Sample container imaging device and sample processing device

Abstract

To provide a specimen container imaging device and a specimen processing device with which, while securing illuminance in sections away from the light source of a specimen container, it is possible to capture the images of the specimen container and the specimen in the inside thereof.SOLUTION: The present invention comprises: a rack conveyance path for transporting a specimen rack that accommodates a specimen container in which a specimen is placed; a camera that is located at a side of the rack conveyance path and captures an image of the specimen container present on the rack conveyance path; a light source that is located at a side of the rack conveyance path on the same side as the camera and illuminates the specimen container from above being imaged by the camera; and a reflection plane, on the side opposite the specimen container being imaged by the camera with respect to the optical axis of the light source, that is located on the outside of a space enclosed by optical paths linking each point on the outer shape of a cylindrical part of the specimen container being imaged by the camera and the main point of the camera. The reflection plane turns back the light emitted by the light source in a direction separating from the specimen container, so as to enter the lower part of the specimen container from diagonally above.SELECTED DRAWING: Figure 1

Description

Technical Field

[0001] The present invention relates to a specimen container imaging device and a specimen processing device.

Background Art

[0002] In a specimen test in which a specimen such as blood or urine is reacted with a reagent to measure the absorbance or luminescence intensity of the reaction mixture, in order to prevent the consumption of consumables and reagents due to unnecessary tests or to improve the reliability of the test results, it is desirable to determine the appropriateness of the used container and the quality of the specimen before the test. As a technique for determining the appropriateness of such a used container and the quality of the specimen before the test, based on an image of the specimen container taken before the test, the shape of the specimen container, the amount of the specimen, and the color of the specimen are detected, and a specimen processing system that discriminates in advance whether the specimen is suitable for measurement is known.

[0003] An example of a specimen processing system is described in Patent Document 1. In Patent Document 1, paragraphs 0035 and FIG. 8 state that "as shown in FIG. 8, the white LED 225c emits light toward the specimen container T at the first imaging position 224e, and the reflected light of the specimen container T is arranged at a position and in a direction such that it does not directly enter the camera 225a located in front of the specimen container T." Paragraphs 0036 and FIG. 7 state that "the specimen container T held at the first imaging position 224e by the gripping portion 224a is imaged by the camera 225a while in a standing state (vertical state), and the imaging image data obtained thereby is transmitted to the system control device 8."

[0004] Another example of a sample processing system is described in Patent Document 2. In Patent Document 2, paragraph 0042 and Figure 6 state that "as shown in Figure 6, the white LED 225c emits light toward the sample container T at the imaging position 224, and is positioned and oriented so that the reflected light from the sample container T does not directly enter the camera 225a located in front of the sample container T," and paragraph 0043 states that "the sample container T, which remains held in the sample rack L at the imaging position 224, is imaged by the camera 225a, and the image data obtained thereby is transmitted to the system control device 8." [Prior art documents] [Patent Documents]

[0005] [Patent Document 1] Japanese Patent Publication No. 2010-107399 [Patent Document 2] Japanese Patent Publication No. 2010-133925 [Overview of the project] [Problems that the invention aims to solve]

[0006] In other words, both Patent Document 1 and Patent Document 2 describe a technique in which the sample container is illuminated with a white LED (hereinafter referred to as the light source) from diagonally above and in front of the sample container, and the sample container is imaged from the front with a camera.

[0007] However, the technologies described in Patent Documents 1 and 2 both have the problem that, as the sample container is further from the light source, the illumination becomes insufficient and the contrast in the captured image decreases, making it impossible to detect the interface of the sample when the sample is small in quantity.

[0008] Therefore, the object of the present invention is to provide a specimen container imaging device and a specimen processing device that can image a specimen container and the specimen inside it while ensuring sufficient illumination in the part of the specimen container that is far from the light source. [Means for solving the problem]

[0009] To solve the above problems, the specimen container imaging device of the present invention comprises, for example, a rack transport path for transporting specimen racks containing specimen containers, a camera provided on the side of the rack transport path for imaging the specimen containers on the rack transport path, a light source provided on the same side of the rack transport path as the camera for illuminating the specimen containers imaged by the camera from above, and a reflective surface located on the opposite side of the specimen containers imaged by the camera with respect to the optical axis of the light source, outside the space enclosed by an optical path connecting each point on the outer shape of the cylindrical part of the specimen container imaged by the camera and the principal point of the camera, wherein the reflective surface reflects the light emitted from the light source in the direction away from the specimen container and causes it to enter the lower part of the specimen container from an oblique upward direction.

