Test pin device
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- FEINMETALL
- Filing Date
- 2023-07-21
- Publication Date
- 2026-05-25
Smart Images
Figure 00000000_0000_ABST
Abstract
Description
[Technical Field]
[0001] The present invention relates to a test pin device for making electrical contact, in particular with multi-pole contact partners. [Background technology]
[0002] Test pin devices of the above type are already known in the prior art. A typical test pin device is described, for example, in German Utility Model Publication No. 202019106239. By adapting the outer cross section of the test pin housing to the inner cross section of the carrier part, referred to there as the outer housing, it is possible to limit the maximum tilt or twist angle of the inner test pin relative to the carrier part. This limit varies depending on the sliding position of the test pin in its longitudinal extension relative to the carrier part. When the test pin device is used to contact a contact mating part, the contact end of the test pin of the test pin device is pressed against the contact mating part. This elastically deforms the spring element, displacing the test pin relative to the carrier part. When the test pin is pressed into the carrier part, it moves relative to the carrier part, and a region of the guide part of the test pin is positioned within a guide opening with an outer cross section different from its initial position, allowing a larger maximum tilt or twist angle. This means that the test pin can twist further in the compressed state than in the extended state. A similar test pin device is known from European Patent Publication No. 2666022. Summary of the Invention [Problem to be solved by the invention]
[0003] SUMMARY OF THE INVENTION It is an object of the present invention to provide an improved test pin device which is less susceptible to spring action when making contact with a contacting partner, which is less susceptible to wear, and which has a space-saving design. [Means for solving the problem]
[0004] The test pin device comprises a carrier part with at least one guide opening and at least one test pin mounted in the guide opening so as to be longitudinally displaceable, the test pin having a cylindrical housing in which one or more, in particular pin-shaped, contact elements are arranged side by side, each of the contact elements having a contact end for contacting a contact counterpart, the housing having a guide part mounted so as to be longitudinally displaceable in the guide opening and a contact part spaced from the guide part, the contact end being assigned to the contact part and being preloaded by a spring element between the contact part and the carrier part, adjacent to the guide part on the housing and being preloaded by the spring element of the carrier part. On the remote side, an axial stop is formed, which cooperates with the carrier part against the spring force of the spring element, and the guide opening and the guide part each have a cross section with at least one straight line, in particular a polygonal cross section, in order to limit the maximum rotation angle and / or tilt angle of the test pin relative to the carrier part about its longitudinal axis, in particular about the longitudinal central axis or an off-center longitudinal axis, and the guide part and the guide opening are configured so that the test pin can roll in at least one sliding position relative to the carrier part and can also be tilted about its longitudinal axis relative to the longitudinal axis of the carrier part or the guide opening.
[0005] The object of the present invention is solved by a test pin device having the features of claim 1. This has the advantage that the torsional flexibility of the rotating pin relative to the carrier part is always the same or limited in the same way, regardless of the sliding position of the test pin. Therefore, the maximum permissible angle of rotation of the test pin relative to the carrier part is constant over the entire length of the test pin on the carrier part or over the entire sliding path of the test pin. This avoids unnecessary twisting of the test pin when it comes into contact with the contact partner and eliminates the need for a spring element to untwist the test pin when it is returned to its original position, thereby reducing wear on the test pin device. If the test pin cannot automatically return to a more limited range of rotation angles, for example due to static friction, the test pin would become jammed, preventing further use of the test pin device. The constant maximum rotation angle according to the present invention reliably prevents problems when the test pin moves from a range of increased maximum rotation angles to a range of decreased maximum rotation angles. This reduces the test pin device's failure and wear. On the other hand, in the present test pin device, the relative swing play between the test pin and the carrier part is advantageously reduced in the initial position, i.e., when the test pin is extended. The swing play of the test pin relative to the carrier part refers to the rotation or tilting of the test pin or its central longitudinal axis relative to the longitudinal axis of the guide opening or the carrier part, respectively. The swing movement of the test pin when it contacts the contact partner compensates for the lateral offset between the contact partner and the carrier part, thereby reliably compensating for any inaccuracies in the positioning of the test pin device relative to the contact partner. This is advantageous not only for test pins with only one contact element, but also for test pins with multiple contact elements. The axial stop counteracts the expanding force of the spring element and prevents the spring element from disengaging the test pin from the carrier part. This defines the maximum repulsive movement of the test pin relative to the carrier part. The test pin device according to the present invention advantageously reduces this swing play in the initial position, i.e., when the test pin is extended, allowing the test pin to easily reach the predetermined initial position with respect to the swing movement.The twisting ability of the test pin is advantageously unaffected, so that the test pin twists upon initial contact with the contact partner, even before the pivoting movement is permitted. This ensures constant contact between the test pin and the contact partner. According to the present invention, this is achieved by forming a transition section between the guide section of the test pin and the axial stop. The transition section connects the guide section to the axial stop. According to the present invention, the transition section has a circular cross section whose diameter is at most the same as the smallest inner diameter or diagonal of the cross section of the guide opening and smaller than the largest diagonal of the cross section of the guide section. Therefore, when viewed along its circumference, the transition section protrudes radially from the guide section only in a certain region. This means that when viewed in cross section, the circular transition section is larger than the guide section in some regions. When viewed in cross section, the guide section has at least one straight line (secant) tangent to the circle, so that the width of the straight line section is narrower than the adjacent sections, and the cross section is reduced by the tangent or straight line (secant). The cross section of the guide part must be smaller than the cross section of the guide opening, and the diameter of the transition part is at most as large as the smallest inner diameter or diagonal of the cross section of the guide opening and larger than the smallest width of the cross section of the guide part. The circular transition part is located between a straight line of the cross section of the guide part and the inner circumference of the cross section of the guide opening when viewed in the radial direction. This allows the transition part to function as a swing centering part without impairing the rotational or torsional properties of the test pin relative to the carrier part. Because the swing centering mechanism is assigned to the axial stop, the axial stop and the swing centering mechanism are adjacent to each other on the side of the carrier part remote from the spring element. This means that a centering device in the guide opening on the side of the guide opening facing the spring element is not required. This means that the guide opening itself can be manufactured easily, thereby reducing costs and labor. Furthermore, since the maximum required length of the guide opening is significantly reduced, the test pin device according to the present invention can be manufactured in a particularly space-saving manner overall, in the axial or longitudinal displacement direction.
