Semiconductor device, control method for a semiconductor device, and program
The semiconductor device optimizes memory usage by selectively storing abnormal data values, addressing memory capacity limitations in harsh environments, ensuring efficient data storage and reduced power consumption.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- RENESAS ELECTRONICS CORP
- Filing Date
- 2024-12-11
- Publication Date
- 2026-06-23
Smart Images
Figure 2026101781000001_ABST
Abstract
Description
[Technical Field]
[0001] This disclosure relates to a semiconductor device, a method for controlling a semiconductor device, and a program, and can be used, for example, in a semiconductor device, a method for controlling a semiconductor device, and a program for storing measured values in memory in a measuring device. [Background technology]
[0002] Measuring devices that measure environmental indicators such as temperature, humidity, and gas concentration are equipped with semiconductor devices that acquire measurement values based on signals from sensors. Measuring devices that perform environmental measurements are expected to be used in confined spaces such as coal mines and tunnels. In this case, the measuring devices are used in harsh environments with high temperature and humidity, the presence of toxic and flammable gases, and difficulty in communicating with the outside world. Therefore, to conduct environmental surveys before manual work and fixed-point environmental surveys, measuring devices are often operated unmanned, such as by being fixed at a fixed point or mounted on a work robot.
[0003] When operating measuring devices unattended in harsh environments, real-time communication between the measuring device and an external management system can be difficult. For example, if the measuring device is installed in a remote and confined location, cable installation is limited, making wired communication difficult. Furthermore, wired communication requires significant materials and preparation work to communicate with multiple measuring devices installed in different locations. Even when using wireless communication, maintaining a good communication status can be challenging. Therefore, generally, measurement values acquired through sensors are stored in memory provided in the measuring device. The measurement values are then stored in the management system by moving the measuring device or memory to a location where communication with the management system is possible.
[0004] For example, Patent Document 1 proposes a temperature recording device that stores the measured temperature. The temperature recording device according to Patent Document 1 stores the alarm period during which the detected temperature falls outside the set temperature range as temperature alarm history data. [Prior art documents] [Patent Documents]
[0005] [Patent Document 1] Japanese Patent Application Laid-Open No. 2002-81847 [Summary of the Invention] [Problems to be Solved by the Invention]
[0006] However, in a measuring device installed without communicating with the outside, the number of measured values that can be stored in the memory is limited by the capacity of the memory. However, since the size of the measuring device is restricted, an increase in the capacity of the memory is also restricted. Therefore, it is difficult to increase the number of measured values stored in the memory provided in the measuring device.
[0007] Other problems and novel features will become apparent from the description of this specification and the accompanying drawings. [Means for Solving the Problems]
[0008] According to one embodiment, a semiconductor device includes a memory, a data acquisition unit that acquires a data signal input from the outside at a predetermined period, and a determination unit that stores a threshold value. The determination unit performs a threshold determination that compares a data value indicated by the data signal acquired by the data acquisition unit with the threshold value. In the threshold determination, when it is determined that the data value is an abnormal value that does not satisfy a predetermined determination criterion, the data value is stored in the memory.
[0009] According to one embodiment, a control method of a semiconductor device acquires a data signal input from the outside at a predetermined period, performs a threshold determination that compares a data value indicated by the acquired data signal with the threshold value, and in the threshold determination, when it is determined that the data value is an abnormal value that does not satisfy a predetermined determination criterion, the data value is stored in a memory provided in the semiconductor device.
[0010] According to one embodiment, the program causes a computer to execute processing for acquiring an externally input data signal at a predetermined period, processing for performing threshold determination to compare a data value indicated by the acquired data signal with the threshold value, and processing for storing the data value in a memory provided in a semiconductor device when it is determined in the threshold determination that the data value is an abnormal value not satisfying a predetermined determination criterion.
Advantages of the Invention
[0011] According to one embodiment, it is possible to provide a semiconductor device that efficiently stores values in a memory, a control method for the semiconductor device, and a program.
Brief Description of the Drawings
[0012] [Figure 1] FIG. 1 is a block diagram schematically showing the configuration of a semiconductor device according to Embodiment 1. [Figure 2] FIG. 2 is a block diagram showing the configuration of peripheral devices of the semiconductor device according to Embodiment 1 together. [Figure 3] FIG. 3 is a block diagram schematically showing a configuration example of the semiconductor device according to Embodiment 1. [Figure 4] FIG. 4 is a flowchart showing the operation of the semiconductor device according to Embodiment 1. [Figure 5] FIG. 5 is a diagram showing an example of storing a measured value in a memory in the semiconductor device according to Embodiment 1. [Figure 6] FIG. 6 is a block diagram schematically showing the configuration of a semiconductor device according to Embodiment 2. [Figure 7] FIG. 7 is a flowchart showing the operation of the semiconductor device according to Embodiment 2. [Figure 8] FIG. 8 is a diagram showing an example of storing a measured value in a memory in the semiconductor device according to Embodiment 2. [Figure 9] FIG. 9 is a block diagram schematically showing the configuration of a semiconductor device according to Embodiment 3. [Figure 10]Figure 10 is a flowchart showing the operation of the semiconductor device according to Embodiment 3. [Figure 11] Figure 11 shows an example of storing measured values in memory in a semiconductor device according to Embodiment 3. [Figure 12] Figure 12 shows an example of a computer configuration for realizing a semiconductor device. [Modes for carrying out the invention]
[0013] Embodiments of the present invention will now be described with reference to the drawings. In each drawing, the same elements are denoted by the same reference numerals, and redundant explanations are omitted where necessary.