[0010] Furthermore, the specimen processing device of the present invention includes, for example, the specimen container imaging device. [Effects of the Invention]

[0011] According to the present invention, it is possible to provide a specimen container imaging device and a specimen processing device that can image a specimen container and the specimen inside it while ensuring sufficient illumination in the part of the specimen container far from the light source. [Brief explanation of the drawing]

[0012] [Figure 1] This is a top view showing an overview of the configuration of the automated analyzer according to Example 1. [Figure 2] This is a side view showing an overview of the configuration of the specimen container imaging device according to Example 1. [Figure 3] This is a side view showing an overview of the configuration of the specimen container imaging device according to Example 2. [Figure 4A] This is a top view showing an overview of the configuration of the specimen container imaging device according to Example 3. [Figure 4B] This is a side view showing an overview of the configuration of the specimen container imaging device according to Example 3. [Figure 5] This is a top view showing an overview of the configuration of the automated analyzer according to Example 5. [Figure 6A] It is a top view showing an outline of the configuration of the specimen container imaging device according to Example 5. [Figure 6B] It is a side view showing an outline of the configuration of the specimen container imaging device according to Example 5. [Figure 7] It is a side view showing an outline of the configuration of the specimen container imaging device according to Example 6. [Figure 8A] It is a top view showing an outline of the configuration of the specimen container imaging device according to Example 7. [Figure 8B] It is a side view showing an outline of the configuration of the specimen container imaging device according to Example 7. [Figure 9A] It is a top view showing an outline of the configuration of the specimen container imaging device according to Example 8. [Figure 9B] It is a front view showing an outline of the configuration of the specimen container imaging device according to Example 8. [Figure 10A] It is a top view showing an outline of the configuration of the specimen container imaging device according to Example 9. [Figure 10B] It is a front view showing an outline of the configuration of the specimen container imaging device according to Example 9.

Embodiments for Carrying Out the Invention

[0013] Hereinafter, an automatic analyzer equipped with the specimen container imaging device of the present invention will be described with reference to the drawings. The automatic analyzer is a device that automatically analyzes a specimen and is an example of a specimen processing device. The specimen container imaging device of the present invention is not limited to an automatic analyzer and can be applied to other specimen processing devices, for example, a pretreatment device that performs pretreatment of a specimen such as centrifugation and sub-sampling. Furthermore, it can be applied to any device that images a specimen container and the liquid inside it. In the drawings referred to in this specification, the same or corresponding components are denoted by the same reference numerals, and repeated descriptions of these components may be omitted.

Examples

[0014] Figure 1 is a top view showing an overview of the configuration of an automated analyzer according to Embodiment 1. The automated analyzer 1 comprises a sample supply unit 12 equipped with an inlet 123 and an outlet 124 for a sample rack 2, an analysis module 13 that dispenses a fixed amount of sample 4 and performs measurement, a transport unit 14 that transports the sample 4, and a control unit 10 that controls the automated analyzer 1. In Figure 1, the control unit 10 is installed inside the sample supply unit 12, but it can be installed at any position in the automated analyzer 1. Alternatively, the control unit 10 may be installed outside the automated analyzer 1 and control the automated analyzer 1 by communicating with it.

[0015] Sample 4 is a liquid, such as blood or urine, and is contained in sample container 3. In the automated analyzer 1, in order to protect sample 4 and improve work efficiency, the sample container 3 containing sample 4 is transported while stored in sample rack 2.

[0016] The specimen rack 2 stores the specimen containers 3 containing the specimens 4. The specimen rack 2 may be a multi-slot specimen rack capable of storing multiple specimen containers 3, or a single-slot specimen rack capable of storing one specimen container 3. In this embodiment, the specimen rack 2 is, as an example, a five-slot specimen rack. In Figure 1, arrow D indicates the direction of transport of the specimen rack 2. Also, 212 represents the front of the specimen rack 2, and 213 represents the back of the specimen rack 2.

[0017] The transport unit 14 includes a rack transport path 141 for loading and a rack transport path 142 for unloading. The rack transport path 141 transports the sample rack 2 from the sample supply unit 12 to the analysis module 13. The rack transport path 142 transports the sample rack 2 from the analysis module 13 to the sample supply unit 12. The rack transport paths 141 and 142 can be constructed, for example, with belts. In the following, the axis parallel to the transport direction of the sample rack 2 by the rack transport path 141 will be represented as the X-axis (left-right direction), the axis parallel to the height direction of the sample container 3 will be represented as the Z-axis (up-down direction), and the axis perpendicular to both the Z-axis and the X-axis will be represented as the Y-axis (front-back direction).

