Information processing system, information processing method, and information processing program

Abstract

This invention provides an information processing system, information processing method, and information processing program that enable simpler analysis of defects present in laminates containing opaque webs. [Solution] The information processing system includes an acquisition unit 511 that acquires first feature point information relating to feature points present in a first web and second feature point information relating to feature points present in a laminate formed by stacking an opaque second web on the first web; a comparison unit 513 that compares the acquired first feature point information and the second feature point information; and an output unit 514 that outputs comparison information relating to the comparison result between the first feature point information and the second feature point information.

Description

Technical Field

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[0001] The present invention relates to an information processing system, an information processing method, and an information processing program.

Background Art

[0002] An optical film is used for displays such as liquid crystal display devices. A web such as an optical film is composed of a laminate of a plurality of webs. In such a manufacturing process of an optical film or the like, strict management of defects generated in the web is required. For example, Patent Document 1 describes a technique related to defects generated in a web.

Prior Art Documents

Patent Documents

[0003]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0004] The laminate of a plurality of webs may include an opaque web such as a protector, a separator, or an antiglare film. In a laminate including an opaque web, it is likely to be difficult to detect defects. Therefore, it is desirable to be able to more easily analyze defects present in a laminate including an opaque web.

[0005] <00​​​​​​​​​​​(1) An information processing system comprising: an acquisition unit that acquires first feature point information relating to feature points present in a first web and second feature point information relating to feature points present in a laminate formed by stacking an opaque second web on the first web; a comparison unit that compares the acquired first feature point information and the second feature point information; and an output unit that outputs comparison information relating to the comparison result between the first feature point information and the second feature point information.

[0008] (2) The comparison unit classifies the feature points present in the first web and the feature points present in the laminate into first-type feature points present in the first web and disappearing in the laminate, second-type feature points not present in the first web but appearing in the laminate, and third-type feature points present in the first web and remaining in the laminate, and the comparison information includes information relating to at least one of the first-type feature points, second-type feature points and third-type feature points, as described in (1) above.

[0009] (3) The information processing system according to (1) above, wherein the acquisition unit further acquires third feature point information present in the second web, and the comparison unit compares the acquired first feature point information and third feature point information with the second feature point information.

[0010] (4) The alignment unit further comprises a positioning unit that associates feature points present in the first web with feature points present in the laminate based on their relative positions, and the comparison unit compares the first feature point information with the second feature point information using the result of the matching, as described in (1) above. Information processing system.

[0011] (5) The information processing system described in (1) above, wherein the output unit outputs the comparison information by causing the display unit to display the comparison information.

[0012] (6) The first web is the information processing system described in (1) above, having a stacked structure of multiple webs.

[0013] (7) The information processing system according to (1) above, wherein the second web includes at least one of a protector, a separator, or an anti-glare film.

[0014] (8) The second web is the information processing system described in (1) above, having haze of 5% or more.

[0015] (9) An information processing method comprising: acquiring first feature point information relating to feature points present in a first web and second feature point information relating to feature points present in a laminate obtained by stacking an opaque second web on the first web; comparing the acquired first feature point information and the second feature point information; and outputting comparison information relating to the comparison result between the first feature point information and the second feature point information.

[0016] (10) An information processing program that causes a computer to execute the information processing method described in (9) above. [Effects of the Invention]

[0017] In the information processing system, information processing method, and information processing program according to the present invention, first feature point information and second feature point information are compared, and comparison information regarding the comparison result is output. As a result, for example, a manufacturing manager can easily grasp the feature points that remain from the state of the first web among the feature points present in the laminate containing the opaque second web, thereby enabling a simpler analysis of defects present in the laminate containing the opaque web. [Brief explanation of the drawing]

[0018] The advantages and features provided by one or more embodiments of the present invention will be better understood from the following detailed description and accompanying drawings, which are for illustrative purposes only and are not intended to define any limitations of the present invention. [Figure 1] This is a schematic diagram showing an example of the application of the information processing system according to the first embodiment. [Figure 2]It is a cross-sectional view showing an example of the configuration of the first laminate and the second laminate shown in FIG. 1. [Figure 3A] It is a schematic diagram showing an example of the configuration of the inspection apparatus shown in FIG. 1. [Figure 3B] It is another schematic diagram showing the configuration of the inspection apparatus shown in FIG. 3A. [Figure 3C] It is a schematic diagram showing another configuration of the inspection apparatus shown in FIG. 3A. [Figure 4] It is a block diagram showing the schematic configuration of the terminal device shown in FIG. 1. [Figure 5] It is a table for explaining the classification of feature points existing in each of the first laminate and the second laminate shown in FIG. 2. [Figure 6] It is a block diagram showing the schematic configuration of the information processing system shown in FIG. 1. [Figure 7A] It is an example of a user list stored in the storage unit shown in FIG. 6. [Figure 7B] It is an example of a lot list stored in the storage unit shown in FIG. 6. [Figure 8A] It is an example of an inspection data DB stored in the storage unit shown in FIG. 6. [Figure 8B] It is another example of an inspection data DB stored in the storage unit shown in FIG. 6. [Figure 8C] It is another example of an inspection data DB stored in the storage unit shown in FIG. 6. [Figure 9] It is a diagram for explaining the comparison result between the first feature point information and the second feature point information by the control unit shown in FIG. 6. [Figure 10] It is a flowchart showing an example of the process executed by the information processing system shown in FIG. 1. [Figure 11] It is a subroutine flowchart of the process of step S33 shown in FIG. 10. [Figure 12] It is a subroutine flowchart executed by the information processing system according to the second embodiment. [Figure 13] It is a diagram showing an example of a probability density function calculated by kernel density estimation shown in FIG. 12. [Figure 14]This is a cross-sectional view showing an example of the configuration of a laminate to which the information processing system according to the third embodiment is applied. [Figure 15] Figure 14 is a schematic diagram illustrating an example of the manufacturing process for the laminate shown. [Modes for carrying out the invention]

[0019] Embodiments of the present invention will be described below with reference to the attached drawings. However, the scope of the present invention is not limited to the disclosed embodiments. In the description of the drawings, the same elements are denoted by the same reference numerals, and redundant descriptions are omitted. Also, the dimensional ratios in the drawings are exaggerated for illustrative purposes and may differ from the actual ratios.

