Particle accommodating device, non-contact particle processing apparatus and its light sensing structure

Abstract

To provide a particle accommodating device, non-contact particle processing apparatus and its light sensing structure.SOLUTION: A particle accommodating device 1 is configured to accommodate a liquid specimen including a plurality of particles therein. The accommodating device includes: a light sensing structure 11; and a mating structure 12 disposed spaced apart from the light sensing structure. The light sensing structure includes: a substrate 111; an electrode layer 112 and a photoelectric layer 113 formed on the substrate; and an insulating body 114 formed on the photoelectric layer. The insulating body includes a charge track T projecting from the photoelectric layer. The photoelectric layer is operable to generate a plurality of charges concentrated on the charge track, such that a density of the charges on the charge track is greater than a density of the charges on an outer surface of the photoelectric layer for enabling at least one of the particles to be positioned onto the charge track through electrostatic adsorption.SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present invention relates to a particle processing device, and more particularly to a particle storage device, a non-contact particle processing device, and a light-sensing structure thereof. [Background technology]

[0002] Conventional particle processing devices can move target particles by applying an electric field, but further improvement and refinement of conventional particle processing devices is required to precisely move the target particles along a predetermined path to a predetermined target area without contacting the target particles. Summary of the Invention [Problem to be solved by the invention]

[0003] Therefore, the inventor of the present application believes that the above defects can be improved, and has devoted himself to research and applied scientific principles, ultimately proposing the present invention, which is rationally designed and effectively improves the above defects. [Means for solving the problem]

[0004] SUMMARY OF THE INVENTION The embodiments of the present invention provide a particle containment device, a non-contact particle processing apparatus, and an optical sensing structure thereof that can effectively improve upon defects that may occur in conventional particle processing apparatuses.

[0005] An embodiment of the present invention discloses a non-contact particle processing device, the non-contact particle processing device comprising: a particle storage device for storing a liquid specimen containing a plurality of particles; and an optical drive device facing the particle storage device, the particle storage device comprising: a first substrate; a first electrode layer formed on the first substrate; a photoelectric layer formed on the first substrate; a photosensitive structure having an insulator formed on the photoelectric layer; and an alignment structure provided at an interval from the photosensitive structure, the insulator comprising: a base layer embedded in the photoelectric layer; and a track layer connected to the base layer, at least a portion of which protrudes from the photoelectric layer, and having charge tracks formed on an upper edge thereof; the photoelectric layer operates to generate a plurality of charges concentrated on the charge tracks, thereby the charge tracks are electrostatically driven. At least one of the microparticles is positioned thereon by adsorption, and the at least one microparticle is defined as a target microparticle, and at least one of the light-sensing structure and the alignment structure is transparent, and the alignment structure includes a second substrate and a second electrode layer formed on the second substrate, and the second electrode layer faces the light-sensing structure, and the light-driving device forms a dielectrophoretic pattern in the light-sensing structure by emitting light that irradiates the light-sensing structure, and when the target microparticle is electrostatically adsorbed and positioned on the charge track, the light-driving device moves the dielectrophoretic pattern to press the target microparticle and move it along the charge track.

[0006] An embodiment of the present invention further discloses a particle containment device for containing a liquid sample containing a plurality of particles, the containment device comprising: a first substrate, a first electrode layer formed on the first substrate, a photoelectric layer formed on the first substrate, a light-sensing structure having an insulator formed on the photoelectric layer, and an alignment structure spaced apart from the light-sensing structure, the insulator including charge tracks protruding from the photoelectric layer, the photoelectric layer operating to generate a plurality of charges concentrated on the charge tracks, such that the charge density of the charge tracks is greater than the charge density on the outer surface of the photoelectric layer, the charge tracks position at least one of the particle on top of the charge tracks by electrostatic attraction, at least one of the light-sensing structure and the alignment structure is transparent, the alignment structure includes a second substrate and a second electrode layer formed on the second substrate, the second electrode layer facing the light-sensing structure.

[0007] An embodiment of the present invention further discloses a light-sensing structure of a non-contact particle processing device, the light-sensing structure of the non-contact particle processing device comprising: a first substrate, a first electrode layer formed on the first substrate, a photoelectric layer formed on the first substrate, and an insulator formed on the photoelectric layer, the insulator including charge orbits protruding from the photoelectric layer, the photoelectric layer operating to generate a plurality of charges concentrated on the charge orbits, so that the charge density of the charge orbits is greater than the charge density on the outer surface of the photoelectric layer. [Effects of the Invention]

[0008] From the above, the particle containing device, non-contact particle processing equipment and its optical sensing structure disclosed in the embodiments of the present invention have an insulator formed on the photoelectric layer, so that the charge trajectory of the insulator cooperates with the operation of the photoelectric layer to move and position the target particle by the above-mentioned electrostatic adsorption method, thereby enabling the target particle to be positioned accurately.

