Test chart and camera manufacturing equipment

Abstract

To suppress a decrease in focus position detection accuracy.SOLUTION: A test chart for calibrating a camera includes a first slope having a pattern from which light is emitted, a second slope having a pattern from which light is emitted and arranged adjacent to the first slope, and a light shielding portion provided between the first slope and the second slope and blocking light from at least the pattern of the first slope toward the second slope.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] This invention relates to a test chart and a camera manufacturing apparatus. [Background technology]

[0002] An apparatus for manufacturing a camera is known that uses a chart having a predetermined pattern to adjust the positions of the optical system and the image sensor (for example, Patent Document 1). [Prior art documents] [Patent Documents]

[0003] [Patent Document 1] Japanese Patent Publication No. 2000-165623 [Overview of the project] [Problems that the invention aims to solve]

[0004] The objective of the present invention is to suppress the decrease in the accuracy of detecting the focal position. [Means for solving the problem]

[0005] According to one aspect of the present invention, This is a test chart for adjusting the camera. A first slope having a pattern of light emission, A second slope having a pattern of light emission, and positioned adjacent to the first slope, A light-shielding portion is provided between the first and second slopes and blocks light from at least the pattern on the first slope toward the second slope, Equipped with A test chart is provided.

[0006] According to another aspect of the present invention, This is a test chart for adjusting the camera. A three-dimensional block with a slope, A two-dimensional block that is arranged so as to be orthogonal to the optical axis of the camera and has a two-dimensional pattern from which light is radiated; An auxiliary light-shielding part that is provided between the three-dimensional block and the two-dimensional block and blocks at least the light from the two-dimensional pattern toward the inclined surface of the three-dimensional block; is provided with A test chart is provided.

[0007] According to another aspect of the present invention, A test chart for adjusting a camera, An outer block arranged at a position away from the center of the visual field of the camera; A neighboring block adjacent to the outer block; A light-shielding part that blocks light between the outer block and the neighboring block; is provided with The outer block Has a vertex provided at a predetermined height at a position biased toward the center side; At least a first inclined surface that slopes from the vertex and has a pattern from which light is radiated; has The outer block is arranged so that the vertex is located at the center of the outer block when the camera images it. The neighboring block has at least a second inclined surface that has a pattern from which light is radiated and is arranged adjacent to the first inclined surface; The light-shielding part is provided between the first inclined surface and the second inclined surface and is provided so as to block at least the light from the first inclined surface of the outer block toward the second inclined surface of the neighboring block. A test chart is provided.

[0008] According to another aspect of the present invention, A chart support part that supports a predetermined test chart; A camera support part that supports at least a part of a camera having an optical system and an imaging element at a position where the test chart can be imaged; An image analysis unit that analyzes an image obtained by imaging the test chart and detects the focal position of the camera; A camera adjustment mechanism that adjusts the relative positions of the optical system and the imaging element based on the focal position of the camera; and has The test chart has a first inclined surface having a pattern from which light is emitted; has a pattern from which light is emitted and is arranged adjacent to the first inclined surface, and a second inclined surface; a light shielding portion provided between the first inclined surface and the second inclined surface and blocking at least the light from the pattern of the first inclined surface toward the second inclined surface; and includes A camera manufacturing apparatus is provided.

[0009] According to another aspect of the present invention, a chart support portion that supports a predetermined test chart; a camera support portion that supports at least a part of a camera having an optical system and an imaging element at a position where the test chart can be imaged; an image analysis unit that analyzes an image obtained by imaging the test chart and detects the focal position of the camera; a camera adjustment mechanism that adjusts the relative positions of the optical system and the imaging element based on the focal position of the camera; and has The test chart has a three-dimensional block having an inclined surface; a two-dimensional block that is arranged perpendicular to the optical axis of the camera and has a two-dimensional pattern from which light is emitted; an auxiliary light shielding portion provided between the three-dimensional block and the two-dimensional block and blocking at least the light from the two-dimensional pattern toward the inclined surface of the three-dimensional block; and includes A camera manufacturing apparatus is provided.

[0010] According to another aspect of the present invention, a chart support portion that supports a predetermined test chart; A camera support portion that supports at least a part of a camera having an optical system and an image sensor at a position where the test chart can be imaged, An image analysis unit analyzes the image captured from the test chart and detects the focal position of the camera, A camera adjustment mechanism that adjusts the relative positions of the optical system and the image sensor based on the focal position of the camera, It has, The aforementioned test chart is, An outer block positioned away from the center of the camera's field of view, The neighboring blocks adjacent to the aforementioned outer block, A light-shielding portion that blocks light between the outer block and the neighboring block, Equipped with, The outer block is, The aforementioned vertex is located at a predetermined height in a position biased toward the central side, At least a first slope that slopes from the aforementioned vertex and has a pattern from which light is emitted, It has, The outer block is arranged such that when the camera takes an image, the vertex is located at the center of the outer block. The neighboring block has a pattern from which light is emitted and has at least a second slope arranged adjacent to the first slope, The light-shielding portion is provided between the first slope and the second slope, and is configured to block light from at least the first slope of the outer block toward the second slope of the neighboring block. Camera manufacturing equipment is provided. [Effects of the Invention]

[0011] According to the present invention, it is possible to suppress the decrease in the accuracy of detecting the focal position. [Brief explanation of the drawing]

[0012] [Figure 1] This is a perspective view showing a test chart according to the first embodiment of the present invention. [Figure 2] This is a plan view showing a test chart according to the first embodiment of the present invention. [Figure 3A] This is a plan view showing one 3D block of a test chart according to the first embodiment of the present invention. [Figure 3B] This is an enlarged view of an image of a test chart according to the first embodiment of the present invention, captured by a camera. [Figure 4] This is a schematic diagram showing a camera manufacturing apparatus according to the first embodiment of the present invention. [Figure 5] This is a schematic diagram showing the cameras to be placed in a camera manufacturing apparatus. [Figure 6] This is a block diagram showing a control unit according to the first embodiment of the present invention. [Figure 7] This is a flowchart showing a method for manufacturing a camera according to the first embodiment of the present invention. [Figure 8A] This is a magnified view of one pattern in the test chart. [Figure 8B] This is an image showing the evaluation area. [Figure 9] This figure shows the relationship between brightness and the number of corrected pixels in the first embodiment. [Figure 10] This figure shows the interpolation curves in each evaluation domain, obtained through frequency analysis. [Figure 11] This figure shows the correspondence between the peak spatial frequency and the position of the boundary line. [Figure 12] This is a perspective view showing a test chart according to a second embodiment of the present invention. [Figure 13] This is a perspective view showing a test chart according to the third embodiment of the present invention. [Modes for carrying out the invention]

[0013] [Description of Embodiments in this Disclosure] <Insights gained by the inventor> First, let me explain the findings of the inventor.

[0014] In order to precisely adjust the camera, the inventors considered a chart with a three-dimensional structure as a test chart.

[0015] The test chart considered, for example, is a three-dimensional structure comprising multiple slopes, each having a pattern from which light is emitted. By imaging the patterns on each slope with a camera, the camera's focal position can be detected with high accuracy.

[0016] However, in some cases, light emitted from the pattern on the first slope overlapped with the pattern on the adjacent second slope. In this case, the light from the first slope became unwanted noise in the detection of the pattern on the second slope. For example, in the image region where the light from the first slope overlapped with the pattern on the second slope, it became difficult to detect the optimal focal position. Alternatively, for example, there was a risk of misdetection of the focal position in the part of the second slope illuminated by light from the first slope. As a result, the accuracy of the camera's focal position detection may have decreased.

[0017] This decrease in the accuracy of detecting the focal point is more likely to occur, for example, when the test chart is small.

[0018] The following invention is based on the above-mentioned novel problem identified by the inventors.

[0019] [Details of the embodiments of this disclosure] Next, an embodiment of the present disclosure will be described below with reference to the drawings. However, the present disclosure is not limited to these examples, and is intended to include all modifications within the meaning and scope of the equivalents of the claims.