[0020] <First Embodiment> Figure 1 is a schematic diagram showing an application example of the information processing system 50 according to the first embodiment. The information processing system 50 is composed of, for example, a server. This information processing system 50 communicates with the terminal device 70 of the factory 100 via a network. The network is a communication line such as a data communication network. In some networks, wired LANs or wireless LANs may be used. The wireless LAN is, for example, a LAN that conforms to the IEEE 802.11 standard. The information processing system 50 may also be connected to other factories via the network. In the factory 100, the manufacturing equipment 2000 manufactures the second laminate 80B from the first laminate 80A. The second laminate 80B is, for example, wound into a roll. Here, the first laminate 80A corresponds to a specific example of the first web of the present invention, and the second laminate 80B corresponds to a specific example of the laminate of the present invention.

[0021] Figure 2 shows an example of the cross-sectional configuration of the first laminate 80A and the second laminate 80B. The first laminate 80A includes a first web 81, a second web 82, and a third web 83. In the first laminate 80A, the first web 81, the second web 82, and the third web 83 are laminated in this order. An adhesive layer 801 is provided between the first web 81 and the second web 82. An adhesive layer 802 is provided between the second web 82 and the third web 83. The first web 81 and the third web 83 are, for example, TAC films. TAC is an abbreviation for triacetylcellulose. The second web 82 is, for example, an optically functional film such as a polarizer. The adhesive layer 801 adheres the first web 81 and the second web 82. The adhesive layer 802 adheres the second web 82 and the third web 83. The first laminate 80A is an opaque web and, for example, has more than 5% haze. This haze represents total haze.

[0022] The second laminate 80B includes the first laminate 80A and the fourth web 84. The fourth web 84 is bonded to the third web 83, for example, via an adhesive layer 803. The fourth web 84 is an opaque web and has, for example, more than 5% haze. Irregular light reflection and scattering occur on the surface of this fourth web 84, for example. Here, the fourth web 84 corresponds to a specific example of the second web of the present invention. The fourth web 84 is, for example, a protector. After bonding this fourth web 84 to the first laminate 80A, For example, the second laminate 80B is subjected to a slitting process. In this case, the surface of the first laminate 80A is protected by the fourth web 84, preventing scratches and other damage from occurring on the surface of the first laminate 80A. The fourth web 84 may be a separator or the like. In the second laminate 80B, an adhesive layer may be provided instead of the adhesive layers 801, 802, and 803.

[0023] [Factory 100] In factory 100, for example, a second laminate 80B is manufactured by bonding a fourth web 84 to a first laminate 80A via an adhesive layer 803. The first laminate 80A may be manufactured in factory 100 or in another factory. The width of the second laminate 80B is, for example, in the range of 1000 mm to 5000 mm. The thickness of each of the first web 81, second web 82, third web 83, and fourth web 84 is set in the range of 15 μm to 500 μm, taking into consideration quality and handling. When the first web 81, second web 82, third web 83, or fourth web 84 contains a metal such as steel, the thickness of the first web 81, second web 82, third web 83, or fourth web 84 may be 1 mm or more. The length of the rolled second laminate 80B is, for example, in the range of 2000 m to 10000 m.

[0024] At factory 100, the second laminate 80B is inspected. For example, the surface of the second laminate 80B is inspected by inspection device 90. Inspection device 90 includes, for example, a camera. Optical inspection by inspection device 90 generates inspection data for the second laminate 80B. This inspection data includes second feature point information regarding feature points present in the second laminate 80B.

[0025] Here, feature points present in the second laminate 80B refer to optical feature points present in the web, specifically spots that have optical differences from their surroundings. Note that a predetermined threshold may be set for determining the optical difference from the surroundings, and those exceeding this threshold may be considered feature points. Feature points present in the web may also be referred to as defects, malfunctions, and failures of the web. Feature points include, for example, defects resulting from poor adhesion during the bonding of multiple webs, and defects resulting from axial irregularities, etc. For bonding multiple webs, ultrasonic fusion, for example, may be used. For example, tens to tens of thousands of feature points can be detected from image data of a single second laminate 80B. The total length of the second laminate 80B is, for example, several hundred meters to several kilometers. Note that multiple defects, malfunctions, and failures within a predetermined area (e.g., 10 mm square) may be considered as a single feature point.

[0026] The second feature point information relating to feature points present in the second stack 80B includes, for example, information regarding the position and size of each of the multiple feature points present in the second stack 80B. The position of a feature point can be represented, for example, using XY coordinates. In the second feature point information, multiple adjacent feature points may be clustered.

[0027] The inspection device 90 for detecting feature points present in the second laminate 80B is either a transmissive or reflective inspection device. The transmissive inspection device 90 irradiates the second laminate 80B with light and receives the light that has passed through the second laminate 80B. The reflective inspection device 90 irradiates the second laminate 80B with light and receives the light that has been reflected by the second laminate 80B. The transmissive inspection device and the reflective inspection device each include a bright-field inspection device and a dark-field inspection device. Multiple inspection devices 90 may be installed in the factory 100.

[0028] Figures 3A and 3B show an example of the configuration of a reflective inspection device 90. Figure 3A shows the configuration of the inspection device 90 viewed from the width direction of the second stacked body 80B. Figure 3B shows the configuration of the inspection device 90 viewed from the transport direction of the second stacked body 80B. The inspection device 90 includes, for example, a light source 91, a camera 92, an analysis unit 93, and a storage unit 94.

[0029] In the inspection device 90, the camera 92 captures images of the surface of the second laminate 80B and generates image data. The number of cameras 92, the field of view, and the distance to the surface of the second laminate 80B are set appropriately so that the entire width of the second laminate 80B is captured. Figure 3B shows the inspection device 90 having two cameras 92 in the width direction.

[0030] The light source 91 irradiates light onto the inspection area of ​​the second laminate 80B. The light source 91 irradiates light uniformly in the width direction of the roll-shaped second laminate 80B. Here, uniform irradiation means that the illuminance of the irradiated light is approximately the same.

[0031] Camera 92 is an optical sensor that optically reads the inspection area of ​​the second laminate 80B. Camera 92 has an image sensor such as a CCD and CMOS, and a lens, etc. CCD is an abbreviation for Charge Coupled Device. CMOS is an abbreviation for Complementary Metal Oxide Semiconductor. Camera 92 generates two-dimensional image data from the output signals of each image sensor. Camera 92 detects diffuse light from the light reflected from the surface of the second laminate 80B after being irradiated by the light source 91. Camera 92 may be a color camera or a monochrome camera. Camera 92 may detect light in the visible light region or light in the infrared region.

