X-ray inspection device

Abstract

To provide an X-ray inspection device capable of reducing a risk of outflow of an article sample while reducing a worker's work burden even in the case of an inspection of probability of an inspection during production of an article.SOLUTION: An X-ray inspection device 1 comprises: a conveyance section 5 for conveying an article; an irradiation section 6 for applying X rays to an article conveyed by the conveyance section 5; a sensor section 7 for detecting X rays; and a control section 10 for generating an inspection image including an article G from a detection result of X rays in the sensor section 7 and inspecting whether or not the article is abnormal on the basis of the inspection image. The control section generates a pseudo defective image including virtual abnormality by changing a partial pixel value of a pixel for composing an inspection image generated when inspecting an article, and inspects probability of inspection on the basis of the pseudo defective image.SELECTED DRAWING: Figure 3

Description

[Technical Field]

[0001] One aspect of the present invention relates to an X-ray inspection apparatus. [Background technology]

[0002] An X-ray inspection device is known that includes a conveying unit that conveys an article, an irradiation unit that irradiates the article conveyed by the conveying unit with X-rays, a sensor that detects the X-rays that have passed through the article, and a control unit that generates an inspection image (X-ray transmission image) from the X-rays detected by the sensor and inspects the article based on the inspection image. At production sites where such X-ray inspection devices are used, the reliability of the inspection is sometimes checked by randomly running test pieces through the production line during normal operation of the production line to check whether the X-ray inspection device can normally detect target foreign objects. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Laid-Open No. 2005-3481 Summary of the Invention [Problem to be solved by the invention]

[0004] However, preparing product samples with test pieces attached and then running the product samples through the production line to check the accuracy of the inspection places a significant burden on workers. Furthermore, since the inspection is performed during product production, there is a risk that the product samples will be lost. Similar risks also exist when other inspections, such as for shape abnormalities or quantity inspections, are performed during production.

[0005] Therefore, an object of one aspect of the present invention is to provide an X-ray inspection device that can reduce the workload of workers and reduce the risk of article samples being leaked, even when checking the accuracy of inspection during the production of articles. [Means for solving the problem]

[0006] (1) An X-ray inspection device according to one aspect of the present invention comprises a conveying unit that conveys an object, an irradiation unit that irradiates X-rays onto the object conveyed by the conveying unit, a sensor unit that detects X-rays, and a control unit that generates an inspection image including the object from the X-ray detection results of the sensor unit and inspects whether the object contains any abnormalities based on the inspection image, and the control unit generates a pseudo-failure image including virtual abnormalities by changing the pixel values ​​of some of the pixels that make up the inspection image generated when inspecting the object, and checks the accuracy of the inspection based on the pseudo-failure image.

[0007] In this configuration, the accuracy of the inspection is checked using pseudo-failure images generated from the inspection image during the inspection without using the product sample. This reduces the workload on the workers and the risk of product samples being leaked, even when the accuracy of the inspection is checked during the production of the product.

[0008] (2) In the X-ray inspection apparatus described in (1) above, the control unit may generate pseudo-failure images and automatically perform inspections after a preset time has elapsed or after a preset number of items have been inspected. In this configuration, inspection of the accuracy of the inspection is automatically performed according to preset rules. This reduces the burden on the operator.

[0009] (3) In the X-ray inspection apparatus described in (1) above, the control unit may generate a pseudo-failure image by extracting the outline of an article included in the inspection image and changing the pixel values ​​of some of the pixels inside the extracted outline. In this configuration, the pseudo-failure image generated by the control unit is an image similar to an inspection image acquired when an abnormality occurs in an article produced on a production line. This allows the accuracy of the inspection to be checked based on an inspection image that would actually be acquired when an abnormality occurs in an article produced on a production line, thereby improving the accuracy of the inspection.

[0010] (4) In the X-ray inspection apparatus described in any one of (1) to (3) above, the control unit may generate the pseudo-failure image of an object containing a foreign substance, and if an inspection based on the pseudo-failure image yields an inspection result showing that no foreign substance is contained, determine that there is a problem with the accuracy of the inspection. With this configuration, it is possible to detect an abnormality in which an object that should normally be determined to contain a foreign substance is determined not to contain a foreign substance.

[0011] (5) In the X-ray inspection apparatus described in any one of (1) to (3) above, the control unit may generate a pseudo-failure image indicating that the object contains a foreign object, and if an inspection based on the inspection image indicates that the object contains a foreign object, the control unit may control the sorting unit to sort the object in a direction different from the direction in which normal objects without foreign objects are transported by the transport unit, and if an inspection based on the pseudo-failure image indicates that the object does not contain a foreign object, the control unit may stop transporting the object by the transport unit. In this configuration, an object determined to contain a foreign object can be distinguished from a normal object and discharged outside the system. Furthermore, in this configuration, if it is determined that the inspection was not performed correctly, transport by the transport unit is stopped, thereby preventing an object containing a foreign object from being treated as a normal object after inspection.