[0006] According to one preferred embodiment of the invention, the transition section has a lead-in bevel in at least one region extending over the guide section. This lead-in bevel prevents an abrupt transition from the guide section to the swing limiter. Rather, it ensures that the transition section enters the guide opening gently and with minimal wear and is centered on the test pin. Depending on the length of the axial extension of the transition section, the lead-in bevel can be long or short. The transition section is preferably designed to be significantly shorter than the guide section, and the lead-in bevel is preferably approximately half the length of the transition section. Since the transition section is circular, the lead-in bevel forms an arc-shaped surface that connects the guide section to the outer diameter or radius of the transition section. It is reasonable for the lead-in bevel to be formed in a radially extending region of the guide section, and particularly preferably, it connects to the transition section from a straight line when viewed in a cross-section of the guide section. Preferably, each straight line of the guide section is assigned a corresponding lead-in bevel that also connects to the transition section extending beyond that straight line. Each straight line in the cross section of the guide portion forms a guide surface when viewed over the entire longitudinal length of the guide portion, and in particular interacts with the guide-opposing surface of the guide opening to function as a rotation limiter.
[0007] Preferably, the guide portion has an inclined leading edge to the transition portion, and as the distance to the longitudinal central axis of the test pin increases, the guide portion leads to a larger transition portion from the guide surface or to a guide portion that protrudes beyond it.
[0008] Preferably, the guide part has a rectangular cross section. Therefore, the guide part in cross section is characterized by four or at least four sides, and therefore four guide surfaces, each having the same length and width. The rectangular cross section allows the test pin to be inserted into the carrier part or the guide opening in the carrier part in multiple positions rotated by 90 degrees. This facilitates assembly while ensuring that the anti-twist function or maximum rotation angle is always the same regardless of the test pin's mounting position.
[0009] Preferably, the guide opening alternatively or additionally has a rectangular cross section, which ensures safe interaction with the test pin at all times. In particular, the rectangular cross section of both the guide part and the guide opening makes the test pin device easy to assemble and use. Because of the rectangular cross section, both the guide part and the guide opening have four guide surfaces that cooperate to prevent twisting. At the same time, the guide surfaces also function as bearing surfaces for the longitudinal displacement of the test pin relative to the carrier part.
[0010] In one preferred development of the invention, the guide sections, when viewed in cross section, have chamfered corners. Therefore, the guide surfaces do not intersect directly at 90 degrees, but are connected to one another via chamfered corners. The chamfered corners further reduce wear on the test pin device and improve the rotatability of the test pin, at least within the maximum permissible rotation angle. Preferably, the straight lines forming the chamfered corners in cross section are shorter than the straight lines defining the respective guide sections.
[0011] According to one preferred development of the invention, the guide opening has rounded corners in cross section. The rounded corners of the guide opening provide the test pin or the housing with a space in which collisions between the guide part and the carrier part are prevented. In particular, chamfered corners of the guide part can be advantageously positioned in this area and can be moved longitudinally and rotationally, thereby reducing wear and susceptibility to breakdowns. The cross section of the guide part can be designed in particular as a rectangle with rounded corners, ensuring maximum internal space with minimal external dimensions of the test pin.
[0012] Preferably, the maximum angle of rotation or tilt of the test pin relative to the carrier part is limited to a maximum angle that it can rotate about its longitudinal axis, in particular about its central longitudinal axis or an off-center longitudinal axis, independently of the longitudinal displacement of the test pin on the carrier part, so that, regardless of the sliding position of the test pin on the carrier part, the test pin can always be tilted or rotated by the same maximum angle of tilt or rotation relative to the carrier part.
