A conductive ultrathin film installed in an atmospheric pressure electron microscope is used as a secondary electron detector.
The integration of a graphene ultrathin film in the secondary electron detector of atmospheric pressure electron microscopes addresses the collection challenge, improving image clarity and signal quality by amplifying the collected current.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- COXEM CO LTD
- Filing Date
- 2025-05-12
- Publication Date
- 2026-07-01
AI Technical Summary
Atmospheric pressure electron microscopes face challenges in effectively collecting secondary electrons due to the narrow gap between the microscope tube and the sample, limiting the installation of a secondary electron detector and hindering efficient electron collection.
A secondary electron detector using a graphene ultrathin film is integrated at the lower end of the microscope tube, where a voltage difference between the film and the sample induces an avalanche effect, amplifying the collected current for clear image display.
The graphene ultrathin film effectively collects secondary electrons, enhancing image clarity and signal-to-noise ratio by five times compared to conventional Si3N4 thin films, reducing electron beam degradation and contamination.
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