[0014] Embodiment 1 This embodiment describes a semiconductor device that stores desired data values, selected based on predetermined criteria from data values acquired based on data signals input from an external source, in a memory. Figure 1 is a schematic block diagram showing the configuration of a semiconductor device according to Embodiment 1. Figure 2 is a block diagram also showing the configuration of peripheral equipment for the semiconductor device according to Embodiment 1. The semiconductor device 100 stores the measured value M, which is the data value indicated by the data signal SIG input from the sensor 110, in a memory provided in the semiconductor device 100 when the value indicated by the data signal SIG does not meet predetermined criteria. The semiconductor device 100 has a data acquisition unit 1, a determination unit 2, and a memory 3.
[0015] In this embodiment, an example in which the sensor 110 is a temperature sensor will be described. The sensor 110 may be installed at any location. The sensor 110 measures the temperature T of the installation location. The sensor 110 outputs a data signal SIG, which is an analog signal indicating the measured temperature T, to the data acquisition unit 1 of the semiconductor device 100.
[0016] The data acquisition unit 1 samples the received data signal SIG at a predetermined sampling period f1. The data acquisition unit 1 converts the sampled data signal SIG from analog to digital to obtain the measured value M, which is a digital value. Hereafter, analog / digital conversion will be abbreviated as A / D conversion. The data acquisition unit 1 outputs the measured value M to the determination unit 2.
[0017] The sensor 110 may also output a data signal SIG indicating the measured temperature T as a digital signal. In this case, the data acquisition unit 1 may convert the received data signal SIG into a measured value M.
[0018] The determination unit 2 performs a threshold determination by comparing the measured value M with a predetermined threshold value to determine whether the measured value M satisfies a predetermined determination criterion. In this embodiment, the determination unit 2 determines that if the measured value M satisfies the lower limit M L The above and the upper limit M H The following describes an example of determining whether a value falls within the following reference range. Hereinafter, a measured value M that falls within the reference range will be referred to as a normal value. A measured value M that does not fall within the reference range will be referred to as an abnormal value. If the measurement value M is a normal value, the determination unit 2 discards the measurement value M without storing it in memory 3. If the measurement value M is an abnormal value, the determination unit 2 stores the measurement value M in memory 3. Note that the lower limit M is... L The above and the upper limit M H The following reference range is also referred to as the first range.
[0019] The measured values M stored in memory 3 are read by the management system 120 when the semiconductor device 100 is connected to the management system 120 by various communication means. The management system 120 stores the data DAT containing the multiple read measured values M in a memory provided in the management system 120, for example.
[0020] Next, an example of the configuration of the semiconductor device 100 will be described. Figure 3 is a schematic block diagram showing an example of the configuration of the semiconductor device according to Embodiment 1. In the example in Figure 3, the data acquisition unit 1 includes an analog front end (AFE) 11, a conversion calculation unit 12, and a timer 13.
[0021] The AFE11 samples the data signal SIG output by the sensor 110 according to the sampling clock CLK with period f1 output by the timer 13. The AFE11 performs A / D conversion of the sampled data signal SIG to a digital value DV. The conversion calculation unit 12 converts the digital value DV into a measured value M. The conversion calculation unit 12 outputs the converted measured value M to the determination unit 2.
[0022] The determination unit 2 includes a determination processing unit 21 and a program storage memory 22. The program storage memory 22 stores a determination program that performs a comparison determination process between a measured value M and a reference range. The determination processing unit 21 reads the determination program from the program storage memory 22 as needed. By executing the determination program, the determination processing unit 21 performs a determination process that compares the measured value M with the reference range. The determination processing unit 21 may also store information indicating the reference range and threshold value to be compared with the measured value M. The determination processing unit 21 may read the reference range and threshold value stored in the program storage memory 22 as needed, or in response to a command from the user of the semiconductor device 100. In Figure 3, the information such as the determination program, reference range, and threshold value read by the determination processing unit 21 from the program storage memory 22 is displayed as "Information INF".
[0023] Next, the operation of the semiconductor device 100 will be described below. The semiconductor device 100 continuously samples the data signal SIG in accordance with the sampling clock CLK to acquire multiple time-discrete measurement values M. The semiconductor device 100 selects the measurement values M to be stored in the memory 3 according to the result of a threshold determination comparing the measurement values M with a reference range.
[0024] The following determination unit 2 determines that the measured value M is the lower threshold M L The above and the upper threshold M H The measurement value M is determined to be a normal value if the following conditions are met. Furthermore, the determination unit 2 determines that the measurement value M is below the lower threshold M. L Smaller than or upper threshold M H If the value is greater than this, the measured value M is determined to be an outlier.