[0018] The sample supply unit 12 is equipped with a camera 5, a light source 6, and a reflective surface 9 on one side of the rack transport path 141 (the front 212 side of the sample rack 2 placed on the rack transport path 141), and a barcode reader 125 on the other side (the rear 213 side of the sample rack 2 placed on the rack transport path 141). In other words, the camera 5, light source 6, and reflective surface 9 and the barcode reader 125 are installed so as to sandwich the rack transport path 141. The rack transport path 141, camera 5, light source 6, and reflective surface 9 function as a sample container imaging device.

[0019] The sample container 3, stored in the sample rack 2, contains the sample 4. The sample container 3 has a cylindrical portion and a hemispherical portion connected to one end of the cylindrical portion, forming a convex shape in the axial direction of the cylindrical portion. The sample container 3 is equipped with a barcode label 31 for sample identification on the side of the cylindrical portion. In this embodiment, the barcode label 31 is attached to the sample container 3. Specifically, the barcode label 31 is attached to a part of the circumferential direction of the sample container 3. The orientation of the barcode label 31 on the sample container 3 is aligned so that it faces the back surface 213 of the sample rack 2. On the rack transport path 141, the back surface 213 of the sample rack 2 faces the barcode reader 125, and the front surface 212 of the sample rack 2 faces the camera 5.

[0020] The control unit 10 controls the sample supply unit 12, analysis module 13, transport unit 14, barcode reader 125, camera 5, and light source 6. First, the control unit 10 pushes the sample racks 2, which are installed at the entrance 123 of the sample racks 2, onto the rack transport path 141 one by one, and moves them onto the rack transport path 141. The control unit 10 then moves the sample racks 2 that have moved onto the rack transport path 141 to the barcode reading position 126 and the camera 5's focal position 7. At the barcode reading position 126, the barcode reader 125 reads the barcode label 31 attached to the sample container 3 from the back side 213 of the sample rack 2. At the camera 5's focal position 7, the camera 5 images the sample container 3 and the sample 4 inside the sample container 3 while illuminating the sample container 3 with the light source 6. Next, the control unit 10 identifies the sample 4 contained in the sample container 3 based on the information obtained from the barcode label 31 read by the barcode reader 125. Subsequently, the control unit 10 assigns the destination analysis module 13 to the sample rack 2 according to the pre-registered item information, and transports the sample rack 2 along the rack transport path 141.

[0021] The automatic analyzer 1 may be equipped with a display device (not shown in the figure). Alternatively, the automatic analyzer 1 may be connected to a display device.

[0022] Figure 2 is a side view showing an overview of the configuration of the specimen container imaging device according to Embodiment 1. Figure 2 is a side view taken from the positive X-axis direction. The light source 6 is located on the side of the specimen rack 2, on the front 212 side, the same side as the camera 5, at a position higher than the upper end of the specimen container 3. Specifically, the light source 6 is positioned such that the point L' obtained by reflecting the light emission point L of the light source 6 back with respect to the generatrix 3B, which is the closest point to the camera 5 on the cylindrical part of the specimen container 3, is higher than the group of lines Ft that connects each point on the upper end of the cylindrical part of the specimen container 3 to the principal point P of the camera 5. The light source 6 illuminates the specimen container 3 from above. This prevents light emitted from the light source 6 and specularly reflected off the surface of the specimen container 3 from directly entering the camera 5 as light. In Figure 2, to facilitate understanding of the group of lines Ft, the line Ft is shown as the line connecting the point on the upper end of the cylindrical part of the specimen container 3 that is closest to the principal point P of the camera 5, and the principal point P of the camera 5. The same applies to the other drawings.

[0023] The reflective surface 9 shown in Figure 1 is located on the opposite side of the light source 6's optical axis O from the sample container 3 being imaged by the camera 5, and outside the space enclosed by the optical path connecting each point on the outer shape of the cylindrical part of the sample container 3 being imaged by the camera 5 to the principal point P of the camera 5. In this embodiment, as an example of the reflective surface 9, as shown in Figure 2, a reflective surface 91 is shown that is located above the group of lines Ft connecting each point on the upper end of the cylindrical part of the sample container 3 being imaged by the camera 5 to the principal point P of the camera 5. Note that, as shown in Figure 2, the optical path directly connecting each point on the outer shape of the cylindrical part of the sample container 3 being imaged by the camera 5 to the principal point P of the camera 5 is represented by a group of lines.

[0024] By providing such a reflective surface 91, the light R1 emitted from the light source 6 in the direction away from the sample container 3, that is, the light R1 emitted on the opposite side of the optical axis O from the sample container 3, is reflected by the reflective surface 91 and incident on the lower part of the sample container 3, which is farther from the light source 6, from an oblique upward direction on the front surface of the sample container 3 (viewed from the positive Y-axis direction). In other words, in addition to the light emitted directly from the light source 6 towards the sample container 3, the lower part of the sample container 3 is also illuminated by the light R1 emitted from the light source 6 on the opposite side of the optical axis O from the sample container 3. Therefore, sufficient illumination can be ensured even in the part of the sample container 3 far from the light source 6, while imaging of the sample container 3 and the sample 4 inside it is possible. The lower part of the sample container 3 refers to the lower part of the sample container 3.