[0020] <First Embodiment of the Invention> (1) Test Chart The test chart 10 according to this embodiment will be explained with reference to Figures 1 and 2. Note that the support plate 190 is omitted in Figure 2.

[0021] In the following, with respect to the camera 20 when the test chart 10 is placed inside the camera manufacturing apparatus 1, the optical axis direction of the optical system 220 will be referred to as the "Z direction" (with + from the test chart 10 toward the camera 20), one of the pixel arrangement directions of the image sensor 240 perpendicular to the optical axis of the optical system 220 will be referred to as the "X direction", and the other direction of the pixel arrangement direction of the image sensor 240 perpendicular to the X direction will be referred to as the "Y direction". Furthermore, the rotation direction around the Z direction will be referred to as "θ". Z The term "direction" refers to the rotational direction around the X-axis, and "θ" refers to the rotational direction around the X-axis. X The direction is called "direction," and the direction of rotation with the Y direction as the axis is "θ." Y There is also the concept of "direction."

[0022] As shown in Figures 1 and 2, the test chart 10 of this embodiment has, for example, a three-dimensional structure (three-dimensional structure). The test chart 10 has, for example, a pattern 160 on the slope 140 that is used to adjust the positions of the optical system 220 and the image sensor 240 in the camera 20.

[0023] Specifically, the test chart 10 of this embodiment includes, for example, a support plate 190, a three-dimensional block (3D block) 110, and a light-shielding section 150.

[0024] [Support plate] The support plate 190 is, for example, constructed as a plate-shaped member and configured to support the 3D block 110. The support plate 190 is made of a black-painted aluminum alloy, for example, to prevent light from entering from the outside, such as room lighting. In plan view, the shape of the support plate 190 is, for example, a square (rectangle).

[0025] The support plate 190 is configured to be supported (fixed) to the chart support section 310 in the camera manufacturing apparatus 1 described later. The support plate 190 may have, for example, a fixed portion (not shown) that is fixed to a predetermined position on the chart support section 310. Examples of the fixed portion include through holes through which bolts are inserted.

[0026] [Composition of each 3D block] The 3D block 110 is provided, for example, on a support plate 190 and has a three-dimensional structure. In this embodiment, the 3D block 110 is configured, for example, as a cone. Examples of cones that the 3D block 110 can be made up of include polygonal pyramids (triangular pyramids, square pyramids, etc.) or cones. In this embodiment, the 3D block 110 is configured, for example, as a square pyramid (regular square pyramid).

[0027] The 3D block 110 of this embodiment has, for example, a base (not shown), a vertex 120, and a slope 140.

[0028] The bottom surface of the 3D block 110 is, for example, in contact with the top surface of the support plate 190 and is fixed to the support plate 190. In this embodiment, the shape of the bottom surface is, for example, a square having four orthogonal bases.

[0029] The vertex 120 is, for example, positioned at a predetermined height from the support plate 190.

[0030] The slope 140 connects, for example, the base and the vertex 120 and is provided at an angle with respect to the normal direction of the base. For example, the test chart 10 is supported by the chart support part 310 (described later) such that the slope 140 is tilted with respect to the optical axis of the optical system 220 of the camera 20 to be adjusted.

[0031] In this embodiment, for example, four slopes 140 are provided. The four slopes 140 are inclined in opposite directions, for example, with respect to the vertex 120. In this embodiment, the shape of each of the four slopes 140 is, for example, an isosceles triangle.

[0032] The inclined surface 140 has, for example, a pattern 160 from which light is emitted. Here, "pattern 160" means a design or pattern that can be captured by the camera 20. Furthermore, "pattern 160 from which light is emitted" includes cases in which light from the bottom side of the 3D block 110 is transmitted through the pattern 160 and emitted, and cases in which light irradiated onto the 3D block 110 from the camera 20 side is reflected by the pattern 160 and emitted. In this embodiment, the pattern 160 is, for example, the former. Furthermore, "light is emitted" means, for example, that light is emitted in all directions except the 3D block 110.

[0033] In this embodiment, for example, each of the multiple slopes 140 has a pattern 160. The multiple patterns 160 extend continuously from the vertex 120 side along different slope directions. Because the patterns 160 are continuous along the slopes 140, the focal position of the camera 20 (provisional focal position described later) can be accurately detected on the continuous patterns 160. Furthermore, because the multiple patterns 160 extend along different slope directions, the optimal focal position of the camera 20 can be detected based on the correlation of the detection results of the multiple patterns 160.

[0034] In each 3D block 110 of this embodiment, the multiple patterns 160 are arranged such that they are point-symmetric with respect to the vertex 120 when viewed from above (directly above) the vertex 120 in the direction of the optical axis of the optical system 220 of the camera 20 (i.e., when viewed visually in real space, i.e., in terms of design). This allows the camera 20 to detect the focal position in a balanced manner based on the detection results of each pattern 160 that is point-symmetric with respect to the vertex 120.

[0035] Furthermore, within the image captured by camera 20, the multiple patterns 160 may not necessarily be point-symmetrical. For example, this could be due to the orientation of the optical system 220 of camera 20 before adjustment not being facing forward, or the effect of distortion aberration in the optical system 220.

[0036] In this embodiment, the slope 140 has, for example, at least one boundary line 162 as a pattern 160. The boundary line 162 forms a boundary of, for example, at least one of color, shade, and brightness. The boundary line 162 also extends linearly along the slope direction of the slope 140.

[0037] In this embodiment, each of the slopes 140 has, for example, a plurality of boundary lines 162. Specifically, the slope 140 has, for example, a slit (linear opening) opened in the black substrate. That is, light is emitted through the slit. Also, both sides of the slit constitute boundary lines 162a and 162b.

[0038] [Types of 3D blocks] In this embodiment, for example, multiple 3D blocks 110 are provided. The multiple 3D blocks 110 include, for example, a central block 110a and four outer blocks 110b. In the following, adjacent 3D blocks 110 may be referred to as "neighboring blocks".

[0039] The central block 110a is configured, for example, as a regular square pyramid. The central block 110a is positioned, for example, in the center of the camera 20's field of view, i.e., in the center of the support plate 190.

[0040] The outer blocks 110b are positioned, for example, away from the center of the camera 20's field of view, that is, away from the center of the support plate 190. In this embodiment, the four outer blocks 110b are each positioned near the four corners of the support plate 190.

[0041] In this embodiment, the outer block 110b is configured as, for example, a square pyramid, but has a shape that is a deformed version of a regular square pyramid.

[0042] Specifically, as shown in Figure 1, the vertex 120 of the outer block 110b is positioned off-center towards the center of the support plate 190.

[0043] On the other hand, as shown in Figure 2, the test chart 10 is positioned such that the vertex 120 is located at the center of the outer block 110b when the camera 20 takes an image. In other words, even if distortion occurs in the optical system 220 of the camera 20, the test chart 10 is positioned such that the vertex 120 of the outer block 110b is located at the center of the outer block 110b because the vertex 120 of the outer block 110b is positioned towards the center of the support plate 190 in real space.

[0044] [Light-blocking part] As shown in Figures 1 and 2, in this embodiment, a light-shielding portion 150 is provided between the first inclined surface 140 and the second inclined surface 140 adjacent to the first inclined surface 140. The light-shielding portion 150 is configured, for example, to block light from at least the pattern 160 of the first inclined surface 140 toward the second inclined surface 140.

[0045] In this context, "adjacent first and second inclined surfaces 140" means that they are non-parallel to each other and are arranged at close range without any members other than the light-shielding portion 150 in between. In other words, the first and second inclined surfaces 140 are arranged such that, if the light-shielding portion 150 were absent, light from each pattern 160 could enter the other inclined surface 140.

[0046] In this way, the presence of the light-shielding portion 150 makes it possible to suppress the overlap (confusion) of light emitted from the pattern 160 of the first slope 140 with the pattern 160 of the second slope 140.