[0025] In this embodiment, when the measured value M is an abnormal value, the semiconductor device 100 stores the measured value M in the memory 3. When the measured value M is a normal value, the semiconductor device 100 stores the measured value M PRE in the memory 3 according to whether the measured value M in the previous sampling is a normal value or an abnormal value. If the measured value M in the current sampling is a normal value and the measured value M PRE in the previous sampling is an abnormal value, the determination unit 2 stores the measured value M in the memory 3. If the measured value M in the current sampling and the measured value M PRE in the previous sampling are normal values, the determination unit 2 discards the measured value M without storing it in the memory 3.
[0026] FIG. 4 is a flowchart showing the operation of the semiconductor device according to Embodiment 1. Hereinafter, the previous measurement flag F is the measured value M in the previous sampling PRE and is flag information indicating whether it is a normal value. When the value of the previous measurement flag F is "1", the measured value M in the previous sampling PRE is a normal value. When the value of the previous measurement flag F is "2", the measured value M in the previous sampling PRE is an abnormal value. Also, the count value C is a value indicating the number of a plurality of consecutive measured values M when the plurality of consecutive measured values M are normal values or abnormal values.
[0027] Step S100 The determination unit 2 sets the initial value of the count value C to "0". The determination unit 2 sets the initial value of the previous measurement flag F to "1".
[0028] Step S101 The data acquisition unit 1 samples the data signal SIG output by the sensor 110 at the set sampling period. The data acquisition unit 1 outputs the measured value M obtained by A / D converting the data signal SIG to the determination unit 2.
[0029] Step S102 The determination unit 2 determines whether the measured value M is a normal value or not.
[0030] Step S103 If the measured value M is within the normal range, the determination unit 2 determines whether the value of the previous measurement flag F is "2". In other words, the determination unit 2 determines whether the measured value M in the previous sampling is "2". PRE Determine whether or not it is an outlier.
[0031] Step S104 If the value of the previous measurement flag F is "2", that is, the measured value M in the previous sampling. PRE If the value is abnormal, the determination unit 2 sets the count value C to "0".
[0032] Step S105 If it is determined in step S103 that the value of the previous measurement flag F is not "2", or after step S104, the determination unit 2 sets the value of the previous measurement flag F to "1".
[0033] Step S106 The determination unit 2 determines whether the count value C is "0" or not. If the count value C is "1" or greater, the determination unit 2 proceeds to step S108.
[0034] Step S107 If the count value C is "0", the determination unit 2 stores the measured value M in the memory 3.
[0035] Step S108 The determination unit 2 adds "1" to the count value C.
[0036] Step S109 The determination unit 2 determines whether or not an instruction to end the measurement has been given to the semiconductor device 100. The instruction to end the measurement may be given to the semiconductor device 100 by the user of the semiconductor device 100 as needed. Alternatively, a timer may be provided inside or outside the semiconductor device 100, and the timer may give an instruction to end the measurement to the semiconductor device 100 when a predetermined time or when the accumulated measurement time reaches a predetermined time. If an instruction to end the measurement has been given to the semiconductor device 100, the determination unit 2 terminates the process. If there is no instruction to end the measurement to the semiconductor device 100, the determination unit 2 returns the process to step S101.
[0037] Step S110 If the measured value M is determined to be an abnormal value in step S102, the determination unit 2 determines whether the previous measurement flag F is "1", that is, the measured value M in the previous sampling. PRE Determine whether the value was within the normal range.
[0038] Step S111 If the previous measurement flag F is "1", the determination unit 2 sets the count value C to "0".
[0039] Step S112 If it is determined in step S110 that the previous measurement flag F is not "1", or after step S111, the determination unit 2 sets the value of the previous measurement flag F to "2". After that, the determination unit 2 proceeds to step S107.
[0040] As described above with reference to Figure 4, by repeating the loop processing in accordance with the sampling of the data signal SIG, measurement values indicating abnormal values can be preferentially stored in memory.
[0041] Next, the storage of measured values in the memory of the semiconductor device 100 will be explained using an example. Figure 5 is a diagram showing an example of storing measured values in the memory of the semiconductor device according to Embodiment 1. In Figure 5, 12 measured values sampled at consecutive timings t1 to t12 are shown. Black circles indicate measured values stored in memory 3. White circles indicate measured values that were discarded without being stored in memory 3.
[0042] In this example, the measurement at the initial timing t1 is within the normal range. Therefore, the measurement at timing t1 is stored in memory 3.
[0043] The measurement value at timing t2 is within the normal range. Furthermore, the measurement value at the previous timing t1 is also within the normal range. Therefore, the measurement value at timing t2 is discarded without being stored in memory 3.
[0044] The measurement value at timing t3 is an outlier. Therefore, the measurement value at timing t3 is stored in memory 3.
[0045] The measurement value at timing t4 is normal. On the other hand, the measurement value at the previous timing t3 is abnormal. Therefore, the measurement value at timing t4 is stored in memory 3.
[0046] The measurements taken at timings t5 through t7 are within the normal range. Furthermore, the measurements taken at the timing immediately preceding each of these are also within the normal range. Therefore, the measurements taken at timings t5 through t7 are discarded without being stored in memory 3.
[0047] The measurement value at timing t8 is an outlier. Therefore, the measurement value at timing t8 is stored in memory 3.
[0048] The measurement value at timing t9 is normal. On the other hand, the measurement value at the previous timing t8 is abnormal. Therefore, the measurement value at timing t9 is stored in memory 3.