[0009] Furthermore, since the charge track can cooperate with the optical driving device, the target particles can be pressed by the dielectrophoretic pattern and move quickly on the charge track. That is, the target particles can be pressed by the dielectrophoretic pattern and move, or can move along the charge track after contact (or light collision) with the dielectrophoretic pattern. As a result, damage to the target particles caused by the photomask can be effectively reduced. [Brief explanation of the drawings]

[0010] [Figure 1] 1 is a schematic three-dimensional view of a non-contact type particle processing device according to a first embodiment of the present invention. [Figure 2] 1 is a cross-sectional view of a non-contact type particle processing device according to a first embodiment of the present invention. [Figure 3] 1 is a schematic plan view of a non-contact type particle processing device according to a first embodiment of the present invention. [Figure 4] FIG. 4 is an enlarged schematic view of region IV in FIG. 3. [Figure 5] FIG. 5 is a schematic diagram of the subsequent operation of FIG. 4. [Figure 6] 5 is a schematic diagram of another subsequent operation of FIG. 4. [Figure 7] 1 is a partial cross-sectional schematic view of a non-contact type particle processing device according to a first embodiment of the present invention. [Figure 8] FIG. 8 is a schematic diagram of the subsequent operation of FIG. 7. [Figure 9] FIG. 10 is a partial cross-sectional schematic view of a non-contact type particle processing device according to a second embodiment of the present invention. [Figure 10] FIG. 10 is a cross-sectional view showing a non-contact type particle processing device according to a third embodiment of the present invention. DETAILED DESCRIPTION OF THE INVENTION

[0011] In order to further understand the features and technical contents of the present invention, please refer to the following detailed description of the present invention and drawings, which are merely for the purpose of illustrating the present invention and are not intended to limit the protection scope of the present invention in any way.

[0012] Hereinafter, specific examples will be used to describe the embodiments of the "particle containing device, non-contact particle processing device, and optical sensing structure thereof" disclosed in the present invention. Those skilled in the art will be able to understand the advantages and effects of the present invention from the disclosed content. The present invention can be implemented or applied through other different specific embodiments, and various detailed descriptions herein can be modified and changed in various ways based on different perspectives and applications without departing from the spirit of the present invention. It should be noted in advance that the drawings of the present invention are merely schematic and are not drawn to actual scale. The technical content of the present invention will be described in more detail using the following embodiments, but the disclosed content is not intended to limit the protection scope of the present invention.

[0013] In this specification, terms such as "first," "second," etc. may be used to describe various elements, but it should be understood that these elements should not be limited by these terms. These terms are primarily used to distinguish one element from another element or one feature from another. Also, the term "or" in this specification should be understood to include any one or more combinations of the associated listed items, depending on the actual circumstances.

[0014] [Example 1] A first embodiment of the present invention will be described with reference to Figures 1 to 8. As shown in Figures 1 to 4, this embodiment discloses a non-contact particle processing device 100 including a particle containing device 1, an AC device 2 electrically coupled to the particle containing device 1, and an optically driven device 3 facing the particle containing device 1. However, the present invention is not limited thereto. For example, in other embodiments not shown in this specification, the particle containing device 1 may be applied (e.g., sold) alone according to actual needs, or may be used in combination with other devices.

[0015] In this embodiment, the particle containing device 1 is a rectangular structure of chip-scale size. Furthermore, the particle containing device 1 contains a liquid sample S containing a plurality of particles P. However, the present invention is not limited thereto. For example, the amount of particles P contained in the liquid sample S may be adjusted according to actual needs (e.g., at least one particle).

[0016] In this embodiment, the microparticles P are described as biological microparticles. Furthermore, the liquid sample S may be a body fluid sample (e.g., blood, lymph, saliva, or urine) from an animal. The microparticles P may be specific types of cells or cell clusters, such as circulating tumor cells (CTCs), fetal nucleated red blood cells (FNRBCs), or bacteria. However, the present invention is not limited thereto. For example, in other embodiments not shown herein, the liquid sample S may be a liquid sample from a plant. Furthermore, the microparticles P may be plastic microparticles that adsorb viruses, bacteria, or exosomes, depending on actual needs.

