EUV light generation apparatus and method for manufacturing electronic devices
By employing a beam monitor and beam splitter to adjust the incidence angle and position of MPL light, the EUV light generation system stabilizes EUV energy output, addressing fluctuations and debris issues, thus enhancing efficiency and stability.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- GIGAPHOTON INC
- Filing Date
- 2024-10-30
- Publication Date
- 2026-05-15
AI Technical Summary
Existing EUV light generation systems face challenges in maintaining consistent EUV energy output due to fluctuations in the irradiation position of pulsed laser beams, which affect the spot intensity distribution and conversion efficiency, leading to potential debris contamination and reduced stability of EUV energy.
Incorporating a beam monitor to measure the incidence angle of MPL light and using a beam splitter to adjust its position, allowing precise control of the irradiation position based on measured parameters, thereby stabilizing the EUV energy output.
The solution enhances the stability and consistency of EUV energy by minimizing fluctuations in spot intensity distribution and maintaining optimal irradiation conditions, reducing debris formation and improving the overall efficiency of EUV light generation.
Smart Images

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