[0049] The measurement value at timing t10 is within the normal range. Furthermore, the measurement value at the previous timing t9 is also within the normal range. Therefore, the measurement value at timing t10 is discarded without being stored in memory 3.
[0050] The measurement value at timing t11 is an outlier. Therefore, the measurement value at timing t8 is stored in memory 3.
[0051] The measurement value at timing t12 is normal. On the other hand, the measurement value at the previous timing t11 is abnormal. Therefore, the measurement value at timing t12 is stored in memory 3.
[0052] As described above, with the semiconductor device 100, only 7 selected measurement values from 12 measurement values can be stored in the memory 3. This reduces the number of values stored in the memory 3 compared to when all measured values are stored in the memory 3.
[0053] As explained above, the semiconductor device 100 can reliably store the measured value M in the memory 3 if the measured value M is an abnormal value. This allows, for example, the measured temperature T indicated by the measured value M to be reliably recorded if it is an abnormal value.
[0054] Furthermore, if the temperature indicated by the measured value M is consistently within the normal range, the semiconductor device 100 stores only the first measured temperature in the memory 3. The semiconductor device 100 then discards the temperatures measured from the second measurement onward. This reduces the number of measured values stored in the memory 3. Also, because the first measured temperature can be recorded, the start date of the period in which the temperature is within the normal range can be clearly recorded.
[0055] Therefore, the semiconductor device 100 can efficiently store the desired measurement values in the memory 3. As a result, even if the capacity of the memory 3 is limited, measurement values can be accumulated over a long period of time.
[0056] Furthermore, with the semiconductor device 100, desired measurement values can be efficiently stored in the memory 3 by the determination process in the determination unit 2 without changing the configuration of existing semiconductor devices. As a result, an increase in the configuration and manufacturing costs of the semiconductor device can be avoided.
[0057] Furthermore, since unnecessary measurement data is not stored in memory 3, the power consumption required for storing measurements can be reduced. As a result, the power consumption of the semiconductor device can be reduced. This is particularly advantageous when the measuring device on which the semiconductor device 100 is mounted is configured as a portable device, as reducing power consumption is required in such cases.
[0058] Embodiment 2 In environmental measurements, it is necessary to detect conditions in which measurement values become abnormal, as this may have a greater impact on people and various equipment. In this case, it is desirable to be able to monitor conditions in which measurement values become abnormal in more detail than conditions in which measurement values become normal. Furthermore, in cases where measurement values become abnormal, it may be necessary to issue an alarm as needed. Therefore, in this embodiment, a semiconductor device that monitors measurement values more frequently when they show abnormal values will be described.
[0059] Figure 6 is a schematic block diagram showing the configuration of the semiconductor device according to Embodiment 2. Compared to the semiconductor device 100, the semiconductor device 200 has a configuration that further includes an alarm output unit 4. Furthermore, the operation of the determination unit 2 of the semiconductor device 200 differs from the operation of the determination unit 2 of the semiconductor device 200 in that it sets the sampling period of the measured value according to whether the measured value is a normal value or an abnormal value.
[0060] Next, the operation of the semiconductor device 200 will be described. Figure 7 is a flowchart showing the operation of the semiconductor device according to Embodiment 2. In Figure 7, steps S201 to S206 have been added compared to Figure 4.
[0061] Steps S100 to S105 For steps S100 to S105 in FIG. 7, since they are the same as steps S100 to S105 in FIG. 4 respectively, duplicate explanations are omitted.
[0062] Step S201 After step S105, the determination unit 2 outputs the sampling period setting notification S1 to the data acquisition unit 1. The data acquisition unit 1 sets the sampling period f CLK to f1.
[0063] Steps S106 to S112 For steps S106 to S112 in FIG. 7, since they are the same as steps S106 to S112 in FIG. 4 respectively, duplicate explanations are omitted.
[0064] Step S202 After step S112, the determination unit 2 outputs the sampling period setting notification S2 to the data acquisition unit 1. The data acquisition unit 1 sets the sampling period f CLK to f2 (f2 < f1), which is shorter than f1.
[0065] Step S203 The determination unit 2 adds "1" to the count value C.
[0066] Step S204 The determination unit 2 determines whether the count value C is "2" or more. If the count value C is "1" or less, the determination unit 2 proceeds with the process to step S107.
[0067] Step S205 If the count value C is "2" or more, the determination unit 2 determines whether the count value C is TH equal to or more than the threshold value C. If the count value C is less than the threshold value C TH the determination unit 2 proceeds with the process to step S107.
[0068] Step S206 If the count value C is the threshold value CTH If the above is true, the determination unit 2 outputs an alarm notification N1 to the alarm output unit 4. The alarm output unit 4 determines that the measured value M is C TH An alarm ALM1 indicating that an abnormal value has occurred more than once in a row is output to, for example, the management system 120. The determination unit 2 then proceeds to step S107. The alarm notification N1 is also referred to as the first notification. The alarm ALM1 is also referred to as the first alarm.
[0069] Next, the storage of measured values in the memory of the semiconductor device 200 will be explained using an example. Figure 8 is a diagram showing an example of storing measured values in the memory of the semiconductor device according to Embodiment 2. In Figure 8, 15 measured values sampled at consecutive timings t1 to t15 are shown. Black circles indicate measured values stored in memory 3. White circles indicate measured values that were discarded without being stored in memory 3. Note that the threshold C in step S205 is used here. TH Let's set it to 3.