[0012] (6) In the X-ray inspection apparatus described in any one of (1) to (3) above, the control unit may generate a pseudo-fault image containing an abnormality in the shape of the article, and when an inspection based on the pseudo-fault image yields an inspection result showing that the shape of the article does not contain an abnormality, the control unit may determine that there is a problem with the accuracy of the inspection. With this configuration, it is possible to detect an abnormality that would normally be determined to be an abnormality in the shape but would otherwise be determined to be no abnormality in the shape.

[0013] (7) In the X-ray inspection apparatus described in any one of (1) to (3) above, the article includes a plurality of components, and the control unit may generate a pseudo-failure image in which at least one of the plurality of components includes a shape abnormality, and when an inspection based on the pseudo-failure image yields an inspection result indicating that the shape of the article does not include an abnormality, determine that there is a problem with the accuracy of the inspection. With this configuration, it is possible to detect an abnormality in which at least one of the articles including a plurality of components is determined to have no shape abnormality, even though it should normally be determined to have a shape abnormality. [Effects of the Invention]

[0014] According to one aspect of the present invention, even when checking the accuracy of inspection during the production of an article, the workload on the worker can be reduced and the risk of article samples being leaked can be reduced. [Brief explanation of the drawings]

[0015] [Figure 1] FIG. 1 is a configuration diagram of an X-ray inspection apparatus according to an embodiment. [Figure 2] FIG. 2 is a diagram showing the internal configuration of the shielding box shown in FIG. [Figure 3] FIG. 3 is a block diagram showing the functional configuration of the X-ray inspection apparatus of FIG. [Figure 4] FIG. 4 is a flowchart showing the operation of the X-ray inspection apparatus according to one embodiment. [Figure 5] Fig. 5(A) is an example of a virtual foreign substance image, Fig. 5(B) is an example of an inspection image, and Fig. 5(C) is an example of an inspection image. [Figure 6] Fig. 6(A) is an example of a pseudo-failure image, and Fig. 6(B) is an example of a pseudo-failure image generated based on an inspection image containing a foreign particle. [Figure 7] Fig. 7(A) is an example of an inspection image according to a modified example, and Fig. 7(B) is an example of a pseudo-failure image generated based on an inspection image including a shape abnormality portion. DETAILED DESCRIPTION OF THE INVENTION

[0016] An X-ray inspection apparatus 1 according to one embodiment will be described below with reference to the drawings. In the description of the drawings, the same elements are given the same reference numerals, and duplicated description will be omitted.

[0017] 1 to 3, the X-ray inspection device 1 includes an apparatus main body 2, support legs 3, a shielding box 4, a transport conveyor 5, an X-ray irradiation unit 6, an X-ray detection unit (sensor unit) 7, a display 8, a controller (control unit) 10, and a memory unit 10A. The X-ray inspection device 1 acquires an inspection image IM of the item G while transporting the item G, and inspects the item G for foreign matter contamination based on the inspection image IM.

[0018] Items G before inspection are carried into the X-ray inspection device 1 by a carry-in conveyor 9A, and items G after inspection are carried out by an unloading conveyor 9B from the X-ray inspection device 1. Items G determined to be defective by the X-ray inspection device 1 are sorted out of the production line (outside the system) by a sorting device (sorting section) 15 arranged downstream of the unloading conveyor 9B, and items G determined to be non-defective by the X-ray inspection device 1 pass through the sorting device as is.

[0019] The device main body 2 houses a controller 10 and other components. The support legs 3 support the device main body 2. The shielding box 4 is provided on the device main body 2 and prevents leakage of X-rays. The shielding box 4 has an inlet 4a and an outlet 4b. An item G before inspection is carried into the shielding box 4 from the carry-in conveyor 9A via the inlet 4a, and an item G after inspection is carried out from the shielding box 4 to the outlet 4b via the outlet 4b onto the outlet conveyor 9B. An X-ray shielding curtain (not shown) is provided at each of the inlet 4a and the outlet 4b to prevent leakage of X-rays. The detection sensor 13 detects the item G transported by the carry-in conveyor 9A. The detection result by the detection sensor 13 is acquired by the controller 10.