[0017] The particle containing device 1 includes a light-sensing structure 11, an alignment structure 12 provided at a distance from the light-sensing structure 11, and a bonding layer 13 that bonds the periphery of the light-sensing structure 11 to the periphery of the alignment structure 12. At least one of the light-sensing structure 11 and the alignment structure 12 is transparent, and in this embodiment, the light-sensing structure 11 and the alignment structure 12 are two plate-like structures arranged parallel to each other, with the distance between them being greater than the size of either particle P. However, the present invention is not limited thereto.

[0018] More specifically, the light-sensing structure 11 includes a first substrate 111, a first electrode layer 112 formed on the first substrate 111, a photovoltaic layer 113 formed on the first substrate 111, and an insulator 114 formed on the photovoltaic layer 113. In this embodiment, the first electrode layer 112 is formed on the bottom side of the first substrate 111, and the photovoltaic layer 113 is formed on the top side of the first substrate 111. The photovoltaic layer 113 has a plurality of transistors 1131 arranged in a matrix. Here, the photovoltaic layer 113 may have an NPN transistor structure, a PNP transistor structure, an NP diode structure, or a PN diode structure according to actual requirements. However, the present invention is not limited thereto.

[0019] The alignment structure 12 includes a second substrate 121 and a second electrode layer 122 formed on the second substrate 121. Furthermore, the second electrode layer 122 faces the light-sensing structure 11 (e.g., the photoelectric layer 113 and the insulator 114). In this embodiment, the AC device 2 is electrically coupled to the first electrode layer 112 of the light-sensing structure 11 and the second electrode layer 122 of the alignment structure 12. This allows the light-sensing structure 11 to be irradiated with light emitted by the optically driven device 3, thereby forming a dielectrophoretic pattern F. As a result, the dielectrophoretic pattern F moves any of the particles P in the liquid sample S (e.g., FIGS. 5 and 6).

[0020] For example, the photo-driven device 3 may include a camera 31 and a light source 32 corresponding to the camera 31. Here, the photo-driven device 3 can emit light from the light source 32 to irradiate the photo-sensing structure 11. As a result, a dielectrophoretic pattern F is formed in the photo-sensing structure 11 (or the photoelectric layer 113).

[0021] The insulator 114 includes charge orbitals T protruding from the photoelectric layer 113. The photoelectric layer 113 operates to generate a plurality of charges that concentrate on the charge orbitals T, thereby making the charge density of the charge orbitals T greater than the charge density on the outer surface of the photoelectric layer 113. This causes the charge orbitals T to position at least one particle P thereon by electrostatic attraction. Furthermore, the at least one particle P is defined as a target particle P1.

[0022] Here, the photoelectric layer 113 may be used to generate a plurality of charges concentrated on the charge trajectory T by receiving external ambient light. Alternatively, the photoelectric layer 113 may generate a plurality of charges concentrated on the charge trajectory T by irradiating light emitted by the photo-driven device 3 thereon. The present invention is not limited thereto.

[0023] As described above, when the target particle P1 is electrostatically adsorbed and positioned on the charge trajectory T, the optical driving device 3 moves the dielectrophoresis pattern F to press the target particle P1 and move it along the charge trajectory T (e.g., Figures 5 and 6).

[0024] Therefore, in this embodiment, the non-contact particle processing device 100 has an insulator 114 formed on the photoelectric layer 113, so that the charge trajectory T of the insulator 114 cooperates with the operation of the photoelectric layer 113 to move and position the target particle P1 by electrostatic adsorption, thereby enabling the target particle P1 to be accurately positioned.

[0025] Furthermore, since the charge trajectory T can cooperate with the optical drive device 3, the target particle P1 can be pressed by the dielectrophoretic pattern F and move quickly on the charge trajectory T. That is, the target particle P1 can move by being pressed by the dielectrophoretic pattern F (e.g., FIG. 6), or can move along the charge trajectory T after being contacted (or lightly bumped) by the dielectrophoretic pattern F (e.g., FIG. 5). As a result, damage to the target particle P1 caused by the photomask is effectively reduced.

[0026] It should be noted that, on the premise that the target particles P1 can be adsorbed on the charge trajectory T or, in addition, the target particles P1 can be moved thereon, the structure of the insulator 114 can be adjusted and changed according to actual needs. However, in order to enable the target particles P1 to move more smoothly and quickly on the charge trajectory T, it is preferable that the insulator 114 include at least some of the following technical features, but the present invention is not limited thereto.