[0070] In this example, the measurement at the initial timing t1 is within the normal range. Therefore, the measurement at timing t1 is stored in memory 3.
[0071] The measurement value at timing t2 is within the normal range. Furthermore, the measurement value at the previous timing t1 is also within the normal range. Therefore, the measurement value at timing t2 is discarded without being stored in memory 3.
[0072] The measured values at timings t3 to t6 are abnormal. Therefore, the measured values at timings t3 to t6 are stored in memory 3. Also, because there are three or more consecutive abnormal measured values, the alarm output unit 4 outputs alarm ALM1 at timing t6.
[0073] The measurement value at timing t7 is normal. On the other hand, the measurement value at the previous timing t6 is abnormal. Therefore, the measurement value at timing t7 is stored in memory 3.
[0074] The measurements taken at timings t8 to t10 are within the normal range. Furthermore, the measurements taken at the timing immediately preceding each of these are also within the normal range. Therefore, the measurements taken at timings t8 to t10 are discarded without being stored in memory 3.
[0075] The measured values at timings t11 and t12 are abnormal. Therefore, the measured values at timings t11 and t12 are stored in memory 3.
[0076] The measurement value at timing t13 is normal. On the other hand, the measurement value at the previous timing t12 is abnormal. Therefore, the measurement value at timing t13 is stored in memory 3.
[0077] The measured values at timings t14 and t15 are normal. Furthermore, the measured values at the preceding timings are also normal. Therefore, the measured values at timings t14 and t15 are discarded without being stored in memory 3.
[0078] Therefore, according to the semiconductor device 200, only 9 selected measurement values from 15 measurement values can be stored in the memory 3. This reduces the number of values stored in the memory 3 compared to when all measured values are stored in the memory 3.
[0079] As described above, the semiconductor device 200, like the semiconductor device 100, can efficiently store the desired measurement values in the memory 3. As a result, even if the capacity of the memory 3 is limited, measurement values can be accumulated over a long period of time.
[0080] Furthermore, the semiconductor device 200 uses a higher sampling period when the measured value M is abnormal compared to when the measured value M is normal. Therefore, it is possible to measure more closely over time the state in which the measured value M shows an abnormal value, which is what we want to monitor in more detail. As a result, undesirable states in which the measured value becomes abnormal can be monitored more precisely.
[0081] Furthermore, the semiconductor device 200 can output an alarm if a predetermined number of measurements are consecutively abnormal. This allows the user of the measuring device on which the semiconductor device 200 is installed to be notified that an undesirable condition of abnormal measurement values is continuing. As a result, entry into areas where entry is undesirable can be prevented by the alarm.
[0082] Embodiment 3 In environments where ventilation is restricted, such as tunnels, monitoring of toxic gas concentrations is required to prevent health hazards. Since toxic gases can immediately lead to health problems depending on their concentration, it is necessary to output appropriate alarms according to the concentration of toxic gases. On the other hand, Embodiment 2 described a semiconductor device that outputs an alarm when the measured value becomes abnormal for a predetermined number of consecutive times. However, when the concentration of toxic gases can immediately lead to health problems, it is desirable to output an alarm regardless of the number of times an abnormal value has been observed. Therefore, this embodiment describes a semiconductor device that immediately outputs an alarm when the measured value becomes abnormal.
[0083] Figure 9 is a schematic block diagram showing the configuration of the semiconductor device according to Embodiment 3. Compared to semiconductor device 100, the alarm output unit 4 of semiconductor device 300 outputs not only alarm ALM1 but also alarm ALM2.
[0084] Next, the operation of the semiconductor device 300 will be described. Figure 10 is a flowchart showing the operation of the semiconductor device according to Embodiment 3. In Figure 10, compared to Figure 7, step S102 is replaced by steps S301 and S302, and step S303 is added.
[0085] Steps S100 and S101 Steps S100 and S101 in Figure 10 are the same as steps S100 and S101 in Figure 4, respectively, so redundant explanations are omitted.
[0086] Step S301 The determination unit 2 determines whether the measured value M is within the normal range. Here, as an example, the determination unit 2 determines whether the measured value M is within the threshold M TH1 Determine whether the following is true: The measured value M is equal to the threshold M. TH1 If the following conditions are met, the determination unit 2 proceeds to step S103. Note that the threshold M TH1 This is also called the first threshold. Furthermore, the threshold M TH1 The following range is also referred to as the first range. Threshold M TH1 A range larger than this is also called the second range.
[0087] Step S302 In step S301, the measured value M is the threshold M TH1 If it is determined that the measured value M is greater than the threshold M, the determination unit 2 determines that the measured value M is greater than the threshold M. TH2 Determine whether the following is true: The measured value M is equal to the threshold M. TH2 If the following conditions are met, the determination unit 2 proceeds to step S110.