[0020] The transport conveyor 5 is disposed within the shielding box 4, and transports the articles G in a transport direction D from the inlet 4a to the outlet 4b. The transport conveyor 5 is, for example, a belt conveyor stretched between the inlet 4a and the outlet 4b. The X-ray irradiator 6 is disposed within the shielding box 4, and irradiates the articles G transported by the transport conveyor 5 with X-rays. The irradiation of X-rays by the X-ray irradiator 6 is controlled by a controller 10.

[0021] The X-ray detection unit 7 is disposed within the shielding box 4 and detects X-rays irradiated from the X-ray irradiation unit 6 and transmitted through the article G and the transport conveyor 5. The X-ray detection unit 7 is configured, for example, as a line sensor. Specifically, the X-ray detection unit 7 has a plurality of photodiodes arranged one-dimensionally along a horizontal direction perpendicular to the transport direction D, and a scintillator arranged on the X-ray incident side of each photodiode. In this case, in the X-ray detection unit 7, X-rays incident on the scintillator are converted into light, and the light incident on each photodiode is converted into an electrical signal. The electrical signal detected by the X-ray detection unit 7 is acquired by the controller 10.

[0022] The display 8 is provided on the device main body 2. The display 8 has a display screen as a touch panel and a speaker. The display 8 functions as an operation input unit that accepts input of various conditions via the display screen. The display 8 functions as a display unit that displays the inspection results of the X-ray inspection device 1 via the display screen.

[0023] The controller 10 is disposed within the apparatus main body 2 and controls the operation of each component of the X-ray inspection apparatus 1. The controller 10 includes a processor such as a CPU (Central Processing Unit), memories such as a ROM (Read Only Memory) and a RAM (Random Access Memory), and storage such as an SSD (Solid State Drive). A program for controlling the X-ray inspection apparatus 1 is recorded in the ROM. The controller 10 may be configured as software in which a program stored in the ROM is loaded onto the RAM and executed by the CPU. The controller 10 may also be configured as hardware such as electronic circuits. The storage unit 10A is configured with one or more of an HDD (Hard Disk Drive), a flash memory, etc. The storage unit 10A may be provided within the apparatus main body 2, or may be provided so as to be able to communicate with the controller 10 via a network.

[0024] The controller 10 generates an inspection image IM, such as that shown in FIG. 5(B), including the article G from the X-ray detection results of the X-ray detection unit 7. The controller 10 also generates an inspection image IM, such as that shown in FIG. 5(C), including the article G containing a foreign matter F from the X-ray detection results of the X-ray detection unit 7. The controller 10 inspects whether the article G contains a foreign matter F based on this inspection image IM.

[0025] The controller 10 of this embodiment generates a pseudo-fault image VI, such as that shown in FIG. 6(A) or 6(B), which includes a virtual foreign substance VF, such as that shown in FIG. 5(A), by changing the pixel values ​​of some of the pixels constituting the inspection image IM generated during inspection of the article G. The controller 10 acquires the inspection image IM of the article G conveyed from the upstream side and extracts the outline of the article G. The outline of the article G can be extracted by known methods such as binarization, sharpening, pattern matching, etc.

[0026] The controller 10 generates a pseudo-failure image VI including a virtual foreign particle VF, for example, as shown in Figure 6(A) or 6(B), by changing the pixel values ​​of some of the pixels inside the outline thus obtained. Figure 6(A) is a pseudo-failure image VI in which a virtual foreign particle VF is included in an inspection image IM of an article G that does not contain a foreign particle F. Figure 6(B) is a pseudo-failure image VI in which a virtual foreign particle VF is included in an inspection image IM of an article G that contains a foreign particle F.

[0027] The controller 10 checks the accuracy of the inspection based on the pseudo-fault image VI thus formed. Here, "checking the accuracy of the inspection" means checking whether or not a foreign substance F identified from one or more of the elements of the foreign substance F, which are identified from size, thickness, material, etc., can be detected. The elements to be checked (in other words, required performance) can be set via the display 8. The controller 10 determines whether or not a predetermined required performance is met based on the pseudo-fault image VI.

[0028] When generating the pseudo-fault image VI, a modification value that determines how much to modify the pixel values ​​of some of the pixels described above in accordance with the required performance is stored in the memory unit 10A. Furthermore, the modification value that determines how much to modify the pixel values ​​of some of the pixels described above is set based on an acquired inspection image of a possible foreign substance F. The memory unit 10A may also store a plurality of foreign substance patterns that specify the number and shape of pixels to be modified, assuming a plurality of foreign substances F. For example, possible foreign substance patterns include round foreign substances F and elongated foreign substances F. The controller 10 may be configured to be able to set what foreign substance pattern the pseudo-fault image VI should be based on when generating the pseudo-fault image VI.

