System and method for synchronizing multiple test and measurement instruments - Patents.com

Abstract

The system includes a plurality of oscilloscopes, each having an output port and an input port, and a cable connecting the output port of a first oscilloscope in the plurality of oscilloscopes to the input port of a second oscilloscope in the plurality of oscilloscopes, the first oscilloscope having a processing element that generates a master run clock, the second oscilloscope having a processing element including a phase-locked loop that locks a slave run clock to the master run clock, and the processing element of one of the plurality of oscilloscopes executing code to operate one of the plurality of run clocks to pass trigger information to another oscilloscope in the plurality of oscilloscopes. A method for synchronizing at least two oscilloscopes, including a master oscilloscope and at least one slave oscilloscope, includes the steps of: interconnecting the at least two oscilloscopes using output and input ports of the at least two oscilloscopes and at least one cable; transmitting a master run clock from the master oscilloscope to the at least one slave oscilloscope; synchronizing the run clock of the at least one slave oscilloscope with the master run clock; recognizing a trigger event in a first oscilloscope of the at least two oscilloscopes; modifying the run clock of the first oscilloscope to encode an indication of a trigger; and receiving the modified run clock in a second oscilloscope of the at least two oscilloscopes and causing the second oscilloscope to recognize the trigger event through the indication of a trigger.

Description

[Technical field]

[0001] This application is a continuation of, and claims priority to, U.S. Patent Application No. 16 / 788,176, filed February 11, 2020, and U.S. Provisional Patent Application No. 62 / 804,678, filed February 12, 2019, which are incorporated herein in their entireties.

[0002] The disclosed technology relates to test and measurement instruments, such as oscilloscopes, and more particularly to a system and method for synchronizing multiple test and measurement instruments. [Background technology]

[0003] Many oscilloscope users want to synchronize data acquisition across many more channels than are available on a single oscilloscope. These users need a way to synchronize the sampling clocks and triggers of multiple oscilloscopes. Previous multi-scope synchronization solutions from Tektronix include the TekLink® instrument interconnect interface, connectors, cables, hubs, and associated software (see, for example, https: / / www.tek.com / support / faqs / what-teklink); the dual oscilloscope synchronization product DPOACQSYNC (see, for example, http: / / download.tek.com / manual / Dual-Oscilloscope-SynchronizationKit-Instructions.pdf); and the UltraSync™ oscilloscope synchronization architecture (see, for example, https: / / www.tek.com / dpo70000sx / scalable-system-precision-synchronization). [Prior art documents] [Patent documents]

[0004] [Patent Document 1] US Patent Publication No. 2016 / 0077131 [Patent Document 2] Patent No. 6799369 Summary of the Invention [Problem to be solved by the invention]

[0005] However, the synchronization accuracy of the TekLink® interface may be too low for some users, and the cost and complexity of the DPOACQSYNC product and UltraSync(TM) architecture may be too high and complex for some users, especially mid-range users.

[0006] Embodiments of the disclosed apparatus and method address these issues. [Means for solving the problem]

[0007] In some situations, more channels are needed to collect data about a particular device under test (DUT) than are available on a single oscilloscope. In these situations, connecting multiple oscilloscopes together to act as one oscilloscope with more channels allows the user to use more channels. Note that the term "oscilloscope" includes digitizers, waveform recorders, etc.

[0008] An embodiment of the disclosed technology (nicknamed "UltraSync™ Lite" or "USL") is intended to provide acceptable synchronization accuracy at a low cost and easy for users to connect to mid-range oscilloscopes, such as the Tektronix 5 Series MSO (mixed signal oscilloscope) oscilloscopes. This mid-range class of oscilloscope typically has an "AUX (auxiliary) output" signal connector that is driven by a processing element. In one embodiment, the processing element may be comprised of a field programmable gate array (FPGA). These oscilloscopes typically have an "AUX trigger in" signal connector and a "reference in" signal connector that drive the same processing element through a comparator. Regardless of the product characteristics, any oscilloscope that has input and output ports may utilize the embodiments described herein. If the inputs used are not internally terminated at 50 Ω, an external 50 Ω BNC termination may be beneficial.

