Crystalline forms of a bet inhibitor

Abstract

Provided herein are crystalline forms of a bromodomain and extraterminal domain (BET) inhibitor, compositions thereof, methods of preparation thereof, and methods of use thereof.

Description

CRYSTALLINE FORMS OF A BET INHIBITORCROSS-REFERENCE TO RELATED APPLICATIONS

[0001] This application claims priority to and benefit of U.S. Provisional Application No. 63 / 578,834 filed August 25, 2023, the disclosure of which is hereby incorporated herein by reference in its entirety.FIELD

[0002] Provided herein are crystalline forms of a bromodomain and extraterminal domain (BET) inhibitor, compositions thereof, methods of preparation thereof, and methods of use thereof.BACKGROUND

[0003] Epigenetic dysregulation has a crucial role in driving aberrant gene expressions leading to various types of cancers. Many components involved in epigenetic regulation have been attractive targets for therapeutic interventions. Among them, the bromodomain and extra- terminal (BET) family of proteins attracted much attention in recent years. The BET family proteins include BRD2, BRD3, BRD4, and the testis-specific BRDT. Via their bromodomains (BRDs), they bind with a high affinity to acetylation motifs, including acetylated histones in chromatin, thereby regulating gene transcription. The genes regulated by BET family proteins include many important oncogenes responsible for cell survival and cell cycle progression.

[0004] BET proteins are emerging targets in cancer, directly regulating the expression of oncogenes in hematological and solid tumors. BRD4, in addition to occupying gene promoters, has a strong preference for enhancers and super-enhancers in key driver genes such as c-MYC (Loven et al, Cell 2013; 153(2):320-34). BET family proteins have also been implicated in mediating acute inflammatory responses through the canonical NF -KB pathway (Huang et al., Mol. Cell. Biol. 29: 1375-1387 (2009)) resulting in the upregulation of genes associated with the production of cytokines (Nicodeme et al., Nature 468: 1119-1123, (2010)). In addition, bromodomain function has been implicated in kidney disease (Zhang, et al., J. Biol. Chem. 287: 28840-28851 (2012)). BRD2 function has also been linked to a predisposition for dyslipidemia or improper regulation of adipogenesis, elevated inflammatory profiles and increased susceptibility to autoimmune diseases (Denis, Discovery Medicine 10: 489-499 (2010)). The human immunodeficiency virus utilizes BRD4 to initiate transcription of viral RNA from stably integrated viral DNA (Jang et al., Mol. Cell, 19: 523-534 (2005)). BET bromodomain inhibitors have also been shown to reactivate HIV transcription in models of latent T cell infection and latent monocyte infection (Banerjee, et al., J. Leukocyte Biol, doi: 10.1189 / jlb.O312165). BRDT has an important role in spermatogenesis (Matzuk, et al., Cell 150: 673-684 (2012)).

[0005] The development of therapies, including combination therapies, for treatment of cancers using BET inhibitors is potentially desirable; the development of therapies for treatment of chemotherapeutic-resistant cancers or cancers which may develop chemotherapeutic resistance is highly desirable. US Patent Publication No. US2021 / 0002293 Al or PCT Publication No. W02021 / 003310 Al, which is hereby incorporated by reference in its entirety, discloses A-ethyl-7-(2-(4-fluoro-2,6-dimethylphenoxy)-5-(2-hydroxypropan-2- yl)phenyl)-5-methyl-4-oxo-4,5-dihydrothieno[3,2-c]pyridine-2-carboxamide (hereinafter “Compound of Formula (I)”) having the structure shown below,which is a BD2-selective BET inhibitor that inhibits BRD4 (BRD4-BD1 IC50 = 2922 nM; BRD4-BD2 IC50 = 2 nM). Without being bound by theory, BD1 inhibition may disrupt steady state gene expression and cause toxicity. BD2 inhibition may prevent BET proteins from being associated with histones and is effective in models of cancer diseases. BD2 selectivity may block the ability of cancer cells to induce resistance pathways and increase tolerability by avoiding BD1 inhibition.

[0006] Crystalline forms of Compound of Formula (I) are disclosed herein. The crystalline forms disclosed herein may provide the advantages of bioavailability and stability and may be suitable for use as an active agent in a pharmaceutical composition. Variations in the crystal structure of a pharmaceutical drug substance may affect the dissolution rate (which may affect bioavailability, etc.), manufacturability (e.g., ease of handling, ease of purification, ability to consistently prepare doses of known strength, etc.) and stability (e.g., thermal stability, shelf life (including resistance to degradation), etc.) of a pharmaceutical drug product. Such variations may affect the methods of preparation or formulation of pharmaceutical compositions in different dosage or delivery forms, such as solid oral dosageforms including tablets and capsules. Compared to other forms such as non-crystalline or amorphous forms, crystalline forms may provide desired or suitable hygroscopicity, particle size control, dissolution rate, solubility, purity, physical and chemical stability, manufacturability, yield, reproducibility, and / or process control. Thus, the crystalline forms disclosed herein may provide advantages of improving the manufacturing process of an active agent or the stability or storability of a drug product form of the active agent, or having suitable bioavailability and / or stability as an active agent.BRIEF SUMMARY

[0007] In one aspect, provided herein is a crystalline form of Compound of Formula (I), as disclosed herein.

[0008] In another aspect, provided herein is a method of preparing a crystalline form of Compound of Formula (I), as disclosed herein.

[0009] In another aspect, provided herein is a composition, comprising a crystalline form of Compound of Formula (I), such as a pharmaceutical composition comprising a crystalline form of Compound of Formula (I), as disclosed herein.

[0010] In another aspect, provided herein is a kit comprising a crystalline form of Compound of Formula (I), as disclosed herein.

[0011] In another aspect, provided is a method of treating a proliferative disorder such as cancer in an individual in need thereof, comprising administering to the individual a therapeutically effective amount of a crystalline form of Compound of Formula (I), as detailed herein. Also provided is a method of modulating BET in an individual, comprising administering to the individual a crystalline form of Compound of Formula (I), as detailed herein. Also provided is a crystalline form of Compound of Formula (I), as detailed herein, for use in therapy. Also provided is a crystalline form of Compound of Formula (I), as detailed herein, for use in a method of treating a proliferative disorder such as cancer. Also provided is use of a crystalline form of Compound of Formula (I), as detailed herein, in the manufacture of a medicament for treating a proliferative disorder such as cancer.BRIEF DESCRIPTION OF THE DRAWINGS

[0012] FIG. 1 A shows an X-ray powder diffraction (XRPD) pattern of an anhydrous crystalline form of Compound of Formula (I) (Form I).

[0013] FIG. IB shows differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA) graphs of Form I.

[0014] FIG. 1C shows a dynamic vapor sorption (DVS) graph of Form I.

[0015] FIG. ID shows an XRPD overlay of Di-DCM solvate at 223K, Di-DCM solvate at ambient, and desolvated Di-DCM solvate.

[0016] FIG. 2A shows an XRPD overlay of crystalline forms (from bottom to top: Form I, Form II, Form III, Form IV, Form V, Form VI, Form VII, Form VIII, Form IX, Form X, Form XI).

[0017] FIG. 2B shows DSC and TGA graphs of Form II.

[0018] FIG. 2C shows a DVS graph of Form II.

[0019] FIG. 3 shows an XRPD overlay of crystalline forms obtained by slurrying Compound of Formula (I) in MTBE, 2-MeTHF, and Toluene.

[0020] FIG. 4 shows a simulated XRPD pattern of the mono-acetone solvate.

[0021] FIG. 5 shows DSC and TGA graphs of Form X.

[0022] FIG. 6 A shows an XRPD pattern of a cumene solvate of Compound of Formula (I) (Form XI).

[0023] FIG. 6B shows DSC and TGA graphs of Form XI.

[0024] FIG. 7 A shows an XRPD pattern of a heptane solvate of Compound of Formula (I) (Form XII).

[0025] FIG. 7B shows DSC and TGA graphs of Form XII.

[0026] FIG. 8 A shows an XRPD pattern of a DMSO solvate of Compound of Formula (I) (Form XIII).

[0027] FIG.8B shows DSC and TGA graphs of Form XIII.

[0028] FIG. 9A shows an XRPD pattern of a methyl ethyl ketone solvate of Compound of Formula (I) (Form XIV).

[0029] FIG. 9B shows DSC and TGA graphs of Form XIV.DETAILED DESCRIPTIONDefinitions

[0030] As used herein, unless clearly indicated otherwise, use of the terms “a”, “an” and the like refers to one or more.

[0031] As used herein, reference to “about” a value or parameter herein includes (and describes) embodiments that are directed to that value or parameter per se. For example, description referring to “about X” includes description of “X”. As used herein, and unless otherwise specified, the terms “about” and “approximately,” when used in connection with doses, amounts, or weight percent of ingredients of a composition or a dosage form, mean a dose, amount, or weight percent that is recognized by those of ordinary skill in the art to provide a pharmacological effect equivalent to that obtained from the specified dose, amount, or weight percent. Specifically, the terms “about” and “approximately,” when used in this context, contemplate a dose, amount, or weight percent within 20%, within 15%, within 10%, within 5%, within 4%, within 3%, within 2%, within 1%, or within 0.5% of the specified dose, amount, or weight percent. Similarly, the terms “about” and “approximately,” when used in connection with a numeric value or range of values, indicate that the numeric value or range of values may vary within 20%, within 15%, within 10%, within 5%, within 4%, within 3%, within 2%, within 1%, or within 0.5% of the specified value or range.

[0032] As used herein, the term “crystalline form” refers to a crystalline solid form of a chemical compound, including, but not limited to, a single-component or multiple-component crystal form, e.g., a polymorph of a compound; or a solvate, a hydrate, a clathrate, a cocrystal, a salt of a compound, or a polymorph thereof. The term “crystal forms” and related terms herein refers to the various crystalline modifications of a given substance, including, but not limited to, polymorphs, solvates, hydrates, co-crystals and other molecular complexes, as well as salts, solvates of salts, hydrates of salts, other molecular complexes of salts, and polymorphs thereof. Crystal forms of a substance can be obtained by a number of methods, as known in the art. Such methods include, but are not limited to, melt recrystallization, melt cooling, solvent recrystallization, recrystallization in confined spaces such as, e.g., in nanopores or capillaries, recrystallization on surfaces or templates such as, e.g., on polymers, recrystallization in the presence of additives, such as, e.g., co-crystal counter-molecules, desolvation, dehydration, rapid evaporation, rapid cooling, slow cooling, vapor diffusion, sublimation, grinding and solvent-drop grinding.

[0033] Unless clearly indicated otherwise, “an individual” as used herein intends a mammal, including but not limited to a primate, human, bovine, horse, feline, canine, or rodent. In one variation, the individual is a human.

[0034] As used herein, “treatment” or “treating” is an approach for obtaining beneficial or desired results including clinical results. Beneficial or desired results include, but are not limited to, one or more of the following: decreasing one more symptoms resulting from the disease, diminishing the extent of the disease, stabilizing the disease (e.g., preventing or delaying the worsening of the disease), preventing or delaying the spread of the disease, delaying the occurrence or recurrence of the disease, delay or slowing the progression of the disease, ameliorating the disease state, providing a remission (whether partial or total) of the disease, decreasing the dose of one or more other medications required to treat the disease, enhancing effect of another medication, delaying the progression of the disease, increasing the quality of life, and / or prolonging survival. The methods of the invention contemplate any one or more of these aspects of treatment.

[0035] As used herein, the term “effective amount” intends such amount of a compound or crystalline form of the invention which should be effective in a given therapeutic form. As is understood in the art, an effective amount may be in one or more doses, z.e., a single dose or multiple doses may be required to achieve the desired treatment endpoint. An effective amount may be considered in the context of administering one or more therapeutic agents (e.g., a compound or crystalline form), and a single agent may be considered to be given in an effective amount if, in conjunction with one or more other agents, a desirable or beneficial result may be or is achieved. Suitable doses of any of the co-administered compounds or crystalline forms may optionally be lowered due to the combined action (e.g., additive or synergistic effects) of the compounds or crystalline forms.

[0036] As used herein, a “therapeutically effective amount” refers to an amount of a compound or crystalline form sufficient to produce a desired therapeutic outcome. It is understood that “therapeutically effective amount” and “effective amount” may be used interchangeably.

[0037] As used herein, “unit dosage form” refers to physically discrete units, suitable as unit dosages, each unit containing a predetermined quantity of active ingredient calculated to produce the desired therapeutic effect in association with the required pharmaceutical carrier. Unit dosage forms may contain a single or a combination therapy.

[0038] As used herein, the term “controlled release” refers to a drug-containing formulation or fraction thereof in which release of the drug is not immediate, z.e., with a “controlled release” formulation, administration does not result in immediate release of the drug into an absorption pool. The term encompasses depot formulations designed to gradually release the drug compound or crystalline form over an extended period of time. Controlled release formulations can include a wide variety of drug delivery systems, generally involving mixing the drug compound or crystalline form with carriers, polymers or other compounds having the desired release characteristics (e.g., pH-dependent or non-pH- dependent solubility, different degrees of water solubility, and the like) and formulating the mixture according to the desired route of delivery (e.g., coated capsules, implantable reservoirs, injectable solutions containing biodegradable capsules, and the like).

[0039] As used herein, by “pharmaceutically acceptable” or “pharmacologically acceptable” is meant a material that is not biologically or otherwise undesirable, e.g., the material may be incorporated into a pharmaceutical composition administered to a patient without causing any significant undesirable biological effects or interacting in a deleterious manner with any of the other components of the composition in which it is contained. Pharmaceutically acceptable carriers or excipients have preferably met the required standards of toxicological and manufacturing testing and / or are included on the Inactive Ingredient Guide prepared by the U.S. Food and Drug Administration.

[0040] The term “excipient” as used herein means an inert or inactive substance that may be used in the production of a drug or pharmaceutical, such as a tablet containing a compound of the invention as an active ingredient. Various substances may be embraced by the term excipient, including without limitation any substance used as a binder, disintegrant, coating, compression / encapsulation aid, cream or lotion, lubricant, solutions for parenteral administration, materials for chewable tablets, sweetener or flavoring, suspending / gelling agent, or wet granulation agent. Binders include, e.g., carbomers, povidone, xanthan gum, etc.; coatings include, e.g., cellulose acetate phthalate, ethylcellulose, gellan gum, maltodextrin, enteric coatings, etc.; compression / encapsulation aids include, e.g., calcium carbonate, dextrose, fructose de (de = “directly compressible”), honey de, lactose (anhydrate or monohydrate; optionally in combination with aspartame, cellulose, or microcrystalline cellulose), starch de, sucrose, etc.; disintegrants include, e.g., croscarmellose sodium, gellan gum, sodium starch glycolate, etc.; creams or lotions include, e.g., maltodextrin, carrageenans, etc.; lubricants include, e.g., magnesium stearate, stearic acid, sodium stearylfumarate, etc.; materials for chewable tablets include, e.g., dextrose, fructose de, lactose (monohydrate, optionally in combination with aspartame or cellulose), etc.; suspending / gelling agents include, e.g., carrageenan, sodium starch glycolate, xanthan gum, etc.; sweeteners include, e.g., aspartame, dextrose, fructose de, sorbitol, sucrose de, etc.; and wet granulation agents include, e.g., calcium carbonate, maltodextrin, microcrystalline cellulose, etc.

