A diagnostic device for the remaining service life of a switching device according to the invention is used to diagnose the remaining service life of the switching device which drives a movable contact with a drive mechanism in such a way that the movable contact makes contact with or is separated from a stationary contact in order to open or close an electrical circuit.

[0036] The diagnostic device includes: a measuring unit for measuring performance characteristics of the switching device; a condition value estimation unit for estimating condition values ​​related to a deterioration state of the switching device based on measurement data obtained by the measuring unit; a recording unit for recording historical condition value data, the condition values ​​being estimated by the condition value estimation unit; and a remaining life estimation unit for estimating the remaining life of the switching device based on the historical condition value data recorded in the recording unit.

[0037] The diagnostic device is characterized in that, based on the accumulated historical state value data, the remaining life estimation unit generates at least one data set of system data in which the state values ​​are plotted, the abscissa indicating at least a part of the elapsed time during the operating period of the switching device; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the elapsed time; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device during the elapsed time; and system data in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during the elapsed time.Then, the remaining lifetime estimation unit estimates the remaining lifetime of the switching device based on the generated system data sets.

[0038] In the diagnostic device according to the invention, a plurality of system data sets are preferably generated from the preceding system data sets, for example system data in which the state values ​​are plotted, the abscissa indicating at least a portion of the elapsed time during the operating period of the switching device; and system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during at least a portion of the elapsed time.

[0039] The remaining service life of the switching device is then estimated based on at least one of the generated system data sets. However, depending on the circumstances, it is also possible for only one of the system data sets to be generated and for the remaining service life of the switching device to be diagnosed based on this generated system data set.

[0040] The diagnostic device according to the invention serves to diagnose the remaining service life of a switching device which drives a movable contact with a drive mechanism in such a way that the movable contact makes contact with or is separated from a stationary contact in order to open or close an electrical circuit.

[0041] The diagnostic device includes: a measuring unit for measuring the performance characteristics of the switching device; a condition value estimation unit for estimating condition values ​​related to a deterioration state of the switching device based on measurement data obtained by the measuring unit; a recording unit for recording historical condition value data, the condition values ​​being estimated by the condition value estimation unit; and a remaining life estimation unit for estimating the remaining life of the switching device based on the historical condition value data recorded in the recording unit.

[0042] The diagnostic device is characterized in that, based on the accumulated historical state value data, the remaining life estimation unit calculates the variance values ​​of the state value data for each predetermined number of measurements and generates at least one data set of system data in which the variance values ​​are plotted, the abscissa indicating at least a part of the elapsed time during the operating period of the switching device; system data in which the variance values ​​are plotted, the abscissa indicating the number of operations of the switching device during the elapsed time; system data in which the variance values ​​are plotted, the abscissa indicating the non-operational time of the switching device during the elapsed time; and system data in which the variance values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during the elapsed time.At the same time, the remaining lifetime estimation unit estimates the remaining lifetime of the switching device based on the generated system data sets.

[0043] In the diagnostic device according to the invention, a plurality of system data sets are preferably generated from among the preceding system data sets, for example, system data in which the state values ​​are plotted, the abscissa indicating at least a part of the elapsed time during the operating period of the switching device; and system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during at least a part of the elapsed time.

[0044] The remaining service life of the switching device is then estimated based on at least one of the generated system data sets. However, depending on the circumstances, it is also possible for only one of the system data sets to be generated, and then the remaining service life of the switching device is diagnosed based on this generated system data set.

[0045] A switching device remaining life diagnostic device according to the invention is used to diagnose the remaining life of a switching device which drives a movable contact with a drive mechanism in such a way that the movable contact makes contact with or is separated from a stationary contact in order to open or close an electrical circuit.

[0046] The diagnostic device includes: a measuring unit for measuring performance characteristics of the switching device; a condition value estimation unit for estimating condition values ​​related to a deterioration state of the switching device based on measurement data obtained by the measuring unit; a recording unit for recording condition value data estimated by the condition value estimation unit as historical condition value data; and a remaining life estimation unit for estimating the remaining life of the switching device based on the historical condition value data recorded in the recording unit.

[0047] The diagnostic device is characterized in that the remaining life estimation unit transforms the state values ​​in the accumulated historical state value data into predetermined state values ​​using a predetermined transformation function and generates at least one data set of system data in which the predetermined state values ​​are plotted, the abscissa indicating at least a portion of the elapsed time during the operating period of the switching device; system data in which the predetermined state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the elapsed time; system data in which the predetermined state values ​​are plotted, the abscissa indicating the non-operational time of the switching device during the elapsed time;and system data on which the predetermined state values ​​are plotted, wherein the abscissa indicates the accumulated operating time of the switching device during the elapsed time. Then, the remaining life estimation unit estimates the remaining life of the switching device based on the generated system data sets.

[0048] In the diagnostic device according to the invention, it is preferred that a plurality of system data sets are generated from the previous system data sets, for example, system data in which the state values ​​are plotted, the abscissa indicating at least a portion of the elapsed time during the operating period of the switching device; and system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during at least a portion of the elapsed time.

[0049] The remaining service life of the switching device is then estimated based on at least one of the generated system data sets. However, depending on the circumstances, it is also possible for only one of the system data sets to be generated, and the remaining service life of the switching device is diagnosed based on the generated system data.

[0050] In the diagnostic device according to the invention, the predetermined transformation functions are preferably different for each of the system data sets.

[0051] The switching device remaining life diagnostic device according to the invention is used to diagnose the remaining life of a switching device that drives a movable contact with a drive mechanism in such a way that the movable contact makes contact with or is separated from a stationary contact to open or close an electrical circuit.

[0052] The diagnostic device includes: a measuring unit for measuring performance characteristics of the switching device; a condition value estimation unit for estimating condition values ​​related to a deterioration state of the switching device based on the measurement data obtained by the measuring unit; a recording unit for recording historical condition value data, the condition values ​​being estimated by the condition value estimation unit; and a remaining life estimation unit for estimating the remaining life of the switching device based on the historical condition value data recorded in the recording unit.

[0053] The diagnostic device is characterized in that, based on the accumulated historical state value data, the remaining life estimation unit generates at least one set of system data in which the state values ​​are plotted, the abscissa indicating the total elapsed time during an operation period of the switching device; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the total elapsed time; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device during the total elapsed time; and system data in which the state values ​​are plotted, the abscissa indicating the accumulated operation time of the switching device during the total elapsed time.

[0054] At the same time, the remaining life estimation unit generates at least one set of system data in which the state values ​​are plotted, the abscissa indicating the elapsed time during a period after a predetermined period has elapsed from the time the switching device started to operate; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device in the elapsed time during a period after the predetermined period has elapsed; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device in an elapsed time during a period after the predetermined period has elapsed;and system data in which the state values ​​are plotted, wherein the abscissa indicates the accumulated operating time of the switching device in the elapsed time during a period after the time at which the predetermined period has elapsed. Then, the remaining life estimation unit estimates the remaining life of the switching device based on the generated system data sets.

[0055] In the diagnostic device according to the invention, system data are preferably generated in which the state values ​​are plotted, the abscissa indicating the total elapsed time during the operating period of the switching device; and system data in which the state values ​​are plotted, the abscissa indicating the total number of operations of the switching device during the elapsed time.

[0056] At the same time, system data are generated in which the state values ​​are plotted, with the abscissa indicating the elapsed time during a period after the predetermined period has elapsed from a time at which the switching device started to operate; and system data in which the state values ​​are plotted, with the abscissa indicating the number of operations of the switching device in the elapsed time during a period after the predetermined period has elapsed. Then, the remaining service life of the switching device is estimated based on at least one of the generated system data sets.

[0057] However, depending on the circumstances, it is also possible to generate only one data set of system data in which the state values ​​are plotted, the abscissa indicating the total elapsed time during the operating period of the switching device; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the total elapsed time; system data in which the state values ​​are plotted, the abscissa indicating the non-operative time of the switching device during the total elapsed time; and system data in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during the total elapsed time.

[0058] At the same time, only one set of system data is generated in which the state values ​​are plotted, the abscissa indicating the elapsed time during a period after the time in which a predetermined period has elapsed from a time in which the switching device started to operate; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device in the elapsed time during a period after the time in which the predetermined period has elapsed; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device in the elapsed time during a period after the time in which the predetermined period has elapsed;and system data in which the state values ​​are plotted, wherein the abscissa indicates the accumulated operating time of the switching device in the elapsed time during a period after the time in which the predetermined period has elapsed. Then, the remaining service life of the switching device is estimated based on two generated system data sets. ;

[0059] The diagnostic device according to the invention is further characterized in that a plurality of switching devices can be provided in one and the same system. The remaining service life estimation unit then generates at least one set of system data sets for the switching device among the plurality of switching devices that has been operated most frequently, and estimates the remaining service life of the other switching devices based on the generated system data sets.

[0060] In the diagnostic method and the diagnostic device according to the invention, the estimation of the remaining lifetime is preferably implemented using a regression line or a regression curve based on the generated system data.

[0061] In the diagnostic method and the diagnostic device according to the invention, the estimation of the remaining lifetime is preferably implemented using the difference between a predetermined value and a regression line or a regression curve based on the generated system data.

[0062] Furthermore, in the diagnostic method and the diagnostic device according to the invention, it is preferable that a plurality of system data sets are generated, and then, on the basis of those system data from the plurality of generated system data sets which most clearly indicate a deterioration tendency of the switching device, a deterioration factor for the switching device is estimated.

[0063] In the diagnostic method and device according to the invention, a plurality of system data sets are preferably generated. Then, an estimated value for the remaining service life of the switching device is calculated for each data set from the plurality of generated system data sets. Subsequently, the estimated value that is smallest among the calculated estimated values ​​is estimated as the remaining service life of the switching device.

[0064] According to the invention, the condition value related to the deterioration state of a switching device refers to a condition value for specifying the deterioration state of the switching device. For example, wear, abrasion, and cracks of the contacts, a frictional force exerted on a sliding portion at a time when the switching device is driven, the capacitance of a drive capacitor, or the like correspond to such a condition value.

[0065] The term "period after the time point in which a predetermined period has elapsed since a time point in which the switching device started to operate" according to the invention includes, for example, the most recent period for a time in which the remaining life of the switching device is diagnosed; the range of the most recent period is appropriately determined by the type of the switching device, the frequency of the opening / closing operations of the switching device, the material constituting the sliding portion, and similar factors.

[0066] According to the present invention, the system data sets in the respective embodiments are independent of each other. Therefore, the system data sets designated by the same designations do not necessarily designate respective system data sets with the same content. Advantages of the invention

[0067] In a diagnostic method for the remaining service life of a switching device according to the invention, accumulated state values ​​relating to a deterioration state of the switching device are used as historical state value data, which are estimated on the basis of measurement data obtained by measuring performance characteristics of the switching device.

[0068] Based on the accumulated historical state value data, at least one data set is generated: system data in which the state values ​​are plotted, the abscissa indicating at least a portion of the elapsed time during the operating period of the switching device; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during at least the portion of the elapsed time; system data in which the state values ​​are plotted, the abscissa indicating the non-operative time of the switching device during at least the portion of the elapsed time; and system data in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during at least a portion of the elapsed time. Based on the generated system data sets, the remaining service life of the switching device is estimated.

[0069] As a result, by separating or distinguishing the deterioration factors that occur or are caused in the switching device, the remaining service life of the switching device can be accurately estimated.

[0070] In the diagnostic method according to the invention, accumulated state values ​​relating to a deterioration state of the switching device are used as historical state value data, which are estimated on the basis of measurement data obtained by measuring performance characteristics of the switching device.

[0071] Based on the accumulated historical state value data, the variance values ​​of the state values ​​are calculated for each predetermined number of measurements, and then at least one data set is generated: system data in which the variance values ​​are plotted, the abscissa indicating at least a portion of the elapsed time during the operating period of the switching device; system data in which the variance values ​​are plotted, the abscissa indicating the number of operations of the switching device during at least the portion of the elapsed time; system data in which the variance values ​​are plotted, the abscissa indicating the non-operative time of the switching device during at least the portion of the elapsed time; and system data in which the variance values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during at least the portion of the elapsed time.The remaining service life of the switching device is then estimated based on the generated system data sets.

[0072] As a result, it is possible to estimate the remaining lifetime of the switching device even in a case where a deterioration factor does not indicate a deterioration tendency in the system data in which the condition values ​​are plotted, where the abscissa indicates the elapsed time, the number of operations, the non-operational time or the accumulated time.

[0073] In the diagnostic method according to the invention, accumulated state values ​​relating to a deterioration state of a switching device are used as historical state value data. These values ​​are estimated based on measurement data obtained by measuring performance characteristics of the switching device. The state values ​​in the accumulated historical state value data are transformed into predetermined state values ​​using predetermined transformation functions.

[0074] Subsequently, at least one data set is generated from system data in which the predetermined state values ​​are plotted, wherein the abscissa indicates at least a portion of the elapsed time during an operating period of the switching device; system data in which the predetermined state values ​​are plotted, wherein the abscissa indicates the number of operations of the switching device during at least the portion of the elapsed time; system data in which the predetermined state values ​​are plotted, wherein the abscissa indicates the non-operative time of the switching device during at least the portion of the elapsed time; and system data in which the predetermined state values ​​are plotted, wherein the abscissa indicates the accumulated operating time of the switching device during at least the portion of the elapsed time. The remaining service life of the switching device is estimated on the basis of the generated system data sets.As a result, it is possible to estimate the remaining service life of the switching device more accurately.

[0075] In the diagnostic method according to the invention, accumulated state values ​​relating to a deterioration state of the switching device are used as historical state value data, which are estimated on the basis of measurement data obtained by measuring performance characteristics of the switching device.

[0076] Based on the accumulated historical state value data, at least one data set is generated of system data in which the state values ​​are plotted, the abscissa indicating the total elapsed time during the operating period of the switching device; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the total elapsed time; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device during the total elapsed time; and system data in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during the total elapsed time.