[0009] As used herein, hereinafter the term "AUX input" refers to either "AUX trigger input" or "reference input", whichever is most preferred in implementation. In USL mode, the AUX output port of the master oscilloscope is connected to the AUX input port of the first slave oscilloscope via a cable, such as a standard BNC (Bayonet Neill Concelman) cable. If more than two oscilloscopes are required, they are connected in a daisy-chain fashion, as shown in Figure 1, with the AUX output of the first slave connected to the AUX input of the next slave via another standard cable. In the present description, these standard cables will be referred to as USL cables. [Brief description of the drawings]

[0010] [Figure 1] FIG. 1 shows a diagram of an embodiment of a system including multiple oscilloscopes. [Diagram 2]FIG. 2 shows a schematic diagram of an embodiment of a portion of a system including multiple oscilloscopes. [Diagram 3] Figure 3 illustrates an embodiment of a timing diagram between a master and at least one slave oscilloscope. [Figure 4] Figure 4 shows a schematic diagram of an embodiment of a zero-phase phase-locked loop architecture. [Diagram 5] Figure 5 shows a schematic diagram of an embodiment of a backward compatible near-zero phase phase-locked loop architecture. [Figure 6] Figure 6 shows a block diagram of a master / slave hub. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0011] FIG. 1 shows a system 10 having multiple oscilloscopes 12, 14, 16 and 18. In this particular example, without limitation, the first oscilloscope 12 acts in a master role and generates a master run clock. An output port 20 of oscilloscope 12 is connected to an input port 22 of oscilloscope 14, and an output port 24 of oscilloscope 14 is connected to an input port of oscilloscope 16. As will be explained below, an output port 26 of the last oscilloscope 18 in the series may be connected to an input port 28 of the first / master oscilloscope 12. This may be referred to as a closed series or closed loop of multiple oscilloscopes. Additional oscilloscopes may be added to the series, but the first and last in the series occur on one and the same oscilloscope.

[0012] An embodiment of the present application may have two oscilloscopes, one of which is referred to as the first / master oscilloscope, where the first oscilloscope generates the master run clock, as described in more detail below. An embodiment of the present application may also have multiple oscilloscopes connected together in series. The output of each oscilloscope is connected to the input of the next oscilloscope in the series, with the output of the previous oscilloscope being connected to the input of the current oscilloscope. When the oscilloscopes are connected in series, the second oscilloscope becomes the previous oscilloscope in the series.

[0013] In the present description, the last oscilloscope in a series may be referred to as the final oscilloscope. In some embodiments, the output of the last oscilloscope may be connected to the input of the first oscilloscope. In embodiments using only two oscilloscopes, the second oscilloscope is the final oscilloscope. In embodiments using multiple oscilloscopes where the last oscilloscope is connected to the first oscilloscope (i.e., in a closed series), any oscilloscope in the series can function as the first oscilloscope and generate the master clock.

[0014] In USL mode, the master device would typically output a square wave or other periodic function signal with a predetermined frequency from its AUX output port as a reference or master clock. Each slave device would lock its time base to the reference clock received at its AUX input port, such as by using a phase-locked loop (PLL). The slave device would then pass the clock further down the chain through its AUX output port. The PLL would be sensitive to a particular edge polarity (in one embodiment, the rising edge of the reference clock). These multiple oscilloscopes would likely be connected to the same network, such as Ethernet or Wi-Fi, for data collection, but a network connection is not required for synchronization. The connector to the network is shown in FIG. 2 as 62 for the master oscilloscope 12 and 162 for the slave oscilloscope (in this example, oscilloscope 14).

[0015] In FIG. 2, the master oscilloscope 12 generates a Run Clock signal that it passes to the slave oscilloscope 14. Note that oscilloscopes other than 12 can be slaves. Each oscilloscope has the same components but operates differently in a series or daisy chain configuration. Components with the reference designator "xx" in the master oscilloscope correspond to the same components in the slave oscilloscopes with the reference designator "1xx".

[0016] The master oscilloscope 12 has a voltage controlled oscillator (VCO) 30 which generates a first output clock signal 31. This output clock signal is then divided in a divider circuit 32 by a factor K 1 The frequency of the clock signal 31 is divided by K and compared with the frequency of the VCXO 36. The PLL 34 adjusts the control voltage of the VCO 30 to make the frequency of the clock signal 31 exactly K times the frequency of the VCXO 36. 1If a reference clock, such as 10 MHz, is provided to input port 44, divider circuit 38 and PLL 42 (via MUX 40) are similarly used to adjust the frequency of VCXO 36 to exactly K times the frequency of the reference clock. 2 Alternatively, the processing element 56 may provide a DC calibration voltage via the DAC 58 and MUX 40 to set the frequency of the VCXO 36 based on factory calibration data.

