Smart sample containers for combined sample evaluation workflows

Abstract

This invention provides a system and method for managing a composite sample evaluation workflow using smart sample containers. [Solution] An exemplary method for using a smart sample container configured to manage a sample evaluation workflow according to the present invention includes: acquiring a sample evaluation workflow for one or more samples; receiving interaction with an external device; and causing the external device to perform actions that advance the sample evaluation workflow based on the sample evaluation workflow. The smart sample container may further modify the sample evaluation workflow based on the results of the actions performed by the sample evaluation workflow and / or store information related to the results of such actions. In this way, the smart sample container can dynamically advance the evaluation of samples through its sample evaluation workflow.

Claims

1. A method for a smart sample container configured to transport multiple sample grids and to manage an electron microscope evaluation workflow across multiple external devices, including an electron microscope, wherein the method is The smart sample container's workflow management module acquires or determines the electron microscope evaluation workflow for samples on the sample grids of the plurality of sample grids, and the smart sample container's interaction module receives interactions from a first external device, the interactions including the results of steps or actions performed by the first external device. Using the workflow management module, modify future steps or actions within the electron microscope evaluation workflow based on the results, Based on the aforementioned electron microscope evaluation workflow, The position of the sample grid on the smart sample container is provided to a second external device, A method comprising transmitting an executable script from the workflow management module to the second external device so that the second external device performs an action to advance the electron microscope evaluation workflow, wherein the action includes automatically performing a step of the electron microscope evaluation workflow.

2. The method according to claim 1, wherein the electron microscope evaluation workflow corresponds to a set of one or more steps that need to be taken to evaluate the sample.

3. The aforementioned multiple external devices Dual-beam microscope system, Sample container transport system, Vitrification system, or The method according to claim 1, comprising at least one of the following: a sample preparation system.

4. The method according to claim 1, wherein the electron microscope evaluation workflow further comprises at least one of external device settings, external device requirements, sample evaluation requirements, and sample information.

5. The aforementioned electron microscope evaluation workflow Sample type, The history of the aforementioned sample and, The method according to claim 1, further comprising an identification code for the sample.

6. The method according to any one of claims 1 to 5, wherein obtaining the electron microscope evaluation workflow includes receiving the workflow uploaded from the external device.

7. The method according to claim 6, further comprising obtaining the electron microscope evaluation workflow by updating one or more steps of the uploaded workflow in order to obtain the electron microscope evaluation workflow.

8. To obtain the aforementioned electron microscope evaluation workflow, Receiving one or more instances of sample information, The method according to any one of claims 1 to 7, comprising selecting an electron microscope evaluation workflow from a series of pre-configured electron microscope evaluation workflows based on the sample information.

9. To obtain the aforementioned electron microscope evaluation workflow, Receiving one or more instances of sample information, Based on the aforementioned instance of sample information, one or more evaluation steps to be performed are determined, Based on the instance of sample information, determine the external device to perform the evaluation step, The method according to any one of claims 1 to 7, comprising determining external device settings for performing the evaluation step based on the instance of sample information.

10. The method according to any one of claims 1 to 7, wherein obtaining the electron microscope evaluation workflow includes determining parameters for individual steps of the electron microscope evaluation workflow based on one or more of the following: sample information, external device parameters, the status of one or more samples, and the history of the one or more samples.

11. The second external device is made to perform actions to advance the electron microscope evaluation workflow. The parameters of the aforementioned sample, or The method according to any one of claims 1 to 10, comprising providing at least one of the indicators of the type of evaluation of the sample.

12. One of the aforementioned multiple external devices is a sample container transport device, and the action for advancing the electron microscope evaluation workflow is The position where the next step will be carried out. A new external device to carry out the aforementioned next step, The type of external device that performs the above next step, Evaluation parameters for the next step, or A method according to any one of claims 1 to 11, corresponding to at least one of the device characteristics for carrying out the above-mentioned next step.

13. The method according to any one of claims 1 to 12, wherein receiving the interaction with the first external device includes receiving communication from the external device via a communication interface that identifies at least one of status, schedule, device settings, device parameters, or device functions.

14. Having the second external device perform the action for advancing the electron microscope evaluation workflow that transmits the communication means that the smart sample container, Instructions for the steps in the aforementioned electron microscope evaluation workflow, Sample parameters, Recommended external device settings, Sample type, The history of the aforementioned sample, and The method according to claim 1, further comprising transmitting one or more of the identification codes of the sample to the second external device.

15. An indicator of completion of a step in the aforementioned electron microscope evaluation workflow, As a result of the actions taken to advance the aforementioned electron microscope evaluation workflow, The new parameters of the aforementioned sample, and The method according to any one of claims 1 to 14, further comprising receiving additional communication with the first external device, which includes one or more instructions for the next step of the electron microscope evaluation workflow.

16. The smart sample container allows for monitoring the status of the sample, The method according to any one of claims 1 to 15, further comprising modifying the electron microscope evaluation workflow based on the detection of an event using the smart sample container.

17. The method according to claim 16, wherein modifying the electron microscope evaluation workflow includes one or more of the following: adding a new step, adjusting parameters for one or more steps, having a step run again, and selecting a new electron microscope evaluation workflow to be performed.

18. A smart sample container configured to transport multiple sample grids and to manage an electron microscope evaluation workflow across multiple devices, including an electron microscope, wherein the smart sample container is configured to transport multiple sample grids and to manage an electron microscope evaluation workflow across multiple devices, A region of the smart sample container for holding the plurality of sample grids, wherein each of the sample grids contains one or more samples, An external support structure defining the region of the smart sample container for holding the sample grid, Communication interface, One or more processors, A memory for storing a workflow management module, an interaction module, and computer-readable instructions, wherein when the computer-readable instructions are executed on one or more processors, the computer-readable instructions are sent to the one or more processors. The workflow management module is used to obtain or determine the electron microscope evaluation workflow for the samples on the sample grids of the multiple sample grids. The interaction module receives an interaction from a first external device, and the interaction includes the result of a step or action performed by the first external device. Using the workflow management module, modify future steps or actions within the electron microscope evaluation workflow based on the results. Based on the aforementioned electron microscope evaluation workflow, The position of the sample grid on the smart sample container is provided to a second external device. A smart sample container comprising memory and a second external device, wherein an executable script is transmitted to the second external device to cause the second external device to perform an action to advance the electron microscope evaluation workflow, the action of which includes automatically performing a step of the electron microscope evaluation workflow.

19. The plurality of external devices include a vitrification system, the smart sample container further includes a temperature sensor, and the method is Using the temperature sensor, determine that the smart sample container has fallen below a threshold temperature within a predetermined time period. The method according to any one of claims 1 to 17, further comprising adding a step to the electron microscope evaluation workflow to use the electron microscope to determine the state of the sample in the smart sample container using the workflow management module.

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