Monitoring system and method

Abstract

A monitoring system (100). The monitoring system (100) comprises a radiation system (106) having one or more environment mapping emitters (108) and one or more aiming optics (110). Each environment mapping emitter (108) is configured to emit electromagnetic waves to each of the aiming optics (110) of the one or more aiming optics (110). Each aiming optics (110) is configured to direct the electromagnetic waves toward each target area of ​​the environment of the monitoring system. The monitoring system (100) comprises a sensing system (120) configured to generate sensing system data at least in part on the electromagnetic waves emitted by the environment mapping emitters (108) and reflected by the target areas of the environment.

Description

Technical Field

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[0003]

[0001] The present disclosure relates to a monitoring system. In particular, the present disclosure relates to a monitoring system configured to generate data indicative of the state of the environment near the monitoring system based at least in part on a portion of electromagnetic waves that are radiated, reflected by the environment near the monitoring system, and detected by a sensing system of the monitoring system. The present disclosure also relates to a method of generating monitoring system output data. In particular, the present disclosure relates to a method of generating monitoring system output data based at least in part on electromagnetic waves incident on at least a portion of the monitoring system.

Background Art

[0002] Monitoring the environment and the state of any objects within that environment over a period of time presents a number of technical challenges. Nevertheless, the advantages that can be provided by accurately monitoring a particular environment and the objects within that environment are significant. For example, manufacturing facilities often include complex manufacturing equipment and / or machinery. Misuse or malfunction of the machinery can expose the operator of the machinery or workers in the vicinity of the machinery to danger. Furthermore, misuse or malfunction of the machinery can increase the risk of damage to the machinery.

[0003] For example, without an effective system for monitoring manufacturing machinery, personnel may be injured or caught by moving parts of the machinery, such as robotic arms, mobile carriers, mobile machine heads / blades. Furthermore, in a collaborative work environment (such as a machining or assembly facility) where humans and manufacturing machinery (such as robots) share the same space and work adjacent to each other to complete tasks independently or sequentially, it can be beneficial to protect humans from unintended movements or malfunctions of the manufacturing machinery.

[0004] Photoelectric barriers are a type of system that can be used around or on machinery to reduce the probability of personnel near the machine being unintentionally injured. Such systems provide light curtains and light beams, and the blocking of one or more of these light curtains or beams slows down or stops the associated machinery. However, these systems are generally incapable of providing useful information beyond the range of whether or not a particular physical boundary has been crossed.

[0005] Safety Integrity Levels (SILs) are defined for several industrial applications (manufacturing, machining, assembly). SIL is the relative level of risk reduction provided by safety features. SIL is related to the likelihood and severity of one or more hazards. SIL levels determine the performance required to maintain and achieve safety, as well as the probability of failure.

[0006] SIL has four grades, and the higher the number, the greater the primary risk of safety failure, and therefore the stricter the safety requirements for that particular level (1-4).

[0007] The hazards arising from the operation or process of the machine determine the required safety level, and therefore the SIL to be met. Safety assessment includes: 1. Determine the frequency or likelihood of the hazard occurring, and 2. The severity of the consequences if the identified hazard occurs. SIL levels can be set to reduce the risk to personnel.

[0008] Where prior art documents are referenced in this specification, it should be understood that such references do not constitute an admission that such documents constitute part of the well-known knowledge in the art in Australia or any other country. [Overview of the Initiative]

[0009] In some embodiments, a monitoring system is provided. The monitoring system may comprise a radiation system comprising one or more environment mapping emitters and one or more aiming optical systems. Each environment mapping emitter may be configured to emit electromagnetic waves to each of the aiming optical systems of the one or more aiming optical systems. Each aiming optical system may be configured to direct the electromagnetic waves toward each target area of ​​the environment of the monitoring system. The monitoring system may comprise a sensing system configured to generate sensing system data based at least in part on the electromagnetic waves emitted by the environment mapping emitters and reflected by the target areas of the environment.

[0010] In some embodiments, the environmental mapping system comprises a first radiation module, the first radiation module comprising a first body, a first subset of environmental mapping emitters, each environmental mapping emitter mounted on the first body, and a first subset of aiming optics, one or more of which are mounted on the first body and configured to redirect electromagnetic waves emitted from each of the first subset of environmental mapping emitters.

[0011] In some embodiments, the outer surface of the first body defines a first plane, and each aiming optical system in the first subset of aiming optical systems is configured to direct electromagnetic waves toward its respective target region by directing electromagnetic waves emitted from its respective environment mapping emitter in one or more directions transverse to the first plane.

[0012] In some embodiments, a first subset of environment mapping emitters are mounted on a first body so as to be coplanar.

[0013] In some embodiments, the radiation system comprises a second radiation module, the second radiation module comprising a second body, a second subset of environment mapping emitters, each environment mapping emitter mounted on the second body, and a second subset of aiming optics, each aiming optics mounted on the second body and configured to redirect electromagnetic waves emitted from each of the second subset of environment mapping emitters.

[0014] In some embodiments, the outer surface of the second body defines a second plane, and each of the second subsets of the aiming optical system is configured to direct electromagnetic waves toward their respective target regions by directing electromagnetic waves emitted from their respective environment mapping emitters in one or more directions transverse to the second plane.

[0015] In some embodiments, the first plane intersects with the second plane.

[0016] In some embodiments, a second subset of the environment mapping emitters is mounted on a second body so as to be coplanar.

[0017] In some embodiments, the radiation system comprises one or more radiation modules, each radiation module comprising a body, a subset of environment mapping emitters, each environment mapping emitter mounted on the body, and a subset of aiming optics, each aiming optics mounted on the body, configured to direct electromagnetic waves toward respective target regions by redirecting the electromagnetic waves emitted from each environment mapping emitter of the subset of environment mapping emitters.

[0018] In some embodiments, the monitoring system comprises six radiation modules.

[0019] In some embodiments, one or more aiming optical systems comprise one or more refractors, reflectors, and diffractors.

[0020] In some embodiments, the radiation system comprises a depth test system comprising one or more depth test emitters and one or more depth test optical systems, each depth test emitter configured to emit electromagnetic waves to an associated depth test optical system among the one or more depth test optical systems.

[0021] In some embodiments, each depth test optical system extends from an incident end to an radiating end, with the incident and radiating ends separated by the length of their respective depth test optical systems.

[0022] In some embodiments, each depth test optical system is configured to direct at least a portion of the electromagnetic waves emitted from its incident end by its respective depth test emitter along its length, and to emit at least a portion of the electromagnetic waves directed along its length from its radiating end.

[0023] In some embodiments, each depth test optical system comprises one or more depth test refractors, depth test reflectors, and depth test diffractors.

[0024] In some embodiments, each depth test optical system is configured to completely internally reflect at least a portion of the electromagnetic waves radiated to its incident end by an associated depth test emitter along its length, and to radiate at least a portion of the completely internally reflected electromagnetic waves from its radiating end.

[0025] In some embodiments, the length of each depth test optical system differs from the length of the other depth test optical systems.

[0026] In some embodiments, one or more lengths of the depth test optical system are multiples of the length of another one of the depth test optical systems.

[0027] In some embodiments, one or more lengths of the depth test optical system are about 2 m, one or more lengths of the depth test optical system are about 4 m, one or more lengths of the depth test optical system are about 6 m, and one or more lengths of the depth test optical system are about 8 m.

[0028] In some embodiments, the depth test system includes a depth test system main body, and the depth test emitter is attached to the depth test system main body.

[0029] In some embodiments, each depth test optical system is configured to be connected to an associated depth test emitter such that the incident end of each depth test optical system faces the respective depth test emitter.

[0030] In some embodiments, the surface of the depth test system main body defines a depth test system main body plane, and one or more of the depth test optical systems extend from the depth test system main body in a direction transverse to the depth test system main body plane.

[0031] In some embodiments, the depth test optical system is curved so as to surround an internal region of the monitoring system.

[0032] In some embodiments, each of the depth test optical systems includes an optical fiber.

[0033] In some embodiments, the depth test system includes four depth test emitters and four depth test optical systems.

[0034] In some embodiments, the monitoring system further includes a window that is transparent to a first range of electromagnetic waves.

[0035] In some embodiments, the window is opaque to a second range of electromagnetic waves.

[0036] In some embodiments, the monitoring system further comprises an optical filter that is transparent to some electromagnetic waves and opaque to other electromagnetic waves.

[0037] In some embodiments, the radiation system comprises a planar test system having one or more planar test emitters.

[0038] In some embodiments, each planar test emitter is configured to emit electromagnetic waves to each target portion of the window.

[0039] In some embodiments, the monitoring system comprises one or more planar test optics, each planar test emitter configured to emit electromagnetic waves to its respective planar test optics, and each planar test optics configured to direct at least a portion of the electromagnetic waves emitted from its respective planar test emitter toward each target portion of the window.

[0040] In some embodiments, each planar test optical system is configured to refract at least a portion of the electromagnetic waves emitted from each planar test emitter, directing the electromagnetic waves toward each target portion of the window.

[0041] In some embodiments, the planar test system further comprises a planar test body, and a planar test emitter is attached to the planar test body.

[0042] In some embodiments, the planar test optical system is attached to the planar test body.

[0043] In some embodiments, the planar test emitter and the planar test optical system are mounted on a planar test body to form a planar test radiation unit, each planar test radiation unit comprising one planar test emitter and an associated planar test optical system.

[0044] In some embodiments, this configuration comprises a multi-row planar test radiation unit and a multi-column planar test radiation unit.

[0045] In some embodiments, the window is configured to reflect at least a portion of the electromagnetic waves emitted by the planar test emitter.

[0046] In some embodiments, the center of each target portion of the window is equidistant from the centers of two or more other target portions of the window.

[0047] In some embodiments, the center of the target portion of the window forms a two-dimensional array on the window.

[0048] In some embodiments, the monitoring system further comprises multiple intensity test optics, each configured to redirect at least a portion of the electromagnetic waves emitted by one or more environmental mapping emitters and reflected from the window surface.

[0049] In some embodiments, one or more of the intensity test optical systems include intensity test optical fibers.

[0050] In some embodiments, each intensity test optical system extends from an incident end to an emission end and is configured to completely internally reflect at least a portion of the electromagnetic waves emitted by one or more environment mapping emitters and reflected from the window surface along its length, and to emit the completely internally reflected electromagnetic waves from its emission end.

[0051] In some embodiments, the sensing system comprises a lens system for defining an optical axis and a sensor module, the lens system configured to focus incident electromagnetic waves onto the sensor module, and the sensor module configured to detect incident electromagnetic waves and generate sensing system data based at least partially on the detected incident electromagnetic waves.

[0052] In some embodiments, the sensing system is configured to detect electromagnetic waves emitted by an environmental mapping emitter and reflected by a target area of ​​the environment, which is directed by a respective aiming optical system, and to generate sensing system data based at least partially on the detected electromagnetic waves.

[0053] In some embodiments, the lens system is configured to focus electromagnetic waves emitted by an environment mapping emitter and reflected by a target area of ​​the environment, which is directed by its respective aiming optical system, onto a first portion of the sensor module.

[0054] In some embodiments, the sensing system is configured to detect electromagnetic waves emitted from the radiating end of a depth test optical system and to generate sensing system data based at least partially on the detected electromagnetic waves.

[0055] In some embodiments, the radiating end of the depth test optical system is positioned to radiate electromagnetic waves that have been completely internally reflected by the depth test optical system to a second portion of the sensor module.

[0056] In some embodiments, there is no overlap between the first part of the sensor module and the second part of the sensor module.

[0057] In some embodiments, the sensing system is configured to detect electromagnetic waves emitted by a planar test emitter and to generate sensing system data based at least partially on the detected electromagnetic waves.

[0058] In some embodiments, the lens system is configured to focus electromagnetic waves emitted by a planar test emitter onto a first portion of the sensor module.

[0059] In some embodiments, the sensing system is configured to detect ambient electromagnetic waves and generate sensing system data based at least partially on the detected ambient electromagnetic waves.

[0060] In some embodiments, the first radiation module is positioned radially outward from the optical axis.

[0061] In some embodiments, the second radiation module is positioned radially outward from the optical axis.

[0062] In some embodiments, each radiation module is positioned radially outward from the optical axis.

[0063] In some embodiments, the incident end of the intensity test optical system is positioned radially outward from the environment mapping emitter with respect to the optical axis.

[0064] In some embodiments, each intensity test optical system is configured to emit at least a portion of the fully internally reflected electromagnetic waves toward the sensor module from its radiating end.

[0065] In some embodiments, each aiming optical system is configured to refract electromagnetic waves emitted by its respective environment mapping emitter and direct the electromagnetic waves so that the reflected portion of the electromagnetic waves reflected from the window does not intersect with the lens system.

[0066] In some embodiments, the monitoring system further comprises at least one processor and memory accessible by at least one processor, the memory storing program instructions configured to cause at least one processor to control a radiation system and a sensing system.

[0067] In some embodiments, the memory is configured to store sensing system data.

[0068] In some embodiments, one or more environmental mapping emitters, one or more of multiple depth test emitters, and / or one or more planar test emitters include a laser configured to emit electromagnetic waves having wavelengths of 400 nm to 1000 nm.

[0069] In some embodiments, one or more environmental mapping emitters, one or more of multiple depth test emitters, and / or one or more planar test emitters include a laser configured to emit electromagnetic waves having a wavelength of 900 nm to 1000 nm.

[0070] In some embodiments, the monitoring system further comprises at least one processor and a memory that stores program instructions accessible by the at least one processor.

[0071] In some embodiments, the program instructions are configured to cause at least one processor to energize the radiation system according to a radiation sequence so that the radiation system radiates electromagnetic waves into the environment near the radiation system, to use a sensing system to detect incident electromagnetic waves, which are electromagnetic waves incident on the sensor module of the sensing system, to determine sensing system data based at least partially on the detected incident electromagnetic waves, and to generate monitoring system output data based at least partially on the sensing system data.

[0072] In some embodiments, program instructions are configured to power at least one processor so that the depth test system radiates electromagnetic waves from the end of at least one depth test optical system toward a sensor module of the monitoring system's sensing system; to use the sensing system to detect the electromagnetic waves radiated from the end of at least one depth test optical system; to determine sensing system data based at least in part on the detection of electromagnetic waves radiated from the end of at least one depth test optical system by the sensing system; to compare the sensing system data with the depth test profile; and to adjust the values ​​of one or more control parameters of the monitoring system in response to the values ​​of one or more parameters of the sensing system data being different from the values ​​of one or more parameters of the depth test profile.

[0073] In some embodiments, program instructions are configured to power up at least one processor according to a planar test radiation sequence so that the planar test system radiates electromagnetic waves toward the surface of a monitoring system; to use a sensing system to detect incident electromagnetic waves, which are electromagnetic waves comprising at least a portion of the electromagnetic waves radiated by the planar test system and reflected by the surface, incident on a sensor module of the sensing system; to determine sensing system data based at least partially on the detected incident electromagnetic waves; and to adjust the values ​​of one or more control parameters of the monitoring system in response to the values ​​of one or more parameters of the sensing system data differing from the values ​​of the planar test reference.

[0074] In some embodiments, program instructions are configured to energize at least one processor so that the mapping radiation system radiates electromagnetic waves toward the window of the monitoring system, to cause at least a portion of the electromagnetic waves radiated by the mapping radiation system and reflected by the window to be fully internally reflected along the length of the intensity test optical system so that at least a portion of the fully internally reflected electromagnetic waves are radiated from the radiation end of the intensity test reflector toward the sensor module of the sensing system of the monitoring system, to cause the sensing system to detect the electromagnetic waves radiated from the radiation end of the intensity test optical system, to cause the sensing system to determine sensing system data based at least in part on the detection of electromagnetic waves radiated from the radiation end of the intensity test optical system by the sensing system, to compare the sensing system data with an intensity index, and to adjust the values ​​of one or more control parameters of the monitoring system in response to the values ​​of one or more parameters of the sensing system data being different from the values ​​of the intensity index.

[0075] In some embodiments, a monitoring system is provided. The monitoring system comprises a radiation system. The radiation system comprises one or more environment mapping emitters. Each environment mapping emitter is configured to radiate electromagnetic waves toward each target area of ​​the environment of the monitoring system. The monitoring system comprises a sensing system. The sensing system is configured to generate sensing system data based at least in part on the electromagnetic waves radiated by the environment mapping emitters and reflected by each target area of ​​the environment.

[0076] In some embodiments, a method for generating monitoring system output data is provided. This method may include energizing a mapping radiation system according to a radiation sequence so that the mapping radiation system radiates electromagnetic waves into the environment near the mapping radiation system; detecting incident electromagnetic waves, which are electromagnetic waves incident on a sensor module of the sensing system, using a sensing system; determining sensing system data based at least partially on the detected incident electromagnetic waves; and generating monitoring system output data based at least partially on the sensing system data.

[0077] In some embodiments, the mapping radiation system comprises a plurality of environmental mapping emitters, and energizing the mapping radiation system according to a radiation sequence comprises energizing the environmental mapping emitters according to a radiation sequence.

[0078] In some embodiments, energizing multiple environmental mapping emitters according to a radiation sequence comprises sequentially energizing one or more subsets of multiple environmental mapping emitters.

[0079] In some embodiments, energizing the environmental mapping emitters according to the radiation sequence comprises sequentially energizing one environmental mapping emitter at a time.

[0080] In some embodiments, energizing multiple environmental mapping emitters according to a radiation sequence includes de-energizing all environmental mapping emitters while sequentially energizing one or more subsets of environmental mapping emitters.

[0081] In some embodiments, detecting incident electromagnetic waves comprises detecting incident electromagnetic waves before energizing the mapping radiation system and detecting incident electromagnetic waves while the mapping radiation system is energized according to the radiation sequence.

[0082] In some embodiments, detecting incident electromagnetic waves while the radiation system is energized according to the radiation sequence includes detecting incident electromagnetic waves during each of the sequential energizations of one or more subsets of environmental mapping emitters, and while all environmental mapping emitters are de-energized between the sequential energizations of one or more subsets of environmental mapping emitters.

[0083] In some embodiments, determining sensing system data involves determining energization state data based at least partially on incident electromagnetic waves emitted by an energized mapping radiation system, and determining ambient state data based at least partially on ambient incident electromagnetic waves.

[0084] In some embodiments, determining sensing system data involves comparing energized state data with ambient state data.

[0085] In some embodiments, determining sensing system data involves subtracting at least a portion of ambient condition data from at least a portion of energized state data.

[0086] In some embodiments, the sensing system data includes time difference data, which comprises a plurality of time difference data elements, each time difference data element indicating a time difference between a first time and a second time, where the first time is associated with one start point of energization in the energization sequence, and the second time is associated with the time when the intensity of the detected incident electromagnetic wave exceeds an intensity threshold.

[0087] In some embodiments, the sensing system data comprises time-delay data elements relating to one or more sensing units of the sensing system, the sensing units being configured to respond to the intensity of incident electromagnetic waves.

[0088] In some embodiments, each time-difference element indicates the distance traveled by the detected electromagnetic waves emitted by the mapping radiation system.

[0089] In some embodiments, the monitoring system output data includes a matrix indicating the state of the environment.

[0090] In some embodiments, the sensing system data indicates the intensity of the incident electromagnetic wave.

[0091] In some embodiments, this method further comprises determining the operating scenario of the monitoring system based at least in part on sensing system data.

[0092] In some embodiments, generating monitoring system output data in response to the determination that the operating scenario is a first operating scenario comprises generating three-dimensional state data that represents the state of at least a portion of the environment of the monitoring system.

[0093] In some embodiments, generating monitoring system output data in response to the determination that the operating scenario is a second operating scenario comprises generating an obstacle-free environment output.

[0094] In some embodiments, generating monitoring system output data in response to the determination that the operating scenario is a third operating scenario includes generating a machine stop output.

[0095] In some embodiments, the method further comprises using a sensing system to detect incident electromagnetic waves within a plurality of time windows, each associated with one or more radiations of a radiation sequence.

[0096] In some embodiments, one or more starting points of the time window are delayed by a predetermined time delay after the associated radiation of the radiation sequence.

[0097] In some embodiments, a method for testing a monitoring system is provided. This method may comprise: energizing the depth test system of the monitoring system so that the depth test system radiates electromagnetic waves from the end of at least one depth test optical system toward a sensor module of the sensing system of the monitoring system; detecting the electromagnetic waves radiated from the end of at least one depth test optical system using the sensing system; determining sensing system data at least in part on the detection of electromagnetic waves radiated from the end of at least one depth test optical system by the sensing system; comparing the sensing system data with a depth test profile; and adjusting the values ​​of one or more control parameters of the monitoring system in response to the values ​​of one or more parameters of the sensing system data being different from the values ​​of one or more parameters of the depth test profile.

[0098] In some embodiments, the sensing system data includes a time difference parameter for each depth test optical system, the value of which indicates the time difference between a first time and a second time, where the first time corresponds to the time the depth test system is energized and the second time corresponds to the time when electromagnetic waves emitted from the end of each depth test optical system are detected by the sensing system.

[0099] In some embodiments, the values ​​of one or more parameters in the sensing system data are the values ​​of time-difference parameters (or more).

[0100] In some embodiments, one or more parameters of the depth test profile include an expected time delay value indicating the expected time delay between the energization of the depth test system and the detection by the sensing system of electromagnetic waves emitted from the end of at least one depth test reflector.

[0101] In some embodiments, at least one depth test optical system comprises a plurality of depth test optical systems, each having a different length.

[0102] In some embodiments, a method for testing a monitoring system is provided. This method comprises energizing the planar test system of the monitoring system according to a planar test radiation sequence so that the planar test system radiates electromagnetic waves toward the surface of the monitoring system; detecting incident electromagnetic waves, comprising at least a portion of the electromagnetic waves radiated by the planar test system and reflected by the surface, incident on a sensor module of the sensing system using the sensing system of the monitoring system; determining sensing system data based at least in part on the detected incident electromagnetic waves; comparing the sensing system data with a planar test reference; and adjusting the values ​​of one or more control parameters of the monitoring system in response to the values ​​of one or more parameters of the sensing system data differing from the values ​​of the planar test reference.

[0103] In some embodiments, the planar test system comprises a plurality of planar test emitters, and energizing the planar test system according to a planar test emission sequence comprises energizing one or more subsets of the planar test emitters.

[0104] In some embodiments, energizing the planar test system according to a planar test emission sequence involves sequentially energizing a subset of planar test emitters, one at a time.

[0105] In some embodiments, each subset of planar test emitters comprises multiple planar test emitters.

[0106] In some embodiments, the planar test system comprises a first number of planar test emitter columns and a second number of planar test emitter rows.

[0107] In some embodiments, each subset of a plurality of planar test emitters comprises one planar test system emitter in each column and one planar test system emitter in each row.

[0108] In some embodiments, a method for testing a monitoring system is provided. This method may comprise: energizing the mapping radiation system of the monitoring system so that the mapping radiation system radiates electromagnetic waves toward a window of the monitoring system; completely internally reflecting at least a portion of the electromagnetic waves radiated by the mapping radiation system and reflected by the window along the length of the intensity test optical system so that at least a portion of the completely internally reflected electromagnetic waves radiate from the radiation end of the intensity test reflector toward a sensor module of the sensing system of the monitoring system; detecting electromagnetic waves radiated from the radiation end of the intensity test optical system using the sensing system; determining sensing system data at least in part on the detection of electromagnetic waves radiated from the radiation end of the intensity test optical system by the sensing system; comparing the sensing system data with an intensity index; and adjusting the values ​​of one or more control parameters of the monitoring system in response to the values ​​of one or more parameters of the sensing system data being different from the values ​​of the intensity index.

[0109] In some embodiments, the sensing system data includes a value for an intensity parameter, where the value of the intensity parameter indicates the intensity of electromagnetic waves emitted from the radiating end of the intensity test optical system.

[0110] In some embodiments, the intensity index value indicates the minimum operating intensity of electromagnetic waves emitted from the radiating end of the intensity test reflector.

[0111] In some embodiments, a monitoring system is provided. The monitoring system may include a radiation system. The radiation system may include one or more environment mapping emitters. The radiation system may include one or more aiming optics. Each environment mapping emitter may be configured to radiate electromagnetic waves to each of the aiming optics of the one or more aiming optics. Each aiming optics may be configured to direct the electromagnetic waves toward each target area of ​​the environment of the monitoring system. The monitoring system may include a sensing system. The sensing system may be configured to generate sensing system data based at least in part on electromagnetic waves radiated by the environment mapping emitters and reflected by the target areas of the environment.

[0112] In some embodiments, the monitoring system further includes a window to which electromagnetic waves emitted by an environmental mapping emitter are directed, and each aiming optical system is configured to diffract the electromagnetic waves emitted by each environmental mapping emitter and direct the electromagnetic waves toward the window so as to avoid the electromagnetic waves reflected from the window intersecting with the lens system of the sensing system.

[0113] In some embodiments, the monitoring system further comprises a window to which electromagnetic waves emitted by an environmental mapping emitter are directed, and at least one environmental mapping emitter emits electromagnetic waves which are operated by a aiming optical system such that the electromagnetic waves propagate within a range of emission angles, the inner emission angle within the range of emission angles being greater than the lens crossing angle, and the lens crossing angle being less than or equal to the angle at which the propagated electromagnetic waves reflect from the window and encounter the lens system of the sensing system.

[0114] In some embodiments, the environmental mapping system comprises a first radiating module. The first radiating module may comprise a first body. The first radiating module may comprise a first subset of environmental mapping emitters. Each environmental mapping emitter of the first subset of environmental mapping emitters may be mounted on the first body. The first radiating module may comprise a first subset of aiming optics. One or more aiming optics of the first subset of aiming optics may be mounted on the first body. One or more aiming optics of the first subset of aiming optics may be configured to redirect electromagnetic waves radiated from each environmental mapping emitter of the first subset of environmental mapping emitters. The radiating system may comprise a second radiating module. The second radiating module may comprise a second body. The second radiating module may comprise a second subset of environmental mapping emitters. Each environmental mapping emitter of the second subset of environmental mapping emitters may be mounted on the second body. The second radiation module may comprise a second subset of aiming optics. Each aiming optic in the second subset of aiming optics may be mounted on the second body. Each aiming optic in the second subset of aiming optics may be configured to redirect electromagnetic waves emitted from each of the environment mapping emitters in the second subset of environment mapping emitters. In some embodiments, the outer surface of the first body defines a first plane. In some embodiments, the outer surface of the second body defines a second plane. In some embodiments, the first plane intersects the second plane.

[0115] In some embodiments, each aiming optical system in a first subset of aiming optical systems is configured to direct electromagnetic waves emitted from its respective environment mapping emitter toward its respective target region by directing the electromagnetic waves toward one or more directions that traverse a first plane.

[0116] In some embodiments, a first subset of environment mapping emitters are mounted on a first body so as to be coplanar. In some embodiments, each aiming optical system in a second subset of aiming optical systems is configured to direct electromagnetic waves emitted from its respective environment mapping emitter toward its respective target region by directing the electromagnetic waves toward one or more directions that traverse a second plane.

[0117] In some embodiments, the monitoring system comprises a sensor module body to which the sensor module of the sensing system is attached, a connecting member connected to a first radiating module at one end and attached to the sensor module body at the other end, and a second connecting member connected to a second radiating module at one end and attached to the sensor module body at the other end, wherein the connecting member and the second connecting member are rigid and rigidly connect the first radiating module and the second radiating module to the sensor module body.

[0118] In some embodiments, the first and second radiation modules are radially offset by the same amount from the axial axis of the monitoring system.

[0119] In some embodiments, the radiation system comprises a plurality of radiation modules, each radiation module comprising a body, a subset of environment mapping emitters, each of which is mounted on the body of the respective radiation module, and a subset of aiming optics, each of which is mounted on the body, and which is configured to direct electromagnetic waves emitted from the environment mapping emitters of each subset of environment mapping emitters toward respective target regions.

[0120] In some embodiments, the monitoring system comprises six radiation modules.

[0121] In some embodiments, one or more aiming optics are configured to manipulate electromagnetic waves.

[0122] In some embodiments, one or more aiming optical systems include one or more refractors, reflectors, diffractors, optical splitters, optical filters, optical switches, optical transmitters, and optical dispersers.

[0123] In some embodiments, the target region to which electromagnetic waves emitted by a particular environmental mapping emitter are directed is the target region of that environmental mapping emitter.

[0124] In some embodiments, the target region of at least one environment mapping emitter is different from the target region of another environment mapping emitter.

[0125] In some embodiments, the target region of at least one environment mapping emitter overlaps with the target region of another environment mapping emitter.

[0126] In some embodiments, at least one of the environmental mapping emitters emits electromagnetic waves having a first radiation profile. In some embodiments, the first radiation profile characterizes at least one of the wavelength, amplitude, and polarization of the electromagnetic waves emitted by at least one environmental mapping emitter. In some embodiments, at least one of the environmental mapping emitters emits electromagnetic waves having a second radiation profile. In some embodiments, the second radiation profile characterizes at least one of the wavelength, amplitude, and polarization of the electromagnetic waves emitted by at least one environmental mapping emitter emitting electromagnetic waves having a second radiation profile. In some embodiments, the first radiation profile differs from the second radiation profile such that at least one of the wavelength, amplitude, and polarization of the electromagnetic waves emitted according to the first radiation profile differs from at least one of the wavelength, amplitude, and polarization of the electromagnetic waves emitted according to the second radiation profile.

[0127] In some embodiments, at least one target region of an environmental mapping emitter emitting electromagnetic waves having a first radiation profile is different from at least one target region of an environmental mapping emitter emitting electromagnetic waves having a second radiation profile.

[0128] In some embodiments, at least one target region of an environmental mapping emitter emitting electromagnetic waves having a first radiation profile overlaps with at least one target region of an environmental mapping emitter emitting electromagnetic waves having a second radiation profile.

[0129] In some embodiments, the monitoring system includes at least a pair of environmental mapping emitters. The at least pair of environmental mapping emitters may include a first environmental mapping emitter configured to emit electromagnetic waves having a first radiation profile, and a second environmental mapping emitter configured to emit electromagnetic waves having a second radiation profile. The target area of ​​the first environmental mapping emitter may be the same as the target area of ​​the second environmental mapping emitter.

[0130] At least one of the environmental mapping emitters may be configured to emit an electromagnetic wave having a first emission profile that characterizes at least one of the wavelength, amplitude, and polarization of an electromagnetic wave emitted by at least one environmental mapping emitter, and to emit an electromagnetic wave having a second emission profile that characterizes at least one of the wavelength, amplitude, and polarization of an electromagnetic wave emitted by at least one environmental mapping emitter, wherein the first emission profile differs from the second emission profile such that at least one of the wavelength, amplitude, and polarization of the electromagnetic wave emitted according to the first emission profile differs from at least one of the wavelength, amplitude, and polarization of the electromagnetic wave emitted according to the second emission profile.

[0131] In some embodiments, the radiation system comprises a depth test system. The depth test system may comprise one or more depth test emitters. The depth test system may comprise one or more depth test optical systems. Each depth test emitter may be configured to radiate electromagnetic waves to an associated depth test optical system among the one or more depth test optical systems.

[0132] In some embodiments, one or more depth test optical systems may be configured to manipulate electromagnetic waves.

[0133] In some embodiments, the depth test optical system may be configured to introduce optical delay.

[0134] In some embodiments, multiple depth test optics extend from an incident end to an radiating end, with the incident and radiating ends separated by the length of each depth test optics.

[0135] In some embodiments, the depth test optical system is configured to direct at least a portion of the electromagnetic waves emitted by each depth test emitter to the incident end of each depth test optical system along its length. In some embodiments, the depth test optical system is configured to emit at least a portion of the electromagnetic waves directed along the length of each depth test optical system from the radiating end of each depth test optical system.

[0136] In some embodiments, each depth test optical system comprises one or more of a depth test refractor, depth test reflector, depth test diffractor, depth test optical splitter, depth test optical filter, depth test optical switch, depth test optical transmitter, and depth test optical disperser.

[0137] In some embodiments, at least one of the depth test optical systems is configured to completely internally reflect at least a portion of the electromagnetic waves radiated to its incident end by an associated depth test emitter along its length, and to radiate at least a portion of the completely internally reflected electromagnetic waves from its radiating end.

[0138] In some embodiments, the length of at least one depth test optical system differs from the length of at least one other depth test optical system.

[0139] In some embodiments, the length of one or more depth test optical systems is a multiple of the length of another depth test optical system.

[0140] In some embodiments, the length of one or more depth test optics is approximately 2 m. In some embodiments, the length of one or more depth test optics is approximately 4 m. In some embodiments, the length of one or more depth test optics is approximately 6 m. In some embodiments, the length of one or more depth test optics is approximately 8 m.

[0141] In some embodiments, the depth test system comprises a depth test system body, a depth test emitter is mounted on the depth test system body, and the depth test system body is oriented to traverse the first body of the first radiating module.

[0142] In some embodiments, each depth test optical system is configured to be connected to an associated depth test emitter such that the incident end of each depth test optical system faces the respective depth test emitter.

[0143] In some embodiments, the surfaces of the depth test system body define the depth test system body plane. In some embodiments, one or more depth test optics extend from the depth test system body in a direction transverse to the depth test system body plane.

[0144] In some embodiments, one or more depth test optics are curved to surround an internal area of ​​the monitoring system.

[0145] In some embodiments, the depth test optical system comprises multiple optical fibers.

[0146] In some embodiments, the monitoring system comprises a housing having multiple housing walls defining a volume enclosed by the housing, at least a portion of the sensing system is housed within the volume enclosed by the housing, and the depth testing system is housed within the volume enclosed by the housing, and the optical fibers are curved to surround the internal region of the monitoring system, which is a region within the volume enclosed by the housing, with one or more of the optical fibers surrounding the internal region a different number of times than the other optical fibers.

[0147] In some embodiments, the depth test system comprises four depth test emitters and four depth test optics.

[0148] In some embodiments, the radiation system comprises a planar test system comprising one or more planar test emitters, each configured to emit electromagnetic waves, and one or more planar test optics, each planar test emitter configured to emit electromagnetic waves to its respective planar test optics, each planar test optics configured to direct at least a portion of the electromagnetic waves irradiated from its respective planar test emitter toward its respective planar test target area, and the monitoring system comprises a window that is optically transparent to at least a portion of the electromagnetic waves, the window being fixedly mounted relative to a housing of the monitoring system that houses the planar test system, and each planar test area being the respective target portion of the window, forming an arrangement on the window.

[0149] In some embodiments, the radiation system comprises a planar test system. The planar test system comprises one or more planar test emitters. Each planar test emitter may be configured to emit electromagnetic waves.

[0150] In some embodiments, the planar test system comprises one or more planar test optical systems. Each planar test emitter may be configured to emit electromagnetic waves to its respective planar test optical system. Each planar test optical system may be configured to direct at least a portion of the electromagnetic waves emitted from its respective planar test emitter toward its respective planar test target area.

[0151] In some embodiments, each of the planar test optical systems comprises one or more of a planar test refractor, a planar test reflector, a planar test diffractor, a planar test optical splitter, a planar test optical filter, a planar test optical switch, a planar test optical transmitter, and a planar test optical disperser.

[0152] In some embodiments, the monitoring system further includes a window that is optically transparent to at least some electromagnetic waves.

[0153] In some embodiments, each planar test emitter is configured to emit electromagnetic waves directed towards each target portion of the window.

[0154] In some embodiments, each planar test target area is the respective target portion of the window, and the planar test areas form a target arrangement on the window.