[0017] The output of VCO 30 provides the sampling clock 31 to the analog-to-digital converter used by the oscilloscope to capture the data samples. However, logic circuits operate better with a slower clock, so divider circuit 46 divides sampling clock 31 by a factor of N to generate divided sampling clock 47. For the purposes of this description, this clock will be referred to as the "Run Clock." This Run Clock 47 is the master clock used to synchronize across all oscilloscopes in a series, such as system 10. Run Clock 47 is communicated through processing element 56 to output port 60 and passed through the USL cable to other oscilloscopes. In one embodiment, the processing element is comprised of an FPGA, and a portion of divider (N) 46 and / or 146 may reside within the FPGA. In this case, the FPGA generates the Run Clock and distributes it to other blocks within the FPGA.

[0018] In some embodiments, different dividers may have associated values ​​for ease of understanding. For example, assuming the VCO 30 clock is 6.25 GHz, the first divider 32 divides by 125, resulting in an output signal equal to 50 MHz, so the input signal to the PLL 34 is 50 MHz. The VCXO runs at 50 MHz, and the PLL 34 locks these two signals. The divider 38 divides the 50 MHz signal by 5, resulting in a 10 MHz signal to the PLL 42. The PLL then locks this signal using the incoming 10 MHz reference signal (if provided).

[0019] Similarly, divider 46 divides the 6.25 GHz clock by a factor to make the clock a suitable speed for the logic circuits. In this example, factor N is 224, which makes the resulting run clock speed approximately 27.9 MHz. Divider 48 divides the clock by a factor D, which determines how often a sample is stored. The sample clock continues to run and the oscilloscope continues to sample, but the user may not want to store every sample. This can lead to memory overruns, so the user can control how often samples are stored by utilizing the control interface that controls factor D of divider 48. One divider 48 may be shared by all channels in the oscilloscope, or multiple dividers 48 may be used, up to one per channel. The above frequencies and divider values ​​are merely for ease of understanding and are not intended or implied to be limiting to these divider values ​​and frequencies.

[0020] Returning to Figure 2, the trigger time interpolator 52 receives a trigger event 54. The acquisition control logic 50 receives the signal from the trigger time interpolator 52. The acquisition control logic stops the acquisition of samples into memory and generates a time stamp relative to the run clock of the trigger event, which generally has a higher resolution than the period of the run clock 47 and sample clock 31. It also acts to reset the divider / decimator 48 for each channel.

[0021] In the current embodiment, the run clock 47 is output from output port 60 to the next oscilloscope in the series and becomes the reference clock at the input port (e.g., 144) of the next oscilloscope. The run clock signal may pass through the fabric of an FPGA that implements a digital PLL.

[0022] In previous multi-scope configurations, the time bases were locked by feeding the same 10MHz reference clock to all oscilloscope reference input ports (e.g. 44 and 144) and configuring the dividers and PLLs the same. With this technique, the sample clock 131 will have the same frequency and phase as the master sample clock 31, while the run clock 147 in the slaves will have the same frequency but arbitrary phase with respect to the master's run clock 47. Because the run clock controls the reset of the decimation divider, the decimated sample clocks will also be the same frequency but arbitrary phase between master and slave. This creates problems in acquiring data and ensuring that all channels through all the multiple scopes function as if they were channels in a single oscilloscope using a single run clock.

[0023] In the current embodiment, the slave VCO 130 is phase locked to the slave VCXO 136 in the standard manner, but a digital PLL is implemented in the processing element 156, which compares the slave run clock 147 to the master run clock 47 received at the AUX input port 144. The digital PLL then controls the VCXO 136 (and in turn the VCO 130) through the DAC 158 and MUX 140 to lock the master and slave run clocks. This ensures that the slave run clock 147 has the same frequency and phase as the master run clock 47, which in turn allows the slave acquisition control logic 150 to function as an extension of the master control logic 50, resetting the decimation divider circuits and starting and stopping acquisitions simultaneously. In an embodiment, the master oscilloscope sends acquisition control, trigger event and associated time stamp messages by manipulating the run clock as described below. In another embodiment, a master oscilloscope may provide the master run clock, but another oscilloscope may send the trigger events and associated time stamps.