[0029] The controller 10 generates a pseudo-fault image VI and automatically performs an inspection when a preset time (e.g., 1 hour) has elapsed since the start of production of the article G (since the start of inspection) or when a preset number of articles G (e.g., 1,000 articles) have been inspected. In other words, the controller 10 performs a normal inspection to check whether or not the article G contains a foreign matter F based on the inspection image IM until a preset time (e.g., 1 hour) has elapsed since the start of production of the article G or until a preset number of articles G (e.g., 1,000 articles) have passed through the X-ray inspection apparatus 1.

[0030] The controller 10 generates the pseudo-fault image VI only when a preset time (e.g., one hour) has elapsed since the start of production of the article G, or when a preset number of articles G (e.g., 1,000) have passed through the X-ray inspection apparatus 1. The controller 10 inspects whether or not the article G contains a foreign substance F based on the pseudo-fault image VI that is automatically generated at such timing. That is, the X-ray inspection apparatus 1 checks the accuracy of the inspection according to a predetermined schedule. If the inspection based on the pseudo-fault image VI gives an inspection result indicating that the article does not contain a foreign substance F, the controller 10 determines that there is a problem with the accuracy of the inspection. If the inspection based on the pseudo-fault image VI gives an inspection result indicating that the article contains a foreign substance F, the controller 10 determines that there is no problem with the accuracy of the inspection. In this way, the controller 10 checks the accuracy of the inspection based on the pseudo-fault image VI.

[0031] The controller 10 controls the sorting of the sorting device 15 arranged downstream of the X-ray inspection device 1. If the item G is determined to be normal (does not contain foreign matter F) in the above-mentioned normal inspection, the controller 10 conveys the item G being transported by the discharge conveyor 9B downstream without operating the sorting device 15. If the item G is determined to be abnormal (contains foreign matter F) in the above-mentioned normal inspection, the controller 10 operates the sorting device 15 to sort the item G outside the production line (in a direction different from the direction of transport in the transport section).

[0032] Examples of the sorting device 15 include an arm-type sorting device using an arm, a drop-up belt-type sorting device, a pusher-type sorting device using a pusher device, a drop flap-type sorting device, an air jet-type sorting device, and a fin-type sorting device.

[0033] If the controller 10 obtains an inspection result indicating that no foreign matter F is contained in the inspection result based on the pseudo-failure image VI described above, in other words, if it is determined that there is a problem with the inspection result, it stops the transport of the article G by the carry-in conveyor 9A, the transport conveyor 5, and the carry-out conveyor 9B. That is, in this case, the controller 10 determines that the current inspection by the X-ray inspection apparatus 1 does not satisfy the predetermined required performance, and stops the operation of the production line. The controller 10 may notify an operator or the like that there is a problem with the inspection result of the inspection result based on the pseudo-failure image VI, for example, by displaying this on the display 8.

[0034] Next, mainly with reference to FIG. 4, the operation of the X-ray inspection apparatus 1 when an article G is produced will be described. As shown in FIG. 4, when production of the article G starts (step S1), the controller 10 resets a counter that counts the number of inspections (step S2). The controller 10 counts the articles G transported to the X-ray inspection apparatus 1 (step S3). The controller 10 counts the articles G based on the detection result of the detection sensor 13 that detects the articles G flowing on the carry-in conveyor 9A. The X-ray inspection apparatus 1 acquires an inspection image (X-ray transmission image) IM of the article G transported thereto (step S4). The controller 10 confirms the number of inspections when the inspection image IM is acquired (step S5).

[0035] When the controller 10 confirms that the inspection number i is smaller than a predetermined number N (e.g., N=1000) (step S5: YES), it performs a normal inspection to check whether or not the item G contains a foreign matter F based on the inspection image IM (step S6). Here, if the controller 10 determines that the item G contains a foreign matter F based on the result of the normal inspection based on the inspection image IM (step S6: YES), it operates the sorting device 15 (step S7) to discharge the corresponding item G from the system. That is, the sorting device 15 prevents the item G containing the foreign matter F from being transported downstream of the discharge conveyor 9B. On the other hand, if the controller 10 determines that the item G does not contain a foreign matter F based on the result of the normal inspection based on the inspection image IM (step S6: NO), it does not operate the sorting device 15 and causes the item G to be transported downstream of the discharge conveyor 9B.

[0036] Thereafter, the controller 10 determines whether or not the production of the article G has been completed (step S8), and if it is determined that the production of the article G has been completed (step S8: YES), the series of processes ends. This ends the series of processes in the X-ray inspection apparatus 1. Note that the completion of the production of the article G here is determined, for example, by whether or not the number of articles G produced in one day has been reached. If the controller 10 determines that the production of the article G has not been completed (step S8: NO), the controller 10 returns to step S3 and increments the inspection number i by one. Thereafter, the controller 10 executes step S4 and subsequent steps.