[0013] According to one preferred embodiment of the invention, the guide opening has a cross-section-reducing step at its end facing away from the axial stop, and the total length of the guide section and the transition section is greater than the step distance to the free end of the guide opening facing the axial stop. This means that only the axial stop adjacent to the transition section is responsible for the unambiguous positioning of the test pin in the extended state. In particular, this means that an additional axial stop in the guide opening is unnecessary and is preferably omitted. This allows for a compact and cost-effective design of the test pin device.
[0014] According to a preferred development of the invention, the housing is provided with a threaded transverse bore near the axial stop, into which a fixing screw is screwed to fix the connecting cable to the housing. The connecting cable is used in particular to make electrical contact with the contact element(s). The fixing screw fixes the connecting cable in the housing and ensures stress relief of the connecting cable, so that tension on the connecting cable does not affect the contact points between the connecting cable and the contact elements. This optimizes the operational reliability of the test pin device.
[0015] According to a further advantageous development of the invention, the contact part of the housing has at its free end at least one lead-in bevel for centering the contact partner. The lead-in bevel ensures that the test pin automatically aligns with the contact partner when it comes into contact with the contact partner. In particular, the lead-in bevel allows the test pin to swing relative to the carrier part. This ensures safe and easy contact with the contact partner.
[0016] Furthermore, it is preferred that the contact end of each contact element is located completely within the housing, in particular set back from the free end of the contact, which in particular ensures that the test pin is centered relative to the contact partner before the contact element reaches the contact partner, thereby ensuring a reliable contact between the contact element and the contact partner and always ensuring a reliable connection even during multiple test procedures.
[0017] According to a preferred development of the invention, the carrier part has one or more mounting openings spaced apart from the guide opening, for example mounting screws being inserted into the mounting openings, by means of which the carrier part can be attached to a carrier optionally comprising a plurality of such carrier parts.
[0018] Preferably, the carrier part is provided with a plurality of guide openings, each of which has or can have a test pin attached thereto. This allows multiple test pins to be attached to one carrier part, with the guide openings and test pins being specifically designed as described above. This allows each test pin to rotate within the maximum permissible rotation angle range and tilt within the permissible swing range independently of the other test pins in the same test pin device. This means that the test pin device can also be used to make reliable contact with multiple contact partners simultaneously.
[0019] Furthermore, the carrier part is preferably no wider than the contact part, so that it does not extend laterally beyond the contact part or the test pin. This means that the overall width of the test pin device is only the width of the test pin in the area of the contact part. This allows a large number of such test pin devices to be arranged next to each other on the main carrier, making optimal use of the installation space.
[0020] According to a preferred embodiment of the invention, the housing comprises a housing part between the guide part and the contact part, which surrounds the contact element or elements and is radially guided in the carrier part. The housing housing part extends in particular to the extension of the guide part, so that it is also radially guided in the carrier part. This allows for a better adjustment of the oscillating movement of the test pin. The greater the distance between the housing part and the transition part or axial stop, the better the adjustment of the oscillating movement.
[0021] To guide the housing, a bearing ring is preferably provided, which is elastically and / or plastically deformable in at least some areas and is held in a radially clamped state at least in some areas between the housing and the carrier part. The bearing ring thus serves as an intermediate bearing between the carrier part and the housing and is advantageously designed to ensure low friction values, for example, in view of the materials used. The elastic and / or plastic deformability of the bearing ring preferably ensures a preferably play-free guide of the housing, and thus the test pin or housing, within the carrier part, at least in the area where the bearing ring acts. The oscillation and / or rotational play of the test pin is maintained in the area of the guide part without being affected by the guide part. Due to its elastic deformability, the bearing ring reliably prevents the housing from jamming and locking in the sliding position. The section of the guide opening in which the bearing ring is located is preferably circular in cross section, as is the housing. This ensures that the rotational movement of the test pin relative to the carrier part is not affected by this bearing section. The bearing ring is designed to allow axial movement of the outer part or test pin relative to the carrier part and functions or is designed as a sliding ring.
[0022] The bearing ring particularly preferably has a lead-in bevel relative to the carrier part, which facilitates assembly while, during assembly, allowing advantageous compensation of the aforementioned play due to elastic deformation of the bearing ring itself. For this purpose, the bearing ring is preferably conical, whereby its outer diameter decreases in the direction of insertion into the carrier part. The bearing ring particularly preferably has a bearing ring stop which limits the maximum penetration depth of the bearing ring into the carrier part. The bearing ring stop is in particular formed as an axial stop which interacts directly with the carrier part and has an outer diameter larger than the opening or part of the guide opening of the carrier part into which the bearing ring is inserted for assembly onto the carrier part.