[0032] Camera 92 can, for example, read the entire width of the second stacked structure 80B at once. It is desirable that the contrast of the image data captured by camera 92 be above a predetermined value. In other words, it is desirable that the light-illuminated area of ​​the second stacked structure 80B and the unilluminated area have a contrast of above a predetermined value. To generate image data with a contrast of above a predetermined value, it is desirable to use a powerful and highly directional light source 91.

[0033] Here, "powerful" means, for example, that when the illuminance at an irradiation distance of 50 mm is E50, the illuminance E50 is 50,000 lx or more. Also, "highly directional" means, for example, that when the illuminance at an irradiation distance of 50 mm is E50 and the illuminance at an irradiation distance of 100 mm is E100, the condition (E50-E100) / E50 < 0.5 is satisfied.

[0034] Camera 92 is positioned, for example, to receive specularly reflected light from light source 91. Camera 92 may also be positioned to avoid specularly reflected light from light source 91, that is, to receive diffused light from the second laminate 80B.

[0035] The analysis unit 93 consists of a CPU and RAM, etc. The analysis unit 93 reads various processing programs stored in the memory unit 94, loads them into RAM, and performs various processing in cooperation with the programs. The analysis unit 93 processes image data captured by the camera 92 to detect feature points present in the second stack 80B. For example, the analysis unit 93 applies predetermined image processing to the image data, then detects feature points and quantitatively evaluates each detected feature point. For image analysis, for example, known techniques are used. Specifically, pixels whose pixel values ​​in the image deviate by a predetermined amount from the surrounding average value are extracted as feature points. The analysis unit 93 may detect feature points using the following method.

[0036] The analysis unit 93 divides the image data captured by the camera 92 into multiple regions. For example, the analysis unit 93 divides the image data into n regions in the width direction. n regions can range from a few to several dozen. Hereafter, the n regions will be referred to as region a1 to region an.

[0037] Next, the analysis unit 93 acquires image data of one region a1 and performs mathematical processing on the image data of region a1. Mathematical processing includes, for example, preprocessing, enhancement processing, signal processing, and image processing. This includes features extraction, etc.

[0038] Image preprocessing includes, for example, image cropping, low-pass filtering, high-pass filtering, Gaussian filtering, median filtering, bilateral filtering, morphological transformation, color transformation, contrast adjustment, noise reduction, blur / blur image restoration, masking, Hough transform, and projection transformation. Color transformations include, for example, L*a*b*, sRGB, HSV, and HSL.

[0039] Enhancement techniques include, for example, the Sobel filter, Scharr filter, Laplacian filter, Gabor filter, and Canny method.

[0040] Signal processing includes, for example, calculating basic statistics, sums of squares and roots, differences, sums, products, ratios, and distance matrices, differential and integral calculus, thresholding, Fourier transforms, wavelet transforms, and peak detection. Basic statistics include, for example, maximum, minimum, mean, median, standard deviation, variance, and quartiles. Thresholding includes, for example, binarization and adaptive binarization. Peak detection includes, for example, detecting peak values, number of peaks, or full width at half maximum.

[0041] Image feature extraction includes template matching and SIFT features, among others.

[0042] The analysis unit 93 performs mathematical processing on the image data of region a1, and then performs thresholding on the values ​​obtained from this processing. Thresholding is a process that determines whether or not an object is a feature point based on a predetermined threshold, and also determines the size of the feature point, etc.

[0043] The analysis unit 93 performs the same processing on regions other than region a1.

[0044] After processing each region a1 to an, the analysis unit 93 integrates the results for each region a1 to an. This allows the feature points present in each region of the second laminate 80B to be detected, corresponding to their position, size, etc. After this, the analysis unit 93 stores the detection results of the feature points of the second laminate 80B in the storage unit 94.

[0045] The analysis unit 93 may, for example, combine multiple images obtained by continuous shooting with one camera 92. The analysis unit 93 may, for example, generate a single image data of the entire surface of the second laminate 80B and store it in the storage unit 94. Alternatively, the analysis unit 93 may generate multiple image data associated with the shooting time and store them in the storage unit 94. The analysis unit 93 may combine multiple image data obtained by multiple cameras 92 arranged in the width direction. The analysis unit 93 may, for example, refer to the stored transport speed to determine the longitudinal position of the second laminate 80B based on the shooting time.

[0046] The storage unit 94 is composed of an HDD and an SSD, etc. SSD is an abbreviation for Solid State Drive. The storage unit 94 stores various processing programs and data necessary for the execution of those programs. For example, the storage unit 94 stores image data captured by the camera 92, linked to the time of capture. The storage unit 94 also stores manufacturing conditions, such as the winding speed in the manufacturing apparatus 2000. The manufacturing conditions for the second laminate 80B may be included in the process list of the inspection DB described later.

[0047] Figure 3C shows an example of a transmissive inspection device 90. In this inspection device 90, the light source 91 is positioned opposite the camera 92, with the second stacked body 80B in between.

[0048] The inspection device 90 may have multiple inspection units. For example, the camera 92 may be a camera for detecting scratches on the surface of the second laminate 80B and a camera for detecting foreign matter inside the second laminate 80B. It may include a camera for this purpose. The inspection data may consist of data from some of the inspection units, or a combination of results from multiple inspection units.

[0049] [Configuration of terminal device 70] The terminal device 70 is a computer such as a PC, smartphone, or tablet. PC is an abbreviation for Personal Computer. The terminal device 70 is configured to be connectable to the information processing system 50. The terminal device 70 sends and receives various types of information to and from the information processing system 50. For example, the terminal device 70 is a PC used by an employee of a manufacturing company operating a factory 100.

[0050] Figure 4 is a block diagram showing the schematic configuration of the terminal device 70. The terminal device 70 has a CPU 71, ROM 72, RAM 73, storage 74, communication interface 75, display unit 76, and operation reception unit 77. CPU is an abbreviation for Central Processing Unit. ROM is an abbreviation for Read Only Memory. RAM is an abbreviation for Random Access Memory. Each component is connected to the others via a bus 78 so as to be able to communicate with each other.

[0051] The CPU 71 controls each of the above configurations and performs various calculations according to the program recorded in the ROM 72 or storage 74.