[0037] When the controller 10 confirms that the number of inspections i is equal to or greater than a predetermined number N (e.g., N=1000) (step S5: NO), it generates a pseudo-fault image VI (step S11). The method for generating the pseudo-fault image VI is as described above. The controller 10 inspects whether or not the item G contains a foreign substance F based on the pseudo-fault image VI, and checks the accuracy of the inspection (step S12). Here, if the controller 10 determines that the item G does not contain a foreign substance F in the inspection of the accuracy of the inspection based on the pseudo-fault image VI (step S12: NO), it stops the transport of the item G by the carry-in conveyor 9A, the transport conveyor 5, and the carry-out conveyor 9B (step S13). This completes a series of processes in the X-ray inspection apparatus 1. Furthermore, when the controller 10 determines that the item G contains a foreign matter F in checking the accuracy of the inspection based on the pseudo-fault image VI (step S12: YES), it operates the sorting device 15 to discharge the corresponding item G from the system (step S14). That is, the sorting device 15 prevents the item G containing the foreign matter F from being transported downstream of the discharge conveyor 9B.

[0038] Thereafter, the controller 10 determines whether or not the production of the article G has been completed (step S15), and if it is determined that the production of the article G has been completed (step S15: YES), it terminates the series of processes in the X-ray inspection apparatus 1. If the controller 10 determines that the production of the article G has not been completed (step S15: NO), it returns to step S2, resets the number of inspections once, and then increments the number of inspections i by one (step S3). Thereafter, the controller 10 repeats step S4 and subsequent steps.

[0039] The effects of the X-ray inspection apparatus 1 of the above embodiment will be described. In the X-ray inspection apparatus 1 of the above embodiment, the accuracy of the inspection is checked using a pseudo-fault image VI generated from an inspection image IM that is normally acquired during inspection, without using a sample with a test piece attached. This reduces the workload on the worker and the risk of foreign matter F being mixed into the object G, even when the accuracy of the inspection is checked during the production of the object G.

[0040] In the X-ray inspection apparatus 1 of the above embodiment, the controller 10 determines that there is a problem with the reliability of the inspection when an inspection based on the pseudo defective image VI yields an inspection result indicating that no foreign matter F is present. This makes it possible to detect an abnormality where a foreign matter F is determined not to be present when it should actually be determined to be present, i.e., a situation in which the currently performed inspection does not satisfy the desired required performance.

[0041] In the X-ray inspection apparatus 1 of the above embodiment, the controller 10 generates a pseudo-fault image VI when a preset time has elapsed or when a preset number of items G have been inspected, and automatically performs inspection. This allows the accuracy of the inspection to be automatically checked according to preset rules. As a result, the burden on the operator can be reduced.

[0042] In the X-ray inspection apparatus 1 of the above embodiment, the controller 10 extracts the outline of the article G included in the inspection image IM, and generates the pseudo-fault image VI by changing the pixel values ​​of some of the pixels inside the extracted outline. This makes the pseudo-fault image VI generated by the controller 10 an image similar to the inspection image IM acquired when a foreign matter F is mixed into an article G produced on a production line. As a result, the accuracy of the inspection is inspected based on the inspection image IM that would actually be acquired when a foreign matter F is mixed into an article G produced on a production line, thereby improving the inspection accuracy.

[0043] In the X-ray inspection apparatus 1 of the above embodiment, when the inspection based on the inspection image IM results in the presence of a foreign matter F, the controller 10 controls the sorting device 15 to sort the items G in a direction different from the direction in which normal items G that do not contain foreign matter F are conveyed on the discharge conveyor 9B. When the inspection based on the pseudo-fault image VI results in the absence of a foreign matter F, the controller 10 stops the conveyance of the items G by the input conveyor 9A, the transport conveyor 5, and the output conveyor 9B. This allows items G determined to contain foreign matter F to be distinguished from normal items and discharged outside the system. Furthermore, when it is determined that the inspection was not performed correctly, the controller 10 stops the conveyance by the input conveyor 9A, the transport conveyor 5, and the output conveyor 9B, thereby preventing items G containing foreign matter F from being treated as normal items after inspection.

[0044] Although one embodiment has been described above, one aspect of the present invention is not limited to the above embodiment, and various modifications are possible without departing from the spirit of the invention.