[0155] In some embodiments, each planar test optical system is configured to refract at least a portion of the electromagnetic waves emitted from each planar test emitter, directing the electromagnetic waves toward each target portion of the window.

[0156] In some embodiments, the center of each target portion of the window is equidistant from the centers of two or more other target portions of the window.

[0157] In some embodiments, the center of the target portion of the window forms a two-dimensional array on the window.

[0158] In some embodiments, the target portion of the window is irregularly distributed throughout the window.

[0159] In some embodiments, the window is configured to reflect at least a portion of the electromagnetic waves emitted by the planar test emitter and is mounted in a fixed position relative to the planar test emitter.

[0160] In some embodiments, the monitoring system further comprises an intensity testing system. The intensity testing system may comprise a plurality of intensity testing optical systems. The intensity testing optical systems may be configured to redirect at least a portion of the electromagnetic waves emitted by one or more environmental mapping emitters.

[0161] In some embodiments, each intensity test optical system comprises one or more intensity test refractors, intensity test reflectors, intensity test diffractors, intensity test optical splitters, intensity test optical filters, intensity test optical switches, intensity test optical transmitters, and intensity test optical dispersers.

[0162] In some embodiments, one or more of the intensity test optical systems include intensity test optical fibers.

[0163] In some embodiments, the monitoring system includes a window that is optically transparent to at least some electromagnetic waves, and each intensity test optical system extends from an incident end to an emission end. In some embodiments, each intensity test optical system is configured to completely internally reflect at least some of the electromagnetic waves emitted by one or more environment mapping emitters and reflected from the surface of the window along its length. In some embodiments, each intensity test optical system is configured to emit the completely internally reflected electromagnetic waves from its emission end.

[0164] In some embodiments, the intensity test optical system is configured to redirect at least a portion of the electromagnetic waves emitted by one or more environmental mapping emitters and reflected from the window surface.

[0165] In some embodiments, the sensing system includes a lens system for defining an optical axis. In some embodiments, the sensing system includes a sensor module. The lens system may be configured to focus incident electromagnetic waves onto the sensor module. The sensor module may be configured to detect incident electromagnetic waves and generate sensing system data based at least partially on the detected incident electromagnetic waves.

[0166] In some embodiments, the sensing system is configured to detect electromagnetic waves emitted by an environmental mapping emitter and reflected by a target area of ​​the environment, which is directed by a respective aiming optical system. In some embodiments, the sensing system is configured to generate sensing system data based at least partially on the detected electromagnetic waves.

[0167] In some embodiments, the lens system is configured to focus electromagnetic waves emitted by an environment mapping emitter and reflected by a target area of ​​the environment, which is directed by its respective aiming optical system, onto a first portion of the sensor module.

[0168] In some embodiments, the sensing system is configured to detect electromagnetic waves emitted by a depth test emitter and to generate sensing system data based at least partially on the detected electromagnetic waves.

[0169] In some embodiments, the sensing system is configured to detect electromagnetic waves emitted from the radiating end of a depth test optical system and to generate sensing system data based at least partially on the detected electromagnetic waves.

[0170] In some embodiments, the radiating ends of the depth test optical system are positioned so that the depth test optical system radiates electromagnetic waves transmitted along the length of each depth test optical system to a second portion of the sensor module, with no overlap between the first portion and the second portion of the sensor module.

[0171] In some embodiments, a first portion of the sensor module is laterally offset from a second portion of the sensor module.

[0172] In some embodiments, the sensing system is configured to detect electromagnetic waves emitted by a planar test emitter and to generate sensing system data based at least partially on the detected electromagnetic waves.

[0173] In some embodiments, the lens system is configured to focus electromagnetic waves emitted by a planar test emitter onto a sensor module.

[0174] In some embodiments, the lens system is configured to focus electromagnetic waves emitted by a planar test emitter onto a first portion of the sensor module.

[0175] In some embodiments, the sensing system is configured to detect electromagnetic waves emitted by a planar test emitter and reflected by a window.

[0176] In some embodiments, electromagnetic waves emitted by a planar test emitter are directed towards a sensor module.

[0177] In some embodiments, the planar test system further comprises a planar test body. In some embodiments, a planar test emitter is mounted on the planar test body. In some embodiments, a planar test optical system is mounted on the planar test body, and the planar test emitter and the planar test optical system are mounted on the planar test body to form a planar test radiation unit, each planar test radiation unit comprising one planar test emitter and an associated planar test optical system.

[0178] In some embodiments, each intensity test optical system is configured to radiate at least a portion of the fully internally reflected electromagnetic waves from its radiating end toward a third portion of the sensor module, the third portion being mutually exclusive with respect to the first and second portions of the sensor module.

[0179] In some embodiments, each aiming optical system refracts the electromagnetic waves emitted by its respective environmental mapping emitter, directing the electromagnetic waves so that the reflected portion of the electromagnetic waves reflected from the window does not intersect with the lens system, and the incident end of the intensity test optical system is positioned radially outward from the environmental mapping emitter with respect to the optical axis of the lens system.

[0180] In some embodiments, this configuration comprises multiple rows of planar test radiation units and multiple columns of planar test radiation units. In some embodiments, the planar test radiation units are arranged irregularly on the planar test body.

[0181] In some embodiments, the sensing system is configured to detect ambient electromagnetic waves. In some embodiments, the sensing system is configured to generate sensing system data based at least partially on the detected ambient electromagnetic waves.

[0182] In some embodiments, the first radiating module is positioned radially outward from the optical axis. In some embodiments, the second radiating module is positioned radially outward from the optical axis. In some embodiments, each radiating module is positioned radially outward from the optical axis. In some embodiments, each radiating module intersects a common plane perpendicular to the optical axis.

[0183] In some embodiments, the incident end of the intensity test optical system is positioned radially outward from the environment mapping emitter with respect to the optical axis.

[0184] In some embodiments, each intensity test optical system is configured to emit at least a portion of the fully internally reflected electromagnetic waves toward the sensor module from its radiating end.

[0185] In some embodiments, each aiming optical system is configured to refract electromagnetic waves emitted by its respective environment mapping emitter and direct the electromagnetic waves so that the reflected portion of the electromagnetic waves reflected from the window does not intersect with the lens system.

[0186] In some embodiments, the inner radiation angle of the radiation angle range associated with at least one environmental mapping emitter is greater than the inner radiation angle threshold at which electromagnetic waves emitted by at least one environmental mapping emitter encounter the lens system. In some embodiments, the inner radiation angle and the inner radiation angle threshold are angles measured with respect to a front plane perpendicular to the optical axis.

[0187] In some embodiments, at least one of an environmental mapping system, a depth testing system, and a planar testing system includes a laser configured to emit electromagnetic waves having a wavelength of 200 nm to 3000 nm.

[0188] In some embodiments, at least one of a mapping system, a depth testing system, and a planar testing system includes a laser configured to emit electromagnetic waves having a wavelength of 900 nm to 1000 nm.

[0189] In some embodiments, the monitoring system further comprises an optical filter that is transparent to some electromagnetic waves and opaque to other electromagnetic waves. In some embodiments, the optical filter is a multibandpass optical filter. In some embodiments, the window comprises an optical filter. In some embodiments, the lens system comprises an optical filter.

[0190] In some embodiments, the monitoring system further comprises a control system. The control system may comprise at least one processor. It may also comprise memory for storing program instructions accessible by at least one processor.

[0191] In some embodiments, a program instruction is configured to energize at least one processor from a first emission start time to a first emission end time so that at least one environment mapping emitter emits electromagnetic waves directed toward a first obstacle in the environment of the monitoring system between a first emission start time and a first emission end time. The first obstacle may be at least partially optically transparent. The first obstacle may be located between the monitoring system and a second obstacle. In some embodiments, a program instruction is configured to cause at least one processor to initiate a detection operation of the sensing system at a first gate time. In some embodiments, a program instruction is configured to cause at least one processor to terminate the detection operation at a second gate time that is later than the first gate time and differs from the first gate time by the gate width. In some embodiments, a program instruction is configured to cause at least one processor to store sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation.

[0192] In some embodiments, the first gate time differs from the first emission start time only by the detection time offset. In some embodiments, the detection time offset is a positive offset. In some embodiments, the detection time offset is a negative offset.

[0193] In some embodiments, the first gate time is the same as the first emission start time.

[0194] In some embodiments, the first gate time is associated with a first distance from the monitoring system. In some embodiments, the second gate time is associated with a second distance greater than the first distance. In some embodiments, at least a portion of the first obstacle is separated from the monitoring system by a distance greater than the first distance and less than the second distance. In some embodiments, the gate width is proportional to the difference between the first distance and the second distance.

[0195] In some embodiments, the electromagnetic waves detected during the detection operation include electromagnetic waves emitted by at least one environment mapping emitter between a first emission start time and a first emission end time and reflected by a first obstacle.

[0196] In some embodiments, sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation is stored in memory as a first time-of-flight data array.

[0197] In some embodiments, a program instruction is configured to cause at least one processor to iteratively start and terminate a plurality of detection operations of the sensing system to energize at least one of the environment mapping emitters from a first emission start time to a first emission end time. Each detection operation may be started at its respective start gate time. Each detection operation may be terminated at its respective end gate time. In some embodiments, a program instruction is configured to cause at least one processor to store sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the iteratively performed detection operations. Electromagnetic waves detected in the iteratively performed detection operations may include electromagnetic waves emitted by at least one environment mapping emitter and reflected by a first obstacle, and electromagnetic waves emitted by at least one environment mapping emitter and reflected by a second obstacle after passing through the first obstacle.

[0198] In some embodiments, the electromagnetic waves detected during a second plurality of iteratively performed detection operations include electromagnetic waves emitted by at least one environment mapping emitter and reflected by a first obstacle.

[0199] In some embodiments, a program instruction is configured to cause at least one processor to initiate a second detection operation of the sensing system at a third gate time. The third gate time may be later than the first gate time. The third gate time may differ from the first gate time by only the gate offset. In some embodiments, a program instruction is configured to cause at least one processor to terminate the second detection operation at a fourth gate time, which is later than the third gate time. The fourth gate time may differ from the third gate time by only the second gate width. In some embodiments, a program instruction is configured to cause at least one processor to store sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the second detection operation.

[0200] In some embodiments, the gate offset is equal to or greater than the difference between the first gate time and the second gate time. In some embodiments, the second detection operation is one of a plurality of iteratively performed detection operations. In some embodiments, the electromagnetic waves detected during the second detection operation include electromagnetic waves emitted by at least one environment mapping emitter between the first emission start time and the first emission end time, which have passed through the first obstacle and been reflected by the second obstacle.

[0201] In some embodiments, the third gate time differs from the first emission start time by only the second detection time offset. In some embodiments, the second detection time offset may be greater than the first detection time offset.

[0202] In some embodiments, the third gate time is associated with a third distance from the monitoring system. In some embodiments, the fourth gate time is associated with a fourth distance from the monitoring system. In some embodiments, the fourth distance is greater than the third distance. In some embodiments, at least a portion of the second obstacle is separated from the monitoring system by a distance greater than the third distance and less than the fourth distance.

[0203] In some embodiments, the electromagnetic waves detected during the second detection operation include electromagnetic waves emitted by at least one environment mapping emitter, which have passed through the first obstacle and been reflected by the second obstacle.

[0204] In some embodiments, a program instruction is further configured to energize at least one processor from a second emission start time to a second emission end time so that at least one environment mapping emitter emits electromagnetic waves directed toward a target region associated with at least one environment mapping emitter between a second emission start time and a second emission end time.

[0205] In some embodiments, the one or more environmental mapping emitters energized between the second radiation start time and the second radiation end time are the same as the one or more environmental mapping emitters energized between the first radiation start time and the first radiation end time. In some embodiments, the one or more environmental mapping emitters energized between the second radiation start time and the second radiation end time are different from the one or more environmental mapping emitters energized between the first radiation start time and the first radiation end time.

[0206] In some embodiments, the program instructions are configured to cause at least one processor to determine at least one subsequent environmental mapping emitter to be energized during the second radiation, based at least in part on sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the sensing operation. In some embodiments, the at least one environmental mapping emitter energized from the second radiation start time to the second radiation end time is the determined subsequent environmental mapping emitter.

[0207] In some embodiments, the program instructions are configured to cause at least one processor to determine a second gate width based at least partially on sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation.

[0208] In some embodiments, the electromagnetic waves detected during the second detection operation include electromagnetic waves emitted by at least one environment mapping emitter and reflected by the second obstacle without passing through the first obstacle.

[0209] In some embodiments, sensing system data generated by the sensing system in response to incident electromagnetic waves detected during a second detection operation is stored in memory as a second time-of-flight data array.

[0210] In some embodiments, the second emission start time is after the first emission end time and before the third gate time. In some embodiments, the second emission end time is after the first emission end time and before the fourth gate time.

[0211] In some embodiments, the incident electromagnetic wave detected during the second detection operation comprises electromagnetic waves emitted by at least one environment mapping emitter between a second radiation start time and a second radiation end time.

[0212] In some embodiments, the program instructions are further configured to cause at least one processor to generate a monitoring system output based at least partially on sensing system data.

[0213] In some embodiments, the monitoring system output includes monitoring system output data.

[0214] In some embodiments, the monitoring system output adjusts the value of at least one control parameter of the device in the environment of the monitoring system in response to the determined characteristics of a first obstacle and / or a second obstacle, and / or comprises a three-dimensional model of at least a portion of the environment, the three-dimensional model comprising a virtual representation of the first obstacle and a virtual representation of the second obstacle.

[0215] In some embodiments, sensing system data generated in response to incident electromagnetic waves detected during the detection operation indicates the characteristics of the first obstacle.

[0216] In some embodiments, the sensing system data generated in response to the incident electromagnetic wave detected during the second detection operation indicates the characteristics of the second obstacle.

[0217] In some embodiments, the characteristics of the first obstacle are associated with at least one of the distance of the first obstacle from the monitoring system, the dimensions of the first obstacle, an obstacle label identifying the type of the first obstacle, the opacity of the first obstacle, the reflectance of the first obstacle, and the brightness of the first obstacle.

[0218] In some embodiments, the characteristics of the second obstacle are associated with at least one of the distance of the second obstacle from the monitoring system, the dimensions of the second obstacle, an obstacle label identifying the type of the second obstacle, the opacity of the second obstacle, the reflectance of the second obstacle, and the brightness of the second obstacle.

[0219] In some embodiments, the first obstacle is within a first distance range associated with a first gate time and a second gate time with respect to the monitoring system.

[0220] In some embodiments, the second obstacle is within a second distance range associated with the third gate time and the fourth gate time with respect to the monitoring system.

[0221] In some embodiments, the shape of the first obstacle completely encompasses the shape of the second obstacle.

[0222] In some embodiments, the monitoring system output includes a three-dimensional model of at least a portion of the environment, the three-dimensional model comprising a virtual representation of a first obstacle and a virtual representation of a second obstacle.

[0223] In some embodiments, the monitoring system output includes a time-of-flight data array.

[0224] In some embodiments, at least one subsequent environmental mapping emitter emits electromagnetic waves between a second emission start time and a second emission end time that have a different emission profile than those emitted between the first emission start time and the first emission end time.

[0225] In some embodiments, the program instructions are configured to cause at least one processor to determine a different radiation profile based at least partially on sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation.

[0226] In some embodiments, the frequency of electromagnetic waves emitted by at least one subsequent environmental mapping emitter between a second radiation start time and a second radiation end time is different from the frequency of electromagnetic waves emitted by at least one environmental mapping emitter between a first radiation start time and a first radiation end time.

[0227] In some embodiments, the program instructions are configured to cause at least one processor to determine the frequency of electromagnetic waves emitted by at least one subsequent environment mapping emitter between a second emission start time and a second emission end time, based at least in part on sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation.

[0228] In some embodiments, the monitoring system output adjusts the value of at least one control parameter.

[0229] In some embodiments, at least one control parameter comprises a control parameter of the monitoring system and is associated with at least one of the following: the radiation frequency of at least one environmental mapping emitter, the radiation start time of future radiation, the radiation end time of future radiation, a first gate time for future detection operations of the sensing system, a second gate time for future detection operations, a specific environmental mapping emitter energized for future radiation, the polarization of electromagnetic waves emitted by at least one environmental mapping emitter, the number of detection operations per electromagnetic wave radiation, and the number of times one or more environmental mapping emitters are energized.

[0230] In some embodiments, the monitoring system output adjusts the values ​​of one or more control parameters of another device located within the monitoring system's environment.

[0231] In some embodiments, the monitoring system output causes another device located within the monitoring system's environment to shut down.

[0232] In some embodiments, the second object is a device. In some embodiments, at least one control parameter comprises a control parameter for the device.

[0233] In some embodiments, the device is stopped by adjusting the value of at least one control parameter.

[0234] In some embodiments, the program instructions are further configured to cause at least one processor to control the sensor system to perform ambient state detection operations. In some embodiments, the program instructions are further configured to cause at least one processor to store sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the ambient state detection operation. In some embodiments, the ambient state detection operation is performed over a period of time during which the detected incident electromagnetic waves are only ambient electromagnetic waves.

[0235] In some embodiments, the program instructions are further configured to cause at least one processor to determine a monitoring system output based at least partially on sensing system data generated by the sensing system in response to incident electromagnetic waves detected during ambient condition detection operation.

[0236] In some embodiments, a program instruction is configured to cause at least one processor to energize at least one environment mapping emitter so that the environment mapping emitter emits electromagnetic waves toward and through an optically transparent first obstacle in the environment of the monitoring system. In some embodiments, a program instruction is configured to cause at least one processor to store sensing system data generated by the sensing system in response to the detection of electromagnetic waves emitted by at least one environment mapping emitter and reflected by the first obstacle. In some embodiments, a program instruction is configured to cause at least one processor to store sensing system data generated by the sensing system in response to the detection of electromagnetic waves emitted by at least one environment mapping emitter and reflected by a second obstacle located behind the first obstacle.

[0237] In some embodiments, a program instruction is configured to cause at least one processor to perform a first detection operation using the sensing system over a first time window. In some embodiments, a program instruction is configured to cause at least one processor to perform a second detection operation using the sensing system over a second time window. In some embodiments, the second time window is after the first time window. In some embodiments, sensing system data is generated at least in part on electromagnetic waves emitted by at least one environment mapping emitter and reflected by a first obstacle, detected during the first time window, and electromagnetic waves emitted by at least one environment mapping emitter and reflected by a second obstacle during the second time window.

[0238] In some embodiments, the program instructions are further configured to cause at least one processor to generate a monitoring system output based at least partially on sensing system data.

[0239] In some embodiments, the monitoring system output includes characteristics of a first obstacle, characteristics of a second obstacle, a time-of-flight data array, and at least one of a three-dimensional model of the environment comprising a virtual representation of the first obstacle and a virtual representation of the second obstacle.

[0240] In some embodiments, the monitoring system output adjusts the value of at least one control parameter.

[0241] In some embodiments, at least one control parameter comprises a control parameter of the monitoring system and is associated with at least one of the following: the radiation frequency of at least one environmental mapping emitter, the radiation start time of future radiation, the radiation end time of future radiation, a first gate time for future detection operations of the sensing system, a second gate time for future detection operations, a specific environmental mapping emitter energized for future radiation, the polarization of electromagnetic waves emitted by at least one environmental mapping emitter, the number of detection operations per electromagnetic wave radiation, and the number of times one or more environmental mapping emitters are energized.

[0242] In some embodiments, the monitoring system output is configured to adjust the values ​​of one or more control parameters of another device located within the monitoring system environment. In some embodiments, the second object is the device. In some embodiments, at least one control parameter comprises the control parameter of the device.

[0243] In some embodiments, the environment mapping emitter is operated according to an emission sequence comprising sequentially activating multiple environment mapping emitters.

[0244] In some embodiments, the program instructions are configured to cause at least one processor to energize the radiation system according to a radiation sequence so that the radiation system radiates electromagnetic waves into the environment near the radiation system. In some embodiments, the program instructions are configured to cause at least one processor to detect incident electromagnetic waves, which are electromagnetic waves incident on the sensor module of the sensing system, using a sensing system. In some embodiments, the program instructions are configured to cause at least one processor to determine sensing system data based at least partially on the detected incident electromagnetic waves. In some embodiments, the program instructions are configured to cause at least one processor to generate monitoring system output data based at least partially on the sensing system data.

[0245] In some embodiments, a program instruction is configured to cause at least one processor to energize the mapping radiation system according to a radiation sequence so that the mapping radiation system radiates electromagnetic waves into the environment near the mapping radiation system. In some embodiments, energizing the mapping radiation system according to a radiation sequence comprises de-energizing all environmental mapping emitters while sequentially energizing one or more subsets of environmental mapping emitters. In some embodiments, a program instruction is configured to cause at least one processor to use a sensing system to detect incident electromagnetic waves, which are electromagnetic waves incident on a sensor module of the sensing system while the mapping radiation system is energized according to a radiation sequence. In some embodiments, a program instruction is configured to cause at least one processor to determine sensing system data comprising energization state data determined at least partially based on the detected incident electromagnetic waves while the mapping radiation system is energized, and ambient state data determined at least partially based on ambient electromagnetic waves detected while the mapping radiation system is de-energized; to determine an operating scenario for the monitoring system at least partially based on the sensing system data; and in response to the determined operating scenario, to generate at least one of three-dimensional state data indicating the state of at least a portion of the environment of the monitoring system, an obstacle environment output indicating the state of obstacles in the environment, and an equipment stop output configured to stop equipment in the environment.

[0246] In some embodiments, a program instruction is configured to cause at least one processor to energize at least one depth test emitter from a depth radiation start time to a depth radiation end time so that at least one depth test emitter emits electromagnetic waves directed toward an associated depth test optical system. In some embodiments, a program instruction is configured to cause at least one processor to detect electromagnetic waves emitted from the radiation end of at least one depth test optical system using a sensing system. In some embodiments, a program instruction is configured to cause at least one processor to determine sensing system data based at least partially on the detected electromagnetic waves. In some embodiments, a program instruction is configured to cause at least one processor to compare the sensing system data with a depth test profile. In some embodiments, in response to a difference between the value of at least one parameter in the sensing system data and the value of at least one corresponding parameter in the depth test profile, a program instruction is configured to cause at least one processor to adjust the value of at least one control parameter.

[0247] In some embodiments, the program instructions are configured to cause at least one processor to energize each depth test emitter from each depth test emission start time to each depth test emission end time. In some embodiments, the program instructions are configured to cause at least one processor to detect electromagnetic waves emitted from the depth test optical system using a sensing system. In some embodiments, the program instructions are configured to cause at least one processor to adjust the value of at least one control parameter based at least partially on the detected electromagnetic waves.

[0248] In some embodiments, program instructions are configured to cause at least one processor to determine sensing system data, at least in part, based on detected electromagnetic waves, with a time delay associated with each depth test emitter, where the time delay associated with a particular depth test emitter represents the time between the energization of that depth test emitter and the detection of electromagnetic waves emitted from the depth test optical system associated with that depth test emitter.

[0249] In some embodiments, the program instructions are configured to cause at least one processor to compare sensing system data with a depth test profile comprising expected time delay parameters for each depth test emitter. In some embodiments, the program instructions are configured to cause at least one processor to adjust the value of at least one control parameter in response to at least one of the determined time delays being different from the value of the corresponding expected time delay parameter in the depth test profile.

[0250] In some embodiments, the control parameter comprises at least one control parameter of the monitoring system.

[0251] In some embodiments, by adjusting the value of at least one control parameter, the monitoring system may shut down, the monitoring system may issue an alarm, and / or the monitoring system may send an alarm signal to another computing device.

[0252] In some embodiments, at least one control parameter comprises at least one control parameter of another device.

[0253] In some embodiments, by adjusting the value of at least one control parameter, the device may shut down, the device may sound an alarm, and / or the device may send an alarm signal to another computing device.

[0254] In some embodiments, a program instruction is configured to cause at least one processor to energize at least one planar test system emitter from a planar radiation start time to a planar radiation end time so that at least one planar test system emitter emits electromagnetic waves directed toward an associated planar test system optical system. In some embodiments, a program instruction is configured to cause at least one processor to detect electromagnetic waves incident on a sensor module, comprising at least a portion of the electromagnetic waves emitted by at least one planar test emitter between the planar radiation start time and the planar radiation end time. In some embodiments, a program instruction is configured to cause at least one processor to determine sensing system data based at least a portion of the detected electromagnetic waves. In some embodiments, a program instruction is configured to cause at least one processor to compare the sensing system data with a planar test reference, the planar test reference comprising a position reference associated with the position on the sensor module where the electromagnetic waves emitted by each planar test emitter are detected. In some embodiments, in response to a difference between the value of at least one parameter in the sensing system data and the value in the planar test reference, a program instruction is configured to cause at least one processor to adjust the value of at least one control parameter.

[0255] In some embodiments, the program instructions are configured to cause at least one processor to energize each planar test emitter from its respective planar radiation start time to its respective planar radiation end time. In some embodiments, the program instructions are configured to cause at least one processor to detect electromagnetic waves incident on the sensor module, comprising at least a portion of the electromagnetic waves emitted by the planar test emitters. In some embodiments, the program instructions are configured to cause at least one processor to adjust the value of at least one control parameter based at least partially on the detected electromagnetic waves.

[0256] In some embodiments, the detected electromagnetic waves comprise electromagnetic waves emitted by at least one planar test emitter, reflected by a window, and incident on the sensor module.

[0257] In some embodiments, the program instructions are configured to cause at least one processor to determine sensing system data based at least partially on the detected electromagnetic waves, and to adjust the value of at least one control parameter in response to the value of at least one parameter of the sensing system data differing from the value of a planar test criterion.

[0258] In some embodiments, the planar test criterion comprises at least one time delay criterion associated with a time delay between the start time of planar radiation and the time at which the electromagnetic waves emitted by each planar test emitter are detected in the sensor module, and position criterion associated with the position on the sensor module at which the electromagnetic waves emitted by each planar test emitter are detected.

[0259] In some embodiments, the control parameter comprises at least one control parameter of the monitoring system.

[0260] In some embodiments, by adjusting the value of at least one control parameter, the monitoring system may shut down, the monitoring system may issue an alarm, and / or the monitoring system may send an alarm signal to another computing device.

[0261] In some embodiments, at least one control parameter comprises at least one control parameter of another device.

[0262] In some embodiments, by adjusting the value of at least one control parameter, the device may shut down, the device may sound an alarm, and / or the device may send an alarm signal to another computing device.

[0263] In some embodiments, a program instruction is configured to cause at least one processor to energize at least one of the environment mapping emitters from an intensity emission start time to an intensity emission end time. In some embodiments, a program instruction is configured to cause at least one processor to detect electromagnetic waves incident on the sensor module, comprising at least a portion of electromagnetic waves emitted by at least one environment mapping emitter between an intensity emission start time and an intensity emission end time and directed toward the sensor module by at least one intensity test optical system. In some embodiments, a program instruction is configured to cause at least one processor to adjust the value of at least one control parameter based at least a portion of the detected electromagnetic waves.

[0264] In some embodiments, a program instruction is configured to cause at least one processor to energize at least one of the environment mapping emitters so that at least one environment mapping emitter emits electromagnetic waves directed toward a window. In some embodiments, a program instruction is configured to cause at least one processor to detect electromagnetic waves that are emitted from the radiating ends of one or more intensity test optical systems toward a sensor module, and which are emitted by at least one environment mapping emitter, reflected from a window, and directed toward the sensor module by at least one intensity test optical system. In some embodiments, a program instruction is configured to cause at least one processor to determine sensing system data based at least partially on the detected electromagnetic waves. In some embodiments, in response to the value of one or more parameters of the sensing system data differing from the value of at least one intensity index, a program instruction is configured to cause at least one processor to adjust the value of at least one control parameter.

[0265] In some embodiments, at least one intensity test optical system completely internally reflects at least a portion of the electromagnetic waves emitted by at least one environment mapping emitter and reflected by a window between the intensity emission start time and the intensity emission end time, along the length of at least one intensity test optical system, so that at least a portion of the completely internally reflected electromagnetic waves are emitted from the emission end of the intensity test reflector toward the sensor module.

[0266] In some embodiments, at least one intensity index is associated with the expected intensity of electromagnetic waves radiated from the radiating ends of one or more intensity test optical systems to the sensor module, and comprises an acceptable intensity range.

[0267] In some embodiments, the intensity emission start time is the first emission start time, and the intensity emission end time is the intensity emission end time.

[0268] In some embodiments, the control parameter comprises at least one control parameter of the monitoring system.

[0269] In some embodiments, by adjusting the value of at least one control parameter, the monitoring system may shut down, the monitoring system may issue an alarm, and / or the monitoring system may send an alarm signal to another computing device.

[0270] In some embodiments, at least one control parameter comprises at least one control parameter of another device.

[0271] In some embodiments, by adjusting the value of at least one control parameter, the device may shut down, the device may sound an alarm, and / or the device may send an alarm signal to another computing device.

[0272] In some embodiments, a monitoring system is provided. The monitoring system may comprise a radiation system comprising one or more environment mapping emitters, each configured to emit electromagnetic waves toward a respective target area of ​​the environment of the monitoring system, and a sensing system configured to generate sensing system data at least in part on the electromagnetic waves emitted by the environment mapping emitters and reflected by the target area of ​​the environment.

[0273] In some embodiments, a monitoring system is provided. The monitoring system may comprise an environment mapping emitter configured to emit radiation to each target region of the environment of the monitoring system, and a sensing system configured to generate sensing system data at least partially based on a portion of the radiation emitted by the environment mapping emitter and reflected by the target regions of the environment.

[0274] In several embodiments, a method is provided. This method may comprise: energizing a mapping radiation system according to a radiation sequence so that the mapping radiation system radiates electromagnetic waves into the environment near the mapping radiation system; detecting incident electromagnetic waves using a sensing system, wherein the incident electromagnetic waves include electromagnetic waves radiated by the mapping radiation system as part of the radiation sequence, reflected by the environment, and incident on a sensor module of the sensing system; determining sensing system data based at least in part on the detected incident electromagnetic waves; and generating monitoring system output data based at least in part on the sensing system data.

[0275] In some embodiments, the incident electromagnetic wave includes electromagnetic waves that are emitted by a mapping radiation system as part of a radiation sequence, directed to pass through a first environmental obstacle, reflected from a second environmental obstacle behind the first environmental obstacle, and incident on a sensor module of a sensing system.

[0276] In some embodiments, the mapping radiation system comprises a plurality of environmental mapping emitters, and energizing the mapping radiation system according to a radiation sequence comprises energizing the environmental mapping emitters according to a radiation sequence.

[0277] In some embodiments, energizing multiple environmental mapping emitters according to a radiation sequence comprises sequentially energizing one or more subsets of multiple environmental mapping emitters.

[0278] In some embodiments, energizing the environmental mapping emitters according to the radiation sequence comprises sequentially energizing one environmental mapping emitter at a time.

[0279] In some embodiments, energizing multiple environmental mapping emitters according to a radiation sequence includes de-energizing all environmental mapping emitters while sequentially energizing one or more subsets of environmental mapping emitters.

[0280] In some embodiments, detecting incident electromagnetic waves comprises detecting incident electromagnetic waves before energizing the mapping radiation system, detecting incident electromagnetic waves while the mapping radiation system is energized according to the radiation sequence, and / or detecting incident electromagnetic waves after the mapping radiation system has been energized according to the radiation sequence.

[0281] In some embodiments, incident electromagnetic waves are detected during each of the sequential energization of one or more subsets of environmental mapping emitters, and while all environmental mapping emitters are de-energized between the sequential energization of one or more subsets of environmental mapping emitters.

[0282] In some embodiments, determining sensing system data involves determining energization state data based at least partially on incident electromagnetic waves emitted by an energized mapping radiation system, and determining ambient state data based at least partially on ambient incident electromagnetic waves.

[0283] In some embodiments, determining sensing system data involves comparing energized state data with ambient state data.

[0284] In some embodiments, determining sensing system data involves processing ambient condition data and energized condition data.

[0285] In some embodiments, the sensing system data includes time difference data, which comprises a plurality of time difference data elements, each time difference data element indicating a time difference between a first time and a second time, where the first time is associated with one start point of energization in the energization sequence, and the second time is associated with the time when the intensity of the detected incident electromagnetic wave exceeds an intensity threshold.

[0286] In some embodiments, the sensing system data comprises time-delay data elements relating to one or more sensing units of the sensing system, the sensing units being configured to respond to the intensity of incident electromagnetic waves.

[0287] In some embodiments, each time-difference element indicates the distance traveled by the detected electromagnetic waves emitted by the mapping radiation system.

[0288] In some embodiments, the monitoring system output data includes a matrix indicating the state of the environment.

[0289] In some embodiments, the sensing system data indicates the intensity of the incident electromagnetic wave.

[0290] In some embodiments, the method further comprises determining an operation scenario of the monitoring system based at least in part on the sensing system data.

[0291] In some embodiments, in response to determining that the operation scenario is a first operation scenario, generating the monitoring system output data comprises generating three-dimensional state data indicative of the state of at least a part of the environment of the monitoring system.

[0292] In some embodiments, in response to determining that the operation scenario is a second operation scenario, generating the monitoring system output data comprises generating an obstacle environment output indicative of the state of an obstacle within the environment.

[0293] In some embodiments, in response to determining that the operation scenario is a third operation scenario, generating the monitoring system output data comprises generating a device stop output configured to stop a device within the environment.

[0294] In some embodiments, in response to determining that the operation scenario is a third operation scenario, generating the monitoring system output data comprises generating a monitoring system stop output configured to stop a mapping radiation system.

[0295] In some embodiments, the method further comprises using the sensing system to detect incident electromagnetic waves within a plurality of time windows each associated with one or more emissions of a radiation sequence.

[0296] In some embodiments, one or more start points of the time window are delayed by a predetermined time delay after the associated emission of the radiation sequence.

[0297] In some embodiments, one or more of the time windows are each associated with a respective distance range, which is the range of distances by which electromagnetic waves emitted by the mapping radiation system are reflected by the environment before being detected.

[0298] In some embodiments, a method of monitoring an environment using a monitoring system is provided. The method may comprise energizing at least one environmental mapping emitter from a first emission start time to a first emission end time such that the at least one environmental mapping emitter emits electromagnetic waves directed towards a first obstacle within the environment of the monitoring system between the first emission start time and the first emission end time. The first obstacle may be at least partially optically transparent and may be between the monitoring system and a second obstacle. The method may comprise starting a detection operation of the sensing system at a first gate time. The method may comprise ending the detection operation at a second gate time that is after the first gate time and differs from the first gate time by only a gate width. The method may comprise storing sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation.

[0299] In some embodiments, the method further comprises generating sensing system data based at least in part on incident electromagnetic waves detected during the detection operation.

[0300] In some embodiments, the first gate time differs from the first emission start time by only a detection time offset.

[0301] In some embodiments, the detection time offset is a positive offset or a negative offset.

[0302] In some embodiments, the first gate time is the same as the first emission start time.

[0303] In some embodiments, the first gate time is associated with a first distance from the sensing system. In some embodiments, the second gate time is associated with a second distance from the monitoring system. In some embodiments, the second distance is greater than the first distance. In some embodiments, at least a portion of the first obstacle is separated from the monitoring system by a distance greater than the first distance and less than the second distance. In some embodiments, the gate width is proportional to the difference between the first distance and the second distance.

[0304] In some embodiments, the electromagnetic waves detected during the detection operation include electromagnetic waves emitted by at least one environment mapping emitter between a first emission start time and a first emission end time and reflected by a first obstacle.

[0305] In some embodiments, sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation is stored in memory as a first time-of-flight data array.