[0023] The bearing ring preferably has a bearing ring end projecting radially outward and is sandwiched between a spring element on one side and a carrier part on the other side. Thus, the spring element is not supported directly on the carrier part at one end, but rather axially on the bearing ring, which in turn is supported on the carrier part. As a result, the bearing ring is constantly preloaded by the spring element, exerting a force in the direction of the carrier part and pressing the bearing ring against the guide opening in the carrier part that accommodates the bearing ring. The favorable elastic deformability of the bearing ring ensures optimal conformity to the housing and carrier part, preventing loss of sliding or bearing contact between the housing and carrier part due to the preload, thereby ensuring safe operation over the long term. The deformability of the bearing ring is preferably designed so that elastic and / or plastic deformation is induced and maintained by the preload of the spring element. Any loss of radial clamping force of the bearing ring due to deformation or wear is compensated for by the spring element permanently pressing it into the carrier part. [Brief explanation of the drawings]
[0024] The invention will now be explained in more detail with reference to the drawings, in which for this purpose the following figures are used: [Figure 1] FIG. 1 shows a perspective view of an advantageous test pin arrangement. [Figure 2] FIG. 2 shows a perspective vertical cross-sectional view of the test pin device. [Figure 3] FIG. 3 shows a perspective view of a portion of the housing of the test pin device. [Figure 4] FIG. 4 shows a perspective vertical cross-sectional view of a part of the test pin device and the carrier portion. [Figure 5] FIG. 5 shows a further perspective longitudinal section of the test pin device. [Figure 6] FIG. 6 shows a cross-sectional view of the test pin device. [Figure 7A] FIG. 7A shows different mounting options for the test pin device. [Figure 7B] FIG. 7B shows different mounting options for the test pin device. [Figure 8]FIG. 8 shows a perspective view of an advantageous further development of the test pin arrangement. [Figure 9] FIG. 9 shows an enlarged longitudinal cross-sectional view of the test pin device. DETAILED DESCRIPTION OF THE INVENTION
[0025] 1 shows a test pin device 1 in a perspective view. The test pin device 1 is designed to make electrical contact with a contact partner, such as a printed circuit board or another type of electrical / electronic test object whose functionality is to be tested. The test pin device 1 allows the contact partner to be electrically contacted by touch contact, thereby, for example, passing a current through the contact partner and electrically applying a voltage to the test object to test its functionality.
[0026] In particular, the test pin device 1 described here is designed to be rotatable and tiltable in a specific area so as to enable a safe touch process that can compensate for positional tolerances from the contact partner to the test pin device 1. Figure 2 shows the test pin device 1 in a perspective longitudinal section.
[0027] The test pin device 1 has a carrier part 2 with two mounting holes 3. The two mounting holes 3 allow the carrier part 2 to be attached, for example, to a main carrier, in particular by screwing. Between the mounting holes 3, the carrier part 2 has a guide opening 4. A test pin 5 is mounted in this guide opening 4 so that it can be longitudinally displaced. The test pin 5 has a multi-part housing 6, in which, according to this exemplary embodiment, two pin-shaped contact elements 7 are arranged. In particular, the contact elements 7 are designed as spring contact pins. According to this first example, the contact elements 7 have contact ends 8 designed as female contact plugs for receiving male contact plugs. The contact ends 8 are located at contact parts 9 of the test pin 5 or the housing 6. The contact ends 9 are arranged at a distance from the carrier part 2. A spring element 10 (in this example, a coil spring) is held in a prestressed state between the contact ends 9 and the carrier part 2 and biases the contact parts 9 away from the carrier part 2. In this example, the coil spring is arranged coaxially with the housing 6 between the contact parts 9 and the carrier part 2.
[0028] The housing 6 of the test pin 5 further comprises a guide element 11, which serves to support and guide the test pin 5 in the guide opening 4 of the carrier part 2. This guide element 11 is explained in more detail in the following figure. The guide element 11 is followed by an axial stop 12, the outer cross section of which is larger than the cross section of the guide opening 4. Therefore, the housing 6 with the axial stop 12 is pushed up onto the carrier part 2 on the side remote from the spring element 10 until the axial stop 12 rests against the carrier part 2. The axial stop 6 thus prevents further displacement of the test pin 5 by the spring element 10. The test pin 5 is thus held between the spring element 10 and the axial stop 12 on the carrier part 2. The multi-part design of the housing 6 allows for easy attachment of the test pin 5 to both sides of the carrier part 2. However, at least the housing part with the guide element 11 must be inserted into the carrier part 2 from the side remote from the spring element.
[0029] The coil spring pushes the test pin in the direction of arrow A to a starting position where the axial stop 12 rests against the carrier part 2. When the contact process is performed, the test pin 5 with the contact end 9 is pressed against the contact partner and repels the test pin 5 against the carrier part 2 against the force of the spring. The deflection direction of the spring is shown by arrow B in Figures 1 and 2. When the spring deflects, the guide part 11 of the housing 6 is pushed out of the guide opening 4 at least in some areas.