[0027] 2, 7 and 8, the insulator 114 includes a base layer 1141 and a track layer 1142. The base layer 1141 is embedded in the photovoltaic layer 113. The track layer 1142 is connected to the base layer 1141 and at least a portion of the track layer 1142 protrudes from the photovoltaic layer 113. Furthermore, a charge track T is formed on the upper edge of the track layer 1142. It should be noted that the following description will illustrate the structure of the insulator 114 from different angles (e.g., cross-sectional view or plan view), and the insulator 114 can be designed using the structure illustrated from a specific angle according to actual needs.

[0028] Furthermore, in the cross-sectional view shown in Figure 2, the insulator 114 includes multiple blocks having substantially the same structure. However, for ease of understanding, in the following description, the insulator 114 will be described using only one of the blocks in Figure 2 (e.g., Figure 7). However, the present invention is not limited thereto. For example, in other embodiments not shown in this specification, the insulator 114 may have multiple blocks in the cross-sectional view formed with different structures.

[0029] 7 and 8 of this embodiment, the track layer 1142 includes two arms 1143 extending from the base layer 1141, and a gap G is formed between the inner surfaces 1143b of the two arms 1143. Here, the free end surfaces 1143a of the two arms 1143 are located outside the photovoltaic layer 113 and contact each other, so that the gap G is surrounded by the inner surfaces 1143b of the two arms 1143 and the base layer 1141, while the free end surfaces 1143a of the two arms 1143 form at least a part of the charge track T.

[0030] Furthermore, each arm 1143 includes an inner corner 1143c and an outer corner 1143d located on opposite sides of the free end surface 1143a. The height positions of the two inner corners 1143c are different from the height positions of the two outer corners 1143d (e.g., lower than the height positions of the two outer corners 1143d). In this embodiment, since the two arms 1143 contact each other at the two inner corners 1143c, the portion of the charge trajectory T formed by the two free end surfaces 1143a is substantially V-shaped, and the target particle P1 can easily move on it. Furthermore, since each arm 1143 has the inner corner 1143c and the outer corner 1143d, it is easy for multiple charges to concentrate at the inner corner 1143c and the outer corner 1143d.

[0031] 4 to 6, the charge track T includes a plurality of lateral track grooves T1 and a plurality of longitudinal track grooves T2. Each lateral track groove T1 is parallel to a first direction D1, and each longitudinal track groove T2 is parallel to a second direction D2 so as to intersect with the lateral track grooves T1. In this embodiment, the first direction D1 and the second direction D2 are perpendicular to each other, but the present invention is not limited to this.

[0032] Furthermore, each of the multiple overlapping locations where the multiple horizontal track grooves T1 and the multiple vertical track grooves T2 intersect with each other is defined as a charge concentration region T3. Here, when the photoelectric layer 113 operates to generate multiple charges that concentrate on the charge track T, the charge concentration region T3 has the largest charge density in the photosensitive structure 11, making it easy to position the target particle P1 in any of the charge concentration regions T3 by electrostatic adsorption.

[0033] 4 and 7, in this embodiment, any one of the plurality of lateral raceway grooves T1 and the plurality of longitudinal raceway grooves T2 is equivalent to being composed of two arms 1143. That is, any one of the plurality of lateral raceway grooves T1 and the plurality of longitudinal raceway grooves T2 has two adjacent inner edge corners 1143c and two outer edge corners 1143d located outside the two inner edge corners 1143c. Furthermore, in any one of the plurality of lateral raceway grooves T1 and the plurality of longitudinal raceway grooves T2, the height positions of the two inner edge corners 1143c are different from the height positions of the two outer edge corners 1143d (for example, lower than the height of the two outer edge corners 1143d).

[0034] 4, the lateral raceway grooves T1 may be continuous grooves that are not divided along the first direction D1, and the longitudinal raceway grooves T2 may also be continuous grooves that are not divided along the second direction D2. However, the present invention is not limited to this.

[0035] Furthermore, in this embodiment, the particle containing device 1 is described as having the light-sensing structure 11 combined with the alignment structure 12 and the bonding layer 13, but the present invention is not limited thereto. For example, in other embodiments not shown in this specification, the light-sensing structure 11 may be applied (e.g., sold) alone or used in combination with other devices according to actual needs.

[0036] [Example 2] A second embodiment of the present invention will be described with reference to Fig. 9. Since this embodiment is similar to the first embodiment described above, a detailed description of the similarities between the two embodiments will be omitted, and only the differences between this embodiment and the first embodiment will be briefly described.