[0306] In some embodiments, the method comprises iteratively starting and ending a plurality of detection operations, each starting at its respective start gate time and ending at its respective end gate time, in order to energize at least one environment mapping emitter from a first emission start time to a first emission end time. In some embodiments, the method comprises storing sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the iteratively performed detection operations. Electromagnetic waves detected in the iteratively performed detection operations include electromagnetic waves emitted by at least one environment mapping emitter and reflected by a first obstacle, and electromagnetic waves emitted by at least one environment mapping emitter, passed through the first obstacle, and then reflected by a second obstacle.

[0307] In some embodiments, the electromagnetic waves detected during a second plurality of iteratively performed detection operations include electromagnetic waves emitted by at least one environment mapping emitter and reflected by a first obstacle.

[0308] In some embodiments, this method comprises: starting a second detection operation of the sensing system at a third gate time that is after a first gate time and differs from the first gate time by only the gate offset; ending the second detection operation at a fourth gate time that is after the third gate time and differs from the third gate time by only the second gate width; and storing sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the second detection operation.

[0309] In some embodiments, the gate offset is equal to or greater than the difference between a first gate time and a second gate time, the second detection operation is one of a plurality of iteratively performed detection operations, and the electromagnetic waves detected during the second detection operation include electromagnetic waves emitted by at least one environment mapping emitter between a first emission start time and a first emission end time, which have passed through a first obstacle and been reflected by a second obstacle.

[0310] In some embodiments, the third gate time differs from the first emission start time only by the second detection time offset, where the second detection time offset is greater than the first detection time offset.

[0311] In some embodiments, the third gate time is associated with a third distance from the sensing system, and the fourth gate time is associated with a fourth distance from the sensing system, where the fourth distance is greater than the third distance, and at least a portion of the second obstacle is separated from the monitoring system by a distance greater than the third distance and less than the fourth distance.

[0312] In some embodiments, the electromagnetic waves detected during the second detection operation include electromagnetic waves emitted by at least one environment mapping emitter, which have passed through the first obstacle and been reflected by the second obstacle.

[0313] In some embodiments, the method further comprises energizing at least one of the environment mapping emitters from a second radiation start time to a second radiation end time so that at least one of the environment mapping emitters emits electromagnetic waves directed toward a target region associated with at least one of the environment mapping emitters between a second radiation start time and a second radiation end time.

[0314] In some embodiments, the one or more environmental mapping emitters energized between the second radiation start time and the second radiation end time are the same as the one or more environmental mapping emitters energized between the first radiation start time and the first radiation end time.

[0315] In some embodiments, the one or more environmental mapping emitters energized between the second radiation start time and the second radiation end time are different from the one or more environmental mapping emitters energized between the first radiation start time and the first radiation end time.

[0316] In some embodiments, the method further comprises determining at least one subsequent environmental mapping emitter to be activated during a second radiation based at least in part on sensing system data generated by the sensing system in response to incident electromagnetic waves detected during a detection operation, wherein the at least one environmental mapping emitter energized from the second radiation start time to the second radiation end time is the determined subsequent environmental mapping emitter.

[0317] In some embodiments, the method further comprises determining a second gate width based at least in part on sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation.

[0318] In some embodiments, the electromagnetic wave detected during the second detection operation is the electromagnetic wave radiated by at least one environmental mapping emitter and reflected by a second obstacle without passing through a first obstacle, and the second obstacle is within a second gate distance window associated with a third gate time and a fourth gate time.

[0319] In some embodiments, the sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the second detection operation is stored in memory as a second time-of-flight data array.

[0320] In some embodiments, the second radiation start time is after the first radiation end time and before the third gate time, and the second radiation end time is after the first radiation end time and before the fourth gate time.

[0321] In some embodiments, the incident electromagnetic wave detected during the second detection operation comprises the electromagnetic wave radiated between the second radiation start time and the second radiation end time.

[0322] In some embodiments, the method further comprises generating a monitoring system output based at least in part on the sensing system data.

[0323] In some embodiments, the monitoring system output comprises monitoring system output data.

[0324] In some embodiments, the monitoring system output adjusts the value of at least one control parameter of the monitoring system and / or a device within the environment of the monitoring system in response to the determined characteristics of the first obstacle and / or the second obstacle, and / or comprises a three-dimensional model of at least a portion of the environment, the three-dimensional model comprising a virtual representation of the first obstacle and a virtual representation of the second obstacle.

[0325] In some embodiments, the sensing system data generated in response to the incident electromagnetic wave detected during the detection operation indicates the characteristics of a first obstacle, and the sensing system data generated in response to the incident electromagnetic wave detected during the second detection operation indicates the characteristics of a second obstacle.

[0326] In some embodiments, the characteristics are associated with at least one of the distance of the first obstacle from the monitoring system, the dimensions of the first obstacle, an obstacle label identifying the type of the first obstacle, the opacity of the first obstacle, the reflectance of the first obstacle, the brightness of the first obstacle, the distance of the second obstacle from the monitoring system, the dimensions of the second obstacle, an obstacle label identifying the type of the second obstacle, the opacity of the second obstacle, the reflectance of the second obstacle, and the brightness of the second obstacle.

[0327] In some embodiments, the first obstacle is located within a first distance range associated with a first gate time and a second gate time.

[0328] In some embodiments, the second obstacle lies within a second distance range associated with the third gate time and the fourth gate time.

[0329] In some embodiments, the shape of the first obstacle completely encompasses the shape of the second obstacle.

[0330] In some embodiments, the monitoring system output includes a three-dimensional model of the environment, the three-dimensional model comprising a virtual representation of a first obstacle and a virtual representation of a second obstacle.

[0331] In some embodiments, the monitoring system output includes a time-of-flight data array.

[0332] In some embodiments, at least one subsequent environmental mapping emitter emits electromagnetic waves between a second emission start time and a second emission end time that have a different emission profile than those emitted between the first emission start time and the first emission end time.

[0333] In some embodiments, the method further comprises determining different radiation profiles based at least in part on sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation.

[0334] In some embodiments, the frequency of electromagnetic waves emitted by at least one subsequent environmental mapping emitter between a second radiation start time and a second radiation end time is different from the frequency of electromagnetic waves emitted by at least one environmental mapping emitter between a first radiation start time and a first radiation end time.

[0335] In some embodiments, the method further comprises determining the frequency of electromagnetic waves emitted by at least one subsequent environment mapping emitter between a second emission start time and a second emission end time, based at least in part on sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation.

[0336] In some embodiments, the monitoring system output adjusts the value of at least one control parameter of a monitoring system that includes a sensing system.

[0337] In some embodiments, at least one control parameter is associated with the radiation frequency of at least one environmental mapping emitter, the emission start time of future radiation, the emission end time of future radiation, a first gate time for future detection operations of the sensing system, a second gate time for future detection operations, a specific environmental mapping emitter energized for future radiation, the polarization of electromagnetic waves emitted by at least one environmental mapping emitter, the number of detection operations per electromagnetic wave emission, and the number of times one or more environmental mapping emitters are energized.

[0338] In some embodiments, the monitoring system output adjusts the values ​​of one or more control parameters of another device located within the sensing system's environment.

[0339] In some embodiments, the monitoring system output causes another device located within the sensing system's environment to shut down.

[0340] In some embodiments, the second object is a device. In some embodiments, at least one control parameter comprises a control parameter for the device.

[0341] In some embodiments, the device is stopped by adjusting the value of at least one control parameter.

[0342] In some embodiments, this method further comprises controlling a sensor system to perform an ambient state detection operation and storing sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the ambient state detection operation, wherein the ambient state detection operation is performed for a period of time during which the detected incident electromagnetic waves are only ambient electromagnetic waves.

[0343] In some embodiments, the method further comprises determining the monitoring system output based at least in part on sensing system data generated by the sensing system in response to incident electromagnetic waves detected during ambient condition detection operation.

[0344] In several embodiments, methods are provided. The method may comprise energizing at least one environmental mapping emitter so that it emits electromagnetic waves toward and through a first optically transparent obstacle in the environment. The method may comprise storing sensing system data generated by a sensing system in response to the detection of electromagnetic waves emitted by at least one environmental mapping emitter and reflected by the first obstacle. The method may comprise storing sensing system data generated by a sensing system in response to the detection of electromagnetic waves emitted by at least one environmental mapping emitter and reflected by a second obstacle located behind the first obstacle.

[0345] In some embodiments, the method further comprises performing a first detection operation using the sensing system over a first time window. In some embodiments, the method further comprises performing a second detection operation using the sensing system over a second time window, the second time window may be later than the first time window. In some embodiments, the method further comprises generating sensing system data based at least partially on electromagnetic waves emitted by at least one environmental mapping emitter and reflected by a first obstacle, which are detected during the first time window. In some embodiments, the method further comprises detecting electromagnetic waves emitted by at least one environmental mapping emitter and reflected by a second obstacle during a second time window. In some embodiments, the method further comprises generating sensing system data based at least partially on electromagnetic waves emitted by at least one environmental mapping emitter and reflected by a second obstacle, which are detected during the second time window.

[0346] In some embodiments, this method further comprises generating a monitoring system output based at least partially on sensing system data.

[0347] In some embodiments, the monitoring system output includes at least one three-dimensional model of the environment, comprising the characteristics of a first obstacle, the characteristics of a second obstacle, a time-of-flight data array, a virtual representation of the first obstacle, and a virtual representation of the second obstacle.

[0348] In some embodiments, the monitoring system output adjusts the value of at least one control parameter.

[0349] In some embodiments, at least one control parameter comprises a control parameter of the monitoring system and is associated with the radiation frequency of at least one environmental mapping emitter, the radiation start time of future radiation, the radiation end time of future radiation, a first gate time for future detection operations of the sensing system, a second gate time for future detection operations, a specific environmental mapping emitter energized for future radiation, the polarization of electromagnetic waves emitted by at least one environmental mapping emitter, the number of detection operations per electromagnetic wave radiation, and the number of times one or more environmental mapping emitters are energized.

[0350] In some embodiments, the monitoring system output is configured to adjust the values ​​of one or more control parameters of another device located within the sensing system's environment.

[0351] In some embodiments, the second object is a device. In some embodiments, at least one control parameter comprises a control parameter for the device.

[0352] In some embodiments, the method further comprises activating the environment mapping emitters according to a radiation sequence comprising sequentially activating a plurality of environment mapping emitters.

[0353] In some embodiments, a method is provided comprising energizing a radiation system according to a radiation sequence so that the radiation system radiates electromagnetic waves into the environment near the radiation system; detecting incident electromagnetic waves, which are electromagnetic waves incident on a sensor module of the sensing system, using a sensing system; determining sensing system data based at least in part on the detected incident electromagnetic waves; and generating monitoring system output data based at least in part on the sensing system data.

[0354] In some embodiments, a method is provided comprising energizing a mapping radiation system according to a radiation sequence so that the mapping radiation system radiates electromagnetic waves into the environment near the mapping radiation system, wherein energizing the mapping radiation system according to the radiation sequence comprises sequentially energizing one or more subsets of environment mapping emitters while de-energizing all environment mapping emitters; using a sensing system to detect incident electromagnetic waves, which are electromagnetic waves incident on a sensor module of the sensing system while the mapping radiation system is energized according to the radiation sequence; determining sensing system data, at least partially based on the detected incident electromagnetic waves, comprising energization state data determined at least partially based on the incident electromagnetic waves detected while the mapping radiation system is energized, and ambient state data determined at least partially based on ambient electromagnetic waves detected while the mapping radiation system is de-energized; determining an operation scenario, at least partially based on the sensing system data; and generating at least one of three-dimensional state data indicating the state of at least a portion of the environment, an obstacle environment output indicating the state of obstacles in the environment, and an equipment stop output configured to stop equipment in the environment, in response to the determined operation scenario.

[0355] In some embodiments, a method for testing a monitoring system is provided. This method may comprise energizing the depth test system of the monitoring system such that the depth test system radiates electromagnetic waves from the end of at least one depth test optical system toward a sensor module of the monitoring system's sensing system. This method may comprise detecting the electromagnetic waves radiated from the end of at least one depth test optical system using a sensing system. This method may comprise determining sensing system data at least in part on the detection of electromagnetic waves radiated from the end of at least one depth test optical system by the sensing system. This method may comprise comparing the sensing system data with a depth test profile. In response to the values ​​of one or more parameters in the sensing system data being different from the values ​​of one or more parameters in the depth test profile, this method may comprise adjusting the value of at least one control parameter.

[0356] In some embodiments, the sensing system data includes a time difference parameter for each depth test optical system. In some embodiments, the value of each time difference parameter indicates the time difference between a first time and a second time. In some embodiments, the first time corresponds to the time the depth test system is energized. In some embodiments, the second time corresponds to the time when electromagnetic waves emitted from the end of each depth test optical system are detected by the sensing system.

[0357] In some embodiments, the values ​​of one or more parameters in the sensing system data are the values ​​of time-difference parameters (or more).

[0358] In some embodiments, one or more parameters of the depth test profile include an expected time delay value indicating the expected time delay between the energization of the depth test system and the detection by the sensing system of electromagnetic waves emitted from the end of at least one depth test reflector.

[0359] In some embodiments, at least one depth test optical system comprises a plurality of depth test optical systems, each having a different length.

[0360] In some embodiments, a method for testing a monitoring system is provided. This method may comprise energizing at least one depth test emitter from a depth emission start time to a depth emission end time so that at least one depth test emitter emits electromagnetic waves directed toward an associated depth test optical system. This method may comprise using a sensing system to detect electromagnetic waves emitted from the emission end of the depth test optical system. This method may comprise determining sensing system data based at least partially on the detected electromagnetic waves. This method may comprise comparing the sensing system data with a depth test profile. This method may comprise adjusting the value of at least one control parameter in response to a difference between the value of at least one parameter in the sensing system data and the value of at least one corresponding parameter in the depth test profile.

[0361] In some embodiments, a method for testing a monitoring system is provided. This method may comprise energizing each depth test emitter of the monitoring system from each depth radiation start time to each depth radiation end time. This method may comprise detecting electromagnetic waves emitted from the depth test optical system of the monitoring system using a sensing system. This method may comprise adjusting the value of at least one control parameter based at least in part on the detected electromagnetic waves.

[0362] In some embodiments, the method further comprises determining sensing system data based at least in part on detected electromagnetic waves, the sensing system data comprising a time delay associated with each depth test emitter, the time delay associated with a particular depth test emitter indicating the time between the energization of that depth test emitter and the detection of electromagnetic waves emitted from the depth test optical system associated with that depth test emitter.

[0363] In some embodiments, the method further comprises comparing sensing system data with a depth test profile comprising expected time delay parameters for each depth test emitter, and adjusting the value of at least one control parameter in response to at least one of the determined time delays being different from the value of the corresponding expected time delay parameter in the depth test profile.

[0364] In some embodiments, the control parameter comprises at least one control parameter of the monitoring system.

[0365] In some embodiments, by adjusting the value of at least one control parameter, the monitoring system may shut down, the monitoring system may issue an alarm, and / or the monitoring system may send an alarm signal to another computing device.

[0366] In some embodiments, at least one control parameter comprises at least one control parameter of another device.

[0367] In some embodiments, by adjusting the value of at least one control parameter, the device may shut down, the device may sound an alarm, and / or the device may send an alarm signal to another computing device.

[0368] In some embodiments, a method for testing a monitoring system is provided. This method may comprise energizing the planar test system of the monitoring system according to a planar test emission sequence so that the planar test system emits electromagnetic waves toward the surface of the monitoring system. This method may comprise detecting incident electromagnetic waves, comprising at least a portion of the electromagnetic waves emitted by the planar test system and reflected by the surface, incident on a sensor module of the sensing system using the sensing system's sensing system. This method may comprise determining sensing system data based at least in part on the detected incident electromagnetic waves. This method may comprise comparing the sensing system data with a planar test reference, the planar test reference comprising a position reference associated with the position on the sensor module where the electromagnetic waves emitted by each planar test emitter are detected. In response to a difference between the values ​​of one or more parameters in the sensing system data and the values ​​in the planar test reference, this method may comprise adjusting the values ​​of one or more control parameters of the monitoring system.

[0369] In some embodiments, the planar test system comprises a plurality of planar test emitters, and energizing the planar test system according to a planar test emission sequence comprises energizing one or more subsets of the planar test emitters.

[0370] In some embodiments, energizing the planar test system according to a planar test emission sequence involves sequentially energizing a subset of planar test emitters, one at a time.

[0371] In some embodiments, each subset of planar test emitters comprises multiple planar test emitters.

[0372] In some embodiments, the planar test system comprises a first number of planar test emitter columns and a second number of planar test emitter rows.

[0373] In some embodiments, each subset of a plurality of planar test emitters comprises one planar test system emitter in each column and one planar test system emitter in each row.

[0374] In some embodiments, a method for testing a monitoring system is provided. This method may comprise energizing at least one planar test system emitter from a planar emission start time to a planar emission end time so that at least one planar test system emitter emits electromagnetic waves directed toward an associated planar test system optical system. This method may comprise detecting electromagnetic waves incident on a sensor module, comprising at least a portion of the electromagnetic waves emitted by at least one planar test emitter between the planar emission start time and the planar emission end time. This method may comprise determining sensing system data based at least in part on the detected electromagnetic waves. This method may comprise comparing the sensing system data with a planar test reference, the planar test reference comprising a position reference associated with the location on the sensor module where the electromagnetic waves emitted by each planar test emitter are detected. In response to a difference between the value of at least one parameter of the sensing system data and the value of the planar test reference, this method may comprise adjusting the value of at least one control parameter.

[0375] In some embodiments, a method for testing a monitoring system is provided. This method may comprise energizing a plurality of planar test emitters from each planar radiation start time to each planar radiation end time. This method may comprise detecting electromagnetic waves incident on a sensor module, comprising at least a portion of the electromagnetic waves emitted by the planar test emitters. This method may comprise adjusting the value of at least one control parameter based at least partially on the detected electromagnetic waves.

[0376] In some embodiments, the detected electromagnetic waves comprise electromagnetic waves emitted by at least one planar test emitter, reflected by a window, and incident on the sensor module.

[0377] In some embodiments, the method further comprises determining sensing system data based at least partially on detected electromagnetic waves, and adjusting the value of at least one control parameter in response to the value of at least one parameter of the sensing system data differing from the value of a planar test criterion.

[0378] In some embodiments, the planar test criterion comprises at least one time delay criterion associated with a time delay between a first planar radiation start time and the time at which electromagnetic waves emitted by each planar test emitter are detected in the sensor module, and position criterion associated with the position on the sensor module at which electromagnetic waves emitted by each planar test emitter are detected.

[0379] In some embodiments, the control parameter comprises at least one control parameter of the monitoring system.

[0380] In some embodiments, by adjusting the value of at least one control parameter, the monitoring system may shut down, the monitoring system may issue an alarm, and / or the monitoring system may send an alarm signal to another computing device.

[0381] In some embodiments, at least one control parameter comprises at least one control parameter of another device.

[0382] In some embodiments, by adjusting the value of at least one control parameter, the device may shut down, the device may sound an alarm, and / or the device may send an alarm signal to another computing device.

[0383] In some embodiments, a method for testing a monitoring system is provided. This method may comprise energizing the mapping radiation system of the monitoring system so that the mapping radiation system radiates electromagnetic waves toward a window of the monitoring system. This method may comprise fully internally reflecting at least a portion of the electromagnetic waves radiated by the mapping radiation system and reflected by the window along the length of the intensity test optical system so that at least a portion of the fully internally reflected electromagnetic waves are radiated from the radiating end of the intensity test reflector toward a sensor module of the sensing system of the monitoring system. This method may comprise detecting the electromagnetic waves radiated from the radiating end of the intensity test optical system using a sensing system. This method may comprise determining sensing system data at least in part on the detection of electromagnetic waves radiated from the radiating end of the intensity test optical system by the sensing system. This method may comprise comparing the sensing system data with an intensity index. In response to a difference between the values ​​of one or more parameters of the sensing system data and the values ​​of the intensity index, this method may comprise adjusting the values ​​of one or more control parameters of the monitoring system.

[0384] In some embodiments, the sensing system data includes a value for an intensity parameter, where the value of the intensity parameter indicates the intensity of electromagnetic waves emitted from the radiating end of the intensity test optical system.

[0385] In some embodiments, the intensity index value indicates the minimum operating intensity of electromagnetic waves emitted from the radiating end of the intensity test reflector.

[0386] In some embodiments, a method for testing a monitoring system is provided. This method may comprise energizing at least one environment mapping emitter from an intensity emission start time to an intensity emission end time. This method may comprise detecting electromagnetic waves incident on a sensor module, comprising at least a portion of electromagnetic waves emitted by at least one environment mapping emitter between the intensity emission start time and the intensity emission end time and directed toward the sensor module by at least one intensity test optical system. This method may comprise adjusting the value of at least one control parameter based at least partially on the detected electromagnetic waves.

[0387] In some embodiments, a method for testing a monitoring system is provided. This method may comprise energizing at least one environmental mapping emitter so that at least one environmental mapping emitter emits electromagnetic waves directed toward a window of the monitoring system. This method may comprise detecting electromagnetic waves that are emitted by at least one environmental mapping emitter, reflected from a window, and directed toward a sensor module by at least one intensity test optical system, which are emitted from the radiating ends of one or more intensity test optical systems toward a sensor module. This method may comprise determining sensing system data based at least partially on the detected electromagnetic waves. In response to a difference between the value of one or more parameters of the sensing system data and the value of at least one intensity index, this method may comprise adjusting the value of at least one control parameter.

[0388] In some embodiments, the method further comprises using at least one intensity test optical system to completely internally reflect at least a portion of the electromagnetic waves emitted by at least one environment mapping emitter and reflected by a window between a first intensity emission start time and a first intensity emission end time, along the length of at least one intensity test optical system, so that at least a portion of the completely internally reflected electromagnetic waves are emitted from the radiating end of the intensity test reflector toward the sensor module.

[0389] In some embodiments, at least one intensity index comprises the intensity of electromagnetic waves radiated from the radiating ends of one or more intensity test optical systems to a sensor module, and comprises an acceptable intensity range.

[0390] In some embodiments, the intensity emission start time is the first emission start time, and the intensity emission end time is the intensity emission end time.

[0391] In some embodiments, the control parameter comprises at least one control parameter of the monitoring system.

[0392] In some embodiments, by adjusting the value of at least one control parameter, the monitoring system may shut down, the monitoring system may issue an alarm, and / or the monitoring system may send an alarm signal to another computing device.

[0393] In some embodiments, at least one control parameter comprises at least one control parameter of another device.

[0394] In some embodiments, by adjusting the value of at least one control parameter, the device may shut down, the device may sound an alarm, and / or the device may send an alarm signal to another computing device.

[0395] In several embodiments, a system is provided. This system may comprise a plurality of monitoring devices as described herein. This system may be configured to generate a system output based on sensor system data generated by one or more monitoring systems and at least one of the sensor system outputs of one or more monitoring systems.

[0396] In some embodiments, the system output is configured to change the value of one or more control parameters of the system's device, and there is a visual obstruction between the device and at least one of the monitoring systems.

[0397] Embodiments of the present invention are further described below, merely as examples, with reference to the accompanying drawings. [Brief explanation of the drawing]

[0398] [Figure 1] Perspective views of several embodiments of monitoring systems are shown. [Figure 2] Front views of several embodiments of monitoring systems are shown. [Figure 3] Several side views of monitoring systems are shown. [Figure 4] The rear view of several embodiments of the monitoring system is shown. [Figure 5] This shows another side view of several embodiments of a monitoring system. [Figure 6] The following are top views of monitoring systems according to several embodiments. [Figure 7] The following are bottom views of monitoring systems according to several embodiments. [Figure 8] Another perspective view of a monitoring system in which the housing of the monitoring system is concealed, according to some embodiments, is shown. [Figure 9] Another perspective view of a monitoring system in which the housing of the monitoring system is concealed, according to some embodiments, is shown. [Figure 10] The following are front views of a monitoring system in which the housing of the monitoring system is concealed, according to several embodiments. [Figure 11] The following are side views of a monitoring system in which the housing of the monitoring system is concealed, according to several embodiments. [Figure 12] The following are rear views of a monitoring system in which the housing of the monitoring system is concealed, according to several embodiments. [Figure 13]Another side view of a monitoring system in which the housing of the monitoring system is concealed, according to several embodiments, is shown. [Figure 14] Another top view of a monitoring system in which the housing of the monitoring system is concealed, according to some embodiments, is shown. [Figure 15] The following are bottom views of a monitoring system with its housing concealed, according to several embodiments. [Figure 16] The following are perspective views of a monitoring system in which the housing and several additional components of the monitoring system are concealed, according to several embodiments. [Figure 17] This is a block diagram of a control system for a monitoring system according to several embodiments. [Figure 18] This is a process flow diagram of a method for generating monitoring system output data according to several embodiments. [Figure 18A] This is a top view of an environment including a tool, according to several embodiments. [Figure 18B] Figure 18A is a top view of an environment with a person, according to several embodiments. [Figure 18C] This is a top view of the environment in Figure 18A, where the tool has been moved according to one of several embodiments. [Figure 18D] Figure 18A is a top view of an environment having part of a person within a zone, according to several embodiments. [Figure 19] A schematic representation of an example monitoring system, in which three environment mapping emitters are represented according to several embodiments, is shown. [Figure 20] This shows a three-dimensional representation of an example of a monitoring system having multiple environment mapping emitters according to several embodiments. [Figure 21] Several embodiments of a monitoring system sensor module are shown. [Figure 22A] A three-dimensional representation of an example monitoring system having six environment mapping emitters, according to several embodiments, is shown. [Figure 22B]Figure 22A shows a region of a dedicated sensor module for detecting the reflection of radiation according to several embodiments. [Figure 23] A schematic diagram of electromagnetic waves emitted by an environmental mapping emitter, which are reflected by an object and detected by a sensor module, is shown according to several embodiments. [Figure 24] A schematic diagram is shown of a case in which, according to several embodiments, electromagnetic waves emitted by an environmental mapping emitter do not reach an object, and the object reflects only the surrounding electromagnetic waves. [Figure 25] A schematic diagram is shown of a case according to several embodiments in which electromagnetic waves emitted by an environmental mapping emitter do not reach an object, and there are no ambient electromagnetic waves emitted by the object that are detected by the sensor module. [Figure 26] Figure 1 shows a three-dimensional representation of several components of the monitoring system, illustrating electromagnetic waves incident on a sensor module according to several embodiments. [Figure 26A] This is a process flow diagram of a method according to several embodiments. [Figure 27] Figure 1 shows a monitoring system in an environment with multiple objects, according to several embodiments. [Figure 28] This shows the time it takes for electromagnetic waves emitted by the monitoring system in Figure 1 and reflected from the object in Figure 27 to be detected by the monitoring system, according to several embodiments. [Figure 29] In some embodiments, the time it takes for electromagnetic waves emitted by the monitoring system in Figure 1 and reflected from the window and objects behind the window to be detected by the monitoring system is shown, along with a representation of the environment including the monitoring system, the window, and the objects. [Figure 30] In some embodiments, the time it takes for electromagnetic waves emitted by the monitoring system in Figure 1 and reflected from visual obstacles and objects behind the visual obstacles to be detected by the monitoring system is shown, along with a representation of the environment including the monitoring system, visual obstacles, and objects. [Figure 31A]In some embodiments, the time over which electromagnetic waves emitted by the monitoring system in Figure 1 and reflected by mirrors and / or objects are detected by the monitoring system is shown, along with a representation of the environment including the monitoring system, mirrors, and objects. [Figure 31B] Figure 31A shows another view of the environment. [Figure 32] The following are process flow diagrams illustrating methods for testing monitoring systems according to several embodiments. [Figure 33] A schematic diagram of a part of the monitoring system shown in Figure 1, according to several embodiments, is shown. [Figure 34] The following are process flow diagrams of alternative methods for testing a monitoring system according to several embodiments. [Figure 35] A schematic diagram of the monitoring system shown in Figure 1 in use, according to several embodiments, is shown. [Figure 36] Several target areas on a window of a monitoring system, according to some embodiments, are shown. [Figures 37A-37E] Representations of the target area on the window and the planar test emission sequence according to several embodiments are shown. [Figure 38] The following are process flow diagrams of alternative methods for testing a monitoring system according to several embodiments. [Figure 39] A schematic representation of a monitoring system when the method shown in Figure 38 is implemented according to several embodiments is shown. [Figure 40] A schematic representation of a monitoring system when the method shown in Figure 38 is implemented according to several embodiments is shown. [Figure 41] Several embodiments of a system comprising multiple monitoring systems are shown. [Figure 42] Another system comprising multiple monitoring systems, according to several embodiments, is shown. [Figure 43] The potential scope of the system shown in Figure 42, according to several embodiments, is presented. [Figure 44] Another system comprising multiple monitoring systems, according to several embodiments, is shown. [Figure 45]Figure 44 shows a perspective view of the field of view of the system according to several embodiments. [Figure 46] Another perspective view of the field of view of the system in Figure 44, according to several embodiments, is shown. [Figure 47] This shows a perspective view of a device equipped with multiple monitoring systems. [Figure 48] A schematic diagram of the environment in which the device moves, according to several embodiments, is shown. [Figure 49A] Schematic diagrams of devices in an environment according to several embodiments are shown. [Figure 49B] Figure 49A shows another schematic diagram of the apparatus and environment, with multiple boundaries indicated, according to several embodiments. [Figure 50] This shows the paths to which the device may move according to several embodiments. [Figure 51] Figure 50 shows a route that references multiple boundaries and in which the route does not intersect with any of the boundaries, according to several embodiments. [Figure 52] This shows alternative paths that the device can travel along, referencing multiple boundaries and not intersecting any of the boundaries, according to some embodiments. [Figure 53] A schematic diagram of the environment in which the device moves, according to several embodiments, is shown. [Figure 54] The following are some possible paths for a machine to travel, according to several embodiments. [Figure 55] A schematic diagram is shown of an environment having multiple defined boundaries and the position of the machine at multiple points in time as the machine moves through the environment, according to several embodiments. [Figure 56] A schematic diagram of the environment in which the machine moves, according to several embodiments, is shown. [Figure 57] The environment and multiple defined boundaries are shown according to several embodiments. [Figure 58] Refer to the multiple boundaries in Figure 57 to show the path the machine will travel. [Modes for carrying out the invention]

[0399] This disclosure relates to a monitoring system. The monitoring system includes a radiation system having a plurality of environment mapping emitters. The environment mapping emitters emit electromagnetic waves directed towards one or more target areas in the environment surrounding the monitoring system. The environment surrounding the monitoring system and objects within the environment reflect both ambient electromagnetic waves and electromagnetic waves emitted from the environment mapping emitters. The sensing system of the monitoring system generates sensing system data based on electromagnetic waves incident on the sensing system. These incident electromagnetic waves include reflected ambient electromagnetic waves (if present) and electromagnetic waves emitted from the environment mapping emitters reflected by the environment surrounding the monitoring system.

[0400] Based on the detected electromagnetic waves, one or more control decisions are made. As part of this process, a virtual 3D model of the environment is generated based on the detected electromagnetic waves. The positions of one or more objects (e.g., machinery or personnel) within the environment can be determined, and control decisions are made based on the determined positions. For example, if a part of a piece of machinery is outside the assumed area where its operation is defined, the machinery may be stopped to reduce the associated safety risks. Similarly, if it is determined that a person is outside the defined area, nearby machinery may be stopped.

[0401] The monitoring system can generate a three-dimensional model of the environment in cases where it is difficult or impossible with conventional monitoring systems. For example, the monitoring system described herein may be able to monitor objects behind windows or smoke and distinguish those objects from the windows and / or the smoke itself.

[0402] Furthermore, the monitoring system is configured to "safely fail" if it is determined that one or more of its subsystems are providing unreliable information. In this way, mechanical devices in the relevant environment may be shut down if the monitoring system itself fails.

[0403] Throughout this specification, the term “electromagnetic wave” may be interpreted as encompassing one or more types of electromagnetic waves. As used herein, electromagnetic waves include electromagnetic waves emitted or radiated from an energy source. As used herein, electromagnetic waves also include electromagnetic waves reflected from an object or material. For example, electromagnetic waves emitted from an energy source and subsequently reflected from one or more objects are considered electromagnetic waves within this specification, even if the electromagnetic waves were not directly emitted from the energy source but were reflected immediately. Examples of electromagnetic waves include visible light, ultraviolet light, infrared light, radio waves, gamma rays, and X-rays. Electromagnetic waves may be referred to as light throughout this specification.

[0404] Throughout this specification, electromagnetic waves can be considered incident on an object if their direction of propagation coincides with the object encountering it during propagation. These electromagnetic waves can be said to be incident on an object at the point of encounter. An object can be said to encounter electromagnetic waves. An object can be said to receive electromagnetic waves. Monitoring system 100

[0405] Figures 1-16 show a monitoring system 100 according to some embodiments of the present disclosure. Multiple reference number labels in the figures include dashed lines (see, for example, Figure 1). The dashed lines can be considered to mean that a particular portion of the reference number label extends to the "rear side" of the feature of the monitoring system 100 to point to the feature of that reference number. The monitoring system 100 comprises a housing 102. The housing 102 houses multiple subsystems of the monitoring system 100. The housing 102 comprises multiple housing walls 104. The housing 102 comprises one or more housing walls 104. The multiple housing walls 104 are integrally formed; that is, the multiple housing walls 104 integrally form a part of the housing 102. Such housing walls 104 may be formed simultaneously, for example, in a molding process. One or more sections of the housing 102 may be configured to connect to one or more other sections of the housing 102 to form the housing 102.

[0406] The housing comprises a front wall 104A. The front wall 104A is planar. The front wall 104A comprises a plurality of holes 105. One or more of the holes 105 define an opening to the interior of the housing 102. The housing comprises a plurality of angled walls 104B. The angled walls 104B are transverse to the front wall 104A. Each angled wall 104B is planar. Each angled wall 104B is in contact with the front wall 104A along its edge. Each angled wall 104B is in contact with two other angled walls 104B at its respective edge. The housing 104 comprises one or more side walls 104C. The side walls 104C are planar. The side walls 104C are transverse to the angled walls 104B. Each side wall 104 is in contact with one or more angled walls 104B at its edge. The side wall 104C is perpendicular to the front wall 104A. The housing includes a rear angled wall 104D. The rear angled wall 104D is planar. Each rear angled wall 104D is in contact with the side wall 104C at its edge. The housing 104 includes a rear wall 104E. The rear wall 104E is parallel to the front wall 104A. Each rear angled wall 104D is in contact with the rear wall 104E at its edge. Radiation system 106

[0407] The monitoring system 100 includes a radiation system 106. The radiation system 106 is configured to emit electromagnetic waves. That is, the radiation system 106 emits electromagnetic waves. The radiation system 106 includes a mapping radiation system 107. The mapping radiation system emits electromagnetic waves. The mapping radiation system 107 includes an environmental mapping emitter 108. The mapping radiation system 107 includes one or more environmental mapping emitters 108. The illustrated mapping radiation system 107 includes multiple environmental mapping emitters 108. Therefore, it can be said that the monitoring system 100 includes multiple environmental mapping emitters 108. The environmental mapping emitter 108 emits electromagnetic waves. That is, the environmental mapping emitter 108 is configured to emit electromagnetic waves. In the illustrated embodiment, each environmental mapping emitter 108 is configured to emit electromagnetic waves. That is, each environmental mapping emitter 108 emits electromagnetic waves. The environmental mapping emitter 108 emits electromagnetic waves when energized. In other words, the environmental mapping emitter 108 emits electromagnetic waves when activated.