[0041] Unless otherwise stated, “substantially pure” intends a composition that contains no more than about 10% impurity, such as a composition comprising less than about 9%, about 7%, about 5%, about 3%, about 1%, or about 0.5% impurity.

[0042] As used herein, the term “substantially as shown in” when referring, for example, to an XRPD pattern, a DSC graph, a TGA graph, or a DVS graph, includes a pattern or graph that is not necessarily identical to those depicted herein, but that falls within the limits of experimental error or deviations when considered by one of ordinary skill in the art.

[0043] It is understood that aspects and embodiments described herein as “comprising” include “consisting of’ and “consisting essentially of’ embodiments.Crystalline Forms

[0044] Crystalline forms of a Compound of Formula (I) are provided herein. In some embodiments, the crystalline form is a hydrate of a Compound of Formula (I). In some embodiments, the crystalline form is a solvate of a Compound of Formula (I). In some embodiments, the crystalline form of a Compound of Formula (I) is anhydrous. Also provided are crystalline forms of Compound of Formula (I) prepared by a process detailed herein.Form I

[0045] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form I).

[0046] In some embodiments, Form I is substantially anhydrous (e.g., containing less than about 2%, about 1%, about 0.5%, about 0.1%, or about 0.01% of water by weight). In some embodiments, Form I is anhydrous. In some embodiments, Form I is anhydrous and is not a solvate. In some embodiments, Form I is prepared by de-solvation of a di-DCM solvate.

[0047] In some embodiments, Form I has an XRPD pattern substantially as shown in FIG. 1 A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 1.TABLE 1

[0048] In some embodiments, Form I has an XRPD pattern comprising peaks provided in Table 1. In some embodiments, Form I has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 1A, or as provided in Table 1. It should be understood that relative intensities and peak assignments can vary depending on a number of factors, including sample preparation, mounting, the instrument and analytical procedure and settings used to obtain the spectrum, temperature effects on the unit cell, and extent of solvation, e.g., hydration, of the sample. For example, relative peak intensities and peak assignments disclosed herein for all crystalline forms (including Form I, Form II, Form III, Form IV, Form V, Form VI, Form VII, Form VIII, Form IX, Form X, Form XI, Form XII, Form XIII, Form XIV) can vary within experimental error. In some embodiments, each peak assignment listed herein, including for Form I, can independently vary by ±0.4 degrees, ±0.3 degrees, ±0.2 degrees, or ±0.1 degrees 2-theta. In some embodiments, each peak assignment listed herein can independently vary by ±0.4 degrees 2-theta. In some embodiments, each peak assignment listed herein can independently vary by ±0.3 degrees 2-theta. In some embodiments, each peak assignment listed herein can independently vary by ±0.2 degrees 2- theta. In some embodiments, each peak assignment listed herein can independently vary by ±0.1 degrees 2-theta. It is also understood that an XRPD pattern substantially as shown in any XRPD pattern disclosed herein such as FIG. 1 A encompasses an XRPD pattern in which thepeak intensities of the one or more peaks differ from those of the corresponding peaks in the XRPD pattern.

[0049] In some embodiments, Form I has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 1, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein, as measured by Cu Ka radiation. For example, Form I may have an XRPD pattern comprising peaks each assigned at an angle 2-theta in degrees of about 6.1 (e.g. 6.1 ±0.2), about 8.5 (e.g. 8.5 ±0.2), about 10.0 (e.g. 10.0 ±0.2), about 11.6 (e.g. 11.6 ±0.2), about 14.2 (e.g. 14.2 ±0.2), about 17.0 (e.g. 17.0 ±0.2), about 18.3 (e.g. 18.3 ±0.2), about 23.4 (e.g. 23.4 ±0.2), and / or about 24.9 (e.g. 24.9 ±0.2). In some embodiments, Form I has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 6.1 (e.g. 6.1 ±0.2), about 8.5 (e.g. 8.5 ±0.2), about 10.0 (e.g. 10.0 ±0.2), about 11.6 (e.g. 11.6 ±0.2), about 14.2 (e.g. 14.2 ±0.2), about 17.0 (e.g. 17.0 ±0.2), about 18.3 (e.g. 18.3 ±0.2), about 18.5 (e.g. 18.5 ±0.2), about 23.4 (e.g. 23.4 ±0.2), and / or about 24.9 (e.g. 24.9 ±0.2). In some embodiments, Form I has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.1 (e.g. 6.1 ±0.2), about 8.5 (e.g. 8.5 ±0.2), about 11.6 (e.g. 11.6 ±0.2), about 17.0 (e.g. 17.0 ±0.2), and / or about 23.4 (e.g. 23.4 ±0.2). In some embodiments, Form I has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.1 (e.g. 6.1 ±0.2), about 8.5 (e.g. 8.5 ±0.2), and / or about 17.0 (e.g. 17.0 ±0.2). In some embodiments, Form I has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.1 (e.g. 6.1 ±0.2) and / or about 8.5 (e.g.8.5 ±0.2). In some embodiments, Form I has an XRPD pattern comprising a peak assigned at 2-theta values in degrees of about 6.1 (e.g. 6.1 ±0.2). In some embodiments, Form I has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.1 (e.g.6.1 ±0.2), about 8.5 (e.g. 8.5 ±0.2), about 10.0 (e.g. 10.0 ±0.2), about 11.6 (e.g. 11.6 ±0.2), and / or about 14.2 (e.g. 14.2 ±0.2).

[0050] In some embodiments, Form I has a DSC graph substantially as shown in FIG. IB. In some embodiments, Form I is characterized as having an endotherm onset at about 154.8 °C (e.g. 154.8 ±10 °C, 154.8 ±9 °C, 154.8 ±8 °C, 154.8 ±7 °C, 154.8 ±6 °C, 154.8 ±5 °C, 154.8 ±4 °C, 154.8 ±3 °C, 154.8 ±2 °C, 154.8 ±1 °C, or 154.8 ±0.5 °C). In some embodiments, Form I is characterized as having an endotherm peak at about 163.1 °C (e.g.163.1 ±10 °C, 163.1 ±9 °C, 163.1 ±8 °C, 163.1 ±7 °C, 163.1 ±6 °C, 163.1 ±5 °C, 163.1 ±4°C, 163.1 ±3 °C, 163.1 ±2 °C, 163.1 ±1 °C, or 163.1 ±0.5 °C), as determined by DSC. In some embodiments, Form I has a TGA graph substantially as shown in FIG. IB.

[0051] In some embodiments, Form I has a DVS graph substantially as shown in FIG.1C. In some embodiments, Form I is characterized as showing water uptake of about 2.7 wt% (e.g., 2.7±0.2 wt%, 2.7±0.1 wt%, 2.7±0.09 wt%, 2.7±0.08 wt%, 2.7±0.07 wt%, 2.7±0.06 wt%, 2.7±0.05 wt%, 2.7±0.04 wt%, 2.7±0.03 wt%, 2.7±0.02%, or 2.7±0.01 wt%) at about 80% relative humidity at room temperature, as determined by DVS.

[0052] In some embodiments of Form I, at least one, at least two, at least three, at least four, at least five, at least six, at least seven, or all of the following (a)-(h) apply:(a) Form I has an XRPD pattern, as measured by Cu Ka radiation, comprising(i) a peak assigned at 2-theta value in degrees of about 6.1 (e.g. 6.1 ±0.2) ,(ii) peaks each assigned at 2-theta values in degrees of about 6.1 (e.g. 6.1 ±0.2) and / or about 8.5 (e.g. 8.5 ±0.2),(iii) peaks each assigned at 2-theta values in degrees of about 6.1 (e.g. 6.1 ±0.2), about 8.5 (e.g. 8.5 ±0.2), and / or about 17.0 (e.g. 17.0 ±0.2),(iv) peaks each assigned at 2-theta values in degrees of about 6.1 (e.g. 6.1 ±0.2), about8.5 (e.g. 8.5 ±0.2), about 11.6 (e.g. 11.6 ±0.2), about 17.0 (e.g. 17.0 ±0.2), and / or about 23.4 (e.g. 23.4 ±0.2),(v) peaks each assigned at 2-theta values in degrees of about 6.1 (e.g. 6.1 ±0.2), about8.5 (e.g. 8.5 ±0.2), about 10.0 (e.g. 10.0 ±0.2), about 11.6 (e.g. 11.6 ±0.2), about 14.2 (e.g. 14.2 ±0.2), about 17.0 (e.g. 17.0 ±0.2), about 18.3 (e.g. 18.3 ±0.2), about 23.4 (e.g. 23.4 ±0.2), and / or about 24.9 (e.g. 24.9 ±0.2), or(vi) peaks each assigned at 2-theta values in degrees of about 6.1 (e.g. 6.1 ±0.2), about8.5 (e.g. 8.5 ±0.2), about 10.0 (e.g. 10.0 ±0.2), about 11.6 (e.g. 11.6 ±0.2), and / or about 14.2 (e.g. 14.2 ±0.2);(b) Form I has an XRPD pattern substantially as shown in FIG. 1 A;(c) Form I is characterized as having an endotherm peak at about 163.1 °C (e.g. 163.1 ±10 °C, 163.1 ±9 °C, 163.1 ±8 °C, 163.1 ±7 °C, 163.1 ±6 °C, 163.1 ±5 °C, 163.1 ±4 °C, 163.1 ±3 °C, 163.1 ±2 °C, 163.1 ±1 °C, or 163.1 ±0.5 °C), as determined by DSC;(d) Form I has a DSC graph substantially as shown in FIG. IB;(e) Form I has a TGA graph substantially as shown in FIG. IB;(f) Form I is characterized as showing water uptake of about 2.7 wt% (e.g., 2.7±0.2 wt%, 2.7±0.1 wt%, 2.7±0.09 wt%, 2.7±0.08 wt%, 2.7±0.07 wt%, 2.7±0.06 wt%, 2.7±0.05 wt%, 2.7±0.04 wt%, 2.7±0.03 wt%, 2.7±0.02%, or 2.7±0.01 wt%) at about 80% relative humidity at room temperature, as determined by DVS; and(g) Form I has a DVS graph substantially as shown in FIG. 1C.Form II

[0053] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form II).

[0054] In some embodiments, Form II is a hydrate or an isopropyl alcohol and water solvate-hydrate. In some embodiments, Form II is a hydrate. In some embodiments, Form II is an isopropyl alcohol and water solvate-hydrate. In some embodiments, Form II displays the crystallographic parameters in Table 2A. In some embodiments, Form II has an XRPD pattern substantially as shown in FIG. 2A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 2B.TABLE 2ATABLE 2B

[0055] In some embodiments, Form II has an XRPD pattern comprising peaks provided in Table 2B, as measured by Cu Ka radiation. In some embodiments, Form II has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 2A, or as provided in Table 2B.

[0056] In some embodiments, Form II has an XRPD pattern comprising peaks as assigned at 2-theta values in degrees as recited in Table 2B, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. For example, Form II may have an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of 7.4 (e.g., 7.4 ±0.2), about 8.5 (e.g., 8.5 ±0.2), about 9.2 (e.g., 9.2 ±0.2), about 11.4 (e.g., 11.4 ±0.2), 10.2 (e.g., 10.2 ±0.2), about 18.1 (e.g., 18.1 ±0.2), about 18.5 (e.g., 18.5 ±0.2), about 19.8 (e.g., 19.8 ±0.2), about 24.7 (e.g., 24.7 ±0.2), and / or about 25.0 (e.g., 25.0 ±0.2).. In some embodiments, Form II has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 7.4 (e.g., 7.4 ±0.2), about 8.5 (e.g., 8.5 ±0.2), about 9.2 (e.g., 9.2 ±0.2), about 11.4 (e.g., 11.4 ±0.2), 10.2 (e.g., 10.2 ±0.2), about 18.1 (e.g., 18.1 ±0.2), about 18.5 (e.g., 18.5 ±0.2), about 19.8 (e.g., 19.8 ±0.2), about 24.7 (e.g., 24.7 ±0.2), and / or about 25.0 (e.g., 25.0 ±0.2). In some embodiments, Form II has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.4 (e.g., 7.4 ±0.2), about 9.2 (e.g., 9.2 ±0.2), about 10.2 (e.g., 10.2 ±0.2), about 18.1 (e.g., 18.1 ±0.2), and / or about 18.5 (e.g., 18.5 ±0.2). In some embodiments, Form II has an XRPD pattern comprising peaks each assigned at 2- theta values in degrees of about 7.4 (e.g., 7.4 ±0.2) and / or about 10.2 (e.g., 10.2 ±0.2). In some embodiments, Form II has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.4 (e.g., 7.4 ±0.2), about 9.2 (e.g., 9.2 ±0.2), and / or about 18.1 (e.g., 18.1 ±0.2). In some embodiments, Form II has an XRPD pattern comprising a peak assigned at 2-theta values in degrees of about 7.4 (e.g., 7.4 ±0.2).

[0057] In some embodiments, Form II (hydrate) has a DSC graph substantially as shown in FIG. 2B. In some embodiments, Form II is characterized as having an endotherm onset at about 87.4 °C (e.g. 87.4 ±10 °C, 87.4 ±9 °C, 87.4 ±8 °C, 87.4 ±7 °C, 87.4 ±6 °C, 87.4 ±5 °C, 87.4 ±4 °C, 87.4 ±3 °C, 87.4 ±2 °C, 87.4 ±1 °C, or 87.4 ±0.5 °C). In some embodiments, Form II is characterized as having an endotherm peak at about 127.6 °C (e.g. 127.6 ±10 °C, 127.6 ±9 °C, 127.6 ±8 °C, 127.6 ±7 °C, 127.6 ±6 °C, 127.6 ±5 °C, 127.6 ±4 °C, 127.6 ±3 °C, 127.6 ±2 °C, 127.6 ±1 °C, or 127.6 ±0.5 °C), as determined by DSC.

[0058] In some embodiments, Form II (hydrate) has a TGA graph substantially as shown in FIG. 2B. In some embodiments, Form II is characterized as showing a weight loss of about 3.94% (e.g., 3.94±1%, 3.94±0.9%, 3.94±0.8%, 3.94±0.7%, 3.94±0.6%, 3.94±0.5%, 3.94±0.4%, 3.94±0.3%, 3.94±0.2%, or 3.94±0.1%) after heating from room temperature to about 160.0 °C (e.g. 160.0 ±10 °C, 160.0 ±9 °C, 160.0 ±8 °C, 160.0 ±7 °C, 160.0 ±6 °C, 160.0 ±5 °C, 160.0 ±4 °C, 160.0 ±3 °C, 160.0 ±2 °C, 160.0 ±1 °C, or 160.0 ±0.5 °C), as determined by TGA.