[0047] In this embodiment, the light-shielding sections 150 are provided, for example, to block light between the outer block 110b and the neighboring 3D block 110 adjacent to the outer block 110b. Specifically, light-shielding sections 150 (S2, S3, S5, S6, S1, and S4, respectively) are provided between the central block B1 and the outer blocks B2 to B5, between the outer block B2 and the outer block B5, and between the outer block B3 and the outer block B4. With this configuration, the light-shielding sections 150 can block light from the slope 140 of each outer block 110b toward the slope 140 of the neighboring block, and light from the slope 140 of the central block 110a toward the slope 140 of the neighboring outer block 110b.

[0048] Furthermore, in this embodiment, the light-shielding portion 150 is arranged such that it does not block the light coming from the patterns 160 of the first and second inclined surfaces 140 toward the camera 20. Specifically, the light-shielding portion 150 is configured, for example, in the shape of a plate and is arranged so that it is captured as a line when image is taken by the camera 20. In other words, the light-shielding portion 150 may be arranged at an angle to the normal of the support plate 190 in real space. With this configuration, the detection of the focal position in each pattern 160 can be performed stably while arranging the light-shielding portion 150.

[0049] Furthermore, in this embodiment, the light-shielding portion 150 has, for example, a surface that suppresses reflection. Specifically, the light-shielding portion 150 has an anti-reflective coating on its surface. This makes it possible to suppress diffuse reflection of light caused by the light-shielding portion 150.

[0050] [Placement of borders within the image] Here, with reference to Figures 3A and 3B, the arrangement of the boundary line 162 in the image captured by the camera 20 being adjusted will be explained.

[0051] As shown in Figure 3B, in this embodiment, the test chart 10 is positioned such that the boundary line 162 and the pixel arrangement direction of the image sensor 240 are non-parallel when the camera 20 takes an image. In other words, the test chart 10 is positioned such that the boundary line 162 and the pixel arrangement direction of the image sensor 240 intersect when the camera 20 takes an image. This makes it possible to detect changes in the index value of pixels at a pitch finer than the pixel pitch.

[0052] Furthermore, in this embodiment, the test chart 10 is positioned such that when the camera 20 takes an image, the boundary line 162 is tilted linearly with respect to the pixel arrangement direction of the image sensor 240.

[0053] The inclination angle α of the boundary line 162 with respect to the pixel array direction is, for example, greater than 0.02 rad. This allows interpolation of the data of 50 rows of pixels to evaluate an index value equivalent to one pixel. However, in practice, increasing the number of rows in the evaluation region ER (described later) tends to worsen the lateral resolution of the image, i.e., the resolution in the Z direction of the focal position. In other words, the better the interpolation accuracy, the worse the lateral resolution of the image tends to become. Therefore, in practice, the number of rows in the evaluation region ER is set to between 10 and 30 rows.

[0054] On the other hand, the inclination angle α of the boundary line 162 with respect to the pixel array direction is, for example, approximately 0.79 rad (45°) or less. This allows for accurate detection of changes in index values ​​smaller than one pixel.

[0055] Here, when the camera 20 takes an image, it is possible that it will be affected by the distortion aberration of the optical system 220.

[0056] However, in this embodiment, the test chart 10 is positioned such that when the camera 20 takes an image, the boundary line 162 is shifted with respect to the pixel arrangement direction of the image sensor 240 by a larger amount than the shift caused solely by the distortion aberration of the optical system 220. In other words, the shift of the boundary line 162 with respect to the pixel arrangement direction when the camera 20 takes an image has, for example, a component caused by the distortion aberration of the optical system 220 and a component that is linearly inclined with respect to the pixel arrangement direction of the image sensor 240 (also called a linear inclination component).

[0057] Furthermore, when camera 20 captures an image, the width of the slit closer to camera 20 becomes wider than the width of the slit at the bottom due to the difference in imaging magnification. As a result, in one slit, one boundary line 162a and the other boundary line 162b become non-parallel to each other. However, even after considering the effects caused by the difference in imaging magnification described above, it is preferable that the boundary lines 162a and 162b intersect with the pixel arrangement direction in the image.

[0058] In real space, the arrangement of the test chart 10 that can be obtained in such an image is such that, for example, each of the four bases of the 3D block 110 is parallel to one of the four sides of the support plate 190 (corresponding to the orthogonal pixel arrangement direction of the image sensor 240). In contrast, the boundary line 162 on each of the slopes 140 is inclined at a predetermined angle α with respect to the extension direction of one of the four bases in a plan view.

[0059] In this embodiment, due to the configuration in which the boundary line 162 is inclined with respect to the base, the patterns 160 on the slopes 140 of each 3D block 110 are arranged to be closer to those of neighboring blocks. Even with this configuration, the presence of the light-shielding portion 150 prevents the light emitted from the inclined patterns 160 of a predetermined slope 140 from overlapping (conflating) with the patterns 160 of neighboring blocks.

[0060] (2) Camera manufacturing equipment Next, the camera manufacturing apparatus 1 according to this embodiment will be described with reference to Figures 1 to 6.

[0061] As shown in Figure 4, the camera manufacturing apparatus 1 of this embodiment is configured to adjust the relative position of the optical system 220 and the image sensor 240 in the camera 20 based on the detection results of the test chart 10, for example. Specifically, the camera manufacturing apparatus 1 includes, for example, a chart support unit 310, a relay lens 320, a camera support unit 340, a camera adjustment mechanism 360, a camera fixing unit 380, and a control unit 400.

[0062] (camera) Here, we will describe the camera 20 that is adjusted in the camera manufacturing apparatus 1, using Figure 5. As shown in Figure 5, the camera 20 includes, for example, an optical system 220, an autofocus mechanism (not shown), an image sensor 240, a circuit board 260, and a connector 280.

[0063] The optical system 220 includes, for example, a lens group (not shown) containing at least one lens, and a lens barrel (not shown). The lens barrel supports the lens group as a whole.

[0064] The autofocus mechanism is configured such that the lens barrel supporting the lens group can move along the optical axis. Examples of autofocus mechanisms include actuators such as voice coil motors.

[0065] The image sensor 240 is configured, for example, as a solid-state image sensor. Examples of the image sensor 240 include a CCD (Charge Coupled Device) or a CMOS (Complementary Metal-Oxide Semiconductor).

[0066] The image sensor 240 is positioned, for example, perpendicular to the optical axis of the optical system 220 and in a position where it is imaged through the optical system 220. The relative position of the image sensor 240 and the optical system 220 is adjusted by the camera manufacturing apparatus 1.

[0067] The circuit board 260 is configured to, for example, mount an image sensor 240 and drive the image sensor 240 and the autofocus mechanism. Adhesive 262 for fixing the optical system 220 is applied around the image sensor 240 on the circuit board 260.

[0068] The connector 280 is configured to connect to a mobile phone or other device equipped with a camera 20. The camera 20 will also be connected to the camera manufacturing apparatus 1 via the connector 280.

[0069] (Chart support section) The chart support section 310 is configured, for example, to support the test chart 10.

[0070] The chart support portion 310 of this embodiment is configured to support the test chart 10 such that, for example, the inclined surface 140 is tilted with respect to the optical axis of the optical system 220, and the boundary line 162 and the pixel arrangement direction of the image sensor 240 are non-parallel when the camera 20 takes an image. The chart support portion 310 is configured to fasten the test chart 10 with screws in the above arrangement.

[0071] The chart support unit 310 may be configured to allow the test chart 10 to be positioned in the optical axis direction. Specifically, for example, the test chart 10 may be movable by a lead screw by approximately ±50 mm in the optical axis direction.

[0072] The chart support section 310 includes, for example, a chart light source 312. The chart light source 312 is positioned on the back side of the test chart 10 and is configured to irradiate light from the inside of each 3D block 110 and transmit light through the patterns 160 of each slope 140. In this embodiment, the chart light source 312 is configured to irradiate light to all 3D blocks 110 simultaneously and transmit light through all patterns 160.

[0073] Furthermore, it is preferable that the sides of the camera manufacturing apparatus 1 are covered with an opaque acrylic plate or blackout curtain to block out light.