[0408] The mapping radiation system 107 comprises a targeting optical system 110. The targeting optical system 110 is configured to direct incident electromagnetic waves toward a target region. That is, the targeting optical system 110 directs incident electromagnetic waves toward a target region. The mapping radiation system 107 comprises one or more targeting optical systems 110. The mapping radiation system 107 comprises multiple targeting optical systems 110. In the illustrated embodiment, each targeting optical system 110 is configured to direct incident electromagnetic waves toward its respective target region. That is, each targeting optical system 110 directs incident electromagnetic waves toward its respective target region. More generally, the radiation system 106 can be said to comprise one or more environmental mapping emitters 108 and one or more targeting optical systems 110. The illustrated radiation system 106 comprises multiple environmental mapping emitters 108 and multiple targeting optical systems 110. Environmental mapping emitter 108

[0409] The environmental mapping emitter 108 is configured to emit electromagnetic waves within a frequency range. That is, the environmental mapping emitter 108 emits electromagnetic waves within a frequency range. One or more environmental mapping emitters 108 are configured to emit electromagnetic waves within a frequency range. One or more environmental mapping emitters 108 emit electromagnetic waves within a frequency range. Multiple environmental mapping emitters 108 are configured to emit electromagnetic waves within a frequency range. That is, multiple environmental mapping emitters 108 emit electromagnetic waves within a frequency range. In the illustrated embodiment, each environmental mapping emitter 108 is configured to emit electromagnetic waves within a frequency range. That is, each environmental mapping emitter 108 emits electromagnetic waves within a frequency range.

[0410] The frequency range may be referred to as the environmental mapping frequency range. In particular, one or more environmental mapping emitters 108 are configured to emit electromagnetic waves within a frequency range from a lower frequency threshold to an upper frequency threshold. That is, the frequency range extends between the lower frequency threshold and the upper frequency threshold. It is understood that the lower frequency threshold and / or upper frequency threshold may correspond to the point where the intensity of the emitted electromagnetic waves falls below the radiated intensity threshold.

[0411] One or more frequency ranges of the environmental mapping emitter 108 may include 450 nm. One or more frequency ranges of the environmental mapping emitter 108 may include 940 nm. One or more frequency ranges of the environmental mapping emitter 108 may include one or more of 200 nm, 250 nm, 300 nm, 400 nm, 450 nm, 500 nm, 550 nm, 600 nm, 650 nm, 700 nm, 750 nm, 800 nm, 850 nm, 900 nm, 950 nm, 1000 nm, 1100 nm, 1200 nm, 1300 nm, 1400 nm, 1500 nm, 1600 nm, 1700 nm, 1800 nm, 1900 nm, and 2000 nm. In some embodiments, the environmental mapping emitter 108 is configured to emit electromagnetic waves having wavelengths of 200 nm to 3000 nm. In some embodiments, the environmental mapping emitter 108 is configured to emit electromagnetic waves having wavelengths of 400 nm to 1000 nm. In some embodiments, the environmental mapping emitter 108 is configured to emit electromagnetic waves having wavelengths of 900 nm to 1000 nm. In some embodiments, the environmental mapping emitter 108 is configured to emit electromagnetic waves having wavelengths of 300 nm to 2000 nm. In some embodiments, one or more frequency ranges of the environmental mapping emitter 108 are different from one or more other frequency ranges of the environmental mapping emitter 108. That is, the first environmental mapping emitter 108 may emit electromagnetic waves within a first frequency range. The second environmental mapping emitter 108 may emit electromagnetic waves within a second frequency range. The second frequency range may be different from the first frequency range. The first frequency range may overlap with the second frequency range.

[0412] In other words, the environmental mapping emitter 108 emits electromagnetic waves within a frequency range. One or more environmental mapping emitters 108 are configured to emit electromagnetic waves within a frequency range. One or more environmental mapping emitters 108 emit electromagnetic waves within a frequency range. Multiple environmental mapping emitters 108 are configured to emit electromagnetic waves within a frequency range. In other words, multiple environmental mapping emitters 108 emit electromagnetic waves within a frequency range. In the illustrated embodiment, each environmental mapping emitter 108 is configured to emit electromagnetic waves within a frequency range. In other words, each environmental mapping emitter 108 emits electromagnetic waves within a frequency range.

[0413] The environmental mapping emitter 108 is configured to emit electromagnetic waves having a radiation profile. The radiation profile of the emitted electromagnetic wave characterizes one or more features of the electromagnetic wave. For example, the radiation profile of the emitted electromagnetic wave may describe the frequency of the electromagnetic wave. The radiation profile of the emitted electromagnetic wave may describe the wavelength of the emitted electromagnetic wave. The radiation profile of the emitted electromagnetic wave may describe the amplitude of the emitted electromagnetic wave. The radiation profile of the emitted electromagnetic wave may describe the polarization of the emitted electromagnetic wave. One or more radiation profile data of the environmental mapping emitter 108 may be stored by a monitoring system. The radiation profile data may comprise at least one radiation profile parameter of one or more environmental mapping emitters 108. The values ​​of the radiation profile parameters may indicate features of the electromagnetic wave emitted by a particular environmental mapping emitter 108. The radiation profile data may comprise at least one of one or more frequency parameters, wavelength parameters, amplitude parameters, and polarization parameters of the environmental mapping emitter 108. Each environmental mapping emitter 108 can be energized according to its associated radiation profile data. The values ​​of one or more radiation profile parameters in the radiation profile data of one environmental mapping emitter 108 may be the same as the values ​​of one or more radiation profile parameters in the radiation profile data of another environmental mapping emitter 108. The values ​​of one or more radiation profile parameters in the radiation profile data of one environmental mapping emitter 108 may be different from the values ​​of one or more radiation profile parameters in the radiation profile data of another environmental mapping emitter 108. That is, the first environmental mapping emitter 108 may emit electromagnetic waves having a first radiation profile. The second environmental mapping emitter 108 may emit electromagnetic waves having a second radiation profile. Alternatively, one or more environmental mapping emitters 108 may be configured to emit electromagnetic waves having multiple radiation profiles. That is, one or more environmental mapping emitters 108 may be configured to emit electromagnetic waves having a first radiation profile and electromagnetic waves having a second radiation profile.Radiation profile data can be stored by the monitoring system 100.

[0414] The use of different radiation profiles can be useful in enabling detailed monitoring of the environment. For example, light of a certain wavelength penetrates certain obstacles (e.g., smoke) more easily than light of other wavelengths. Therefore, by using different environmental mapping emitters 108 that emit light of different frequencies, environmental monitoring in the presence of certain obstacles can be improved. Alternatively, the same advantages may be provided by using environmental mapping emitters 108 that are capable of selectively emitting electromagnetic waves of different wavelengths.

[0415] Each environmental mapping emitter 108 is configured to emit electromagnetic waves in its respective radiation direction. That is, each environmental mapping emitter 108 emits electromagnetic waves in its respective radiation direction. Each environmental mapping emitter 108 is configured to emit electromagnetic waves in its respective radiation direction. That is, each environmental mapping emitter 108 emits electromagnetic waves in its respective radiation direction. The radiation direction of each environmental mapping emitter 108 can be determined at least in part by the configuration in which the environmental mapping emitter 108 is attached to another component of the monitoring system 100. One or more of the environmental mapping emitters 108 are in the form of lasers. One or more of the environmental mapping emitters 108 may be in the form of light-emitting diodes or other light-emitting components.

[0416] The illustrated monitoring system 100 comprises 24 environmental mapping emitters 108. However, it is understood that the monitoring system 100 may comprise a different number of environmental mapping emitters 108. For example, the monitoring system 100 may comprise any number of environmental mapping emitters 108 from 1 to 24. Alternatively, the monitoring system 100 may comprise more than 24 environmental mapping emitters 108. The monitoring system 100 may comprise 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, or 23 environmental mapping emitters 108. The number of environmental mapping emitters 108 may be a power of 2. The number of environmental mapping emitters 108 may be a multiple of 2. Aiming optical system 110

[0417] The monitoring system 100 includes a targeting optical system 110. The targeting optical system 110 is configured to manipulate electromagnetic waves. The targeting optical system 110 manipulates electromagnetic waves. The monitoring system 100 includes one or more targeting optical systems 110. The targeting optical system 110 is configured to manipulate electromagnetic waves. The targeting optical system 110 manipulates electromagnetic waves. The illustrated monitoring system 100 includes multiple targeting optical systems 110. The radiation system 106 includes a targeting optical system 110. More specifically, the mapping radiation system 107 includes a targeting optical system 110. The monitoring system 100 includes a targeting optical system 110 for each environmental mapping emitter 108. That is, one or more of the targeting optical systems 110 are associated with each environmental mapping emitter 108. In the illustrated configuration, each targeting optical system 110 is associated with each environmental mapping emitter 108.

[0418] Each environmental mapping emitter 108 is configured to emit electromagnetic waves in its respective aiming optical system 110. That is, each environmental mapping emitter 108 emits electromagnetic waves in its respective aiming optical system 110. One or more environmental mapping emitters 108 are configured to emit electromagnetic waves in their respective aiming optical systems 110. That is, one or more environmental mapping emitters 108 emit electromagnetic waves in their respective aiming optical systems 110. The aiming optical system 110 from which a particular environmental mapping emitter 108 emits electromagnetic waves can be considered to be the aiming optical system 110 associated with that particular environmental mapping emitter 108. In other words, one or more environmental mapping emitters 108 are configured to emit electromagnetic waves in their associated aiming optical systems 110. Multiple environmental mapping emitters 108 are configured to emit electromagnetic waves in their respective aiming optical systems 110. In the illustrated embodiment, each environmental mapping emitter 108 is configured to emit electromagnetic waves in the associated aiming optical system 110. That is, each environmental mapping emitter 108 emits electromagnetic waves in the associated aiming optical system 110.

[0419] The aiming optical system 110 is configured to direct incident electromagnetic waves. That is, the aiming optical system 110 directs incident electromagnetic waves. One or more of the aiming optical systems 110 are configured to direct electromagnetic waves. That is, one or more of the aiming optical systems 110 direct electromagnetic waves. In particular, one or more of the aiming optical systems 110 are configured to direct electromagnetic waves irradiated by the associated environment mapping emitter 108 toward each target area of ​​the environment of the monitoring system 100. That is, one or more of the aiming optical systems 110 direct electromagnetic waves irradiated by the associated environment mapping emitter 108 toward each target area of ​​the environment of the monitoring system 100. In the illustrated embodiment, each aiming optical system 110 is configured to direct electromagnetic waves irradiated by the associated environment mapping emitter 108 toward each target area of ​​the environment of the monitoring system 100. In other words, each aiming optical system directs the electromagnetic waves emitted by the associated environment mapping emitter 108 toward the respective target area of ​​the environment of the monitoring system 100.

[0420] The aiming optical system 110 includes a refractor. One or more of the aiming optical systems 110 include a refractor. Multiple aiming optical systems 110 include a refractor. In the illustrated embodiment, each aiming optical system 110 includes a refractor. The refractor is configured to refract the incident electromagnetic wave. The refractor refracts the incident electromagnetic wave. The refractor is configured to redirect the incident electromagnetic wave by refracting the electromagnetic wave. That is, the refractor redirects the incident electromagnetic wave by refracting the electromagnetic wave. In this way, the refractor changes the propagation direction of the electromagnetic wave from a first propagation direction to a second propagation direction.

[0421] The refractor may be in the form of a prism. The refractor may be in the form of a lens. The refractor may be in the form of an optical fiber. The refractor may take any other form. One or more aiming optical systems 110 may comprise multiple refractors (e.g., one or more prisms, one or more lenses, and / or one or more optical fibers). Although each aiming optical system 110 in the illustrated embodiments comprises a refractor, it will be understood that in some embodiments only one or more aiming optical systems 110 may comprise each refractor. That is, not all aiming optical systems 110 may comprise a refractor. Thus, in some embodiments, it can be said that a subset of aiming optical systems 110 comprises refractors. In some embodiments, none of the aiming optical systems 110 comprise a refractor.

[0422] The aiming optical system 110 may include a refractor. One or more of the aiming optical systems 110 may include a refractor. Multiple aiming optical systems 110 may include a refractor. Each of the aiming optical systems 110 may include a refractor. One or more of the aiming optical systems 110 may include mirrors; that is, the refractor may be in the form of a mirror. One or more of the aiming optical systems 110 may include optical fibers; the refractor may be in the form of an optical fiber. One or more of the aiming optical systems 110 may include one or more mirrors and / or optical fibers configured to completely internally reflect incident electromagnetic waves. One or more mirrors may be configured to redirect incident electromagnetic waves radiated from the associated environmental mapping emitter 108 toward one or more optical fibers. That is, one or more mirrors may redirect incident electromagnetic waves radiated from the associated environmental mapping emitter 108 toward one or more optical fibers. One or more optical fibers may be configured to redirect incident electromagnetic waves radiated from the associated environmental mapping emitter 108 toward one or more mirrors. That is, one or more optical fibers may redirect incident electromagnetic waves radiated from the associated environmental mapping emitter 108 toward one or more mirrors. One or more mirrors may be configured to redirect incident electromagnetic waves toward their respective target regions. That is, one or more mirrors may redirect incident electromagnetic waves toward their respective target regions. One or more optical fibers may be configured to redirect incident electromagnetic waves toward their respective target regions. That is, one or more optical fibers may redirect incident electromagnetic waves toward their respective target regions.

[0423] The aiming optical system 110 may include a diffractor. One or more of the aiming optical systems 110 may include a diffractor. Multiple aiming optical systems 110 may include a diffractor. Each aiming optical system 110 may include a diffractor. For example, one or more of the aiming optical systems 110 may include one or more diffraction gratings. One or more diffractors may be configured to diffract incident electromagnetic waves emitted from associated environmental mapping emitters 108 as they propagate toward their respective target regions. That is, one or more diffractors may diffract incident electromagnetic waves emitted from associated environmental mapping emitters 108 as they propagate toward their respective target regions.

[0424] The aiming optics 110 may include an optical splitter. One or more of the aiming optics 110 may include an optical splitter. Multiple aiming optics 110 may include an optical splitter. Each aiming optics 110 may include an optical splitter. The aiming optics 110 may include an optical filter. One or more of the aiming optics 110 may include an optical filter. Multiple aiming optics 110 may include an optical filter. Each aiming optics 110 may include an optical filter. The aiming optics 110 may include an optical switch. One or more of the aiming optics 110 may include an optical switch. Multiple aiming optics 110 may include an optical switch. Each aiming optics 110 may include an optical switch. The aiming optics 110 may include an optical transmitter. One or more of the aiming optics 110 may include an optical transmitter. Multiple aiming optical systems 110 may be equipped with optical transmitters. Each aiming optical system 110 may be equipped with an optical transmitter. Each aiming optical system 110 may be equipped with an optical disperser. One or more of the aiming optical systems 110 may be equipped with an optical disperser. Multiple aiming optical systems 110 may be equipped with optical dispersers. Each aiming optical system 110 may be equipped with an optical disperser.

[0425] In some embodiments, the aiming optical system 110 may comprise one or more refractors, reflectors, and diffractors. In some embodiments, one or more of the aiming optical systems 110 may comprise one or more refractors, reflectors, and diffractors. The aiming optical system 110 may comprise at least one of refractors, reflectors, and diffractors. The aiming optical system 110 may comprise a refractor and a reflector. The aiming optical system 110 may comprise a refractor and a diffractor. The aiming optical system 110 may comprise a reflector and a diffractor. The aiming optical system 110 may comprise a refractor, a reflector, and a diffractor.

[0426] The environmental mapping emitter 108 and its associated aiming optical system 110 can be considered as a single radiation unit. In other words, a radiation unit may comprise the environmental mapping emitter 108 and its associated aiming optical system 110. The mapping radiation system 107 can be said to comprise a radiation unit. The mapping radiation system 107 comprises one or more radiation units. The mapping radiation system 107 comprises multiple radiation units.

[0427] The environmental mapping emitter 108 and its associated aiming optics 110 can be mounted to each other; that is, the environmental mapping emitter 108 and its associated aiming optics 110 can be connected. The environmental mapping emitter 108 can be connected to its associated aiming optics 110. This may be a separable connection. This may be a permanent connection. The combined unit can be mounted to the body 114 of the radiation module 112 of the monitoring system 100, as described herein.

[0428] One or more of the radiation units may be in the form of lasers. One or more of the radiation units may be in the form of light-emitting diodes or other light-emitting components. In some embodiments, one or more of the aiming optics 110 may be considered to be the optics of a laser. That is, the aiming optics 110 may be the optics of a laser. Each environmental mapping emitter 108 may comprise an excitation mechanism (e.g., a flash lamp) and a laser medium (e.g., a laser medium such as a crystal). In other words, the environmental mapping emitter 108 may comprise a flash lamp and / or a laser medium. Each aiming optics 110 may comprise an optical resonator (e.g., a pair of opposing mirrors, one of which has a hole for the laser output).

[0429] It is understood that the aiming optics 110 may be optional. That is, in some embodiments, the monitoring system 100 does not have aiming optics 110 configured to direct the electromagnetic waves emitted by each environment mapping emitter 108 toward each target area of ​​the environment of the monitoring system 100. In such embodiments, one or more of the environment mapping emitters 108 are arranged so that the emitted electromagnetic waves propagate directly toward each target area. In some embodiments, one or more of the environment mapping emitters 108 may have an integrated optics. In such cases, a separate aiming optics 110 may not be necessary. Alternatively, the integrated optics of each environment mapping emitter 108 may be considered as the associated aiming optics 110.

[0430] The target region to which electromagnetic waves emitted from a particular environmental mapping emitter 108 are directed is the target region of that environmental mapping emitter 108. That is, the target region to which electromagnetic waves emitted by a particular environmental mapping emitter 108 are directed can be referred to as the target region associated with that target region. In this specification, it is understood that this applies whether the environmental mapping emitter 108 emits electromagnetic waves directly to the target region (i.e., without manipulation by the aiming optical system 110) or whether the electromagnetic waves are manipulated by the aiming optical system.

[0431] It is understood that the target region of at least one environment mapping emitter 108 may overlap with the target region of another environment mapping emitter 108. The target region of at least one environment mapping emitter 108 may partially overlap with the target region of another environment mapping emitter 108. The target region of at least one environment mapping emitter 108 may completely overlap with the target region of another environment mapping emitter 108. That is, the target region of at least one environment mapping emitter 108 may be the same as the target region of another environment mapping emitter 108.

[0432] The target region of at least one environmental mapping emitter 108 emitting electromagnetic waves having a first radiation profile may overlap with the target region of another environmental mapping emitter 108. The other environmental mapping emitter 108 may emitting electromagnetic waves having a second radiation profile. In other words, environmental mapping emitters can map common areas of the environment.

[0433] The target region of at least one environmental mapping emitter 108 emitting electromagnetic waves having a first radiation profile may differ from the target region of at least one environmental mapping emitter 108 emitting electromagnetic waves having a second radiation profile. In other words, the environmental mapping emitter 108 can map different parts of the environment.

[0434] The monitoring system 100 may include at least one pair of environmental mapping emitters 108. The monitoring system 100 may include multiple pairs of environmental mapping emitters 108. One environmental mapping emitter 108 in a pair may emit electromagnetic waves having a first radiation profile. The other environmental mapping emitter 108 in a pair may emit electromagnetic waves having a second radiation profile. The first radiation profile may be different from the second radiation profile. For example, the frequency at which the first environmental mapping emitter 108 emits electromagnetic waves may be different from the frequency at which the second environmental mapping emitter 108 emits electromagnetic waves. The target area of ​​the first environmental mapping emitter 108 may be the same as the target area of ​​the second environmental mapping emitter 108. That is, a pair of emitters 108 may target the same area of ​​the environment. Radiation module 112

[0435] Referring to Figures 1-16, the monitoring system 100 includes a radiation module 112. The monitoring system 100 includes one or more radiation modules 112. The illustrated monitoring system 100 includes multiple radiation modules 112. The environmental mapping system 106 includes a radiation module 112. In particular, the mapping radiation system 107 includes a radiation module 112.

[0436] The illustrated environmental mapping system 106 comprises a plurality of radiating modules 112. Specifically, the environmental mapping system 106 comprises six radiating modules 112. However, it is understood that in some embodiments, the environmental mapping system 106 may comprise a different number of radiating modules 112. For example, the environmental mapping system 106 comprises one, two, three, four, five, six, seven, eight, nine, ten, or more radiating modules 112. One or more of the radiating modules 112 may be in the form of printed circuit boards. One or more of the radiating modules 112 comprise their respective printed circuit boards.

[0437] The radiation module 112 comprises a body 114. One or more radiation modules 112 comprise a body 114. Multiple radiation modules 112 each comprise a body 114. In the illustrated embodiment, each radiation module 112 comprises a body 114. The body 114 may be in the form of a base of a printed circuit board.

[0438] A radiation module 112 comprises a subset of environmental mapping emitters 108. One or more radiation modules 112 comprise a subset of environmental mapping emitters 108. Multiple radiation modules 112 each comprise a subset of environmental mapping emitters 108. In the illustrated embodiment, each radiation module 112 comprises a subset of environmental mapping emitters 108. One or more environmental mapping emitters 108 from each subset of environmental mapping emitters 108 are mounted on their respective bodies 114. Each environmental mapping emitter 108 from each subset of environmental mapping emitters 108 is mounted on its respective body 114. In other words, each environmental mapping emitter 108 from each subset of environmental mapping emitters 108 is mounted on the respective body 114 of the associated radiation module 112.

[0439] A radiation module 112 comprises a subset of the aiming optics 110. One or more radiation modules 112 comprise a subset of the aiming optics 110. Multiple radiation modules 112 each comprise a subset of the aiming optics 110. In the illustrated embodiment, each radiation module 112 comprises a subset of the aiming optics 110. The aiming optics 110 are mounted on the body 114 of each radiation module 112. One or more aiming optics 110 of each subset of the aiming optics 110 are mounted on the body 114 of each radiation module 112. Multiple aiming optics 110 of each subset of the aiming optics 110 are mounted on the body 114 of each radiation module 112. In the illustrated embodiment, each aiming optics 110 of each subset of the aiming optics 110 are mounted on the body 114 of each radiation module 112. Each subset of the aiming optical system 110 is associated with the corresponding subset of the environment mapping emitter 108.

[0440] As described herein, each aiming optical system 110 in each subset of the aiming optical system 110 is configured to redirect electromagnetic waves. In particular, each aiming optical system 110 in each subset of the aiming optical system 110 is configured to direct electromagnetic waves toward their respective target regions by redirecting electromagnetic waves emitted from each environment mapping emitter 108 in each subset of the environment mapping emitters 108.

[0441] The environmental mapping system 106 comprises a first radiating module 112A. The first radiating module 112A comprises a first body 114A. The first body 114A is in the form of a printed circuit board base. The first radiating module 112A comprises a first subset 108A of environmental mapping emitters 108 (see Figure 1). The first subset 108A of environmental mapping emitters 108 comprises four environmental mapping emitters 108. Each environmental mapping emitter 108 of the first subset 108A of environmental mapping emitters 108 is mounted on the first body 114A. In other words, the environmental mapping emitters 108 of the first subset 108A of environmental mapping emitters 108 are mounted on the first body 114A. It is understood that these mountings may be direct (for example, the environmental mapping emitter 108 may be directly soldered to a connection on the first body 114A). Alternatively, these mountings may be indirect (for example, the environmental mapping emitter 108 may be removably mounted to one or more mounting components directly mounted to the first body 114A, for example, by solder connections). The environmental mapping emitters 108 of the first subset 108A of the environmental mapping emitter 108 are mounted on the first body 114A so as to be coplanar. The environmental mapping emitters 108 of the first subset 108A of the environmental mapping emitter 108 are mounted on the first body 114A so as to be coaxial. Alternatively, the environmental mapping emitters 108 of the first subset 108A of the environmental mapping emitter 108 may be mounted on the second body 114 at irregular positions.

[0442] The first radiation module 112A comprises a first subset 110A of the aiming optics 110. Each aiming optics 110 of the first subset 110A of the aiming optics 110 is mounted on the first body 114A. Each aiming optics 110 of the first subset 110A of the aiming optics 110 is configured to redirect electromagnetic waves. In particular, each aiming optics 110 of the first subset 110A of the aiming optics 110 is configured to redirect electromagnetic waves emitted from each of the environment mapping emitters 108 of the first subset 108A of the environment mapping emitters 108. That is, each aiming optics 110 of the first subset 110A of the aiming optics 110 redirects electromagnetic waves emitted from each of the environment mapping emitters 108 of the first subset 108A of the environment mapping emitters 108. Each aiming optical system 110 in the first subset 110A of the aiming optical system 110 is configured to redirect electromagnetic waves emitted from each of the environment mapping emitters 108 in the first subset 108A of the environment mapping emitters 108 toward their respective target regions. The target regions can be independent of each other; that is, each target region may be a different environment region. In some embodiments, there is an overlap of target regions; that is, a portion of the first target region may overlap with a portion of the second target region. In other words, a portion of the first target region may also be a portion of the second target region.

[0443] The outer surface 116A of the first body 114A defines at least a portion of the first plane. In other words, the outer surface 116A of the first body 114A is planar. The aiming optics 110 of the first subset 110A of the aiming optics 110 are configured to direct electromagnetic waves emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the first plane. That is, the aiming optics 110 of the first subset 110A of the aiming optics 110 direct electromagnetic waves emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the first plane. One or more of the aiming optics 110 of the first subset 110A of the aiming optics 110 are configured to direct electromagnetic waves emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the first plane. In the illustrated embodiment, each aiming optical system 110 in the first subset 110A of the aiming optical system 110 is configured to direct electromagnetic waves emitted from an associated environment mapping emitter 108 in one or more directions that are transverse to a first plane.

[0444] Throughout this specification, the term “transverse” may be interpreted as “non-parallel.” That is, if a line is not parallel to a plane, then that line is transverse to the plane. In such a case, the line intersects the plane at one point. Similarly, if a first plane and a second plane intersect, then the first plane can be said to be transverse to the second plane. Such planes may intersect at any angle greater than 0° and are still considered transverse. In other words, if a first plane and a second plane are non-parallel, then the first plane is transverse to the second plane.

[0445] The environmental mapping emitters 108 of the first subset 108A of the environmental mapping emitters 108 are mounted on the first body 114A so as to be coaxial. The environmental mapping emitters 108 of the first subset 108A of the environmental mapping emitters 108 are mounted on the first body 114A so as to be coplanar.

[0446] The environmental mapping system 106 comprises a second radiating module 112B. The second radiating module 112B comprises a second body 114B. The second body 114B is in the form of a printed circuit board base. The second radiating module 112B comprises a second subset 108B of environmental mapping emitters 108 (see Figure 1). Each environmental mapping emitter 108 of the second subset 108B of environmental mapping emitters 108 is mounted on the second body 114B. In other words, the environmental mapping emitters 108 of the second subset 108B of environmental mapping emitters 108 are mounted on the first body 114A. It is understood that this mounting may be direct (for example, the environmental mapping emitters 108 may be directly soldered to connections on the second body 114B). Alternatively, this mounting may be indirect (for example, the environmental mapping emitter 108 may be removably mounted to one or more mounting components directly attached to the second body 114B, for example, by solder connections). The environmental mapping emitters 108 of the second subset 108B of the environmental mapping emitter 108 are mounted to the second body 114B so as to be coplanar. The environmental mapping emitters 108 of the second subset 108B of the environmental mapping emitter 108 are mounted to the second body 114B so as to be coaxial. Alternatively, the environmental mapping emitters 108 of the second subset 108B of the environmental mapping emitter 108 may be mounted to the second body 114B at irregular positions.

[0447] The second radiation module 112B comprises a second subset 110B of the aiming optics 110. Each aiming optics 110 of the second subset 110B of the aiming optics 110 is mounted on the second body 114B. Each aiming optics 110 of the second subset 110B of the aiming optics 110 is configured to redirect electromagnetic waves. In particular, each aiming optics 110 of the second subset 110B of the aiming optics 110 is configured to redirect electromagnetic waves emitted from each of the environment mapping emitters 108 of the second subset 108B of the environment mapping emitters 108. That is, each aiming optics 110 of the second subset 110B of the aiming optics 110 redirects electromagnetic waves emitted from each of the environment mapping emitters 108 of the second subset 108B of the environment mapping emitters 108. Each aiming optical system 110 in the second subset 110B of the aiming optical system 110 is configured to redirect electromagnetic waves emitted from each environment mapping emitter 108 in the second subset 108B of the environment mapping emitter 108 toward its respective target region. The target regions can be independent of each other; that is, each target region may be a different environment region. In some embodiments, there is an overlap of target regions; that is, a portion of the first target region may overlap with a portion of the second target region. In other words, a portion of the first target region may also be a portion of the second target region.

[0448] The target area associated with the second radiating module 112B may have one or more portions in common with the target area associated with the first radiating module 112A. In other words, there may be overlap between the environmental area targeted by the second radiating module 112B and the environmental area targeted by the first radiating module 112A. However, it is understood that within the environment of the monitoring system 100, the target area of ​​the second radiating module 112B may include a region different from the target area associated with the first radiating module 112A. That is, at least a portion of the environmental area of ​​the monitoring system 100 targeted by the second radiating module 112B is different from the region targeted by the first radiating module 112A.

[0449] The outer surface 116B of the second body 114B defines at least a portion of the second plane. In other words, the outer surface of the second body 114B is planar. The aiming optics 110 of the second subset 110B of the aiming optics 110 are configured to direct electromagnetic waves emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the second plane. That is, the aiming optics 110 of the second subset 110B of the aiming optics 110 direct electromagnetic waves emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the second plane. One or more of the aiming optics 110 of the second subset 110B of the aiming optics 110 are configured to direct electromagnetic waves emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the second plane. In the illustrated embodiment, each aiming optical system 110 in the second subset 110B of the aiming optical system 110 is configured to direct electromagnetic waves emitted from an associated environmental mapping emitter 108 in one or more directions that are transverse to a second plane. The first plane is transverse to the second plane.

[0450] The environmental mapping emitters 108 of the second subset 108B of the environmental mapping emitter 108 are mounted on the second body 114B so as to be coaxial. The environmental mapping emitters 108 of the second subset 108B of the environmental mapping emitter 108 are mounted on the second body 114B so as to be coplanar. The environmental mapping emitters 108 of the second subset 108B of the environmental mapping emitter 108 may be mounted on the second body 114B in a different manner.

[0451] The first radiating module 112A is offset radially from the axial axis of the monitoring system 100. The axial axis may correspond to the optical axis 174. The optical axis 174 may be the axial axis of the monitoring system 100. The first radiating module 112A is offset radially from the axial axis of the monitoring system 100 along a plane perpendicular to the optical axis 174. The second radiating module 112B is offset radially from the axial axis of the monitoring system 100. The second radiating module 112B is offset radially from the axial axis of the monitoring system 100 along a plane perpendicular to the optical axis 174. The first radiating module 112A and the second radiating module 112B are offset by the same amount from the axial axis of the monitoring system 100. That is, when measured in their respective radial directions perpendicular to the axial axis, they are at the same distance from the axial axis. Depth testing system 122

[0452] Referring to Figures 8-13, the monitoring system 100 includes a depth test system 122. In particular, the radiation system 106 includes a depth test system 122. The depth test system 122 is configured to emit electromagnetic waves. That is, the depth test system 122 emits electromagnetic waves. The depth test system 122 includes depth test emitters 124. The depth test system 122 includes one or more depth test emitters 124. The illustrated depth test system 122 includes multiple depth test emitters 124.

[0453] The depth test emitter 124 is configured to emit electromagnetic waves. The depth test emitter 124 emits electromagnetic waves. One or more depth test emitters 124 are configured to emit electromagnetic waves. One or more depth test emitters 124 emit electromagnetic waves. Multiple depth test emitters 124 are configured to emit electromagnetic waves. Multiple depth test emitters 124 emit electromagnetic waves. In the illustrated embodiment, each depth test emitter 124 is configured to emit electromagnetic waves; that is, each depth test emitter 124 emits electromagnetic waves. When energized, the depth test emitter 124 emits electromagnetic waves; that is, when activated, the depth test emitter 124 emits electromagnetic waves.

[0454] The depth test system 122 comprises a depth test optical system 126. The depth test optical system 126 is configured to manipulate electromagnetic waves. The depth test optical system 126 manipulates electromagnetic waves. In particular, the depth test optical system 126 introduces an optical delay. The optical delay is the delay between the time the incident electromagnetic wave encounters the depth test optical system 126 and the time the incident electromagnetic wave is radiated. The depth test optical system 126 is configured to direct the incident electromagnetic wave along its length. The depth test optical system 126 directs the incident electromagnetic wave along its length. This takes time. Therefore, in some embodiments, a time delay is introduced by the depth test optical system 126 that directs the incident electromagnetic wave along its length. The depth test system 122 comprises one or more depth test optical systems 126. The depth test optical system 126 is configured to manipulate electromagnetic waves. The depth test optical system 126 manipulates electromagnetic waves. One or more of the depth test optical systems 126 are configured to direct incident electromagnetic waves along their length. One or more of the depth test optical systems 126 radiate incident electromagnetic waves along their length. The depth test system 122 comprises a plurality of depth test optical systems 126. Each depth test optical system 126 is configured to direct incident electromagnetic waves along its length. That is, each depth test optical system directs incident electromagnetic waves along its length. Depth test emitter 124

[0455] The depth test emitter 124 is configured to emit electromagnetic waves within a frequency range. That is, the depth test emitter 124 emits electromagnetic waves within a frequency range. One or more depth test emitters 124 are configured to emit electromagnetic waves within a frequency range. One or more depth test emitters 124 emit electromagnetic waves within a frequency range. Multiple depth test emitters 124 are configured to emit electromagnetic waves within a frequency range. That is, multiple depth test emitters 124 emit electromagnetic waves within a frequency range. In the illustrated embodiment, each of the depth test emitters 124 is configured to emit electromagnetic waves within a frequency range. That is, each of the depth test emitters 124 emits electromagnetic waves within a frequency range.

[0456] The frequency range may be referred to as the depth test frequency range. In particular, one or more depth test emitters 124 are configured to emit electromagnetic waves within a frequency range from a lower frequency threshold to an upper frequency threshold. That is, the frequency range extends between the lower frequency threshold and the upper frequency threshold. It is understood that the lower frequency threshold and / or upper frequency threshold may correspond to the point where the intensity of the emitted electromagnetic waves falls below an intensity threshold.

[0457] One or more frequency ranges of the depth test emitter 124 may include 450 nm. One or more frequency ranges of the depth test emitter 124 may include 940 nm. One or more frequency ranges of the depth test emitter 124 may include one or more of 200 nm, 250 nm, 300 nm, 400 nm, 450 nm, 500 nm, 550 nm, 600 nm, 650 nm, 700 nm, 750 nm, 800 nm, 850 nm, 900 nm, 950 nm, 1000 nm, 1100 nm, 1200 nm, 1300 nm, 1400 nm, 1500 nm, 1600 nm, 1700 nm, 1800 nm, 1900 nm, and 2000 nm. In some embodiments, the depth test emitter 124 is configured to emit electromagnetic waves having wavelengths of 200 nm to 3000 nm. In some embodiments, the depth test emitter 124 is configured to emit electromagnetic waves having wavelengths of 400 nm to 1000 nm. In some embodiments, the depth test emitter 124 is configured to emit electromagnetic waves having wavelengths of 900 nm to 1000 nm. In some embodiments, the depth test emitter 124 is configured to emit electromagnetic waves having wavelengths of 300 nm to 2000 nm.

