Semiconductor equipment
By alternately arranging IGBT and FWD regions with varying widths and maintaining a specific width ratio, the semiconductor device addresses uneven heat dissipation, preventing central region overheating and enhancing operational reliability.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- DENSO CORP
- Filing Date
- 2023-08-09
- Publication Date
- 2026-06-30
AI Technical Summary
In semiconductor devices with IGBT and FWD regions, regions at the edges dissipate heat more easily, leading to uneven temperature distribution with the central regions becoming hotter, potentially causing damage.
The IGBT and FWD regions are alternately arranged with varying widths, where the central regions have narrower widths compared to the edge regions, and the ratio of widths is maintained between 1.5 to 4.5, to prevent excessive heating.
This configuration effectively suppresses temperature rise in central regions, enhancing heat dissipation and preventing damage, thereby increasing the semiconductor device's operational reliability and current capacity.
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