[0059] In some embodiments, Form II has a DVS graph substantially as shown in FIG. 2C upon dehydration. In some embodiments, Form II is characterized as showing water uptake of about 3 wt% (e.g., 3±0.30 wt%, 3±0.20 wt%, 3±0.10 wt%, 3±0.09 wt%, 3±0.08 wt%, 3±0.07 wt%, 3±0.06 wt%, 3±0.05 wt%, 3±0.04 wt%, 3±0.03 wt%, 3±0.02%, or 3±0.01 wt%) at about 80% relative humidity at room temperature, as determined by DVS.Form III

[0060] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form III).

[0061] In some embodiments, Form III is an isopropyl alcohol solvate. In some embodiments, Form III is a labile isopropyl alcohol solvate. In some embodiments, Form III is a labile isopropyl alcohol solvate which converts to Form VIII upon drying. In some embodiments, Form III has an XRPD pattern substantially as shown in FIG. 2A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 3, as measured by Cu Ka radiation.TABLE 3

[0062] In some embodiments, Form III has an XRPD pattern comprising peaks provided in Table 3. In some embodiments, Form III has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 2A, or as provided in Table 3.

[0063] In some embodiments, Form III has an XRPD pattern comprising peaks as assigned at 2-theta values in degrees as recited in Table 3, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. For example, Form III may have an XRPD pattern comprising peaks each assigned at an angle 2- theta in degrees of about 7.3 (e.g. 7.3 ±0.2), about 7.6 (e.g. 7.6 ±0.2), about 8.6 (e.g. 8.6 ±0.2), about 9.0 (e.g. 9.0 ±0.2), about 14.3 (e.g. 14.3 ±0.2), about 14.7 (e.g. 14.7 ±0.2), about 15.1 (e.g. 15.1 ±0.2), about 15.6 (e.g. 15.6 ±0.2), about 18.3 (e.g. 18.3 ±0.2), and / or about 23.8 (e.g. 23.8 ±0.2). In some embodiments, Form III has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values indegrees of about 7.3 (e.g. 7.3 ±0.2), about 7.6 (e.g. 7.6 ±0.2), about 8.6 (e.g. 8.6 ±0.2), about 9.0 (e.g. 9.0 ±0.2), about 14.3 (e.g. 14.3 ±0.2), about 14.7 (e.g. 14.7 ±0.2), about 15.1 (e.g. 15.1 ±0.2), about 15.6 (e.g. 15.6 ±0.2), about 18.3 (e.g. 18.3 ±0.2), and / or about 23.8 (e.g.23.8 ±0.2). In some embodiments, Form III has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.3 (e.g. 7.3 ±0.2) and / or about 7.6 (e.g. 7.6 ±0.2). In some embodiments, Form III has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.3 (e.g. 7.3 ±0.2), about 7.6 (e.g. 7.6 ±0.2), about 8.6 (e.g. 8.6 ±0.2), about 9.0 (e.g. 9.0 ±0.2), and / or about 23.8 (e.g. 23.8 ±0.2). In some embodiments, Form III has an XRPD pattern comprising a peak assigned at 2-theta values in degrees of about 7.6 (e.g. 7.6 ±0.2).Form IV

[0064] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form IV).

[0065] In some embodiments, Form IV is an ethyl acetate solvate or acetonitrile solvate. In some embodiments, Form IV is an ethyl acetate solvate. In some embodiments, Form IV is an acetonitrile solvate.

[0066] In some embodiments, Form IV has an XRPD pattern substantially as shown in FIG. 2A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 4, as measured by Cu Ka radiation.TABLE 4

[0067] In some embodiments, Form IV has an XRPD pattern comprising peaks provided in Table 4. In some embodiments, Form IV has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at leastseven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 2A, or as provided in Table 4.

[0068] In some embodiments, Form IV has an XRPD pattern comprising peaks as assigned at 2-theta values in degrees as recited in Table 4, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. For example, Form IV may have an XRPD pattern comprising peaks each assigned at an angle 2- theta in degrees of about 6.0 (e.g., 6.0 ±0.2), about 6.9 (e.g., 6.9 ±0.2), about 11.7 (e.g., 11.7 ±0.2), about 13.5 (e.g., 13.5 ±0.2), about 15.0 (e.g., 15.0 ±0.2), about 16.4 (e.g., 16.4 ±0.2), about 16.1 (e.g., 16.1 ±0.2), about 18.0 (e.g., 18.0 ±0.2), about 19.3 (e.g., 19.3 ±0.2), and / or about 19.7 (e.g., 19.7 ±0.2). In some embodiments, Form IV has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 6.0 (e.g., 6.0 ±0.2), about 6.9 (e.g., 6.9 ±0.2), about 11.7 (e.g., 11.7 ±0.2), about 13.5 (e.g., 13.5 ±0.2), about 15.0 (e.g., 15.0 ±0.2), about 16.4 (e.g., 16.4 ±0.2), about 16.1 (e.g., 16.1 ±0.2), about 18.0 (e.g., 18.0 ±0.2), about 19.3 (e.g., 19.3 ±0.2), and / or about 19.7 (e.g., 19.7 ±0.2). In some embodiments, Form IV has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.0 (e.g., 6.0 ±0.2) and / or about 6.9 (e.g., 6.9 ±0.2). In some embodiments, Form IV has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.0 (e.g., 6.0 ±0.2), about 6.9 (e.g., 6.9 ±0.2), about 11.7 (e.g., 11.7 ±0.2), about 15.0 (e.g., 15.0 ±0.2), and / or about 16.4 (e.g., 16.4 ±0.2). In some embodiments, Form IV has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.0 (e.g., 6.0 ±0.2), about 6.9 (e.g., 6.9 ±0.2), and / or about 15.0 (e.g., 15.0 ±0.2). In some embodiments, Form IV has an XRPD pattern comprising a peak at 2-theta values in degrees of about 6.0 (e.g., 6.0 ±0.2) and / or about 6.9 (e.g., 6.9 ±0.2). In some embodiments, Form IV has an XRPD pattern comprising a peak at 2-theta values in degrees of about 6.9 (e.g. 6.9 ±0.2).

[0069] In some embodiments, Form IV is characterized as having an endotherm onset at about 139.2 °C (e.g. 139.2 ±5 °C, 139.2 ±4 °C, 139.2 ±3 °C, 139.2 ±2 °C, 139.2 ±1 °C, or 139.2 ±0.5 °C), as determined by DSC.Form V

[0070] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form V).

[0071] In some embodiments, Form V is a THF solvate. In some embodiments, Form V (THF solvate) has an XRPD pattern substantially as shown in FIG. 2A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 5A, as measured by Cu Ka radiation.TABLE 5 A

[0072] In some embodiments, crystalline forms obtained from slurrying the Compound ofFormula (I) in MTBE, 2-MeTHF, or toluene show Form V-like XRPD patterns, as shown in FIG. 3, as measured by Cu Ka radiation. Representative peaks and relative peak intensities that may be observed for the crystalline forms are shown in Table 5B, as measured by Cu Ka radiation.TABLE 5B

[0073] In some embodiments, Form V (THF solvate) has an XRPD pattern comprising peaks provided in Table 5A. In some embodiments, Form V has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 2A, or as provided in Table 5A.

[0074] In some embodiments, Form V has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 5, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. For example, Form V may have an XRPD pattern comprising peaks each assigned at an angle 2-theta in degrees of about 6.6 (e.g., 6.6 ±0.2), about 9.5 (e.g., 9.5 ±0.2), about 10.6 (e.g., 10.6 ±0.2), about 13.1 (e.g., 13.1 ±0.2), about 13.4 (e.g., 13.4 ±0.2), about 14.7 (e.g., 14.7 ±0.2), about 16.3 (e.g., 16.3 ±0.2), about 16.8 (e.g., 16.8 ±0.2), about 22.3 (e.g., 22.3 ±0.2), and / or about 23.1 (e.g., 23.1 ±0.2). In some embodiments, Form V has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 6.6 (e.g., 6.6 ±0.2), about 9.5 (e.g., 9.5 ±0.2), about 10.6 (e.g., 10.6 ±0.2), about 13.1 (e.g., 13.1 ±0.2), about 13.4 (e.g., 13.4 ±0.2), about 14.7 (e.g., 14.7 ±0.2), about 16.3 (e.g., 16.3 ±0.2), about 16.8 (e.g., 16.8 ±0.2), about 22.3 (e.g., 22.3 ±0.2), and / or about 23.1 (e.g., 23.1 ±0.2). In some embodiments, Form V has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.6 (e.g., 6.6 ±0.2), about 9.5 (e.g., 9.5 ±0.2), about 10.6 (e.g., 10.6 ±0.2), about 14.7 (e.g., 14.7 ±0.2), and / or about 16.8 (e.g., 16.8 ±0.2). In some embodiments, Form V has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.6 (e.g., 6.6 ±0.2), 9.5 (e.g., 9.5 ±0.2), and / or about 10.6 (e.g., 10.6 ±0.2). In some embodiments, Form V has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.6 (e.g., 6.6 ±0.2) and / or 9.5 (e.g., 9.5 ±0.2). In some embodiments, Form V has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.6 (e.g., 6.6 ±0.2).Form VI

[0075] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form VI).

[0076] In some embodiments, provided herein is a crystalline form of a mono-acetone solvate of Compound of Formula (I) (mono-acetone form). In some embodiments, the monoacetone form displays the crystallographic parameters in Table 6A. In some embodiments, the mono-acetone form has a simulated XRPD pattern substantially as shown in FIG. 4. Positions of peaks and relative peak intensities that may be observed for the crystalline form using simulated XRPD are shown in Table 6B.TABLE 6ATABLE 6B

[0077] In some embodiments, the mono-acetone form has an XRPD pattern comprising peaks provided in Table 6B. In some embodiments, the mono-acetone form has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 4, or as provided in Table 6B.

[0078] In some embodiments, the mono-acetone form has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 6A, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. For example, the mono-acetone form may have an XRPD pattern comprising peaks each assigned at an angle 2-theta in degrees of about 8.4 (e.g., 8.4 ±0.2), about 9.0 (e.g., 9.0 ±0.2), about 10.9 (e.g., 10.9 ±0.2), about 14.4 (e.g., 14.4 ±0.2), about 15.3 (e.g., 15.3 ±0.2), about 16.4 (e.g., 16.4 ±0.2), about 18.2 (e.g., 18.2 ±0.2), about 19.0 (e.g., 19.0 ±0.2), about 21.7 (e.g., 21.7 ±0.2), and / or about 24.5 (e.g., 24.5 ±0.2). In some embodiments, the monoacetone form has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 8.4 (e.g., 8.4 ±0.2), about 9.0 (e.g., 9.0 ±0.2), about 10.9 (e.g., 10.9 ±0.2), about 14.4 (e.g., 14.4 ±0.2), about 15.3 (e.g., 15.3 ±0.2), about 16.4 (e.g., 16.4 ±0.2), about 18.2 (e.g., 18.2 ±0.2), about 19.0 (e.g., 19.0 ±0.2), about 21.7 (e.g., 21.7 ±0.2), and / or about 24.5 (e.g., 24.5 ±0.2). In someembodiments, the mono-acetone form has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 14.4 (e.g., 14.4 ±0.2), about 16.4 (e.g., 16.4 ±0.2), about 19.0 (e.g., 19.0 ±0.2), about 21.7 (e.g., 21.7 ±0.2), and / or 24.5 (e.g., 24.5 ±0.2). In some embodiments, the mono-acetone form has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 14.4 (e.g., 14.4 ±0.2), about 16.4 (e.g., 16.4 ±0.2), and / or about 24.5 (e.g., 24.5 ±0.2). In some embodiments, the mono-acetone form has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 14.4 (e.g., 14.4 ±0.2), about 21.7 (e.g., 21.7 ±0.2), and / or 24.5 (e.g., 24.5 ±0.2). In some embodiments, the mono-acetone form has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 24.5 (e.g., 24.5 ±0.2).

[0079] In some embodiments, Form VI is a partially desolvated acetone solvate. In some embodiments, Form VI has a stoichiometry of 0.2: 1 (Acetone: API).

[0080] In some embodiments, Form VI has an XRPD pattern substantially as shown in FIG. 2A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 6C, as measured by Cu Ka radiation.TABLE 6C

[0081] In some embodiments, Form VI has an XRPD pattern comprising peaks provided in Table 6C. In some embodiments, Form VI has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 2A, or as provided in Table 6C.

[0082] In some embodiments, Form VI has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 6, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. Forexample, Form VI may have an XRPD pattern comprising peaks each assigned at an angle 2- theta in degrees of about 8.4 (e.g., 8.4 ±0.2), about 11.0 (e.g., 11.0 ±0.2), about 14.6 (e.g.,14.6 ±0.2), about 15.4 (e.g., 15.4 ±0.2), about 16.4 (e.g., 16.4 ±0.2), about 16.7 (e.g., 16.7 ±0.2), about 17.1 (e.g., 17.1 ±0.2), about 18.4 (e.g., 18.4 ±0.2), about 19.2 (e.g., 19.2 ±0.2), and / or about 24.8 (e.g., 24.8 ±0.2). In some embodiments, Form VI has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 8.4 (e.g., 8.4 ±0.2), about 11.0 (e.g., 11.0 ±0.2), about14.6 (e.g., 14.6 ±0.2), about 15.4 (e.g., 15.4 ±0.2), about 16.4 (e.g., 16.4 ±0.2), about 16.7 (e.g., 16.7 ±0.2), about 17.1 (e.g., 17.1 ±0.2), about 18.4 (e.g., 18.4 ±0.2), about 19.2 (e.g., 19.2 ±0.2), and / or about 24.8 (e.g., 24.8 ±0.2) . In some embodiments, Form VI has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 14.6 (e.g., 14.6 ±0.2), about 15.4 (e.g., 15.4 ±0.2), about 16.4 (e.g., 16.4 ±0.2), about 16.7 (e.g., 16.7 ±0.2), and / or about 24.8 (e.g., 24.8 ±0.2). In some embodiments, Form VI has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 14.6 (e.g., 14.6 ±0.2), about 16.4 (e.g., 16.4 ±0.2), and / or about 24.8 (e.g., 24.8 ±0.2). In some embodiments, Form VI has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 16.4 (e.g., 16.4 ±0.2), about 16.7 (e.g., 16.7 ±0.2), and / or about 24.8 (e.g., 24.8 ±0.2). In some embodiments, Form VI has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 8.4 (e.g., 8.4 ±0.2), about 16.4 (e.g., 16.4 ±0.2), about 16.7 (e.g.,16.7 ±0.2), and / or about 24.8 (e.g., 24.8 ±0.2). In some embodiments, Form VI has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 16.4 (e.g., 16.4 ±0.2).