[0458] In some embodiments, one or more frequency ranges of depth test emitters 124 differ from the frequency ranges of other depth test emitters 124. That is, a first depth test emitter 124 may emit electromagnetic waves within a first frequency range. A second depth test emitter 124 may emit electromagnetic waves within a second frequency range. The second frequency range may differ from the first frequency range. The first frequency range may overlap with the second frequency range.

[0459] Each depth test emitter 124 is configured to emit electromagnetic waves in its respective radiation direction. That is, each depth test emitter 124 emits electromagnetic waves in its respective radiation direction. Each depth test emitter 124 is configured to emit electromagnetic waves in its respective radiation direction. That is, each depth test emitter 124 emits electromagnetic waves in its respective radiation direction. The radiation direction of each depth test emitter 124 can be determined at least in part by the configuration in which the depth test emitter 124 is attached to another component of the monitoring system 100. One or more of the depth test emitters 124 are in the form of lasers. One or more of the depth test emitters 124 may be in the form of light-emitting diodes or other light-emitting components.

[0460] The illustrated monitoring system 100 comprises four depth test emitters 124. However, it is understood that in some embodiments, the monitoring system 100 may comprise a different number of depth test emitters 124. For example, the monitoring system 100 may comprise any number of depth test emitters 124 between 1 and 10. Alternatively, the monitoring system 100 may comprise more than 10 depth test emitters 124. The monitoring system 100 may comprise 1, 2, 3, 5, 6, 7, 8, 9, or 10 depth test emitters 124. The number of depth test emitters 124 may be a power of 2. The number of depth test emitters 124 may be a multiple of 2. Depth test optical system 126

[0461] The monitoring system 100 includes depth test optics 126. The monitoring system 100 includes one or more depth test optics 126. The illustrated monitoring system 100 includes multiple depth test optics 126. The depth test system 122 includes depth test optics 126. In particular, the depth test system 122 includes a depth test optics 126 for each depth test emitter 124. In other words, the number of depth test optics 126 is the same as the number of depth test emitters 124. One or more depth test optics 126 are associated with each depth test emitter 124. In the illustrated configuration, each depth test optics 126 is associated with each depth test emitter 124.

[0462] Each depth test emitter 124 is configured to emit electromagnetic waves to each depth test optical system 126. That is, each depth test emitter 124 emits electromagnetic waves to each depth test optical system 126. One or more depth test emitters 124 are configured to emit electromagnetic waves to each depth test optical system 126. That is, one or more depth test emitters 124 emit electromagnetic waves to each depth test optical system 126. A depth test optical system 126 from which a particular depth test emitter 124 emits electromagnetic waves can be considered the depth test optical system 126 associated with that particular depth test emitter 124. In other words, one or more depth test emitters 124 are configured to emit electromagnetic waves to their associated depth test optical system 126. Multiple depth test emitters 124 are configured to emit electromagnetic waves to each depth test optical system 126. In the illustrated embodiment, each depth test emitter 124 is configured to emit electromagnetic waves to the associated depth test optical system 126. That is, each depth test emitter 124 emits electromagnetic waves to the associated depth test optical system 126.

[0463] The depth test optical system 126 includes an incident end 128. One or more depth test optical systems 126 include an incident end 128 (see Figure 12). Multiple depth test optical systems 126 each include an incident end 128. The incident end 128 constitutes the incident end of the depth test optical system 126. In the illustrated embodiment, each depth test optical system 126 includes an incident end 128. The depth test optical system 126 includes a radial end 130. One or more depth test optical systems 126 include a radial end 130 (see Figure 10). Multiple depth test optical systems 126 each include a radial end 130. The radial end 130 constitutes the radial end of the depth test optical system 126. In the illustrated embodiment, each depth test optical system 126 includes a radial end 130.

[0464] Each depth test optical system 126 extends from its incident end 128 or its radial end 130. One or more depth test optical systems 126 extend from their incident end 128 to their radial end 130. Multiple depth test optical systems 126 extend from their incident end 128 to their radial end 130. In the illustrated embodiment, each depth test optical system 126 extends from its incident end 128 to its radial end 130. That is, each depth test optical system 126 extends from its incident end 128 to its radial end 130. The incident end 128 and radial end 130 of each depth test optical system 126 are separated by the length of each depth test optical system 126. That is, the length of a depth test optical system 126 is the distance between its incident end and radial end. The length of multiple depth test optical systems 126 is the distance between the incident end and radial end of each depth test optical system 126.

[0465] A depth test emitter 124 is configured to emit electromagnetic waves to the incident end 128 of the associated depth test optical system. The depth test emitter 124 emits electromagnetic waves to the incident end 128 of the associated depth test optical system. One or more depth test emitters 124 are configured to emit electromagnetic waves to the incident end 128 of the associated depth test optical system 126. One or more depth test emitters 124 emit electromagnetic waves to the incident end 128 of the associated depth test optical system 126. Multiple depth test emitters 124 are configured to emit electromagnetic waves to the incident end 128 of the associated depth test optical system 126. Multiple depth test emitters 124 emit electromagnetic waves to the incident end 128 of the associated depth test optical system 126. In the illustrated embodiment, each depth test emitter 124 is configured to emit electromagnetic waves to the incident end 128 of the associated depth test optical system 126.

[0466] The depth test optics 126 are configured to direct electromagnetic waves. The depth test optics 126 direct electromagnetic waves. One or more of the depth test optics 126 are configured to direct electromagnetic waves. One or more of the depth test optics 126 direct electromagnetic waves. In particular, one or more of the depth test optics 126 are configured to direct at least a portion of the electromagnetic waves emitted at their incident end 128 by the associated depth test emitter 124 along their length. That is, one or more of the depth test optics 126 direct at least a portion of the electromagnetic waves emitted at their incident end 128 by the associated depth test emitter 124 along their length. In the illustrated embodiment, each depth test optics 126 is configured to direct at least a portion of the electromagnetic waves emitted at its incident end 128 by the associated depth test emitter 124 along its length. In other words, each depth test optical system 126 directs at least a portion of the electromagnetic waves radiated from its incident end 128 by the associated depth test emitter 124 along its length. The depth test optical system 126 is configured to radiate at least a portion of the electromagnetic waves directed along its length from its radiating end 130. The depth test optical system 126 radiates at least a portion of the electromagnetic waves directed along its length from its radiating end 130. One or more depth test optical systems 126 are configured to radiate at least a portion of the electromagnetic waves directed along their length from their radiating end 130. One or more depth test optical systems 126 radiate at least a portion of the electromagnetic waves directed along their length from their radiating end 130. Multiple depth test optical systems 126 are configured to radiate at least a portion of the electromagnetic waves directed along their lengths from their respective radiating ends 130. Multiple depth test optics 126 radiate at least a portion of electromagnetic waves oriented along their lengths from their respective radiating ends 130. In the illustrated embodiment, each depth test optics 126 is configured to radiate at least a portion of electromagnetic waves oriented along its length from its radiating end 130.In other words, each depth test optical system 126 emits at least a portion of electromagnetic waves directed along its length from its radiating end 130.

[0467] The depth test optical system 126 comprises a depth test refractor. One or more depth test optical systems 126 comprise a depth test refractor. Multiple depth test optical systems 126 comprise depth test refractors. In the illustrated embodiment, each of the depth test optical systems 126 comprises a depth test refractor. The depth test refractor may be in the form of a prism. The depth test refractor may be in the form of a lens. The depth test refractor may be in the form of an optical fiber. One or more depth test optical systems 126 may comprise multiple refractors (e.g., one or more prisms, one or more lenses, and / or one or more optical fibers).

[0468] The depth test optical system 126 may include depth test reflectors. One or more depth test optical systems 126 may include depth test reflectors. Multiple depth test optical systems 126 may include depth test reflectors. For example, one or more depth test optical systems 126 may include one or more mirrors and / or optical fibers configured to completely internally reflect incident electromagnetic waves. One or more mirrors may be configured to redirect incident electromagnetic waves radiated from an associated depth test emitter 124.

[0469] The depth test optical system 126 may include a depth test diffractometer. One or more depth test optical systems 126 may include a depth test diffractometer. Multiple depth test optical systems 126 may include depth test diffractometers. For example, one or more depth test optical systems 126 may include one or more diffraction gratings. One or more diffractometers may be configured to diffract incident electromagnetic waves emitted from the associated depth test emitter 124.

[0470] The illustrated depth test optical system 126 comprises optical fibers 132. Specifically, each illustrated depth test optical system 126 comprises an optical fiber 132. Each optical fiber 132 extends from its respective incident end 128 to its radiating end 130. The length of the optical fiber 132 is the distance between its incident end 128 and its radiating end 130. The incident end 128 of the optical fiber 132 comprises an incident end. The incident end is the first end of the optical fiber 132. The radiating end 130 comprises a radiating end. The radiating end is the second end of the optical fiber 132. The length of the optical fiber 132 is the distance between its incident end and its radiating end when measured along the longitudinal length of the optical fiber 132. It is understood that the optical fibers 132 may be curved along their length. In such cases, the length of the optical fiber 132 is the distance between its incident end and its radiating end when measured along the curved length of the optical fiber 132. In other words, the path along which the measurement is performed curves along with the optical fiber 132.

[0471] Each optical fiber 132 is configured to completely internally reflect at least a portion of the electromagnetic waves radiated to its incident end 128 by the associated depth test emitter 124 along its length. In other words, each optical fiber 132 completely internally reflects at least a portion of the electromagnetic waves radiated to its incident end 128 by the associated depth test emitter 124 along its length. In the illustrated embodiment, each optical fiber 132 is configured to completely internally reflect at least a portion of the electromagnetic waves radiated to its incident end 128 by the associated depth test emitter 124 along its length. In other words, each optical fiber 132 completely internally reflects at least a portion of the electromagnetic waves radiated to its incident end 128 by the associated depth test emitter 124 along its length. Furthermore, each optical fiber 132 is configured to emit at least a portion of the completely internally reflected electromagnetic waves from its radiating end 130. In other words, each optical fiber 132 emits at least a portion of the completely internally reflected electromagnetic waves from its radiating end 130. It is understood that some of the electromagnetic waves that are completely internally reflected toward the incident end 128 may be lost along the length of the optical fiber 132 due to inefficiencies (e.g., leakage).

[0472] One or more lengths of the depth test optical system 126 differ from one or more lengths of the other depth test optical systems 126. In the illustrated embodiment, each of the optical fibers 132 has a different length. One or more lengths of the optical fibers 132 are multiples of the lengths of the other one or more optical fibers 132.

[0473] In particular, each of the multiple depth test optical systems 126 includes a first optical fiber 132A. Specifically, each of the first depth test optical systems 126 includes a first optical fiber 132A. The first optical fiber 132A has a first length. Each of the multiple depth test optical systems 126 includes a second optical fiber 132B. Specifically, each of the second depth test optical systems 126 includes a second optical fiber 132B. The second optical fiber 132B has a second length. The second length is a multiple of the first length. Each of the multiple depth test optical systems 126 includes a third optical fiber 132C. Specifically, each of the third depth test optical systems 126 includes a third optical fiber 132C. The third optical fiber 132C has a third length. The third length is a multiple of the first length. Each of the multiple depth test optical systems 126 includes a fourth optical fiber 132D. The fourth optical fiber 132D has a fourth length. The fourth length is a multiple of the first length.

[0474] The length of one or more depth test optical systems 126 is approximately 2m. The length of one or more optical fibers 132 is approximately 2m. The length of one or more depth test optical systems 126 is approximately 4m. The length of one or more optical fibers 132 is approximately 4m. The length of one or more depth test optical systems 126 is approximately 6m. The length of one or more optical fibers 132 is approximately 6m. The length of one or more depth test optical systems 126 is approximately 8m. The length of one or more optical fibers 132 is approximately 8m. In some embodiments, the length of one or more depth test optical systems 126 and / or the length of the depth test optical fibers 132 is approximately 1m, 2m, 3m, 4m, 5m, 6m, 7m, 8m, 9m, 10m, or 10m or more.

[0475] The depth test optical system 126 may be equipped with a depth test refractor. The depth test optical system 126 may be equipped with a depth test reflector. The depth test optical system 126 may be equipped with a depth test diffractor. The depth test optical system 126 may be equipped with a depth test optical splitter. One or more of the depth test optical systems 126 may be equipped with an optical splitter. Multiple depth test optical systems 126 may be equipped with an optical splitter. Each depth test optical system 126 may be equipped with an optical splitter. The depth test optical system 126 may be equipped with an optical filter. One or more of the depth test optical systems 126 may be equipped with an optical filter. Multiple depth test optical systems 126 may be equipped with an optical filter. Each depth test optical system 126 may be equipped with an optical filter. The depth test optical system 126 may be equipped with an optical switch. One or more of the depth test optical systems 126 may be equipped with an optical switch. Multiple depth test optical systems 126 may be equipped with optical switches. Each depth test optical system 126 may be equipped with an optical switch. Each depth test optical system 126 may be equipped with an optical transmitter. One or more depth test optical systems 126 may be equipped with an optical transmitter. Multiple depth test optical systems 126 may be equipped with optical transmitters. Each depth test optical system 126 may be equipped with an optical transmitter. One or more depth test optical systems 126 may be equipped with an optical disperser. Multiple depth test optical systems 126 may be equipped with an optical disperser. Each depth test optical system 126 may be equipped with an optical disperser. Depth Test Module 134

[0476] Referring to Figures 8, 13, and 14, the monitoring system 100 comprises a depth test module 134. The illustrated monitoring system 100 comprises one depth test module 134. However, it will be understood that in some embodiments, the monitoring system 100 may comprise multiple depth test modules 134 that are the same as or similar to the depth test module 134 described herein. That is, the monitoring system 100 may comprise multiple depth test modules. The depth test module 134 may be in the form of a printed circuit board. The depth test system 122 comprises a depth test module 134.

[0477] The depth test system 122 comprises a depth test system body 136. In particular, the depth test module 134 comprises the depth test system body 136. That is, the depth test system body 136 may be the body of the depth test module 134. The depth test system body 136 may be in the form of a base of a printed circuit board. The depth test emitter 124 is mounted on the depth test system body 136. The depth test system body 136 is oriented transversely to one or more of the radiation modules 112. The depth test system body 136 is oriented transversely to the first body 114A of the first radiation module 112A.

[0478] The depth test optical system 126 is configured to be connected to the associated depth test emitter 124. The depth test optical system 126 is connected to the associated depth test emitter 124. This connection may be a physical connection. This connection may be an optical connection. In other words, the depth test optical system 126 is optically connected to the associated depth test emitter. One or more depth test optical systems 126 are configured to be connected to the associated depth test emitter 124. One or more depth test optical systems 126 are connected to the associated depth test emitter 124. One or more depth test optical systems 126 are optically connected to the associated depth test emitter 124. Multiple depth test optical systems 126 are configured to be connected to their respective associated depth test emitters 124. Multiple depth test optical systems 126 are connected to their respective associated depth test emitters 124. Multiple depth test optics 126 are optically connected to associated depth test emitters 124. In the illustrated embodiment, each depth test optics 126 is configured to be connected to an associated depth test emitter 124. That is, each depth test optics 126 is connected to an associated depth test emitter 124. Each depth test optics 126 is optically connected to an associated depth test emitter 124.

[0479] In particular, each depth test optical system 126 is configured to be connected to an associated depth test emitter 124 such that the incident end 128 of each depth test optical system 126 faces the associated depth test emitter 124. Each depth test optical system 126 is connected to an associated depth test emitter 124 such that the incident end 128 of each depth test optical system 126 faces the associated depth test emitter 124. In other words, each depth test optical system 126 is mounted to an associated depth test emitter 124 such that the incident end 128 of each depth test optical system 126 faces the associated depth test emitter 124. The depth test optical system 126 can be mounted to an associated depth test emitter 124. The depth test optical system 126 can be mounted to another component of the monitoring system 100. In some embodiments, the depth test optical system 126 is mounted on an associated depth test emitter 124 such that the depth test optical system 126 and the associated depth test emitter 124 are in contact. That is, one or more depth test optical systems 126 are in contact with their respective associated depth test emitters 124.

[0480] The outer surface 138 of the depth test system body 136 (see Figure 13) defines at least a portion of the plane of the depth test system body. In other words, the outer surface 138 of the depth test system body 136 is planar. The outer surface 138 of the depth test system body 136 can be referred to as the surface of the depth test system body 136.

[0481] One or more of the depth test optical systems 126 extend from the depth test system body 136. In the illustrated embodiment, each of the depth test optical systems 126 extends from the depth test system body 136 in a direction transverse to the plane of the depth test system body. In particular, the optical fiber 132 extends perpendicular to the plane of the depth test system body. The optical fiber 132 extends from the depth test system body 136 in a direction perpendicular to the plane of the depth test system body 136.

[0482] The depth test optics 126 are curved along their length. That is, the optical fibers 132 are curved along their length. One or more of the depth test optics 126 are curved along their respective lengths. One or more of the optical fibers 132 are curved along their respective lengths. In the illustrated embodiment, the depth test optics 126 are curved to surround the internal region 140 of the monitoring system 100 (see Figures 9 and 12). In particular, the optical fibers 132 are curved to surround the internal region 140 of the monitoring system 100. The optical fibers 132 are curved to define the internal region 140. The internal region 140 is cylindrical in shape. One or more of the optical fibers 132 surround the internal region 140 of the monitoring system 100 a different number of times than another optical fiber 132. This is because one or more of the optical fibers 132 are longer than another optical fiber 132. In the illustrated embodiment, each depth test optical fiber 132 surrounds the internal region 140 of the radiation system a different number of times than each other depth test optical fiber 132.

[0483] The depth test system 122 comprises four depth test emitters 124. However, it is understood that in some embodiments, the depth test system 122 may have a different number of depth test emitters 124. For example, the depth test system 122 may have 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, or 10 or more depth test emitters 124. The depth test system 122 comprises four depth test optics 126. However, it is understood that in some embodiments, the depth test optics 122 may have a different number of depth test optics 126. For example, the depth test system 122 may have 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, or 10 or more depth test optics 126. The depth test system 122 comprises the same number of depth test emitters 124 and depth test optics 126. Planar Testing System 146

[0484] The monitoring system 100 includes a window 142 (see Figure 1). The window 142 is optically transparent to at least some electromagnetic waves. The window 142 may be opaque to some electromagnetic waves. That is, the window 142 functions to filter electromagnetic waves in a specific frequency band. The window 142 is configured to reflect at least some electromagnetic waves incident on its surface. Specifically, the window 142 reflects at least some electromagnetic waves incident on its inner surface. The window 142 may include a polarization switch. In such a configuration, the window 142 can selectively allow the simple transmission of polarized electromagnetic waves or rotate the polarized electromagnetic waves by a rotation angle (about the incident axis). The rotation angle may be 45°, 90°, or another angle.

[0485] The window 142 is mounted in a fixed position relative to the housing 102. In some embodiments, the window 142 is mounted on the housing 102. The window 142 is located at the front of the monitoring system 100. The window 142 is parallel to the front wall 104A of the housing 102. The window 142 is transparent to a certain range of electromagnetic waves. This range may be referred to as the first range. The window 142 is opaque to another range of electromagnetic waves. This range may be referred to as the second range. Although the illustrated embodiment has one window 142, it is understood that some embodiments may have multiple windows. For example, in some embodiments, the monitoring system 100 has multiple windows. Furthermore, although the illustrated window 142 is planar, it is understood that in some embodiments, the contour of the window 142 may have one or more curves. That is, the window 142 may be curved along one or more radii of curvature.

[0486] The monitoring system 100 includes an optical filter 144 (see Figure 26). The optical filter 144 is transparent to some electromagnetic waves. The optical filter 144 is opaque to other electromagnetic waves. The optical filter 144 is transparent to a certain range of electromagnetic waves. The optical filter 144 is opaque to another range of electromagnetic waves. In other words, the optical filter 144 is configured to filter out wavelengths within a specific range. The optical filter 144 may be a multibandpass optical filter. The window 142 may include the optical filter 144. The lens system 172 may include the optical filter 144. The optical filter 144 may include a polarization switch. In such a configuration, the optical filter 144 can selectively enable the simple transmission of polarized electromagnetic waves or rotate the polarized electromagnetic waves by a rotation angle (about the incident axis). The rotation angle may be 45°, 90°, or another angle.

[0487] The radiation system 106 includes a planar test system 146 (see Figure 8). The planar test system 146 is configured to enable testing of one or more features of the monitoring system 100. In the illustrated embodiment, the planar test system 146 enables testing of the physical features of the monitoring system 100. Specifically, the planar test system 146 enables testing of the presence of the window 142. The planar test system 146 also enables testing of the physical location and / or orientation of the window 142. The planar test system 146 enables testing of the operation of the sensing system 120. For example, the planar test system 146 enables testing of the functionality of the sensor module 170. Specifically, the planar test system 146 enables testing of the functionality of the row portion and / or column portion of the sensor module 170. The row portion and / or column portion comprises sensing units to be tested. The planar test system 146 enables testing of the lens system 172 under test.

[0488] The planar test system 146 is configured to emit electromagnetic waves. The planar test system 146 includes a planar test emitter 148. The planar test emitter 148 is configured to emit electromagnetic waves. The planar test emitter 148 emits electromagnetic waves. The planar test system 146 includes one or more planar test emitters 148. One or more planar test emitters 148 are configured to emit electromagnetic waves. One or more planar test emitters 148 emit electromagnetic waves. The illustrated planar test system 146 includes multiple planar test emitters 148. Multiple planar test emitters 148 are configured to emit electromagnetic waves. Multiple planar test emitters 148 emit electromagnetic waves. In the illustrated embodiment, each planar test emitter 148 emits electromagnetic waves. The planar test emitter 148 emits electromagnetic waves when energized. In other words, the planar test emitter 148 emits electromagnetic waves when activated.

[0489] The planar test emitter 148 is configured to emit electromagnetic waves. The planar test emitter 148 emits electromagnetic waves. One or more planar test emitters 148 are configured to emit electromagnetic waves. One or more planar test emitters 148 emit electromagnetic waves. Multiple planar test emitters 148 are configured to emit electromagnetic waves. Multiple planar test emitters 148 emit electromagnetic waves. Each planar test emitter 148 is configured to emit electromagnetic waves. Each planar test emitter 148 emits electromagnetic waves.

[0490] The planar test emitter 148 is configured to emit electromagnetic waves in each target portion of the window 142. In the illustrated embodiment, each planar test emitter 148 is configured to emit electromagnetic waves in each target portion of the window 142. That is, each planar test emitter 148 emits electromagnetic waves in each target portion of the window 142. In other words, the planar test target area of ​​each planar test emitter 148 is each target portion of the window 142. The planar test emitter 148 may be configured to emit electromagnetic waves directly in each target portion of the window 142. That is, the planar test emitter 148 may directly emit electromagnetic waves in each target portion of the window 142. Alternatively, the planar test emitter 148 may be configured to emit electromagnetic waves toward one or more optical systems that redirect the electromagnetic waves toward each target portion of the window 142. In other words, the planar test emitter 148 can emit electromagnetic waves toward one or more optical systems that redirect the electromagnetic waves toward each target portion of the window 142. Planar test emitter 148

[0491] The planar test emitter 148 is configured to emit electromagnetic waves within a frequency range. That is, the planar test emitter 148 emits electromagnetic waves within a frequency range. One or more of the planar test emitters 148 are configured to emit electromagnetic waves within a frequency range. One or more of the planar test emitters 148 emit electromagnetic waves within a frequency range. Multiple planar test emitters 148 are configured to emit electromagnetic waves within a frequency range. That is, multiple planar test emitters 148 emit electromagnetic waves within a frequency range. In the illustrated embodiment, each of the planar test emitters 148 is configured to emit electromagnetic waves within a frequency range. That is, each of the planar test emitters 148 emits electromagnetic waves within a frequency range.

[0492] The frequency range may be referred to as the planar test frequency range. In particular, one or more of the planar test emitters 148 are configured to emit electromagnetic waves within a frequency range from a lower frequency threshold to an upper frequency threshold. That is, the frequency range extends between the lower frequency threshold and the upper frequency threshold. It is understood that the lower frequency threshold and / or upper frequency threshold may correspond to the point where the intensity of the emitted electromagnetic waves falls below an intensity threshold.

[0493] One or more frequency ranges of the planar test emitter 148 may include 450 nm. One or more frequency ranges of the planar test emitter 148 may include 940 nm. One or more frequency ranges of the planar test emitter 148 may include one or more of 200 nm, 250 nm, 300 nm, 400 nm, 450 nm, 500 nm, 550 nm, 600 nm, 650 nm, 700 nm, 750 nm, 800 nm, 850 nm, 900 nm, 950 nm, 1000 nm, 1100 nm, 1200 nm, 1300 nm, 1400 nm, 1500 nm, 1600 nm, 1700 nm, 1800 nm, 1900 nm, and 2000 nm. In some embodiments, the planar test emitter 148 is configured to emit electromagnetic waves having wavelengths of 200 nm to 3000 nm. In some embodiments, the planar test emitter 148 is configured to emit electromagnetic waves having wavelengths of 400 nm to 1000 nm. In some embodiments, the planar test emitter 148 is configured to emit electromagnetic waves having wavelengths of 900 nm to 1000 nm. In some embodiments, the planar test emitter 148 is configured to emit electromagnetic waves having wavelengths of 300 nm to 2000 nm.

[0494] In some embodiments, one or more frequency ranges of a planar test emitter 148 differ from the frequency ranges of one or more other planar test emitters 148. That is, a first planar test emitter 148 may emit electromagnetic waves within a first frequency range. A second planar test emitter 148 may emit electromagnetic waves within a second frequency range. The second frequency range may differ from the first frequency range. The first frequency range may overlap with the second frequency range.

[0495] The frequency range of the planar test emitter 148 may be the same as the frequency range of the environmental mapping emitter 108. The frequency range of the planar test emitter 148 may be the same as the frequency range of the depth test emitter 124. The frequency range of multiple planar test emitters 148 may be the same as one or more frequency ranges of the environmental mapping emitter 108. The frequency range of multiple planar test emitters 148 may be the same as one or more frequency ranges of the depth test emitter 124. The frequency range of the planar test emitter 148 may be different from the frequency range of the environmental mapping emitter 108. The frequency range of the planar test emitter 148 may be different from the frequency range of the depth test emitter 124. The frequency range of multiple planar test emitters 148 may be different from one or more frequency ranges of the environmental mapping emitter 108. The frequency ranges of the multiple planar test emitters 148 may differ from one or more frequency ranges of the depth test emitter 124.

[0496] Each planar test emitter 148 is configured to emit electromagnetic waves in its respective radiation direction. That is, each planar test emitter 148 emits electromagnetic waves in its respective radiation direction. Each planar test emitter 148 is configured to emit electromagnetic waves in its respective radiation direction. That is, each planar test emitter 148 emits electromagnetic waves in its respective radiation direction. The radiation direction of each planar test emitter 148 can be determined at least in part by the configuration in which the planar test emitter 148 is attached to another component of the monitoring system 100. One or more of the planar test emitters 148 are in the form of lasers. One or more of the planar test emitters 148 may be in the form of light-emitting diodes or other light-emitting components.

[0497] The illustrated embodiment includes 16 planar test emitters 148. However, it is understood that some embodiments may include a different number of planar test emitters 148. For example, some embodiments may have 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, or 16 planar test emitters 148. Some embodiments may have more than 16 planar test emitters 148. The number of planar test emitters 148 may be a power of 2. The number of planar test emitters 148 may be a multiple of 2. Planar test optical system 150

[0498] The monitoring system 100 may include a planar test optical system 150. The planar test optical system 150 is configured to manipulate electromagnetic waves. The planar test optical system 150 manipulates electromagnetic waves. The planar test system 146 may include a planar test optical system 150. In some embodiments, the planar test system 146 includes one or more planar test optical systems 150. The planar test optical system 150 is configured to manipulate electromagnetic waves. The planar test optical system 150 manipulates electromagnetic waves. The monitoring system 100 may include multiple planar test optical systems 150. The radiation system 106 may include a planar test optical system 150. In particular, the monitoring system 100 may include a planar test optical system 150 for each planar test emitter 148. That is, one or more planar test optical systems 150 may be associated with each planar test emitter 148. In some embodiments, each planar test optical system 150 may be associated with each planar test emitter 148.

[0499] Each planar test emitter 148 is configured to emit electromagnetic waves to each planar test optical system 150. That is, each planar test emitter 148 emits electromagnetic waves to each planar test optical system 150. One or more planar test emitters 148 are configured to emit electromagnetic waves to each planar test optical system 150. That is, one or more planar test emitters 148 emit electromagnetic waves to each planar test optical system 150. A planar test optical system 150 from which a particular planar test emitter 148 emits electromagnetic waves can be considered to be the planar test optical system 150 associated with that particular planar test emitter 148. In other words, one or more planar test emitters 148 are configured to emit electromagnetic waves to the associated planar test optical system 150. Multiple planar test emitters 148 may be configured to emit electromagnetic waves to each planar test optical system 150. In the illustrated embodiment, each planar test emitter 148 is configured to emit electromagnetic waves into the associated planar test optical system 150. That is, each planar test emitter 148 emits electromagnetic waves into the associated planar test optical system 150.

[0500] The planar test optical system 150 is configured to direct electromagnetic waves. That is, the planar test optical system 150 directs incident electromagnetic waves. One or more of the planar test optical systems 150 are configured to direct electromagnetic waves. That is, one or more of the planar test optical systems 150 direct electromagnetic waves.

[0501] The planar test optical system 150 is configured to direct electromagnetic waves irradiated by the associated planar test emitter 148 toward the planar test area. The planar test area is the area of ​​the monitoring system 100. The planar test area is an area on the surface of the monitoring system 100. The planar test area may be on the sensor module of the monitoring system 100. The planar test optical system 150 may direct electromagnetic waves irradiated by the associated planar test emitter 148 toward the sensor module. The planar test optical system 150 may directly radiate electromagnetic waves toward the sensor module so that the electromagnetic waves encounter the sensor module without further manipulation. Alternatively, the planar test area may be the area of ​​the lens system of the monitoring system 100. That is, the planar test optical system 150 may direct electromagnetic waves irradiated by the associated planar test emitter 148 toward the lens system. The lens system may manipulate the electromagnetic waves before they encounter the sensor module. This function is described with reference to the planar test optical system 150, but it should be understood that the function of multiple planar test optical systems 150 may be the same.

[0502] In the illustrated embodiments, one or more of the planar test optical systems 150 are configured to direct electromagnetic waves emitted by an associated planar test emitter 148 toward each target portion of the window 142. That is, the planar test target area may be on the window 142. One or more of the planar test optical systems 150 direct electromagnetic waves emitted by an associated planar test emitter 148 toward each target portion of the window 142. In some embodiments, each planar test optical system 150 is configured to direct electromagnetic waves emitted by an associated planar test emitter 148 toward each target portion of the window 142. That is, each planar test optical system 150 directs electromagnetic waves emitted by an associated planar test emitter 148 toward each target portion of the window 142.

[0503] The planar test optical system 150 comprises a planar test refractor. One or more of the planar test optical systems 150 comprises a planar test refractor. Multiple planar test optical systems 150 comprise a planar test refractor. In the illustrated embodiment, each planar test optical system 150 comprises a planar test refractor. The planar test refractor may be configured to refract the incident electromagnetic wave, thereby directing the incident electromagnetic wave radiated from the associated planar test emitter 148 toward each target portion of the window 142. That is, the planar test refractor can change the direction of propagation of the electromagnetic wave by redirecting the incident electromagnetic wave by refracting the electromagnetic wave. The planar test refractor may be in the form of a prism. The planar test refractor may be in the form of a lens. The planar test refractor may be in the form of an optical fiber. One or more of the planar test optical systems 150 may comprise multiple refractors (e.g., one or more prisms, one or more lenses, and / or one or more optical fibers).

[0504] The planar test optical system 150 may include a planar test reflector. One or more of the planar test optical systems 150 may include a planar test reflector. Multiple planar test optical systems 150 may include a planar test reflector. For example, one or more of the aiming optical systems 110 may include one or more mirrors and / or optical fibers configured to completely internally reflect incident electromagnetic waves. One or more mirrors may be configured to redirect incident electromagnetic waves radiated from the associated planar test emitter 148 toward each target portion of the window 142.

[0505] The planar test optical system 150 may include a planar test diffractometer. One or more of the planar test optical systems 150 may include a planar test diffractometer. Multiple planar test optical systems 150 may include a planar test diffractometer. For example, one or more of the planar test optical systems 150 may include one or more diffraction gratings. One or more diffractometers may be configured to diffract incident electromagnetic waves emitted from the associated planar test emitter 148.

[0506] In some embodiments, the planar test emitter 148 and its associated planar test optics 150 (if any) may be considered as a single planar test radiation unit. For example, the planar test emitter 148 and its associated planar test optics 150 may be mounted to each other, and the combined unit may be mounted to the body 154 of the planar test radiation module 152. One or more of the radiation units may be in the form of lasers. One or more of the radiation units may be in the form of light-emitting diodes or other light-emitting components. In some embodiments, one or more of the planar test optics 150 may be considered as the optics of a laser. That is, each planar test emitter 148 may comprise an excitation mechanism (e.g., a flash lamp) and a laser medium (e.g., a laser medium such as a crystal). Each planar test optics 150 may comprise an optical resonator (e.g., a pair of opposing mirrors, one of which has a hole for the laser output).

[0507] The planar test optical system 150 may be equipped with an optical splitter. One or more of the planar test optical systems 150 may be equipped with an optical splitter. Multiple planar test optical systems 150 may be equipped with an optical splitter. Each planar test optical system 150 may be equipped with an optical splitter. The planar test optical system 150 may be equipped with an optical filter. One or more of the planar test optical systems 150 may be equipped with an optical filter. Multiple planar test optical systems 150 may be equipped with an optical filter. Each planar test optical system 150 may be equipped with an optical filter. The planar test optical system 150 may be equipped with an optical switch. One or more of the planar test optical systems 150 may be equipped with an optical switch. Multiple planar test optical systems 150 may be equipped with an optical switch. Each planar test optical system 150 may be equipped with an optical switch. The planar test optical system 150 may be equipped with an optical transmitter. One or more of the planar test optical systems 150 may be equipped with an optical transmitter. Multiple planar test optical systems 150 may be equipped with optical transmitters. Each planar test optical system 150 may be equipped with an optical transmitter. Each planar test optical system 150 may be equipped with an optical disperser. One or more of the planar test optical systems 150 may be equipped with an optical disperser. Multiple planar test optical systems 150 may be equipped with optical dispersers. Each planar test optical system 150 may be equipped with an optical disperser.

[0508] In some embodiments, instead of the planar test optical system 150 (if present) directing the electromagnetic waves emitted from each planar test emitter 148 toward the target portion of the window 142, the planar test emitters 148 are arranged to directly emit electromagnetic waves toward each target portion of the window 142. That is, in some embodiments, the monitoring system 100 does not include the planar test optical system 150. Planar test radiation module 152

[0509] Referring to Figure 8, the monitoring system 100 comprises a planar test radiation module 152. The monitoring system 100 comprises one or more planar test radiation modules 152. In particular, the planar test system 146 comprises one or more planar test radiation modules 152. The illustrated planar test system 146 comprises one planar test radiation module 152. The planar test radiation module 152 is in the form of a printed circuit board. However, it is understood that in some embodiments, the planar test system 146 may comprise multiple planar test radiation modules 152.