[0024] FIG. 3 illustrates an embodiment of a timing diagram showing one embodiment of a pulse train (series of pulses). In FIG. 3, the top line shows a periodic square wave, but it could be any periodic function, without limitation. When the master oscilloscope recognizes a trigger event defined across any number of input channels, it synchronizes the trigger to the Run Clock cycle and time stamps the position of the trigger within the Run Clock cycle. On the next subsequent Run Clock cycle, the master shifts the duty cycle of the output signal, keeping the rising edge in its normal position but advancing the falling edge to produce a pulse with a duty cycle of less than 50% (e.g., a 25% duty cycle pulse as shown in pulse 70 on the master line).

[0025] The first slave will recognize the first 25% duty cycle pulse after the appropriate post-trigger count as a trigger event to stop acquisition, and then use the digital time stamp from the master to place the trigger point in its record. It will also pass the same shifted falling edge to the next slave in the chain so that it can also trigger. The size of the circular buffer used to capture acquisitions will be increased to account for the maximum trigger delay added when going down multiple USL Series units.

[0026] The system then modifies the next pulse of the master clock to encode the trigger time stamp. This can be done in a number of ways, but in one example, if the falling edge of the clock signal occurs before the end of the normal period, it can encode a digital "1". If the falling edge of the clock signal occurs after the end of the normal period, it can encode a digital "0". In the example shown in Figure 3, pulse 72 represents a "1", pulse 74 represents a "1", pulse 76 represents a "0", and pulse 78 represents a "1". Thus, the encoded sequence represents the data word 1101.

[0027] Thus, this type of encoding allows a master device to send a time stamp of a trigger event to a slave device by manipulating the run clock. The number of bits in the time stamp determines the number of pulses used to encode the time stamp. It should be noted that in the present embodiment, for ease of discussion, the rising edge is used as the "fixed" part of the signal and the falling edge is used as the "changing" edge. However, embodiments may also use the falling edge as the fixed edge and the rising edge as the changing edge. No particular polarity is intended or implied. Other encoding methods are contemplated, for example, pulse amplitude modulation may be used instead of pulse width modulation.

[0028] This synchronizes the time bases to within the jitter of each PLL, and multiple triggers are precisely synchronized because only the master calculates the trigger position, which is digitally and therefore precisely replicated in all slaves. Because the trigger information is shared digitally, and the time base PLLs average out the timing jitter of thousands to millions of edges, depending on the ratio of the reference frequency to the loop bandwidth, the overall trigger jitter between oscilloscopes is much smaller than would be the case in a system that passes the trigger information as a single edge placement in continuous time.

[0029] The above embodiment assumes that the trigger source is in the master. As mentioned above, if the AUX output of the last slave is fed back to the AUX input of the master as shown by the dotted line in Figure 1, any oscilloscope in the chain can be the trigger source. This would recognize the trigger event, time stamp it, and adjust the position of the falling edge before passing it down the chain. However, the master could remain a frequency reference that determines the timing of the rising edge, so the choice of trigger source would not affect the frequency of the timebase.

[0030] The PLL bandwidth can also be set based on lab evaluation / characterization to be narrow enough to filter out most of the jitter / crosstalk added to the falling edge of the run clock in the FPGA and I / O drivers, but wide enough to track the close-in phase noise of the oscillator circuit to minimize jitter in the oscilloscope. A VCXO based time base can be either directly locked to the incoming run clock or locked to the VCXO and then locked to the incoming run clock, depending on which results in less overall jitter between the time bases. Preliminary analysis suggests locking the VCO to the VCXO as above, and then locking the VCXO to the incoming run clock.