[0037] In this embodiment, the free end surfaces 1143a of the two arms 1143 are located apart from each other outside the photovoltaic layer 113 so that the gap G is in communication with the outside. Furthermore, the inner surfaces 1143b of the two arms 1143 form at least a part of the charge trajectory T.

[0038] More specifically, the height position of the inner corners 1143c of the two arms 1143 is higher than the height position of the outer corners 1143d of the two arms 1143. In this embodiment, since the two inner corners 1143c of the two arms 1143 are spaced apart from each other, the portion of the charge trajectory T formed by the inner surfaces 1143b of the two arms 1143 is approximately V-shaped, and the target particle P1 can easily move on it. That is, the target particle P1 may be partially located within the gap G.

[0039] [Example 3] A third embodiment of the present invention will be described with reference to Fig. 10. Since this embodiment is similar to the first and second embodiments described above, a detailed description of the similarities with the previous embodiments will be omitted, and only differences between this embodiment and the first and second embodiments will be briefly described.

[0040] In this embodiment, any transverse track groove T1 is made up of multiple sections along the first direction D1, and any longitudinal track groove T2 is made up of multiple sections along the second direction D2. Here, the split structures of the transverse track groove T1 and the longitudinal track groove T2 can be adjusted and changed according to actual needs, and the following content is only an example of one preferred embodiment and is not limited thereto.

[0041] More specifically, the track layer 1142 includes a plurality of annular segments 1144 surrounding the plurality of transistors 1131, respectively, and the plurality of annular segments 1144 are arranged adjacent to each other in a matrix, and the upper edges of the plurality of annular segments 1144 together form charge tracks T. That is, the upper edges of the plurality of annular segments 1144 together form a plurality of horizontal track grooves T1 and a plurality of vertical track grooves T2.

[0042] The outer contour of each annular segment 1144 is rectangular, and a charge concentration region T3 is formed in the center of any four adjacent annular segments 1144. When viewed from another angle, any two adjacent arms 1143 belong to two annular segments 1144, respectively.

[0043] [Beneficial Effects of the Embodiments] From the above, the particle containing device, non-contact particle processing equipment and its optical sensing structure disclosed in the embodiments of the present invention have an insulator formed on the photoelectric layer, so that the charge trajectory of the insulator cooperates with the operation of the photoelectric layer to move and position the target particle by the above-mentioned electrostatic adsorption method, thereby enabling the target particle to be positioned accurately.

[0044] Furthermore, since the charge track can cooperate with the optical driving device, the target particles can be pressed by the dielectrophoretic pattern and move quickly on the charge track. That is, the target particles can be pressed by the dielectrophoretic pattern and move, or can move along the charge track after contact (or light collision) with the dielectrophoretic pattern. As a result, damage to the target particles caused by the photomask can be effectively reduced.

[0045] The above disclosure is merely a preferred embodiment of the present invention and does not limit the scope of the claims of the present invention. Therefore, all equivalent technical modifications made using the specification and drawings of the present invention are included in the scope of the claims of the present invention. [Explanation of symbols]

[0046] 100: Non-contact particle processing equipment 1: Particle containment device 11: Light sensing structure 111: First board 112: First electrode layer 113: Photoelectric layer 1131:Transistor 114: Insulator 1141: Basal layer 1142: Orbital layer 1143: Arm 1143a: Free end face 1143b:Inner surface 1143c: Inner corner 1143d: outer corner 1144: Annular segment 12: Alignment structure 121: Second board 122:Second electrode layer 13: Bonding layer 2: AC device 3: Optical drive device 31: Camera 32: Light source T: charge orbit T1: Lateral raceway groove T2: Longitudinal raceway groove T3: Charge concentration region G: Gap S: Liquid sample P: Fine particles P1: Target particle F: Dielectrophoresis pattern D1: 1st direction D2:Second direction