[0025] Furthermore, the specimen container imaging device can image the specimen container 3 while it is still stored in the specimen rack 2. However, it is not limited to this configuration; the specimen container imaging device may also image the specimen container 3 after it has been removed from the specimen rack 2.

[0026] Furthermore, in this embodiment, since the lower part of the sample container 3 is illuminated only by light incident from diagonally above, it is possible to prevent light reflected from the lower surface of the sample container 3 from directly entering the camera 5 as light. In addition, since the sample container 3 is illuminated by a single light source 6 in this embodiment, there is an advantage in that it is possible to prevent the occurrence of color unevenness caused by differences in the color temperature of the light sources, which is a problem when multiple light sources are used. [Examples]

[0027] The position of the reflective surface 9 is not limited to the upper side of the line group Ft shown in Example 1. Figure 3 is a side view showing an overview of the configuration of the specimen container imaging device according to Example 2. Figure 3 is a side view viewed from the positive X-axis direction. In this example, as an example of the reflective surface 9, a reflective surface 92 is shown that is located on the opposite side of the specimen container 3 being imaged by the camera 5 with respect to the optical axis O of the light source 6, and below the line group Fb that connects each point on the lower end of the cylindrical part of the specimen container 3 to the principal point P of the camera 5. In Figure 3, to facilitate understanding of the line group Fb, the line group Fb is shown as the line connecting the point closest to the principal point P of the camera 5 among the points on the lower end of the cylindrical part of the specimen container 3 to the principal point P of the camera 5. The same applies to the other drawings.

[0028] In this embodiment, the amount of light R2 emitted from the light source 6 away from the sample container 3, that is, light R2 emitted on the opposite side of the sample container 3 with respect to the optical axis O, is reflected by the reflective surface 92, thereby increasing the amount of light incident on the lower part of the sample container 3 from diagonally above the front of the sample container 3. Therefore, in this embodiment as well, sufficient illumination can be ensured at the lower part of the sample container 3, which is far from the light source 6, while imaging of the sample container 3 and the sample 4 inside it. In addition, in this embodiment, the lower part of the sample container 3 can be illuminated using light R2 with a small angle with the optical axis O of the light source 6, i.e., light with high luminosity, which is advantageous for improving the illumination at the lower part of the sample container 3. [Examples]

[0029] Figure 4A is a top view showing an overview of the configuration of the specimen container imaging device according to Embodiment 3. Figure 4B is a side view showing an overview of the configuration of the specimen container imaging device according to Embodiment 3. Note that Figure 4B is a side view viewed from the positive X-axis direction. In this embodiment, as an example of a reflective surface 9, as shown in Figure 4A, a reflective surface 93 is provided that is located outside the space in the left-right direction of the space enclosed by the group of lines Fl, which connects each point on the positive X-axis side surface of the cylindrical part of the specimen container 3 imaged by the camera 5 to the principal point P of the camera 5, and the group of lines Fr, which connects each point on the negative X-axis side surface of the cylindrical part of the specimen container 3 imaged by the camera 5 to the principal point P of the camera 5, with respect to the optical axis O of the light source 6. In Figure 4A, to facilitate understanding of the line groups Fl and Fr, the line groups connecting each point on the side surface of the cylindrical part of the sample container 3 to the principal point P of the camera 5 are shown as line group Fl, where the line tangent to the sample container 3 on the positive X-axis side is shown, and the line groups tangent to the sample container 3 on the negative X-axis side are shown as line group Fr. The same applies to the other drawings.

[0030] In this embodiment as well, as shown in Figure 4B, the amount of light R3 emitted from the light source 6 away from the sample container 3, that is, the light R3 emitted on the opposite side of the optical axis O from the sample container 3, is reflected by the reflective surface 93, thereby increasing the amount of light incident from diagonally above to the lower part of the sample container 3, which is far from the light source 6. Therefore, in this embodiment as well, sufficient illumination can be ensured even at the lower part of the sample container 3, which is far from the light source, while imaging of the sample container 3 and the sample 4 inside it.

[0031] The vertical position of the reflective surface 93 is set between the linear group Ft and the linear group Fb, as shown in Figure 4B, but it is not limited to this as long as the light R3 is reflected and incident onto the sample container 3 from an oblique upward direction.