[0031] Additionally, other acquisition control messages may be defined, such as "Run" to start a new acquisition, "Abort" to stop an ongoing acquisition without a trigger, "Auto-Discover" to determine the number of slaves down the daisy chain and the accumulated delay in each slave, "Fast-Edge" to generate a fast edge on each channel to enhance channel deskew, etc. For example, if the trigger event message starts with a 25% duty cycle pulse as described above, other messages may start with a 75% duty cycle pulse to distinguish them from trigger events. If the output port of the last slave is wired back to the input port of the master, an acquisition control query such as "Acq-Ready?" may also be added, allowing the master to query when all slaves are ready to execute a "Run" command.

[0032] The addresses of multiple oscilloscopes in a series can be passed over the USL cable. These addresses can be IP addresses (if all scopes are connected to a network), MAC addresses, unique device serial numbers, etc. This allows for auto-discovery of other devices in the chain and the order in which they are connected.

[0033] Long term (>1 reference cycle) memory effects in FPGAs, I / O drivers, and cables can subtly shift the timing of rising edges due to modulation of the timing of falling edges. To minimize such shifts in frequency content within the PLL loop bandwidth, the message encoding scheme can maintain the same number of early and late falling edges in each message. As a simple example, each bit in a message can be represented by either an early and late pair of "1" bits, or a late and early pair of "0" bits.

[0034] Although all time bases are locked to the same frequency, there will be phase differences due to delays in the USL cables and associated circuitry. This is not shown in FIG. 3. While cable delays are relatively stable, active circuit delays may vary with temperature. To minimize this effect, a "zero phase" PLL architecture may be used as shown in FIG. 4. In a zero phase PLL, also called a PLL with symmetric paths, the rising edge of the reference clock on output port 24 is compared to the rising edge of the reference clock received at input port 22 through a symmetric circuit. In one embodiment, the symmetric circuit includes matching buffers 81 and 83 and a rising edge phase comparison circuit 80. As long as the delays of the two symmetric paths track each other, the timing of the output reference clock will match the input and there will be no phase error build-up down the series of devices. To the extent that the delays from the sample clocks output in each oscilloscope to the reference clock track across multiple oscilloscopes, the sample clocks will track each other.

[0035] In one embodiment, VCO 84 may consist of a 6.25 GHz VCO phase-locked to a 50 MHz VCXO. The clock frequency of the VCO is controlled by adjusting the control voltage input of the VCXO. Note that different oscilloscopes in a series may have different oscillator frequencies and divider ratios.

[0036] However, the AUX output feedback buffer 83 does not exist in the current oscilloscope hardware design (referred to herein as legacy hardware). Instead, the USL can be implemented without hardware expense or modification, as shown in Figure 5. This may result in some degradation in performance, as explained below. The phase comparator 90 and loop filter 92 shown above can be implemented digitally in the FPGA fabric, and the I 2 An Inter-Integrated Circuit (C) command allows the loop filter output to be fed to fine DAC 158 and VCXO 136. Divide circuit 96 within processing element 86 here, and potentially further divide operations, represents run clock divider 146 of FIG.

[0037] This allows the user install base to retrofit the oscilloscope for USL operation with a software update, but this would impact performance in two ways. First, since the AUX input and AUX output buffers are outside the zero-phase feedback loop, the I / O buffer delay changes over temperature would not be inherently compensated. However, the nominal delay temperature coefficient could be characterized and the trigger time adjusted accordingly based on the measured temperature. Alternatively, a nominally matching temperature dependent delay could be inserted into the feedback path 98 in the FPGA fabric, thus approximating a zero-phase PLL.

[0038] Since the effective gain of the digital phase comparator depends on random jitter effects, it will be necessary to determine the jitter in the FPGA to set the gain of the phase comparator and then the PLL loop bandwidth. This could be done in the lab on a representative sample or as part of the factory calibration while each device is produced.

[0039] The delay of the USL cable, if known, can be compensated for by subtracting it from the digital trigger time stamp. A loopback calibration procedure could be provided to assist customers setting up a USL.

[0040] In one embodiment of the calibration procedure, a cable is connected from the output port to the input port of the device to be added to the series. This forms a ring oscillator through the FPGA, I / O driver and cable, and a first period is measured using the period counter 88. Then, another ring oscillator is formed using the symmetric path of the "zero phase" PLL to bypass the cable delay, and a second period is measured. The cable delay is determined by subtracting these two period measurements. The cable is then disconnected from the AUX output of the new slave and connected to the AUX output of the master or previous slave to form or extend the series (or daisy chain).