[0045] The controller 10 of the X-ray inspection apparatus 1 of the above embodiment has been described with an example in which it generates a pseudo-failure image VI in which an article G contains a foreign matter F as an example of a pseudo-failure image containing a virtual abnormality. However, for example, it may generate a pseudo-failure image VII as shown in FIG. 7(B) in which an abnormality is included in the shape of the article G. Furthermore, in the X-ray inspection apparatus 1 of the above embodiment, the controller 10 has been described with an example in which it inspects whether an article G contains a foreign matter F based on the pseudo-failure image VI. However, for example, it may inspect whether the shape of the article G contains an abnormality based on the pseudo-failure image VII. Below, an X-ray inspection apparatus 1 that inspects whether an article G that extends in one direction, such as a wiener or a sausage, is bent will be described as an inspection apparatus that inspects whether the shape of the article G contains an abnormality.

[0046] Similar to the above embodiment, the X-ray inspection device 1 according to the modified example includes an apparatus main body 2, support legs 3, a shielding box 4, a transport conveyor 5, an X-ray irradiation unit 6, an X-ray detection unit (sensor unit) 7, a display 8, a controller (control unit) 10, and a memory unit 10A. The X-ray inspection device 1 conveys an item G in which a plurality of components B extending in one direction, such as wieners or sausages, are sealed in a bag, while acquiring an inspection image IM (see FIG. 7(A)) of the item G, and inspects whether the components B are bent based on the inspection image IM.

[0047] The controller 10 generates an inspection image IM including the item G, for example, as shown in FIG. 7(A), from the X-ray detection result in the X-ray detection unit 7. Based on this inspection image IM, the controller 10 inspects whether or not the component B includes an abnormally shaped portion AD (whether or not it includes a bent portion). Based on the inspection image IM, the controller 10 determines whether or not the component B includes an abnormally shaped portion AD, for example, using the first trained model or the second trained model.

[0048] The memory unit 10A stores first and second trained models used in inspecting whether or not component B contains an abnormally shaped portion AD, as well as programs and algorithms used to generate the first and second trained models. The first and second trained models are programs automatically set by machine learning. The first trained model is a model trained based on the contour of an object in an X-ray radiographic image. The second trained model is a model trained based on the edge of component B in an X-ray radiographic image. The first and second trained models are models capable of semantic segmentation. The first and second trained models may also be models capable of instance segmentation. Whether or not component B contains an abnormally shaped portion AD may be determined by a known method, such as pattern matching, without using the above-described trained models.

[0049] The controller 10 generates a pseudo-failure image VII including an abnormal component B1 having a virtual abnormal shape portion AD, as shown in FIG. 7B, by changing the pixel values ​​of some of the pixels constituting the inspection image IM generated during inspection of the article G. More specifically, the controller 10 acquires the inspection image IM of the article G transported from the upstream side and extracts the outlines of multiple components B included in the article G. The outlines of the components B can be extracted using known methods such as binarization, sharpening, and pattern matching. The controller 10 generates a pseudo-failure image VII including an abnormal shape portion AD, as shown in FIG. 7B, by changing the pixel values ​​of some of the pixels including the thus acquired outlines. The abnormal shape portion AD is a bent portion at the end of the component B. The pseudo-failure image VII including the abnormal shape portion AD may be formed by pasting an image of the end of the component B stored in advance in the memory unit 10A, by changing the outline based on a predetermined pattern, or by deforming the end so as to bend using known image processing.

[0050] The controller 10 checks the accuracy of the inspection based on the pseudo-fault image VII thus formed. Here, "checking the accuracy of the inspection" means, for example, using the first trained model or the second trained model, to confirm whether or not it has been correctly determined that the component B contains the abnormal shape portion AD.

[0051] The controller 10 generates a pseudo-failure image VII and automatically performs an inspection when a preset time (e.g., 1 hour) has elapsed since the start of production of the article G (since the start of inspection) or when a preset number of articles G (e.g., 1,000 pieces) have been inspected. In other words, the controller 10 performs a normal inspection to check whether the component B includes an abnormally shaped portion AD (bend) based on the inspection image IM until a preset time (e.g., 1 hour) has elapsed since the start of production of the article G or until a preset number of articles G (e.g., 1,000 pieces) have passed through the X-ray inspection device 1.

[0052] The controller 10 generates the pseudo-fault image VII only when a predetermined time (e.g., one hour) has elapsed since the start of production of the article G, or when a predetermined number of articles G (e.g., 1,000 pieces) have passed through the X-ray inspection apparatus 1. The controller 10 inspects whether or not the component B included in the article G contains an abnormally shaped portion AD based on the pseudo-fault image VII automatically generated at such timing. That is, the X-ray inspection apparatus 1 checks the accuracy of the inspection according to a predetermined schedule. When the inspection based on the pseudo-fault image VII gives an inspection result indicating that the abnormally shaped portion AD is not included, the controller 10 determines that there is a problem with the accuracy of the inspection. When the inspection based on the pseudo-fault image VII gives an inspection result indicating that the abnormally shaped portion AD is included, the controller 10 determines that there is no problem with the accuracy of the inspection. In this way, the controller 10 checks the accuracy of the inspection based on the pseudo-fault image VII.