[0032] Furthermore, by changing the position and orientation of the reflective surface 93, the light R3 can be reflected back to the bottom of the sample container 3, which is the part of the sample container 3 that is further away from the light source 6. [Examples]

[0033] The specimen container imaging device may also include all of the reflective surfaces 91 of Example 1, 92 of Example 2, and 93 of Example 3. Since none of the reflective surfaces 91, 92, and 93 obstruct the light R1, R2, and R3, and do not hinder the reflection on each of the reflective surfaces 91, 92, and 93, they can be used in combination. In this case, the light R1, R2, and R3 can be reflected and incident on the lower part of the specimen container 3, so that the illumination of the part of the specimen container 3 far from the light source 6 can be further improved, while imaging of the specimen container 3 and the specimen 4 inside it. Furthermore, the device is not limited to including all of the reflective surfaces 91, 92, and 93, but may include any two of the reflective surfaces 91, 92, and 93. In addition, the specimen container imaging device may include further reflective surfaces as long as they do not hinder the reflection on each of the reflective surfaces 91, 92, and 93. [Examples]

[0034] Figure 5 is a top view showing an overview of the configuration of the automated analyzer according to Example 5. Note that in Figure 5, the analysis module 13, which is the same as in Examples 1 to 4, is omitted from the illustration. The same applies to subsequent examples. Below, we will mainly describe the differences between the sample container imaging device in this example and that in Examples 1 to 4.

[0035] The specimen container imaging device according to this embodiment is provided with a planar mirror 8 located on the same side as the camera 5 of the rack transport path 141, and reflects the specimen containers 3 on the rack transport path 141. The camera 5 also images the specimen containers 3 reflected in the planar mirror 8. In this embodiment, as shown in Figure 5, an example in which the camera 5 is oriented in the negative X-axis direction is described. This allows the distance between the specimen containers 3 and the camera 5 to be reduced in the Y-axis direction, and the distance between the rack transport path 141 and the rack transport path 142 to be reduced, thereby reducing the size of the transport unit 14. However, the orientation and position of the camera 5 are not limited to this.

[0036] Figure 6A is a top view showing an overview of the configuration of the specimen container imaging device according to Example 5. Figure 6B is a side view showing an overview of the configuration of the specimen container imaging device according to Example 5. Note that Figure 6B is a side view viewed from the positive X-axis direction. Also, in Figure 6A, the reflective surface 91 is omitted from the illustration in order to explain the positional relationship between the specimen container 3, the camera 5, and the plane mirror 8. In this configuration, the optical path connecting each point on the outer shape of the cylindrical part of the specimen container 3, which is imaged by the camera 5, and the principal point P of the camera 5 via the plane mirror 8 is represented by a group of polylines bent by the plane mirror 8. Of these groups of polylines, the group of polylines connecting each point on the upper end of the cylindrical part of the specimen container 3 and the principal point P of the camera 5 via the plane mirror 8 is denoted as Ft', and the group of polylines connecting each point on the lower end of the cylindrical part of the specimen container 3 and the principal point P of the camera 5 via the plane mirror 8 is denoted as Fb'. In Figures 6A and 6B, to facilitate understanding of the polyline group Ft', the polyline connecting the point furthest to the positive Y-axis direction on the upper end of the cylindrical part of the sample container 3 to the principal point P of the camera is shown as polyline group Ft'. Similarly, in Figure 6B, to facilitate understanding of the polyline group Fb', the polyline connecting the point furthest to the positive Y-axis direction on the lower end of the cylindrical part of the sample container 3 to the principal point P of the camera is shown as polyline group Fb'. The same applies to the other figures.

[0037] In this embodiment, as an example of a reflective surface 9, as shown in Figures 6A and 6B, a reflective surface 91 is provided that is located on the opposite side of the sample container 3 being imaged by the camera 5 with respect to the optical axis O of the light source 6, and above the piecewise line group Ft'. The reflective surface 91 in this embodiment is the same as the reflective surface 91 in Embodiment 1, except that it is located above the piecewise line group Ft' shown in Figure 6, rather than the linear line group Ft shown in Figure 2. Therefore, the effect is also the same as in Embodiment 1. [Examples]

[0038] Figure 7 is a side view showing an overview of the configuration of the specimen container imaging device according to Example 6. Note that Figure 7 is a side view taken from the positive X-axis direction. The specimen container imaging device according to this example is equipped with a planar mirror 8, similar to Example 5.