[0052] ROM72 stores various programs and data.

[0053] RAM73 is used as a working area to temporarily store programs and data.

[0054] Storage 74 stores various programs, including the operating system, and various data. For example, storage 74 has an application installed for displaying various information transmitted from the information processing system 50.

[0055] The communication interface 75 is an interface for communicating with other devices. Various wired or wireless communication interfaces are used as the communication interface 75. The communication interface 75 is used, for example, when transmitting inspection data from the inspection device 90 to the information processing system 50, and when receiving comparison information (described later) from the information processing system 50.

[0056] The display unit 76 includes, for example, a liquid crystal display or an organic EL display. The display unit 76 displays various information. The display unit 76 may also consist of viewer software or a printer.

[0057] The operation reception unit 77 includes, for example, a touch sensor, a pointing device such as a mouse, or a keyboard. The operation reception unit 77 receives various operations from the user. In addition, the display unit 160 and the operation reception unit 77 may be configured as a touch panel by superimposing a touch sensor, which is the operation reception unit 77, onto the display surface, which is the display unit 76.

[0058] The terminal device 70 may generate second feature point information by performing image analysis on image data of the second stacked material 80B captured by the inspection device 90. The terminal device 70 transmits the inspection data, including the second feature point information, to the information processing system 50, for example.

[0059] The terminal device 70 further transmits, for example, inspection data of the first laminate 80A to the information processing system 50. This inspection data includes first feature point information relating to feature points present in the first laminate 80A. The feature points present in the first laminate 80A are, for example, the inspection device It is detected optically using an inspection device similar to the one used for position 90.

[0060] Inspection data of the first laminate 80A may be transmitted to the information processing system 50 from another terminal device. The other terminal device may be, for example, a terminal device at the factory that manufactured the first laminate 80A.

[0061] The information processing system 50, for example, compares the first feature point information and the second feature point information received from the terminal device 70 and classifies each feature point into three types: first-type feature point, second-type feature point, and third-type feature point.

[0062] Figure 5 is a table for explaining Type 1, Type 2, and Type 3 feature points, respectively. Multiple feature points present in the first laminate 80A can be classified, for example, into Type 1 and Type 3 feature points. Feature points present in the second laminate 80B can be classified, for example, into Type 2 and Type 3 feature points.

[0063] Type 1 feature points are feature points that exist only in the first laminate 80A and not in the second laminate 80B. In other words, Type 1 feature points are feature points that disappeared during the lamination process of the fourth web 84. Even if these Type 1 feature points exist in the first laminate 80A, they are feature points that are relatively unlikely to affect subsequent processes after the lamination process of the fourth web 84. In this specification, feature points that do not exist in the web or have disappeared do not necessarily have to be completely gone; the concept also includes feature points that exist as feature points but are unlikely to be problematic as defects.

[0064] Type 2 feature points are feature points that are not present in the first laminate 80A but are present in the second laminate 80B. In other words, Type 2 feature points are feature points newly generated during the lamination process of the fourth web 84. These Type 2 feature points are feature points that result from the lamination process of the fourth web 84.

[0065] Type 3 feature points are feature points present in both the first laminate 80A and the second laminate 80B. That is, Type 3 feature points are generated in a process prior to the manufacturing process of the first laminate 80A and remain in the second laminate 80B. These Type 3 feature points are relatively likely to affect processes after the lamination process of the fourth web 84. Note that the shape and size of Type 3 feature points may change due to the lamination process of the fourth web 84 compared to when they were present in the first laminate 80A. Additional failures may occur depending on the lamination process.

[0066] The information processing system 50, for example, classifies and stores the feature points present in the first stack 80A and the feature points present in the second stack 80B as Type 1 feature points, Type 2 feature points, and Type 3 feature points. By classifying and storing the feature points as Type 1 and Type 3 feature points, it is possible to determine whether the feature points from the first stack 80A remain in the second stack 80B or have disappeared.

[0067] [Configuration of Information Processing System 50] Figure 6 is a block diagram showing the schematic configuration of the information processing system 50. The information processing system 50 includes, for example, a control unit 51, a storage unit 52, and a communication unit 53.

[0068] The control unit 51 includes, for example, a CPU and memory such as RAM and ROM. The CPU is composed of a multi-core processor that controls the above-mentioned parts and performs various calculations according to a program. Each function of the information processing system 50 is performed by the CPU executing the corresponding program. The specific functions of the control unit 51 will be described later.

[0069] The memory unit 52 is a large-capacity auxiliary storage device that stores various programs, including the operating system, and various data. For example, a hard disk, solid-state drive, flash memory, or ROM can be used for storage. The memory unit 52 stores, for example, a user list, a lot list, and an inspection data database. For example, the manager of factory 100 manages the user list and the lot list, respectively. The manager of factory 100 is, for example, an employee of the manufacturer operating factory 100.

[0070] Figure 7A shows an example of a user list. The user list includes information such as each user's user ID, username, and contact information. Each user may have access rights to the inspection data database, for example, each user may be able to access various data related to a given website.

[0071] Figure 7B shows an example of a lot list. The lot list includes information such as the lot ID, product name, customer user ID, manufacturing conditions, size, and manufacturing date for each lot.

[0072] Figures 8A to 8C each show an example of an inspection data database. The inspection data database includes, for example, process lists for each manufacturing process of the first laminate 80A and the second laminate 80B, and inspection data for each inspection performed in each manufacturing process.

[0073] Figure 8A shows an example of a process list. The process list includes information such as the lot ID, the width and length of the web at each process, the process name, the web stretching ratio, the number of web layers, the orientation of the width and length, etc. The process list also includes information about inspections performed at each manufacturing process. Information about each inspection includes, for example, the inspection ID for each inspection, the inspection equipment ID of the inspection equipment used for each inspection, the inspection data, and the date and time of the inspection. Information about the orientation of the width and length of the web is represented, for example, by whether it is the same as or reversed from the orientation of the width and length of the web in the previous process.

[0074] Figures 8B and 8C each show an example of inspection data for each inspection included in the process list. Figure 8B shows an example of inspection data with inspection ID i0101. This inspection data is, for example, the inspection data for the first laminate 80A. This inspection data includes information such as the feature point ID, position, area, length, width, maximum brightness, minimum brightness, classification, and presence or absence of concentrated dots for feature points present in the first laminate 80A. In other words, this inspection data includes first feature point information regarding feature points present in the first laminate 80A.