[0053] In addition, in the X-ray inspection apparatus 1 relating to the modified example, the control of the sorting device 15 based on the inspection results, the control of the loading conveyor 9A, the transport conveyor 5 and the unloading conveyor 9B based on the reliability of the inspection, the notification method, etc. are the same as in the above embodiment, so detailed explanations will be omitted here.

[0054] The effects of the X-ray inspection apparatus 1 of the above-described modified example will be described. Conventionally, to check the accuracy of an X-ray inspection apparatus for the presence or absence of an abnormally shaped portion AD in an object B, abnormally shaped objects, such as broken sausages, were created and then released onto the production line before or during the production of goods containing these objects. However, this work is time-consuming. Furthermore, because sausages and other objects deteriorate, abnormally shaped objects must be created periodically at short intervals, resulting in product loss and the burden of creating the abnormally shaped objects. Furthermore, this type of inspection procedure also poses a risk of abnormally shaped objects being mixed in with the goods and released onto the production line.

[0055] In this regard, in the X-ray inspection apparatus 1 according to this modification, the accuracy of the inspection is checked using a pseudo-fault image VII generated from an inspection image IM that is normally acquired during inspection, without using an article sample with an abnormal shape such as a sausage. This reduces the workload on the worker and reduces the risk of a component B (article sample) having an abnormally shaped portion AD being mixed into the article G, even when checking the accuracy of the inspection during production of the article G.

[0056] In the above modified example, an example was given of inspecting whether or not component B placed in a bag has an abnormal shape, but the same method can also be used to inspect component B when it is transported alone, i.e., when component B is transported alone as item G.

[0057] Although the X-ray inspection apparatus 1 of the above embodiment and modified example has been described with reference to an example in which a foreign matter contamination inspection for inspecting whether or not a component B contains a foreign matter F, or a shape abnormality inspection for inspecting whether or not a component B contains an abnormally shaped portion AD, one aspect of the present invention is not limited to being applied to these inspections. For example, one aspect of the present invention can also be applied to an inspection for counting the number of pieces of fried chicken or the number of diced solid objects such as pot cubes, an inspection for estimating the length, width, mass, etc. of long items such as sausages, an inspection for checking the presence or absence of main ingredients, garnishes, etc. in boxed lunches, an inspection for checking the presence or absence of air bubbles in rubber sheets, etc.

[0058] In the description of the operation of the X-ray inspection apparatus 1 of the above embodiment and the above modified example, as shown in FIG. 4, an example has been given in which the controller 10 determines whether to perform the inspection certainty check based on the number of inspections, but this is not limiting. For example, the controller 10 may determine whether to perform the inspection certainty check based on the time (e.g., one hour) that has elapsed since the start of the inspection. In other words, the controller 10 may perform the inspection certainty check every predetermined elapsed time (e.g., one hour). The number of inspections or the elapsed time may be configured to be arbitrarily input by the operator via the display 8 or the like.

[0059] In the X-ray inspection apparatus 1 of the above embodiment and the above modified example, when generating the pseudo-fault image VI, the pixel values ​​of some of the above-mentioned pixels are changed based on the numerical values ​​stored in the storage unit 10A, and a pseudo-fault image VI including a virtual foreign substance VF, such as that shown in Fig. 6(A) or 6(B), is generated. However, the present invention is not limited to this. For example, a previously acquired X-ray transmission image of a foreign substance F may be stored in the storage unit 10A, and the controller 10 may synthesize the previously acquired X-ray transmission image of the foreign substance F with an inspection image IM of the article G, thereby changing the pixel values ​​of some of the above-mentioned pixels to generate a pseudo-fault image VI including a virtual foreign substance VF.

[0060] In the X-ray inspection apparatus 1 of the above embodiment and the above modified example, an example has been described in which a sorting device 15 is provided that sorts the articles G so that they are either conveyed downstream in the conveying direction on the discharge conveyor 9B or discharged outside the system, but this is not limiting. For example, in addition to the above-mentioned discharge outside the system, the sorting device 15 may also discharge the articles G to an outside of the system (hereinafter also referred to as a "second outside of the system") that is distinct from the above-mentioned discharge outside the system. In other words, the sorting device 15 of this modified example may be configured to be able to sort the articles G conveyed on the discharge conveyor 9B in three directions.