Claims

1. a particle containing device for containing a liquid specimen containing a plurality of particles; an optical drive unit facing the particle containing unit; Equipped with The particle containing device is a light-sensing structure including a first substrate, a first electrode layer formed on the first substrate, a photovoltaic layer formed on the first substrate, and an insulator formed on the photovoltaic layer; an alignment structure spaced apart from the light-sensing structure; and The insulator is a base layer embedded within the photovoltaic layer; a track layer connected to the base layer, at least a portion of which protrudes beyond the photovoltaic layer, and having charge track(s) formed on an upper edge thereof; and the photoelectric layer is operative to generate a plurality of charges that are concentrated on the charge orbitals, thereby causing the charge orbitals to position at least one of the microparticles thereon by electrostatic attraction, the at least one microparticle being defined as a target microparticle; At least one of the light-sensing structure and the alignment structure is transparent, and the alignment structure includes a second substrate and a second electrode layer formed on the second substrate, the second electrode layer facing the light-sensing structure; the optically driven device emits light to irradiate the light-sensing structure, thereby causing the light-sensing structure to form a dielectrophoretic pattern; When the target particle is electrostatically attracted and positioned on the charge track, the optically driven device moves the dielectrophoretic pattern to press the target particle and move it along the charge track. A non-contact type particle processing device characterized by:

2. when the photovoltaic layer is operated to generate the plurality of charges concentrated in the charge orbitals, the charge density of the charge orbitals is greater than the charge density on the outer surface of the photovoltaic layer; The non-contact particle processing device according to claim 1.

3. the track layer includes two arms extending from the base layer, a gap is formed between inner surfaces of the two arms, and free end surfaces of the two arms are located outside the photoelectric layer and contact each other, so that the gap is surrounded by the inner surfaces of the two arms and the base layer, while the free end surfaces of the two arms form at least a part of the charge track; The non-contact particle processing device according to claim 1.

4. the track layer includes two arms extending from the base layer, a gap is formed between inner surfaces of the two arms, free end surfaces of the two arms are located apart from each other outside the photoelectric layer so that the gap is in communication with the outside, and the inner surfaces of the two arms form at least a part of the charge track; The non-contact particle processing device according to claim 1.

5. The charge orbital is a plurality of lateral track grooves each parallel to a first direction; a plurality of longitudinal track grooves each extending parallel to the second direction and intersecting the plurality of lateral track grooves; and a plurality of overlapping portions where the plurality of lateral track grooves and the plurality of longitudinal track grooves intersect with each other are defined as charge concentration regions, when the photovoltaic layer is operative to generate the plurality of charges concentrating in the charge orbitals, the charge concentration region having a maximum charge density within the photosensitive structure; The non-contact particle processing device according to claim 1.

6. any one of the plurality of lateral raceway grooves and the plurality of longitudinal raceway grooves has two inner edge corners adjacent to each other and two outer edge corners located outside the two inner edge corners, and in any one of the plurality of lateral raceway grooves and the plurality of longitudinal raceway grooves, height positions of the two inner edge corners are different from height positions of the two outer edge corners; The non-contact type particle processing device according to claim 5.

7. The photoelectric layer includes a plurality of transistors arranged in a matrix, the track layer includes a plurality of annular segments surrounding each of the plurality of transistors, the plurality of annular segments being arranged adjacent to each other in a matrix, and upper edges of the plurality of annular segments together form the charge track. The non-contact particle processing device according to claim 1.

8. an outer contour of each of the annular segments is rectangular, and a charge concentration region is formed in a central portion of any four of the annular segments adjacent to each other and arranged in a rectangular shape, and when the photoelectric layer is operated to generate the plurality of charges concentrated in the charge orbitals, the charge concentration region has a maximum charge density within the photosensitive structure; The non-contact particle processing device according to claim 7.

9. A particle containing device for containing a liquid specimen containing a plurality of particles, The storage device is a light-sensing structure including a first substrate, a first electrode layer formed on the first substrate, a photovoltaic layer formed on the first substrate, and an insulator formed on the photovoltaic layer; an alignment structure spaced apart from the light-sensing structure; Equipped with the insulator includes charge orbitals projecting from the photovoltaic layer; the photoelectric layer is operative to generate a plurality of charges concentrated on the charge orbitals, such that the charge density of the charge orbitals is greater than the charge density on the outer surface of the photoelectric layer, and the charge orbitals position at least one of the microparticles thereon by electrostatic attraction; At least one of the light-sensing structure and the alignment structure is transparent, and the alignment structure includes a second substrate and a second electrode layer formed on the second substrate, the second electrode layer facing the light-sensing structure. A particle containing device characterized by:

10. a first substrate; a first electrode layer formed on the first substrate; a photovoltaic layer formed on the first substrate; an insulator formed on the photovoltaic layer; Equipped with the insulator includes charge orbitals projecting from the photovoltaic layer; the photovoltaic layer is operative to generate a plurality of charges concentrated in the charge orbitals, such that the charge density of the charge orbitals is greater than the charge density at the outer surface of the photovoltaic layer; A light-sensing structure for a non-contact type particle processing device.

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