[0083] In some embodiments, Form VI is characterized as having endotherm peak at about 128.25 °C (e.g., 128.25 ±10 °C, 128.25 ±9 °C, 128.25 ±8 °C, 128.25 ±7 °C, 128.25 ±6 °C, 128.25 ±5 °C, 128.25 ±4 °C, 128.25 ±3 °C, 128.25 ±2 °C, 128.25 ±1 °C, or 128.25 ±0.5 °C), as determined by DSC.Form VII

[0084] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form VII). In some embodiments, Form VII is an acetone and water solvate- hydrate.

[0085] In some embodiments, Form VII has an XRPD pattern substantially as shown in FIG. 2A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 7, as measured by Cu Ka radiation.TABLE 7

[0086] In some embodiments, Form VII has an XRPD pattern comprising peaks provided in Table 7. In some embodiments, Form VII has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 2A, or as provided in Table 7.

[0087] In some embodiments, Form VII has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 7, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. For example, Form VII may have an XRPD pattern comprising peaks each assigned at an angle 2-theta in degrees of about 7.6 (e.g., 7.6 ±0.2), about 8.7 (e.g., 8.7 ±0.2), about 10.5 (e.g.,10.5 ±0.2), about 13.2 (e.g., 13.2 ±0.2), about 15.3 (e.g., 15.3 ±0.2), about 16.5 (e.g., 16.5 ±0.2), about 16.7 (e.g., 16.7 ±0.2), about 18.8 (e.g., 18.8 ±0.2), about 21.7 (e.g., 21.7 ±0.2), and / or about 26.3 (e.g., 26.3 ±0.2). In some embodiments, Form VII has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 7.6 (e.g., 7.6 ±0.2), about 8.7 (e.g., 8.7 ±0.2), about 10.5 (e.g., 10.5 ±0.2), about 13.2 (e.g., 13.2 ±0.2), about 15.3 (e.g., 15.3 ±0.2), about 16.5 (e.g.,16.5 ±0.2), about 16.7 (e.g., 16.7 ±0.2), about 18.8 (e.g., 18.8 ±0.2), about 21.7 (e.g., 21.7 ±0.2), and / or about 26.3 (e.g., 26.3 ±0.2). In some embodiments, Form VII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.6 (e.g., 7.6 ±0.2), about 8.7 (e.g., 8.7 ±0.2), about 15.3 (e.g., 15.3 ±0.2), about 16.5 (e.g., 16.5 ±0.2), and / or about 21.7 (e.g., 21.7 ±0.2). In some embodiments, Form VII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.6 (e.g., 7.6 ±0.2), about 8.7 (e.g., 8.7 ±0.2), and / or about 16.5 (e.g., 16.5 ±0.2). In some embodiments, FormVII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 8.7 (e.g., 8.7 ±0.2).

[0088] In some embodiments, Form VII is characterized as having an endotherm onset at about 43.5 °C (e.g., 43.5 ±5 °C, 43.5 ±4 °C, 43.5 ±3 °C, 43.5 ±2 °C, 43.5 ±1 °C, or 43.5 ±0.5 °C), and / or an endotherm onset at about 135.03 °C (e.g., 135.03 ±5 °C, 135.03 ±4 °C, 135.03 ±3 °C, 135.03 ±2 °C, 135.03 ±1 °C, or 135.03 ±0.5 °C), as determined by DSC.Form VIII

[0089] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form VIII).

[0090] In some embodiments, Form VIII is an IPA solvate. In some embodiments, FormVIII is isolated through Form III, which converts to Form VIII upon drying.

[0091] In some embodiments, Form VIII has an XRPD pattern substantially as shown in FIG. 2A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 8, as measured by Cu Ka radiation.TABLE 8

[0092] In some embodiments, Form VIII has an XRPD pattern comprising peaks provided in Table 8. In some embodiments, Form VIII has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 2A, or as provided in Table 8.

[0093] In some embodiments, Form VIII has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 8, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. For example, Form VIII may have an XRPD pattern comprising peaks each assigned at an angle 2-theta in degrees of about 7.9 (e.g., 7.9 ±0.2), about 8.8 (e.g., 8.8 ±0.2), about 13.1 (e.g., 13.1 ±0.2), about 14.0 (e.g., 14.0 ±0.2), about 17.3 (e.g., 17.3 ±0.2), about 17.6 (e.g., 17.6 ±0.2), about 18.7 (e.g., 18.7 ±0.2), about 20.1 (e.g., 20.1 ±0.2), about 21.1 (e.g., 21.1 ±0.2), and / or about 23.2 (e.g., 23.2 ±0.2). In some embodiments, Form VIII has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at leastfive, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 7.9 (e.g., 7.9 ±0.2), about 8.8 (e.g., 8.8 ±0.2), about 13.1 (e.g., 13.1 ±0.2), about 14.0 (e.g., 14.0 ±0.2), about 17.3 (e.g., 17.3 ±0.2), about 17.6 (e.g., 17.6 ±0.2), about 18.7 (e.g., 18.7 ±0.2), about 20.1 (e.g., 20.1 ±0.2), about 21.1 (e.g., 21.1 ±0.2), and / or about 23.2 (e.g., 23.2 ±0.2). In some embodiments, Form VIII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.9 (e.g., 7.9 ±0.2), about 8.8 (e.g., 8.8 ±0.2), about 14.0 (e.g., 14.0 ±0.2), about 17.6 (e.g., 17.6 ±0.2), and / or about 20.1 (e.g., 20.1 ±0.2). In some embodiments, Form VIII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.9 (e.g., 7.9 ±0.2), about 8.8 (e.g., 8.8 ±0.2), and / or about 14.0 (e.g., 14.0 ±0.2). In some embodiments, Form VIII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.9 (e.g., 7.9 ±0.2) and / or about 14.0 (e.g., 14.0 ±0.2). In some embodiments, Form VIII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.9 (e.g., 7.9 ±0.2).

[0094] In some embodiments, Form VIII is characterized as having an endotherm onset at about 108.4 °C (e.g. 108.4 ±5 °C, 108.4 ±4 °C, 108.4 ±3 °C, 108.4 ±2 °C, 108.4 ±1 °C, or 108.4 ±0.5 °C), as determined by DSC.Form IX

[0095] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form IX).

[0096] In some embodiments, Form IX Is an ethanol solvate. In some embodiments, Form IX has an XRPD pattern substantially as shown in FIG. 2A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 9, as measured by Cu Ka radiation.TABLE 9

[0097] In some embodiments, Form IX has an XRPD pattern comprising peaks provided in Table 9. In some embodiments, Form IX has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 2A, or as provided in Table 9.

[0098] In some embodiments, Form IX has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 9, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. For example, Form IX may have an XRPD pattern comprising peaks each assigned at an angle 2- theta in degrees of about 7.8 (e.g., 7.8 ±0.2), about 8.2 (e.g., 8.2 ±0.2), about 8.9 (e.g., 8.9 ±0.2), about 13.4 (e.g., 13.4 ±0.2), about 15.7 (e.g., 15.7 ±0.2), about 16.8 (e.g., 16.8 ±0.2), about 17.9 (e.g., 17.9 ±0.2), about 18.5 (e.g., 18.5 ±0.2), about 20.4 (e.g., 20.4 ±0.2), and / or about 22.1 (e.g., 22.1 ±0.2). In some embodiments, Form IX has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 7.8 (e.g., 7.8 ±0.2), about 8.2 (e.g., 8.2 ±0.2), about 8.9 (e.g., 8.9 ±0.2), about 13.4 (e.g., 13.4 ±0.2), about 15.7 (e.g., 15.7 ±0.2), about 16.8 (e.g.,16.8 ±0.2), about 17.9 (e.g., 17.9 ±0.2), about 18.5 (e.g., 18.5 ±0.2), about 20.4 (e.g., 20.4 ±0.2), and / or about 22.1 (e.g., 22.1 ±0.2). In some embodiments, Form IX has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.8 (e.g., 7.8 ±0.2), about 8.2 (e.g., 8.2 ±0.2), about 8.9 (e.g., 8.9 ±0.2), about 13.4 (e.g., 13.4 ±0.2), and / or about 16.8 (e.g., 16.8 ±0.2). In some embodiments, Form IX has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.8 (e.g., 7.8 ±0.2), about 8.2 (e.g., 8.2 ±0.2), and / or about 16.8 (e.g., 16.8 ±0.2). In some embodiments, Form IX has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about7.8 (e.g., 7.8 ±0.2) and / or about 8.2 (e.g., 8.2 ±0.2). In some embodiments, Form IX has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 7.8 (e.g.,7.8 ±0.2).

[0099] In some embodiments, Form IX has a DSC graph substantially as shown in FIG. 9B. In some embodiments, Form IX is characterized as having an endotherm peak at about56.3 °C (e.g. 56.3 ±5 °C, 56.3 ±4 °C, 56.3 ±3 °C, 56.3 ±2 °C, 56.3 ±1 °C, or 56.3 ±0.5 °C), and / or an endotherm peak at about 101.3 °C (e.g. 101.3 ±5 °C, 101.3 ±4 °C, 101.3 ±3 °C,101.3 ±2 °C, 101.3 ±1 °C, or 101.3 ±0.5 °C), as determined by DSC.Form X

[0100] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form X).

[0101] In some embodiments, Form X is an acetone solvate. In some embodiments, Form X remains unchanged after desolvation.

[0102] In some embodiments, Form X has an XRPD pattern substantially as shown in FIG. 2A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 10, as measured by Cu Ka radiation.TABLE 10

[0103] In some embodiments, Form X has an XRPD pattern comprising peaks provided in Table 10. In some embodiments, Form X has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 2A, or as provided in Table 10.

[0104] In some embodiments, Form X has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 10, each peak of which canindependently vary in assignment at angle 2-theta in degrees as described herein. For example, Form X may have an XRPD pattern comprising peaks each assigned at an angle 2- theta in degrees of about 16.7 (e.g., 16.7±0.2), about 15.9 (e.g., 15.9±0.2), about 19.5 (e.g., 19.5±0.2), about 12.7 (e.g., 12.7±0.2), about 16.9 (e.g., 16.9±0.2), about 8.1 (e.g., 8.1±0.2), about 11.6 (e.g., 11.6±0.2), about 21.1 (e.g., 21.1±0.2), about 19.3 (e.g., 19.3±0.2), and / or about 9.4 (e.g., 9.4±0.2). In some embodiments, Form X has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 16.7 (e.g., 16.7±0.2), about 15.9 (e.g., 15.9±0.2), about 19.5 (e.g., 19.5±0.2), about 12.7 (e.g., 12.7±0.2), about 16.9 (e.g., 16.9±0.2), about 8.1 (e.g., 8.1±0.2), about 11.6 (e.g., 11.6±0.2), about 21.1 (e.g., 21.1±0.2), about 19.3 (e.g., 19.3±0.2), and / or about 9.4 (e.g., 9.4±0.2). In some embodiments, Form X has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 16.7 (e.g., 16.7±0.2), about 15.9 (e.g., 15.9±0.2), about 19.5 (e.g., 19.5±0.2), about 12.7 (e.g., 12.7±0.2), and / or about 16.9 (e.g., 16.9±0.2). In some embodiments, Form X has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 16.7 (e.g., 16.7±0.2), about 15.9 (e.g., 15.9±0.2), and / or about 19.5 (e.g., 19.5±0.2). In some embodiments, Form X has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 16.7 (e.g., 16.7±0.2) and / or about 15.9 (e.g., 15.9±0.2).

[0105] In some embodiments, Form X has a DSC graph substantially as shown in FIG. 5. In some embodiments, Form X is characterized as having an endotherm onset at about 27.2 °C (e.g. 27.2 ±5 °C, 27.2 ±4 °C, 27.2 ±3 °C, 27.2 ±2 °C, 27.2 ±1 °C, or 27.2 ±0.5 °C) and / or having an endotherm onset at about 158.9 °C (e.g. 158.9 ±5 °C, 158.9 ±4 °C, 158.9 ±3 °C, 158.9 ±2 °C, 158.9 ±1 °C, or 158.9 ±0.5 °C), and / or an endotherm peak at about 53.93 °C (e.g. 53.93 ±5 °C, 53.93 ±4 °C, 53.93 ±3 °C, 53.93 ±2 °C, 53.93 ±1 °C, or 53.93 ±0.5 °C), and / or an endotherm peak at about 170.48 °C (e.g. 170.48 ±5 °C, 170.48 ±4 °C, 170.48 ±3 °C, 170.48 ±2 °C, 170.48 ±1 °C, or 170.48 ±0.5 °C), as determined by DSC.

[0106] In some embodiments, Form X has a TGA graph substantially as shown in FIG. 5.Form XI

[0107] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form XI). In some embodiments, Form XI is a cumene solvate.

[0108] In some embodiments, Form XI has an XRPD pattern substantially as shown in FIG. 6A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 11, as measured by Cu Ka radiation.TABLE 11

[0109] In some embodiments, Form XI has an XRPD pattern comprising peaks provided in Table 11. In some embodiments, Form XI has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 6A, or as provided in Table 11.

[0110] In some embodiments, Form XI has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 11, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. For example, Form XI may have an XRPD pattern comprising peaks each assigned at an angle 2- theta in degrees of about 6.7 (e.g., 6.7 ±0.2), about 9.3 (e.g., 9.3 ±0.2), about 10.5 (e.g., 10.5 ±0.2), about 13.2 (e.g., 13.2 ±0.2), about 14.6 (e.g., 14.6 ±0.2), about 16.4 (e.g., 16.4 ±0.2), about 18.6 (e.g., 18.6 ±0.2), about 20.9 (e.g., 20.9 ±0.2), about 22.1 (e.g., 22.1 ±0.2), and / or about 22.5 (e.g., 22.5 ±0.2). In some embodiments, Form XI has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 6.7 (e.g., 6.7 ±0.2), about 9.3 (e.g., 9.3 ±0.2), about 10.5 (e.g., 10.5 ±0.2), about 13.2 (e.g., 13.2 ±0.2), about 14.6 (e.g., 14.6 ±0.2), about 16.4 (e.g., 16.4 ±0.2), about 18.6 (e.g., 18.6 ±0.2), about 20.9 (e.g., 20.9 ±0.2), about 22.1 (e.g., 22.1 ±0.2), and / or about 22.5 (e.g., 22.5 ±0.2). In some embodiments, Form XI has an XRPDpattern comprising peaks each assigned at 2-theta values in degrees of about 9.3 (e.g., 9.3 ±0.2), about 10.5 (e.g., 10.5 ±0.2), about 14.6 (e.g., 14.6 ±0.2), about 22.1 (e.g., 22.1 ±0.2), and / or about 22.5 (e.g., 22.5 ±0.2). In some embodiments, Form XI has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 14.6 (e.g., 14.6 ±0.2), about 22.1 (e.g., 22.1 ±0.2), and / or about 22.5 (e.g., 22.5 ±0.2). In some embodiments, Form XI has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 14.6 (e.g., 14.6 ±0.2) and / or about 20.9 (e.g., 20.9 ±0.2). In some embodiments, Form XI has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 9.3 (e.g., 9.3 ±0.2), about 14.6 (e.g., 14.6 ±0.2) and / or about 20.9 (e.g., 20.9 ±0.2). In some embodiments, Form XI has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 14.6 (e.g., 14.6 ±0.2).[OHl] In some embodiments, Form XI has a DSC graph substantially as shown in FIG. 6B. In some embodiments, Form XI is characterized as having an endotherm onset at about 130.03 °C (e.g. 130.03 ±5 °C, 130.03 ±4 °C, 130.03 ±3 °C, 130.03 ±2 °C, 130.03 ±1 °C, or 130.03 ±0.5 °C) and / or endotherm peak at about 130.19 °C (e.g. 130.19 ±5 °C, 130.19 ±4 °C, 130.19 ±3 °C, 130.19 ±2 °C, 130.19 ±1 °C, or 130.19 ±0.5 °C), as determined by DSC.