[0030] 3 shows in perspective view the part of the housing 6 that includes the guide section 11. The guide section 11 is designed to have a constant cross section when viewed in the longitudinal direction of the housing 6. This cross section is rectangular, with four straight lines arranged at right angles to one another, which form four adjacent guide surfaces 13 that are arranged perpendicular to one another. The guide section has a height H 11 and width B 11 which are of the same size (H 11 =B 11 The guide surfaces 13 do not terminate directly in cross section, but have chamfered or beveled corners 14 located between adjacent guide surfaces. Alternatively, the corners 14 are designed with a rounded shape.
[0031] The axial stopper 12 has a cross section that essentially corresponds to the cross-sectional shape of the guide part 11, but is larger overall, and in particular in this example, its width B 12 is the height H 12 greater than (B 12 >H 12 ) Furthermore, its width B 12 is the width B of the guide portion 11 11 and height H 11 greater than (B 12 >B 12 ,H 11 Optionally, the axial stop 12 also has a square cross section with chamfered corners. In this embodiment, the axial stop 12 is shorter (L) than the guide part 11 as viewed in the longitudinal direction. 11 >L 12). Alternatively, the axial stopper may be the same length as or longer than the guide part 11. In this case, the guide part 11 and the axial stopper 12 are aligned with each other so that the guide surface 13 is parallel to the corresponding flat surface of the axial stopper 12. In principle, the axial stopper 12 may have any cross-sectional shape, provided that the axial stopper 12 has a cross-section larger than the cross-section of the guide opening 4, so that the axial stopper 12 can exert a force in the direction of longitudinal displacement on the carrier part 2 in at least some areas. In principle, the axial stopper 12 has a cross-section larger than the guide part 11 and larger than the guide opening 4, so that the axial stopper 12 abuts on the axial or front side of the carrier part 2 or abuts on the test pin 5 in a rebound state. Height H of the axial stopper 12 12 and width B 12 The larger the stop surface 19, the larger the axial stop surface interacting with the carrier part 2. A larger stop surface 19 improves the oscillation centering of the test pin 5. This occurs when the test pin 5 is pushed out by the spring element 10, i.e., when the axial stop 12 abuts against the carrier part 2. The stop surface 19 of the axial stop 12 is designed to be perpendicular to the longitudinal extension of the test pin 5 and is configured to ensure a planar-parallel alignment of the test pin 5 or its longitudinal axis in the rest state, in particular such that its central longitudinal axis M or an off-center longitudinal axis parallel to the central longitudinal axis extends parallel to the longitudinal axis of the carrier part 2. If the stop surface 19 is not parallel to the end face of the carrier part 2, the axial stop 12 will generate a moment that forces the test pin 5 to tilt into an axially parallel position whenever it reaches the stop.
[0032] FIG. 4 shows a longitudinal perspective view of the test pin 5 offset from the central longitudinal axis M, with the cross section not passing through the central longitudinal axis M but radially offset from the central longitudinal axis M. The guide opening 4 has a cross section at least substantially complementary to the cross section of the guide part 11. Thus, the guide opening 4 also has a rectangular cross section. In contrast to the cross section of the guide part 11, the corners are rounded rather than chamfered. The width and height of the rectangular cross section are only slightly larger than those of the guide part 11, as shown, for example, in FIG. 6 , so that the guide part 11 is mounted in the guide opening 4 in a wear-resistant and displaceable manner. The rectangular cross section of the guide opening 4, with the guide surfaces 13 each assigned to a corresponding guide counter surface 15, means that the test pin 5 can be advantageously displaced longitudinally, i.e., axially, within the guide opening 4. This size difference ensures that the housing 6 is reliably guided within the guide opening 4 while still being able to rotate or tilt within a limited angle about the central longitudinal axis M relative to the carrier part 2. In particular, tilt occurs around a central longitudinal axis that is offset from the center of the test pin, but which is parallel to the central longitudinal axis. The smaller the size difference, the smaller the maximum angle of rotation. Regardless of size, the maximum angle of rotation is constant, independent of the sliding position of the housing 6 in the carrier part 2.
[0033] At the end facing the spring element 11, the guide opening 4 has a taper in the form of a step 16, the inner diameter or cross section of which is smaller than the outer diameter or cross section of the housing 6 at the end of the guide part 11, so that the guide part 11 cannot be pushed further than the step 16 in the direction of the arrow A through the carrier part 2. However, before the free end of the guide part 11 reaches the step 16, the axial stop 6 strikes the carrier part 2. For this purpose, the longitudinal extension (L 11 +L 17 ) is smaller than the depth or length of the guide opening 4 up to the step 16.