[0075] Figure 8C shows an example of inspection data with inspection ID i0102. This inspection data is, for example, inspection data for the second layer 80B. This inspection data includes information such as the feature point ID, location, area, length, width, maximum brightness, minimum brightness, classification, and presence or absence of concentrated dots for feature points present in the second layer 80B. In other words, this inspection data includes second feature point information regarding feature points present in the second layer 80B.

[0076] The location of a feature point is represented, for example, by an XY coordinate system based on a predetermined location on each web. The X coordinate is, for example, the width coordinate of each web and can take on a range of, for example, 0 to 3000 mm. The Y coordinate is, for example, the longitudinal coordinate of each web and can take on a range of, for example, 0 to 10000 m.

[0077] The classification of feature points represents, for example, the shape and brightness distribution of each feature point. Each feature point is classified into approximately 5 to 20 categories according to, for example, its shape and brightness distribution. The presence or absence of concentrated points indicates, for example, whether or not multiple feature points exist around that feature point.

[0078] The inspection data may include inspection data for the fourth web 84. This inspection data may include, for example, information about the feature points present in the fourth web 84, such as feature point ID, location, area, length, width, maximum brightness, minimum brightness, division, and presence or absence of concentrated dots.

[0079] The communication unit 53 is an interface that connects to external devices such as the terminal device 70 via a network.

[0080] [Functions of Information Processing System 50] As shown in Figure 6, the information processing system 50 functions as an acquisition unit 511, a alignment unit 512, a comparison unit 513, and an output unit 514, with the control unit 51 reading a program stored in the storage unit 52 and executing processing.

[0081] The acquisition unit 511 acquires first feature point information and second feature point information. The first feature point information is information about feature points present in the first laminate 80A. The first feature point information includes, for example, information about each of the multiple feature points present in the first laminate 80A, such as the feature point ID, position, area, length, width, maximum brightness, minimum brightness, classification, and presence or absence of concentrated dots.

[0082] The second feature point information is information about feature points present in the second laminate 80B. The second feature point information includes, for example, information about each of the multiple feature points present in the second laminate 80B, such as the feature point ID, location, area, length, width, maximum brightness, minimum brightness, classification, and presence or absence of concentrated dots.

[0083] The first feature point information and the second feature point information preferably include at least information about the location of each feature point. The location of a feature point is represented, for example, by XY coordinates based on a predetermined location on each web. The acquisition unit 511 acquires the first feature point information and the second feature point information from, for example, the terminal device 70. The acquisition unit 511 may also acquire the first feature point information and the second feature point information from the storage unit 52.

[0084] The acquisition unit 511 may further acquire third feature point information. The third feature point information is information about feature points present in the fourth web 84. The third feature point information includes, for example, information about each of the multiple feature points present in the fourth web 84, such as the feature point ID, location, area, length, width, maximum brightness, minimum brightness, classification, and presence or absence of concentrated dots.

[0085] The alignment unit 512 aligns the XY coordinates of the first laminate 80A with the XY coordinates of the second laminate 80B. The alignment unit 512, for example, associates predetermined feature points present in the first laminate 80A with predetermined feature points present in the second laminate 80B based on their relative positions. This association is performed based on first feature point information and second feature point information acquired by the acquisition unit 511. This association of feature points aligns the XY coordinates between the first laminate 80A and the second laminate 80B. The alignment unit 512 may also align the XY coordinates of the first laminate 80A, the XY coordinates of the second laminate 80B, and the XY coordinates of the fourth web 84.

[0086] The comparison unit 513 compares the first feature point information and the second feature point information acquired by the acquisition unit 511. The comparison unit 513 compares the first feature point information and the second feature point information using the results of the correspondence performed by the alignment unit 512. Specifically, the comparison unit 513 classifies the feature points present in the first laminate 80A and the feature points present in the second laminate 80B into first-type feature points, second-type feature points, and third-type feature points based on this comparison. The comparison unit 513 classifies the feature points for the first laminate 80A and the second laminate 80B, whose XY coordinates have been aligned by the alignment unit 512.

[0087] Figure 9 shows an example of the comparison result between the first feature point information and the second feature point information. The comparison unit 513, for example, integrates and compares the feature points present in the first laminate 80A and the feature points present in the second laminate 80B. The comparison unit 513, for example, assigns a new feature point ID to all the integrated feature points. The comparison unit 513, for example, classifies each feature point ID into a first-type feature point, a second-type feature point, or a third-type feature point. The comparison result may include information regarding the accuracy of the classification of first-type, second-type, and third-type feature points.

[0088] The comparison unit 513 may compare the first feature point information and the third feature point information acquired by the acquisition unit 511 with the second feature point information.

[0089] The output unit 514 outputs comparison information relating to the comparison result between the first feature point information and the second feature point information obtained by the comparison unit 513. The output unit 514 outputs the comparison information, for example, by displaying the comparison information on the display unit 76 of the terminal device 70.

[0090] The output unit 514, for example, causes the display unit 76 to display feature points present in the first stack 80A and feature points present in the second stack 80B. This screen displays the first stack 80A and the second stack 80B, whose XY coordinates have been aligned by the alignment unit 512. The output unit 514, for example, displays a predetermined area of ​​the second stack 80B and the area of ​​the first stack 80A corresponding to this predetermined area. The output unit 514, for example, causes the display unit 76 to display feature points present in the second stack 80B and feature points present in the first stack 80A using different colors. The output unit 514 may also cause the display unit 76 to display feature points present in each web included in the first stack 80A.

[0091] For example, on one screen, a predetermined area of ​​the second laminate 80B and the area of ​​the first laminate 80A corresponding to this predetermined area may be displayed overlapping. Alternatively, on one screen, a predetermined area of ​​the second laminate 80B and the area of ​​the first laminate 80A corresponding to this predetermined area may be displayed side by side.

[0092] The comparison information includes, for example, information about at least one of the first type feature points, second type feature points, and third type feature points. Preferably, the output unit 514 outputs the comparison information so that the first and second type feature points and the third type feature points are distinguished. The output unit 514 displays the first and second type feature points and the third type feature points on the display unit 76 using different colors from each other. The output unit 514 may also display the first type feature points, second type feature points, and third type feature points on the display unit 76 using different colors from each other.