[0112] In some embodiments, Form XI has a TGA graph substantially as shown in FIG. 6B. In some embodiments, Form XI is characterized as showing a weight loss of about 17.3% (e.g., 17.3±0.10%, 17.3±0.09%, 17.3±0.08%, 17.3±0.07%, 17.3±0.06%, 17.3±0.05%, 17.3±0.04%, 17.3±0.03%, 17.3±0.02%, or 17.3±0.01%) after heating from room temperature to about 160.0 °C (e.g. 160.0 ±5 °C, 160.0 ±4 °C, 160.0 ±3 °C, 160.0 ±2 °C, 160.0 ±1 °C, or 160.0 ±0.5 °C), as determined by TGA.Form XII

[0113] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form XII). In some embodiments, Form XII is a heptane solvate.

[0114] In some embodiments, Form XII has an XRPD pattern substantially as shown in FIG. 7A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 12, as measured by Cu Ka radiation.TABLE 12

[0115] In some embodiments, Form XII has an XRPD pattern comprising peaks provided in Table 12. In some embodiments, Form XII has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 7A, or as provided in Table 12.

[0116] In some embodiments, Form XII has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 12, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. For example, Form XII may have an XRPD pattern comprising peaks each assigned at an angle 2-theta in degrees of about 6.7 (e.g., 6.7 ±0.2), about 9.2 (e.g., 9.2 ±0.2), about 10.6 (e.g., 10.6 ±0.2), about 14.6 (e.g., 14.6 ±0.2), about 15.7 (e.g., 15.7 ±0.2), about 18.4 (e.g., 18.4 ±0.2), about 21.2 (e.g., 21.2 ±0.2), about 21.9 (e.g., 21.9 ±0.2), about 22.6 (e.g., 22.6 ±0.2), and / or about 23.2 (e.g., 23.2 ±0.2). In some embodiments, Form XII has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 6.7 (e.g., 6.7 ±0.2), about 9.2 (e.g., 9.2 ±0.2), about 10.6 (e.g., 10.6 ±0.2), about 14.6 (e.g., 14.6 ±0.2), about 15.7 (e.g., 15.7 ±0.2), about 18.4 (e.g., 18.4 ±0.2), about 21.2 (e.g., 21.2 ±0.2), about 21.9 (e.g., 21.9 ±0.2), about 22.6 (e.g., 22.6 ±0.2), and / or about 23.2 (e.g., 23.2 ±0.2). In some embodiments, Form XII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.7 (e.g., 6.7 ±0.2), about 9.2 (e.g., 9.2 ±0.2), about 10.6 (e.g., 10.6 ±0.2), about 14.6 (e.g., 14.6 ±0.2), and / or about 15.7 (e.g., 15.7 ±0.2). In some embodiments, Form XII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.7 (e.g., 6.7 ±0.2), about 9.2 (e.g., 9.2 ±0.2), and / or about 14.6 (e.g., 14.6 ±0.2). In some embodiments, Form XII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.7 (e.g., 6.7 ±0.2) and / or about 9.2 (e.g., 9.2 ±0.2). In some embodiments, Form XII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 9.2 (e.g., 9.2 ±0.2).

[0117] In some embodiments, Form XII has a DSC graph substantially as shown in FIG. 7B. In some embodiments, Form XII is characterized as having an endotherm onset at about 140.14 °C (e.g. 140.14 ±5 °C, 140.14 ±4 °C, 140.14 ±3 °C, 140.14 ±2 °C, 140.14 ±1 °C, or140.14 ±0.5 °C) and / or an endotherm peak at about 149.69 °C (e.g. 149.69 ±5 °C, 149.69 ±4 °C, 149.69 ±3 °C, 149.69 ±2 °C, 149.69 ±1 °C, or 149.69 ±0.5 °C), as determined by DSC.

[0118] In some embodiments, Form XII has a TGA graph substantially as shown in FIG. 7B. In some embodiments, Form XII is characterized as showing a weight loss of about 6.01% (e.g., 6. OHO.10%, 6. OHO.09%, 6.01±0.08%, 6.01±0.07%, 6.01±0.06%, 6.01±0.05%, 6.01 ±0.04%, 6.01 ±0.03%, 6.01 ±0.02%, or 6.01 ±0.01%) after heating from room temperature to about 160 °C (e.g. 160 ±5 °C, 160 ±4 °C, 160 ±3 °C, 160 ±2 °C, 160 ±1 °C, or 160 ±0.5 °C), as determined by TGA.Form XIII

[0119] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form XIII). In some embodiments, Form XIII is a DMSO solvate.

[0120] In some embodiments, Form XIII has an XRPD pattern substantially as shown in FIG. 8A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 13, as measured by Cu Ka radiation.TABLE 13

[0121] In some embodiments, Form XIII has an XRPD pattern comprising peaks provided in Table 13. In some embodiments, Form XIII has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 8 A, or as provided in Table 13.

[0122] In some embodiments, Form XIII has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 13, each peak of which canindependently vary in assignment at angle 2-theta in degrees as described herein. For example, Form XIII may have an XRPD pattern comprising peaks each assigned at an angle 2-theta in degrees of about 6.5 (e.g., 6.5 ±0.2), about 12.9 (e.g., 12.9 ±0.2), about 16.3 (e.g., 16.3 ±0.2), about 17.4 (e.g., 17.4 ±0.2), about 19.3 (e.g., 19.3 ±0.2), about 21.7 (e.g., 21.7 ±0.2), about 23.0 (e.g., 23.0 ±0.2), about 23.3 (e.g., 23.3 ±0.2), about 23.6 (e.g., 23.6 ±0.2), and / or about 24.6 (e.g., 24.6 ±0.2). In some embodiments, Form XIII has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 6.5 (e.g., 6.5 ±0.2), about 12.9 (e.g., 12.9 ±0.2), about 16.3 (e.g., 16.3 ±0.2), about 17.4 (e.g., 17.4 ±0.2), about 19.3 (e.g., 19.3 ±0.2), about 21.7 (e.g., 21.7 ±0.2), about 23.0 (e.g., 23.0 ±0.2), about 23.3 (e.g., 23.3 ±0.2), about 23.6 (e.g., 23.6 ±0.2), and / or about 24.6 (e.g., 24.6 ±0.2). In some embodiments, Form XIII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.5 (e.g., 6.5 ±0.2), about 12.9 (e.g., 12.9 ±0.2), about 19.3 (e.g., 19.3 ±0.2), about 21.7 (e.g., 21.7 ±0.2), and / or about 23.3 (e.g., 23.3 ±0.2). In some embodiments, Form XIII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.5 (e.g., 6.5 ±0.2), about 19.3 (e.g., 19.3 ±0.2), and / or about 21.7 (e.g., 21.7 ±0.2). In some embodiments, Form XIII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.5 (e.g., 6.5 ±0.2) and / or about 21.7 (e.g., 21.7 ±0.2). In some embodiments, Form XIII has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 6.5 (e.g., 6.5 ±0.2).

[0123] In some embodiments, Form XIII has a DSC graph substantially as shown in FIG. 8B. In some embodiments, Form XIII is characterized as having an endotherm peak at about 50 °C (e.g. 50 ±5 °C, 50 ±4 °C, 50 ±3 °C, 50 ±2 °C, 50 ±1 °C, or 50 ±0.5 °C) and / or an endotherm onset at about 84 °C (e.g. 84 ±5 °C, 84 ±4 °C, 84 ±3 °C, 84 ±2 °C, 84 ±1 °C, or 84 ±0.5 °C) and / or endotherm peak at about 91 °C (e.g. 91 ±5 °C, 91 ±4 °C, 91 ±3 °C, 91 ±2 °C, 91 ±1 °C, or 91 ±0.5 °C), as determined by DSC.

[0124] In some embodiments, Form XIII has a TGA graph substantially as shown in FIG. 8B. In some embodiments, Form XIII is characterized as showing a weight loss of about 0.78 % (e.g., 0.78±0.10%, 0.78±0.09%, 0.78±0.08%, 0.78±0.07%, 0.78±0.06%, 0.78±0.05%, 0.78±0.04%, 0.78±0.03%, 0.78±0.02%, or 0.78±0.01%) after heating from room temperature to about 65 °C (e.g. 65 ±5 °C, 65 ±4 °C, 65 ±3 °C, 65 ±2 °C, 65 ±1 °C, or 65 ±0.5 °C), and / or about 12.37 % (e.g., 12.37±0.10%, 12.37±0.09%, 12.37±0.08%, 12.37±0.07%, 12.37±0.06%,12.37±0.05%, 12.37±0.04%, 12.37±0.03%, 12.37±0.02%, or 12.37±0.01%) after heating from about 65 °C (e.g. 65 ±5 °C, 65 ±4 °C, 65 ±3 °C, 65 ±2 °C, 65 ±1 °C, or 65 ±0.5 °C) to about 175 °C (e.g. 175 ±5 °C, 175 ±4 °C, 175 ±3 °C, 175 ±2 °C, 175 ±1 °C, or 175 ±0.5 °C), as determined by TGA.Form XIV

[0125] In some embodiments, provided herein is a crystalline form of Compound of Formula (I) (Form XIV). In some embodiments, Form XIV is a methyl ethyl ketone (MEK) solvate.

[0126] In some embodiments, Form XIV has an XRPD pattern substantially as shown in FIG. 9A, as measured by Cu Ka radiation. Positions of peaks and relative peak intensities that may be observed for the crystalline form using XRPD are shown in Table 14, as measured by Cu Ka radiation.TABLE 14

[0127] In some embodiments, Form XIV has an XRPD pattern comprising peaks provided in Table 14. In some embodiments, Form XIV has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks at 2-theta values in the XRPD pattern substantially as shown in FIG. 9A, or as provided in Table 14.

[0128] In some embodiments, Form XIV has an XRPD pattern comprising one or more peaks as assigned at 2-theta values in degrees as recited in Table 14, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. Forexample, Form XIV may have an XRPD pattern comprising peaks each assigned at an angle 2-theta in degrees of about 8.2 (e.g., 8.2 ±0.2), about 9.9 (e.g., 9.9 ±0.2), about 10.9 (e.g.,10.9 ±0.2), about 14.5 (e.g., 14.5 ±0.2), about 15.4 (e.g., 15.4 ±0.2), about 16.3 (e.g., 16.3 ±0.2), about 18.3 (e.g., 18.3 ±0.2), about 19.2 (e.g., 19.2 ±0.2), about 19.8 (e.g., 19.8 ±0.2), and / or about 24.7 (e.g., 24.7 ±0.2).

[0129] In some embodiments, Form XIV has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at 2-theta values in degrees of about 8.2 (e.g., 8.2 ±0.2), about 9.9 (e.g., 9.9 ±0.2), about 10.9 (e.g., 10.9 ±0.2), about 14.5 (e.g., 14.5 ±0.2), about 15.4 (e.g., 15.4 ±0.2), about 16.3 (e.g., 16.3 ±0.2), about 18.3 (e.g., 18.3 ±0.2), about 19.2 (e.g., 19.2 ±0.2), about 19.8 (e.g., 19.8 ±0.2), and / or about 24.7 (e.g., 24.7 ±0.2). In some embodiments, Form XIV has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 8.2 (e.g., 8.2 ±0.2), about 14.5 (e.g., 14.5 ±0.2), about 15.4 (e.g., 15.4 ±0.2), about 18.3 (e.g., 18.3 ±0.2), and / or about 19.2 (e.g.,19.2 ±0.2). In some embodiments, Form XIV has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 8.2 (e.g., 8.2 ±0.2), about 9.9 (e.g., 9.9 ±0.2), about 14.5 (e.g., 14.5 ±0.2), and / or about 18.3 (e.g., 18.3 ±0.2). In some embodiments, Form XIV has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about 8.2 (e.g., 8.2 ±0.2), and / or about 9.9 (e.g., 9.9 ±0.2). In some embodiments, Form XIV has an XRPD pattern comprising peaks each assigned at 2-theta values in degrees of about8.2 (e.g., 8.2 ±0.2).

[0130] In some embodiments, Form XIV has a DSC graph substantially as shown in FIG. 14B. In some embodiments, Form XIV is characterized as having an endotherm peak at about115.9 °C (e.g. 115.9 ±5 °C, 115.9 ±4 °C, 115.9 ±3 °C, 115.9 ±2 °C, 115.9 ±1 °C, or 115.9 ±0.5 °C), and / or an endotherm peak at about 125.4 °C (e.g. 125.4 ±5 °C, 125.4 ±4 °C, 125.4 ±3 °C, 125.4 ±2 °C, 125.4 ±1 °C, or 125.4 ±0.5 °C), as determined by DSC.

[0131] In some embodiments, Form XIV has a TGA graph substantially as shown in FIG. 14B. In some embodiments, Form XIV is characterized as showing a weight loss of about 8.74% (e.g., 8.74±0.10%, 8.74±0.09%, 8.74±0.08%, 8.74±0.07%, 8.74±0.06%, 8.74±0.05%, 8.74±0.04%, 8.74±0.03%, 8.74±0.02%, or 8.74±0.01%) after heating from room temperature to about 200 °C (e.g. 200 ±5 °C, 200 ±4 °C, 200 ±3 °C, 200 ±2 °C, 200 ±1 °C, or 200 ±0.5 °C), as determined by TGA. In some embodiments, Form XIV is characterized as showing a weight loss of about 4.51 % (e.g., 4.51±0.10%, 4.51±0.09%, 4.51±0.08%, 4.51±0.07%,4.51±0.06%, 4.51±0.05%, 4.51±0.04%, 4.51±0.03%, 4.51±0.02%, or 4.51±0.01%) after heating from room temperature to about 105 °C (e.g. 105 ±5 °C, 105 ±4 °C, 105 ±3 °C, 105 ±2 °C, 105 ±1 °C, or 105 ±0.5 °C), and / or about 4.24 % (e.g., 4.24±0.10%, 4.24±0.09%, 4.24±0.08%, 4.24±0.07%, 4.24±0.06%, 4.24±0.05%, 4.24±0.04%, 4.24±0.03%, 4.24±0.02%, or 4.24±0.01%) after heating from about 105 °C (e.g. 105 ±5 °C, 105 ±4 °C, 105 ±3 °C, 105 ±2 °C, 105 ±1 °C, or 105 ±0.5 °C) to about 200 °C (e.g. 200 ±5 °C, 200 ±4 °C, 200 ±3 °C, 200 ±2 °C, 200 ±1 °C, or 200 ±0.5 °C), as determined by TGA.Di-acetone solvate

[0132] In some embodiments, provided herein is a crystalline form of a di-acetone solvate of Compound of Formula (I) (di-acetone form). In some embodiments, the di-acetone form displays the crystallographic parameters in Table 15 A.TABLE 15ATABLE 15B

[0133] In some embodiments, the mono-acetone form has an XRPD pattern comprising peaks provided in Table 17B. In some embodiments, the mono-acetone form has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) of the peaks atangles 2-theta in the XRPD pattern substantially as shown in FIG. 17 A, or as provided in Table 17B.