[0088] Step S303 Measured value M is threshold M TH2 If it is greater than the threshold M, the determination unit 2 outputs an alarm notification N2 to the alarm output unit 4. The alarm output unit 4, in response to the alarm notification N2, determines that the measured value M is greater than the threshold M. TH2 The alarm ALM2, indicating that the value is greater than the threshold, is output to, for example, the management system 120. The determination unit 2 then proceeds to step S110. TH2 This is also called the second threshold. TH1 Larger than and threshold M TH2 The following range is also referred to as the third range. Threshold M TH2 A range greater than this is also called the fourth range. Therefore, the threshold M that indicates a measured value M is an outlier is... TH1 The second range, which is greater than the threshold M TH2 The following ranges are divided into a third range that is close to the first range and a fourth range that is far from the first range. Furthermore, alarm notification N2 is also referred to as the second notification, and alarm ALM2 is also referred to as the second alarm.
[0089] Steps S103 to S112 and S201 to S206 Steps S103 to S112 and S201 to S206 in Figure 10 are the same as steps S103 to S112 and S201 to S206 in Figure 7, respectively, so redundant explanations are omitted.
[0090] In the process shown in Figure 10, if the alarm output unit 4 receives alarm notifications N1 and N2, it may output both alarm ALM1 and ALM2. Alternatively, the alarm output unit 4 may output alarm ALM2 as the more urgent alarm and stop outputting alarm ALM1.
[0091] Next, the storage of measured values in the memory of the semiconductor device 300 will be explained using an example. Figure 11 is a diagram showing an example of storing measured values in the memory of a semiconductor device according to Embodiment 3. In Figure 11, 15 measured values sampled at consecutive timings t1 to t15 are shown. Black circles indicate measured values stored in memory 3. White circles indicate measured values that were discarded without being stored in memory 3.
[0092] In this example, the measurement at the first timing t1 is the threshold M TH1 The following is true, therefore it is within the normal range. Thus, the measured value at timing t1 is stored in memory 3.
[0093] The measurement value at timing t2 is within the normal range. Furthermore, the measurement value at the previous timing t1 is also within the normal range. Therefore, the measurement value at timing t2 is discarded without being stored in memory 3.
[0094] The measured values at timings t3 to t6 are given by threshold M. TH1 The above, and threshold M TH2 The following is an outlier that falls within the third reference range. Therefore, the measured values from timing t3 to t6 are stored in memory 3. Also, if three or more consecutive measured values exceed the threshold M TH1 Because it is larger than the specified value, the alarm output unit 4 outputs the alarm ALM1 at timing t6.
[0095] The measurement value at timing t7 is normal. On the other hand, the measurement value at the previous timing t6 is abnormal. Therefore, the measurement value at timing t7 is stored in memory 3.
[0096] The measurements taken at timings t8 to t10 are within the normal range. Furthermore, the measurements taken at the timing immediately preceding each of these are also within the normal range. Therefore, the measurements taken at timings t8 to t10 are discarded without being stored in memory 3.
[0097] The measured values at timings t11 to t13 are threshold M TH1 The above, and threshold M TH2 This is an outlier that falls within the third reference range. Therefore, the measured values from timing t11 to t13 are stored in memory 3.
[0098] The measurement value at timing t14 is normal. On the other hand, the measurement value at the previous timing t12 is abnormal. Therefore, the measurement value at timing t14 is stored in memory 3.
[0099] The measured value at timing t15 is the threshold M TH2 This is an outlier that falls within the fourth reference range, which is larger than the specified threshold. Therefore, the measured value at timing t15 is stored in memory 3. The measured value is also stored within the threshold M. TH2 Because it is larger than the specified value, the alarm output unit 4 outputs the alarm ALM2.
[0100] Therefore, according to the semiconductor device 200, only 11 selected measurement values can be stored in the memory 3. This reduces the number of values stored in the memory 3 compared to the case where all measured values are stored in the memory 3.
[0101] As described above, the semiconductor device 300, like the semiconductor device 200, can efficiently store the desired measurement values in the memory 3. As a result, even if the capacity of the memory 3 is limited, measurement values can be accumulated over a long period of time.
[0102] Furthermore, like the semiconductor device 200, the semiconductor device 300 can more precisely monitor undesirable conditions where the measured values become abnormal. Also like the semiconductor device 200, the semiconductor device 300 can output an alarm if a predetermined number or more of the measured values M become abnormal consecutively.
[0103] Furthermore, the semiconductor device 300 can immediately output an alarm if the measured value M is greater than a predetermined standard value. This allows, for example, an alarm to be output if the concentration of toxic gas indicated by the measured value is greater than the standard value, prompting restrictions on entry or evacuation of people.
[0104] Other embodiments Although the present disclosure has been described above with reference to embodiments, the present disclosure is not limited to the embodiments described above. Various modifications to the structure and details of the present disclosure are possible, as can be understood by those skilled in the art within the scope of the present disclosure. Furthermore, each embodiment can be combined with other embodiments as appropriate.
[0105] In Embodiments 1 and 2, examples were described in which the measured value is compared with a reference range defined by a lower limit and an upper limit, but this is merely illustrative. In Embodiments 1 and 2, as in Embodiment 3, the measured value may also be compared with a threshold value.
[0106] In Embodiment 3, an example of comparing a measured value with a threshold was described, but this is merely illustrative. In Embodiment 3, as in Embodiments 1 and 2, the measured value may be compared with a first range, which is a reference range defined by a lower limit and an upper limit. In this case, a first range and a second range including the first range may be provided. Then, in step S301 of Figure 10, it may be determined whether the measured value M falls within the first range. Also, in step S302 of Figure 10, it may be determined whether the measured value M falls within the second range.