[0041] In another embodiment of the calibration procedure, the processing element can count the number of clock cycles of delay between outputting an edge on the AUX output port and receiving that edge on the AUX input port through the USL cable. If a high speed serial transceiver (HSS XCVR) is used for this measurement, the resolution of the cable delay measurement is as fine as one unit interval (UI) of the HSS XCVR, which is typically less than 100 picoseconds.

[0042] If the variation in cable delay with temperature is large, additional circuitry in the master can track the total cable delay by comparing the phase of the clock at its input port, the last in the daisy chain, with the phase of the clock at its output port. The software can then allocate the total delay variation to each cable based on the initial delay estimate for each cable. This compensates for cable delay over temperature, as long as all cables heat or cool together.

[0043] Regular channel skew calibration can be performed by the user to remove residual time base delay errors in the daisy chain and channel interconnect delay differences.

[0044] USL mode will not have a significant impact on normal acquisition mode, but the time required for communication of the trigger time stamp may affect the maximum trigger rate for FastFrame and FastAcq, and the size of the extra circular acquisition buffer will affect the maximum number of frames for short FastFrame records.

[0045] To minimize daisy chain delays in large installations, some embodiments include a USL "hub" as shown in FIG. 6. Hub 100 distributes the USL signal from master 102 in parallel to multiple slaves (e.g., 104, 106, 108, 110) in a "star" arrangement. A mixed star and daisy chain installation also works well, with a master driving a 1:4 hub with four outputs driving four daisy chains. FIG. 6 shows an example where, in addition to slave 110, it also drives chains of slaves 112, 114, and 116. The zero phase PLL architecture described above can also be used to minimize delay changes over temperature in the hub. Another method is to use an active temperature controller in a simple buffer architecture in the hub.

[0046] A hub can also provide a MUX (multiplexer) function by connecting the output ports of multiple slaves to the input port of a master to relay query results or slave trigger events.

[0047] Aspects of the disclosed technology can operate on specially created hardware, firmware, digital signal processors, or specially programmed general-purpose computers, including processors that operate according to programmed instructions. The term "controller" or "processor" as used herein contemplates microprocessors, microcomputers, ASICs, special purpose hardware controllers, and the like. Aspects of the disclosed technology can be embodied in computer-available data and computer-executable instructions, such as one or more program modules, executed by one or more computers (including monitoring modules) or other devices.

[0048] Generally, program modules include routines, programs, objects, components, data structures, etc., which, when executed by a processor in a computer or other device, perform particular tasks or implement particular abstract data formats. Computer-executable instructions may be stored in a computer-readable storage medium, such as a hard disk, optical disk, removable storage medium, solid-state memory, RAM, etc. As will be appreciated by those skilled in the art, the functionality of the program modules may be combined or distributed as desired in various embodiments. Furthermore, such functionality may be embodied in whole or in part in firmware or hardware equivalents, such as integrated circuits, field programmable gate arrays (FPGAs), etc. Certain data structures may be used to more effectively implement one or more aspects of the disclosed technology, and such data structures are considered to be within the scope of the computer-executable instructions and computer-usable data described herein.

[0049] The disclosed aspects may, in some cases, be implemented in hardware, firmware, software, or any combination thereof. The disclosed aspects may also be implemented as instructions carried by or stored on one or more computer-readable media that may be read and executed by one or more processors. Such instructions may be referred to as computer program products. A computer-readable medium as described herein means any medium that can be accessed by a computing device. By way of example, and not limitation, computer-readable media may include computer storage media and communication media.

[0050] Computer storage media means any medium that can be used to store computer-readable information. By way of example and not limitation, computer storage media may include random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk read-only memory (CD-ROM), digital video disc (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, and any other volatile or non-volatile removable or non-removable media implemented in any technology. Computer storage media excludes signals themselves and transitory forms of signal transmission.

[0051] A communication medium refers to any medium capable of communicating computer readable information. By way of example, and not limitation, communication media may include coaxial cables, fiber optic cables, air, or any other medium suitable for communicating electrical, optical, radio frequency (RF), infrared, acoustic, or other types of signals.

[0052] In addition, the description of this application refers to specific features. It should be understood that the disclosure herein includes all possible combinations of those specific features. For example, if a specific feature is disclosed in connection with a particular embodiment, that feature can also be used in connection with other embodiments, to the extent possible.