[0134] In some embodiments, the mono-acetone form has an XRPD pattern comprising one or more peaks as assigned at angles 2-theta in degrees as recited in Table 17, each peak of which can independently vary in assignment at angle 2-theta in degrees as described herein. For example, the mono-acetone form may have an XRPD pattern comprising peaks each assigned at an angle 2-theta in degrees of about 6.7 (e.g., 6.7 ±0.2), about 12.8 (e.g.,12.8 ±0.2), about 13.7 (e.g., 13.7 ±0.2), about 16.1 (e.g., 16.1 ±0.2), about 19.5 (e.g., 19.5 ±0.2), about 19.9 (e.g., 19.9 ±0.2), about 21.1 (e.g., 21.1 ±0.2), about 21.9 (e.g., 21.9 ±0.2), about 23.8 (e.g., 23.8 ±0.2), and / or about 25.2 (e.g., 25.2 ±0.2). In some embodiments, the mono-acetone form has an XRPD pattern comprising one or more (e.g., at least one, at least two, at least three, at least four, at least five, at least six, at least seven, at least eight, at least nine, or at least ten) peaks each assigned at angles 2-theta in degrees of about 6.7 (e.g., 6.7 ±0.2), about 12.8 (e.g., 12.8 ±0.2), about 13.7 (e.g., 13.7 ±0.2), about 16.1 (e.g., 16.1 ±0.2), about 19.5 (e.g., 19.5 ±0.2), about 19.9 (e.g., 19.9 ±0.2), about 21.1 (e.g., 21.1 ±0.2), about21.9 (e.g., 21.9 ±0.2), about 23.8 (e.g., 23.8 ±0.2), and / or about 25.2 (e.g., 25.2 ±0.2). In some embodiments, the mono-acetone form has an XRPD pattern comprising peaks each assigned at angles 2-theta in degrees of about 6.7 (e.g., 6.7 ±0.2), about 16.1 (e.g., 16.1 ±0.2), about 21.1 (e.g., 21.1 ±0.2), about 21.9 (e.g., 21.9 ±0.2), and / or about 23.8 (e.g., 23.8 ±0.2). In some embodiments, the mono-acetone form has an XRPD pattern comprising peaks each assigned at angles 2-theta in degrees of about 6.7 (e.g., 6.7 ±0.2), about 16.1 (e.g., 16.1 ±0.2), and / or about 21.1 (e.g., 21.1 ±0.2). In some embodiments, the mono-acetone form has an XRPD pattern comprising peaks each assigned at angles 2-theta in degrees of about 6.7 (e.g., 6.7 ±0.2) and / or about 16.1 (e.g., 16.1 ±0.2). In some embodiments, the mono-acetone form has an XRPD pattern comprising peaks each assigned at angles 2-theta in degrees of about 6.7 (e.g., 6.7 ±0.2).

[0135] In some embodiments, provided herein is a crystalline form of a di-DCM solvate of Compound of Formula (I) (di-DCM form). In some embodiments, the di-DCM form has a XRPD pattern substantially as shown in FIG. ID.Methods of PreparationForm I

[0136] Form I may be prepared according to the methods disclosed in Example 2. For example, in some embodiments, provided is a method of preparing Form I, comprising desolvating a Di-DCM solvate of Compound of Formula (I). In some embodiments, the Di- DCM solvate is obtained by slurrying Compound of Formula (I) in DCM. In some embodiments, the Di-DCM solvate is obtained by slurrying Compound of Formula (I) in DCM at room temperature. In some embodiments, desolvating the Di-DCM solvate comprises drying the Di-DCM solvate. In some embodiments, desolvating the Di-DCM solvate comprises drying the Di-DCM solvate at room temperature. In some embodiments, desolvating the Di-DCM solvate comprises drying the Di-DCM solvate at between about 30 °C and 40 °C. In some embodiments, slurrying Compound of Formula (I) in a solvent disclosed herein (e.g., DCM) comprises: (1) mixing Compound of Formula (I) with the solvent to form a slurry, (2) agitate the slurry, and / or (3) isolate the solid (e.g., by vacuum or centrifuge filtration).Form II

[0137] Form II may be prepared according to the methods disclosed in Example 3. For example, in some embodiments, provided is a method of preparing Form II, comprising slurrying Compound of Formula (I) in a mixture of IP A and water at room temperature. In some embodiments, provided is a method of preparing Form II (hydrate), comprising slurrying Form X in water at 50 °C.Form III

[0138] Form III may be prepared according to the methods disclosed in Example 4. For example, in some embodiments, provided is a method of preparing Form III, comprising slurrying the Compound of Formula (I) in IP A at room temperature.Form IV

[0139] Form IV may be prepared according to the methods disclosed in Example 5. For example, in some embodiments, provided is a method of preparing Form IV, comprising slurrying Compound of Formula (I) in EtOAc or ACN at room temperature.Form V

[0140] Form V may be prepared according to the methods disclosed in Example 6. For example, in some embodiments, provided is a method of preparing Form V, comprising slurrying Compound of Formula (I) in THF at room temperature.Form VI

[0141] Form VI may be prepared according to the methods disclosed in Example 7. For example, in some embodiments, provided is a method of preparing Form VI, comprising drying the product obtained by slurrying Compound of Formula (I) in acetone at room temperature.Form VII

[0142] Form VII may be prepared according to the methods disclosed in Example 8. For example, in some embodiments, provided is a method of preparing Form VII, comprising slurrying Compound of Formula (I) in a mixture of acetone and water at room temperature.Form VIII

[0143] Form VIII may be prepared according to the methods disclosed in Example 9. For example, in some embodiments, provided is a method of preparing Form VIII, comprising drying Form III.Form IX

[0144] Form IX may be prepared according to the methods disclosed in Example 10. For example, in some embodiments, provided is a method of preparing Form IX, comprising slurrying Compound of Formula (I) in EtOH at 5°C.Form X

[0145] Form X may be prepared according to the methods disclosed in Example 11. For example, in some embodiments, provided is a method of preparing Form X, comprising slurrying Compound of Formula (I) in acetone at 5°C.Form XI

[0146] Form XI may be prepared according to the methods disclosed in Example 12. For example, in some embodiments, provided is a method of preparing Form XI, comprising slurrying the Compound of Formula (I) in cumene.Form XII

[0147] Form XII may be prepared according to the methods disclosed in Example 13. For example, in some embodiments, provided is a method of preparing Form XII, comprising slurrying the Compound of Formula (I) in heptane.Form XIII

[0148] Form XIII may be prepared according to the methods disclosed in Example 14. For example, in some embodiments, provided is a method of preparing Form XIII, comprising slurrying the Compound of Formula (I) in DMSO at room temperature.Form XIV

[0149] Form XIV may be prepared according to the methods disclosed in Example 15. For example, in some embodiments, provided is a method of preparing Form XIV, comprising slurrying Compound of Formula (I) in MEK at room temperature.Pharmaceutical Compositions and Formulations

[0150] Pharmaceutical compositions of any of crystalline forms detailed herein are embraced by this invention. Thus, the invention includes pharmaceutical compositions comprising a crystalline form disclosed herein, e.g., any one of Forms I, II, III, IV, V, VI, VII, VIII, IX, X, XI, XII, XIII, or XIV, and a pharmaceutically acceptable carrier or excipient. In one embodiment, the pharmaceutical composition is a composition for controlled release of any of the crystalline forms detailed herein.

[0151] Crystalline forms or compositions disclosed herein may be formulated for any available delivery route, including an oral, mucosal (e.g., nasal, sublingual, vaginal, buccal or rectal), parenteral (e.g., intramuscular, subcutaneous or intravenous), topical or transdermal delivery form, or a form suitable for inhalation. A crystalline form or composition disclosed herein may be formulated with suitable carriers to provide delivery forms that include, but are not limited to, tablets, caplets, capsules (such as hard gelatin capsules or soft elastic gelatin capsules), cachets, troches, lozenges, gums, dispersions, suppositories, ointments, cataplasms (poultices), pastes, powders, dressings, creams, solutions, patches, aerosols (e.g., nasal spray or inhalers), gels, suspensions (e.g., aqueous or non-aqueous liquid suspensions, oil-in-water emulsions or water-in-oil liquid emulsions), solutions and elixirs.

[0152] Crystalline forms disclosed herein can be used in the preparation of a formulation, such as a pharmaceutical formulation, by combining the crystalline form as an active ingredient with a pharmaceutically acceptable carrier, such as those mentioned above. Depending on the therapeutic form of the system (e.g., transdermal patch vs. oral tablet), the carrier may be in various forms. In addition, pharmaceutical formulations may contain preservatives, solubilizers, stabilizers, re-wetting agents, emulgators, sweeteners, dyes, adjusters, and salts for the adjustment of osmotic pressure, buffers, coating agents orantioxidants. Formulations comprising the compound may also contain other substances which have valuable therapeutic properties. Pharmaceutical formulations may be prepared by known pharmaceutical methods. Suitable formulations can be found, e.g, in Remington: The Science and Practice of Pharmacy, Academic Press, 23rded. (2020), which is incorporated herein by reference.

[0153] Crystalline forms disclosed herein may be administered to an individual (e.g., a human) in a form of generally accepted oral compositions, such as tablets, coated tablets, and gel capsules in a hard or in soft shell, emulsions or suspensions. Examples of carriers, which may be used for the preparation of such compositions, are lactose, com starch or its derivatives, talc, stearate or its salts, etc. Acceptable carriers for gel capsules with soft shell are, for instance, plant oils, wax, fats, semisolid and liquid poly-ols, and so on. In addition, pharmaceutical formulations may contain preservatives, solubilizers, stabilizers, re-wetting agents, emulgators, sweeteners, dyes, adjusters, and salts for the adjustment of osmotic pressure, buffers, coating agents or antioxidants.Methods of Use

[0154] In some embodiments, provided herein is a method of treating a disease in an individual comprising administering an effective amount of a crystalline form disclosed herein, e.g, any one of Forms I, II, III, IV, V, VI, VII, VIII, IX, X, XI, XII, XIII, or XIV, to the individual. Further provided herein is a method of treating a proliferative disease in an individual, comprising administering an effective amount of the crystalline form to the individual. Also provided herein is a method of treating cancer in an individual comprising administering an effective amount of the crystalline form to the individual. In some embodiments, the crystalline form is administered to the individual according to a dosage and / or method of administration described herein.

[0155] In some embodiments, provided herein is a method of treating a disease mediated by the BET family of proteins in an individual comprising administering an effective amount of a crystalline form disclosed herein, e.g, any one of Forms I, II, III, IV, V, VI, VII, VIII, IX, X, XI, XII, XIII, or XIV, to the individual. In an embodiment, the present invention provides for methods for treating or preventing disorders that are ameliorated by inhibition of BET.