[0107] In the above-described embodiment, an example was explained in which, when multiple consecutive measurements are normal values, the first measurement among multiple consecutive measurements is stored in memory 3. However, this is merely an example. If necessary, the first measurement among multiple consecutive measurements does not need to be stored in memory 3. In this case, the number of measurements stored in memory 3 can be further reduced. However, if all measurements indicating normal values are not stored in memory 3, it may not be possible to determine whether the measurement was performed correctly. Therefore, if the priority is to determine whether the measurement was performed correctly, it is desirable to store the first measurement in memory 3 when multiple consecutive measurements are normal values.
[0108] In the above-described embodiment, the measured value was determined to be a normal value when it was above the lower limit and below the upper limit, but this is merely an example. The measured value may also be determined to be a normal value when it is greater than the lower limit and less than the upper limit. The measured value may also be determined to be a normal value when it is above the lower limit and less than or equal to the upper limit. The measured value may also be determined to be a normal value when it is greater than the lower limit and less than or equal to the upper limit.
[0109] In the above-described embodiment, the measured value was determined to be normal when it was below a threshold, but this is merely an example. The measured value may also be determined to be normal when it is smaller than a threshold.
[0110] In the embodiments described above, the semiconductor device according to the disclosure has been described primarily as a hardware configuration, but is not limited thereto. The semiconductor device according to the disclosure can be realized by having a computer execute a computer program to perform any processing. These processing may be realized by having a computer, which includes at least one processor (e.g., a microprocessor, CPU, GPU, MPU, or DSP (Digital Signal Processor)), execute a program. Specifically, one or more programs containing a set of instructions for causing a computer to perform algorithms related to these transmission signal processing or reception signal processing can be created and supplied to the computer.
[0111] Computer programs can be stored and supplied to a computer using various types of non-transitory computer-readable media. Non-transitory computer-readable media include various types of tangible storage media. Examples of non-transitory computer-readable media include magnetic recording media (e.g., flexible disks, magnetic tapes, hard disk drives), magneto-optical recording media (e.g., magneto-optical disks), CD-ROMs (Read Only Memory), CD-Rs, CD-R / Ws, and semiconductor memory (e.g., mask ROMs, PROMs (Programmable ROMs), EPROMs (Erasable PROMs), flash ROMs, and RAMs (random access memory)). Programs may also be supplied to a computer using various types of transient computer-readable media. Examples of transient computer-readable media include electrical signals, optical signals, and electromagnetic waves. Transitory computer-readable media can be supplied to a computer via wired communication channels such as electric wires and optical fibers, or via wireless communication channels.
[0112] The following shows an example of a computer configuration for realizing the semiconductor device according to the above-described embodiment. Figure 12 is a diagram showing an example of a computer configuration for realizing a semiconductor device. The semiconductor device can be realized by a computer 9000 such as a dedicated computer or a personal computer (PC). However, the computer does not need to be physically single; there may be multiple computers when performing distributed processing. As shown in Figure 12, the computer 9000 has, for example, a processor 9001, a ROM (Read Only Memory) 9002, a RAM (Random Access Memory) 9003, a storage unit 9004, a communication interface 9005, and a user interface 9006.
[0113] The processor 9001, ROM 9002, RAM 9003, memory unit 9004, communication interface 9005, and user interface 9006 are interconnected via bus 9007, enabling them to communicate with each other. While the operating system software necessary to run the computer is not described here, it will be implemented in the computer 9000 as appropriate.
[0114] ROM is composed of, for example, non-volatile semiconductor memory devices. ROM 9002 stores information such as various programs used in computer 9000.
[0115] The storage unit 9004 is composed of various storage devices, such as hard disks and solid-state disks. Furthermore, the storage unit 9004 is not limited to storage devices installed in the computer 9000, but may also be external storage devices. External storage devices may include various communication means, such as cloud storage connected to the computer 9000 via a network. The storage unit 9004 stores information such as various programs and data used by the computer 9000.
[0116] RAM 9003 is composed of volatile semiconductor memory devices. Programs and data used by the processor 9001 are loaded into RAM 9003 as needed from either ROM 9002 or memory unit 9004, or both.
[0117] The processor 9001 may be composed of, for example, a CPU (Central Processing Unit). Alternatively, the processor 9001 may include a GPU (Graphics Processing Unit) in addition to the CPU. A GPU is suitable for parallel processing of routine tasks, and can improve processing speed compared to a CPU, for example, by being used in neural network processing. The processor 9001 executes various processes based on various programs stored in the ROM 9002, or various programs and data held in the RAM 9003, as appropriate. The processor 9001 may also store the data generated by the processing in the RAM 9003 or the storage unit 9004 as appropriate.
[0118] The communication interface 9005 is an interface that connects the computer 9000 to a communication network such as the Internet or an intranet via various wired or wireless communication means. This allows the computer 9000 to communicate with other devices, systems, and sensors connected to the communication network.
[0119] The user interface 9006 includes, for example, a display unit that provides information so that the user can perceive it, such as through a display device, and an audio output unit that provides audio. The user interface 9006 also includes an input unit that allows the user to input information into the computer 9000 through user operation, such as a keyboard, mouse, and touch panel. Furthermore, the user interface 9006 may include devices such as sensors that acquire information useful to the user.