[0074] (Relay lens) The relay lens 320 is configured, for example, to focus the image of the test chart 10 onto the image sensor 240. The relay lens 320 is configured, for example, as a convex lens. This configuration makes it possible to shorten the distance between objects within the camera manufacturing apparatus 1.

[0075] (Camera support section) The camera support section 340 is configured to support at least a portion of the camera 20, which has an optical system 220 and an image sensor 240, in a position where the test chart 10 can be imaged. In this embodiment, the camera support section 340 is configured to support, for example, the image sensor 240, the circuit board 260, and the connector 280.

[0076] The camera support section 340 is connected to the connector 280 of the camera 20. This allows the camera manufacturing apparatus 1 to capture images of the test chart 10 using the image sensor 240.

[0077] (Camera adjustment mechanism) The camera adjustment mechanism 360 is configured, for example, to adjust the relative positions of the optical system 220 and the image sensor 240 based on the focal position of the camera 20.

[0078] Specifically, the camera adjustment mechanism 360 controls, for example, the Z direction, X direction, Y direction, θ Z direction, θ X Direction and θ Y The optical system 220 is configured to be adjustable in the direction. Furthermore, the camera adjustment mechanism 360 may be configured such that, for example, the camera support portion 340 that supports the image sensor 240 is adjustable in the X and Y directions.

[0079] (Camera mounting part) The camera fixing unit 380 is configured, for example, to fix the optical system 220 and the image sensor 240. Specifically, the camera fixing unit 380 is configured, for example, as a light source that emits ultraviolet light. For example, by irradiating the adhesive 262 on the circuit board 260 with ultraviolet light from the camera fixing unit 380 and curing the adhesive 262, the optical system 220 and the image sensor 240 can be fixed in place.

[0080] (Control Unit) The control unit 400 is configured, for example, to control each part of the camera manufacturing apparatus 1 and to adjust the camera 20 based on the image of the test chart 10 captured by the camera 20.

[0081] Specifically, as shown in Figure 5, the control unit 400 is configured as a computer and includes, for example, a CPU (Central Processing Unit) 410, RAM (Random Access Memory) 420, a storage device 430, an I / O port 440, an input unit 450, and a display unit 460. The RAM 420, the storage device 430, and the I / O port 440 are configured to exchange data with the CPU 410.

[0082] The I / O port 440 is connected, for example, to the chart light source 312, the camera support unit 340, the camera adjustment mechanism 360, and the camera fixing unit 380. The I / O port 440 is also connected to the image sensor 240 of the camera 20 via the camera support unit 340.

[0083] The storage device 430 is configured to store, for example, a program related to focus detection of the camera 20, a program for controlling the camera adjustment mechanism 360, and images of the test chart 10. The storage device 430 is, for example, an HDD (Hard disk drive) or an SSD (Solid State Drive).

[0084] RAM420 is configured to temporarily hold programs and information read from storage device 430 by CPU410.

[0085] The CPU 410 is configured to function as an image analysis unit and a camera adjustment control unit by executing a predetermined program stored in the storage device 430.

[0086] The image analysis unit is configured to analyze images of the test chart 10, for example, and to detect the focal position of the camera 20. The camera adjustment control unit is configured to control the camera adjustment mechanism 360 to adjust the relative positions of the optical system 220 and the image sensor 240 based on the focal position of the camera 20, for example. The camera manufacturing method using the parts described above will be explained in detail later.

[0087] The predetermined programs for realizing each of the above-mentioned parts are installed and used, for example, on the computer comprising the control unit 400. The programs may be provided, for example, by being stored on a computer-readable storage medium prior to their installation. Alternatively, the programs may be provided to the computer, for example, through a communication line (such as an optical fiber) connected to the control unit 400.

[0088] The display unit 460 is configured to display, for example, an image of the test chart 10 or analysis results. The display unit 460 is, for example, a liquid crystal display or an organic light-emitting diode (OLED) display.

[0089] The input unit 450 is configured to allow, for example, information that the user will use to perform a predetermined operation to be input to the control unit 400. The input unit 450 is, for example, a mouse or keyboard.

[0090] The display unit 460 and the input unit 450 may be configured to serve both functions using a touch panel or the like.

[0091] (3) Camera manufacturing method Next, the manufacturing method of the camera according to this embodiment will be described with reference to Figures 1 to 11.

[0092] As shown in Figure 7, the camera manufacturing method of this embodiment includes, for example, a preparation step S100, an imaging step S200, an image analysis step S300, a focus error calculation step S400, a focus position determination step S520, a camera position adjustment step S540, and a camera fixing step S600. Each step after the preparation step S100 is processed or controlled by the control unit 400.

[0093] (S100: Preparation process) First, prepare the test chart 10 for this embodiment.

[0094] At this time, the test chart 10 is supported by the chart support unit 310. Once the test chart 10 is in place, the chart light source 312 is activated and light is shone onto the test chart 10. In addition, light is simultaneously shone from the chart light source 312 onto all 3D blocks 110, allowing light to pass through all patterns 160.

[0095] Furthermore, the camera 20 to be adjusted is placed in the camera manufacturing apparatus 1.

[0096] In this case, for example, at least a portion of the camera 20 is supported by the camera support 340 in a position where the test chart 10 can be imaged, and at least a portion of the optical system 220 and the image sensor 240 are arranged in the camera adjustment mechanism 360.

[0097] (S200: Imaging process) Next, using the camera 20 described above, an image of the test chart 10 is acquired by capturing images of the test chart 10.

[0098] At this time, all patterns 160 of the 3D blocks 110 are imaged at once. Also, at this time, for example, due to the arrangement of the test chart 10 described above, the boundary line 162 of the test chart 10 and the pixel arrangement direction are non-parallel in the image.

[0099] (S300: Image analysis process) Next, the image captured from the test chart 10 is analyzed to detect the focal position of the camera 20.

[0100] In this embodiment, for example, the focal position of the camera 20 is detected based on the detection result of the boundary line 162 in the image captured of the test chart 10.

[0101] As shown in Figure 8A, an evaluation region ER containing multiple pixels that intersect the boundary line 162 is selected within the image of the test chart 10. In this case, for example, multiple evaluation regions ER with different positions along the extension direction of the boundary line 162 are selected. Also, as shown in Figure 8B, for example, multiple pixel sequences that intersect the boundary line 162 are selected as evaluation regions ER.

[0102] Next, for each pixel within the evaluation region ER, an index value (pixel value) is obtained for at least one of the following: color, intensity, and brightness.

[0103] Furthermore, for each pixel within the evaluation region ER in Figure 8B, the number of corrected pixels d' is calculated from a reference line that passes through the corner of the evaluation region ER and is parallel to the boundary line 162. Since the boundary line 162 is inclined at an angle α with respect to the pixel arrangement direction, the number of corrected pixels d' can be calculated using the following equation (1). d' = d + n tan α ... (1) However, d is the number of pixels (number of pixel rows) (in pixels) in the direction of the pixel array (longitudinal direction of the evaluation area ER, vertical direction in the figure) from one end of the evaluation area ER to the direction of the pixel array that intersects with boundary line 162 within the evaluation area ER. n is the number of pixel columns in the evaluation area ER.

[0104] Based on these results, as shown in Figure 9, the correspondence between the index value of a pixel and the number of corrected pixels d' is obtained for each pixel within the evaluation region ER. Note that the vertical axis in Figure 9 represents, for example, brightness (luminance) as the index value.

[0105] In this embodiment, by setting the horizontal axis to the number of corrected pixels d' calculated from a reference line passing through the corners of the evaluation region ER and parallel to the boundary line 162, an index value can be obtained for each column of the evaluation region ER where the number of corrected pixels d' is shifted by tanα. By setting tanα≦1, i.e., α≦0.79rad(45°), the index value of each pixel can be plotted at a pitch shorter than the pixel pitch. In other words, it becomes possible to virtually shorten the sampling pitch. As a result, it becomes possible to accurately grasp changes in index values ​​smaller than one pixel in the direction intersecting the boundary line 162.