[0061] In this case, if the controller 10 determines that the item G contains a foreign matter F in checking the accuracy of the inspection based on the pseudo-fault image VI (step S12: YES), it may operate the sorting device 15 to discharge the corresponding item G to an outside system (outside the second system) different from the outside system that discharges items G that are determined to contain a foreign matter F in the normal inspection. This makes it possible to accurately manage the number of good items and the number of defective items in the production of the item G, even when checking the accuracy of the inspection during the production of the item G.

[0062] In the X-ray inspection apparatus 1 of the above embodiment and the above modified example, the controller 10 generates a pseudo-fault image VI when a preset time has elapsed since the start of production of the article G (since the start of inspection) or when a preset number of articles G have been inspected, and automatically checks the accuracy of the inspection. However, the present invention is not limited to this. For example, the controller 10 may check the accuracy of the inspection in response to an instruction from an operator input via the display 8 or the like.

[0063] In the above-described embodiment and modified example of the X-ray inspection apparatus 1, the X-ray detection unit 7 is configured with one line sensor. However, the X-ray detection unit 7 may be configured as a multi-energy sensor including a first line sensor and a second line sensor that can detect different energy bands. The X-ray detection unit 7 may be capable of detecting X-rays using a photon counting method. The X-ray detection unit 7 may be a direct conversion type detection unit or an indirect conversion type detection unit. These sensors may be arranged, for example, in at least a direction (width direction) perpendicular to the conveying direction and the up-down direction of the transport conveyor 5. The elements may be arranged not only in the width direction but also in the conveying direction. That is, the X-ray detection unit 7 may include a line sensor or a group of sensors arranged two-dimensionally. The sensor may be, for example, a photon detection type sensor such as a CdTe semiconductor detector. [Explanation of symbols]

[0064] 1...X-ray inspection device, 5...transport conveyor (transport section), 6...X-ray irradiation section (irradiation section), 7...X-ray detection section (sensor section), 8...display, 9A...feed-in conveyor, 9B...feed-out conveyor, 10...controller (control section), 10A...memory section, 13...detection sensor, 15...sorting device (sorting section), F...foreign body, G...item, B...component, IM...inspection image, VF...virtual foreign body, VI, VII...pseudo-defective image, AD...abnormally shaped part.

Claims

1. a conveying unit that conveys the article; an irradiation unit that irradiates the object transported by the transport unit with X-rays; a sensor unit for detecting the X-rays; a control unit that generates an inspection image including the item from the detection result of the X-rays by the sensor unit, and inspects whether or not the item includes an abnormality based on the inspection image, The control unit generates a pseudo-failure image containing virtual abnormalities by changing the pixel values ​​of some of the pixels that make up the inspection image generated when inspecting the item, and checks the accuracy of the inspection based on the pseudo-failure image.

2. 2. The X-ray inspection apparatus according to claim 1, wherein the control unit generates the pseudo-failure image when a preset time has elapsed or when a preset number of the articles have been inspected, and automatically performs the inspection.

3. 2. The X-ray inspection apparatus according to claim 1, wherein the control unit extracts an outline of the article included in the inspection image and generates the pseudo-fault image by changing pixel values ​​of a portion of the pixels inside the extracted outline.

4. The control unit generating the pseudo-fault image in which the article contains a foreign substance; The X-ray inspection apparatus according to any one of claims 1 to 3, wherein if the inspection based on the pseudo-fault image yields an inspection result indicating that the foreign matter is not included, it is determined that there is a problem with the reliability of the inspection.

5. The control unit generating the pseudo-fault image in which the article contains a foreign substance; When the inspection based on the inspection image results in an inspection result indicating that the foreign matter is contained, the sorting unit is controlled so as to sort the object in a direction different from the direction in which the normal object not containing the foreign matter is conveyed by the conveying unit. The X-ray inspection apparatus according to any one of claims 1 to 3, wherein if the inspection based on the pseudo-fault image results in an inspection result indicating that the foreign matter is not contained, the transport unit stops transporting the item.

6. The control unit generating the pseudo-failure image containing an abnormality in the shape of the article; The X-ray inspection device according to any one of claims 1 to 3, wherein the control unit determines that there is a problem with the reliability of the inspection when the inspection based on the pseudo-fault image yields an inspection result indicating that the shape of the item does not contain any abnormalities.

7. The article includes a plurality of components; The control unit generating a pseudo-failure image including an abnormality in the shape of at least one of the plurality of components; An X-ray inspection device according to any one of claims 1 to 3, wherein if the inspection based on the pseudo-fault image yields an inspection result showing that the shape of the item of the component does not contain any abnormalities, it is determined that there is a problem with the reliability of the inspection.

Images