[0156] In some embodiments, provided is a method of treating cancer in an individual comprising administering a therapeutically effective amount of a crystalline form disclosedherein to an individual in need thereof. In some embodiments, the present invention relates to methods of treating cancer in an individual comprising administering a therapeutically effective amount of a crystalline form disclosed herein, e.g., any one of Forms I, II, III, IV, V, VI, VII, VIII, IX, X, XI, XII, XIII, or XIV, to an individual in need thereof. In certain embodiments, the cancer is selected from the group consisting of: acoustic neuroma, acute leukemia, acute lymphocytic leukemia, acute myelocytic leukemia (monocytic, myeloblastic, adenocarcinoma, angiosarcoma, astrocytoma, myelomonocytic and promyelocytic), acute T- cell leukemia, basal cell carcinoma, bile duct carcinoma, bladder cancer, brain cancer, breast cancer, bronchogenic carcinoma, cervical cancer, chondrosarcoma, chordoma, choriocarcinoma, chronic leukemia, chronic lymphocytic leukemia, chronic myelocytic (granulocytic) leukemia, chronic myelogenous leukemia, colon cancer, colorectal cancer, craniopharyngioma, cystadenocarcinoma, diffuse large B-cell lymphoma, dysproliferative changes (dysplasias and metaplasias), embryonal carcinoma, endometrial cancer, endotheliosarcoma, ependymoma, epithelial carcinoma, erythroleukemia, esophageal cancer, estrogen-receptor positive breast cancer, essential thrombocythemia, Ewing’s tumor, fibrosarcoma, follicular lymphoma, germ cell testicular cancer, glioma, glioblastoma, gliosarcoma, heavy chain disease, hemangioblastoma, hepatoma, hepatocellular cancer, hormone sensitive and insensitive prostate cancer, enzalutamide (XT ANDI) and abiraterone resistant prostate cancer in the pre- and post- chemo stages, leiomyosarcoma, leukemia, liposarcoma, lung cancer, lymphagioendotheliosarcoma, lymphangiosarcoma, lymphoblastic leukemia, lymphoma (Hodgkin’s and non-Hodgkin’s), malignancies and hyperproliferative disorders of the bladder, breast, colon, lung, ovaries, pancreas, prostate, skin and uterus, lymphoid malignancies of T-cell or B-cell origin, leukemia, lymphoma, medullary carcinoma, medulloblastoma, melanoma, meningioma, mesothelioma, multiple myeloma, myelogenous leukemia, myeloma, myxosarcoma, neuroblastoma, NUT midline carcinoma (NMC), non-small cell lung cancer, oligodendroglioma, oral cancer, osteogenic sarcoma, ovarian cancer, pancreatic cancer, papillary adenocarcinomas, papillary carcinoma, pinealoma, polycythemia vera, prostate cancer, rectal cancer, renal cell carcinoma, retinoblastoma, rhabdomyosarcoma, sarcoma, sebaceous gland carcinoma, seminoma, skin cancer, small cell lung carcinoma, solid tumors (carcinomas and sarcomas), small cell lung cancer, stomach cancer, squamous cell carcinoma, synovioma, sweat gland carcinoma, thyroid cancer, Waldenstrom’s macroglobulinemia, testicular tumors, uterine cancer and Wilms’ tumor. In some embodiments, the cancer in the individual has one or more mutations or amplification or overexpression of the genes encoding BET proteins. In someembodiments, the cancer in the individual has mutation or amplification or overexpression of BRD4. In some embodiments, the cancer in the individual has mutation or amplification or overexpression of c-MYC. In some embodiments, the cancer in the individual has mutation or amplification or overexpression of MYCN. In some embodiments, the cancer in the individual is characterized by Androgen Receptor (AR) expression. In some embodiments, a method of treating a disease in an individual is provided, the method comprising (a) administering an effective amount of a crystalline form disclosed herein, e.g., any one of Forms I, II, III, IV, V, VI, VII, VIII, IX, X, XI, XII, XIII, or XIV, and (b) administering an effective amount of a DNA damage repair (DDR) pathway inhibitor. In some embodiments, the crystalline form disclosed herein, e.g., any one of Forms I, II, III, IV, V, VI, VII, VIII, IX, X, XI, XII, XIII, or XIV, is administered prior to, after, or simultaneously co-administered with the DDR pathway inhibitor. In some embodiments, the crystalline form disclosed herein, e.g, any one of Forms I, II, III, IV, V, VI, VII, VIII, IX, X, XI, XII, XIII, or XIV, is administered 1 or more hours (such as 2 or more hours, 4 or more hours, 8 or more hours, 12 or more hours, 24 or more hours, or 48 or more hours) prior to or after the DDR pathway inhibitor. Examples of inhibitors of the DDR pathway include poly(ADP -ribose) polymerase (PARP) inhibitors (such as olaparib, rucaparib, niraparib, or talazoparib), ataxia telangiectasia mutated (ATM) protein inhibitors, ataxia telangiectasia and Rad3 -related (ATR) protein inhibitors, checkpoint kinase 1 (Chkl) inhibitors, or combinations thereof. In some embodiments, the crystalline form is Form I, Form II, Form III, Form IV, Form V, Form VI, Form VIII, Form IX, Form X, Form XI, Form XII, Form XIII, Form XIV, the mono-acetone solvate form, or the di-acetone solvate form. In some embodiments, the crystalline form is Form I, Form II, or Form X. In some embodiments of any of the foregoing, the crystalline form is Form I. In some embodiments of any of the foregoing, the crystalline form is Form II. In some embodiments of any of the foregoing, the crystalline form is Form X.In some embodiments, a method of treating a disease in an individual is provided, the method comprising (a) administering an effective amount of a crystalline form disclosed herein, e.g., any one of Forms I, II, III, IV, V, VI, VII, VIII, IX, X, XI, XII, XIII, or XIV, and (b) administering an effective amount of an endocrine therapy agent. In some embodiments, the endocrine therapy is antiestrogen therapy. In some embodiments, the endocrine therapy is a selective estrogen receptor degrader (SERD, such as fulvestrant). In some embodiments, the endocrine therapy is an aromatase inhibitor (such as letrozole). In some embodiments, the endocrine therapy is an anti-androgen therapy (such as enzalutamide or apalutamide). In some embodiments, the endocrine therapy is a CYP17 inhibitor (such as abiraterone). Insome embodiments, the crystalline form disclosed herein, e.g., any one of Forms I, II, III, IV, V, VI, VII, VIII, IX, X, XI, XII, XIII, or XIV, is administered prior to, after, or simultaneously co-administered with the endocrine therapy agent. In some embodiments, the crystalline form disclosed herein, e.g., any one of Forms I, II, III, IV, V, VI, VII, VIII, IX, X, XI, XII, XIII, or XIV, is administered 1 or more hours (such as 2 or more hours, 4 or more hours, 8 or more hours, 12 or more hours, 24 or more hours, or 48 or more hours) prior to or after the endocrine therapy agent. In some embodiments, the crystalline form is Form I, Form II, Form III, Form IV, Form V, Form VI, Form VIII, Form IX, Form X, Form XI, Form XII, Form XIII, Form XIV, the mono-acetone solvate form, or the di -acetone solvate form. In some embodiments, the crystalline form is Form I, Form II, or Form X. In some embodiments of any of the foregoing, the crystalline form is Form I. In some embodiments of any of the foregoing, the crystalline form is Form II. In some embodiments of any of the foregoing, the crystalline form is Form X.Kits

[0157] The present disclosure further provides kits for carrying out the methods of the invention, which comprises one or more crystalline forms described herein or a composition comprising a crystalline form described herein. The kits may employ any of the crystalline forms disclosed herein. The kits may be used for any one or more of the uses described herein, and, accordingly, may contain instructions for the treatment of cancer.

[0158] Kits generally comprise suitable packaging. The kits may comprise one or more containers comprising any crystalline form described herein. Each component (if there is more than one component) can be packaged in separate containers or some components can be combined in one container where cross-reactivity and shelf life permit.

[0159] The kits may optionally include a set of instructions, generally written instructions, although electronic storage media (e.g., magnetic diskette or optical disk) containing instructions are also acceptable, relating to the use of component(s) of the methods of the present invention. The instructions included with the kit generally include information as to the components and their administration to an individual.

[0160] The invention can be further understood by reference to the following examples, which are provided by way of illustration and are not meant to be limiting.Examples

[0161] The following examples are provided to further aid in understanding the embodiments disclosed in the application, and presuppose an understanding of conventional methods well known to those persons having ordinary skill in the art to which the examples pertain. The particular materials and conditions described hereunder are intended to exemplify particular aspects of embodiments disclosed herein and should not be construed to limit the reasonable scope thereof.

[0162] The following abbreviations may be used herein:

[0163] The crystalline forms were characterized by various analytical techniques, including XRPD, DSC, TGA, and DVS using the procedures described below.XRPD

[0164] XRPD was performed with a Panalytical X' Pert3X-ray Powder XRPD on a Si zero-background holder. The 29 position was calibrated against a Panalytical Si reference standard disc. The XRPD parameters used are listed in the table below.Parameters for XRPD testTGA and DSC

[0165] TGA data were collected using a TA Discovery550 TGA from TA Instruments.DSC was performed using a TA Q2000 DSC from TA Instruments. DSC was calibrated with Indium reference standard and the TGA was calibrated using nickel reference standard.Detailed parameters used are , table below.Parameters for TGA and DSC testDVS

[0166] DVS was measured via a SMS (Surface Measurement Systems) DVS Intrinsic. The relative humidity at 25 °C was calibrated against the deliquescence point of LiCl, Mg(NOs)2 and KC1. Parameters for DVS test are listed in the table below.Parameters for DVS testPLM

[0167] Polarized light microscopic picture was captured on Nikon DS-Fi2 upright microscope at room temperature.Single Crystal

[0168] Single crystal indexing was performed via Bruker D8 Venture.Example 1. Preparation of Compound of Formula (I)

[0169] Compound of Formula (I) was prepared as disclosed in U.S. Patent Publication No. US 2021 / 0002293 Al, which is hereby incorporated by reference in its entirety.Example 2. Preparation of Form I

[0170] 25mg Compound of Formula (I) was added to a vial and DCM was added until a thin slurry was obtained. The slurry was stirred at RT for 48 hours. The solids were filtered, dried, and analyzed. Form I was isolated through a Di-DCM solvate, which was prepared by slurrying Compound of Formula (I) in DCM at RT as described above. The Di-DCM solvate was fragile and broke in ambient conditions. Desolvation of the Di-DCM solvate led to Form I. The XRPD overlay of Di-DCM solvate at 223K, Di-DCM solvate at ambient, desolvated Di-DCM solvate is shown in FIG. ID. Even though additional solvents were involved in the isolation process, the process consistently yielded the Di-DCM solvate, which converted to Form I upon drying. The product was analyzed by XRPD, DSC, TGA, and DVS. The XRPD pattern is shown in FIG. 1 A. The TGA and DSC graphs are shown in FIG. IB. The DVS graph is shown in FIG. 1C. Form I was also prepared by solvent-anti solvent experiment.Saturated solution of Compound of Formula (I) in DCM was prepared and Heptane was added as anti-solvent until precipitates were obtained. The solids were filtered, dried, and analyzed.

[0171] Form I was highly crystalline with a melting endotherm with an onset temperature of 154.1 °C and an enthalpy of ~46 J / g. Since this is not a melt of a true anhydrous phase, but a phase obtained by desolvation, the onset and enthalpy of melting can show some deviation from the above-mentioned numbers. Form I was hygroscopic showing water uptake of ~2.7 weight percent at 80%RH. Form I particles exhibited plate-like morphology and withstood milling without amorphous generation. The free base of Compound of Formula (I) is highly solvating and no known directly isolatable anhydrate crystalline forms were identified.Example 3. Preparation of Form II

[0172] 25mg Compound of Formula (I) was added to a vial and a mixture of IPA and water (1 : 1) was added until a thin slurry was obtained. The slurry was stirred at RT for 48 hours. The solids were filtered, dried, and analyzed. Form II (IP A: water solvate-hydrate) was prepared by slurrying Compound of Formula (I) in a mixture of IPA and water at RT as described above. Form II (pure hydrate) was prepared by slurrying Form X in water at 50 °C for 48 hours. The product was analyzed by XRPD, DSC, and TGA. The XRPD pattern is shown in FIG. 2A. The TGA and DSC graphs are shown in FIG. 2B. The dehydrated hydrate product was analyzed by DVS. The DVS graph is shown in FIG. 2C.

[0173] Form II was obtained as either a co-solvate of water with organic solvent, or pure hydrate. The unit cells between the two structures were virtually identical. The space group was the same, and the unit cell dimensions were only different by a very small degree which can be almost entirely attributed to the difference in collection temperature. The fractional coordinates in each solution are likely interchangeable, making the API molecules isomorphous. There were no observable differences in conformation between the two structures.

[0174] The DSC / TGA of Form II (pure hydrate) displayed about 3.94% weight loss and a broad endotherm with onset temperature of 87.4°C and enthalpy of 114.3 J / g. PLM of Form II (pure hydrate) revealed irregularly shaped morphology. The dehydrated Form II was subjected to DVS, and about 3% water uptake was observed at 80%RH / RT. Peak broadening was found after DVS and the water content adsorbed was close to the stoichiometric amount of water for a monohydrate, 3.4%.Example 4. Preparation of Form III

[0175] 25mg Compound of Formula (I) was added to a vial and IPA was added until a thin slurry was obtained. The slurry was stirred at RT for 48 hours. The solids were filtered, dried, and analyzed. Form III was prepared by slurrying Compound of Formula (I) in IPA at RT as described above. The product was analyzed by XRPD. The XRPD pattern is shown in FIG. 2A. Form III was obtained as a labile IPA solvate, which can convert to Form VIII upon oven drying.Example 5. Preparation of Form IV

[0176] 25mg Compound of Formula (I) was added to a vial and EtOAc or ACN was added until a thin slurry was obtained. The slurry was stirred at RT for 48 hours. The solids were filtered, dried, and analyzed. Form IV was prepared by slurrying Compound of Formula (I) in EtOAc or ACN at RT as described above. The product was analyzed by XRPD, DSC, TGA, and DVS. The XRPD pattern is shown in FIG. 2A. TGA / DSC of the form revealed 2.7% weight loss and a broad endotherm with an onset temperature of 139.2°C. DVS of Form IV showed 4.4% weight change from 0%-90%RH indicating that it is hygroscopic. The crystallinity was reduced as a result of the DVS experiment.Example 6. Preparation of Form V

[0177] 25mg Compound of Formula (I) was added to a vial and THF was added until a thin slurry was obtained. The slurry was stirred at RT for 48 hours. The solids were filtered, dried, and analyzed. Form V was prepared by slurrying Compound of Formula (I) in THF at RT as described above. Crystalline forms obtained from slurrying Compound of Formula (I) in MTBE, 2-MeTHF, or toluene at RT showed Form V-like XRPD patterns, as shown in FIG. 3. The product was analyzed by XRPD, DSC, and TGA. The XRPD pattern is shown in FIG. 2A. TGA / DSC showed a weight loss of 8.4% and an endotherm at 92.6°C (onset).Example 7. Preparation of Form VI

[0178] 25mg Compound of Formula (I) was added to a vial and acetone was added until a thin slurry was obtained. The slurry was stirred at RT for 48 hours. The solids were filtered, dried, and analyzed. Form VI was prepared by drying the product obtained by slurrying Compound of Formula (I) in acetone at RT as described above. The product was analyzed by XRPD, DSC, and TGA. The XRPD pattern is shown in FIG. 2A.

[0179] Form VI was obtained as a partially desolvated acetone solvate, which was desolvated from the mono-acetone solvate and was stable at RT. TGA / DSC of Form VI indicated 2.3% weight loss, corresponding to a stoichiometry of 0.2: 1 (Acetone: API), and an endotherm at 128.25°C (peak). Removal of acetone under oven drying or high humidity conditions resulted in crystallinity loss.Example 8. Preparation of Form VII

[0180] 25mg Compound of Formula (I) was added to a vial and a mixture of acetone and water (1: 1) was added until a thin slurry was obtained. The slurry was stirred at RT for 48 hours. The solids were filtered, dried, and analyzed. Form VII was prepared by slurrying Compound of Formula (I) in a mixture of acetone and water at RT as described above. The product was analyzed by XRPD, DSC, and TGA. The XRPD pattern is shown in FIG. 2A.