[0106] Next, as shown in Figure 9, an interpolation curve (interpolation function) IC is obtained by interpolating discrete data representing the correspondence between the number of corrected pixels d' and the index value of the pixels within the evaluation region ER.

[0107] Next, by performing a frequency analysis (Fourier transform) on the interpolation curve IC, we obtain a curve representing the spatial frequency response (SFR) with respect to spatial frequency, as shown as one curve in Figure 10.

[0108] As described above, a series of steps are performed in multiple evaluation regions ER located at different positions along the extension direction of the boundary line 162.

[0109] As a result, frequency response curves can be obtained for each of the evaluation regions ER, as shown in Figure 10.

[0110] In this embodiment, for example, among multiple evaluation regions ER, the position within the evaluation region ER where the change in the index value with respect to the number of corrected pixels d' is steepest is detected as the provisional focal position.

[0111] Specifically, as shown in Figure 10, in each evaluation region ER, the maximum spatial frequency having a frequency response above a predetermined criterion is defined as the "optimal spatial frequency (Best)". It is calculated as "Frequency)".

[0112] Next, as shown in FIG. 11, obtain the correspondence relationship of the optimal spatial frequency with respect to the center position (L) of each evaluation region ER in the direction along the boundary line 162, and determine the highest spatial frequency as the peak spatial frequency. Specify the position where the peak spatial frequency is obtained as the provisional focal position on the boundary line 162.

[0113] After specifying the provisional focal position, in the image, based on the distance L from the lower end of the boundary line 162 to the provisional focal position in the direction along the boundary line 162, obtain the coordinates (three-dimensional coordinates) B mn1 (X, Y, Z) of the provisional focal position in the real space.

[0114] Next, after obtaining the provisional focal position on a predetermined boundary line 162, perform the same process for all the boundary lines 162 of the test chart 10.

[0115] (S400: Focus error calculation step) When the image analysis step S300 is completed for all the boundary lines 162, as shown in FIG. 3A, the provisional focal positions (coordinates B 111 ~B 142 ) are obtained at each of all the boundary lines 162.

[0116] At this time, in the present embodiment, for example, based on the correlation of the detection results of a plurality of boundary lines 162, the optimal focal position B m of the camera 20 is detected.

[0117] As described above, when the coordinates B m of the optimal focal position of the camera 20 are obtained, based on the coordinates B m of the optimal focal position, the tilt angle θ x , θ y of the focal plane of the camera 20, and the coordinates (C x , C y , C z ) of the center position of the focal plane are obtained.

[0118] In this way, the tilt angle θ x , θ y of the focal plane of the camera 20, and the coordinates (C x , Cy ,C z Once the values ​​are determined, the error between each value and the target value is calculated. This error will also be referred to as the "focus error" below.

[0119] (S520: Focus position determination step) After determining the focus error, it is determined whether the camera 20's focal position is good or not. Specifically, for example, it is determined whether the aforementioned focus error is below a predetermined tolerance value.

[0120] (S540: Camera position adjustment process) If the focal position of camera 20 is not good (i.e., if the focus error is greater than the allowable value, No in S520), the camera adjustment mechanism 360 adjusts the relative positions of the optical system 220 and the image sensor 240 based on the focal position of camera 20.

[0121] Specifically, for example, the Z, X, Y, and θ directions are adjusted so that the aforementioned focus error becomes 0 (zero). Z direction, θ X Direction and θ Y Adjust the optical system 220 in the direction.

[0122] After adjusting camera 20, the imaging process from S200 onwards is repeated.

[0123] (S600: Camera fixing process) On the other hand, if the camera 20's focal position is good (i.e., if the focus error is below a preset tolerance, the answer is Yes in S520), the camera fixing unit 380 fixes the optical system 220 and the image sensor 240.

[0124] This concludes the camera manufacturing process of this embodiment.

[0125] (4) Effects according to this embodiment This embodiment provides one or more of the following effects.

[0126] (a) In this embodiment, a light-shielding portion 150 is provided between the first inclined surface 140 and the second inclined surface 140 adjacent to the first inclined surface 140. The light-shielding portion 150 is configured, for example, to block light from at least the pattern 160 of the first inclined surface 140 toward the second inclined surface 140. This makes it possible to suppress the overlap of light emitted from the pattern 160 of the first inclined surface 140 with the pattern 160 of the second inclined surface 140.

[0127] This allows for stable detection of the optimal focal position in the pattern 160 of the second slope 140 without being affected by the overlap of light emitted from the pattern 160 of the first slope 140. Furthermore, it is possible to suppress erroneous detection of the focal position in the portion of the second slope 140 illuminated by light from the first slope 140.

[0128] As a result, in this embodiment, it is possible to suppress the decrease in the detection accuracy of the camera 20's focal position.

[0129] (b) In this embodiment, the focal position of the camera 20 can be detected early based on images taken of all patterns 160 in the multiple 3D blocks 110.

[0130] Here, the problem of the light patterns 160 overlapping between the slopes 140 as described above can potentially be resolved by illuminating each 3D block 110 with light and acquiring an image of pattern 160 for each slope 140. However, if image acquisition and analysis are performed by illuminating each 3D block 110 with light, the time required for measurement and analysis will increase in proportion to the number of 3D blocks 110.

[0131] In contrast, in this embodiment, by capturing an image of all patterns 160 in multiple 3D blocks 110 at once, it is possible to suppress the overlap of light between the patterns 160 on the slopes 140. As a result, the focal position of the camera 20 can be detected early, while suppressing a decrease in detection accuracy, based on only one image in which the overlap of light of the patterns 160 is suppressed. In other words, it is possible to achieve both suppression of a decrease in the detection accuracy of the focal position and a reduction in the detection time of the focal position.

[0132] (c) In this embodiment, the light-shielding portion 150 is arranged such that it does not block the light coming from the patterns 160 of the first and second slopes 140 toward the camera 20. This makes it possible to suppress the loss of the pattern 160 caused by the light-shielding portion 150 when the camera 20 images the pattern 160. As a result, it is possible to stably detect the optimal focal position using the entire pattern 160 while arranging the light-shielding portion 150.

[0133] Furthermore, in this embodiment, the light-shielding portion 150 is configured in a plate shape and is arranged so as to be captured as a line when image is captured by the camera 20. This makes it possible to more stably suppress defects in the pattern 160 caused by the light-shielding portion 150.

[0134] (d) In this embodiment, the outer block 110b is positioned such that its vertex 120 is located at the center of the outer block 110b when the camera 20 takes an image. The light-shielding portion 150 is provided to block light from the slope 140 of the outer block 110b toward the slope 140 of the neighboring block.

[0135] Here, if the outer block 110b is arranged as described above, the vertex 120 of the outer block 110b is positioned in real space, biased towards the center of the support plate 190. Due to the shape of the outer block 110b, at least one of the slopes 140 of the outer block 110b is positioned nearly perpendicular to the support plate 190. As a result, light from the nearly perpendicular slope 140 of the outer block 110b is more likely to be directed towards the slope 140 of a neighboring block, and more likely to overlap with the pattern 160 of the neighboring block.

[0136] Furthermore, due to the shape of the outer block 110b, the area of ​​at least one slope 140 of the outer block 110b becomes larger, and the pattern 160 on that slope 140 becomes larger. As a result, light from the wide slope 140 of the outer block 110b is more easily directed towards the slope 140 of a neighboring block, and is more likely to overlap with the pattern 160 of the neighboring block.

[0137] In contrast, in this embodiment, a light-shielding section 150 is provided between the outer block 110b and the neighboring block, thereby blocking light from the nearly vertical slope 140 of the outer block 110b toward the slope 140 of the neighboring block. Furthermore, it is possible to suppress the irradiation of the slope 140 of the neighboring block by light from the wide slope 140 of the outer block 110b.

[0138] As a result, even under conditions where light overlap of pattern 160 is likely to occur due to the shape of the outer block 110b, it is possible to stably suppress a decrease in the detection accuracy of the camera 20's focal position.