[0093] The output unit 514 may output comparison information relating to the comparison result between the first feature point information and the third feature point information obtained by the comparison unit 513 and the second feature point information.

[0094] Figure 10 is a flowchart showing an example of the procedure for outputting comparative information performed in the information processing system 50. The processing of the information processing system 50 shown in the flowchart of Figure 10 is stored as a program in the storage unit 52 of the information processing system 50 and is executed by the CPU controlling each part.

[0095] (Step S31) The information processing system 50 acquires inspection data of the first laminate 80A and inspection data of the second laminate 80B, for example, in response to instructions from a user via a terminal device 70. This allows the information processing system 50 to acquire first feature point information regarding feature points present in the first laminate 80A and second feature point information regarding feature points present in the second laminate 80B. At a predetermined timing, the information processing system 50 acquires the inspection data of the first laminate 80A. Inspection data for the first layer and the second layer 80B may be obtained.

[0096] (Step S32) The information processing system 50 performs preprocessing on each inspection data in order to align the coordinate systems of the first stack 80A and the second stack 80B. For example, the information processing system 50 aligns the XY coordinate system of the first stack 80A with the XY coordinate system of the second stack 80B.

[0097] The information processing system 50 may, for example, invert the Y coordinate of the first laminate 80A as a preprocessing step for each inspection data. The information processing system 50 may also invert the X coordinate of the first laminate 80A. The information processing system 50 may transform the XY coordinate of the first laminate 80A according to the stretching ratio of the first laminate 80A and the second laminate 80B, etc.

[0098] The information processing system 50 further performs noise reduction processing as preprocessing for each inspection data. The noise reduction processing includes, for example, at least one of the following: removal of low-intensity feature points, removal of extremely small feature points, and removal of consecutive dots. The noise reduction processing may also include the removal of concentrated dots in the width direction. Concentrated dots in the width direction occur, for example, at the leading and trailing ends of the first laminate 80A and the second laminate 80B.

[0099] (Step S33) The information processing system 50 performs preprocessing on each inspection data, and then performs alignment processing between the coordinate system of the first stack 80A and the coordinate system of the second stack 80B.

[0100] Figure 11 is a subroutine flowchart showing the alignment process in step S33.

[0101] (Steps S401~S403) First, the information processing system 50 roughly adjusts the XY coordinates of the feature points of the first stack 80A and the second stack 80B as follows. For example, the information processing system 50 first shifts the coordinate position of a predetermined feature point of the first stack 80A by a predetermined amount. Next, the information processing system 50 calculates the distances L1 to Lm between this predetermined feature point of the first stack 80A and the corresponding feature point of the second stack 80B, and selects the shift amount (x1, y1) whose sum is the smallest. The information processing system 50 may use the average value instead of the sum. For example, the information processing system 50 determines the feature point of the second stack 80B that has the closest coordinate position to the predetermined feature point of the first stack 80A as the feature point of the second stack 80B corresponding to the predetermined feature point of the first stack 80A. If the information processing system 50 cannot determine the feature points of the second laminate 80B that correspond to a predetermined feature point of the first laminate 80A, that is, if the predetermined feature point is a first-class feature point, it may exclude this feature point and calculate the sum of distances L1 to Lm.

[0102] The information processing system 50, for example, sequentially shifts the coordinate positions of predetermined feature points of the first stacked material 80A from (-shift_x,-shift_y) to (+shift_x,+shift_y) around the central shift amount (0,0) with a fixed coarse adjustment shift amount a step size. From the coordinate positions of these predetermined feature points of the first stacked material 80A, it calculates the distances L1 to Lm to each of the feature points 1 to m of the second stacked material 80B. Then, from (-shift_x,-shift_y) to (+shift_x,+shift_y), it selects the shift amount (x1,y1) that minimizes the sum of distances L1 to Lm.

[0103] For example, if the coarse adjustment shift amount a = 1.0 mm, then (-shift_x, -shift_y) = (-10 mm, -10 mm) and (-shift_x, +shift_y) = (+10 mm, +10 mm). The information processing system 50 adjusts the coarse adjustment shift amount a in the X direction and You may also use different units for the Y direction. For example, you could use millimeters for the X direction and meters for the Y direction, so that (-shift_x,-shift_y)=(-10mm,-10m) and (-shift_x,+shift_y)=(+10mm,+10m).

[0104] (Steps S404~S406) Next, the information processing system 50 fine-tunes the XY coordinates of the feature points of the first laminate 80A and the second laminate 80B, and selects a shift amount (x2, y2). The information processing system 50 selects the shift amount (x2, y2) in much the same manner as in steps S401 to S403 above. Steps S404 to S406 differ from steps S401 to S403 in the following respects, for example: The fine-tuned shift amount b in step S404 is smaller than the coarse-tuned shift amount a. Also, the center shift amount in step S405 uses the shift amount (x1, y1) selected in step S403. For example, the fine-tuned shift amount b is sufficiently smaller than the coarse-tuned shift amount a, for example, one order of magnitude smaller, 0.1 mm.

[0105] (Step S407) The information processing system 50 uses the shift amount (x2, y2) selected in step S406 to perform a coordinate transformation process on all feature points of the first stacked material 80A.

[0106] (Step S408) The information processing system 50 calculates the distances L1 to Lm after the coordinate transformation in step S407 and checks whether the sum of the distances L1 to Lm is less than a predetermined threshold. If it is greater than or equal to the predetermined threshold, the information processing system 50 may determine that the coordinate transformation process in step S407 was inappropriate.

[0107] (Step S409) If the alignment is incorrect, i.e., if the answer is YES, the information processing system 50 terminates the process. If the alignment is incorrect, the information processing system 50 may display an error message on the display unit 76 or record in the inspection data DB that the calculation could not be performed. On the other hand, if the alignment is correct, i.e., if the answer is NO, the information processing system 50 terminates the process shown in Figure 11, returns to the process shown in Figure 10, and executes the processes from step S34 onwards.

[0108] (Step S34) The information processing system 50 compares the first feature point information with the second feature point information. Specifically, the information processing system 50 compares the feature points present in the first stacked body 80A with the feature points present in the second stacked body 80B. For example, the coordinates of the feature points present in the first stacked body 80A have been transformed by the processing in step S33. Based on this comparison, the information processing system 50 classifies the feature points present in the first stacked body 80A and the feature points present in the second stacked body 80B into either type 1 feature points, type 2 feature points, or type 3 feature points.