[0181] Form VII was obtained as an acetone:water solvate-hydrate. XRPD of Form VII indicated that it was crystalline. The TGA / DSC revealed 2.8% weight loss and two endotherms at 43.5 °C (onset) and 135.03 °C (onset).Example 9. Preparation of Form VIII

[0182] Form VIII was prepared by drying Form III. The product was analyzed by XPRD, DSC, and TGA. The XRPD pattern is shown in FIG. 2A.TGA / DSC of the form showed 8.7% weight loss and a broad endotherm with an onset temperature of 108.4°C.Example 10. Preparation of Form IX

[0183] 25mg Compound of Formula (I) was added to a vial and EtOH was added until a thin slurry was obtained. The slurry was stirred at 5°C for 48 hours. The solids were filtered, dried, and analyzed. Form IX was prepared by slurrying Compound of Formula (I) in EtOH at 5°C as described above. The product was analyzed by XPRD, DSC, and TGA. The XRPD pattern is shown in FIG. 2A. Form IX was obtained as an EtOH solvate and has been obtained at 5°C. XRPD of Form IX indicates that it is crystalline. The TGA / DSC revealed 6% weight loss and two endotherms at 56.3°C (peak) and 101.3°C (peak).Example 11. Preparation of Form X

[0184] 25mg Compound of Formula (I) was added to a vial and acetone was added until a thin slurry was obtained. The slurry was stirred at 5°C for 48 hours. The solids were filtered, dried, and analyzed. Form X was prepared by slurrying Compound of Formula (I) in acetone at 5°C as described above. The product was analyzed by XPRD, DSC, and TGA. The XRPDpattern is shown in FIG. 2A. XRPD overlay of the wet and dried cakes revealed no form change. TGA / DSC showed 4.1% weight loss and two endotherms: the one at 27.2° C (onset) was attributed to the solvent loss and the one at 158.9 °C (onset) was due to melting of the desolvated phase. The heat of fusion for the melting endotherm was 34.8J / g. No form change was observed after ambient and 40 °C drying. Humidity study showed that Form X was stable at 93%RH / RT.Example 12. Preparation of Form XI

[0185] Form XI was prepared by slurrying Compound of Formula (I) in cumene with temperature cycling. The product was analyzed by XPRD, DSC, and TGA. The XRPD pattern is shown in FIG. 6A. The DSC and TGA graphs are shown in FIG. 6B. The form was highly crystalline. The thermal data showed 17.3% weight loss in the TGA and a DSC endotherm at 130°C (onset). Thermal analysis was conducted and amorphous form was obtained after heating the sample past the endotherm.Example 13. Preparation of Form XII

[0186] Form XII was prepared by slurrying Compound of Formula (I) in heptane with temperature cycling. The product was analyzed by XPRD, DSC, and TGA. The XRPD pattern is shown in FIG. 7A. The DSC and TGA graphs are shown in FIG. 7B. The XRPD shows the form was crystalline. The TGA and DSC of Form XII showed 6% weight loss that started around 50°C and a broad endotherm with an onset temperature of 140°C. Heating Form XII tol60°C resulted in amorphous phase. Based on the data, Form XII was considered a heptane solvate.Example 14. Preparation of Form XIII

[0187] Form XIII was prepared by slurrying Compound of Formula (I) in DMSO at RT. The product was analyzed by XPRD, DSC, and TGA. The XRPD pattern is shown in FIG. 8A. The DSC and TGA graphs are shown in FIG. 8B. Form XIII was obtained as a DMSO solvate that is stable at RT. The XRPD indicated that Form XIII is crystalline. TGA / DSC of the form showed a weight loss of 13.2% before decomposition, and two endotherms where the small endotherm at 50°C (peak) corresponded to residual solvent loss, while the endotherm at 84°C (onset) was due to concurrent desolvation and melt. The PLM revealed irregular plate like morphology.Example 15. Preparation of Form XIV

[0188] Form XIV was prepared by slurrying the Compound of Formula (I) in MEK at RT. The product was analyzed by XPRD, DSC, and TGA. The XRPD pattern is shown in FIG. 9A. The DSC and TGA graphs are shown in FIG. 9B. Form XIV was obtained as a MEK solvate stable at RT. The XPRD pattern of the form indicated that it had low crystallinity. A two-step weight loss is shown in TGA, where 4.5% loss in the first step was followed with a 4.24% loss; two endotherms at 115.9°C and 125.4°C were observed in DSC. PLM suggested irregular shaped morphology.Example 16. Competitive Slurry

[0189] As Form X remained unchanged after desolvation and high humidity storage, comparative stability study of desolvated Form X and Form I was conducted via competitive slurry in DCM at RT. Form I was obtained after 24hrs indicating that Form I is the most stable phase in DCM.

[0190] All publications, including patents, patent applications, and scientific articles, mentioned in this specification are herein incorporated by reference in their entirety for all purposes to the same extent as if each individual publication, including patent, patent application, or scientific article, were specifically and individually indicated to be incorporated by reference.

Claims

CLAIMS1. A crystalline form of a compound of Formula (I):or a solvate or hydrate thereof.

2. The crystalline form of claim 1, wherein the crystalline form is an anhydrous crystalline form.

3. The crystalline form of claim 2, wherein the crystalline form is characterized as having an X-Ray Powder Diffraction (XRPD) pattern comprising peaks at 2-theta values of about 6.1 and about 8.5 degrees, as measured by Cu Ka radiation.

4. The crystalline form of claim 2 or 3, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 6.1, about 8.5, about11.6, about 17.0, and about 23.4 degrees, as measured by Cu Ka radiation.

5. The crystalline form of any one of claims 2-4, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 6.1, about 8.5, about 10.0, about 11.6, about 14.2, about 17.0, about 18.3, about 23.4, and about 24.9 degrees, as measured by Cu Ka radiation.

6. The crystalline form of any one of claims 2-5, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 1 A, as measured by Cu Ka radiation.

7. The crystalline form of any one of claims 2-6, wherein the crystalline form is characterized as having an endotherm peak at about 163.1 °C, as determined by DSC.

8. The crystalline form of any one of claims 2-6, wherein the crystalline form is characterized as having a DSC graph substantially as shown in FIG. IB and / or a TGA graph substantially as shown in FIG. IB.

9. The crystalline form of any one of claims 2-8, wherein the crystalline form is characterized as having water uptake of about 2.7 wt% at about 80% relative humidity at room temperature, as determined by DVS.

10. The crystalline form of any one of claims 2-9, wherein the crystalline form is characterized as having a DVS graph substantially as shown in FIG. 1C.

11. The crystalline form of claim 1, wherein the crystalline form is a hydrate or an isopropyl alcohol (IP A) and water solvate-hydrate.

12. The crystalline form of claim 11, wherein the crystalline form is an isopropyl alcohol and water solvate-hydrate.

13. The crystalline form of claim 11, wherein the solvate is a hydrate.

14. The crystalline form of any one of claims 11-13, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 7.4 and about 10.2 degrees, as measured by Cu Ka radiation.

15. The crystalline form of any one of claims 11-14, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 7.4, about 9.2, about 10.2, about 18.1, and about 18.5, as measured by Cu Ka radiation.

16. The crystalline form of any one of claims 11-15, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 2A (Form II), as measured by Cu Ka radiation.

17. The crystalline form of any one of claims 13-16, wherein the crystalline form is characterized as having an endotherm peak at about 127.6 °C, as determined by DSC.

18. The crystalline form of any one of claims 13-17, wherein the crystalline form is characterized as having a DSC graph substantially as shown in FIG. 2B.

19. The crystalline form of any one of claims 13-18, wherein the crystalline form is characterized as showing a weight loss of about 3.94 % after heating from room temperature to about 160 °C, as determined by TGA.

20. The crystalline form of any one of claims 13-19, wherein the crystalline form is characterized as having a TGA graph substantially as shown in FIG. 2B.

21. The crystalline form of any one of claims 13-20, wherein the crystalline form upon dehydration is characterized as showing water uptake of about 3 wt% at about 80% relative humidity at room temperature, as determined by DVS.

22. The crystalline form of any one of claims 13-21, wherein the crystalline form upon dehydration is characterized as having a DVS graph substantially as shown in FIG. 2C.

23. The crystalline form of claim 1, wherein the crystalline form is an isopropyl alcohol solvate.

24. The crystalline form of claim 23, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 7.3 and about 7.6 degrees, as measured by Cu Ka radiation.

25. The crystalline form of claim 23 or 24, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 7.3, about 7.6, about 8.6, about 9.0, and about 23.8, as measured by Cu Ka radiation.

26. The crystalline form of any one of claims 23-25, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 2A (Form III), as measured by Cu Ka radiation.

27. The crystalline form of claim 1, wherein the crystalline form is an ethyl acetate solvate or acetonitrile solvate.

28. The crystalline form of claim 27, wherein the crystalline form is an ethyl acetate solvate.

29. The crystalline form of claim 27, wherein the crystalline form is an acetonitrile solvate.

30. The crystalline form of any one of claims 27-29, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of 6.0 and about6.9 degrees, as measured by Cu Ka radiation.

31. The crystalline form of any one of claims 27-30, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 6.0, about 6.9, about 11.7, about 15.0, and about 16.4 degrees, as measured by Cu Ka radiation.

32. The crystalline form of any one of claims 27-31, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 2A (Form IV), as measured by Cu Ka radiation.

33. The crystalline form of claim 1, wherein the crystalline form is a tetrahydrofuran solvate.

34. The crystalline form of claim 33, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 6.6 and 9.5 degrees, as measured by Cu Ka radiation.

35. The crystalline form of claim 34, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 6.6, about 9.5, about 10.6, about 14.7, and about 16.8 degrees, as measured by Cu Ka radiation.

36. The crystalline form of any one of claims 33-35, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 2A (Form V), as measured by Cu Ka radiation.

37. The crystalline form of claim 1, wherein the crystalline form is an acetone solvate of stoichiometry of 0.2: 1 (Acetone : Compound of Formula (I)).

38. The crystalline form of claim 37, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 16.4, about 16.7, and about 24.8 degrees, as measured by Cu Ka radiation.

39. The crystalline form of claim 37 or 38, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of 14.6, about 15.4, about 16.4, about 16.7, and / or about 24.8 degrees, as measured by Cu Ka radiation.

40. The crystalline form of any one of claims 37-39, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 2A (Form VI), as measured by Cu Ka radiation.

41. The crystalline form of claim 1, wherein the crystalline form is an acetone and water solvate-hydrate.

42. The crystalline form of claim 41, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 7.6, about 8.7, and about 16.5 degrees, as measured by Cu Ka radiation.

43. The crystalline form of claim 41 or 42, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 7.6, about 8.7, about 15.3, about 16.5, and about 21.7 degrees, as measured by Cu Ka radiation.

44. The crystalline form of any one of claims 41-43, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 2A (Form VII), as measured by Cu Ka radiation.

45. The crystalline form of any one of claim 1, wherein the crystalline form is an IPA solvate.

46. The crystalline form of claim 45, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 7.9, about 8.8, and about 14.0 degrees, as measured by Cu Ka radiation.

47. The crystalline form of claim 45 or 46, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 7.9, about 8.8, about 14.0, about 17.6, and 20.1 degrees, as measured by Cu Ka radiation.

48. The crystalline form of any one of claims 43-45, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 2A (Form VIII), as measured by Cu Ka radiation.

49. The crystalline form of any one of claim 1, wherein the crystalline form is an ethanol solvate.

50. The crystalline form of claim 49, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 7.8, about 8.2, and about 16.8 degrees, as measured by Cu Ka radiation.

51. The crystalline form of claim 49 or 50, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 7.8, about 8.2, about 8.9, about 13.4, and about 16.8 degrees, as measured by Cu Ka radiation.

52. The crystalline form of any one of claims 49-51, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 2A (Form IX), as measured by Cu Ka radiation.

53. The crystalline form of any one of claim 1, wherein the crystalline form is an acetone solvate.

54. The crystalline form of claim 53, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 16.7, about 15.9, and about 19.5 degrees, as measured by Cu Ka radiation.

55. The crystalline form of claim 53 or 54, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 16.7, about 15.9, about 19.5, about 12.7, and about 16.9 degrees, as measured by Cu Ka radiation.

56. The crystalline form of any one of claims 53-55, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 2A (Form X), as measured by Cu Ka radiation.

57. The crystalline form of any one of claim 1, wherein the crystalline form is a cumene solvate.

58. The crystalline form of claim 57, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 14.6, about 22.1, and about 22.5 degrees, as measured by Cu Ka radiation.

59. The crystalline form of claim 57 or 58, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 9.3, about 10.5, about 14.6, about 22.1, and about 22.5 degrees, as measured by Cu Ka radiation.

60. The crystalline form of any one of claims 57-59, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 6A, as measured by Cu Ka radiation.

61. The crystalline form of any one of claim 1, wherein the crystalline form is a heptane solvate.

62. The crystalline form of claim 61, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 6.7, about 9.2, and about 14.6 degrees, as measured by Cu Ka radiation.

63. The crystalline form of claim 61 or 62, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of 6.7, about 9.2, about 10.6, about 14.6, and about 15.7 degrees, as measured by Cu Ka radiation.

64. The crystalline form of any one of claims 61-63, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 7A, as measured by Cu Ka radiation.

65. The crystalline form of any one of claim 1, wherein the crystalline form is a DMSO solvate.

66. The crystalline form of claim 65, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 6.5, about 19.3, and about 21.7 degrees, as measured by Cu Ka radiation.

67. The crystalline form of claim 65 or 66, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 6.5, about 12.9, about 19.3, about 21.7, and about 23.3 degrees, as measured by Cu Ka radiation.

68. The crystalline form of any one of claims 65-67, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 8A, as measured by Cu Ka radiation.

69. The crystalline form of any one of claim 1, wherein the crystalline form is a methyl ethyl ketone (MEK) solvate.

70. The crystalline form of claim 69, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 8.2 and about 9.9 degrees, as measured by Cu Ka radiation.

71. The crystalline form of claim 69 or 70, wherein the crystalline form is characterized as having an XRPD pattern comprising peaks at 2-theta values of about 8.2, about 9.9, about 14.5, and about 18.3 degrees, as measured by Cu Ka radiation.

72. The crystalline form of any one of claims 69-71, wherein the crystalline form is characterized as having an XRPD pattern substantially as shown in FIG. 9A, as measured by Cu Ka radiation.

73. A method of preparing the crystalline form of any one of claims 2-10, comprising desolvating a Di-DCM solvate of Compound of Formula (I).

74. The method of claim 73, wherein the Di-DCM solvate is obtained by slurrying Compound of Formula (I) in DCM.

75. The method of claim 73 or 74, wherein the Di-DCM solvate is obtained by slurrying Compound of Formula (I) in DCM at room temperature.

76. The method of any one of claims 73-75, wherein desolvating the Di-DCM solvate comprises drying the Di-DCM solvate.

77. A method of preparing the crystalline form of any one of claims 11-22, comprising slurrying Compound of Formula (I) in a mixture of IP A and water at room temperature.

78. A method of preparing the crystalline form of any one of claims 23-26, comprising comprising slurrying the Compound of Formula (I) in IPA at room temperature.

79. A method of preparing the crystalline form of any one of claims 27-32, comprising slurrying Compound of Formula (I) in EtOAc or ACN at room temperature.

80. A method of preparing the crystalline form of any one of claims 33-36, comprising slurrying Compound of Formula (I) in THF at room temperature.

81. A method of preparing the crystalline form of any one of claims 37-40, comprising drying the product obtained by slurrying Compound of Formula (I) in acetone at room temperature.

82. A method of preparing the crystalline form of any one of claims 41-44, comprising slurrying Compound of Formula (I) in a mixture of acetone and water at room temperature.

83. A method of preparing the crystalline form of any one of claims 45-48, comprising drying the crystalline form of any one of claims 23-26.

84. A method of preparing the crystalline form of any one of claims 49-52, comprising slurrying Compound of Formula (I) in EtOH at 5°C.

85. A method of preparing the crystalline form of any one of claims 53-56, comprising slurrying Compound of Formula (I) in acetone at 5°C.

86. A method of preparing the crystalline form of any one of claims 57-60, comprising slurrying the Compound of Formula (I) in cumene.

87. A method of preparing the crystalline form of any one of claims 61-64, comprising slurrying the Compound of Formula (I) in heptane.

88. A method of preparing the crystalline form of any one of claims 65-68, comprising slurrying the Compound of Formula (I) in DMSO at room temperature.

89. A method of preparing the crystalline form of any one of claims 69-72, comprising slurrying Compound of Formula (I) in MEK at room temperature.

90. A composition comprising the crystalline form of any one of claims 1-72 and a pharmaceutically acceptable excipient.

91. A method of treating cancer in an individual in need thereof, comprising administering a therapeutically effective amount of the crystalline form of any one of claims 1-72.

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