Single-point analyzer
The switching element-based calibration method allows continuous calibration of inspection systems, addressing the disruption issue by integrating calibration into the measurement process, thereby ensuring high reliability and efficiency.
JP2026518034APending Publication Date: 2026-06-03トムラソーティングゲゼルシヤフトミツトベシユレンクテルハフツング
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- トムラソーティングゲゼルシヤフトミツトベシユレンクテルハフツング
- Filing Date
- 2024-05-06
- Publication Date
- 2026-06-03
AI Technical Summary
Technical Problem
Existing inspection systems require interruption of measurement operations for calibration, which disrupts the process flow and is costly in terms of time and efficiency, especially in material recycling facilities.
Method used
A calibration method and apparatus that uses a switching element with inspection, dark, and white reference positions to rotate between, allowing continuous calibration without interrupting measurement operations, using a single movable element for both white and dark calibration.
Benefits of technology
Enables continuous calibration of inspection systems, ensuring high reliability and efficiency by integrating calibration into the measurement process, eliminating the need for separate calibration periods and enhancing system uptime.
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Smart Images
Figure 2026518034000001_ABST
Abstract
The present invention relates to an inspection system for detecting and analyzing a subject, the inspection system comprising: an irradiation device that emits light radiation to irradiate the subject; a detection system comprising at least one detector adapted to receive and detect the light radiation; a white reference target element; and a switching element comprising at least one inspection zone, at least one dark reference zone, and at least one white reference zone. The switching element is rotatable between at least one inspection position, at least one dark reference position, and at least one white reference position, wherein in the inspection position, the inspection zone transmits light radiation originating from the subject toward the detector system; in the dark reference position, the switching element blocks at least a majority of the light radiation originating from the subject from reaching the detector system, the dark reference zone faces the at least one detector; and in the white reference position, the switching element blocks at least a majority of the light radiation originating from the subject from reaching the detector system, the white reference zone redirects and transmits light radiation originating from the white reference target element toward the detector system.
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