[0109] (Step S35) The information processing system 50 outputs the comparison result from step S34 and terminates the process.

[0110] [Effects and benefits of information processing system 50] In the information processing system 50 according to the present invention, first feature point information and second feature point information are compared, and comparison information regarding the comparison result is output. This allows, for example, a manufacturing manager to easily identify feature points present in the second laminate 80B, which includes the opaque fourth web 84, that remain from the time of inspection of the first laminate 80A. Therefore, it becomes possible to more easily analyze defects present in the second laminate 80B, which includes the opaque fourth web 84. The effects of this system will be explained below.

[0111] Strict quality control is required for webs such as optical films. For example, the occurrence of defects in the web is strictly controlled. Defects include, for instance, foreign matter, scratches, and dents. Such webs are manufactured through multiple processes, and quality inspections are performed at each stage.

[0112] In laminations of webs that include opaque webs, defect detection is more difficult compared to laminations consisting solely of transparent webs. Opaque webs, for example, have minute irregularities on their surface or contain light-scattering materials. As a result, irregular light scattering and reflection occur in opaque webs. Therefore, when inspecting laminations containing opaque webs using optical methods, noise is more likely to occur, potentially reducing the sensitivity and accuracy of the inspection.

[0113] In contrast, the information processing system 50 compares the feature points present in the second stack 80B with the feature points present in the first stack 80A. Therefore, even if the inspection data of the second stack 80B contains noise, it is possible to easily identify, for example, the feature points present in both the first stack 80A and the second stack 80B, i.e., the third type of feature points remaining in the second stack 80B from the first stack 80A. Thus, even if the inspection data of the second stack 80B contains noise, it becomes possible to analyze defects present in the second stack 80B more easily.

[0114] In particular, the information processing system 50 aligns the coordinate systems of the first stack 80A and the second stack 80B, and then compares the feature points present in the first stack 80A with the feature points present in the second stack 80B. Therefore, it becomes possible to classify the feature points present in the first stack 80A and the feature points present in the second stack 80B into Type 1, Type 2, and Type 3 feature points with high accuracy.

[0115] Furthermore, even if both the first layer 80A and the second layer 80B are opaque, the likelihood of noise overlapping between the inspection data of the first layer 80A and the second layer 80B is low. In other words, feature points whose coordinate positions overlap between the inspection data of the first layer 80A and the second layer 80B are highly likely to be Type 3 feature points.

[0116] Furthermore, even if the optical film, such as the polarizer, contained in the first laminate 80A is opaque, regular transmission, reflection, and scattering of light occur. For this reason, unlike the protector or separator that constitutes the fourth web 84, the first laminate 80A can be inspected with high sensitivity and accuracy using optical methods.

[0117] Furthermore, it is preferable that the information processing system 50 also uses third feature point information relating to feature points present in the fourth web 84. This makes it possible to classify the feature points present in the first laminate 80A and the feature points present in the second laminate 80B into first-type feature points, second-type feature points, and third-type feature points with higher accuracy.

[0118] The following describes other embodiments of the information processing system 50 described in the first embodiment above. In order to avoid repetition of explanations, detailed explanations of configurations similar to those of the information processing system 50 described in the first embodiment above will be omitted below.

[0119] <Second Embodiment> Figure 12 is a subroutine flowchart representing the alignment process of the information processing system 50 according to the second embodiment. Figure 12 corresponds to Figure 11 described in the first embodiment above. This information processing system 50 uses kernel density estimation to align the XY coordinates of the first stacked body 80A with the XY coordinates of the second stacked body 80B. In this respect, the information processing system 50 according to the second embodiment differs from the information processing system 50 according to the first embodiment. Second Embodiment Except for this point, the information processing system 50 relating to the form has the same configuration as the information processing system 50 according to the first embodiment described above, and produces the same effects and advantages.

[0120] (Step S451) The information processing system 50 obtains a probability density function by performing kernel density estimation on the feature points of the first stacked body 80A. The kernel density estimation is performed in two dimensions, and a Gaussian kernel is used as the kernel function. A predetermined value is used for the bandwidth, for example. For example, a table associating web product names with bandwidths is stored in the storage unit 52. The information processing system 50 may use a bandwidth value corresponding to the web product name, or it may use different bandwidth values ​​depending on the number of feature points present in the first stacked body 80A. When the information processing system 50 estimates the kernel density of a predetermined feature point, it takes into account the data surrounding this feature point. Then, the information processing system 50 sums the densities of each feature point to obtain a probability density function.

[0121] Figure 13 shows an example of a probability density function calculated by kernel density estimation. The vertical and horizontal axes in Figure 13 represent the XY coordinate system, and the intensity of the color indicates the density.

[0122] (Step S452) The information processing system 50 obtains the probability density function for each feature point of the second stack 80B in the same manner as the processing in step S451.

[0123] (Steps S453~S455) The information processing system 50 compares the two obtained probability density functions and makes a correspondence based on the density distribution. Then, the information processing system 50 calculates a transformed row example based on the correspondence result and performs a coordinate transformation of the XY coordinates on the feature points of the first laminate 80A.

[0124] (Steps S456~S457) The information processing system 50 performs the processing in steps S456 to S457 in the same manner as steps S406 to S407 in Figure 11.

[0125] The information processing system 50 may use kernel density estimation for all of the alignment of the XY coordinates of the first stacked body 80A and the XY coordinates of the second stacked body 80B, or it may use kernel density estimation for part of the alignment.

[0126] In this second embodiment of the information processing system 50, similar to that described in the first embodiment, the first feature point information and the second feature point information are compared, and comparison information regarding the comparison result is output. Therefore, it becomes possible to analyze defects present in the second laminate 80B more easily.

[0127] Furthermore, in kernel density estimation, the feature points of the first layer 80A and the feature points of the second layer 80B are not determined on a one-to-one basis; instead, the probability of the feature point's existence is calculated using a probability density function. Therefore, even if the fourth web 84 is opaque and the second feature point information contains a large amount of noise, the accuracy of feature point extraction and classification is ensured. Consequently, the information processing system 50 can suitably utilize kernel density estimation.