[0034] As can be seen from Figure 3, the housing 6 has a transition 17 at the transition from the guide part 12 to the axial stop 6. The axial extent L 12 and the axial range L of the guide portion 11 11 or length L 11 Compared with the length L of the transition section 17, 17 is significantly shorter (L 17 < <L 11 , L 12 ). At the transition section 17, the housing 6 has a circular cross section. The diameter of the circle is selected so that it does not exceed the smallest inner diameter or diagonal length of the cross section of the guide opening 4, so that the transition section 17 is fully inserted into the guide opening 4. The circular shape does not prevent the housing 6 from rotating in the guide opening 4, since the insertion of the transition section 17 into the guide opening 4 does not change the rotatability of the housing 6 in the guide opening 4. However, the insertion of the transition section 17 into the guide opening 4 has the effect that the test pin 5 can no longer, or only to a lesser extent, swing in its longitudinal extension relative to the carrier part 2. The transition section 17 therefore only limits the swinging movement of the test pin 5. In this respect, the transition section 17 can also be described as a swinging centering device.
[0035] Preferably, as shown, the transition section 17 has a diameter greater than the height or width of the rectangular cross section of the guide section 11, so that the transition section 17 extends radially partially beyond the guide surface 13. Alternatively, the diameter of the transition section 17 is selected to be smaller than the maximum diagonal of the cross section of the guide section 11, so that in other areas viewed in the circumferential direction, the guide section 11 extends radially beyond the transition section 17. In particular, in the area of the chamfered corner 14, the guide section 11 extends radially beyond the transition section 17. According to an alternative embodiment (not shown), the guide section 11 extends to the axial stop 6 in areas where the diameter of the transition section 17 is smaller than the cross section of the guide section 11, so that the circular shape or circular transition section 17 is only visible and effective in the area of the guide surface 13.
[0036] To facilitate insertion of the transition sections 17 into the guide openings 4, the transition sections 17 are provided with lead-in ramps 18 in the region of each guide surface 13, extending from the respective guide section 13 toward the outer diameter or diameter of the transition section 17. The lead-in ramps 18 thus rise radially toward the axial stop 12. As a result, each lead-in ramp 18 has an arc-shaped surface. When the transition sections 17 are inserted into the guide openings 4, the lead-in ramps 18 center the test pin 5 during swinging relative to the carrier section 2. This reduces swinging of the test pin 5 and centers the test pin during swinging movement. Preferably, the length of the transition sections ensures alignment and centering of the test pin 5 during deflection and allows for a rapid swinging movement of the test pin after initial contact with the contacting partner during compression or after a short spring deflection. For example, the transition sections 17 have an axial extension or length of 0.05 to 0.5 mm. Furthermore, the initial position of the test pin 5 in the fully extended state is supported by an axial stop 12, which has a stop surface 19 aligned perpendicular to the longitudinal extension of the pin 5 and which, as already mentioned above, lies flat against the carrier part 2 in the extended state.
[0037] The advantageous design of the test pin device 1 allows the test pin 5 to rotate in the bearing part 2 about its central longitudinal axis M up to a maximum rotation angle, and also to tilt or oscillate about its longitudinal axis relative to the longitudinal axis of the carrier part 2. The oscillating movement is captured in an initial rebound position by the lead-in ramps 18 and the transition part 17, while the rotation limit remains constant throughout the entire longitudinal displacement of the test pin 5.
[0038] 5 shows a perspective view of the housing part of the housing 6 with the guide part 11 in the bearing part 2 in an extended state. Here it can be seen that the axial stop 6 protrudes beyond the guide opening 4 and thereby abuts the bearing part 2 at the axial stop surface 19, preventing further rebound. Furthermore, FIG. 5 shows that the transition part 17 is located within the guide opening 4.
[0039] Furthermore, Figure 6 shows in a perspective cross-section, the cutting plane of which is located in the region of the transition 17, that a circle having a diameter corresponding at most to the smallest diagonal of the rectangular cross-section of the guide opening 4 does not affect the rotatability of the test pin 5 in the guide opening 4. Therefore, the maximum angle of rotation is determined only by the cross-section of the guide surface 18 or guide part 11 and the guide opening 4.
[0040] Optionally, the test pin device 1 is provided with a radially oriented transverse bore 20 in the housing near the axial stop 12. In particular, the transverse bore 20 is provided with a thread 21 into which a fixing screw 22, for example a set screw as shown in Fig. 5, can be or is screwed in. The fixing screw 22 serves to firmly fix a connecting cable inserted into the end of the housing 6 opposite the contact 9 and ensures an electrical connection with the contact element 8.
[0041] The square cross-section of the guide part and the guide opening allows the test pin 5 to be inserted into the carrier part 2 in different rotational positions offset by 90 degrees. Figures 7A and 7B show different mounting positions of the test pin 5 on the carrier part 2, which are rotated by 90 degrees relative to one another. This allows the test pin device 1 to be easily adapted to different contact partners or boundary conditions. The contact part 9 preferably plays a decisive role in determining the dimensioning of the bearing part 2. Therefore, as shown in Figures 7A and 7B, the width of the bearing part 2 is preferably not wider than the width of the contact end 9.
[0042] 8 shows another embodiment of the test pin device 1, which differs from the previous embodiment in that multiple guide openings 4 are formed in the bearing portion 2 and a test pin 5 is inserted into each guide opening 4. The test pins 5 and guide openings 4 are formed as described above. This allows multiple test pins 5 to be inserted into the bearing portion 2.