[0510] The planar test emission module 152 comprises a planar test body 154, which is in the form of a printed circuit board base. The planar test emission module 152 also comprises a planar test emitter 148, which is mounted on the planar test body 154. If the planar test system 146 comprises one or more planar test optical systems 150, the planar test optical systems 150 may also be mounted on the planar test body 154. This mounting may be direct or via the planar test emitter 148.

[0511] The planar test emitter 148 is attached to the planar test body 154, forming a configuration of the planar test emitter 148. This configuration comprises multiple rows of planar test emitters 148. This configuration comprises multiple columns of planar test emitters 148. In other words, the planar test emitters 148 are arranged in a grid. However, it is understood that in some embodiments, this configuration does not comprise multiple rows or multiple columns. That is, this configuration may take a form other than a grid.

[0512] As described herein, in some embodiments, the planar test emitters 148 are connected to each planar test optical system 150 to form a radiation unit. In some embodiments, the planar test emitters 148 and associated planar test optical systems 150 are mounted on a planar test body 154 to form a planar test radiation unit. Each planar test radiation unit may comprise one planar test emitter 148 and associated planar test optical system 150. This configuration may comprise multiple rows of planar test radiation units. This configuration may comprise multiple columns of planar test radiation units. In other words, the planar test radiation units may be arranged in a grid. However, in some embodiments, it is understood that this configuration does not comprise multiple rows or multiple columns; that is, this configuration may be in a form other than a grid. In some embodiments, the planar test radiation units are arranged irregularly on the planar test body 154.

[0513] Window 142 is configured to reflect at least a portion of the electromagnetic waves emitted by the planar test emitters 148. As described herein, each planar test emitter 148 emits electromagnetic waves. The electromagnetic waves are directed toward a target portion of window 142. Each planar test emitter 148 is associated with a different target portion of window 142. That is, electromagnetic waves emitted from one planar test emitter 148 are directed toward a different target portion of window 142 than electromagnetic waves emitted from other planar test emitters 148. The center of each target portion of window 142 may be equidistant from the centers of two or more other target portions of window 142. The centers of the target portions of window 142 form a two-dimensional configuration on window 142. This configuration may be regular; that is, it may be symmetric with respect to an axis of symmetry. This configuration may be symmetric with respect to two axes of symmetry. The centers of the target portions of window 142 form a two-dimensional array on window 142. The target portion of window 142 may be irregularly distributed throughout window 142. Window 142 reflects at least a portion of the electromagnetic waves emitted by the planar test emitter 148. In particular, window 142 reflects at least a portion of the electromagnetic waves emitted by the planar test emitter 148 and directed toward the inner surface of window 142. Strength testing system 156

[0514] Referring to Figures 1, 8, 39, and 40, the monitoring system 100 includes an intensity testing system 156. The intensity testing system 156 is configured to allow testing of one or more intensities of the environmental mapping emitter 108. In other words, the intensity testing system 156 is configured to allow testing of one or more output powers of the environmental mapping emitter 108. The intensity testing system 156 may be used to verify that electromagnetic waves are being emitted by the monitoring system 100. The intensity testing system 156 allows testing of the environmental mapping emitter 108 (e.g., verification of its operation). The intensity testing system 156 also allows testing of the physical properties of the window 142. For example, if the window 142 is dirty, this dirt will be reflected in the amount of electromagnetic waves emitted by the environmental mapping emitter 108 passing through the window 142, and therefore reflected in the data collected during the operation of the intensity testing system 156.

[0515] The intensity test system 156 comprises an intensity test optical system 158. The intensity test optical system 158 is configured to manipulate electromagnetic waves. The intensity test optical system 158 manipulates electromagnetic waves. The intensity test optical system 158 introduces an optical delay. The optical delay is the delay between the time it takes for an incident electromagnetic wave to encounter the intensity test optical system 158 and the time it takes for it to be emitted from the intensity test optical system 158. The intensity test optical system 158 extends from an incident end 162 to an emission end 164. The intensity test system 156 comprises one or more intensity test optical systems 156. In particular, the intensity test system 156 comprises multiple intensity test optical systems 158. The intensity test optical system 156 is configured to manipulate electromagnetic waves. The intensity test optical system 156 manipulates electromagnetic waves. The intensity test system 156 comprises an intensity test optical system 158 for each emission module 112. For clarity, some of these are hidden in Figure 40. The intensity test optical system 158 comprises an intensity test optical fiber 160. The intensity test optical fiber 160 introduces an optical delay; that is, there is a delay between the time when light encounters the first end of the intensity test optical fiber 160 and the time when it is emitted from the second end. One or more intensity test optical systems 158 each include an intensity test optical fiber 160.

[0516] The intensity test optical fiber 160 extends from the incident end 162 to the radiating end 164. Each intensity test optical fiber 160 extends from the incident end to the radiating end 164. It is understood that there may be one or more components attached to the incident end of the optical fiber. These components may be optically transparent. These components assist in attaching the intensity test optical fiber 160 to each radiating module 112. In this case, it is understood that the incident end 162 of the intensity test optical fiber 160 comprises one or more components. It is understood that there may be one or more components attached to the radiating end of the optical fiber. These components may be optically transparent. These components assist in attaching the intensity test optical fiber 160 to the mounting part of the monitoring system 100. In this case, it is understood that the radiating end 164 of the intensity test optical fiber 160 comprises one or more components.

[0517] As described herein, the environment mapping emitter 108 is configured to emit electromagnetic waves directed toward each target region of the environment. As the emitted electromagnetic waves propagate toward the target regions, a portion 143 of them passes through the window 142 (see Figure 40). Another portion is reflected 168 by the window 142. In particular, the inner surface 166 of the window 142 reflects 168 a portion of the electromagnetic waves emitted by the environment mapping emitter 108. This reflection is schematically shown in Figures 39 and 40.

[0518] The intensity test optical fiber 160 is configured to completely internally reflect at least a portion of the electromagnetic waves emitted by one or more environmental mapping emitters 108 and reflected 168 from the window 142 along its length. That is, the intensity test optical fiber 160 completely internally reflects at least a portion of the electromagnetic waves emitted by one or more environmental mapping emitters 108 and reflected 168 from the inner surface 166 of the window 142 along its length, directing them toward the incident end of the intensity test optical fiber 160. The intensity test optical fiber 160 is configured to completely internally reflect at least a portion of the electromagnetic waves emitted by one or more environmental mapping emitters 108 and reflected 168 from the inner surface 166 of the window 142 along its length. The intensity test optical fiber 160 is configured to emit the completely internally reflected electromagnetic waves from its radiating end 164. That is, the intensity test optical fiber 160 emits the completely internally reflected electromagnetic waves from its radiating end 164. In particular, the intensity test optical fiber 160 is configured to radiate fully internally reflected electromagnetic waves from its radiating end 164 to the third portion of the sensor module 170. That is, the intensity test optical fiber 160 radiates fully internally reflected electromagnetic waves from its radiating end 164 to the third portion of the sensor module 170. The third portion 179 of the sensor module 170 is mutually exclusive with the first portion 176 and the second portion 178 of the sensor module 170.

[0519] The intensity test optical system 158 redirects at least a portion of the electromagnetic waves emitted by one or more environmental mapping emitters 108 and reflected from the surface of the window 142. This surface is the inner surface 166 of the window 142.

[0520] Each intensity test optical system 158 is associated with its respective radiation module 112. In particular, at least a portion of each intensity test optical system 158 extends through a hole in the body 114 of each radiation module 112.

[0521] In some embodiments, the intensity test optical fiber 160 of the intensity test optical system 158 extends through a hole in the body 114 of each radiating module 112. In some embodiments, the intensity test optical system 158 includes an incident end optical component. The incident end optical component is connected to the intensity test optical fiber 160 and extends through a hole in the body 114 of each radiating module 112. The incident end optical component can be considered to form the incident end 162 of each intensity test optical system 158.

[0522] The incident end 163 of the intensity test optical system 158 is generally perpendicular to the outer surface 116 of the body 114 of each radiating module 112. The incident end 163 may be the end of the intensity test optical fiber 160. The incident end 163 may be the end of an incident end optical component. In the illustrated embodiment, the incident end 163 of the intensity test optical system 158 is located midway between the side edges of each radiating module 112. In other words, the incident end 163 of the intensity test optical system 158 is located midway between the environmental mapping emitters 108 of each radiating module 112. The incident end 163 of the intensity test optical system 158 is offset from the environmental mapping emitters 108. That is, the incident end 163 of the intensity test optical system 158 is not coaxial with the environmental mapping emitters 108. The incident end 163 of the intensity test optical system 158 is laterally offset from the coaxial environmental mapping emitters 108. The incident end 163 of the intensity test optical system 158 is closer to the outer edge of the radiation module 112 than the environment mapping emitter 108 of the radiation module 112. It is understood that different configurations may be provided in some embodiments.

[0523] The intensity test optical system 158 may be equipped with an intensity test refractor. The intensity test optical system 158 may be equipped with an intensity test reflector. The intensity test optical system 158 may be equipped with an intensity test diffractor. The intensity test optical system 158 may be equipped with an optical splitter. One or more of the intensity test optical systems 156 may be equipped with an optical splitter. Multiple intensity test optical systems 156 may be equipped with an optical splitter. Each intensity test optical system 158 may be equipped with an optical splitter. The intensity test optical system 158 may be equipped with an optical filter. One or more of the intensity test optical systems 156 may be equipped with an optical filter. Multiple intensity test optical systems 156 may be equipped with an optical filter. Each intensity test optical system 158 may be equipped with an optical filter. The intensity test optical system 158 may be equipped with an optical switch. One or more of the intensity test optical systems 156 may be equipped with an optical switch. Multiple intensity test optical systems 156 may be equipped with an optical switch. Each intensity test optical system 158 may be equipped with an optical switch. Each intensity test optical system 158 may be equipped with an optical transmitter. One or more of the intensity test optical systems 156 may be equipped with an optical transmitter. Multiple intensity test optical systems 156 may be equipped with optical transmitters. Each intensity test optical system 158 may be equipped with an optical transmitter. Each intensity test optical system 158 may be equipped with an optical disperser. One or more of the intensity test optical systems 156 may be equipped with an optical disperser. Multiple intensity test optical systems 156 may be equipped with an optical disperser. Each intensity test optical system 158 may be equipped with an optical disperser. Sensing system 120

[0524] The monitoring system 100 includes a sensing system 120. The sensing system 120 may include a camera system. The sensing system 120 may include a three-dimensional time-of-flight camera. The sensing system 120 may include a three-dimensional time-of-flight camera system. The sensing system 120 is configured to generate sensing system data. That is, the sensing system 120 generates sensing system data. The sensing system 120 generates sensing system data in response to the detection of electromagnetic waves incident on the sensing system 120. In particular, the sensing system 120 is configured to generate sensing system data at least in part based on electromagnetic waves emitted by the environment mapping emitter 108 that are reflected by a target area of ​​the environment. The sensing system 120 generates sensing system data at least in part based on electromagnetic waves emitted by the environment mapping emitter 108 that are reflected by a target area of ​​the environment. The reflected electromagnetic waves are detected by the sensing system 120, and the sensing system 120 generates sensing system data in response.

[0525] The sensing system 120 includes a sensor module 170. The sensor module 170 includes a three-dimensional time-of-flight sensor module. The sensor module 170 may be in the form of a three-dimensional time-of-flight sensor module. The sensing system 120 includes a lens system 172. The lens system 172 defines the optical axis 174. The lens system 172 is configured to focus the incident electromagnetic waves onto the sensor module 170. That is, the lens system 172 focuses the incident electromagnetic waves onto the sensor module 170. The lens system 172 may include an optical filter 144. One or more of the radiating modules 112 may intersect a plane perpendicular to the optical axis 174. In the illustrated embodiment, each radiating module 112 intersects a common plane perpendicular to the optical axis.

[0526] The sensor module 170 is configured to generate sensing system data based at least partially on the incident electromagnetic wave. In the illustrated embodiment, the sensor module 170 generates sensing system data based at least partially on the incident electromagnetic wave. In particular, the sensor module 170 is configured to detect the incident electromagnetic wave and generate sensing system data based at least partially on the detected incident electromagnetic wave. That is, the sensor module 170 detects the incident electromagnetic wave and generates sensing system data in response to the detected incident electromagnetic wave. The sensing system data may be time-series data. That is, the sensing system data may comprise a dataset or data elements with multiple time indices.

[0527] For the purposes of this specification, if a change in the value of one or more operating parameters of the sensor module 170 changes in response to an incident electromagnetic wave, it can be considered that the incident electromagnetic wave has been detected.

[0528] The sensor module 170 comprises multiple sensing units (not shown). Each sensing unit responds to the intensity of the incident electromagnetic wave. In particular, an intensity parameter is associated with each sensing unit. The intensity parameter may take the intensity value that indicates the intensity of the electromagnetic wave incident on each sensing unit.

[0529] The sensing system data may consist of multiple snapshots of the intensity parameter values ​​of each sensing unit at a specific time. That is, the sensing system data may consist of a time-series intensity dataset, each intensity dataset containing the intensity parameter values ​​output by each sensing unit at the relevant time.

[0530] As described herein, the sensor module 170 is configured to generate sensing system data based at least in part on electromagnetic waves incident on the sensor module 170 at one or more time intervals. That is, the sensor module 170 generates sensing system data based at least in part on electromagnetic waves incident on the sensor module 170 at one or more time intervals. The incident electromagnetic waves may include ambient electromagnetic waves. These may be, for example, electromagnetic waves emitted by the sun, electromagnetic waves emitted by one or more artificial light sources in or around the environment of the monitoring system 100, and / or electromagnetic waves reflected towards the sensor module 170 by the environment and / or one or more objects in the environment.

[0531] As described herein, the environmental mapping emitter 108 is configured to emit electromagnetic waves directed toward a target area of ​​the environment surrounding the monitoring system 100. A portion of these electromagnetic waves is reflected by the environment and / or objects within the environment. The sensing system 120 is configured to detect the electromagnetic waves emitted by the environmental mapping emitter 108 and reflected by the target area(s) directed by each aiming optical system 110. The sensing system 120 is configured to generate sensing system data based at least in part on the detected electromagnetic waves.

[0532] In other words, the environmental mapping emitter 108 emits electromagnetic waves that are directed toward a target area in the environment surrounding the monitoring system 100. The sensing system 120 detects the electromagnetic waves emitted by the environmental mapping emitter 108 and reflected by the target area(s) that the electromagnetic waves emitted by the environmental mapping emitter 108 are directed toward by their respective aiming optics 110. The sensing system 120 generates sensing system data based at least partially on the detected electromagnetic waves.

[0533] The lens system 172 is positioned in front of the sensor module 170. The axis of the lens system 172 passes through the sensor module 170.

[0534] The lens system 172 is configured to focus incident electromagnetic waves onto the sensor module 170. That is, the lens system 172 is configured to focus electromagnetic waves that encounter the lens system 172 during propagation onto the sensor module 170. In this way, the lens system 172 is configured to focus ambient electromagnetic waves onto the sensor module 170. The lens system 172 is configured to focus electromagnetic waves emitted by the environment mapping emitter 108 and reflected by target areas (multiple areas are possible) that are directed by each aiming optical system 110. In other words, the lens system 172 is configured to focus the superposition of ambient electromagnetic waves and electromagnetic waves emitted by the environment mapping emitter 108 and reflected by the environment onto the sensor module 170.

[0535] The lens system 172 focuses the incident electromagnetic waves onto the sensor module 170. That is, the lens system 172 focuses the electromagnetic waves that it encounters during propagation onto the sensor module 170. In this way, the lens system 172 focuses the ambient electromagnetic waves onto the sensor module 170. The lens system 172 focuses the electromagnetic waves emitted by the environment mapping emitter 108 and reflected by the target area(s) that are directed by each aiming optical system 110. In other words, the lens system 172 focuses the superposition of ambient electromagnetic waves and electromagnetic waves emitted by the environment mapping emitter 108 and reflected by the environment onto the sensor module 170.

[0536] Referring to Figure 21, the lens system 172 is configured to focus electromagnetic waves onto the first portion 176 of the sensor module 170 (see Figure 21). That is, the lens system 172 focuses electromagnetic waves onto the first portion 176 of the sensor module 170. The first portion 176 of the sensor module 170 is the central portion of the sensor module 170. The first portion 176 of the sensor module 170 may form a Reuleaux triangle. The first portion 176 of the sensor module 170 may approximate a Reuleaux triangle. The first portion 176 of the sensor module 170 may resemble a Reuleaux triangle. It is understood that, as a result of spherical aberration by the lens system 172, the first portion 176 may deviate from the shape of a Reuleaux triangle.

[0537] The electromagnetic waves emitted by the planar test emitter 148 are directed to the sensor module 170. In some embodiments, the electromagnetic waves emitted by the planar test emitter 148 are directed directly to the sensor module 170. That is, in some embodiments, the electromagnetic waves emitted by the planar test emitter 148 bypass the lens system 172. In some embodiments, the lens system 172 focuses the electromagnetic waves emitted by the planar test emitter 148 onto a first portion 176 of the sensor module 170. The sensing system 120 detects the electromagnetic waves emitted by the planar test emitter 148. In particular, the sensing system 120 detects the electromagnetic waves emitted by the planar test emitter 148 and reflected by the window 142. However, in some embodiments, it is understood that the electromagnetic waves may be emitted from another surface.

[0538] The sensing system 120 is also configured to detect electromagnetic waves emitted from the radiating end 130 of the depth test optical system 126. The radiating end 130 of the depth test optical system 126 is fixed in place to emit electromagnetic waves directed toward the sensing system 120 from each of its incident end 128. In particular, these electromagnetic waves are directed toward the sensor module 170. The sensing system 120 is configured to generate sensing system data based at least partially on these detected electromagnetic waves. In other words, the sensing system 120 is configured to detect electromagnetic waves emitted by the depth test emitter 124 and to generate sensing system data based at least partially on these detected electromagnetic waves.

[0539] The radiating end 130 of the depth test optical system 126 is positioned to radiate electromagnetic waves that are completely internally reflected by the depth test optical system 126 to the second portion 178 of the sensor module 170. In other words, the radiating end 130 of the depth test optical system 126 is positioned to face the second portion 178 of the sensor module 170. There is no overlap between the first portion 176 and the second portion 178 of the sensor module 170. The second portion 178 of the sensor module 170 is triangular. The second portion 178 of the sensor module 170 is offset laterally from the first portion 176 of the sensor module 170. The second portion 178 of the sensor module 170 is offset perpendicularly to the first portion 176 of the sensor module 170.

[0540] The sensing system 120 is configured to detect electromagnetic waves emitted by the planar test emitter 148 and reflected by the window 142. Specifically, the sensing system 120 detects electromagnetic waves emitted by the planar test emitter 148. More precisely, the electromagnetic waves are fully internally reflected along the depth test optical fiber 132 and emitted to a second portion 178 of the sensor module 170, where they are detected.

[0541] The sensing system 120 is configured to generate sensing system data based at least partially on the detected electromagnetic wave. In some embodiments, this electromagnetic wave is radiated directly to the sensor module 170 by the depth test optical fiber 132. In some embodiments, this electromagnetic wave is directed toward one or more lenses (e.g., part of a lens system 172) before it encounters the sensor module 170. Thus, in some embodiments, the lens system 172 is configured to focus the electromagnetic wave radiated by the planar test emitter 148 and reflected by the window 142 onto a first portion 176 of the sensor module 170.

[0542] The sensing system 120 is configured to detect ambient electromagnetic waves. The sensing system 120 is configured to generate sensing system data based at least partially on the detected ambient electromagnetic waves. The lens system 172 is configured to focus the incident ambient electromagnetic waves onto a first portion 176 of the sensor module 170.

[0543] The sensing system 120 detects ambient electromagnetic waves. The sensing system 120 generates sensing system data based at least partially on the detected ambient electromagnetic waves. The lens system 172 focuses the incident ambient electromagnetic waves onto the first portion 176 of the sensor module 170.

[0544] The radiating end 164 of the intensity test optical system 158 is positioned to radiate electromagnetic waves that are fully internally reflected by the intensity test optical system 158 toward the sensor module 170. In other words, each intensity test optical system 158 is configured to radiate at least a portion of the fully internally reflected electromagnetic waves toward the sensor module 170 from its radiating end 164. Specifically, the intensity test optical fiber 160 is positioned to radiate electromagnetic waves toward the sensor module 170. The intensity test optical fiber 160 radiates electromagnetic waves toward a third portion 179 of the sensor module 170. The third portion 179 of the sensor module 170 is triangular. The third portion 179 of the sensor module 170 is laterally offset from the first portion 176 of the sensor module 170. The third portion 179 of the sensor module 170 is vertically offset from the first portion 176 of the sensor module 170. The third portion 179 of the sensor module 170 is located opposite the second portion 178 of the sensor module 170 to the first portion 176 of the sensor module 170. Physical structure of monitoring system 100

[0545] As described herein, the monitoring system 100 comprises a housing 102. The housing 102 comprises a plurality of housing walls 104, the housing walls 104 defining the volume enclosed by the housing 102. The housing walls 104 comprise a planar front wall 104A and an inclined wall 104B. The outer surfaces 116 of one or more bodies 114 of the radiating module 112 are parallel to their respective inclined walls 104B. At least a portion of each radiating module 112 is outside the housing 102. In particular, the body 114 of each radiating module 112 is outside the housing 102. Furthermore, the environmental mapping emitter 108 in the illustrated embodiment is outside the housing 102. However, in some embodiments, it is understood that at least a portion of one or more of the radiating modules 112 is inside the housing 102. For example, one or more bodies 114 of the radiating module 112 may be inside the housing 102. Furthermore, one or more of the environmental mapping emitters 108 may be located within the housing 102. In such embodiments, the housing may have one or more holes, and the environmental mapping emitters 108 are configured to align with the holes so that they can radiate electromagnetic waves to the other side of the housing 102. These holes may have windows, through which the environmental mapping emitters 108 radiate electromagnetic waves. The windows may be transparent to the frequencies of the electromagnetic waves radiated from each environmental mapping emitter 108.

[0546] The housing includes holes 105. Each hole 105 is aligned with a respective planar test emitter 148. The planar test emitter 148 is configured such that electromagnetic waves emitted from it can propagate across the housing 104 by passing through each hole 105. In other words, the planar test emitter 148 enables electromagnetic waves to propagate across the housing 104 by emitting electromagnetic waves through each hole 105. Here again, one or more of these holes may be covered by a window. The window may be transparent to the frequencies of electromagnetic waves emitted from each planar test emitter 148. The front wall 104A of the housing 102 includes a lens system opening. The lens system 172 extends through the lens system opening, as shown in Figure 1. In some embodiments, it is understood that the outer surface of the lens system 172 may be aligned with the front wall 104A of the housing 102 at at least one point. That is, the lens system 172 may be coplanar with the front wall 104A of the housing 102.

[0547] The housing 102 includes a mounting portion 103 (see Figures 2-4). The mounting portion 103 is configured to allow the monitoring system 100 to be mounted to a structure. The structure may be, for example, a window, scaffolding, or the frame of a mechanical device such as a robot. The structure may be part of a vehicle. The illustrated mounting portion 103 is in the form of an elongated projection. However, it is understood that the mounting portion 103 may take other forms. For example, the housing 102 may include a plurality of mounting portions in the form of recesses and / or holes, to which the housing 102 can be mounted to another structure by a nut and bolt connection system or a screw-based connection system.

[0548] The monitoring system 100 includes a sensor module body 109 (see Figure 9). The sensor module body 109 is housed in a housing 102. A sensor module 172 is mounted on the sensor module body 109. The sensor module body 109 may be in the form of a base for a printed circuit board. The sensor module body 109 is a planar body. The sensor module body 109 has a thickness. This thickness may be constant throughout the sensor module body 109. One or more components of the monitoring system 100 are configured to connect to the sensor module body 109. That is, one or more components of the monitoring system 100 are connected to the sensor module body 109. The sensor module body 109 may be configured to connect to the housing 102. That is, the sensor module body 109 may be connected to the housing 102. When connected to the housing 102, relative movement between the sensor module body 109 and the housing 102 is prevented. Therefore, the sensor module body 109 locks the other connected components to the housing 102. In this way, the movement of the housing 102 causes a corresponding movement of the sensor module body 109, which in turn causes a corresponding movement of the components rigidly connected to the sensor module body 109.

[0549] The radiating modules 112 are positioned radially outward relative to the lens system 172. The positioning of the first component radially outward relative to the second component is understood to mean that the first component is further away from the axial centerline of the monitoring system 100 than the second component, in a direction perpendicular to the axial centerline. In the illustrated embodiment, the axial centerline of the monitoring system 100 corresponds to the optical axis 174 of the lens system 172. That is, the axial centerline of the monitoring system 100 is coaxial with the optical axis 174 of the lens system 172. One or more of the radiating modules 112 are positioned radially outward relative to the lens system 172. In the illustrated embodiment, each of the radiating modules 112 is positioned axially outward relative to the lens system 172. That is, the radiating modules 112 are positioned radially outward from the optical axis 174. The first radiating module 112A is positioned radially outward from the optical axis 174. The second radiating module 112B is positioned radially outward from the optical axis 174.

[0550] The monitoring system 100 includes a radiation system connecting member 111. The radiation system connecting member 111 may be referred to as a connecting member 111. The monitoring system 100 includes a plurality of radiation system connecting members 111 (see Figures 10-16). The radiation system connecting member 111 extends between the sensor module body 109 and the radiation module 112. One or more connecting members 111 extend between the sensor module body 109 and each of the radiation modules 112. In the illustrated embodiment, each radiation system connecting member 111 extends between the sensor module body 109 and each of the radiation modules 112. The radiation system connecting member 111 is connected to the sensor module body 109 at a first end. The radiation system connecting member 111 is connected to each of the radiation modules 112 at a second end.

[0551] The radiation system connecting member 111 may be a flexible printed circuit board that electronically connects each radiation module 112 to the sensor module body 109. The radiation system connecting member 111 may be in the form of wires and / or cables that electrically connect each radiation module 112 to the sensor module body 109. In the illustrated embodiment, the radiation system connecting member 111 is rigid. The connecting member 111 is an elongated member. The radiation system connecting member 111 rigidly connects each radiation module 112 to the sensor module body 109.

[0552] Each radiation module 112 is connected to the respective connecting member 111 at one end. The other end of the connecting member 111 is connected to the sensor module body 109.

[0553] In some embodiments, one or more of the radiation modules 112 are movable relative to one or more other parts of the monitoring system 100. For example, a radiation module 112 may be movably connected to the sensor module body 109. A radiation module 112 may be moved by an actuator. Thus, the target area of ​​the environment that can be imaged using the environment mapping emitter 108 of the radiation module 112 may change as the position or orientation of the radiation module 112 changes.

[0554] The radiating modules 112 face in opposite directions. The planes formed by the bodies 114 of the radiating modules 112 are not parallel. That is, the planes formed by the bodies 114 of the radiating modules 112 are transverse to each other. The radiating modules 112 face in opposite directions from a common point. That is, a straight line extending from the center point of a radiating module 112 in a direction perpendicular to the plane formed by the body 114 of that radiating module 112 intersects with the corresponding straight line of the other radiating module 112 at a common point. In other words, the outer edge of a radiating module 112 is offset axially with respect to its inner edge. That is, the outer edge of a radiating module 112 is closer to the rear wall 104E of the monitoring system 100 than the inner edge of a radiating module 112. It is understood that the outer edge of a radiating module 112 is offset radially with respect to its inner edge. In the illustrated embodiment, this applies to each of the radiating modules 112.

[0555] The incident end 162 of the intensity test optical system 158 is positioned radially outward from the environment mapping emitter 108 with respect to the optical axis 174. In other words, the incident end 162 of the intensity test optical system 158 is positioned radially outward from the environment mapping emitter 108. The incident end 162 of the intensity test optical system 158 is positioned radially outward from the inner edge of each radiation module 112. The incident end 162 of the intensity test optical system 158 is positioned radially inward from the outer edge of each radiation module 112.

[0556] The environmental mapping emitters 108 and / or aiming optics 110 are configured such that, if present, electromagnetic waves emitted by the environmental mapping emitters 108 do not reflect from the window 142 and intersect with the lens system 172. That is, the environmental mapping emitters 108 are positioned so that the electromagnetic waves they emit, reflected from the window 142, bypass the lens system 172. In some embodiments, the environmental mapping emitters 108 are mounted on the body 114 of each radiating module 112 at a predetermined angle. Alternatively, the environmental mapping emitters 108 are mounted on the body 114 of each radiating module 112 so as to emit electromagnetic waves within a predetermined angular range. These angles are determined so as to minimize or avoid reflections in the lens system 172.

[0557] Referring to Figure 39, an environmental mapping emitter 108 mounted on the body 114 of a particular radiation module 112 is shown. The diagram in Figure 39 may reflect a top view of the radiation module 112. The environmental mapping emitters 108 are positioned so that the electromagnetic waves they emit, reflected from the window 142, do not intersect with the lens system. The environmental mapping emitters 108 emit electromagnetic waves within a radiation angle range 141. One or more environmental mapping emitters 108 emit electromagnetic waves within a radiation angle range 141. In the illustrated embodiment, each environmental mapping emitter 108 emits electromagnetic waves within a radiation angle range 141. The radiation angle range 141 of the top environmental mapping emitter 108 in Figure 39 is shown, but it is understood that each environmental mapping emitter 108 emits electromagnetic waves within such a range. The radiation angle range 141 may be influenced by the corresponding aiming optical system 110. For example, an environmental mapping emitter 108 may emit electromagnetic waves, which are then manipulated by an associated aiming optical system 110 to propagate within a radiation angle range 141. In this way, the aiming optical system 110 can control the radiation angle range 141. Each environmental mapping emitter 108 may be associated with a corresponding radiation angle range 141, which may be defined by the characteristics of the associated aiming optical system 110.

[0558] An inner boundary 151 exists for the radiation angle range 141 of the environmental mapping emitter 108. The inner boundary 151 of the radiation angle range 141 of the environmental mapping emitter 108 is the boundary of the electromagnetic radiation of the environmental mapping emitter 108 closest to the optical axis 174 of the monitoring system 100. It is understood that the inner boundary 151 of the radiation angle range 141 of the environmental mapping emitter 108 is the boundary of the electromagnetic radiation of the environmental mapping emitter 108 closest to the axial axis of the monitoring system 100. The inner boundary 151 of the electromagnetic radiation of the environmental mapping emitter 108 forms an inner radiation angle 153 with a plane orthogonal to the optical axis 174. Such a plane may be referred to as a front plane. Each environmental mapping emitter 108 may be associated with a corresponding front plane.

[0559] The internal radiation angle 153 of the environmental mapping emitter 108 is measured on a plane perpendicular to the front plane. This plane may be referred to as the radial plane. The radial plane is perpendicular to the front plane and parallel to the optical axis 174. Each environmental mapping emitter 108 is associated with a radial plane. The optical axis 174 is incident on each radial plane. The radial plane associated with the environmental mapping emitter 108 bisects the electromagnetic waves emitted by the environmental mapping emitter 108.

[0560] The environmental mapping emitter 108 is configured to emit electromagnetic waves such that its internal radiation angle 153 is greater than the internal radiation angle threshold 157. The internal radiation angle threshold 157 is a threshold angle. The internal radiation angle threshold 157 of the environmental mapping emitter 108 is the angle between the front plane and the lens crossing angle 157 of the environmental mapping emitter 108. The lens crossing angle 157 is the angle measured from the front plane along the radial plane, and is the angle at which the electromagnetic waves 191 emitted by the environmental mapping emitter 108 encounter the lens system 172. The angle of the internal radiation angle threshold 157 may differ between environmental mapping emitters 108.

[0561] Therefore, the inner radiation angle 153 of the environmental mapping emitter 108 is greater than the inner radiation angle threshold 157 of the environmental mapping emitter 108. In the illustrated embodiment, the inner radiation angle 153 of each environmental mapping emitter 108 is greater than the inner radiation angle threshold 157 of the environmental mapping emitter 108. The inner radiation angle threshold 157 of an environmental mapping emitter 108 that is radially closer to the optical axis 174 is smaller than the inner radiation angle threshold 157 of an environmental mapping emitter 108 that is radially further from the optical axis 174. Therefore, the inner radiation angle threshold 157 of an environmental mapping emitter 108 is related to the radial distance of the environmental mapping emitter 108 from the optical axis 174. Thus, the environmental mapping emitter 108 is positioned such that the inner radiation angle 153 of the environmental mapping emitter 108 decreases as a function of increasing radial distance from the optical axis 174.

[0562] Therefore, the body 114 of the environmental mapping emitter 108 is positioned such that some or all of the electromagnetic radiation reflected from the inner surface 166 of the window is not directed towards the lens system 172 and / or the sensor module 174. This advantageously reduces or eliminates the range over which electromagnetic radiation reflected from the inner surface 166 of the window 142 affects the sensing system data.

[0563] In other words, the environmental mapping emitter 108 (and, if present, the associated aiming optics 110) directs the emitted electromagnetic waves toward a target area in the environment. These electromagnetic waves pass through the window 142. In particular, these electromagnetic waves pass through the window 142 at at least some positions on the window 142 before the incident electromagnetic waves encounter the sensing system 120. The environmental mapping emitter 108 (and, if present, the associated aiming optics 110) directs the emitted electromagnetic waves so that they do not reflect from the window 142 back to the lens system 172. This is achieved by controlling one or more of the emission angle range of the emission unit and the orientation of the emission unit. Control system 180

[0564] The monitoring system 100 comprises a control system 180. Figure 17 is a block diagram of the control system 180 according to several embodiments. The block diagram in Figure 17 represents several features of the monitoring system 100. The control system 180 comprises at least one processor 182. The at least one processor 182 is configured to process data received from one or more subsystems of the monitoring system 100. It is understood that the at least one processor may comprise at least one processor of a subsystem of the monitoring system 100. For example, the at least one processor 182 may be considered to comprise at least one processor of the sensing system 120.

[0565] The control system 180 includes a memory 184. At least one processor 182 is configured to communicate with the memory 184. At least one processor 182 is configured to communicate with the sensing system 120. In some embodiments, at least one processor 182 is configured to acquire sensing system data from the sensing system 120. In some embodiments, the sensing system 120 is configured to provide sensing system data to at least one processor 182. At least one processor 182 is configured to store the sensing system data in the memory 184.

[0566] At least one processor is configured to execute program instructions 186 stored in memory 184 to make the control system 180 function as described herein. In other words, the program instructions 186 are accessible by at least one processor 182 and are configured to make at least one processor 182 function as described herein. In some embodiments, the program instructions 186 are in the form of program code. In particular, the program instructions 186 are configured to cause at least one processor 182 to control the radiation system 106. The program instructions 186 are configured to cause at least one processor 182 to control the sensing system 120. The program instructions 186 are configured to cause at least one processor 182 to control the depth test system 122. The program instructions 186 are configured to cause at least one processor 182 to control the plane test system 146. The program instructions 186 are configured to cause at least one processor 182 to control the intensity test system 156.

[0567] At least one processor 182 comprises one or more microprocessors, central processing units (CPUs), application-specific integrated circuits (ASICs), graphics processing units (GPUs), tensor processing units (TPUs), field-programmable gate arrays (FPGAs), or other processors capable of reading and executing programs. One or more of the at least one processor 182 may be remote processors; that is, these processors may be located outside the housing 102. For example, these processors may be located in a separate device. Alternatively, these processors may be located in a remote location that provides processing functionality.