[0139] (e) In this embodiment, the test chart 10 is positioned such that the inclined surface 140 is tilted with respect to the optical axis of the optical system 220, and the boundary line 162 and the pixel arrangement direction of the image sensor 240 are nonparallel when the camera 20 takes an image. This makes it possible to obtain an index value for each row of the evaluation region ER in which the number of corrected pixels d' is shifted by tanα. By setting tanα≦1, i.e., α≦0.79rad(45°), the index value of each pixel can be plotted at a pitch shorter than the pixel pitch. In other words, it is possible to virtually shorten the sampling pitch. As a result, it is possible to accurately grasp changes in index values ​​smaller than one pixel in the direction intersecting the boundary line 162.

[0140] In this way, by accurately grasping the change in the index value in the direction intersecting the boundary line 162, the focal position at the boundary line 162 (the provisional focal position mentioned above) can be accurately detected. As a result, it becomes possible to accurately adjust the relative position of the optical system 220 and the image sensor 240 in the camera 20.

[0141] (f) In this embodiment, in the test chart 10 in which the boundary line 162 is non-parallel to the pixel arrangement direction, the light-shielding portion 150 is arranged to suppress light from the pattern 160 of the first slope 140 from overlapping with the boundary line 162 of the adjacent second slope 140.

[0142] Here, if the boundary line 162 is not parallel to the pixel arrangement direction, as described above, the boundary line 162 will be positioned at an angle to the bottom edge of the 3D block 110. As a result, the pattern 160 on the slope 140 of each 3D block 110 is positioned to be closer to neighboring blocks. Consequently, light from the pattern 160 that is closer to neighboring blocks is more likely to illuminate the slope 140 of the neighboring block, and is more likely to overlap with the pattern 160 of the neighboring block.

[0143] In contrast, in this embodiment, a light-shielding section 150 is provided between the slopes 140 where the boundary line 162 is not parallel to the pixel arrangement direction. This suppresses the illumination of the slopes 140 of neighboring blocks by light from a pattern 160 approaching a neighboring block. As a result, even in situations where overlapping of light from pattern 160 is likely to occur due to the shape of the boundary line 162 being not parallel to the pixel arrangement direction, changes in index values ​​smaller than one pixel can be accurately grasped at the boundary line 162. Consequently, it becomes possible to stably suppress a decrease in the detection accuracy of the camera 20's focal position.

[0144] <Second Embodiment of the Present Invention> Next, a second embodiment of the present invention will be described.

[0145] In the following description, only elements that differ from the embodiments described above will be explained. Elements that are substantially the same as those described in the embodiments above will be denoted by the same reference numerals and their descriptions will be omitted. Similarly, descriptions of the third embodiment and others will also be omitted, as with the second embodiment.

[0146] (1) Test Chart The test chart 10 according to this embodiment will be explained with reference to Figure 12.

[0147] As shown in Figure 12, the test chart 10 of this embodiment includes, for example, a support plate 190, a 3D block 110, and a light-shielding section 150.

[0148] In this embodiment, the 3D block 110 has, for example, a plurality of ridges 130 and a plurality of slopes 140.

[0149] The multiple ridges 130 are provided, for example, at a predetermined height from the support plate 190. The ridges 130 may also be considered to be formed by the collection of vertices 120 in the above-described embodiment. It is preferable that the heights of each of the multiple ridges 130 from the support plate 190 are equal to each other.

[0150] Furthermore, in this embodiment, the multiple ridges 130 are arranged radially around, for example, the optical axis of the optical system 220 of the camera 20 (i.e., the center of the support plate 190). In other words, in this embodiment, the 3D block 110 has a shape in which, for example, multiple triangular prisms are joined at the center of the support plate 190.

[0151] In this embodiment, it is preferable that the multiple ridges 130 are axially symmetric with respect to the optical axis of the optical system 220 of the camera 20.

[0152] Multiple slopes 140 are provided, for example, so as to slope in opposite directions, flanking each of the multiple ridges 130.

[0153] In this embodiment, each slope 140 has a plurality of slits, for example, as a pattern 160. Each of the plurality of slits has a pair of boundary lines 162 (162a, 162b).

[0154] Here, as shown in Figure 12, in this embodiment, a pair of slopes 140 that incline from a pair of ridges 130 are in contact with each other. That is, of the pair of slopes 140, the first slope 140 inclines from the first ridge 130 of the multiple ridges 130, and the second slope 140 inclines from the second ridge 130 adjacent to the first ridge 130 and is in contact with the first slope 140. The light-shielding portion 150 extends radially between the first slope 140 and the second slope 140, centered on the optical axis of the camera 20. The light-shielding portion 150 is configured, for example, to block light from the pattern 160 of one slope 140 toward the other slope 140.

[0155] In this embodiment as well, the light-shielding portion 150 is arranged such that it does not block the light directed toward the camera 20 from, for example, the patterns 160 of the first and second inclined surfaces 140.

[0156] (2) Effects In this embodiment, the test chart 10 has a plurality of radially arranged ridges 130, and a light-shielding portion 150 is provided between a pair of slopes 140 that are in contact with each other, other than the ridges 130.

[0157] In the test chart 10, where a pair of inclined surfaces 140 are in contact with each other, the spacing between the patterns 160 of the pair of inclined surfaces 140 becomes narrower. As a result, light from the pattern 160 of one of the inclined surfaces 140 is more likely to illuminate the other inclined surface 140, and more likely to overlap with the pattern 160 of the other inclined surface 140.

[0158] In contrast, in this embodiment, since a light-shielding portion 150 is provided between the pair of adjacent inclined surfaces 140 as described above, it is possible to suppress the illumination of the other inclined surface 140 by light from the pattern 160 of one of the inclined surfaces 140. As a result, even in situations where overlapping of light from the pattern 160 is likely to occur due to the arrangement of closely spaced inclined surfaces 140, it is possible to stably suppress a decrease in the detection accuracy of the camera 20's focal position.

[0159] <Third Embodiment of the Invention> Next, a third embodiment of the present invention will be described.

[0160] (1) Test Chart The test chart 10 according to this embodiment will be explained with reference to Figure 13.

[0161] As shown in Figure 13, the test chart 10 of this embodiment includes, for example, a support plate 190, a 3D block 110, a 2D block 170, and a light-shielding section 150.

[0162] The 3D block 110 of this embodiment is similar to, for example, the 3D block 110 of the second embodiment.

[0163] The 2D block 170 is, for example, positioned differently from the 3D block 110 on the support plate 190 and has a two-dimensional pattern (2D pattern) 180 on its upper surface. The 2D pattern 180 is, for example, positioned perpendicular to the optical axis of the camera 20. This allows the optical adjustment mechanism of the camera 20 to adjust the position of the optical system 220 to the origin position based on the detection result of the 2D pattern 180 of the 2D block 170.

[0164] The 2D pattern 180 is provided, for example, on the flat upper surface of the 2D block 170. The height of the 2D pattern 180 from the support plate 190 is, for example, lower than the height of the vertex 120 of the 3D block 110.

[0165] Furthermore, the 2D block 170 has, for example, at least one boundary line 182 as a 2D pattern 180. The boundary line 182 forms a boundary of, for example, at least one of color, shade, and brightness.

[0166] In this embodiment, for example, four 2D blocks 170 are provided. The four 2D blocks 170 are each positioned, for example, between multiple edges 130 of the 3D block 110. Alternatively, the 2D blocks 170 are positioned, for example, in the center between a pair of edges 130. With this arrangement, the centers in the X and Y directions can be easily detected based on the detection results (correlation) of the 2D blocks 170.

[0167] Here, as shown in Figure 13, in this embodiment, the light-shielding portion 150 extends radially between the multiple slopes 140 of the 3D block 110, with respect to the optical axis of the camera 20.

[0168] Furthermore, in this embodiment, the light-shielding portion 150 is provided between the 3D block 110 and the 2D block 170 and is also configured as an auxiliary light-shielding portion that blocks at least the light from the 2D pattern 180 toward the 3D block 110.