[0043] Advantageously, each contact part 9 of the test pin 5 or the housing 6 also has a lead-in bevel 23, particularly on its outer side, for centering the test pin 5 relative to the contacting partner during the contacting operation. In particular, the lead-in bevel 23 creates a wide or long, gentle lead-in area on the contacting partner side, while also ensuring centering with almost no play on the inner side or inner area of the contacting partner. At the same time, the outer and inner shapes of the contact part 9 ensure that the tilting of the test pin 5 is not caused by interlocking parts. For this purpose, the lead-in bevel 23 terminates in a ridge 24 having a cross section larger than the surface area of the housing 6 facing away from the free end of the contact part 9. This ridge 24 ensures that the contact area between the contact part 9 and the inside of the contacting partner is narrow or linear, thereby reliably preventing the test pin 5 from jamming or getting stuck in the contacting partner even when the test pin 5 swings. The lead-in ramp 23 is preferably adapted to the spring force of the spring element 10 so that spring compression and oscillation of the test pin 5 only begins after positive contact with the contact partner without damaging the contact partner.
[0044] FIG. 9 shows the test pin device 1 in an enlarged longitudinal section in the region of the carrier part 2 facing away from the axial stop 12. The housing 6 has a housing 25, which is continuous with the guide part 11 and is guided radially without play in the carrier part 2. For this purpose, a bearing ring 26 is arranged in the region of the tapered cross section of the guide opening 4 between the carrier part 2 and the housing 25, forming a step 16. However, the bearing ring 26 can also be used for guide openings with a constant cross section. The tapered cross section of the step 16 is preferably circular, so that it does not affect the rotation of the test pin 5 in the guide opening 4. The bearing ring 26 is elastically deformable and is held in a radially elastically clamped state between the carrier part 2 and the housing wall 25 or the housing 6. For this purpose, for example, the outer diameter of the bearing ring 26 is at least partially slightly larger than the inner diameter of the guide opening 4 of the carrier part 2 in the region of the step 16 and / or its inner diameter is slightly smaller than the outer casing 25 of the housing 6, so that in the mounted position, as shown in Figure 9, the bearing ring 26 is elastically deformed radially and is thereby held in a prestressed or clamped state. In this case, the bearing ring 26 is designed as a sliding ring and is mounted in a sliding manner so that the housing 6 together with the outer casing 25 can be axially displaced within the bearing ring and the test pin 5 can be pushed in and extended.
[0045] Preferably, the bearing ring 26 is provided with a radially protruding bearing ring stop 27 that limits the maximum axial insertion depth of the bearing ring 26 into the carrier part 2. The bearing ring stop 27 is arranged between the carrier part 2 and the spring element 10 so that the spring element is axially supported on the bearing ring stop 27. The bearing ring stop 27 is preferably formed integrally with the bearing ring 26. Particularly preferably, the bearing ring 26 has a lead-in bevel 28 that forms the outer diameter of the bearing ring 26 and gradually decreases in the insertion direction. In particular, the bearing ring 26 is formed at least conically on the outer wall of the jacket. In this case, in the undeformed state of the bearing ring 26, e.g., before assembly, the conical shape or lead-in bevel 28 of the bearing ring 26 preferably extends from the free end that is inserted into the carrier part 2 to the bearing ring stop 27, as shown by the dashed line in FIG. 9 . The bearing ring 26 is forced axially into the guide opening 4 or into the tapered portion of the guide opening 4 by the spring element 10 or the preload force provided by the spring element 10. This causes the bearing ring 26 to elastically deform or compress as the insertion depth increases. Optionally, plastic deformation of the bearing ring 26 can also occur.
[0046] Due to the deformation of the bearing ring 26, the test pin 5 with its outer shell 25 is guided without play in the carrier part 2 in the area of the step 16. As a result, in the area of the step 16, the test pin 5 has a rocking bearing or fulcrum, which determines the rocking axis of the test pin 5, which is aligned transversely with the longitudinal direction of the test pin 5 or the longitudinal axis of the guide opening 4. Together with the transition section 17 and the axial stop 12, the bearing ring 26 optimizes the rocking movement of the test pin 5 through the improved longitudinal guidance relative to the carrier part 2. The greater the distance between the bearing ring 26 and the open end of the guide opening 4 facing the axial stop 12, the more precisely the test pin 5 is guided, and the smaller the permissible rocking angle. Depending on the application, the rocking movement of the test pin 5 relative to the carrier part 2 can be reduced or increased by selecting the preferred ratio of the distance, cross-sectional shape, and size of the axial stop 12, the guide section 11, and the guide opening 4.
[0047] The spring force acting on the bearing ring 26 and its lead-in ramp 28 causes the bearing ring to automatically move further inside the carrier part 4 in the event of wear in order to maintain a play-free bearing.