[0077] At the same time, at least one data set is generated of system data in which the state values ​​are plotted, the abscissa indicating the elapsed time during a period after a predetermined period has elapsed since the switching device started to operate; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device in the elapsed time during a period after the predetermined period has elapsed; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device in the elapsed time during a period after the predetermined period has elapsed;and system data in which the state values ​​are plotted, wherein the abscissa indicates the accumulated operating time of the switching device in the elapsed time during a period after the predetermined period has elapsed. Then, based on the generated system data sets, the remaining service life of the switching device is estimated.

[0078] Consequently, even in a case where no deterioration tendency occurs in the system data in which the state values ​​are plotted, the abscissa indicating the total elapsed time during the operating period of the switching device, the total number of operations, the total non-operational time, or the total accumulated time, a deterioration tendency can still be indicated with the at least one set of system data in which the state values ​​are plotted, the abscissa indicating the elapsed time during a period after a predetermined period has elapsed since a time at which the switching device started to operate; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during a period after the predetermined period has elapsed;System data in which the state values ​​are plotted, with the abscissa indicating the non-operational time of the switching device during a period after the predetermined period has elapsed; and system data in which the state values ​​are plotted, with the abscissa indicating the accumulated operating time of the switching device during a period after the predetermined period has elapsed. Therefore, the remaining service life of the switching device can be estimated more accurately with a simple configuration.

[0079] A switching device remaining life diagnostic device according to the invention is used to diagnose the remaining life of a switching device which drives a movable contact with a drive mechanism in such a way that the movable contact makes contact with or is separated from a stationary contact in order to open or close an electrical circuit.

[0080] The diagnostic device includes: a measuring unit for measuring performance characteristics of the switching device; a condition value estimation unit for estimating condition values ​​regarding a deterioration state of the switching device based on measurement data obtained by the measuring unit; a recording unit for recording historical condition value data, the condition values ​​being estimated by the condition value estimation unit; and a remaining life estimation unit for estimating the remaining life of the switching device based on the historical condition value data recorded in the recording unit.

[0081] Based on the accumulated historical state value data, the remaining life estimation unit generates at least one data set of system data in which the state values ​​are plotted, the abscissa indicating at least a portion of the elapsed time during the operating period of the switching device; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the elapsed time; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device during the elapsed time; and system data in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during the elapsed time.

[0082] The remaining service life of the switching device is then estimated based on the generated system data sets. As a result, by distinguishing and separating deterioration factors that occur or are caused by the switching device, the remaining service life of the switching device can be accurately estimated using a simple configuration.

[0083] The switching device remaining life diagnostic device according to the invention is used to diagnose the remaining life of a switching device which drives a movable contact with a drive mechanism in such a way that the movable contact makes contact with or is separated from a stationary contact in order to open or close an electrical circuit.

[0084] The diagnostic device includes: a measuring unit for measuring performance characteristics of the switching device; a condition value estimation unit for estimating condition values ​​related to a deterioration state of the switching device based on measurement data obtained by the measuring unit; a recording unit for recording historical condition value data, the condition values ​​being estimated by the condition value estimation unit; and a remaining life estimation unit for estimating the remaining life of the switching device based on the historical condition value data recorded in the recording unit and the accumulated historical condition value data.

[0085] The remaining life estimation unit calculates the variance values ​​of the state values ​​for each predetermined number of measurements and generates at least one set of system data in which the variance values ​​are plotted, the abscissa indicating at least a portion of the elapsed time during the operating period of the switching device; system data in which the variance values ​​are plotted, the abscissa indicating the number of operations of the switching device during the elapsed time; system data in which the variance values ​​are plotted, the abscissa indicating the non-operational time of the switching device during the elapsed time; and system data in which the variance values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during the elapsed time. Then, the remaining life of the switching device is estimated based on the generated system data sets.

[0086] As a result, it is possible to estimate the remaining service life of the switching device even in a case where a deterioration factor indicates no deterioration trend in the system data, where the state values ​​are plotted, with the abscissa representing the elapsed time, the number of operations, the non-operational time, or the accumulated time. Therefore, the remaining service life of the switching device can be estimated more accurately with a simple configuration.

[0087] The switching device remaining life diagnostic device according to the invention is used to diagnose the remaining life of a switching device which drives a movable contact with a drive mechanism in such a way that the movable contact makes contact with or is separated from a stationary contact in order to open or close an electrical circuit.

[0088] The diagnostic device includes: a measuring unit for measuring performance characteristics of the switching device; a condition value estimation unit for estimating condition values ​​related to a deterioration state of the switching device based on measurement data obtained by the measuring unit; a recording unit for recording historical condition value data, the condition values ​​being estimated by the condition value estimation unit; and a remaining life estimation unit for estimating the remaining life of the switching device based on the historical condition value data recorded in the recording unit.

[0089] The remaining life estimation unit transforms the state values ​​in the accumulated historical state value data into predetermined state values ​​using a predetermined transformation function and generates at least one set of system data in which the predetermined state values ​​are plotted, the abscissa indicating at least a portion of the elapsed time during the operating period of the switching device; system data in which the predetermined state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the elapsed time; system data in which the predetermined state values ​​are plotted, the abscissa indicating the non-operational time of the switching device during the elapsed time; and system data in which the predetermined state values ​​are plotted, the abscissa indicating the accumulated operating period of the switching device during the elapsed time.

[0090] The remaining service life of the switching device is then estimated based on the generated system data sets. As a result, the remaining service life of the switching device can be estimated more accurately.

[0091] The switching device remaining life diagnostic device according to the invention is used to diagnose the remaining life of a switching device which drives a movable contact with a drive mechanism in such a way that the movable contact makes contact with or is separated from a stationary contact in order to open or close an electrical circuit.

[0092] The diagnostic device includes: a measuring unit for measuring the performance characteristics of the switching device; a condition value estimation unit for estimating condition values ​​related to a deterioration state of the switching device based on measurement data obtained by the measuring unit; a recording unit for recording historical condition value data, the condition values ​​being estimated by the condition value estimation unit; and a remaining life estimation unit for estimating the remaining life of the switching device based on the historical condition value data recorded in the recording unit and on the basis of accumulated historical condition value data.

[0093] The remaining life estimation unit generates at least one data set of system data in which the state values ​​are plotted, the abscissa indicating the total elapsed time during an operating period of the switching device; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the total elapsed time; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device during the total elapsed time; and system data in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during the total elapsed time.

[0094] At the same time, the remaining life estimation unit generates at least one set of system data in which the state values ​​are plotted, the abscissa indicating the elapsed time during a period after a predetermined period has elapsed since the switching device started to operate; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device in the elapsed time during a period after the predetermined period has elapsed; system data in which the state values ​​are plotted, the abscissa indicating the non-operational time of the switching device in the elapsed time during the period after the predetermined period has elapsed;and system data in which the state values ​​are plotted, wherein the abscissa indicates the accumulated operating time of the switching device in the elapsed time during a period after the predetermined period has elapsed. Then, based on the generated system data sets, the remaining service life of the switching device is estimated.

[0095] As a result, even in a case where no deterioration tendency occurs in the system data in which the state values ​​are plotted, the abscissa indicating the total elapsed time during an operating period of the switching device, the total number of operations, the total non-operational time, or the total accumulated time, a deterioration tendency can still be indicated, namely with the at least one set of system data in which the state values ​​are plotted, the abscissa indicating the elapsed time during a period after a predetermined period has elapsed since a time at which the switching device started to operate; system data in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device during a period after the predetermined period has elapsed;System data in which the state values ​​are plotted, with the abscissa indicating the non-operational time of the switching device during a period after the predetermined period has elapsed; and system data in which the state values ​​are plotted, with the abscissa indicating the accumulated operating time of the switching device during a period after the predetermined period has elapsed. Therefore, the remaining service life of the switching device can be estimated more accurately with a simple configuration.

[0096] In the diagnostic device according to the invention, when a plurality of switching devices are present in one and the same system, the remaining life estimation unit generates at least one set of system data records for the switching device among the plurality of switching devices that has been operated most frequently, and estimates the remaining life of the other switching devices based on these generated system data records. Therefore, the remaining life of a switching device for which no historical state value data exists can be accurately estimated.

[0097] In the diagnostic method and the diagnostic device according to the invention, the estimation of the remaining service life is carried out using a regression line or a regression curve on the basis of generated system data, so that the remaining service life can be accurately estimated.

[0098] In the diagnostic method and the diagnostic device according to the invention, the predetermined transformation functions are different depending on the respective system data sets, so that the remaining service life of a switching device can be accurately estimated.

[0099] In the diagnostic method and device according to the invention, a deterioration factor in the switching device is estimated based on those system data from the plurality of generated system data sets that most clearly indicate a deterioration tendency of a switching device. Therefore, the remaining service life of the switching device can be more accurately estimated, and a deterioration factor of the switching device can also be more accurately estimated. As a result, a suitable maintenance plan for the switching device can be established and implemented.

[0100] In the diagnostic method and device according to the invention, the estimated value that is smallest among the calculated estimated values ​​is preferably used as the remaining life of the switching device. Therefore, by distinguishing the deterioration factors caused in the switching device, the remaining life of the switching device can be accurately estimated with a simple configuration. Best mode for carrying out the invention

[0101] Embodiments 1 to 11 of the invention will be explained in detail below. The system records in the respective embodiments are independent of each other, and system records with the same names do not necessarily indicate system records with the same contents. First embodiment

[0102] Hereinafter, a switching device remaining life diagnostic apparatus according to the first embodiment of the invention will be explained in detail. Fig. 1 shows a schematic diagram for explaining the configuration of a diagnostic device for the remaining service life of a switching device according to the first embodiment of the invention. A diagnostic method for the remaining service life of a switching device according to a first embodiment of the invention is implemented using a device according to the first embodiment and will be described in detail below with reference to Fig. 1 explained.

[0103] According to Fig. 1, a switching device 1 includes: a vacuum valve 11 that opens or closes a main circuit, which is an electrical circuit configured with main circuit conductors 101 and 102; and an electromagnetic actuator 12 that is a drive mechanism for actuating the vacuum valve 11.

[0104] The vacuum valve 11 is provided with a housing 110, the interior of which is maintained at a negative pressure. Inside the housing 110 are a stationary contact 111 for opening and closing the main circuit, as well as a movable contact 112 positioned opposite the stationary contact 111. The stationary contact 111 is connected to one end of the main circuit conductor 101. The movable contact 112 is connected to one end of the main circuit conductor 102 by means of a support shaft 113 for the movable contact 112 and a flexible conductor 114.

[0105] If in the Fig. 1, when the stationary contact 111 and the movable contact 112 are in contact with each other, an electric current flows in the main circuit conductors 101 and 102 in the direction indicated by arrows through the stationary contact 111 and the movable contact 112. In the interior of the housing 110 of the vacuum valve 11, a bellows 115 is provided between the peripheral surface of the support shaft 113 of the movable contact and the inner peripheral surface of the housing 110. The bellows 115 ensures an airtight seal of the interior of the housing 110.

[0106] The support shaft 113 of the movable contact 112 is slidably supported by a first guide bearing 116, which is fixed in a through hole of the housing 110, and one end of the support shaft 113 of the movable contact 112 protrudes from the housing 110. One end 1171 of a first movable shaft 117 is coupled to one end of the support shaft 113 of the movable contact 112 and slides slidably supported by a second guide bearing 119, which is fixed in a through hole of a gas tank 118. The other end 1172 of the first movable shaft 117 protrudes from the gas tank 118.

[0107] An insulating rod 120 is inserted into the first movable shaft 118 and insulates one end 1171 of the first movable shaft 117 from its other end 1172. The interior of the gas tank 118 houses the vacuum valve 11, the flexible conductor 114, parts of the main circuit conductors 101 and 102, parts of the first movable shaft 117, and the insulating rod 120. Furthermore, an insulating gas, such as SF6 gas, nitrogen, or dry air under pressure, is enclosed to improve the insulating properties. The bellows 121 ensures a tight seal against the atmosphere in the interior of the tank 118.

[0108] The electromagnetic actuator 12 includes a yoke 211, a permanent magnet 212, a connecting coil 213, a separating coil 214, a movable member 215, and a second movable shaft 216. The yoke 211 is made of magnetic material and has one end 2111 on the stationary contact side and one end 2112 on the opposite side of the stationary contact. The movable member 215 is made of magnetic material, is attached to the second movable shaft 216, and is arranged in the interior of the yoke 211.

[0109] The second movable axis 216 is slidably supported by a third guide bearing 217 and a fourth guide bearing 218, which are mounted in the end 2111 on the side of the stationary contact and the end 2112 on the opposite side of the stationary contact of the yoke 211, respectively.

[0110] Each of a pair of permanent magnets 212 formed in a tubular shape is fixed to the surface of a protrusion 2113 projecting approximately at the center of the internal space of the yoke 211. The surface of a pair of permanent magnets 212 faces the movable part 215 with a predetermined gap therebetween. The connecting coil 213 is arranged in the internal space of the yoke 211 and fixed to the end 2111 on the stationary contact side of the yoke 211. The separating coil 214 is arranged in the internal space of the yoke 211 and fixed to the end 2112 on the opposite side of the stationary contact of the yoke 211. The connecting coil 213 and the separating coil 214 are each connected to a driving power source 2 and a driving capacitor 3.

[0111] The electromagnetic actuator 12 is actuated by a drive current from the drive power source 2 and drives the movable contact 112 in the vacuum valve 11 to open or close the vacuum valve 11. The drive capacitor 3 is provided to provide a required amount of drive current when the drive current required by the electromagnetic actuator 12 is greater than the capacity of the drive power source 2.

[0112] A contact pressure spring support housing 219 is attached to one end 2161 of the second movable shaft 216, and a contact pressure spring 220 is mounted inside the contact pressure spring support housing 219. The other end 1172 of the first movable shaft 117 is slidably inserted into the contact pressure spring support housing 219 and is constantly biased toward the stationary contact 111 by the contact pressure spring 220.