[0053] Furthermore, when the application refers to a method having two or more defined steps or processes, those defined steps or processes may be performed in any order or simultaneously, unless the context precludes such a possibility.

[0054] Although, for convenience of illustration, specific aspects of the disclosed technology have been illustrated and described, it will be understood that various modifications can be made therein without departing from the spirit and scope of the disclosed technology. Accordingly, the disclosed technology should not be limited, except as by the appended claims. Working Example

[0055] In the following, examples of the disclosed technology are presented. An embodiment of the technology may include one or more of the examples described below and any combination thereof.

[0056] Example 1 is a system comprising a plurality of oscilloscopes, each having an output port and an input port, and a cable connecting the output port of a first oscilloscope in the plurality of oscilloscopes to the input port of a second oscilloscope in the plurality of oscilloscopes, the first oscilloscope having a processing element that generates a Master Run Clock, the second oscilloscope having a processing element including a phase-locked loop that locks a Slave Run Clock to the Master Run Clock, and a processing element of one of the plurality of oscilloscopes executing code to operate on one of the plurality of Run Clocks to pass trigger information to another oscilloscope in the plurality of oscilloscopes.

[0057] Example 2 is the system of Example 1, wherein the plurality of oscilloscopes further comprises one or more additional oscilloscopes connected in a series with the first oscilloscope and the second oscilloscope, each of the additional oscilloscopes having a cable connecting an output port of a previous oscilloscope in the series to an input port of a current oscilloscope in the series, and the second oscilloscope is the previous oscilloscope in the series.

[0058] Example 3 is a system according to any one of Examples 1 and 2, wherein the plurality of oscilloscopes includes a last oscilloscope having a cable connecting an output port of the last oscilloscope to an input port of the first oscilloscope to form a closed loop with the plurality of oscilloscopes.

[0059] Example 4 is the system of any one of Examples 1 to 3, wherein the system is implemented using legacy hardware.

[0060] Example 5 is a system according to any one of Examples 1 to 4, wherein a cable connecting an output port of the first oscilloscope to an input port of another oscilloscope among the plurality of oscilloscopes is connected to the input port of the other oscilloscope via a hub.

[0061] Example 6 is the system of example 5, in which the hub has one input port and multiple output ports for connecting to multiple oscilloscope input ports.

[0062] Example 7 is a system of Example 5 or 6, wherein the hub is connected to a plurality of oscilloscopes, at least one of the plurality of oscilloscopes having a cable connected to an output port thereof and connected to an input port of another oscilloscope or other oscilloscopes not connected to the hub.

[0063] Example 8 is the system of any of Examples 1 to 7, wherein each of the oscilloscopes other than the first oscilloscope comprises a phase-locked loop having a symmetrical path.

[0064] Example 9 is the system of any of examples 1-8, wherein the phase-locked loop is implemented in the processing element.

[0065] Example 10 is a method for synchronizing at least two oscilloscopes including a master oscilloscope and a slave oscilloscope, comprising: interconnecting the at least two oscilloscopes using output and input ports of the at least two oscilloscopes and at least one cable; transmitting a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event in a first oscilloscope of the at least two oscilloscopes; modifying a run clock of the first oscilloscope to encode a trigger indication; and receiving the modified run clock in a second oscilloscope of the at least two oscilloscopes and causing the second oscilloscope to recognize the trigger event by the trigger indication.

[0066] Example 11 is the method of example 10, wherein modifying the Run Clock includes encoding information to be transmitted between oscilloscopes by modifying an interval between a first edge polarity of the Run Clock and a second edge polarity of the Run Clock.

[0067] Example 12 is the method of example 11, wherein encoding the information includes encoding at least one of a time stamp of the trigger event and an acquisition control message.

[0068] Example 13 is the method of example 11 or example 12, in which the encoding of information includes encoding an address of the device.

[0069] Example 14 is any of the methods of Examples 10 to 13, further comprising a step of connecting an output port of a last oscilloscope of the at least two oscilloscopes to an input port of the master oscilloscope to form a closed series of oscilloscopes.

[0070] Example 15 is the method of example 14, further comprising transmitting the encoded acquisition control query to at least one other oscilloscope.