[0169] (2) Effects In this embodiment, the test chart 10 has a 3D block 110 and a 2D block 170, and the light-shielding portion 150 is provided between the 3D block 110 and the 2D block 170.

[0170] In the test chart 10, which has a 3D block 110 and a 2D block 170, the 2D block 170 may be lower than the vertices 120 of the 3D block 110. In this case, light from the 2D pattern 180 of the 2D block 170 is more likely to illuminate the slope 140 of the 3D block 110, and more likely to overlap with the pattern 160 of the slope 140 of the 3D block 110.

[0171] In contrast, in this embodiment, as described above, a light-shielding section 150 is provided between the 3D block 110 and the 2D block 170 as an auxiliary light-shielding section, which suppresses the light from the 2D pattern 180 of the 2D block 170 from illuminating the slope 140 of the 3D block 110. As a result, even in situations where overlapping of the light of the pattern 160 is likely to occur due to the arrangement of the 2D block 170, it is possible to stably suppress a decrease in the detection accuracy of the focal position of the camera 20.

[0172] <Other embodiments of the present invention> Although embodiments of the present invention have been specifically described above, the present invention is not limited to the embodiments described above, and can be modified in various ways without departing from its essence. Hereinafter, "the embodiments described above" refers to the first embodiment, the second embodiment, and the third embodiment.

[0173] In the above-described embodiment, the case in which the inclined surface 140 of the 3D block 110 has slits as a pattern 160 was explained. However, the inclined surface 140 of the 3D block 110 may have, as a pattern 160, a light-impermeable region and a light-transmitting region separated by a center line extending in the direction of inclination of the inclined surface 140.

[0174] In the above embodiment, the case in which the light-shielding portion 150 is configured in the shape of a plate was described, but the shape of the light-shielding portion 150 is not limited as long as the light-shielding portion 150 does not block the light directed from each pattern 160 toward the camera 20.

[0175] In the above-described embodiment, the light-shielding portion 150 is shown to be captured in a straight line when photographed by the camera. However, as long as the light-shielding portion 150 is captured in a linear shape, the shape of the line is not limited. For example, the light-shielding portion 150 may be captured in a curved or bent linear shape.

[0176] In the embodiments described above, the case in which each 3D block 110 has multiple slopes 140 has been described, but the disclosure is not limited to this case. Each 3D block 110 may have only one slope 140. Even in such a configuration, the overlap of light in the pattern 160 can be suppressed by providing light-shielding sections 150 between the multiple 3D blocks 110.

[0177] In the embodiments described above, a light-shielding portion 150 is provided between a pair of adjacent slopes 140, and the light-shielding portion 150 blocks light from both patterns 160 of the pair of slopes 140. However, the disclosure is not limited to this case. For example, the light-shielding portion 150 may be configured to block light from only one of the slopes 140's patterns 160.

[0178] In the third embodiment described above, the light-shielding portion 150 is configured not only to block light between the 3D blocks 110, but also to function as an auxiliary light-shielding portion that blocks light from the 2D blocks 170 to the 3D blocks 110. However, the disclosure is not limited to this case. The light-shielding portion 150 that blocks light between the 3D blocks 110 and the auxiliary light-shielding portion that blocks light from the 2D blocks 170 to the 3D blocks 110 may be provided separately.

[0179] <Preferred Embodiments of the Invention> Preferred embodiments of the present invention are described below.

[0180] (Note 1) This is a test chart for adjusting the camera. A first slope having a pattern of light emission, A second slope having a pattern of light emission, and positioned adjacent to the first slope, A light-shielding portion is provided between the first and second slopes and blocks light from at least the pattern on the first slope toward the second slope, Equipped with Test chart.

[0181] (Note 2) The light-shielding portion is positioned so as not to block the light directed toward the camera from the patterns on the first and second slopes, respectively. The test chart described in Appendix 1.

[0182] (Note 3) The light-shielding portion is configured in a plate shape and is arranged so that it is captured as a line when image is taken by the camera. The test chart described in Appendix 1 or Appendix 2.

[0183] (Note 4) Each of the patterns of the first and second slopes has at least one boundary line that extends linearly along the slope direction of each slope, The slope is inclined with respect to the optical axis of the camera, and is arranged such that the boundary line and the pixel arrangement direction of the camera are non-parallel when the camera takes an image. The light-shielding portion is arranged to suppress light from the pattern on the first slope from overlapping with the boundary line of the second slope. The test chart described in one of the appendices 1 through 3.

[0184] (Note 5) It is provided at a predetermined height and comprises a plurality of ridges arranged radially with respect to the optical axis of the camera, The first slope is inclined from the first of the plurality of ridges, The second slope is inclined from a second ridge adjacent to the first ridge and is in contact with the first slope. The test chart described in one of the appendices 1 through 4.

[0185] (Note 6) The light-shielding portion extends radially between the first and second inclined surfaces, with respect to the optical axis of the camera. The test chart described in one of the appendices 1 through 5.

[0186] (Note 7) A three-dimensional block having either the first slope or the second slope, A two-dimensional block having a two-dimensional pattern from which light is emitted, arranged perpendicular to the optical axis of the aforementioned camera, An auxiliary light-shielding section is provided between the three-dimensional block and the two-dimensional block, which blocks at least light from the two-dimensional pattern toward the three-dimensional block, Equipped with The test chart described in one of the appendices 1 through 6.

[0187] (Note 8) This is a test chart for adjusting the camera. A three-dimensional block with a slope, A two-dimensional block having a two-dimensional pattern from which light is emitted, arranged perpendicular to the optical axis of the aforementioned camera, An auxiliary light-shielding section is provided between the three-dimensional block and the two-dimensional block, which blocks at least the light from the two-dimensional pattern toward the slope of the three-dimensional block, Equipped with Test chart.

[0188] (Note 9) An outer block positioned away from the center of the camera's field of view, The neighboring blocks adjacent to the aforementioned outer block, Equipped with, The outer block is, The aforementioned vertex is located at a predetermined height in a position biased toward the central side, At least the first slope, which slopes from the aforementioned vertex, It has, The outer block is arranged such that when the camera takes an image, the vertex is located at the center of the outer block. The neighboring block has at least the second slope, The light-shielding portion is provided to block light from the first slope of the outer block toward the second slope of the neighboring block. The test chart described in one of the appendices 1 through 8.

[0189] (Note 10) This is a test chart for adjusting the camera. An outer block positioned away from the center of the camera's field of view, The neighboring blocks adjacent to the aforementioned outer block, A light-shielding portion that blocks light between the outer block and the neighboring block, Equipped with, The outer block is, The aforementioned vertex is located at a predetermined height in a position biased toward the central side, At least a first slope that slopes from the aforementioned vertex and has a pattern from which light is emitted, It has, The outer block is arranged such that when the camera takes an image, the vertex is located at the center of the outer block. The neighboring block has a pattern from which light is emitted and has at least a second slope arranged adjacent to the first slope, The light-shielding portion is provided between the first slope and the second slope, and is configured to block light from at least the first slope of the outer block toward the second slope of the neighboring block. Test chart.

[0190] (Note 11) The light-shielding portion has a surface that suppresses reflection. The test chart described in one of the appendices 1 through 10.

[0191] (Note 12) A chart support section that supports a predetermined test chart, A camera support portion that supports at least a part of a camera having an optical system and an image sensor at a position where the test chart can be imaged, An image analysis unit analyzes the image captured from the test chart and detects the focal position of the camera, A camera adjustment mechanism that adjusts the relative positions of the optical system and the image sensor based on the focal position of the camera, It has, The aforementioned test chart is, A first slope having a pattern of light emission, A second slope having a pattern of light emission, and positioned adjacent to the first slope, A light-shielding portion is provided between the first and second slopes and blocks light from at least the pattern on the first slope toward the second slope, Equipped with Camera manufacturing equipment.