[0120] Here, the computer 9000 is described as a single device, but this is merely an example. The computer 9000 may consist of multiple physically separate devices. Some of these devices may be portable, while others may be stationary.
[0121] Each drawing is merely illustrative to illustrate one or more embodiments. Each drawing may be associated with one or more other embodiments rather than with only one specific embodiment. As those skilled in the art will understand, various features or steps described with reference to any one drawing can be combined with features or steps shown in one or more other drawings, for example, to create embodiments not explicitly shown or described. Not all features or steps shown in any one drawing to illustrate an exemplary embodiment are necessarily required, and some features or steps may be omitted. The order of steps shown in any of the drawings may be changed as appropriate. [Explanation of symbols]
[0122] 100, 200, 300 Semiconductor Equipment 110 Sensor 120 Management Systems 1. Data Acquisition Unit 2 Judgment section 3 memory 4. Alarm output section 11 AFE 12 Conversion Calculation Unit 13 Timer 21. Determination Processing Unit 22 Program storage memory ALM1, ALM2 alarm CLK Sampling Clock DV Digital Value INF Information M measurement value N1, N2 alarm notification S1, S2 Sampling period setting notification SIG data signal
Claims
1. Memory and A data acquisition unit that acquires data signals input from an external source at predetermined intervals, It comprises a determination unit that stores a threshold value, A semiconductor device comprising: a determination unit which performs a threshold determination by comparing the data value indicated by the data signal acquired by the data acquisition unit with the threshold value, and if the determination unit determines in the threshold determination that the data value is an abnormal value that does not meet a predetermined determination criterion, stores the data value in the memory.
2. In the semiconductor device described in claim 1, A semiconductor device wherein, if the first data value indicated by the data signal acquired by the data acquisition unit at a first timing is an abnormal value that does not satisfy the predetermined judgment criteria, and the second data value indicated by the data signal acquired by the data acquisition unit at a second timing following the first timing is a normal value that satisfies the predetermined judgment criteria, the judgment unit stores the second data value in the memory.
3. In the semiconductor device described in claim 1, The determination unit, If the data value is a normal value that satisfies the predetermined judgment criteria, the data acquisition unit is set to the first period as the predetermined period. A semiconductor device that, if the data value is an abnormal value that does not meet the predetermined criteria, sets a second period shorter than the first period as the predetermined period in the data acquisition unit.
4. In the semiconductor device described in claim 1, The determination unit, Determine whether the data value belongs to a first range or a second range separated by a first threshold, If the data value falls within the first range, it is determined that the data value is a normal value that satisfies the predetermined criteria. A semiconductor device that determines, when the data value falls within the second range, that the data value is an abnormal value that does not meet the predetermined criteria.
5. In the semiconductor device according to claim 4, The determination unit determines which of the first and second ranges the data value belongs to based on which of the first and second ranges the first threshold value belongs to, in a semiconductor device.
6. In the semiconductor device described in claim 5, The system further includes an alarm output unit that issues an alarm based on the first notification, The determination unit outputs the first notification to the alarm output unit if a predetermined number of data values acquired consecutively fall within the second range. The alarm output unit is a semiconductor device that outputs a first alarm in response to the first notification.
7. In the semiconductor device described in claim 6, The second range is divided by a second threshold into a third range adjacent to the first range and a fourth range adjacent to the third range. The determination unit, Determine which of the third and fourth ranges the data value belongs to, If the data value falls within the fourth range, a second notification is output to the alarm output unit. The alarm output unit is a semiconductor device that outputs a second alarm in response to the second notification.
8. In the semiconductor device according to claim 7, The determination unit determines which of the third and fourth ranges the data value belongs to based on which of the third and fourth ranges the second threshold value belongs to, in a semiconductor device.
9. In the semiconductor device described in claim 1, The determination unit determines that the data value is a normal value that satisfies the determination criteria when the data value falls within a first range defined by a lower limit and an upper limit.
10. In the semiconductor device described in claim 9, The system further includes an alarm output unit that issues an alarm based on the first notification, If the determination unit determines that a predetermined number of data values acquired consecutively do not fall within the first range, it outputs the first notification to the alarm output unit. The alarm output unit is a semiconductor device that outputs a first alarm in response to the first notification.
11. In the semiconductor device according to claim 10, The determination unit, If the data value does not fall within a second range set to include the first range, a second notification is output to the alarm output unit. The alarm output unit is a semiconductor device that outputs a second alarm in response to the second notification.
12. The system acquires data signals input from an external source at predetermined intervals. A threshold determination is performed by comparing the data value indicated by the acquired data signal with a threshold. A control method for a semiconductor device, wherein, in the threshold determination, if it is determined that the data value is an abnormal value that does not meet a predetermined determination criterion, the data value is stored in a memory provided in the semiconductor device.
13. A process for acquiring data signals input from an external source at predetermined intervals, A process for performing threshold determination by comparing the data value indicated by the acquired data signal with a threshold, In the threshold determination, if it is determined that the data value is an abnormal value that does not meet a predetermined determination criterion, the computer is instructed to perform the following steps: store the data value in the memory provided in the semiconductor device. program.