[0113] Current sensors 41 and 42, which constitute measuring devices for measuring the performance characteristics of the switching device 1, are provided in the connection circuit between the connection coil 213 of the electromagnetic actuator 12 and the driving power source 2 and in the connection circuit between the separation coil 214 and the driving power source 2, and measure the driving currents flowing through the connection circuits.

[0114] Each of the current sensors 41 and 42 outputs current waveform data regarding the measured drive currents as an analog signal or a digital signal and supplies this data to a condition monitoring device 5. Reference numeral 6 denotes a display device having a display unit which will be explained in more detail below.

[0115] From an initial time when the operation of the switching device 1 is started, the current sensors 41 and 42 measure drive currents for the electromagnetic actuator 12, for example, each time the electromagnetic actuator 12 operates, and provide current waveforms of the drive currents measured at different times.

[0116] The output signals of current sensors 41 and 42 can also be voltage waveforms instead of current waveforms of the drive currents. The following explanations assume that current sensors 41 and 42 output current waveforms.

[0117] Fig. Fig. 2 is a block diagram illustrating the configuration of the condition monitoring device 5 in the switching device remaining life diagnostic device according to the first embodiment of the invention. Fig. 2, the condition monitoring device 5 is configured with a condition value estimation unit 51, a recording unit 52 and a remaining life estimation unit 53.

[0118] The state value estimation unit 51 receives current waveform data supplied from the current sensors 41 and 42, and based on the current waveform data, it estimates state values ​​related to the wear state of the switching device 1, that is, state values ​​such as contact abrasion, contact wear, friction force at the time of driving, and the capacitance of the driving capacitor 3, which specify the wear state of the switching device 1.

[0119] Generally, current waveform data regarding the driving current for a switching device can be obtained from a waveform corresponding to the driving distance of the movable contact. However, as the contacts wear, the driving distance of the movable contact of the switching device changes from a preliminarily predetermined driving distance or the driving distance at the time the opening / closing operation is implemented. Accordingly, the current waveform data obtained during the opening / closing operation changes from the predetermined data or the data at the time the opening / closing operation is implemented.

[0120] Accordingly, by previously obtaining the corresponding relations between the changing values ​​of the current waveform data, the driving distance of the movable contact, and the wear values ​​of the contacts by means of an experiment or calculation, the wear values ​​of the contacts, which constitute a state value regarding the wear state of the switching device, can be estimated from the changing values ​​of the current waveform data.

[0121] Instead of using the contact wear values, one can alternatively use the changing values ​​of the current waveform data as condition values ​​related to the wear condition of the switching device.

[0122] Furthermore, when a switching device is in operation, the drive speed of the switching device or the starting time of the opening / closing operation generally depends on the frictional force exerted on the drive shaft. If the drive speed or the starting time of the opening / closing operation changes, the current waveform data obtained during the opening / closing operation will differ from the predetermined data or the data at the time the opening / closing operation was implemented.

[0123] If one obtains in advance by experiment or calculation the corresponding relationship between the changing values ​​of the current waveform data and the frictional force exerted at the time of operation of the switching device, one can estimate the frictional force exerted at a time when the switching device is operated, which is a state value related to the wear state of the switching device, from the changing values ​​of the current waveform data.

[0124] Instead of using the friction force, one can alternatively use the changing values ​​of the current waveform data as condition values ​​related to the wear condition of the switching device.

[0125] Furthermore, when the switching device is operated, a drive current is generally discharged from the drive capacitor 3 provided in the drive circuit. As the capacitance of the drive capacitor 3 changes, the discharge time constant also changes. Therefore, the current waveform data differs from the predetermined data or the data at the time the opening / closing operation is implemented.

[0126] Therefore, if the corresponding relations between the change values ​​of the current waveform data and the capacitance of the drive capacitor 3 are obtained in advance by means of an experiment or calculation, the capacitance of the drive capacitor 3, which is a state value related to the wear state of the switching device, can be estimated from the changing values ​​of the current waveform data.

[0127] Instead of using the capacitance of the drive capacitor 3, one can alternatively use the change values ​​of the current waveform data as state values ​​related to the wear state of the switching device.

[0128] As mentioned above, the current sensors 41 and 42 measure the drive current twice or more times at different times. Thus, based on the respective current waveform data measured at two or more times, the state value estimation unit 51 estimates the progressive state value that specifies the wear state of the switching device 1 at the respective measurement times.

[0129] The recording unit 52 sequentially records, as historical condition values, the condition values ​​at each measurement time point estimated by the condition value estimation unit 51. The remaining life estimation unit 53 reads the historical condition values ​​recorded by the recording unit 52 and diagnoses the development situation of wear in the switching device 1 based on the read historical condition values, and estimates the remaining life of the switching device 1 and the wear factor that caused the wear, as described below.

[0130] The value of the remaining life estimated by the remaining life estimation unit 53 and the estimated wear factor in the switching device 1 are transmitted to the display unit 6, where they are displayed and communicated to the maintenance personnel.

[0131] Next, the operation of the switching device 1 will be explained in more detail. As in Fig. As shown in Figure 1, the vacuum valve 11 is in the connected state, so that the main circuit consisting of the main circuit conductors 101 and 102 is closed, with both the connecting coil 213 and the disconnecting coil 214 de-energized. However, the movable part 215 is held in the connected position, adhering to the end 2111 on the stationary contact side of the yoke 211 by the permanent magnet 212.

[0132] As a result, the movable contact 112 is in contact with the stationary contact 111 by the action of the second movable shaft 216, the contact pressure spring 220, the first movable shaft 117, the insulating rod 120, and the support shaft 113 of the movable contact 112. The contact pressure spring 220 exerts a predetermined contact pressure between the stationary contact 111 and the movable contact 112.

[0133] If in a situation where the vacuum valve 11 is in the connection state according to Fig. 1, the driving power source 2 supplies energy and biases the separation coil 214, the movable member 215 is attracted to the end 2112 of the yoke 211 on the opposite side from the stationary contact by the magnetic force generated by the separation coil 214, and moves to the end 2112 on the opposite side from the stationary contact and stops in the separation position in which it abuts against the end 2112 on the opposite side from the stationary contact.

[0134] Thereafter, although the separation coil 214 is de-energized, the movable member 215 is held in the separation position by the magnetic force of the permanent magnet 212. As a result, the movable contact 112 of the vacuum valve 11 is separated from the stationary contact 111, so that the main circuit is de-energized.

[0135] On the other hand, when the vacuum valve 11 is in the separation state and the driving power source 2 is energized and the connecting coil 213 is biased, the movable member 215 is attracted to the end 2111 on the stationary contact side by the magnetic force exerted by the connecting coil 213, moves toward the end 2111 on the stationary contact side, and stops in the Fig. 1 in the connection position in which it rests against the end 2111 on the side of the stationary contact.

[0136] Thereafter, even if the connecting coil 213 is de-energized, the movable part 215 is held in the connecting position by the magnetic force of the permanent magnet 212. As a result, the movable contact 112 of the vacuum valve 11 makes contact with the stationary contact 111, so that the main circuit is closed.

[0137] As mentioned above, the movable contact support shaft 113, the first movable shaft 117, and the second movable shaft 216 are slidably supported by the first guide bearing 116, the second guide bearing 119, the third guide bearing 217, and the fourth guide bearing 218. Therefore, when the switchgear 1 performs the disconnection operation or the connection operation, the movable contact support shaft 113, the first movable shaft 117, and the second movable shaft 216 usually move in a smooth, gentle manner, so that the movable contact 112 of the vacuum valve 11 can be driven.

[0138] In general, the respective sliding areas between the movable contact support shaft 113, the first movable shaft 117, the second movable shaft 216, and the first guide bearing 116, the second guide bearing 119, the third guide bearing 217, and the fourth guide bearing 218 are designed so that the remaining service life of the product is satisfactory when the switching device 1 is used in a given state.

[0139] However, in a case where the switching device 1 is continuously used under conditions exceeding a predetermined condition, wear in the respective sliding portions or in the lubricant causes a change in the frictional forces exerted in the respective sliding portions, so that erroneous operation may be caused in the switching device.

[0140] The contributing factors of such wear in a sliding portion, i.e., wear in a switching device 1, are as follows: (1) wear and cracks in the sliding portion; (2) roughness in the sliding portion; (3) corrosion in the sliding portion; (4) intrusion of foreign matter into a moving part such as a moving shaft; (5) solidification of the lubricant in the sliding portion or the like.

[0141] The development of deterioration or wear in the sliding area depends on the respective contributing factors, and each of the contributing factors has its own characteristics.

[0142] In other words, wear, abrasion, and cracks in the sliding portion of the switching device 1 develop during the operation of the switching device 1. Therefore, if the contributing factor of wear in the sliding portion is wear, abrasion, and cracks of the sliding portion, the development of wear in the sliding portion strongly depends on the number of operations of the switching device 1.

[0143] Wear in the sliding portion develops continuously from its initial state at a time when the switching device 1 starts its operation. The tendency of abrasion, wear, and cracks in the sliding portion depends on the structure of the sliding portion of the switching device 1, and the effect of differences among the switching devices 1 is relatively small.

[0144] On the other hand, roughness is caused in the sliding portion of the switching device 1 when a scratch occurs on the surface of the sliding portion due to certain circumstances. The scratch on the surface of the sliding portion becomes larger each time the switching device 1 repeats its opening / closing operation.

[0145] Although in a case where the contributing factor of deterioration or wear in a sliding portion is roughness in the sliding portion, the frictional force increases when the switching device 1 performs its opening / closing operation, which is also the case with continuous abrasion, wear, and cracks of the sliding portion, and the wear in the sliding portion develops depending on the number of opening / closing operations of the switching device 1. The wear in the sliding portion due to the roughness in the sliding portion does not develop gradually from its initial state at a time when the switching device 1 starts to operate, but develops abruptly from a certain time.

[0146] Corrosion in the sliding area of ​​the switching device 1 is caused by rust in a metallic material or chemical changes in a polymer material. Corrosion in the sliding area increases the static friction and the sliding friction in the sliding area. In a case where the contributing factor to wear in the sliding area is corrosion in the sliding area, the development of wear in the sliding area depends essentially on the time elapsed since the switching device 1 was installed.

[0147] The rate of wear development varies greatly depending on environmental conditions, such as temperature, humidity, or the presence of salt erosion or corrosive gases. Furthermore, the rate of rust development in a metallic material varies depending on whether the switching device 1 performs frequent opening / closing operations or does not perform such opening / closing operations for a long period of time. Thus, differences occur in how deterioration and wear develop in the sliding area.

[0148] The ingress of foreign matter into a moving part, such as a moving shaft of the switching device 1, occurs when grit, dust, or metallic fragments ejected from the surrounding materials, or other such materials, are deposited on a moving shaft. Due to the ingress of foreign matter, the moving part may be unable to move to the correct stationary position; or such foreign matter may enter the sliding portion, increasing the frictional forces exerted on the sliding portion.

[0149] The ingress of foreign matter into the sliding area can be one of the contributing factors to the progressive roughness in the sliding area. In some cases, the change in the friction force exerted on the sliding area caused by the ingress of grains or dust into the sliding area occurs abruptly and can be eliminated if the switching device 1 performs its opening / closing operation several times.

[0150] In a case where the contributing factor to deterioration in the sliding area is the intrusion of foreign matter into a moving part such as a movable shaft, in some cases, deterioration of the sliding area occurs abruptly and is eliminated after the switching device 1 has performed its opening / closing operation several times. Furthermore, there appears to be a tendency that the fluctuation ratio in the friction forces becomes higher as more grit and dust accumulate.

[0151] On the other hand, if the switching device 1 is not operated for a long period of time, solidification of the lubricant in the sliding portion of the switching device 1 is caused because the oil in the sliding portion lubricant is separated and the lubricant then solidifies. Such a lubricant solidification effect does not easily develop when the switching device 1 frequently performs its opening / closing operation.

[0152] On the other hand, if the oil of the lubricant has not been completely separated, the solidification will be eliminated when the switching device 1 performs the opening / closing operation again. Therefore, if the contributing factor to the deterioration of the sliding portion is solidification of the lubricant, the frictional force exerted on the sliding portion becomes large at an initial stage when the switching device 1 performs the opening / closing operation again after a long period of non-operation. Thereafter, when the opening / closing operation is repeated within a relatively short cycle, the frictional force exerted on the sliding portion tends to return to its original state.

[0153] Fig. 3 shows a set of diagrams illustrating cases where the condition value related to the wear or deterioration of the switching device 1, i.e., the friction force F, which is one of the factors of wear caused by corrosion in the sliding portion, is given as data in three different systems based on historical condition values.

[0154] Fig. 3(a) is a diagram of first system data in which friction forces F, which are state values ​​related to the deterioration or wear of a switching device, are plotted sequentially, wherein the abscissa indicates the elapsed time T during the operating period of the switching device 1.

[0155] Fig. Figure 3(b) shows a diagram of second system data in which the friction forces F are plotted sequentially, with the abscissa indicating the number of operations N during the operating period of the switching device.

[0156] Fig. Figure 3(c) shows a diagram of third system data in which the friction forces F are plotted sequentially, with the abscissa indicating the non-operative time nT during the operating period of the switching device.

[0157] It is apparent that in a case where the contribution factor of the change in the friction force F, that is, the contribution factor of the deterioration or wear in the sliding portion is corrosion in the sliding portion, the friction force exerted on the sliding portion gradually increases in proportion to the elapsed time T, as clearly shown in a regression line RL1 of first system data as shown in Fig. 3(a).

[0158] Since at an initial time at which the switching device 1 starts its operation, the switching device 1 is operated many times for adjustment, a large amount of historical state values ​​exists.

[0159] The second system data, which is in Fig. 3(b), a regression line RL2 is shown, where the friction force F appears to begin to increase abruptly at a certain point in time. Therefore, if the analysis of the friction force F is implemented only based on the second system data, a large error occurs in the estimation of the remaining service life of the switching device 1.

[0160] For the third system data according to Fig. 3(c), a regression line can be derived, which is shown as regression line RL3. However, the variation of the data with respect to the regression line RL3 is large, so the correlation is extremely low. Therefore, if the analysis of the friction force F is implemented based only on the third system data, a large error occurs in the estimation of the remaining service life of the switching device 1.