[0039] In this embodiment, as an example of a reflective surface 9, as shown in Figure 7, a reflective surface 92 is provided that is located on the opposite side of the optical axis O of the light source 6 from the sample container 3 being imaged by the camera 5, and below the piecewise line group Fb'. The reflective surface 92 in this embodiment is the same as the reflective surface 92 in Embodiment 2, except that it is located below the piecewise line group Fb' shown in Figure 7, rather than the straight line group Fb shown in Figure 3. Therefore, the effect is also the same as in Embodiment 2. [Examples]

[0040] Figure 8A is a top view showing an overview of the configuration of the specimen container imaging device according to Example 7. Figure 8B is a side view showing an overview of the configuration of the specimen container imaging device according to Example 7. Note that Figure 8B is a side view viewed from the positive X-axis direction. The specimen container imaging device according to this example is equipped with a planar mirror 8, similar to Example 5. However, in Figure 8B, the camera 5 and the planar mirror 8 are omitted from the illustration in order to show the reflection of light R3 by the reflective surface 93.

[0041] In this embodiment, as an example of a reflective surface 9, as shown in Figures 8A and 8B, a reflective surface 93 is provided that is located outside the space enclosed by the polyline group Fl', which connects each point on the positive X-axis side of the cylindrical part of the sample container 3 to the principal point of the camera 5 via the plane mirror 8, with respect to the optical axis O of the light source 6, on the side opposite to the sample container 3 being imaged by the camera 5, and the polyline group Fr', which connects each point on the negative X-axis side of the cylindrical part of the sample container 3 to the principal point of the camera 5 via the plane mirror 8. In Figure 8A, to facilitate understanding of the linear groups Fl' and Fr', polylines that are tangent to the sample container 3 on the positive X-axis side are shown as polyline group Fl', and polylines that are tangent to the sample container 3 on the negative X-axis side are shown as polyline group Fr'. The same applies to the other drawings.

[0042] The reflective surface 93 is the same as the reflective surface 93 of Example 3, except that it is located outside the space enclosed by the group of polyline lines Fl' and Fr' shown in Figure 8A, rather than the space enclosed by the group of straight lines Fl and Fr shown in Figure 4A. Therefore, the effect is also the same as in Example 3. [Examples]

[0043] Figure 9A is a top view showing an overview of the configuration of the specimen container imaging device according to Example 8. Figure 9B is a front view showing an overview of the configuration of the specimen container imaging device according to Example 8. Note that Figure 9B is a view from the positive Y-axis direction. The specimen container imaging device according to this example is equipped with a planar mirror 8, similar to Example 5.

[0044] In this embodiment, as an example of a reflective surface 9, as shown in Figure 9A, a reflective surface 94 located outside the space enclosed by the polyline groups Fl' and Fr' in the left-right direction is exemplified, similar to the reflective surface 93 in Embodiment 7. Furthermore, as shown in Figures 9A and 9B, the reflective surface 94 reflects the light R4 emitted from the light source 6 in the direction away from the sample container 3, that is, the light R4 emitted on the opposite side of the sample container 3 relative to the optical axis O, and directs it onto the lower part of the sample container 3 from an oblique upward direction to the front of the sample container 3 via the planar mirror 8. In other words, in addition to the light emitted from the light source 6 toward the sample container 3, the sample container 3 is also illuminated by the light R4 emitted from the light source 6 in the direction away from the sample container 3 relative to its optical axis O. Therefore, sufficient illumination can be ensured even at the lower part of the sample container 3, which is far from the light source 6, while imaging of the sample container 3 and the sample 4 inside it is possible.

[0045] Furthermore, as shown in Figure 9A, the planar mirror 8 should be installed such that the width wr from the intersection of the piecewise line group Fr' and the planar mirror 8 to the edge of the planar mirror 8 on the sample container 3 side is wider than the width wl from the intersection of the piecewise line group Fl' and the planar mirror 8 to the edge of the planar mirror 8 on the opposite side of the sample container 3. This is advantageous for directing more of the light R4, which was emitted in a direction away from the sample container 3 with respect to the optical axis O, into the lower part of the sample container 3. [Examples]

[0046] Figure 10A is a top view showing an overview of the configuration of the specimen container imaging device according to Example 9. Figure 10B is a front view showing an overview of the configuration of the specimen container imaging device according to Example 9. Note that Figure 10B is a view from the positive Y-axis direction. The specimen container imaging device according to this example is equipped with a planar mirror 8, similar to Example 5.