Claims
1. In particular, a test pin device (1) for making electrical contact with a multi-pole contact partner, A carrier section (2) having at least one guide opening (4), The system comprises at least one test pin (5) mounted within the guide opening (4) so as to be displaceable in the vertical direction, The test pin (5) has a cylindrical housing (6) in which one or more particularly pin-shaped contact elements (7) are arranged, and each of the contact elements (7) has a contact end (8) for contacting the contact mating object. The housing (6) has a guide portion (11) that is mounted so as to be displaceable in the vertical direction within the guide opening (4), and a contact portion (9) that is spaced apart from the guide portion, and the contact end (8) is assigned to the contact portion (9), A preload is applied to the spring element (10) between the contact portion (9) and the carrier portion (2), and an axial stopper (12) is formed adjacent to the guide portion (11) on the housing (6) and on the side of the carrier portion (2) away from the spring element (10), and the axial stopper (12) cooperates with the carrier portion (2) against the spring force of the spring element (10), In order to limit the maximum rotation angle and / or tilt angle of the test pin (5) about the vertical axis relative to the carrier portion (2) by the guide opening (4) and the guide portion (11), the guide opening (4) and the guide portion (11) each have a polygonal cross-section having at least one straight line, In a test pin device (1) configured such that the guide portion (11) and the guide opening (4) allow the test pin (5) to roll in at least one sliding position relative to the carrier portion (2), A transition portion (17) is formed between the guide portion (11) and the axial stopper (12), and the transition portion (17) has a circular cross-section, the diameter of which is, on the one hand, at most equal to the minimum width of the cross-section of the guide opening (4), and on the other hand, smaller than the maximum diagonal and larger than the minimum width of the cross-section of the guide portion (11), so that when viewed over its entire circumference, the transition portion (17) protrudes radially from the guide portion (11) in only a portion of the area, characterized in that, in the test pin device (1).
2. The test pin device (1) according to claim 1, characterized in that the transition portion (17) has an introduction slope (18) in at least one region that protrudes beyond the guide portion (11).
3. The test pin device (1) according to claim 2, characterized in that the introduction slope (18) rises from the guide section (11) to the transition section (17).
4. The test pin device (1) according to claim 1, characterized in that the guide portion (11) has a square cross-section.
5. The test pin device (1) according to claim 1, characterized in that the guide opening (4) has a square cross-section.
6. The test pin device (1) according to claim 1, characterized in that the guide portion (11) has a chamfered corner portion (14) in cross-section.
7. The test pin device (1) according to claim 1, characterized in that the guide opening (4) has rounded corners in cross-section.
8. The test pin device (1) according to claim 1, characterized in that the maximum rotation angle is limited independently of the vertical displacement of the test pin (5) in the carrier portion (2).
9. The test pin device (1) according to claim 1, characterized in that the guide opening (4) has a step (16) that tapers in cross-section at the end facing away from the axial stopper (12), and the total length of the guide portion (11) and the transition portion (17) is smaller than the distance between the step (16) and the free end of the guide opening (4) facing the axial stopper (12).
10. The test pin device (1) according to claim 1, characterized in that the housing (6) has a lateral hole (20) having a screw thread (21) for a fixing screw (22) in the area of the axial stopper (12), and the connecting cable can be fixed inside the housing (6) by the fixing screw (22).
11. The test pin device (1) according to claim 1, characterized in that the contact portion (9) of the housing (6) has at least one guide slope (23) at its free end for aligning the center of the contacting object.
12. The test pin device (1) according to claim 1, characterized in that each of the contact ends (8) of the contact element (7) is completely inside the housing (6) and is set back in particular from the free end side of the contact portion (9).
13. The test pin device (1) according to claim 1, characterized in that the carrier portion (2) has one or more mounting holes (3) located away from the guide opening (4).
14. The test pin device (1) according to claim 1, characterized in that the carrier portion (2) has a plurality of guide openings (4), and the test pin (5) is attached to or can be attached to each of the guide openings (4).
15. The test pin device (1) according to claim 1, characterized in that the carrier portion (2) has a width less than or equal to the width of the contact portion (9).
16. The test pin device (1) according to claim 1, characterized in that the housing (6) has an outer casing (25) that surrounds one or more contact elements (7) between the guide portion (11) and the contact portion (9), and is guided radially by the carrier portion (2), particularly by the tapered portion of the guide opening (4).
17. The test pin device (1) according to claim 16, characterized in that a guide bearing ring (26) is provided, the bearing ring (26) is elastically and / or plastically deformable in at least a portion of the area, and is held at least partially radially pre-pressurized between the outer casing (25) and the carrier (2).
18. The test pin device (1) according to claim 17, characterized in that the bearing ring (26) has a particularly conical inclined surface (28) for the carrier portion (2).
19. The test pin device (1) according to claim 17, characterized in that the bearing ring (26) has a bearing ring stopper (27) that protrudes radially, and the bearing ring stopper is held axially between the spring element (10) and the carrier portion (2).