[0161] Fig. Figure 4 shows a set of diagrams representing cases where the friction force F caused by downforce and cracks of a sliding zone are given as data in three different systems based on historical state values.

[0162] Fig. Figure 4(a) shows a diagram of first system data in which the friction forces F are plotted sequentially, with the abscissa indicating the elapsed time T during the operating period of the switching device.

[0163] Fig. 4(b) shows a diagram of second system data in which the friction forces F are plotted sequentially, with the abscissa indicating the number of operations N during the operating period of the switching device.

[0164] Fig. Figure 4(c) shows a diagram of third system data in which the friction forces F are plotted sequentially, with the abscissa indicating the non-operative time nT during the operating period of the switching device.

[0165] It can be seen that in a case where the contribution factor of the change in the friction force F, that is, the contribution factor of the deterioration or wear in the sliding area due to the change in the friction force is the corrosion in the sliding area, the friction force F exerted on the sliding area gradually increases in proportion to the number of operations N; this is clearly evident from a regression line RL2 of second system data shown in Fig. 4(b).

[0166] On the other hand, the first system data according to Fig. 4(a), where a regression line RL1 is shown, no sufficient correlation can be found between the friction force F and the elapsed time T. Therefore, it is not possible to analyze the change in the friction force F based only on the first system data, so that it is difficult to estimate the remaining service life of the switching device 1 from only the first system data.

[0167] Similarly, the third system data according to Fig. 4(c), where a regression line RL3 is plotted, no sufficient correlation can be found between the friction force F and the non-operational time nT during the operating life of the switching device. Therefore, it is not possible to analyze the change in the friction force F based solely on the third system data, making it difficult to estimate the remaining service life of the switching device 1 from the third system data alone.

[0168] The Fig. Figure 5 shows a set of graphs illustrating cases where the friction force F changes due to lubricant solidification, which is given with data from three different systems based on historical state values.

[0169] Fig. 5(a) shows a diagram of first system data in which the friction forces F are plotted sequentially, with the abscissa indicating the elapsed time T during the operating period of the switching device.

[0170] Fig. 5(b) shows a diagram of second system data in which the friction forces F are plotted sequentially, with the abscissa indicating the number of operations N during the operating period of the switching device.

[0171] Fig. Figure 5(c) shows a diagram of third system data in which the friction forces F are plotted sequentially, with the abscissa indicating the non-operative time nT during the operating period of the switching device.

[0172] It can be seen that in cases where the contribution factor for the change in friction force F, i.e. the contribution factor for the deterioration or wear in the sliding area due to a change in friction force, is the solidification of lubricant, the following applies: the longer the non-operational time nT is, the greater the friction force F exerted on the sliding area when the opening / closing operation is resumed. This is clearly evident from the regression line RL3 of third system data according to Fig. 5(c).

[0173] In a case where the opening / closing operation is performed after a short non-operational time nT, the friction force F tends to return to its original value. In contrast, for the respective values ​​of the first system data in Fig. 5(a) and the second system data in Fig. 5(b), the variation of the friction force F exerted on the sliding portion is large, so it is impossible to carefully analyze the change of the friction force F. Therefore, it is difficult to estimate the remaining service life of the switching device 1.

[0174] As stated above, depending on the type of contribution factor causing the change in friction force F, the type of abscissa values ​​of the system data directly related to the change in friction force F differs. Therefore, when the state value is based on measured data, the friction force F is provided by only a part of three system data sets, so that cases may occur where a tendency of the change in friction force cannot be sufficiently determined.

[0175] Therefore, a diagnostic method and a diagnostic device for the remaining service life of a switching device according to the first embodiment of the invention proceed as follows.First system data are generated in which state values ​​relating to the deterioration of a switching device are plotted, the abscissa indicating the total elapsed time during a period after a time at which the switching device 1 started to operate; second system data are generated in which the progressive state values ​​are plotted, the abscissa indicating the total number of operations of the switching device during the period after the time at which the switching device 1 started to operate; and third system data are generated in which the progressive state values ​​are plotted, the abscissa indicating the total non-operational time of the switching device during the period after the time at which the switching device 1 started to operate. Based on the generated first, second, and third system data, the remaining service life of the switching device 1 is estimated.

[0176] In the switching device remaining life diagnostic device according to the first embodiment of the invention, the remaining life estimation unit 53 generates the first, second, and third system data and thereby estimates the remaining life.

[0177] Next, the operation of the switching device remaining life diagnostic device according to the first embodiment of the invention will be explained in more detail. Fig. 1 the switching device 1 performs a separating operation, the driving power source 2 biases the separating coil 214 of the electromagnetic actuating device 12, so that by this operation the movable contact 112 of the vacuum valve 11 is separated from the fixed contact 111 and thus the main circuit is opened.

[0178] In this situation, the current sensor 42 measures the current waveform of a drive current applied to the isolation coil 214 and supplies the measurement data to the state value estimation unit 51 of the state monitoring device 5, which is Fig. 2 is shown.

[0179] When the switching device 1 performs a disconnecting operation, the driving power source 2 biases the connecting coil 213 of the electromagnetic actuator 12, so that by the corresponding operation, the movable contact 112 of the vacuum valve 11 makes contact with the fixed contact 111 and thus the main circuit is closed.

[0180] In this situation, the current sensor 41 measures the current waveform of a drive current applied to the connecting coil 213 and supplies its measurement data to the state value estimation unit 51 of the state monitoring device 5 according to Fig. 2.

[0181] Based on the change in the current waveform, which is the input measurement data, the condition value estimation unit 51 estimates condition values, such as a value for abrasion, wear, and cracks, the friction force at the time of driving, and the capacitance of the driving capacitor 3, which specify the deterioration or wear state of the sliding portion in the switching device 1. The recording unit 52 records and accumulates the condition values ​​estimated by the condition value estimation unit 51 as historical condition value data.

[0182] The remaining life estimation unit 53 reads the historical state values ​​recorded and stored in the recording unit 52. First, based on the historical state values, the remaining life estimation unit 53 generates first system data in which the state values ​​are sequentially arranged, with the abscissa indicating the elapsed time from a time point at which the switching device 1 started operating; second system data in which the state values ​​are arranged, with the abscissa indicating the number of operations N from a time point at which the switching device 1 started operating; and third system data in which the state values ​​are arranged, with the abscissa indicating the non-operational time nT from a time point at which the switching device 1 started operating.

[0183] The remaining life estimation unit 53 then estimates the remaining life of the switching device 1 based on at least part of the system data sets. In the following explanation, the friction forces F exerted on the sliding area are used as the state values. However, it goes without saying that other state values ​​may also be used.

[0184] Furthermore, the remaining life estimation unit 53 prepares four remaining life variables t1, t2, t3, and t4. A large value, such as "999 years," is specified for each of the variables t1, t2, t3, and t4. The values ​​of the variables t1, t2, t3, and t4 are overwritten with remaining life estimates, as explained in more detail below.

[0185] The Fig. 6A and Fig. 6B show a set of flowcharts for explaining the operation in which the remaining life estimation unit 53 of the condition monitoring device 5 estimates the remaining life of the switching device 1 by determining the deterioration tendency of the frictional forces exerted on the switching device 1, which is obtained from the first, second, and third system data.

[0186] According to Fig. 6A, first, in a step S1, all historical state value data recorded in the recording unit 52 of the condition monitoring device 5 are read. Then, the first system data are provided in which the friction forces F, which are state values ​​in the read historical state value data, are arranged, wherein the abscissa indicates the elapsed time T during a period after a time at which the switching device 1 has started to operate. The first system data regarding the elapsed time corresponds to the first system data recorded in Fig. 3(a), Fig. 4(a) or Fig. 5(a), as explained above.

[0187] Furthermore, in step S1, the second system data are provided in which the friction forces F, which are state values ​​in the read-out historical state value data, are arranged, wherein the abscissa indicates the number of operations N of the switching device 1 during a period after a time in which the switching device 1 has started to operate. The second system data corresponds to the second system data contained in Fig. 3(b), Fig. 4(b) or Fig. 5(b), as explained above.

[0188] Furthermore, in step S1, the third system data are provided in which the friction forces F, which are state values ​​in the read-out historical state value data, are arranged, wherein the abscissa indicates the non-operative time nT of the switching device 1 during a period after a time in which the switching device 1 has started to operate. The third system data corresponds to the third system data contained in Fig. 3(c), Fig. 4(c) or Fig. 5(c).

[0189] Next, in step S2, it is determined whether a tendency is detected in the first system data in which the friction force F deteriorates from a time point at which the switching device 1 has started to operate as the elapsed time T increases.

[0190] In the determination implemented in step S2, in a case described in Fig. 3(a) or in Fig. 4(a), a regression line RL1 is obtained, and if the correlation coefficient of the regression line RL1 is equal to or greater than a predetermined value and the gradient of the regression line RL1 is equal to or less than a predetermined value (or is equal to or greater than a predetermined value), then it is determined that a deterioration tendency of the friction force F is detected. In other cases, it is determined that no deterioration tendency of the friction force F is detected.

[0191] Next, in step S3, it is determined whether a tendency is detected in the second system data in which the friction force F becomes worse as the number of operations N increases from a time point at which the switching device 1 has started to operate.

[0192] In the determination implemented in step S3, in a case that is Fig. 3(b) or in Fig. 4(b), a regression line RL2 is obtained, and when the correlation coefficient of the regression line RL2 is equal to or greater than a predetermined value and the gradient of the regression line RL2 is equal to or less than a predetermined value (or is equal to or greater than a predetermined value), it is determined that a deterioration tendency of the friction force F is detected. In other cases or in the case shown in Fig. 5(b), in which no regression line is obtained, it is determined that no deterioration tendency of the friction force F has been detected.

[0193] Next, in step S4, it is determined whether a tendency is detected in the third system data in which the friction force F has deteriorated from a time point at which the switching device 1 has started to operate as the non-operational time nT of the switching device 1 increases.

[0194] In the determination implemented in step S4, in a case described in Fig. 5(c), a regression line RL3 is obtained, and when the correlation coefficient of the regression line RL3 is equal to or greater than a predetermined value and the gradient of the regression line RL3 is equal to or less than a predetermined value (or is equal to or greater than a predetermined value), it is determined that a deterioration tendency of the friction force F has been detected. In other cases or in the case shown in Fig. 3(c) and in Fig. 4(c), no regression line is obtained, and it is determined that no deterioration tendency of the friction force F has been detected.

[0195] In these explanations, a regression line is used as the curve showing data correlation. However, a higher-order regression curve, a regression curve using an exponent, or a regression curve using a logarithm can also be used. Although correlation coefficients are used in these explanations, the difference or absolute value of the difference between the data and the regression line can also be used, and the determining condition is assumed to be that this difference is less than a predetermined value.

[0196] Next, in step S5, it is determined whether, in all the results of the determinations implemented in steps S2, S3, and S4, no tendency of deterioration of the friction force F in the switching device 1 from its initial state has been detected.

[0197] In a case where it is determined that there is no deterioration tendency in the friction force F (YES) based on all the results of the determinations implemented in steps S2, S3, and S4, step S5 is followed by step S10, described in more detail below. In a case where it is determined that there is a deterioration tendency in the friction force F (NO) based on at least one of the results of the determinations implemented in steps S2, S3, and S4, step S6 is next followed by step S5.

[0198] In step S6, it is determined whether a deterioration tendency of the friction force F has been detected in only one of the results of the determinations implemented in steps S1, S2, and S3. If it is determined that a deterioration tendency of the friction force F exists in only one of the system data sets (YES), step S6 is followed by step S9. If it is determined that deterioration tendencies exist in two or more system data sets (NO), step S6 is followed by step S7.

[0199] If it is determined in the above-described steps that a tendency for the friction force F to deteriorate has been detected in two or more system data sets among the results of the determinations implemented in steps S1, S2, and S3, the flowchart proceeds to step S7. Step S8 then follows step S7.

[0200] In step S8, the estimated value of the remaining service life of the switching device 1 is calculated from the system data belonging to the two or more system data sets in which the deterioration tendency of the friction force F has been detected, which have the largest correlation coefficient of a regression line. Case 1

[0201] Below, explanations will first be given as Case 1, assuming a case where it is determined in step S2 that the friction force F in the first system data has a deterioration tendency, it is determined in step S3 that the friction force F in the second system data has a deterioration tendency, and it is determined in step S4 that the friction force F in the third system data has a deterioration tendency. Furthermore, in Case 1, it is assumed that the first system data has the strongest correlation.

[0202] In case 1, the result of the determination in step S5 is "NO." Step S5 then proceeds to the next step S6. In step S6, it is determined whether a tendency for the friction force F to deteriorate has been detected in only one of the results of the determinations implemented in steps S1, S2, and S3. Thus, the result is "NO," and step S6 then proceeds to step S7.

[0203] In step S7, in a case where it has been determined that a tendency for the friction force F to deteriorate is detected in two or more system data sets in the results of the determinations implemented in steps S1, S2, and S3, the flowchart proceeds to step S8. Thus, in case 1, step S8 follows step S7.

[0204] In step S8, an optimal regression line RL1 is obtained for the first system data exhibiting the strongest correlation among the three system data sets. Then, from this regression line, the elapsed time is calculated until the friction force F reaches the threshold value at which the switching device 1 can no longer meet the predetermined performance.

[0205] The calculated elapsed time is converted to the number of years. The number of years overwrites the value "999" of the previously specified variable t1. The number of years is used as the initial estimate of the remaining life. In this situation, if the value obtained by converting the calculated elapsed time to the number of years exceeds "999," the initial estimate is set to "999."