[0047] In this embodiment, as an example of a reflective surface 9, a reflective surface 95 located below the piecewise line group Fb' is shown in Figure 10B. Furthermore, as shown in Figures 10A and 10B, the reflective surface 95 receives light R5 from the light source 6 that is emitted away from the sample container 3 and reflected back towards the camera 5 by the plane mirror 8. That is, light R5 emitted on the opposite side of the optical axis O from the sample container 3 and reflected back towards the camera 5 by the plane mirror 8 is reflected back towards the plane mirror 8 and incident on the lower part of the sample container 3 from an oblique upward direction to the front of the sample container 3 via the plane mirror 8. In other words, in addition to the light emitted from the light source 6 towards the sample container 3, the lower part of the sample container 3 is also illuminated by light R5 emitted from the light source 6 in a direction away from the sample container 3 with respect to its optical axis O. Therefore, sufficient illumination can be ensured even at the lower part of the sample container 3, which is far from the light source 6, while imaging of the sample container 3 and the sample 4 inside it. [Examples]

[0048] The specimen container imaging device may also include all of the reflective surfaces 91 of Example 5, 92 of Example 6, 93 of Example 7, 94 of Example 8, and 95 of Example 9. Since none of the reflective surfaces 91, 92, 93, 94, and 95 obstruct the light R1, R2, R3, R4, and R5, and do not hinder the reflection on each of the reflective surfaces 91, 92, 93, 94, and 95, they can be used in combination. In this case, the light R1, R2, R3, R4, and R5 can be reflected and incident on the lower part of the specimen container 3, so that the illumination of the part of the specimen container 3 far from the light source 6 can be further improved, while imaging of the specimen container 3 and the specimen 4 inside it. Furthermore, the device is not limited to including all of the reflective surfaces 91, 92, 93, 94, and 95, but may include any two or more of the reflective surfaces 91, 92, 93, 94, and 95.

[0049] It should be noted that the present invention is not limited to the embodiments described above, and various modifications are possible. For example, the embodiments described above are explained in detail to make the present invention easier to understand, and the present invention is not necessarily limited to embodiments having all the configurations described. Furthermore, it is possible to replace parts of the configuration of one embodiment with the configuration of another embodiment. It is also possible to add configurations from other embodiments to the configuration of one embodiment. Furthermore, it is possible to delete parts of the configuration of each embodiment, or to add or replace other configurations. [Explanation of Symbols]

[0050] 1...Automatic analyzer, 2...Sample rack, 3...Sample container, 4...Sample, 5...Camera, 6...Light source, 7...Focal position, 8...Planar mirror, 9, 91, 92, 93, 94, 95...Reflective surface, 10...Control unit, 12...Sample supply unit, 13...Analysis module, 14...Transport unit, 31...Barcode label, 3B...Bulbine on the camera side of the cylindrical part of the sample container, 123...Inlet, 124...Outlet, 125...Barcode reader, 126...Barcode reading position, 141...Rack transport path for loading, 14 2...Rack transport path for unloading, 212...Front of the sample rack, 213...Back of the sample rack, D...Transport direction of the sample rack, Ft...Group of lines connecting each point on the upper end of the cylindrical part of the sample container to the principal point of the camera, Fb...Group of lines connecting each point on the lower end of the cylindrical part of the sample container to the principal point of the camera, Fl...Group of lines connecting points on the positive side of the X-axis direction of the cylindrical part of the sample container to the principal point of the camera, Fr...Group of lines connecting each point on the negative side of the X-axis direction of the cylindrical part of the sample container to the principal point of the camera, Ft'...Cylindrical part of the sample container Fb'…A group of polylines connecting each point on the upper end to the camera's principal point via a plane mirror, Fb'…A group of polylines connecting each point on the lower end of the cylindrical part of the specimen container to the camera's principal point via a plane mirror, Fl'…A group of polylines connecting each point on the positive X-axis side of the cylindrical part of the specimen container to the camera's principal point via a plane mirror, Fr'…A group of polylines connecting each point on the negative X-axis side of the cylindrical part of the specimen container to the camera's principal point via a plane mirror, L…The light source's emission point, L'…The point on the camera side of the cylindrical part of the specimen container O...the point obtained by reflecting the light source's emission point with respect to a certain generatrix, P...the principal point of the camera, R1, R2, R3, R4, R5...light emitted from the light source in the direction away from the sample container, wl...the width from the intersection of the piecewise line group Fl' and the plane mirror to the opposite end of the plane mirror from the sample container, wr...the width from the intersection of the piecewise line group Fr' and the plane mirror to the end of the plane mirror on the sample container side, X...the axis parallel to the transport direction of the sample rack, Z...the axis parallel to the height direction of the sample container, Y...the axis perpendicular to both the Z and X axes

Claims

1. A rack transport path for transporting sample racks containing sample containers, A camera is provided on the side of the rack transport path to image the sample containers located on the rack transport path, A light source is provided on the same side of the rack transport path as the camera, and illuminates the sample containers that the camera images from above. A reflective surface located outside the space enclosed by an optical path connecting each point on the outer shape of the cylindrical portion of the sample container imaged by the camera and the principal point of the camera, with respect to the optical axis of the light source, Equipped with, The reflective surface reflects the light emitted by the light source away from the sample container, causing it to enter the lower part of the sample container from an oblique upward direction. A specimen container imaging device characterized by the following features.