[0568] Memory 184 may comprise one or more volatile or non-volatile memory types. For example, memory 184 may comprise one or more random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. Memory 184 is configured to store program code accessible by at least one processor 182. The program code may comprise executable program code modules. In other words, memory is configured to store executable code modules configured to be executable by at least one processor 182. The executable code modules cause at least one processor 182 to perform certain functions as described herein. Throughout this specification, program code may be considered to mean program instructions.

[0569] The control system 180 is configured to communicate with one or more subsystems of the monitoring system 100 via a communication network 188. The control system 180 includes a network interface 190. The network interface 190 enables the control system 180 to communicate with subsystems of the monitoring system 100. The network interface 190 may include a combination of network interface hardware and network interface software suitable for establishing, maintaining, and facilitating communication over the relevant communication channels.

[0570] The communication network 188 may be in the form of a bus. The communication network 188 may include a cloud server network, a wired or wireless internet connection, Bluetooth® or other short-range wireless communication, and / or a physical medium such as USB.

[0571] In some embodiments, the housing 102 accommodates at least a portion of the control system 180. For example, at least one processor 182, memory 184, and one or more network interfaces 190 may be housed within the housing 102. Alternatively, at least one processor 182, memory 184, and one or more network interfaces 190 may be located remotely from the housing 102. 300 methods for generating monitoring system output data

[0572] A process flow diagram of Method 300 is shown in Figure 18. Method 300 can be considered a method for generating monitoring system output data. Method 300 can be considered a computer implementation method. Method 300 can be considered a method for monitoring the environment. The control system 180 can perform at least a portion of Method 300. More specifically, at least one processor 182 may perf...

Claims

1. Radiation systems and, Sensing system and A monitoring system comprising, The aforementioned fire-fighting system, One or more environment mapping emitters, One or more aiming optics and Equipped with, Each environment mapping emitter is configured to emit electromagnetic waves to each of the aiming optical systems of the one or more aiming optical systems. Each aiming optical system is configured to direct the electromagnetic waves toward each target area of ​​the environment of the monitoring system, The sensing system is configured to generate sensing system data based at least partially on the electromagnetic waves emitted by the environment mapping emitter and reflected by the target area of ​​the environment.

2. The environmental mapping system comprises a first radiation module, and the first radiation module is The first main body, A first subset of the environmental mapping emitters, wherein each environmental mapping emitter is attached to the first body, A first subset of the aiming optical system, wherein one or more of the aiming optical systems are Attached to the first main body, A first subset of the aiming optical system is configured to redirect the electromagnetic waves emitted from each of the first subset of the environmental mapping emitters. The monitoring system according to claim 1, comprising:

3. The outer surface of the first body defines a first plane, The surveillance system according to claim 2, wherein each aiming optical system in the first subset of the aiming optical system is configured to direct the electromagnetic waves toward the respective target areas by directing the electromagnetic waves emitted from each of the environment mapping emitters in one or more directions transverse to the first plane.

4. The monitoring system according to claim 2 or 3, wherein the first subset of the environmental mapping emitters are mounted on the first body so as to be on the same plane.

5. The radiation system comprises a second radiation module, and the second radiation module is The second main body, A second subset of the environmental mapping emitter, wherein each environmental mapping emitter is attached to the second body, A second subset of the aforementioned aiming optical system, wherein each aiming optical system is Attached to the second main body, A second subset of the aiming optical system is configured to redirect the electromagnetic waves emitted from each of the second subset of the environmental mapping emitters. A monitoring system according to any one of claims 1 to 4, comprising:

6. The outer surface of the second body defines a second plane, The surveillance system according to claim 5, wherein each aiming optical system in the second subset of the aiming optical system is configured to direct the electromagnetic waves toward the respective target areas by directing the electromagnetic waves emitted from each of the environment mapping emitters in one or more directions transverse to the second plane.

7. The monitoring system according to claim 6, as dependent on claim 3, wherein the first plane intersects with respect to the second plane.

8. The monitoring system according to any one of claims 5 to 7, wherein a second subset of the environmental mapping emitters is mounted on the second body so as to be on the same plane.

9. The monitoring system according to any one of claims 5 to 8, as dependent on claim 2, wherein the first radiation module and the second radiation module are radially offset by the same amount from the axial axis of the monitoring system.

10. The radiation system comprises multiple radiation modules, each of which is: The main unit and A subset of the environmental mapping emitters, wherein each environmental mapping emitter in each subset is attached to the main body of each of the radiation modules, A subset of the aforementioned aiming optical system, wherein each aiming optical system in each subset is Attached to the aforementioned main body, A subset of the aiming optical system is configured to direct the electromagnetic waves emitted from each subset of the environmental mapping emitters toward each of the target regions by redirecting the electromagnetic waves emitted from the environmental mapping emitters of each subset of the environmental mapping emitters. The monitoring system according to claim 1, comprising:

11. The monitoring system according to claim 10, comprising six radiation modules.

12. The surveillance system according to any one of claims 1 to 11, wherein the one or more aiming optical systems are configured to manipulate electromagnetic waves.

13. One or more of the aforementioned aiming optical systems are Refractor, reflector, Diffractor, Optical splitter, Optical filters, Optical switch, Optical transmitter, and optical scatterer A monitoring system according to any one of claims 1 to 12, comprising one or more of the following:

14. The monitoring system according to any one of claims 1 to 13, wherein the target region to which electromagnetic waves emitted by a specific environmental mapping emitter are directed is the target region of the environmental mapping emitter.

15. The monitoring system according to claim 14, wherein the target region of at least one environmental mapping emitter is different from the target region of another environmental mapping emitter.

16. The monitoring system according to claim 14 or 15, wherein the target region of at least one environmental mapping emitter overlaps with the target region of another environmental mapping emitter.

17. At least one of the environmental mapping emitters emits electromagnetic waves having a first radiation profile, The monitoring system according to any one of claims 1 to 16, wherein at least one of the environmental mapping emitters emits electromagnetic waves having a second radiation profile.

18. The monitoring system according to claim 17, as dependent on claim 14, wherein at least one of the target regions of the environmental mapping emitter emitting electromagnetic waves having the first radiation profile is different from at least one of the target regions of the environmental mapping emitter emitting electromagnetic waves having the second radiation profile.

19. The monitoring system according to claim 17, as dependent on claim 14 or claim 18, wherein at least one of the target regions of the environmental mapping emitter emitting electromagnetic waves having the first radiation profile overlaps with at least one of the target regions of the environmental mapping emitter emitting electromagnetic waves having the second radiation profile.

20. The monitoring system comprises at least one pair of environmental mapping emitters, and the at least one pair of environmental mapping emitters is A first environmental mapping emitter configured to emit electromagnetic waves having the first radiation profile, A second environmental mapping emitter configured to emit electromagnetic waves having the second radiation profile, Equipped with, The monitoring system according to claim 17, as dependent on claim 14, claim 18, or claim 19, wherein the target area of ​​the first environmental mapping emitter is the same as the target area of ​​the second environmental mapping emitter.

21. At least one of the aforementioned environment mapping emitters is Electromagnetic waves having a first radiation profile are emitted, The monitoring system according to any one of claims 1 to 16, configured to emit electromagnetic waves having a second radiation profile.

22. The aforementioned fire-fighting system, A depth test system comprising one or more depth test emitters and one or more depth test optical systems, The monitoring system according to any one of claims 1 to 21, wherein each depth test emitter is configured to emit electromagnetic waves to an associated depth test optical system among the one or more depth test optical systems.

23. The monitoring system according to claim 22, wherein one or more of the depth test optical systems are configured to manipulate electromagnetic waves.

24. The monitoring system according to claim 22 or 23, wherein the depth test optical system is configured to introduce an optical delay.

25. The monitoring system according to any one of claims 22 to 24, wherein the plurality of depth test optical systems extend from an incident end to an radiating end, and the incident end and the radiating end are separated by the length of each of the depth test optical systems.

26. The depth test optical system is, Each of the depth test emitters directs at least a portion of the electromagnetic waves radiated to the incident end of each of the depth test optical systems along its length. The monitoring system according to claim 25, wherein at least a portion of the electromagnetic waves directed along the length of each of the depth test optical systems is configured to be emitted from the radiating end of each of the depth test optical systems.

27. Each of the depth test optical systems is: Depth test refractometer, Depth test reflector, Depth test diffractometer, Depth test optical splitter, Depth test optical filter, Depth test optical switch, Depth test optical transmitter, and Depth Test Optical Dispersor A monitoring system according to any one of claims 22 to 26, comprising one or more of the above.

28. At least one of the depth test optical systems is At least a portion of the electromagnetic waves radiated from its incident end by the associated depth test emitter is completely internally reflected along its length, The monitoring system according to claim 25, or claim 26 or 27 as dependent on claim 25, wherein at least a portion of the completely internally reflected electromagnetic waves are radiated from their radiating ends.

29. The monitoring system according to claim 25, or any one of claims 26 to 28 as dependent on claim 25, wherein the length of at least one of the depth test optical systems is different from the length of at least one other depth test optical system.

30. The monitoring system according to claim 25, or any one of claims 26 to 29 as dependent on claim 25, wherein the length of one or more of the depth test optical systems is a multiple of the length of another depth test optical system.

31. The length of one or more of the depth test optical systems is approximately 2 m. The length of one or more of the depth test optical systems is approximately 4 m. The length of one or more of the depth test optical systems is approximately 6 m. The length of one or more of the depth test optical systems is approximately 8 m. A monitoring system according to claim 25, or any one of claims 26 to 30 as dependent on claim 25.

32. The depth testing system comprises a depth testing system body, The depth test emitter is attached to the depth test system body, according to any one of claims 22 to 31, in the monitoring system.

33. The monitoring system according to claim 32, as dependent on claim 2, wherein the depth test system body is oriented to be transverse to the first body of the first radiation module.

34. The monitoring system according to claim 25, or any one of claims 26 to 33 as dependent on claim 25, wherein each depth test optical system is configured to be connected to the associated depth test emitter such that the incident end of each depth test optical system faces the respective depth test emitter.

35. The surface of the depth test system body defines the plane of the depth test system body, One or more of the depth test optical systems extend from the depth test system body in a direction transverse to the plane of the depth test system body, as described in claim 32, or claim 33 or 34 if dependent on claim 32.

36. The monitoring system according to any one of claims 22 to 35, wherein one or more of the depth test optical systems are curved to surround the internal region of the monitoring system.

37. The monitoring system according to any one of claims 22 to 36, wherein the plurality of depth test optical systems are equipped with optical fibers.

38. The monitoring system according to claim 37, as dependent on claim 36, wherein the optical fiber is curved to surround the internal region of the monitoring system.

39. The monitoring system according to claim 37 or 38, as dependent on claim 36, wherein one or more of the optical fibers surround the internal region of the monitoring system a different number of times than the other optical fibers.

40. The aforementioned depth testing system is Four depth test emitters, Four depth test optics and A monitoring system according to any one of claims 22 to 39, comprising:

41. The monitoring system according to any one of claims 1 to 40, wherein the radiation system comprises a planar test system comprising one or more planar test emitters, each planar test emitter configured to emit electromagnetic waves.

42. The planar test system comprises one or more planar test clerestory, Each planar test emitter is configured to emit electromagnetic waves into its respective planar test optical system. The monitoring system according to claim 41, wherein each planar test optical system is configured to direct at least a portion of the electromagnetic waves emitted from each planar test emitter toward each planar test target area.

43. Each of the aforementioned planar test optical systems is Plane test refractometer, Planar test reflector, Planar test diffractometer, Planar test optical splitter, Planar test optical filter, Planar test optical switch, Planar test optical transmitter, and Planar test optical disperser The monitoring system according to claim 42, comprising one or more of the following:

44. The monitoring system according to any one of claims 1 to 43, further comprising a window that is optically transparent to at least some electromagnetic waves.

45. The monitoring system according to claim 44, as dependent on claim 41, wherein each planar test emitter is configured to emit electromagnetic waves directed to each target portion of the window.

46. The monitoring system according to claim 45, as dependent on claim 42, wherein each planar test target area is the respective target portion of the window.

47. The monitoring system according to claim 46, wherein each planar test optical system is configured to refract at least a portion of the electromagnetic waves emitted from each of the planar test emitters, thereby directing the electromagnetic waves toward each of the target portions of the window.

48. The monitoring system according to claim 46 or 47, wherein the center of each target portion of the window is equidistant from the centers of two or more other target portions of the window.

49. The monitoring system according to any one of claims 46 to 48, wherein the center of the target portion of the window forms a two-dimensional array on the window.

50. The monitoring system according to claim 46 or claim 47, wherein the target portion of the window is irregularly distributed throughout the entire window.

51. The monitoring system according to any one of claims 44 to 50, wherein the window is configured to reflect at least a portion of the electromagnetic waves emitted by the planar test emitter.

52. The monitoring system according to any one of claims 1 to 51, further comprising an intensity testing system, wherein the intensity testing system comprises a plurality of intensity testing optical systems, the intensity testing optical systems configured to redirect at least a portion of the electromagnetic waves emitted by one or more environmental mapping emitters.

53. Each of the aforementioned intensity testing optical systems is: Strength testing refractometer, Strength test reflector, Intensity testing diffractometer, Intensity testing optical splitter, Intensity testing optical filters, Strength testing optical switches, Intensity testing optical transmitter, and Intensity testing optical dispersant The monitoring system according to claim 52, comprising one or more of the following:

54. The monitoring system according to claim 52 or 53, wherein one or more of the intensity testing optical systems include intensity testing optical fibers.

55. Each intensity test optical system is, It extends from the incident end to the radial end, At least a portion of the electromagnetic waves emitted by one or more environmental mapping emitters and reflected from one or more of the planar test target areas are completely internally reflected along their length, The monitoring system according to any one of claims 52 to 54, configured to emit the completely internally reflected electromagnetic waves from its radiating end.

56. The aforementioned intensity testing optical system is A monitoring system according to any one of claims 52 to 55, as dependent on claim 44, configured to redirect at least a portion of the electromagnetic waves emitted by one or more environmental mapping emitters and reflected from the surface of the window.

57. The aforementioned sensing system, A lens system that defines the optical axis, Sensor module and Equipped with, The lens system is configured to focus the incident electromagnetic waves onto the sensor module. The aforementioned sensor module is The incident electromagnetic wave is detected, The monitoring system according to any one of claims 1 to 56, configured to generate sensing system data based at least partially on the detected incident electromagnetic wave.

58. The aforementioned sensing system, The system detects electromagnetic waves emitted by the environmental mapping emitter and reflected by the target region of the environment, which is directed by the respective aiming optical systems. The monitoring system according to claim 57, configured to generate sensing system data based at least partially on the detected electromagnetic waves.

59. The aforementioned lens system is plate The monitoring system according to claim 57 or 58, configured to focus the electromagnetic waves emitted by the environment mapping emitter and reflected by the target region of the environment, which is directed by the respective aiming optical systems, onto a first portion of the sensor module.

60. The aforementioned sensing system, The electromagnetic waves emitted by the depth test emitter are detected, A monitoring system according to any one of claims 57 to 59, as dependent on claim 22, configured to generate sensing system data based at least partially on the detected electromagnetic waves.

61. The aforementioned sensing system, The electromagnetic waves emitted from the radiation end of the depth test optical system are detected. A monitoring system according to any one of claims 57 to 60, as dependent on claim 25, configured to generate sensing system data based at least partially on the detected electromagnetic waves.

62. The monitoring system according to any one of claims 57 to 61, as dependent on claim 25, wherein the radiating end of the depth test optical system is arranged such that the depth test optical system radiates electromagnetic waves that have been completely internally reflected along the length of each of the depth test optical systems to a second portion of the sensor module.

63. The monitoring system according to claim 62, as dependent on claim 59, wherein there is no overlap between the first portion of the sensor module and the second portion of the sensor module.

64. The aforementioned sensing system, The electromagnetic waves emitted by the planar test emitter are detected, A monitoring system according to any one of claims 57 to 63, as dependent on claim 41, configured to generate sensing system data based at least partially on the detected electromagnetic waves.

65. The monitoring system according to any one of claims 57 to 64, wherein the lens system is configured to focus the electromagnetic waves emitted by the planar test emitter onto the sensor module.

66. The monitoring system according to claim 65, as dependent on claim 59, wherein the lens system is configured to focus the electromagnetic waves emitted by the planar test emitter onto the first portion of the sensor module.

67. The aforementioned sensing system, A monitoring system according to any one of claims 57 to 66, as dependent on claim 44, configured to detect the electromagnetic waves emitted by the planar test emitter and reflected by the window.

68. The monitoring system according to any one of claims 57 to 66, wherein the electromagnetic waves emitted by the planar test emitter are directed towards the sensor module.

69. The monitoring system according to any one of claims 57 to 66 or 68, wherein the electromagnetic waves emitted by the planar test emitter are directly directed to the sensor module.

70. The monitoring system according to claim 68 or 69, wherein the electromagnetic waves emitted by the planar test emitter bypass the lens system.

71. The aforementioned planar test system further comprises a planar test body, The planar test emitter is attached to the planar test body, and the monitoring system is according to any one of claims 41 to 51 or 57 to 70.

72. The planar test optical system is attached to the planar test body and is a monitoring system according to claim 42, any one of claims 43 to 51 dependent on claim 42, or any one of claims 57 to 71 dependent on claim 42.

73. The monitoring system according to claim 72, wherein the planar test emitter and the planar test optical system are attached to the planar test body to form a planar test radiation unit, and each planar test radiation unit comprises one of the planar test emitters and an associated planar test optical system.

74. The monitoring system according to claim 73, comprising a plurality of rows of planar test radiation units and a plurality of columns of planar test radiation units.

75. The monitoring system according to claim 73, wherein the planar test radiation units are irregularly arranged on the planar test body.

76. The aforementioned sensing system, Detects ambient electromagnetic waves, The monitoring system according to any one of claims 57 to 75, configured to generate the sensing system data based at least partially on the detected ambient electromagnetic waves.

77. The monitoring system according to any one of claims 57 to 76, as dependent on claim 2, wherein the first radiation module is positioned radially outward from the optical axis.

78. The monitoring system according to any one of claims 57 to 77, as dependent on claim 5, wherein the second radiation module is positioned radially outward from the optical axis.

79. The monitoring system according to any one of claims 57 to 78, as dependent on claim 10, wherein each radiation module is positioned radially outward from the optical axis.

80. The monitoring system according to claim 79, wherein each radiation module intersects a common plane perpendicular to the optical axis.

81. The monitoring system according to any one of claims 57 to 80, as dependent on claim 55, wherein the incident end of the intensity test optical system is positioned radially outward from the environment mapping emitter with respect to the optical axis.

82. The monitoring system according to any one of claims 57 to 81, as dependent on claim 52, wherein each intensity test optical system is configured to radiate at least a portion of the fully internally reflected electromagnetic waves toward the sensor module from its radiating end.

83. The surveillance system according to any one of claims 57 to 82, as dependent on claim 44, wherein each aiming optical system is configured to refract the electromagnetic waves emitted by the respective environmental mapping emitters and to direct the electromagnetic waves so that the reflected portion of the electromagnetic waves reflected from the window does not intersect with the lens system.

84. The inner radiation angle of the radiation angle range associated with at least one environment mapping emitter is greater than the inner radiation angle threshold at which the electromagnetic waves emitted by the at least one environment mapping emitter encounter the lens system. The monitoring system according to any one of claims 57 to 83, as dependent on claim 44, wherein the inner radiation angle and the inner radiation angle threshold are angles measured with respect to a front plane perpendicular to the optical axis.

85. The monitoring system according to any one of claims 1 to 84, wherein at least one of the environmental mapping system, the depth testing system, and the planar testing system comprises a laser configured to emit electromagnetic waves having a wavelength of 200 nm to 3000 nm.

86. The monitoring system according to any one of claims 1 to 85, wherein at least one of the environmental mapping system, the depth testing system, and the planar testing system comprises a laser configured to emit electromagnetic waves having a wavelength of 900 nm to 1000 nm.

87. The monitoring system according to any one of claims 1 to 86, further comprising an optical filter that is transparent to some electromagnetic waves and opaque to other electromagnetic waves.

88. The monitoring system according to claim 87, wherein the optical filter is a multibandpass optical filter.

89. The monitoring system according to claim 87 or 88, as dependent on claim 44, wherein the window comprises the optical filter.

90. The monitoring system according to claim 87 or claim 89, wherein the lens system comprises the optical filter.

91. At least one processor, A memory that stores program instructions accessible by the at least one processor and The monitoring system according to any one of claims 1 to 90, further comprising a control system comprising:

92. The program instruction is provided to at least one processor, At least one of the environmental mapping emitters is energized from the first radiation start time to the first radiation end time so that it emits electromagnetic waves directed toward a first obstacle in the environment of the monitoring system between the first radiation start time and the first radiation end time, and the first obstacle is At least partially optically transparent, Located between the aforementioned monitoring system and the second obstacle, During the first gate time, the detection operation of the sensing system is initiated. The detection operation is terminated at a second gate time that is later than the first gate time and differs from the first gate time by only the gate width. The monitoring system according to claim 91, configured to store sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation.

93. The monitoring system according to claim 92, wherein the first gate time differs from the first emission start time by only the detection time offset.

94. The monitoring system according to claim 93, wherein the detection time offset is a positive or negative offset.

95. The monitoring system according to claim 92, wherein the first gate time is the same as the first radiation start time.

96. The first gate time is associated with a first distance from the monitoring system, The second gate time is associated with the second distance from the monitoring system. The second distance is greater than the first distance. At least a portion of the first obstacle is located at a distance greater than the first distance and less than the second distance from the monitoring system. The monitoring system according to any one of claims 92 to 95, wherein the gate width is proportional to the difference between the first distance and the second distance.

97. The monitoring system according to any one of claims 92 to 96, wherein the electromagnetic waves detected during the detection operation include electromagnetic waves emitted by the at least one environment mapping emitter between the first emission start time and the first emission end time and reflected by the first obstacle.

98. The monitoring system according to any one of claims 92 to 97, wherein the sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the detection operation is stored in memory as a first time-of-flight data array.

99. The program instruction is provided to at least one processor, The multiple detection operations of the sensing system are repeatedly started and stopped, each starting at its respective start gate time and ending at its respective end gate time. The system is configured to store sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the aforementioned iteratively performed detection operation. The monitoring system according to any one of claims 92 to 98, wherein the electromagnetic waves detected during a plurality of the repeatedly performed detection operations include electromagnetic waves emitted by the at least one environment mapping emitter and reflected by the first obstacle.

100. The monitoring system according to claim 99, wherein the electromagnetic waves detected during a second plurality of the iteratively performed detection operations include electromagnetic waves emitted by the at least one environment mapping emitter and reflected by the first obstacle.

101. The program instruction is provided to at least one processor, The second detection operation of the sensing system is started at a third gate time that is after the first gate time and differs from the first gate time by only the gate offset. The second detection operation is terminated at a fourth gate time that is after the third gate time and differs from the third gate time by the second gate width. The monitoring system according to any one of claims 92 to 99, configured to store sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the second detection operation.

102. The gate offset is equal to or greater than the difference between the first gate time and the second gate time. The second detection operation is one of the plurality of repeatedly performed detection operations, The monitoring system according to claim 101, as dependent on claim 99, wherein the electromagnetic waves detected during the second detection operation include electromagnetic waves emitted by the at least one environment mapping emitter between the first emission start time and the first emission end time, and reflected by the second obstacle after passing through the first obstacle.

103. The monitoring system according to claim 101 or claim 102, wherein the third gate time differs from the first emission start time by only the second detection time offset, and the second detection time offset is greater than the first detection time offset.

104. The third gate time is associated with the third distance from the monitoring system, The fourth gate time is associated with the fourth distance from the monitoring system, The fourth distance is greater than the third distance. The monitoring system according to any one of claims 101 to 103, wherein at least a portion of the second obstacle is spaced away from the monitoring system by a distance greater than the third distance and less than the fourth distance.

105. The monitoring system according to any one of claims 101 to 104, wherein the electromagnetic waves detected during the second detection operation include electromagnetic waves emitted by the at least one environment mapping emitter, which have passed through the first obstacle and been reflected by the second obstacle.

106. The monitoring system according to any one of claims 92 to 105, wherein the program instruction further configures the at least one processor to energize the at least one environment mapping emitter from the second radiation start time to the second radiation end time so that the at least one environment mapping emitter emits electromagnetic waves directed toward the target region associated with the at least one environment mapping emitter between the second radiation start time and the second radiation end time.

107. The environmental mapping emitters (or multiple emitters) energized between the second radiation start time and the second radiation end time are the same as the environmental mapping emitters (or multiple emitters) energized between the first radiation start time and the first radiation end time, or The monitoring system according to claim 106, wherein the environmental mapping emitter(s) energized between the second radiation start time and the second radiation end time are different from the environmental mapping emitter(s) energized between the first radiation start time and the first radiation end time.

108. The program instruction is configured to cause the at least one processor to determine at least one subsequent environment mapping emitter to be energized during the second radiation, based at least in part on the sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the detection operation. The monitoring system according to any one of claims 105 to 107, wherein the at least one environmental mapping emitter energized from the second radiation start time to the second radiation end time is the determined subsequent environmental mapping emitter.

109. The monitoring system according to any one of claims 100 to 108, wherein the program instruction is configured to cause the at least one processor to determine the second gate width based at least in part on the sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the detection operation.

110. The monitoring system according to any one of claims 100 to 109, wherein the electromagnetic waves detected during the second detection operation include electromagnetic waves emitted by the at least one environment mapping emitter and reflected by the second obstacle without passing through the first obstacle.

111. The monitoring system according to any one of claims 100 to 110, wherein the sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the second detection operation is stored in memory as a second time-of-flight data array.

112. The second emission start time is after the first emission end time and before the third gate time. The monitoring system according to claim 105 or any one of claims 106 to 111, wherein the second radiation termination time is later than the first radiation termination time and before the fourth gate time.

113. The monitoring system according to claim 105 or any one of claims 106 to 112, wherein the incident electromagnetic wave detected during the second detection operation comprises an electromagnetic wave emitted by the at least one environment mapping emitter between the second radiation start time and the second radiation end time.

114. The monitoring system according to any one of claims 92 to 113, wherein the program instructions are further configured to cause the at least one processor to generate a monitoring system output based at least partially on the sensing system data.

115. The monitoring system according to claim 114, wherein the monitoring system output comprises monitoring system output data.

116. The sensing system data generated in response to the incident electromagnetic wave detected during the detection operation indicates the characteristics of the first obstacle. The monitoring system according to any one of claims 92 to 115, wherein the sensing system data generated in response to the incident electromagnetic wave detected during the second detection operation indicates the characteristics of the second obstacle.

117. The aforementioned characteristics are, The distance of the first obstacle from the monitoring system, The dimensions of the first obstacle, Obstacle label for identifying the type of the first obstacle, The opacity of the first obstacle, The reflectance of the first obstacle, The luminance of the first obstacle, The distance of the second obstacle from the monitoring system, The dimensions of the second obstacle, Obstacle label for identifying the type of the second obstacle, The opacity of the second obstacle mentioned above, The reflectance of the second obstacle, and Brightness of the second obstacle The monitoring system according to claim 116, which is associated with at least one of the following.

118. The monitoring system according to claim 116 or claim 117, wherein the first obstacle is within a first distance range associated with the first gate time and the second gate time with respect to the monitoring system.

119. The monitoring system according to any one of claims 116 to 118, wherein the second obstacle is within a second distance range associated with the third gate time and the fourth gate time with respect to the monitoring system.

120. The monitoring system according to any one of claims 116 to 119, wherein the shape of the first obstacle completely encompasses the shape of the second obstacle.

121. The monitoring system according to any one of claims 114 to 120, wherein the monitoring system output comprises a three-dimensional model of at least a portion of the environment, and the three-dimensional model comprises a virtual representation of the first obstacle and a virtual representation of the second obstacle.

122. The monitoring system according to any one of claims 114 to 121, wherein the monitoring system output comprises a time-of-flight data array.

123. The monitoring system according to claim 108, or any one of claims 109 to 122 as dependent on claim 108, wherein the at least one subsequent environmental mapping emitter emits electromagnetic waves having a different radiation profile between the second radiation start time and the second radiation end time than those emitted between the first radiation start time and the first radiation end time.

124. The monitoring system according to claim 123, wherein the program instructions are configured to cause the at least one processor to determine the different radiation profiles based at least in part on the sensing system data generated by the sensing system in response to the incident electromagnetic waves detected during the detection operation.

125. The monitoring system according to claim 124, wherein the frequency of the electromagnetic wave emitted by the at least one subsequent environmental mapping emitter between the second radiation start time and the second radiation end time is different from the frequency of the electromagnetic wave emitted by the at least one environmental mapping emitter between the first radiation start time and the first radiation end time.

126. The monitoring system according to claim 125, wherein the program instruction is configured to cause the at least one processor to determine the frequency of the electromagnetic wave emitted by the at least one subsequent environment mapping emitter between the second emission start time and the second emission end time, at least in part on the sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the detection operation.

127. The monitoring system according to claim 114, or any one of claims 115 to 126 as dependent on claim 114, wherein the monitoring system output adjusts the value of at least one control parameter.

128. The at least one control parameter comprises the control parameter of the monitoring system, Radiation frequency of at least one environment mapping emitter, Future radiation start times, The end time of the aforementioned future radiation, The first gate time for the future detection operation of the sensing system, The second gate time of the aforementioned future detection operation, Specific environmental mapping emitters that will be energized for future radiation, Polarization of electromagnetic waves emitted by at least one environmental mapping emitter, The number of detection operations for each electromagnetic wave emission, and The number of times one or more of the environmental mapping emitters are energized. The monitoring system according to claim 127, which is associated with at least one of the following.

129. The monitoring system according to claim 114, or any one of claims 115 to 128 as dependent on claim 114, wherein the monitoring system output adjusts the values ​​of one or more control parameters of another device located within the environment of the monitoring system.

130. The monitoring system according to claim 114, or any one of claims 115 to 129 as dependent on claim 114, wherein the monitoring system output causes the monitoring system to shut down another device located within the environment of the monitoring system.

131. The aforementioned second object is a device, The monitoring system according to claim 114, or any one of claims 115 to 130 as dependent on claim 114, wherein the at least one control parameter comprises the control parameter of the device.

132. The monitoring system according to claim 131, wherein the device is stopped by adjusting the value of the at least one control parameter.

133. The program instruction further provides the at least one processor, The sensor system is controlled to perform ambient condition detection operations. It is configured to store sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the ambient condition detection operation, The monitoring system according to any one of claims 92 to 132, wherein the ambient condition detection operation is performed for a period of time during which the detected incident electromagnetic wave is only ambient electromagnetic wave.

134. The monitoring system according to claim 133, wherein the program instructions are configured to cause the at least one processor to determine the monitoring system output based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the ambient state detection operation.

135. The program instruction is provided to at least one processor, At least one environmental mapping emitter is energized so that the environmental mapping emitter emits electromagnetic waves to and through a first obstacle in the environment of the monitoring system. The sensing system stores sensing system data generated by the sensing system in response to the detection of the electromagnetic waves emitted by the at least one environmental mapping emitter and reflected by the first obstacle. The monitoring system according to claim 91, configured to store sensing system data generated by the sensing system in response to the detection of electromagnetic waves emitted by at least one environmental mapping emitter and reflected by a second obstacle located behind the first obstacle.

136. The program instruction is provided to at least one processor, Over a first time window, the sensing system is used to perform a first detection operation. The system is configured to perform a second detection operation using the sensing system over a second time window. The second time window is after the first time window, The data from the aforementioned sensing system is Electromagnetic waves detected during the first time window, which are emitted by the at least one environment mapping emitter and reflected by the first obstacle, and Electromagnetic waves emitted by the at least one environment mapping emitter and reflected by the second obstacle during the second time window. A monitoring system according to claim 135, which is generated at least in part based on the above.

137. The monitoring system according to claim 135 or claim 136, wherein the program instructions are further configured to cause the at least one processor to generate a monitoring system output based at least partially on the sensing system data.

138. The output of the aforementioned monitoring system is: Characteristics of the first obstacle, Characteristics of the second obstacle, Time-of-flight data array, and A three-dimensional model of the environment comprising the virtual representation of the first obstacle and the virtual representation of the second obstacle. The monitoring system according to claim 137, comprising at least one of the following.

139. The monitoring system according to claim 137 or claim 138, wherein the monitoring system output adjusts the value of at least one control parameter.

140. The at least one control parameter comprises the control parameter of the monitoring system, Radiation frequency of at least one environment mapping emitter, Future radiation start times, The end time of the aforementioned future radiation, The first gate time for the future detection operation of the sensing system, The second gate time of the aforementioned future detection operation, Specific environmental mapping emitters that will be energized for future radiation, Polarization of electromagnetic waves emitted by at least one environmental mapping emitter, The number of detection operations for each electromagnetic wave emission, and The number of times one or more of the environmental mapping emitters are energized. The monitoring system according to claim 139, which is associated with at least one of the following.

141. The monitoring system according to any one of claims 137 to 140, wherein the monitoring system output is configured to adjust the values ​​of one or more control parameters of another device located within the environment of the monitoring system.

142. The aforementioned second object is a device, The monitoring system according to any one of claims 137 to 141, wherein the at least one control parameter comprises the control parameter of the device.

143. The monitoring system according to any one of claims 92 to 142, wherein the environmental mapping emitter is operated according to a radiation sequence comprising sequentially operating a plurality of the environmental mapping emitters.

144. The program instruction is provided to at least one processor, The radiation system is energized according to a radiation sequence so that it radiates electromagnetic waves into the environment near the radiation system. Using the aforementioned sensing system, the incident electromagnetic wave, which is an electromagnetic wave incident on the sensor module of the sensing system, is detected. The sensing system data is determined based at least partially on the detected incident electromagnetic wave. The monitoring system according to claim 91, configured to generate monitoring system output data based at least partially on the sensing system data.

145. The program instruction is provided to at least one processor, At least one depth test emitter is energized from the start time of depth emission to the end time of depth emission so that it emits electromagnetic waves directed toward the associated depth test optical system. Using the sensing system, electromagnetic waves emitted from the radiating end of the at least one depth test optical system are detected. The sensing system data is determined based at least partially on the detected electromagnetic waves. The sensing system data and the depth test profile are compared, A monitoring system according to any one of claims 91 to 144, as dependent on claims 57 and 25, configured to adjust the value of at least one control parameter in response to the value of at least one parameter of the sensing system data being different from the value of at least one corresponding parameter of the depth test profile.

146. The program instruction is provided to at least one processor, Each depth test emitter is energized from the start time of each depth test emission until the end time of each depth test emission. Using the aforementioned sensing system, electromagnetic waves emitted from the depth test optical system are detected. A monitoring system according to claim 91 or claim 145, as dependent on claims 57 and 25, configured to adjust the value of at least one control parameter based at least partially on the detected electromagnetic wave.

147. The program instruction is provided to at least one processor, The system is configured to determine sensing system data with a time delay associated with each depth test emitter, based at least partially on the detected electromagnetic waves. The monitoring system according to claim 146, wherein the time delay associated with a particular depth test emitter indicates the time between the energization of the depth test emitter and the detection of electromagnetic waves emitted from the depth test optical system associated with the depth test emitter.

148. The program instruction is provided to at least one processor, The sensing system data is compared with a depth test profile that includes the expected time delay parameters of each depth test emitter. The monitoring system according to claim 147, configured to adjust the value of the at least one control parameter in response to at least one of the determined time delays being different from the value of the corresponding expected time delay parameter of the depth test profile.