[0206] Next, in step S8, the deterioration tendency of the friction force F in the first system data, which has the strongest correlation, is removed from the original data. Then, three system data—the first system data, the second system data, and the third system data—are regenerated. For example, the procedure for removing the deterioration tendency from the original data is as follows. (1) The three system data sets can be represented as (y_i, a_i, b_i, c_i). The symbol i denotes a value that varies between 1 and M. M denotes the total number of data sets; yi corresponds to the measured state value; a_i corresponds to the elapsed time, which is the abscissa value of the first system data; b_i corresponds to the number of operations, which is the abscissa value of the second system data; c_i corresponds to the non-operational time, which is the abscissa value of the third system data. (2) With respect to each of the first system data (y_i, a_i), the second system data (y_i, b_i) and the third system data (y_i, c_i), for example, the deterioration tendency of the friction force F is determined. (3) For example, in a case where a significant deterioration tendency of the friction force F is detected in the first system data (y_i, a_i), a regression line [y = A xa + B] is obtained. Here, A and B denote coefficients obtained using a correlation coefficient obtained by statistical calculations of the system data sets. (4) Therefore, to remove the first system data (y_i, a_i) from the original historical state value data, in which the significant deterioration trend has been detected, [(y1_i) = (y_i) - (A x a_i) - B] is set, and (y_i, a_i, b_i, c_i) is replaced by (y1_i, a_i, b_i, c_i). As a result, the first system data (y1_i, a_i), the second system data (y1_i, b_i), and the third system data (y1_i, c_i) are newly obtained.

[0207] In the manner described above, from the original data having the strongest correlation and from which the deterioration tendency has been removed, the following data are again generated: first system data in which the friction force is indicated while the abscissa denotes the elapsed time, second system data in which the friction force is indicated while the abscissa denotes the number of operations, and third system data in which the friction force is indicated while the abscissa denotes the non-operational time.

[0208] To determine whether the deterioration tendency of the friction force is again detected in the newly generated three system data sets, steps S2, S3, and S4 are performed again. In the same manner as described above, it is determined with respect to the respective system data whether or not there is a tendency for the friction force F to deteriorate from an initial state at a time when the switching device 1 has started to operate.

[0209] As described above, in Case 1, the deterioration tendency of the friction force F is detected in each of the original system data sets. However, since the specified procedure removes the deterioration tendency of the friction force F in the first system data, where the abscissa indicates the elapsed time, and these system data have the strongest correlation, the deterioration tendency of the friction force exists in the second system data, where the abscissa indicates the number of operations, and the third system data, where the abscissa indicates the non-operational time, among the newly generated three system data sets. Thus, step S8 follows steps S5 to S7.

[0210] In step S8, an optimal regression line is obtained in the manner described above for the system data exhibiting the strongest correlation among the newly generated second system data and third system data. Then, from this regression line, the elapsed time, the number of operations, or the non-operational time at which the friction force F reaches the threshold value at which the switching device 1 can no longer meet the specified performance is calculated.

[0211] In this situation, assuming that the newly generated second system data have the strongest correlation, the specific number of operations in the time corresponding to the time in which the friction force reaches the limit at which switching device 1 can no longer meet the specified performance is calculated on the basis of the optimal regression line RL2 for it.

[0212] The calculated number of operations is converted to the number of years. The number of years is used to overwrite the value "999" of the previously specified variable t2. The number of years is then used as the second estimate of the remaining life. In this case, if the value obtained by converting the calculated elapsed time to the number of years exceeds "999," the first estimate is set to "999."

[0213] Next, at step S8, the deterioration tendency of the friction force F in the second system data is removed from the original data by the same procedure as described above, and then three sets of system data are newly generated.

[0214] To determine whether the deterioration trend is again detected in the three newly generated system data sets, steps S2, S3, and S4 are performed again. In the same manner as described above, it is determined with respect to the respective system data whether a trend is detected in which the friction force F deteriorates from an initial state to a time point at which the switching device 1 has started to operate.

[0215] As mentioned above, in Case 1, the deterioration tendency of the friction force F is detected in each of the original system data sets. Because of the above-described procedure, the deterioration tendency of the friction force F is removed in the first system data, where the abscissa indicates the elapsed time, and in the second system data, where the abscissa indicates the number of operations, the deterioration tendency of the friction force F is present only in the third system data, where the abscissa indicates the non-operational time, among the three newly generated system data sets. Thus, step S9 follows steps S5 and S6.

[0216] In step S9, an optimal regression line RL3 is obtained for the third system data from the newly generated three system data sets. Then, from this regression line, a non-operational time is calculated at which the friction force F reaches the threshold value at which the switching device 1 can no longer meet the predetermined performance.

[0217] The calculated non-operational time is converted into a number of years. The number of years is used to overwrite the value "999" of the previously entered variable t3. Then, the number of years is used as the third estimate of the remaining service life. In this situation, if the value obtained by converting the calculated elapsed time into the number of years exceeds "999," this estimate is set to "999."

[0218] By repeating the process comprising steps S2 to S9 three times in the manner described above, in case 1, the first estimated value t1 and the second estimated value t2 of the remaining life are calculated in step S8, while the third estimated value t3 is calculated in step S9.

[0219] Next, in step S9, the deterioration tendency of the friction force F in the newly generated third system data is again removed from the original data by the same procedure as described above, and then step S10 follows step S9.

[0220] In step S10, historical state value data is extracted from the data that passed through step S9 based on the most recent N-times measured data. Based on this historical state value data, the following data are generated: fourth system data in which the friction forces F are plotted, with the abscissa indicating the elapsed time T; fifth system data in which the friction forces F are plotted, with the abscissa indicating the number of operations N of the switching device 1; and sixth system data in which the friction forces F are plotted, with the abscissa indicating the non-operational time nT of the switching device 1.

[0221] The most recent N-times measurement data denotes the measurement data during a period after a time point when a predetermined period has elapsed from a time point at which the switching device 1 has started to operate.

[0222] Thus, the four system data denote such system data in which the state values ​​are indicated as a function of an elapsed time during a period after a point in time, wherein the predetermined period has elapsed from a point in time at which the switching device 1 has started to operate.

[0223] The fifth system data denotes such system data in which the state values ​​are specified as a function of the number of operations N of the switching device during a period after a point in time, the predetermined period having elapsed from a point in time at which the switching device 1 has started to operate.

[0224] The sixth system data denotes system data in which the state values ​​are indicated depending on the non-operational time of the switching device during a period after a time point, wherein the predetermined time period has elapsed from a time point in which the switching device 1 has started to operate.

[0225] As ways in which the deterioration occurs in the sliding range of the switching device 1, there are a case in which the deterioration gradually occurs from an initial state in which the switching device 1 starts to operate, and a case in which Fig. 3(b), in which the deterioration occurs rapidly from a certain point in time.

[0226] In the latter case, the deterioration develops relatively rapidly from a certain point in time. The measurement data analysis, which is performed from an initial state in which the switching device 1 begins to operate, cannot readily capture the deterioration trend.

[0227] For example, if there is a large number of data sets that do not vary greatly, and a relatively small number of data sets indicating a deterioration tendency, the measurement data analysis performed from an initial state in which the switching device 1 begins to operate may not easily capture the deterioration tendency. In this situation, it is possible to clearly determine a deterioration tendency of the switching device 1 by analyzing the most recent N-times of measurement data.

[0228] As in the case of steps S2, S3, and S4 described above, the respective regression lines are obtained for the fourth system data, the fifth system data, and the sixth system data based on the most recent N-times measured data as indicated in step S10. In this case, when a regression line is obtained, and when the correlation coefficient of the regression line is equal to or greater than a predetermined value and the gradient of the regression line is equal to or less than a predetermined value (or equal to or greater than a predetermined value), it is determined that a deterioration tendency of the friction force F has been detected.

[0229] Next, in step S11, it is determined whether a deterioration tendency of the friction force F is present as a state value in at least one of the fourth system data, the fifth system data, and the sixth system data. If a deterioration tendency of the friction force F is present as a state value in at least one of the system data sets (YES), step S11 is followed by step S12. If a deterioration tendency of the friction force F is not present in any of the system data sets (NO), step S11 is followed by step S13.

[0230] In step S12, based on the optimal regression line of the system data from the three system data sets in which there is a deterioration tendency of the friction force, which have the strongest correlation, the elapsed time, the number of operations, or the non-operational time in the period corresponding to that in which the friction force has reached a limit value at which the switching device 1 can no longer meet its predetermined performance is calculated.

[0231] For example, if the fourth system data has the strongest correlation due to its optimal regression line RL1, the elapsed time is calculated in which the friction force reaches a limit value at which the switching device 1 can no longer meet its predetermined performance.

[0232] The calculated elapsed time is converted into a number of years. The number of years is used to overwrite the value "999" of the previous variable t4, which was provisionally entered. The number of years is then used as the fourth estimate of the remaining lifespan. If, in this situation, the value obtained by converting the elapsed time into the number of years exceeds "999," this estimate is set to "999."

[0233] Next, in step S13, the shortest estimated value is estimated as the remaining lifetime of the switching device 1 from the first estimated value t1 and the second estimated value t2 calculated in step S8, the third estimated value t3 calculated in step S9, and the fourth estimated value t4 calculated in step S12. Case 2

[0234] Next, a constellation is explained as case 2, in which it is determined in two of the steps S2, S3 and S4 that a deterioration tendency of the friction force F exists in the system data.

[0235] In Case 2, there is a deterioration trend in the friction force F in two of the three system data sets. As in Case 1, the flowchart proceeds through steps S1 to S8 in a manner that includes steps S2, S3, S4, S5, S6, and S7.

[0236] In step S8, an optimal regression line is obtained for the system data exhibiting the strongest correlation among the two system data sets. Then, from this regression line, the elapsed time, the number of operations, or the non-operational time is calculated at which the friction force F reaches the threshold value at which the switching device 1 can no longer meet its predetermined performance.

[0237] Provided that the first system data have the strongest correlation, namely on the corresponding optimal regression line RL1, the elapsed time is calculated in which the friction force reaches a limit value at which the switching device 1 can no longer fulfill its predetermined performance.

[0238] The elapsed time is converted into a number of years. The number of years is used to overwrite the preliminarily specified value of "999" for the previous variable t1. The number of years is then used as the first estimate of the remaining lifespan. If, in this situation, the value obtained by converting the elapsed time into the number of years exceeds "999," the first estimate is set to "999."

[0239] Next, in step S8, based on the above procedure, the deterioration tendency of the friction force F in the first system data with the strongest correlation is removed from the original data. Then, three new system data sets are generated. To determine whether the deterioration tendency is detected again in the newly generated three system data sets, steps S2, S3, and S4 are performed again.

[0240] In the manner described above, it is determined with regard to the respective system data whether a tendency is detected in which the friction force F becomes worse from an initial state from a point in time at which the switching device 1 has started to operate.

[0241] As mentioned, in Case 2, the deterioration tendency of the friction force F is detected in two of the three original system data sets. Since the previous procedure removed the deterioration tendency of the friction force F in the first system data, which has the strongest correlation, the deterioration tendency of the friction force F is present only in the second system data or the third system data among the newly configured three system data sets. The flowchart then proceeds via steps S5 and S6 to step S9.

[0242] Assuming that there is a deterioration trend of the friction force F in the second system data, where the abscissa indicates the number of operations, an optimal regression line RL2 is obtained for the newly generated system data in step S9. Then, from this regression line, the number of operations at which the friction force F reaches the threshold value at which the switching device 1 can no longer meet its predetermined performance is calculated.

[0243] The calculated number of operations is converted into a number of years. The number of years is used to overwrite the provisionally set value of "999" for the previous variable t2. The number of years is then used as the second estimate of the remaining service life. If, in this situation, the value obtained by converting the elapsed time into the number of years reaches "999," this estimate is set to "999."

[0244] As mentioned, in Case 2, by repeating the process including steps S2 to S9 twice, the first estimated value t1 and the second estimated value t2 of the remaining lifetime are calculated in step S8 and step S9, respectively.

[0245] Next, in step S9, the deterioration tendency of the friction force F in the newly generated second system data is removed from the original data by the same procedure as described above, and then step S9 is followed by step S10.

[0246] The operation in the process from step S10 to step S13 is the same as in Case 1. Fourth system data, fifth system data, and sixth system data are generated based on the most recent N-times measurement data, and a third estimated value t3 of the remaining life is calculated from the system data having the strongest correlation.

[0247] Next, in step S13, the shortest estimated value is estimated as the remaining lifetime of the switching device 1 from the first estimated value t1 calculated in step S8, the second estimated value t2 calculated in step S9, and the third estimated value t3 calculated in step S12. Case 3

[0248] Next, a constellation is explained as case 3 in which only in one of the steps S2, S3 and S4, for example only in the first system data, it is determined that there is a deterioration tendency of the friction force F.

[0249] In Case 3, the deterioration tendency of the friction force F is present in only one of three system data sets. Thus, the flowchart proceeds from step S1 to step S6 via steps S2, S3, S4, and S5. Step S6 is then followed by step S9.

[0250] In step S9, an optimal regression line RL1 is obtained for the initial system data, where the abscissa indicates the elapsed time. Then, from this regression line, the elapsed time at which the friction force F reaches the threshold value at which the switching device 1 can no longer meet its predetermined performance is calculated.

[0251] The calculated elapsed time is converted into a number of years. The number of years is used to overwrite the value "999" of the previous variable t1, which was provisionally set. This number of years is then used as the initial estimate of the remaining life. If, in this situation, the value obtained by converting the calculated elapsed time into the number of years exceeds "999," then this estimate is set to "999."

[0252] As already mentioned, in case 3, step S6 is directly followed by step S9, so that the first estimated value t1 is calculated.

[0253] Next, at step S9, the deterioration tendency of the friction force F in the first system data is removed from the original data by the same procedure as described above, and then step S9 is followed by step S10.

[0254] The operations in the process from step S10 to step S13 are the same as in case 1 or case 2. Fourth system data, fifth system data, and sixth system data are generated based on the most recent N-times measured data, and a second estimated value t2 of the remaining life is calculated from the system data having the strongest correlation.

[0255] Next, in step S13, the shortest estimated value is estimated as the remaining lifetime of the switching device 1 from the first estimated value t1 calculated in step S9 and the second estimated value t2 calculated in step S12. Case 4

[0256] Next, Case 4 explains a situation in which none of steps S2, S3, and S4 determines that a deterioration tendency exists, for example, in the friction force F as a state value. In Case 4, step S5 is then directly followed by step S10.