2. The reflective surface is located above the group of lines connecting each point on the upper end of the cylindrical portion of the sample container, which is imaged by the camera, with the principal point of the camera. The specimen container imaging device according to feature 1.

3. The reflective surface is located below the group of lines connecting each point on the lower end of the cylindrical portion of the sample container, which is imaged by the camera, with the principal point of the camera. The specimen container imaging device according to feature 1.

4. When the direction in which the rack transport path moves the sample rack is left-right, The reflective surface is located outside the left-right direction of the space enclosed by the group of lines connecting each point on the side surface of the cylindrical portion of the sample container imaged by the camera and the principal point of the camera. The specimen container imaging device according to feature 1.

5. When the direction in which the rack transport path moves the sample rack is left-right, The reflective surface comprises a first reflective surface, a second reflective surface, and a third reflective surface. The first reflective surface is located above the group of lines connecting each point on the upper end of the cylindrical portion of the sample container imaged by the camera and the principal point of the camera. The second reflective surface is located below the group of lines connecting each point on the lower end of the cylindrical portion of the specimen container imaged by the camera to the principal point of the camera. The third reflective surface is located outside the left-right direction of the space enclosed by the group of lines connecting each point on the side surface of the cylindrical portion of the sample container imaged by the camera and the principal point of the camera. The specimen container imaging device according to feature 1.

6. The rack transport path is further provided with a flat mirror located on the same side as the camera, which reflects the sample containers on the rack transport path. The camera captures the sample container reflected in the flat mirror. The specimen container imaging device according to feature 1.

7. The reflective surface is located above the group of broken lines formed by connecting each point on the upper end of the cylindrical portion of the sample container, which is imaged by the camera, with the principal point of the camera, via the plane mirror. The specimen container imaging device according to feature 6.

8. The reflective surface is located below the group of broken lines formed by connecting each point on the lower end of the cylindrical portion of the specimen container, which is imaged by the camera, with the principal point of the camera, via the plane mirror. The specimen container imaging device according to feature 6.

9. When the direction in which the rack transport path moves the sample rack is left-right, The reflective surface is located outside the left-right direction of the space enclosed by the group of polylines that connect each point on the side surface of the cylindrical portion of the sample container imaged by the camera and the principal point of the camera, via the plane mirror. The specimen container imaging device according to feature 6.

10. When the direction in which the rack transport path moves the sample rack is left-right, The reflective surface is located outside the left-right direction of the space enclosed by the group of polylines connecting each point on the side surface of the cylindrical portion of the sample container imaged by the camera and the principal point of the camera, via the plane mirror. The reflective surface reflects the light emitted by the light source away from the sample container and causes it to enter the sample container from an oblique upward direction via the plane mirror. The specimen container imaging device according to feature 6.

11. The reflective surface is located between the camera and the plane mirror, and reflects the light emitted from the light source away from the sample container, causing it to enter the sample container from an oblique upward direction via the plane mirror. The specimen container imaging device according to feature 8.

12. When the direction in which the rack transport path moves the sample rack is left-right, The reflective surface comprises at least two of the following: a first reflective surface, a second reflective surface, a third reflective surface, a fourth reflective surface, and a fifth reflective surface. The first reflective surface is located above the group of polylines formed by connecting each point on the upper end of the cylindrical portion of the specimen container imaged by the camera and the principal point of the camera via the plane mirror. The second reflective surface is located below the group of polylines formed by connecting each point on the lower end of the cylindrical portion of the specimen container imaged by the camera and the principal point of the camera via the plane mirror. The third reflective surface is located outside the left-right direction of the space enclosed by the group of polylines that connect each point on the side surface of the cylindrical portion of the specimen container imaged by the camera and the principal point of the camera via the plane mirror. The fourth reflective surface is located outside the left-right direction of the space enclosed by the group of polylines connecting each point on the side surface of the cylindrical portion of the sample container imaged by the camera and the principal point of the camera via the plane mirror, and reflects the light emitted by the light source away from the sample container, causing it to enter the sample container from an oblique upward direction via the plane mirror. The fifth reflective surface is located below the group of polylines formed by connecting each point on the lower end of the cylindrical portion of the sample container imaged by the camera and the principal point of the camera via the plane mirror, and is situated between the camera and the plane mirror. It reflects the light emitted by the light source away from the sample container and causes it to enter the sample container from an oblique upward direction via the plane mirror. The specimen container imaging device according to feature 6.

13. A specimen processing apparatus comprising a specimen container imaging device as described in claim 1.

14. A specimen processing apparatus comprising a specimen container imaging device as described in claim 6.

Images