149. The monitoring system according to any one of claims 145 to 148, wherein the at least one control parameter comprises at least one control parameter of the monitoring system.

150. By adjusting the value of the at least one control parameter, The aforementioned monitoring system has stopped, The monitoring system issues an alarm and / or, The monitoring system according to claim 149, wherein the monitoring system transmits an alarm signal to another computing device.

151. The monitoring system according to any one of claims 145 to 150, wherein the at least one control parameter comprises at least one control parameter of another device.

152. By adjusting the value of the at least one control parameter, The aforementioned device stops, The device issues an alarm and / or, The monitoring system according to claim 151, wherein the device transmits an alarm signal to another computing device.

153. The program instruction is provided to at least one processor, At least one planar test system emitter is energized from the start time of planar radiation to the end time of planar radiation so that it emits electromagnetic waves directed toward the associated planar test system optical system. The sensor module is made to detect electromagnetic waves that include at least a portion of the electromagnetic waves emitted by the at least one planar test emitter between the planar radiation start time and the planar radiation end time. The sensing system data is determined based at least partially on the detected electromagnetic waves. The sensing system data is compared with the planar test criteria. A monitoring system according to any one of claims 91 to 152, as dependent on claim 57 and claim 42, configured to adjust the value of at least one control parameter in response to the value of at least one parameter of the sensing system data being different from the value of the planar test criterion.

154. The program instruction is provided to at least one processor, Each planar test emitter is energized from the start time of each planar radiation to the end time of each planar radiation. The sensor module is made to detect electromagnetic waves comprising at least a portion of the electromagnetic waves emitted by the planar test emitter, which are incident on the sensor module. The monitoring system according to claim 91, as dependent on claims 57 and 42, configured to adjust the value of at least one control parameter based at least partially on the detected electromagnetic wave.

155. The detected electromagnetic waves are Emitted by at least one planar test emitter, Reflected by the blue window, The monitoring system according to claim 153 or claim 154, as dependent on claim 44, further comprising electromagnetic waves incident on the sensor module.

156. The program instruction is provided to at least one processor, The sensing system data is determined based at least partially on the detected electromagnetic waves. A monitoring system according to claim 154 or claim 155 as dependent on claim 154, configured to adjust the value of the at least one control parameter in response to the value of at least one parameter of the sensing system data being different from the value of a planar test criterion.

157. The aforementioned planar test standards are: A time delay criterion associated with the time delay between the start time of the planar radiation and the time at which the electromagnetic waves emitted by each planar test emitter are detected in the sensor module, and Position reference associated with the position on the sensor module where the electromagnetic waves emitted by each planar test emitter are detected. The monitoring system according to claim 153 or claim 156, comprising at least one of the following.

158. The monitoring system according to any one of claims 153 to 157, wherein the at least one control parameter comprises at least one control parameter of the monitoring system.

159. By adjusting the value of the at least one control parameter, The aforementioned monitoring system has stopped, The monitoring system issues an alarm and / or, The monitoring system according to any one of claims 153 to 158, wherein the monitoring system transmits an alarm signal to another computing device.

160. The monitoring system according to any one of claims 153 to 159, wherein the at least one control parameter comprises at least one control parameter of another device.

161. By adjusting the value of the at least one control parameter, The aforementioned device stops, The device issues an alarm and / or, The monitoring system according to claim 160, wherein the device transmits an alarm signal to another computing device.

162. The program instruction is provided to at least one processor, At least one of the environmental mapping emitters is energized from the intensity emission start time to the intensity emission end time. The sensor module is made to detect electromagnetic waves comprising at least a portion of the electromagnetic waves emitted by the at least one environment mapping emitter between the intensity emission start time and the intensity emission end time, and directed toward the sensor module by the at least one intensity test optical system. A monitoring system according to any one of claims 91 to 161, as dependent on claim 52, configured to adjust the value of at least one control parameter based at least partially on the detected electromagnetic wave.

163. The program instruction is provided to at least one processor, At least one environmental mapping emitter is energized from the intensity emission start time to the intensity emission end time so that it emits electromagnetic waves directed toward the window. Detect electromagnetic waves comprising electromagnetic waves emitted from the radiating end of one or more intensity test optical systems toward the sensor module, which are emitted by the at least one environment mapping emitter between the intensity emission start time and the intensity emission end time, reflected from the window and directed toward the sensor module by the at least one intensity test optical system, The sensing system data is determined based at least partially on the detected electromagnetic waves. A monitoring system according to any one of claims 91 to 161, as dependent on claim 52 and claim 44, configured to adjust the value of at least one control parameter in response to the value of one or more parameters of the sensing system data being different from the value of at least one intensity index.

164. The aforementioned at least one intensity test optical system is The monitoring system according to claim 163, wherein at least a portion of the electromagnetic waves emitted by the at least one environment mapping emitter and reflected by the window between the intensity emission start time and the intensity emission end time is completely internally reflected along the length of the at least one intensity test optical system, and at least a portion of the completely internally reflected electromagnetic waves are emitted from the emission end of the intensity test reflector toward the sensor module.

165. The monitoring system according to any one of claims 163 or 164, wherein the at least one intensity index is associated with the expected intensity of the electromagnetic waves radiated from the radiating end of one or more intensity test optical systems to the sensor module, and comprises an acceptable intensity range.

166. A monitoring system according to any one of claims 162 to 165, as dependent on claim 92, wherein the intensity radiation start time is the first radiation start time and the intensity radiation end time is the intensity radiation end time.

167. The monitoring system according to any one of claims 162 to 166, wherein the at least one control parameter comprises at least one control parameter of the monitoring system.

168. By adjusting the value of the at least one control parameter, The aforementioned monitoring system has stopped, The monitoring system issues an alarm and / or, The monitoring system according to any one of claims 162 to 167, wherein the monitoring system transmits an alarm signal to another computing device.

169. The monitoring system according to any one of claims 162 to 168, wherein the at least one control parameter comprises at least one control parameter of another device.

170. By adjusting the value of the at least one control parameter, The aforementioned device stops, The device issues an alarm and / or, The monitoring system according to claim 169, wherein the device transmits an alarm signal to another computing device.

171. It is a monitoring system, A radiation system comprising one or more environment mapping emitters, each configured to emit electromagnetic waves toward a respective target area of ​​the environment of the monitoring system, A sensing system configured to generate sensing system data based at least partially on the electromagnetic waves emitted by the environmental mapping emitter and reflected by the target area of ​​the environment, A monitoring system equipped with the following features.

172. It is a monitoring system, An environment mapping emitter configured to emit radiation to each target region of the environment of the monitoring system, A sensing system configured to generate sensing system data based at least partially on a portion of the radiation emitted by the environment mapping emitter and reflected by the target region of the environment. A monitoring system equipped with the following features.

173. The mapping radiation system is energized according to a radiation sequence so that it emits electromagnetic waves into the environment near the mapping radiation system, The detection of incident electromagnetic waves using a sensing system, wherein the incident electromagnetic waves are As part of the aforementioned radiation sequence, the mapping radiation system emits, Reflected by the aforementioned environment, The electromagnetic waves incident on the sensor module of the aforementioned sensing system include, Determining sensing system data based at least partially on the detected incident electromagnetic wave, The monitoring system output data is generated based at least partially on the aforementioned sensing system data. A method for providing this.

174. The incident electromagnetic wave is As part of the aforementioned radiation sequence, the mapping radiation system emits, Oriented to pass through the first environmental obstacle, Reflected from a second environmental obstacle located behind the first environmental obstacle, The method according to claim 173, comprising electromagnetic waves incident on the sensor module of the sensing system.

175. The mapping emission system comprises a plurality of environmental mapping emitters, The method according to claim 173 or claim 174, wherein energizing the mapping radiation system in accordance with the radiation sequence comprises energizing the environmental mapping emitter in accordance with the radiation sequence.

176. The method according to claim 175, wherein energizing the plurality of environmental mapping emitters according to the radiation sequence comprises sequentially energizing one or more subsets of the plurality of environmental mapping emitters.

177. The method according to any one of claims 173 to 176, wherein energizing the environmental mapping emitters according to the radiation sequence comprises sequentially energizing one environmental mapping emitter at a time.

178. The method according to claim 177, wherein energizing the plurality of environmental mapping emitters according to the emission sequence comprises de-energizing all of the environmental mapping emitters while sequentially energizing one or more subsets of the environmental mapping emitters.

179. Detecting incident electromagnetic waves is The incident electromagnetic wave is detected before energizing the mapping radiation system, The mapping radiation system detects incident electromagnetic waves while it is energized according to the radiation sequence, and / or, The mapping radiation system detects incident electromagnetic waves after being energized according to the radiation sequence. The method according to any one of claims 173 to 178, comprising:

180. The incident electromagnetic wave is, During each of the sequential energization of one or more subsets of the environmental mapping emitters, and The method according to claim 179, as dependent on claim 178, which is detected while all of the environmental mapping emitters are de-energized during the sequential energization of one or more subsets of the environmental mapping emitters.

181. Determining the aforementioned sensing system data means Determining the energization state data based at least partially on the incident electromagnetic waves emitted by the mapping radiation system while energized, Determining ambient condition data based at least partially on ambient incident electromagnetic waves and The method according to any one of claims 173 to 180, comprising:

182. The method according to claim 181, wherein determining the sensing system data comprises comparing the energized state data with the ambient state data.

183. The method according to claim 181 or claim 182, wherein determining the sensing system data comprises processing the ambient state data and the energized state data.

184. The sensing system data includes time-delay data, The aforementioned time difference data comprises multiple time difference data elements, Each time difference data element indicates the time difference between the first time and the second time. The first time is associated with one of the starting points of the energization sequence, The method according to any one of claims 176 to 178, or any one of claims 179 to 183 as dependent on claim 176, wherein the second time is associated with the time at which the detected intensity of the incident electromagnetic wave exceeds an intensity threshold.

185. The method according to claim 184, wherein the sensing system data comprises time-difference data elements relating to one or more sensing units of the sensing system, and the sensing units are configured to respond to the intensity of the incident electromagnetic wave.

186. The method according to claim 184 or claim 185, wherein each time difference element indicates the distance traveled by the detected electromagnetic wave emitted by the mapping radiation system.

187. The method according to any one of claims 173 to 186, wherein the monitoring system output data comprises a matrix indicating the state of the environment.

188. The method according to any one of claims 173 to 187, wherein the sensing system data indicates the intensity of the incident electromagnetic wave.

189. The method according to any one of claims 173 to 188, further comprising determining an operating scenario of the monitoring system based at least in part on the sensing system data.

190. The method according to claim 189, wherein generating the monitoring system output data in response to the determination that the operation scenario is a first operation scenario comprises generating three-dimensional state data indicating the state of at least a part of the environment of the monitoring system.

191. The method according to claim 189, wherein generating the monitoring system output data in response to the determination that the operation scenario is a second operation scenario comprises generating an obstacle environment output indicating the state of the obstacles in the environment.

192. The method according to claim 189, wherein generating the monitoring system output data in response to the determination that the operation scenario is a third operation scenario comprises generating a device stop output configured to stop a device in the environment.

193. The method according to claim 189, wherein generating the monitoring system output data in response to the determination that the operation scenario is a third operation scenario comprises generating a monitoring system stop output configured to stop the mapping radiation system.

194. The method according to any one of claims 173 to 183, further comprising using the sensing system to detect incident electromagnetic waves within a plurality of time windows, each associated with one or more radiations of the radiation sequence.

195. The method according to claim 194, wherein one or more starting points of the time window are delayed by a predetermined time delay after the associated radiation of the radiation sequence.

196. The method according to claim 194 or claim 195, wherein one or more of the time windows are associated with a distance range, the distance range being the range of distances over which electromagnetic waves emitted by the mapping radiation system have been reflected by the environment before detection.

197. A method for monitoring the environment using a monitoring system, At least one environmental mapping emitter is energized from the first radiation start time to the first radiation end time so that it emits electromagnetic waves directed toward a first obstacle in the environment of the monitoring system between the first radiation start time and the first radiation end time, wherein the first obstacle is At least partially optically transparent, The monitoring system is located between the second obstacle, At the first gate time, the detection operation of the sensing system is initiated, The detection operation is terminated at a second gate time that is later than the first gate time and differs from the first gate time by only the gate width. The system stores the sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the aforementioned detection operation. A method for providing this.

198. The method according to claim 197, further comprising generating the sensing system data based at least partially on the incident electromagnetic wave detected during the detection operation.

199. The method according to claim 197 or claim 198, wherein the first gate time differs from the first emission start time by only the detection time offset.

200. The method according to claim 199, wherein the detection time offset is a positive offset or a negative offset.

201. The method according to claim 198, wherein the first gate time is the same as the first emission start time.

202. The first gate time is associated with a first distance from the sensing system, The second gate time is associated with the second distance from the monitoring system. The second distance is greater than the first distance. At least a portion of the first obstacle is located at a distance greater than the first distance and less than the second distance from the monitoring system. The method according to any one of claims 197 to 201, wherein the gate width is proportional to the difference between the first distance and the second distance.

203. The method according to any one of claims 197 to 202, wherein the electromagnetic waves detected during the detection operation include electromagnetic waves emitted by the at least one environment mapping emitter between the first emission start time and the first emission end time and reflected by the first obstacle.

204. The method according to any one of claims 197 to 203, wherein the sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the detection operation is stored in memory as a first time-of-flight data array.

205. This involves repeatedly starting and ending multiple detection operations, each starting at its respective start gate time and ending at its respective end gate time. The system stores sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the aforementioned iteratively performed detection operation. Equipped with, The method according to any one of claims 197 to 203, wherein the electromagnetic waves detected during a plurality of the iteratively performed detection operations include electromagnetic waves emitted by the at least one environment mapping emitter and reflected by the first obstacle.

206. The method according to claim 205, wherein the electromagnetic waves detected during the second plurality of the iteratively performed detection operations include electromagnetic waves emitted by the at least one environment mapping emitter and reflected by the first obstacle.

207. The second detection operation of the sensing system is initiated at a third gate time that is after the first gate time and differs from the first gate time by only the gate offset. The second detection operation is terminated at a fourth gate time that is after the third gate time and differs from the third gate time by the second gate width, The sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the second detection operation is stored. The method according to any one of claims 197 to 206, further comprising:

208. The gate offset is equal to or greater than the difference between the first gate time and the second gate time. The second detection operation is one of the plurality of repeatedly performed detection operations, The method according to claim 207, as dependent on claim 205, wherein the electromagnetic waves detected during the second detection operation include electromagnetic waves emitted by the at least one environment mapping emitter between the first emission start time and the first emission end time, and reflected by the second obstacle after passing through the first obstacle.

209. The method according to claim 206 or claim 207, wherein the third gate time differs from the first emission start time by only the second detection time offset, and the second detection time offset is greater than the first detection time offset.

210. The third gate time is associated with the third distance from the sensing system, The fourth gate time is associated with the fourth distance from the sensing system, The fourth distance is greater than the third distance. The method according to any one of claims 206 to 209, wherein at least a portion of the second obstacle is spaced away from the monitoring system by a distance greater than the third distance and less than the fourth distance.

211. The method according to any one of claims 206 to 210, wherein the electromagnetic waves detected during the second detection operation include electromagnetic waves emitted by the at least one environment mapping emitter, which have passed through the first obstacle and been reflected by the second obstacle.

212. The method according to any one of claims 197 to 211, further comprising energizing at least one of the environment mapping emitters from the second radiation start time to the second radiation end time so that the at least one environment mapping emitter emits electromagnetic waves directed toward the target region associated with the at least one environment mapping emitter between the second radiation start time and the second radiation end time.

213. The method according to claim 212, wherein the environmental mapping emitter(s) energized between the second radiation start time and the second radiation end time is the same as the environmental mapping emitter(s) energized between the first radiation start time and the first radiation end time.

214. The method according to claim 212, wherein the environmental mapping emitter(s) energized between the second radiation start time and the second radiation end time are different from the environmental mapping emitter(s) energized between the first radiation start time and the first radiation end time.

215. The further comprising determining at least one subsequent environmental mapping emitter to be activated during the second radiation, based at least in part on the sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the detection operation, The method according to any one of claims 212 to 214, wherein the at least one environmental mapping emitter energized from the second radiation start time to the second radiation end time is the determined subsequent environmental mapping emitter.

216. The method according to any one of claims 206 to 215, further comprising determining the second gate width at least in part on the sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the detection operation.

217. The method according to any one of claims 206 to 216, wherein the electromagnetic waves detected during the second detection operation include electromagnetic waves emitted by the at least one environment mapping emitter and reflected by the second obstacle without passing through the first obstacle, and the second obstacle is located within a second gate distance window associated with the third gate time and the fourth gate time.

218. The method according to any one of claims 206 to 217, wherein the sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the second detection operation is stored in memory as a second time-of-flight data array.

219. The second emission start time is after the first emission end time and before the third gate time. The method according to claim 212 or any one of claims 213 to 218, wherein the second radiation termination time is later than the first radiation termination time and earlier than the fourth gate time.

220. The method according to claim 212 or any one of claims 213 to 219, wherein the incident electromagnetic wave detected during the second detection operation comprises an electromagnetic wave radiated between the second radiation start time and the second radiation end time.

221. The method according to any one of claims 197 to 220, further comprising generating a monitoring system output based at least partially on the sensing system data.

222. The method according to claim 221, wherein the monitoring system output comprises monitoring system output data.

223. The sensing system data generated in response to the incident electromagnetic wave detected during the detection operation indicates the characteristics of the first obstacle. The method according to any one of claims 197 to 222, wherein the sensing system data generated in response to the incident electromagnetic wave detected during the second detection operation indicates the characteristics of the second obstacle.

224. The aforementioned characteristics are, The distance of the first obstacle from the monitoring system, The dimensions of the first obstacle, Obstacle label for identifying the type of the first obstacle, The opacity of the first obstacle, The reflectance of the first obstacle, The luminance of the first obstacle, The distance of the second obstacle from the monitoring system, The dimensions of the second obstacle, Obstacle label for identifying the type of the second obstacle, The opacity of the second obstacle mentioned above, The reflectance of the second obstacle, and Brightness of the second obstacle The method according to claim 223, which is associated with at least one of the following.

225. The method according to claim 223 or claim 224, wherein the first obstacle is within a first distance range associated with the first gate time and the second gate time.

226. The method according to any one of claims 223 to 225, wherein the second obstacle is within a second distance range associated with the third gate time and the fourth gate time.

227. The method according to any one of claims 223 to 226, wherein the shape of the first obstacle completely encompasses the shape of the second obstacle.

228. The method according to any one of claims 223 to 227, wherein the monitoring system output comprises a three-dimensional model of the environment, and the three-dimensional model comprises a virtual representation of the first obstacle and a virtual representation of the second obstacle.

229. The method according to any one of claims 223 to 228, wherein the monitoring system output comprises a time-of-flight data array.

230. The method according to claim 215, or according to any one of claims 216 to 229 as dependent on claim 215, wherein the at least one subsequent environment mapping emitter emits electromagnetic waves having a different radiation profile between the second radiation start time and the second radiation end time than those emitted between the first radiation start time and the first radiation end time.

231. The method according to claim 230, further comprising determining the different radiation profiles based at least in part on the sensing system data generated by the sensing system in response to the incident electromagnetic waves detected during the detection operation.

232. The method according to claim 231, wherein the frequency of the electromagnetic wave emitted by the at least one subsequent environmental mapping emitter between the second radiation start time and the second radiation end time is different from the frequency of the electromagnetic wave emitted by the at least one environmental mapping emitter between the first radiation start time and the first radiation end time.

233. The method according to claim 232, further comprising determining the frequency of the electromagnetic wave emitted by the at least one subsequent environment mapping emitter between the second emission start time and the second emission end time, based at least in part on the sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the detection operation.

234. The method according to claim 221, or any one of claims 222 to 233 as dependent on claim 221, wherein the monitoring system output adjusts the value of at least one control parameter of the monitoring system comprising the sensing system.

235. The at least one control parameter is, Radiation frequency of at least one environment mapping emitter, Future radiation start times, The end time of the aforementioned future radiation, The first gate time for the future detection operation of the sensing system, The second gate time of the aforementioned future detection operation, Specific environmental mapping emitters that will be energized for future radiation, Polarization of electromagnetic waves emitted by at least one environmental mapping emitter, The number of detection operations for each electromagnetic wave emission, and The number of times one or more environment mapping emitters are energized. The method according to claim 234, which is associated with the present invention.

236. The method according to claim 221, or any one of claims 222 to 235 as dependent on claim 221, wherein the monitoring system output adjusts the values ​​of one or more control parameters of another device located in the environment of the sensing system.

237. The method according to claim 221, or any one of claims 222 to 236 as dependent on claim 221, wherein the monitoring system output causes the sensing system to shut down another device located within the environment.

238. The aforementioned second object is a device, The method according to claim 221 or any one of claims 222 to 237, wherein the at least one control parameter comprises the control parameter of the device.

239. The method according to claim 238, wherein the device is stopped by adjusting the value of the at least one control parameter.

240. The sensor system is controlled to perform ambient condition detection operations, The system stores the sensing system data generated by the sensing system in response to the incident electromagnetic wave detected during the ambient condition detection operation. Furthermore, The method according to any one of claims 197 to 238, wherein the ambient state detection operation is performed for a period of time during which the detected incident electromagnetic wave is only ambient electromagnetic wave.

241. The method according to any one of claims 221 to 240, further comprising determining the monitoring system output at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic waves detected during the ambient condition detection operation.

242. The environmental mapping emitter is energized such that it emits electromagnetic waves towards and through a first obstacle in the environment, The system stores sensing system data generated by the sensing system in response to the detection of the electromagnetic waves emitted by the at least one environmental mapping emitter and reflected by the first obstacle, The system stores sensing system data generated by the sensing system in response to the detection of the electromagnetic waves emitted by the at least one environmental mapping emitter and reflected by the second obstacle located behind the first obstacle. A method for providing this.

243. Performing a first detection operation using the sensing system over a first time window, The second detection operation is performed using the sensing system over a second time window that is after the first time window, The system generates sensing data based at least partially on electromagnetic waves emitted by the at least one environmental mapping emitter and reflected by the first obstacle, which are detected during the first time window. Detecting electromagnetic waves emitted by the at least one environment mapping emitter and reflected by the second obstacle during the second time window, To generate sensing system data based at least partially on electromagnetic waves emitted by the at least one environmental mapping emitter and reflected by the second obstacle, which are detected during the second time window. The method according to claim 242, further comprising:

244. The method according to claim 242 or claim 243, further comprising generating a monitoring system output based at least partially on the sensing system data.

245. The output of the aforementioned monitoring system is: Characteristics of the first obstacle, Characteristics of the second obstacle, Time-of-flight data array, and A three-dimensional model of the environment comprising the virtual representation of the first obstacle and the virtual representation of the second obstacle. The method according to claim 244, comprising at least one of the following.

246. The method according to claim 244 or claim 245, wherein the monitoring system output adjusts the value of at least one control parameter.

247. The at least one control parameter comprises the control parameter of the monitoring system, Radiation frequency of at least one environment mapping emitter, Future radiation start times, The end time of the aforementioned future radiation, The first gate time for the future detection operation of the sensing system, The second gate time of the aforementioned future detection operation, Specific environmental mapping emitters that will be energized for future radiation, Polarization of electromagnetic waves emitted by at least one environmental mapping emitter, The number of detection operations for each electromagnetic wave emission, and The number of times one or more of the environmental mapping emitters are energized. The method according to claim 246, which is associated with the present invention.

248. The method according to any one of claims 244 to 247, wherein the monitoring system output is configured to adjust the values ​​of one or more control parameters of another device located in the environment of the sensing system.

249. The aforementioned second object is a device, The method according to claim 247 or claim 248, wherein the at least one control parameter comprises a control parameter of the device.

250. The method according to any one of claims 197 to 249, further comprising activating the environmental mapping emitters according to a radiation sequence comprising sequentially activating a plurality of the environmental mapping emitters.

251. The radiation system is energized according to a radiation sequence so that it radiates electromagnetic waves into the environment near the radiation system, Using a sensing system, detect the incident electromagnetic wave, which is an electromagnetic wave incident on the sensor module of the sensing system, Determining sensing system data based at least partially on the detected incident electromagnetic wave, The monitoring system output data is generated based at least partially on the aforementioned sensing system data. A method for providing this.

252. A method for testing a monitoring system, The depth test system is energized in the monitoring system such that it emits electromagnetic waves from the end of at least one depth test optical system toward the sensor module of the monitoring system's sensing system, Using the sensing system, the electromagnetic waves emitted from the end of the at least one depth test optical system are detected. Determining sensing system data based at least partially on the detection of the electromagnetic waves emitted from the end of the at least one depth test optical system by the sensing system, Comparing the aforementioned sensing system data with the depth test profile, In response to the fact that the value of one or more parameters in the sensing system data differs from the value of one or more parameters in the depth test profile, the value of at least one control parameter is adjusted. A method for providing this.

253. The aforementioned sensing system data includes time difference parameters for each depth test optical system, The value of each time difference parameter indicates the time difference between the first time and the second time. The first time corresponds to the time during which the depth test system is energized. The method according to claim 252, wherein the second time corresponds to the time during which the electromagnetic waves emitted from the respective ends of the depth test optical systems are detected by the sensing system.

254. The method according to claim 253, wherein the value of one or more parameters of the sensing system data is the value of the time difference parameter (or more parameters).

255. The method according to any one of claims 252 to 254, wherein the one or more parameters of the depth test profile include an expected time delay value indicating the expected time delay between the energization of the depth test system and the detection of the electromagnetic waves radiated from the end of the at least one depth test reflector by the sensing system.

256. The method according to any one of claims 252 to 255, wherein the at least one depth test optical system comprises a plurality of depth test optical systems, each having a different length.

257. A method for testing a monitoring system, At least one depth test emitter is energized from the start time of depth emission to the end time of depth emission so that it emits electromagnetic waves directed toward the associated depth test optical system, The sensing system is used to detect electromagnetic waves emitted from the radiating end of the depth test optical system, Determining sensing system data based at least partially on the detected electromagnetic waves, Comparing the aforementioned sensing system data with the depth test profile, In response to the fact that the value of at least one parameter of the sensing system data differs from the value of at least one corresponding parameter of the depth test profile, the value of at least one control parameter is adjusted. A method for providing this.

258. A method for testing a monitoring system, The monitoring system's depth test emitters are energized from the start time of each depth radiation to the end time of each depth radiation, The sensing system is used to detect electromagnetic waves emitted from the depth test optical system of the monitoring system, Adjusting the value of at least one control parameter based at least partially on the detected electromagnetic wave. A method for providing this.

259. The sensing system data is determined at least partially based on the detected electromagnetic waves, wherein the sensing system data includes a time delay associated with each depth test emitter. The method according to claim 258, wherein the time delay associated with a particular depth test emitter indicates the time between the energization of the depth test emitter and the detection of electromagnetic waves emitted from the depth test optical system associated with the depth test emitter.

260. The sensing system data is compared with a depth test profile that includes the expected time delay parameters of each depth test emitter. In response to at least one of the determined time delays being different from the value of the corresponding expected time delay parameter of the depth test profile, the value of the at least one control parameter is adjusted. The method according to claim 259, further comprising:

261. The method according to any one of claims 252 to 260, wherein the at least one control parameter comprises at least one control parameter of the monitoring system.

262. By adjusting the value of the at least one control parameter, The aforementioned monitoring system has stopped, The monitoring system issues an alarm and / or, The method according to claim 261, wherein the monitoring system transmits an alarm signal to another computing device.

263. The method according to any one of claims 252 to 262, wherein the at least one control parameter comprises at least one control parameter of another device.

264. By adjusting the value of the at least one control parameter, The aforementioned device stops, The device issues an alarm and / or, The method according to claim 263, wherein the device transmits an alarm signal to another computing device.

265. A method for testing a monitoring system, The planar test system is energized in accordance with the planar test radiation sequence so that it radiates electromagnetic waves toward the surface of the monitoring system, Using the sensing system of the monitoring system, detect incident electromagnetic waves that are incident on the sensor module of the sensing system and comprise at least a portion of the electromagnetic waves that are emitted by the planar test system and reflected by the surface, Determining sensing system data based at least partially on the detected incident electromagnetic wave, Comparing the aforementioned sensing system data with the planar test criteria, In response to the value of one or more parameters of the sensing system data differing from the value of the planar test criterion, the value of one or more control parameters of the monitoring system is adjusted. A method for providing this.

266. The planar test system comprises a plurality of planar test emitters, The method according to claim 265, wherein energizing the planar test system according to the planar test radiation sequence comprises energizing one or more subsets of the planar test emitters.

267. The method according to claim 266, wherein energizing the planar test system according to the planar test emission sequence comprises sequentially energizing a subset of the planar test emitters one at a time.

268. The method according to claim 266 or claim 267, wherein each subset of the planar test emitters comprises a plurality of planar test emitters.

269. The method according to any one of claims 266 to 268, wherein the planar test system comprises a first number of planar test emitter rows and a second number of planar test emitter rows.

270. The method according to claim 269, as dependent on claim 267, wherein each subset of the plurality of planar test emitters comprises one planar test system emitter in each column and one planar test system emitter in each row.

271. A method for testing a monitoring system, At least one planar test system emitter is energized from the start time of planar radiation to the end time of planar radiation so that it emits electromagnetic waves directed toward the associated planar test system optical system, The detection of electromagnetic waves incident on the sensor module, comprising at least a portion of the electromagnetic waves emitted by the at least one planar test emitter between the planar radiation start time and the planar radiation end time, Determining sensing system data based at least partially on the detected electromagnetic waves, Comparing the aforementioned sensing system data with the planar test criteria, In response to the fact that the value of at least one parameter of the sensing system data differs from the value of the planar test criterion, the value of at least one control parameter is adjusted. A method for providing this.

272. A method for testing a monitoring system, comprising energizing multiple planar test emitters from the start time of each planar radiation to the end time of each planar radiation, The sensor module detects electromagnetic waves comprising at least a portion of the electromagnetic waves emitted by the planar test emitter, Adjusting the value of at least one control parameter based at least partially on the detected electromagnetic wave. A method for providing this.

273. The detected electromagnetic waves are Emitted by at least one planar test emitter, Reflected by the window, The method according to claim 271 or claim 272, further comprising electromagnetic waves incident on the sensor module.

274. Determining sensing system data based at least partially on the detected electromagnetic waves, In response to the fact that the value of at least one parameter of the sensing system data differs from the value of the planar test standard, the value of at least one control parameter is adjusted. The method according to claim 272 or claim 273, further comprising:

275. The aforementioned planar test standards are: A time delay criterion associated with the time delay between the first planar radiation start time and the time at which the electromagnetic waves emitted by each planar test emitter are detected in the sensor module, and Position reference associated with the position on the sensor module where the electromagnetic waves emitted by each planar test emitter are detected. The method according to claim 271 or claim 274, comprising at least one of the following.

276. The method according to any one of claims 271 to 275, wherein the at least one control parameter comprises at least one control parameter of the monitoring system.

277. By adjusting the value of the at least one control parameter, The aforementioned monitoring system has stopped, The monitoring system issues an alarm and / or, The method according to any one of claims 271 to 276, wherein the monitoring system transmits an alarm signal to another computing device.

278. The method according to any one of claims 271 to 277, wherein the at least one control parameter comprises at least one control parameter of another device.

279. By adjusting the value of the at least one control parameter, The aforementioned device stops, The device issues an alarm and / or, The method according to claim 278, wherein the device transmits an alarm signal to another computing device.

280. A method for testing a monitoring system, The mapping radiation system of the monitoring system is energized so that it radiates electromagnetic waves toward the window of the monitoring system, To completely internally reflect at least a portion of the electromagnetic waves emitted by the mapping radiation system and reflected by the window along the length of the intensity test optical system, and to ensure that at least a portion of the completely internally reflected electromagnetic waves are emitted from the radiation end of the intensity test reflector toward the sensor module of the sensing system of the monitoring system, Using the sensing system, the electromagnetic waves emitted from the radiation end of the intensity test optical system are detected. The sensing system determines the sensing system data at least partially based on the detection of the electromagnetic waves emitted from the radiation end of the intensity test optical system by the sensing system, Comparing the aforementioned sensing system data with the intensity index, In response to the value of one or more parameters of the sensing system data being different from the value of the intensity index, the value of one or more control parameters of the monitoring system is adjusted. A method for providing this.

281. The method according to claim 280, wherein the sensing system data comprises a value of an intensity parameter, and the value of the intensity parameter indicates the intensity of the electromagnetic wave emitted from the radiating end of the intensity test optical system.

282. The method according to claim 280 or claim 281, wherein the value of the intensity index indicates the minimum operating intensity of the electromagnetic waves radiated from the radiating end of the intensity test reflector.

283. A method for testing a monitoring system, At least one environmental mapping emitter is energized from the intensity emission start time to the intensity emission end time, The detection of electromagnetic waves incident on the sensor module, comprising at least a portion of the electromagnetic waves emitted by the at least one environment mapping emitter between the intensity emission start time and the intensity emission end time, and directed toward the sensor module by the at least one intensity test optical system, Adjusting the value of at least one control parameter based at least partially on the detected electromagnetic wave. A method for providing this.

284. A method for testing a monitoring system, At least one environmental mapping emitter is energized from the intensity emission start time to the intensity emission end time so that it emits electromagnetic waves directed toward the window, Detecting electromagnetic waves that are emitted from the radiating ends of one or more intensity test optical systems to a sensor module, which are emitted by the at least one environment mapping emitter between the intensity emission start time and the intensity emission end time, reflected from the window and directed toward the sensor module by the at least one intensity test optical system, Determining sensing system data based at least partially on the detected electromagnetic waves, In response to the value of one or more parameters in the sensing system data differing from the value of at least one intensity index, the value of at least one control parameter is adjusted. A method for providing this.

285. The method according to claim 284, further comprising the at least one intensity test optical system completely internally reflecting, along the length of the at least one intensity test optical system, at least a portion of the electromagnetic waves emitted by the at least one environment mapping emitter and reflected by the window between the first intensity emission start time and the first intensity emission end time, so that at least a portion of the completely internally reflected electromagnetic waves are emitted from the emission end of the intensity test reflector toward the sensor module.

286. The method according to any one of claims 284 or 285, wherein the at least one intensity index comprises the intensity of the electromagnetic waves radiated from the radiating end of one or more intensity test optical systems to the sensor module, and comprises an acceptable intensity range.

287. The method according to any one of claims 283 to 286, as dependent on claim 197, wherein the intensity radiation start time is the first radiation start time and the intensity radiation end time is the intensity radiation end time.

288. The method according to any one of claims 283 to 287, wherein the at least one control parameter comprises at least one control parameter of the monitoring system.

289. By adjusting the value of the at least one control parameter, The aforementioned monitoring system has stopped, The monitoring system issues an alarm and / or, The method according to any one of claims 283 to 288, wherein the monitoring system transmits an alarm signal to another computing device.

290. The method according to any one of claims 283 to 289, wherein the at least one control parameter comprises at least one control parameter of another device.

291. By adjusting the value of the at least one control parameter, The aforementioned device stops, The device issues an alarm and / or, The method according to claim 290, wherein the device transmits an alarm signal to another computing device.

292. A system comprising a plurality of monitoring systems according to any one of claims 1 to 172, A system configured to generate a system output based on sensor system data generated by one or more of the monitoring systems and at least one of the sensor system outputs of one or more of the monitoring systems.

293. The system according to claim 292, wherein the system output is configured to change the value of one or more control parameters of the device of the system, and there is a visual obstruction between the device and at least one of the monitoring systems.

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