[0257] The operations in the process from step S10 to step S13 are the same as in Case 1, Case 2, or Case 3. Then, based on the most recent N-times measurement data, the fourth system data in which the abscissa indicates the elapsed time, the fifth system data in which the abscissa indicates the number of operations, and the sixth system data in which the abscissa indicates the non-operational time are configured, and a first estimated value t1 of the remaining life is calculated from the system data having the strongest correlation.

[0258] As mentioned, in case 4, only the first estimated value t1 is calculated as the remaining lifetime of the switching device 1, and in step S13, the first estimated value is estimated as the remaining lifetime of the switching device 1.

[0259] In each of Case 1, Case 2, and Case 3, in the process of steps S10 to S13, the estimated remaining life is calculated based on the most recent N-time measurement data sets. However, there may also be a case where, even if the fourth system data, the fifth system data, and the sixth system data are configured based on the most recent N-time measurement data, there is no system data indicating a deterioration trend of a condition value.

[0260] In this case, if none of the first system data, the second system data, or the third system data contain data indicating a deterioration trend of a condition value, no remaining service life estimate is calculated. Thus, "999 years" is set as the remaining service life for each of the variables t, t1, t2, t3, and t4, indicating that, due to the fact that no deterioration trend has occurred in switching device 1, the current stage is not suitable for estimating a remaining service life.

[0261] Next, in each of cases 1 to 4, at step S13, the deterioration contribution factor for the switching device 1 is estimated from the system data on the basis of which the shortest remaining life estimate has been calculated. At step S13, the deterioration factor is estimated in the following manner. (1) In the case where the remaining service life is calculated from the system data where the abscissa indicates the elapsed time, it is estimated that the deterioration was caused by rust or corrosion in the sliding portion or by dust deposited on the sliding portion. (2) In the case where the remaining service life is calculated from the system data where the abscissa indicates the number of operations, it is estimated that the deterioration was caused by wear, abrasion and cracks in the sliding area. (3) In the case where the remaining service life has been calculated from the system data where the abscissa indicates the non-operative time, it is estimated that the deterioration was caused by solidification of the lubricant.

[0262] In a diagnostic device and a diagnostic method for the remaining service life of a switching device according to the first embodiment of the invention, the following occurs.First system data are generated in which state values ​​relating to deterioration of the switching device are plotted, the abscissa indicating the total elapsed time during a period after a time point in which the switching device 1 started to operate; second system data are generated in which the previous state values ​​are arranged, the abscissa indicating the total number of operations of the switching device during the period after a time point in which the switching device 1 started to operate; and third system data are generated in which the previous state values ​​are arranged, the abscissa indicating the total non-operational time of the switching device during the period after the time point in which the switching device 1 started to operate.

[0263] Based on the generated first system data, second system data, and third system data, the remaining service life of the switching device is estimated. As a result, the remaining service life of the switching device can be accurately estimated, and the deterioration contribution factor in the switching device can also be estimated. Second embodiment

[0264] Fig. 7 shows a set of schematic diagrams for explaining the diagnostic method and the diagnostic device for the remaining life of a switching device according to the second embodiment of the invention. Fig. 7(a) shows a diagram for explaining system data in which friction forces F are plotted, where the abscissa indicates the number of operations or the elapsed time during a period after the switching device has started to operate. Fig. 7(b) shows a diagram for explaining system data, in which the variance value D of the most recent N-times measurement data of friction forces is plotted, where the abscissa indicates the number of operations or the elapsed time.

[0265] For the system data according to Fig. From Figure 7(a), it can be seen that there is no correlation indicating the development of deterioration of the switching device. However, sometimes there is a case where, compared to the variation B1 of the friction force F during the initial operation of the switching device, the variation B2 of the friction force F becomes large at a time when a long period of time has passed or the number of operations has increased. It can be estimated that the roughness of the surface of the sliding portion or the intrusion of foreign matter into the sliding portion causes the operation of the switching device to become unstable.

[0266] In this case, corresponding system data sets are generated, in which the variance values ​​of the state values ​​from N operations of the switching device are plotted. The abscissa represents the elapsed time, the number of operations of the switching device, the non-operational time of the switching device, and the accumulated operating time of the switching device. Based on these system data sets, the strength of the correlation of the deterioration of the switching device is determined, so that the remaining service life of the switching device can be estimated. Instead of the variance value, the standard deviation, which is similar to the variance value, can also be used.

[0267] Therefore, in the diagnostic method and apparatus for the remaining life of a switching device according to the second embodiment of the invention, the following data are generated: first system data in which the variance values ​​of the state values ​​are indicated in every predetermined number of measurements by a measuring unit, depending on the elapsed time during the operation period of the switching device; second system data in which the previous variance values ​​are indicated depending on the number of operations of the switching device during the operation period; third system data in which the previous variance values ​​are indicated depending on the non-operational time of the switching device during the operation period; and fourth system data in which the previous variance values ​​are indicated depending on the accumulated operation time of the switching device during the operation period.The remaining service life of the switching device is then estimated based on the generated system data sets. For simplicity, the explanation uses the first system data through the third system data.

[0268] In the Fig. In the system data shown in Figure 7(a), during the initial operation period of the switching device 1, the friction forces f1, f2, f3, f4, f5, f6, f7, and f8 are distributed. The variance value d1 of the friction forces f1, f2, f3, f4, f5, f6, and f7 corresponding to the 7 operations of the switching device 1 is obtained, and then the variance value d2 of the friction forces f2, f3, f4, f5, f6, f7, and f8 corresponding to the following 7 operations is obtained. Similarly, the variance value for each group of friction forces corresponding to the 7 operations of the switching device is subsequently obtained until this process reaches the most recent number of operations or the elapsed time.

[0269] By arranging the variance values ​​D obtained in the manner described above, where the abscissa indicates the number of operations of the switching device or the elapsed time, system data are obtained which are expressed in Fig. 7(b). In the Fig. From the system data shown in Figure 7(b), a clear regression line RL4 can be obtained, so that the remaining service life of the switching device 1 can be estimated.

[0270] In the Fig. The system data shown in Figure 7(b) are only the first system data, where the abscissa indicates the number of operations, and the second system data, where the abscissa indicates the elapsed time. However, the third system data, where the abscissa indicates the non-operational time of the switching device, can be obtained in a similar manner.

[0271] In the second embodiment according to the invention, in the flow chart according to Fig. 6A, in step S1, the following data is generated: first system data in which the variance values ​​D of the friction forces are plotted, the abscissa indicating the elapsed time during the operating period of the switching device; second system data in which the variance values ​​D of the friction forces are indicated, the abscissa indicating the number of operations of the switching device; and third system data in which the variance values ​​D of the friction forces are indicated, the abscissa indicating the non-operative time of the switching device.

[0272] Next, in steps S2 to S9, with operations similar to those in the first embodiment, estimated values ​​t1, t2, and t3 of the remaining life of the switching device 1 are calculated, and in step S13, the shortest estimated value among the calculated estimated values ​​of the remaining life is estimated as the remaining life of the switching device 1. Furthermore, in the case of Embodiment 2, steps S10 to S12 are not required.

[0273] In the case of the second embodiment, it can be estimated in the manner stated above whether the roughness of the surface of the sliding portion or the penetration of foreign matter into the sliding portion is the contributing factor for the deterioration of the switching device 1.

[0274] The switching device remaining life diagnostic device according to the second embodiment makes it possible to diagnose the development of deterioration and estimate the remaining life even in a case where the deterioration factor does not appear in any system data, namely, system data in which the measured state values ​​are plotted with the abscissa indicating time; system data in which the measured state values ​​are plotted with the abscissa indicating the number of operations; system data in which the measured state values ​​are plotted with the abscissa indicating the non-operational time; and system data in which the measured state values ​​are plotted with the abscissa indicating the accumulated operation time. Third embodiment

[0275] Fig. Fig. 8 shows a set of diagrams for explaining the diagnostic method and the diagnostic device for the remaining service life of a switching device according to the third embodiment of the invention. Fig. 8(a) is a diagram for explaining system data in which the friction forces F are plotted, wherein the abscissa indicates the elapsed time during a period after a time at which the switching device has started to operate.

[0276] Fig. Figure 8(b) shows a diagram for explaining system data in which friction forces F, which are measured state values, have been converted into state variables G using a transformation function Fcorr, where the state variables G are plotted, while the abscissa indicates the elapsed time.

[0277] Regarding the values ​​measured with a measuring unit, such as a current sensor, the condition values, such as friction force and operating time, are stored as physical values. These physical values ​​depend on the deterioration state of the switching device. However, their deterioration tendency differs depending on the structure of the switching device's drive mechanism. However, there are sometimes cases where the remaining service life cannot be accurately determined even if the deterioration tendency is directly estimated using measured physical values.

[0278] In the diagnostic method and device for the remaining service life of a switching device according to the third embodiment of the invention, a preliminary variation trend of physical values ​​is prepared as a function, specifically from the structure of the drive mechanism. From this function, a transformation function G = fcorr (F) is generated to transform a physical value as a state value related to the deterioration of the switching device 1 into a predetermined state value for evaluating the deterioration trend.

[0279] Physical values, as state values ​​recorded in historical state values ​​in the recording unit 52, are transformed into predetermined state values ​​using the transformation function G, and then the deterioration tendency is estimated using these transformed state values.

[0280] The values ​​that indicate the breaking behavior of a switching device include, for example, the movement speed of the contact at the time the switching device is opened, i.e., the breaking speed. If the movement speed of the moving contact increases, the breaking behavior deteriorates; therefore, the breaking speed can be defined as a state value that indicates the behavior or performance of the switching device, i.e., a state value that relates to the deterioration of the switching device.

[0281] In contrast, the friction force is assumed to be a state value obtained by practically measuring the operating state of the switching device 1. During the off-operation of the switching device 1, the movable contact 112 is moved by the contact pressure spring 220 and the electromagnetic force exerted by the electromagnetic actuator 12. Therefore, the operation of the movable contact 112 can be simply expressed according to the following equation (1): FT=m⋅a

[0282] Here, FT is a force exerted by the movable contact 112, with a value of the resultant force from the spring force of the contact pressure spring 220, the electromagnetic force exerted by the electromagnetic actuator 12, and the friction force exerted by the sliding portion. The value a represents the acceleration, and m is the weight of the movable part including the movable contact 112.

[0283] Let F0 be the component, among the components of the resultant force FT, consisting of the spring force and the electromagnetic force, which hardly changes over time, and let F be the component of the friction force, which changes over time, the following equation (2) is obtained. F0+F=m⋅a

[0284] There are two or more methods for determining the cut-off speed. For the purposes of this discussion, the cut-off speed v is defined as x1 / T1, based on the time T1 required for the movable contact 112 to move a distance x1. In this situation, x1 is given by the following equation (3). x1=1 / 2⋅a⋅T12

[0285] From this, the following equation (4) can be derived. v=x1 / T1=(1 / 2⋅a⋅x1)=(1 / 2)⋅(F0+F) / m⋅x1

[0286] The cut-off speed v changes approximately proportionally with the square root of the friction force F. Therefore, the transformation function G = fcorr (F) can be defined using equation (5) given below. fcorr=(1 / 2⋅(F0+F) / m⋅x1)

[0287] Accordingly, the friction force F is calculated in the system data, where the elapsed time is given along the abscissa, as shown in Fig. 8(a) is transformed into the state value G by the transformation function G according to equation (5) above. By arranging these state values ​​G, where the abscissa indicates the elapsed time T, the first system data according to Fig. 8(b). Based on this initial system data, a regression line is obtained. The remaining service life of switching device 1 can then be estimated.

[0288] In this example, the regression curve is a straight line. However, the regression curve is generally expressed by a polynomial function. The state value G obtained with the transformation described above has a strong correlation compared to a regression curve such as a polynomial function. Therefore, the remaining service life can be accurately estimated.

[0289] Furthermore, even for the same physical quantity, such as friction force, the transformation function for system data where the abscissa represents elapsed time, the transformation function for system data where the abscissa represents the number of operations or accumulated operating time, and the transformation function for system data where the abscissa represents non-operational time are different from each other. This is because the respective degradation factor models for the system data sets are different from each other.

[0290] Respective transformation functions are thus prepared for the system data sets. The following data are used: the first system data, in which predefined state values ​​G are plotted, which have been transformed using the corresponding transformation function, where the abscissa indicates the elapsed time; the second system data, in which the predefined state values ​​G are plotted, where the abscissa indicates the number of operations; and the third system data, in which the predefined state values ​​G are plotted, where the abscissa indicates the non-operational time. From this, the remaining service life of the switching device is estimated, so that an accurate diagnosis can be realized.

[0291] As in the case of the first embodiment according to Fig. 1, the condition monitoring device 5 receives current waveform data output from the current sensors 41 and 42, and based on the current waveform data, condition values ​​related to the deterioration state of the switching device 1 are estimated. That is, condition values ​​such as contact abrasion and wear values, friction forces at the time of driving, and the capacitance of the driving capacitor 3, which indicate the deterioration state of the switching device 1, are estimated. As mentioned above, the current sensors 41 and 42 measure the driving current twice or more at different times.

[0292] Thus, based on the respective current waveform data measured at two or more points in time, the state value estimation unit 51 estimates the previous state value indicating the deterioration state of the switching device 1 depending on the respective measurement points in time. The estimated state values ​​are recorded as historical data in the recording unit 52.

[0293] Next, when the remaining service life is estimated, the recorded historical data is read, and the state values ​​as physical values ​​are transformed into the predetermined state values ​​G using the transformation function G. Then, in step S1, according to Fig. 6A generates the following data: first system data in which the state values ​​G are plotted, where the abscissa indicates the elapsed time; second system data in which the state values ​​G are plotted, where the abscissa indicates the number of operations; and third system data in which the state values ​​G are plotted, where the abscissa indicates the non-operational time.