[0192] (Note 13) A chart support section that supports a predetermined test chart, A camera support portion that supports at least a part of a camera having an optical system and an image sensor at a position where the test chart can be imaged, An image analysis unit analyzes the image captured from the test chart and detects the focal position of the camera, A camera adjustment mechanism that adjusts the relative positions of the optical system and the image sensor based on the focal position of the camera, It has, The aforementioned test chart is, A three-dimensional block with a slope, A two-dimensional block having a two-dimensional pattern from which light is emitted, arranged perpendicular to the optical axis of the aforementioned camera, An auxiliary light-shielding section is provided between the three-dimensional block and the two-dimensional block, which blocks at least the light from the two-dimensional pattern toward the slope of the three-dimensional block, Equipped with Camera manufacturing equipment.

[0193] (Note 14) A chart support section that supports a predetermined test chart, A camera support portion that supports at least a part of a camera having an optical system and an image sensor at a position where the test chart can be imaged, An image analysis unit analyzes the image captured from the test chart and detects the focal position of the camera, A camera adjustment mechanism that adjusts the relative positions of the optical system and the image sensor based on the focal position of the camera, It has, The aforementioned test chart is, An outer block positioned away from the center of the camera's field of view, The neighboring blocks adjacent to the aforementioned outer block, A light-shielding portion that blocks light between the outer block and the neighboring block, Equipped with, The outer block is, The aforementioned vertex is located at a predetermined height in a position biased toward the central side, At least a first slope that slopes from the aforementioned vertex and has a pattern from which light is emitted, It has, The outer block is arranged such that when the camera takes an image, the vertex is located at the center of the outer block. The neighboring block has a pattern from which light is emitted and has at least a second slope arranged adjacent to the first slope, The light-shielding portion is provided between the first slope and the second slope, and is configured to block light from at least the first slope of the outer block toward the second slope of the neighboring block. Camera manufacturing equipment.

[0194] (Note 15) The process of preparing a predetermined test chart, A step of imaging the test chart using a camera having an optical system and an image sensor, The process involves analyzing the image captured from the test chart and detecting the focal position of the camera. A step of adjusting the relative positions of the optical system and the image sensor based on the focal position of the camera, It has, In the process of preparing the aforementioned test chart, As the aforementioned test chart, A first slope having a pattern of light emission, A second slope having a pattern of light emission, and positioned adjacent to the first slope, A light-shielding portion is provided between the first and second slopes and blocks light from at least the pattern on the first slope toward the second slope, Prepare a chart that includes [the necessary features]. Camera manufacturing method. [Explanation of Symbols]

[0195] 1. Camera manufacturing equipment 10 Test Charts 20 cameras 110 3D Blocks 110a Central Block 110b Outer block 120 vertices 130 Ridge 140 slopes 150 Light-shielding part 160 patterns 162,162a,162b border 170 2D blocks 180 2D patterns 182 Boundary Line 190 Support plate 220 Optical system 240 image sensors 260 Circuit Boards 262 Adhesives 280 connectors 310 Chart support section 312 Chart light source 320 Relay lens 340 Camera support section 360 Camera adjustment mechanism 380 Camera fixing section 400 Control section 410 CPU 420 RAM 430 Storage device 440 I / O port 450 Input section 460 Display section

Claims

1. This is a test chart for adjusting the camera. A first slope having a pattern of light emission, A second inclined surface having a pattern of light emission, and positioned adjacent to the first inclined surface, A light-shielding portion is provided between the first slope and the second slope, and blocks light from at least the pattern of the first slope toward the second slope, Equipped with Test chart.

2. The light-shielding portion is positioned so as not to block the light directed toward the camera from the patterns on the first and second slopes, respectively. The test chart according to claim 1.

3. The light-shielding portion is configured in a plate shape and is arranged so that it is captured as a line when image is taken by the camera. The test chart according to claim 1 or claim 2.

4. Each of the patterns of the first and second slopes has at least one boundary line that extends linearly along the slope direction of each slope, The light-shielding portion is arranged to suppress light from the pattern on the first slope from overlapping with the boundary line of the second slope. A test chart according to any one of claims 1 to 3.

5. A support plate and Multiple ridges are provided at a predetermined height from the support plate and are arranged radially with respect to the center of the support plate, Equipped with, The first slope is inclined from the first of the plurality of ridges toward the support plate, The second slope is inclined from the second ridge adjacent to the first ridge toward the support plate and is in contact with the first slope. A test chart according to any one of claims 1 to 4.

6. A support plate and A three-dimensional block provided on the support plate, having either the first slope or the second slope, A two-dimensional block provided on the support plate, arranged parallel to the support plate, and having a two-dimensional pattern from which light is emitted, An auxiliary light-shielding section is provided between the three-dimensional block and the two-dimensional block, which blocks at least light from the two-dimensional pattern toward the three-dimensional block, Equipped with A test chart according to any one of claims 1 to 5.

7. A support plate and An outer block provided on the support plate and positioned away from the center of the support plate, The neighboring blocks adjacent to the aforementioned outer block, Equipped with, The outer block is, A vertex is provided at a predetermined height from the support plate at a position biased toward the central side of the support plate, At least the first slope that slopes from the apex toward the support plate, It has, The outer block is positioned on the support plate such that its vertex is located at the center of the outer block in the image captured by the camera from above the center of the support plate. The aforementioned neighboring block has at least the second slope, The light-shielding portion is provided to block light from the first slope of the outer block toward the second slope of the neighboring block. A test chart according to any one of claims 1 to 5.

8. This is a test chart for adjusting the camera. Support plate and An outer block provided on the support plate and positioned away from the center of the support plate, The neighboring blocks adjacent to the aforementioned outer block, A light-shielding portion that blocks light between the outer block and the neighboring block, Equipped with, The outer block is, A vertex is provided at a predetermined height from the support plate at a position biased toward the central side of the support plate, At least a first inclined surface having a pattern that slopes from the vertex toward the support plate and from which light is emitted, It has, The outer block is positioned on the support plate such that its vertex is located at the center of the outer block in the image captured by the camera from above the center of the support plate. The neighboring block has a pattern from which light is emitted and has at least a second slope arranged adjacent to the first slope, The light-shielding portion is provided between the first slope and the second slope, and is configured to block light from at least the first slope of the outer block toward the second slope of the neighboring block. Test chart.

9. A chart support section that supports a predetermined test chart, A camera support portion that supports at least a part of a camera having an optical system and an image sensor at a position where the test chart can be imaged, An image analysis unit analyzes the image captured from the test chart and detects the focal position of the camera, A camera adjustment mechanism that adjusts the relative positions of the optical system and the image sensor based on the focal position of the camera, It has, The aforementioned test chart is, A first slope having a pattern of light emission, A second inclined surface having a pattern of light emission, and positioned adjacent to the first inclined surface, A light-shielding portion is provided between the first slope and the second slope, and blocks light from at least the pattern of the first slope toward the second slope, Equipped with Camera manufacturing equipment.

10. A chart support section that supports a predetermined test chart, A camera support portion that supports at least a part of a camera having an optical system and an image sensor at a position where the test chart can be imaged, An image analysis unit analyzes the image captured from the test chart and detects the focal position of the camera, A camera adjustment mechanism that adjusts the relative positions of the optical system and the image sensor based on the focal position of the camera, It has, The aforementioned test chart is, A support plate supported by the chart support section, An outer block provided on the support plate and positioned away from the center of the support plate, The neighboring blocks adjacent to the aforementioned outer block, A light-shielding portion that blocks light between the outer block and the neighboring block, Equipped with, The outer block is, A vertex is provided at a predetermined height from the support plate at a position biased toward the central side of the support plate, At least a first inclined surface having a pattern that slopes from the vertex toward the support plate and from which light is emitted, It has, The outer block is positioned on the support plate such that its vertex is located at the center of the outer block in the image captured by the camera from above the center of the support plate. The neighboring block has a pattern from which light is emitted and has at least a second slope arranged adjacent to the first slope, The light-shielding portion is provided between the first slope and the second slope, and is configured to block light from at least the first slope of the outer block toward the second slope of the neighboring block. Camera manufacturing equipment.

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