[0071] Example 16 is the method of any of examples 10 to 15, wherein the synchronizing step uses a phase-locked loop on at least one of the slave oscilloscopes.

[0072] Example 17 is the method of example 16, wherein the encoding step minimizes energy within a bandwidth of the phase-locked loop.

[0073] Example 18 is the method of any of examples 17 or 18, further comprising setting a bandwidth of the phase-locked loop to minimize jitter between oscilloscopes.

[0074] Example 19 is the method of any of Examples 10 to 18, further comprising calibrating a designated oscilloscope of the at least two oscilloscopes by connecting a cable from an output port of the designated oscilloscope to an input port of the designated oscilloscope, comparing edges of a signal on the output port with edges on the input port, and measuring a delay associated with the cable.

[0075] Example 20 is the method of example 19, further comprising adjusting a signal using the measured cable delay when the specified oscilloscope is connected in series with at least one other oscilloscope among the at least two oscilloscopes.

[0076] Although specific embodiments have been illustrated and described for purposes of illustration, it will be understood that various modifications can be made without departing from the spirit and scope of the disclosed technology. Accordingly, the invention should not be limited, except as by the appended claims.

Claims

1. a plurality of test and measurement instruments, each having an output port and an input port; a cable connecting an output port of a first one of the plurality of said test and measurement devices to an input port of a second one of the plurality of said test and measurement devices; Equipped with the first test and measurement instrument has a processing element for generating a master run clock obtained by dividing a sampling clock for an analog-to-digital converter for acquiring data in the first test and measurement instrument, and supplying the master run clock to the second test and measurement instrument via the cable; the second test and measurement device has a processing element including a phase-locked loop for locking a slave run clock, which is a divided sampling clock for an analog-to-digital converter for acquiring data in the second test and measurement device, to the master run clock; A system for synchronizing multiple test and measurement instruments, wherein when a processing element of the first test and measurement instrument recognizes a trigger event to stop data acquisition, it modulates one of the master run clocks to execute code to cause the second test and measurement instrument to recognize the trigger event.

2. 2. The system for synchronizing multiple test measurement instruments as described in claim 1, wherein the multiple test measurement instruments further include one or more additional test measurement instruments connected in a series with the first test measurement instrument and the second test measurement instrument, each of the additional test measurement instruments having a cable connecting an output port of a previous test measurement instrument in the series to an input port of a current test measurement instrument in the series, and the second test measurement instrument being the previous test measurement instrument in the series.

3. 2. The system for synchronizing multiple test measurement instruments as described in claim 1, wherein the multiple test measurement instruments include a last test measurement instrument having a cable connecting an output port of the last test measurement instrument to an input port of the first test measurement instrument, forming a closed loop with the multiple test measurement instruments.

4. 1. A method for synchronizing at least two test and measurement instruments, including a master test and measurement instrument and at least one slave test and measurement instrument, comprising: connecting the at least two test and measurement devices to each other using output and input ports of the at least two test and measurement devices and at least one cable; a process of transmitting a master run clock obtained by dividing a sampling clock for an analog-to-digital converter for acquiring data in the master test and measurement device to the at least one slave test and measurement device; a process of synchronizing a slave run clock obtained by dividing a sampling clock for an analog-to-digital converter for acquiring data in the at least one slave test measurement device with the master run clock; modulating one of the master run clocks of the master test and measurement instrument to encode an indicia of a trigger upon recognition of a trigger event for stopping data acquisition at the master test and measurement instrument; receiving the modulated master run clock in the at least one slave test and measurement instrument and causing the at least one slave test and measurement instrument to recognize the trigger event by an indicia of the trigger; 13. A method for synchronizing multiple test and measurement instruments, comprising:

5. 5. The method for synchronizing a plurality of test and measurement instruments as described in claim 4, further comprising the step of connecting an output port of a last test and measurement instrument of the at least two test and measurement instruments to an input port of the master test and measurement instrument to form a closed series of test and measurement instruments.

6. calibrating a designated one of the at least two test and measurement devices; connecting a cable from an output port of the designated test and measurement device to an input port of the designated test and measurement device; comparing the edges of the signal on the output port with the edges on the input port; A process for measuring delays associated with said cables; 5. The method of claim 4, further comprising:

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