[0294] Thereafter, according to steps S2 to S13 in the flow charts according to Fig. 6A and Fig. 6B, the development situation of deterioration in the switching device 1 is diagnosed in the same manner as in the first embodiment, and the deterioration factor that caused the deterioration and the remaining life of the switching device 1 are estimated. The remaining life value estimated by the remaining life estimation unit 53 and the estimated deterioration factor in the switching device 1 are transmitted to the display unit 6, where they are displayed and notified to the maintenance personnel.

[0295] The switching device remaining life diagnostic device according to the third embodiment having the above-described configuration makes it possible to estimate the remaining life of a switching device more accurately. Fourth embodiment

[0296] Fig. 9 shows a schematic diagram for explaining a diagnostic device for the remaining service life of a switching device according to a fourth embodiment of the invention. In Fig. 9, three switching devices 1 are arranged in an electricity reception / distribution system which is a single installation.

[0297] Each of the switching devices 1 is constructed in the same manner as the switching device 1 according to the first embodiment. Each of the switching devices 1 includes a driving power source 2 and current sensors 41 and 42 as measuring units for measuring the performance characteristics of the respective switching devices 1, in the same manner as in the first embodiment.

[0298] The current sensors 41 and 42 output current waveform data of the measured drive currents as analog signals or digital signals and supply the data to the condition monitoring devices 5a, 5b, and 5c in the respective switching devices 1. Based on the current waveform data from the current sensors 41 and 42, the condition monitoring devices 5a, 5b, and 5c record, in a recording unit, the condition values ​​related to the deterioration of the respective switching devices 1 in the same manner as in the first embodiment, and estimate the remaining life and the deterioration factor.

[0299] Furthermore, the condition monitoring devices 5a, 5b, and 5c are connected to an overall monitoring device 50. The condition values ​​and the records of the remaining life estimation results held by the condition monitoring devices 5a, 5b, and 5c are copied to the overall monitoring device 50.

[0300] In the overall monitoring device 50, the entire data from the state value records obtained by copying in the state monitoring devices 5a, 5b, and 5c are integrated. Then, system data are configured, namely, system data in which the state values ​​are plotted with the abscissa indicating the elapsed time, or system data in which the state values ​​are plotted with the abscissa indicating the number of operations, and system data in which the state values ​​are plotted with the abscissa indicating the non-operational time, or system data in which the state values ​​are plotted with the abscissa indicating the number of operations.

[0301] Alternatively, system data are configured in which the condition values ​​are plotted, with the abscissa indicating the accumulated operating time, and the remaining service life of the entire switching device is estimated on the basis of at least one set of previous system data sets.

[0302] The remaining life of the switching device and the deterioration factor are determined in the same manner as in the first, second and third embodiments.

[0303] In the case of the above-mentioned switching device remaining life diagnosis apparatus according to the fourth embodiment, the remaining life of a switching device can be estimated among the two or more switching devices provided in one and the same electricity reception / distribution system, wherein the number of operations and the number of historical records are small. Fifth embodiment

[0304] Fig. Fig. 10 is a schematic diagram illustrating a diagnostic device for the remaining service life of a switching device according to a fifth embodiment of the invention. In this fifth embodiment, Fig. 10, the overall monitoring device 50 of the fourth embodiment is not provided. Instead, the condition monitoring device 5a functions as an overall monitoring device.

[0305] The remaining life of the switching device and the deterioration factor are estimated in the same manner as in the first, second and third embodiments.

[0306] The switching device remaining life diagnostic device according to the fifth embodiment makes it possible to eliminate the overall monitoring device 50, so that a diagnostic device can be realized at low cost. Sixth embodiment

[0307] Fig. Fig. 11 is a schematic diagram illustrating a diagnostic device for the remaining service life of a switching device according to a sixth embodiment of the invention. In this sixth embodiment, the condition monitoring devices 5a, 5b, and 5c, which are shown in the fourth embodiment according to Fig. 9 are not provided. Instead, the overall monitoring device 50 has the functions of the condition monitoring devices 5a, 5b, and 5c.

[0308] The remaining life of the switching device and the deterioration factor are estimated in the same manner as in the first, second and third embodiments.

[0309] The switching device remaining life diagnostic device according to the sixth embodiment makes it possible to omit the condition monitoring devices 5a, 5b, and 5c for the respective switching devices, so that a switching device remaining life diagnostic device can be realized at low cost. Seventh embodiment

[0310] In the cases according to the fourth, fifth and sixth embodiments described in Fig. 9, Fig. 10 and Fig. 11, in which two or more switching devices are provided in one and the same electricity reception / distribution system, there are cases where there is a switching device that has been frequently operated and for which sufficient historical state value data has been recorded, and a switching device that has not been frequently operated and for which sufficient historical state value data has not been recorded, or a switching device that has not been operated for a long period of time and for which no recent historical state value data exists.

[0311] In such a case, it is difficult to estimate the remaining service life of a switchgear for which there is little historical condition value data, or to make an estimate for a switchgear for which no recent historical condition value data exists. However, it is possible to assume that deterioration has progressed in approximately the same manner in all two or more switchgears in the same electricity receiving / distribution system.

[0312] Therefore, in the switching device remaining life diagnostic device according to the seventh embodiment of the invention, based on at least one set of system data for the switching device, among the two or more switching devices arranged in the same electricity reception / distribution system that have the largest number of operations, the remaining life of the other switching devices is estimated. The remaining life of the switching device and the deterioration factor are estimated in the same manner as in the first, second, and third embodiments.

[0313] Thus, in the case of the switching device remaining life diagnostic device according to the seventh embodiment of the invention, even if there is a switching device installed in one and the same electricity reception / distribution system and for which there is little historical state value data or even no historical state value data, the remaining life can be estimated for all the switching devices. Eighth embodiment

[0314] In the switching device remaining life diagnosis method and device according to the eighth aspect of the invention, only data based on measurements of the most recent N-times operations are extracted from the historical state value data, and then the following system data are generated: first system data in which the state values ​​are plotted, with the abscissa indicating the elapsed time; second system data in which the state values ​​are plotted, with the abscissa indicating the number of operations; third system data in which the state values ​​are plotted, with the abscissa indicating the non-operational time; and fourth system data in which the state values ​​are plotted, with the abscissa indicating the accumulated operation time.

[0315] On the basis of these system data sets, the remaining service life for the switching device 1 is estimated in the same way as in steps S2 to S9 and step S13 in the flow charts according to Fig. 6A and Fig. 6B has been explained in connection with the first embodiment.

[0316] In the eighth embodiment, in step S9, no corresponding deterioration trend is removed from the respective system data sets. Then, step S9 is followed by step S13, in which the smallest estimated value among two or more estimated remaining life values ​​is estimated as the remaining life for the switching device.

[0317] In the eighth embodiment, it is possible to calculate the respective variance values ​​of the state values ​​for every predetermined number of measurements based on historical state value data obtained from the most recent N-times operations of a switching device, as in the case of the second embodiment.

[0318] The following data is generated: first system data, in which the variance values ​​are plotted, with the abscissa indicating the elapsed time; second system data, in which the variance values ​​are arranged, with the abscissa indicating the number of operations of the switching device; third system data, in which the variance values ​​are plotted, with the abscissa indicating the inoperative time of the switching device; and fourth system data, in which the variance values ​​are plotted, with the abscissa indicating the accumulated operating time of the switching device. Then, based on at least one of the preceding system data sets, the remaining service life of the switching device is estimated.

[0319] Furthermore, in the eighth embodiment of the invention, on the basis of historical state value data obtained from the recent N-times operations of the switching device, as in the case of the third embodiment, the state values ​​can be transformed into predetermined state values ​​using a predetermined transformation function.

[0320] Then, the following data are generated: first system data in which the predetermined state values ​​are plotted, with the abscissa indicating the elapsed time; second system data in which the predetermined state values ​​are plotted, with the abscissa indicating the number of operations or the accumulated operating time; and third system data in which the predetermined state values ​​are plotted, with the abscissa indicating the non-operational time; or fourth system data in which the predetermined state values ​​are plotted, with the abscissa indicating the accumulated operating time of the switching device. Then, based on at least one of the preceding system data sets, the remaining service life of the switching device is estimated.

[0321] Furthermore, in the case of the fourth, fifth, sixth and seventh embodiments, the eighth embodiment can be applied to a case where two or more switching devices are provided in one and the same electricity reception / distribution system.

[0322] In the case of the switching device remaining life diagnostic device according to the eighth embodiment of the invention, even if it is difficult to start a deterioration tendency through a trend analysis at a time point at which the switching device has started to operate, it is possible to perform an analysis of the data of recent N-times operations to estimate the remaining life of the switching device. Ninth embodiment

[0323] As explained in connection with the first embodiment, abrasion, wear, and cracks of the sliding portion in the switching device 1 develop as the operation of the switching device continues. In cases where the contributing factor of deterioration in the sliding portion is abrasion, wear, and cracks of the sliding portion, the development of deterioration in the sliding portion greatly depends on the accumulated operation time obtained by summing the operation times of the switching device 1 and the number of operations of the switching device 1, as explained in connection with the first embodiment. The deterioration of the sliding portion develops continuously from the beginning from a time when the switching device 1 starts to operate.

[0324] Furthermore, roughness of the sliding portion of the switching device 1 is caused by scratches on the surface of the sliding portion caused by a certain factor. Scratches on the surface of the sliding portion become larger each time the switching device 1 repeats its opening / closing operation. Therefore, if the contributing factor to deterioration in the sliding portion is roughness in the sliding portion, frictional forces exerted each time the switching device 1 performs its opening / closing operation increase, such as the abrasion and wear of the sliding portion mentioned above, so that deterioration in the sliding portion progresses not only depending on the number of opening / closing operations of the switching device 1, but also depending on the accumulated operation time obtained by summing the opening / closing operation times of the switching device 1.

[0325] Fig. Figure 12 shows a set of diagrams for explaining cases in which the condition value is plotted with respect to the deterioration of the switching device 1, namely the friction force F, which is one of the deterioration factors caused by corrosion in the sliding portion, wherein the data are given based on historical condition value data in four different systems. The diagrams are in Fig. 12(a), Fig. 12(b) and Fig. 12(c) are the same as in the first embodiment.

[0326] Fig. 12(a) is a graph of first system data in which friction forces F, which are state values ​​related to deterioration in a switching device, are sequentially plotted, with the abscissa indicating the elapsed time T during the operation period of the switching device 1.

[0327] Fig. 12(b) is a graph of second system data in which the friction forces F are plotted sequentially, with the abscissa indicating the number of operations N during the operating period of the switching device 1.

[0328] Fig. 12(c) is a diagram of third system data in which the friction forces F are plotted sequentially, wherein the abscissa indicates the non-operative time nT during the operating period of the switching device 1.

[0329] Diagram 12(d) is a diagram of seventh system data in which the friction forces F are plotted sequentially, wherein the abscissa indicates the accumulated operating time AT during the operating time of the switching device 1.

[0330] In the diagnostic method and the diagnostic device for the remaining service life of a switching device according to the ninth embodiment of the invention, the following system data are generated: first system data in which the state values ​​relating to the deterioration of the switching device are plotted, the abscissa indicating the total elapsed time during a period after a time at which the switching device 1 started to operate; second system data in which the previous state values ​​are plotted, the abscissa indicating the total number of operations of the switching device during the period after the time at which the switching device 1 started to operate; third system data in which the previous state values ​​are plotted, the abscissa indicating the total non-operative time of the switching device during the period after the time at which the switching device 1 started to operate; fourth system data in which the previous state values ​​are plotted, wherein the abscissa indicates the total accumulated operating time of the switching device during the period after the time at which the switching device 1 started to operate; fifth system data in which the previous state values ​​are plotted, the abscissa indicating the most recent elapsed time during the operating period of the switching device; sixth system data in which the previous state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the period after the time at which the predetermined time period has elapsed; seventh system data in which the previous state values ​​are plotted, wherein the abscissa indicates the non-operative time of the switching device during the period after the time at which the predetermined period has elapsed; and eighth system data in which the previously determined state values ​​are plotted, wherein the abscissa indicates the accumulated operating time of the switching device during the period following the time at which the predetermined period has elapsed.

[0331] The remaining service life of the switching device is then estimated based on the generated system data sets.

[0332] In the switching device remaining life diagnosis method and device according to the ninth embodiment of the invention, the remaining life estimation unit 53 generates the previous system data sets and estimates the remaining life.

[0333] The following explains in detail the diagnostic method and operation sequence of the remaining life diagnostic device for a switching device according to the ninth embodiment of the invention. The description of the same components as in the first embodiment 1 is omitted.

[0334] The remaining life estimation unit 53 reads the historical state value data recorded in the recording unit 52. Based on the historical state value data, the remaining life estimation unit 53 generates the following data: first system data in which the state values ​​are plotted sequentially, with the abscissa indicating the elapsed time T from a time at which the switching device 1 started to operate; second system data in which the state values ​​are plotted, the abscissa indicating the number of operations N from a time at which the switching device 1 has started to operate; third system data in which the state values ​​are plotted, wherein the abscissa indicates the non-operative time nT from a point in time at which the switching device 1 has started to operate; and seventh system data in which the state values ​​are plotted, wherein the abscissa indicates the accumulated operation time AT obtained by accumulating the opening / closing operations from a time at which the switching device 1 has started to operate.

[0335] The remaining life estimation unit 53 then estimates the remaining life of the switching device 1 based on at least one of the system data sets. In the following description, the friction force F exerted on the sliding portion is used as the state value. However, it goes without saying that another state value may also be used.

[0336] The Fig. 13A and Fig. 13B are flowcharts for explaining the operation wherein the remaining life estimation unit 53 of the condition monitoring device 5 estimates the remaining life of the switching device 1 using the first to eighth system data by determining the deterioration tendency of the frictional force exerted on the switching device 1.

[0337] In Fig. 13A, first, in step S101, all the historical state value data stored in the recording unit 52 of the state monitoring device 5 are read. Then, the first system data is provided in which the friction forces F, which are state values ​​in the read historical state value data, are plotted, wherein the abscissa indicates the total elapsed time T during the period after a point in time in which the switching device 1 has started to operate. The first system data regarding the elapsed time corresponds to the first system data stored in Fig. 12(a).