[0128] The information processing system 50 may align the XY coordinates of the first stacked body 80A and the second stacked body 80B before stacking by other means. The information processing system 50 may, for example, perform kernel density estimation of a feature point of one of the first stacked body 80A and the second stacked body 80B. At this time, the information processing system 50 compares the obtained probability density function with that of the other feature point. As a result, the information processing system 50 aligns the XY coordinates of the first stacked body 80A and The XY coordinate position of the second layer 80B can be aligned.

[0129] <Third Embodiment> Figure 14 shows an example of the cross-sectional configuration of a laminate 80C to which the information processing system 50 according to the third embodiment is applied. Figure 14 corresponds to Figure 2 described in the first embodiment. The laminate 80C includes a fifth web 85 and a sixth web 86 on the fifth web 85. The sixth web 86 is formed by coating the fifth web 85. In this respect, the information processing system 50 according to the third embodiment differs from the information processing system 50 according to the first embodiment. Except for this point, the information processing system 50 according to the third embodiment has the same configuration as the information processing system 50 according to the first embodiment and produces the same effects. Here, the fifth web 85 corresponds to a specific example of the first web of the present invention, and the sixth web 86 corresponds to a specific example of the second web of the present invention.

[0130] The fifth web 85 is, for example, a base film. The fifth web 85 is, for example, transparent and has a haze of 2% or less. The sixth web 86 is opaque and has a haze of 5% or more. The sixth web 86 is, for example, an anti-glare layer.

[0131] Figure 15 shows an example of the manufacturing process for the laminate 80C. For example, a fifth web 85 is manufactured in factory 100A. In factory 100A, the characteristic points present on the fifth web 85 are inspected by inspection device 90A. This fifth web 85 is transported to factory 100B. The fifth web 85 may be transported to other factories. In factory 100B, a sixth web 86 is coated onto the fifth web 85 to manufacture the laminate 80C. In factory 100B, the characteristic points present on the laminate 80C are inspected by inspection device 90B. Factory 100A is equipped with, for example, manufacturing equipment 2000A, and factory 100B is equipped with, for example, manufacturing equipment 2000B.

[0132] The information processing system 50 compares the first feature point information relating to the feature points present in the fifth web 85 with the second feature point information relating to the feature points present in the laminate 80C, and outputs comparison information.

[0133] In this third embodiment of the information processing system 50, similar to that described in the first embodiment, the first feature point information and the second feature point information are compared, and comparison information regarding the comparison result is output. Therefore, it becomes possible to analyze defects present in the laminate 80C more easily.

[0134] The configuration of the information processing system 50 described above is intended to illustrate the main features of the above embodiment, and is not limited to the above configuration; various modifications can be made within the scope of the claims. Furthermore, it does not exclude configurations that are generally found in information processing devices or information processing systems. For example, the information processing system 50 may include an inspection device 90. Also, the feature point generation function of the analysis unit 93 of the inspection device 90 may be handled by the control unit 51 of the information processing system 50.

[0135] For example, in the above embodiment, an example was described in which the first web of the present invention has an opaque optical film such as a polarizer, but the first web may include other opaque webs. The first web may include, for example, a steel plate or an anti-glare film. The first web may also be transparent. A transparent first web has, for example, a haze of 2% or less. A transparent first web is, for example, a transparent optical film, a hard coat, an anti-reflection layer, or a liquid crystal layer. The second web of the present invention may include an opaque optical film such as a polarizer, a plastic film, a steel plate, and paper.

[0136] Furthermore, the means and methods for performing various processing tasks in the information processing system 50 according to the above embodiment can be implemented by either a dedicated hardware circuit or a programmed computer. The program may be provided, for example, on a computer-readable recording medium such as a USB memory stick or DVD-ROM, or it may be provided online via a network such as the Internet. In this case, the program recorded on the computer-readable recording medium is usually transferred to and stored in a storage unit such as a hard disk. The program may also be provided as a standalone application software, or it may be incorporated into the software of the device as a function of the device. DVD is an abbreviation for Digital Versatile Disc.

[0137] While embodiments of the present invention have been described and illustrated in detail, the disclosed embodiments are for illustrative purposes only and are not limiting. The scope of the present invention should be interpreted in accordance with the language of the appended claims.

[0138] This application is based on Japanese Patent Application No. 2024-59896, filed on April 3, 2024, and its disclosures are referenced and incorporated as a whole. [Explanation of Symbols]

[0139] 50 Information Processing Systems 51 Control Unit 511 Acquisition Department 512 Alignment section 513 Comparison section Output section of 514 52 Storage section 90 Inspection equipment 2000 Manufacturing equipment

Claims

1. An acquisition unit that acquires first feature point information relating to feature points present in the first web and second feature point information relating to feature points present in a laminate formed by stacking an opaque second web on the first web, A comparison unit that compares the acquired first feature point information with the second feature point information, An output unit that outputs comparison information relating to the comparison result between the first feature point information and the second feature point information. An information processing system equipped with the following features.

2. The comparison unit, based on the comparison, classifies the feature points present in the first web and the feature points present in the laminate into three types: first type feature points present in the first web that disappear in the laminate, second type feature points that are not present in the first web but appear in the laminate, and third type feature points present in the first web that remain in the laminate. The information processing system according to claim 1, wherein the comparison information includes information relating to at least one of the first type feature point, the second type feature point, and the third type feature point.

3. The acquisition unit further acquires third feature point information present in the second web, The information processing system according to claim 1, wherein the comparison unit compares the acquired first feature point information and third feature point information with the second feature point information.

4. The first web and the laminate further have an alignment section that associates the feature points present in the first web with the feature points present in the laminate based on their relative positions. The information processing system according to claim 1, wherein the comparison unit compares the first feature point information and the second feature point information using the results of the correspondence.

5. The information processing system according to claim 1, wherein the output unit outputs the comparison information by causing the display unit to display the comparison information.

6. The information processing system according to claim 1, wherein the first web has a stacked structure of multiple webs.

7. The information processing system according to claim 1, wherein the second web comprises at least one of a protector, a separator, or an anti-glare film.

8. The information processing system according to claim 1, wherein the second web has a haze of 5% or more.

9. To obtain first feature point information relating to feature points present in the first web, and second feature point information relating to feature points present in a laminate formed by stacking an opaque second web on the first web, The acquired first feature point information and the second feature point information are compared, Output comparison information regarding the comparison result between the first feature point information and the second feature point information. Information processing methods including

10. An information processing program that causes a computer to execute the information processing method described in claim 9.

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