[0338] Furthermore, in step S101, the second system data is provided, in which the friction forces F, which are state values ​​in the read-out historical state value data, are plotted, wherein the abscissa indicates the total number of operations N of the switching device 1 during a period after a time at which the switching device 1 has started to operate. The second system data corresponds to the second system data according to Fig. 12(b).

[0339] Furthermore, in step S101, the third system data are generated, in which the friction forces F, which are state values ​​in the read-out historical state value data, are plotted, wherein the abscissa indicates the total non-operative time nT of the switching device 1 during a period after a time in which the switching device 1 has started to operate. The third system data corresponds to the third system data in Fig. 12(c).

[0340] Furthermore, in step S101, the seventh system data is generated in which the friction forces F, which are state values ​​in the read-out historical state value data, are plotted, wherein the abscissa indicates the total accumulated operating time of the switching device 1 during a period after a time at which the switching device 1 started to operate. The seventh system data corresponds to the seventh system data in Fig. 12(d).

[0341] Next, in steps S102, S103, and S104, the same determinations as in steps S2, S3, and S4 of the first embodiment are performed. In step S105, it is determined whether a tendency is detected in the seventh system data in which the friction force F at a time point when the switching device 1 has started to operate deteriorates as the accumulated operating time ΔT increases.

[0342] In the determination implemented in step S105, in the case described in Fig. 12(d), a regression line RL4 is obtained, and if the correlation coefficient of the regression line RL4 is equal to or greater than a predetermined value and the gradient of the regression line RL4 is equal to or less than a predetermined value (or is equal to or greater than a predetermined value), then it is determined that a deterioration tendency of the friction force F has been detected. In other cases, it is determined that no deterioration tendency of the friction force F has been detected.

[0343] Next, in step S106, it is determined whether, in all the results of the determinations implemented in steps S102, S103, S104, and S105, a deterioration tendency of the shifting device 1 is recognized from the beginning in the friction force F. If, from all the results of the determinations implemented in steps S102, S103, S104, and S105, it is recognized that there is no deterioration tendency in the friction force F (YES), step S106 proceeds to step S111. If, in at least one of the results of the determinations implemented in steps S102, S103, S104, and S105, a deterioration tendency in the friction force F is recognized (NO), step S106 proceeds to step S107.

[0344] In step S107, it is determined whether a deterioration tendency in the friction force F has been detected in only one of the results of the determinations according to the implementations in steps S102, S103, S104, and S105. If it has been determined that a deterioration tendency in the friction force F exists in only one of the system data sets (YES), step S110 follows step S107. If it is determined that deterioration tendencies exist in two or more system data sets (NO), step S108 follows step S107.

[0345] If, in the steps described above, it is determined that deterioration tendencies of the friction force F are detected in two or more system data sets among the results of the determinations implemented in steps S102, S103, and S104, the flowchart proceeds to step S108. Step S109 then follows step S108.

[0346] In step S109, the estimated value of the remaining service life of the switching device 1 is calculated from the system data, namely among the two or more system data sets in which a deterioration tendency of the friction force F has been detected, which provide the largest correlation coefficient for a regression line.

[0347] In the following steps S110, S111, S112, S113, and S114, the same process flows as explained in steps S9, S10, S11, S12, and S13 of the first embodiment are implemented. Therefore, a detailed explanation of these process steps is omitted here. Tenth embodiment

[0348] In the diagnostic method and apparatus for the remaining life of a switching device according to the tenth embodiment of the invention, based on the accumulated historical state value data, the variance value of the state values ​​is calculated for each predetermined number of measurements, and then the following data is generated: first system data in which variance values ​​are plotted, the abscissa indicating the total elapsed time during a period after a point in time at which the switching device 1 has started to operate; second system data in which the variance values ​​are plotted, the abscissa indicating the total number of actuations of the switching device during the period after a time at which the switching device 1 has started to operate; third system data in which the variance values ​​are plotted, wherein the abscissa indicates the total non-operative time of the switching device during the period after a time at which the switching device 1 has started to operate; fourth system data in which the variance values ​​are plotted, wherein the abscissa indicates the total accumulated operating time of the switching device during the period after the time at which the switching device 1 started to operate; fifth system data in which the variance values ​​are plotted, the abscissa indicating the most recent elapsed time during the operating period of the switching device; Sixth system data in which the variance values ​​are plotted, the abscissa indicating the number of operations of the switching device during the period after the time at which the predetermined period has elapsed; Seventh system data in which the variance values ​​are plotted, the abscissa indicating the non-operational time of the switching device during the period after the time at which the predetermined period has elapsed; and Eighth system data in which the variance values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device during the period after the time at which the predetermined period has elapsed. Based on the generated system data sets, the remaining service life of the switching device is estimated.

[0349] The development situation of deterioration in the switching device 1 is diagnosed in the same manner as in the ninth embodiment, so that the deterioration factor that caused the deterioration and the remaining life of the switching device 1 are estimated. The value of the remaining life estimated by the remaining life estimation unit 53 and the estimated deterioration factor in the switching device 1 are transmitted to the display unit 6, where they are displayed and notified to the maintenance personnel. Eleventh embodiment

[0350] In the switching device remaining life diagnostic method and device according to the eleventh embodiment of the invention, the state values ​​in the accumulated historical state value data are transformed into predetermined state values ​​using a predetermined transformation function. Then, the following data is generated: first system data in which the predetermined state values ​​are plotted, wherein the abscissa indicates the total elapsed time during the period after a point in time at which the switching device 1 has started to operate; second system data in which the predetermined state values ​​are plotted, wherein the abscissa indicates the total number of operations of the switching device during the period after the time at which the switching device 1 started to operate; third system data in which the predetermined state values ​​are plotted, wherein the abscissa indicates the total non-operative time of the switching device during the period after the time at which the switching device started to operate; fourth system data in which the predetermined state values ​​are plotted, wherein the abscissa indicates the total accumulated operating time of the switching device during the period after the time at which the switching device started to operate; fifth system data in which the predetermined state values ​​are plotted, the abscissa indicating the most recently elapsed time during the operating period of the switching device; sixth system data in which the predetermined state values ​​are plotted, the abscissa indicating the number of operations of the switching device during the period after the time at which the predetermined period has elapsed; seventh system data in which the predetermined state values ​​are plotted, wherein the abscissa indicates the non-operative time of the switching device during the period after the time at which the predetermined period has elapsed; and eighth system data in which the previous predetermined state values ​​are plotted, wherein the abscissa indicates the accumulated operating time of the switching device during the period after the time at which the predetermined period has elapsed. Then, based on the generated system data sets, the remaining service life of the switching device is estimated.

[0351] The development situation of deterioration in the switching device 1 is diagnosed in the same manner as in the ninth embodiment, so that the deterioration factor that caused the deterioration and the remaining life of the switching device 1 are estimated. The remaining life value estimated by the remaining life estimation unit 53 and the estimated deterioration factor in the switching device 1 are transmitted to the display unit 6, where they are displayed and notified to the maintenance personnel. Industrial applicability

[0352] A switching device remaining life diagnostic device according to the invention can be applied to electricity supply switching devices or the like which drives the movable contact of a circuit breaker such as a vacuum valve using a driving mechanism such as an electromagnetic actuator to open or close an electricity supply circuit. Brief description of the drawings Fig. 1 is a schematic diagram illustrating a switching device remaining life diagnostic device according to a first embodiment of the invention; Fig. 2 is a block diagram showing the configuration of a condition monitoring device in a switching device remaining life diagnostic device according to the first embodiment of the invention; Fig. Figure 3 shows a set of diagrams illustrating a case where the friction force F caused by corrosion in a sliding zone provides data in three different systems; Fig. Figure 4 shows a set of diagrams illustrating a case where the friction force F caused by wear, abrasion and cracks in a sliding zone provides the data in three different systems; Fig. Figure 5 shows a set of diagrams illustrating a case where the friction force F caused by the solidification of a lubricant provides the data in three different systems based on historical state value data; Fig. 6A and Fig. 6B shows a flowchart for explaining the operation of a switching device remaining life diagnostic device according to the first embodiment of the invention; Fig. 7 shows a set of schematic diagrams for explaining a diagnostic device for the remaining service life of a switching device according to a second embodiment of the invention; Fig. 8 shows a set of schematic diagrams for explaining a diagnostic device for the remaining life of a switching device according to a third embodiment of the invention; Fig. 9 is a schematic diagram for explaining a switching device remaining life diagnostic device according to a fourth embodiment of the invention; Fig. 10 is a schematic diagram for explaining a switching device remaining life diagnostic device according to a fifth embodiment of the invention; Fig. 11 is a schematic diagram for explaining a switching device remaining life diagnostic device according to a sixth embodiment of the invention; Fig. Figure 12 shows a set of diagrams to illustrate a case where the friction force provides data in four different systems; and Fig. 13A and Fig. 13B shows a flowchart for explaining the operation of a switching device remaining life diagnostic device according to a ninth embodiment of the invention.

Claims

[1] A diagnostic method for the remaining service life of a switching device, wherein performance characteristics of the switching device (1) are obtained with a measuring unit (41, 42) and then used as historical condition value data relating to a deterioration state of the switching device (1), are estimated with a condition value estimation unit (51) on the basis of measurement data obtained by the measuring unit (41, 42); wherein, on the basis of the historical condition value data, a remaining service life estimation unit (53) generates two or more sets of data series, namely - data series in which the state values ​​are plotted, the abscissa indicating the elapsed time during an operating period of the switching device (1); - data series in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device (1) during the operating period of the switching device (1); - data series in which the state values ​​are plotted, the abscissa indicating the non-operative time of the switching device (1) during the operating period of the switching device (1); and - data series in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device (1) during the operating time of the switching device (1); wherein, on the basis of the data series among the generated two or more data series sets for which the correlation between the abscissa values ​​of the generated data series sets and the state values ​​corresponding to the respective abscissa values ​​is the strongest, a first deterioration tendency of the switching device (1) is determined; wherein a first estimated value of the remaining service life of the switching device (1) is calculated on the basis of the first deterioration tendency; wherein the first deterioration trend is removed from the generated two or more data series sets; wherein a second deterioration tendency is determined on the basis of the data series from the two or more data series sets from which the first deterioration tendency has been removed, for which the correlation between the abscissa values ​​of the data series sets from which the first deterioration tendency has been removed and the condition values ​​corresponding to the respective abscissa values ​​is the strongest; wherein a second estimated value of the remaining service life of the switching device (1) is calculated on the basis of the second deterioration tendency; and wherein the remaining service life of the switching device (1) is then determined at least on the basis of the first estimated value and the second estimated value of the remaining service life. [2] The method of claim 1, wherein the estimation of the remaining lifetime is repeated until there is no deterioration tendency of the switching device (1) in the data series having the strongest correlation, and wherein the number of remaining lifetime estimates is the same as the number of data series sets generated. [3] A method according to any one of claims 1 to 2, wherein the estimation of the remaining lifetime is performed using the difference between the generated data series and a regression line or a regression curve based on the generated data series. [4] Diagnosis device for the remaining service life of a switching device for diagnosing the remaining service life of a switching device (1) which drives a movable contact (112) with a drive mechanism (12) so that the movable contact (112) makes contact with or is separated from a stationary contact (111) in order to open or close an electrical circuit (101, 102), the device comprising: - a measuring unit (41, 42) for measuring performance characteristics of the switching device (1); - a state value estimation unit (51) for estimating state values ​​relating to a deterioration state of the switching device (1) on the basis of measurement data obtained by the measuring unit (41, 42); - a recording unit (52) for recording state values ​​estimated by the state value estimation unit (51) as historical state value data; and - a remaining life estimation unit (53) for estimating the remaining life of the switching device (1) on the basis of the historical state value data recorded in the recording unit (52), wherein the remaining life estimation unit (53) generates two or more data series sets based on the historical state value data from the - data series in which the state values ​​are plotted, the abscissa indicating the elapsed time during an operating period of the switching device (1); - data series in which the state values ​​are plotted, the abscissa indicating the number of operations of the switching device (1) during the operating period of the switching device (1); - data series in which the state values ​​are plotted, the abscissa indicating the non-operative time of the switching device (1) during the operating period of the switching device (1); and - data series in which the state values ​​are plotted, the abscissa indicating the accumulated operating time of the switching device (1) during the operating time of the switching device (1); wherein a first deterioration tendency of the switching device (1) is determined on the basis of the data series from the generated two or more data series sets in which the correlation between the abscissa values ​​of the generated data series sets and the state values ​​corresponding to the respective abscissa values ​​becomes strongest; wherein a first estimated value for the remaining service life of the switching device (1) is calculated on the basis of the first deterioration tendency; wherein the extracted first deterioration trend is removed from the generated two or more data series sets; wherein a second deterioration tendency is determined on the basis of the data series from the two or more data series sets from which the first deterioration tendency has been removed, at which the correlation between the abscissa values ​​of the data series sets from which the first deterioration tendency has been removed and the condition values ​​corresponding to the respective abscissa values ​​becomes strongest; wherein a second estimated value for the remaining service life of the switching device (1) is calculated on the basis of the second deterioration tendency; and wherein the remaining service life of the switching device (1) is then determined at least on the basis of the first estimated value and the second estimated value of the remaining service life. [5] The apparatus of claim 4, wherein the estimation of the remaining lifetime is repeated until no deterioration tendency of the switching device (1) exists in the data series having the strongest correlation, and wherein the number of remaining lifetime estimation values ​​is the same as the number of data series sets generated. [6] Apparatus according to any one of claims 4 or 5, wherein the estimation of the remaining lifetime is performed using a correlation function based on the generated data series. [7] Device according to claim 4, wherein a plurality of switching devices (1) are present in one and the same installation; and wherein the remaining life estimation unit (53) generates the two or more sets of data series for the switching device (1) among the plurality of switching devices that have been operated the most, and estimates the remaining life of the other switching devices (1) on the basis of the generated sets of data series.

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