Reference sample of paint defect and its manufacturing method
A reference sample with pseudo-defects mimicking actual coating defects on painted surfaces addresses the inadequacies of conventional evaluation methods by providing a precise, visually aligned assessment of convex and concave defects on products like automobiles.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- KONICA MINOLTA INC
- Filing Date
- 2022-07-08
- Publication Date
- 2026-07-29
AI Technical Summary
Existing methods for evaluating convex and concave coating defects on painted surfaces, such as those found on automobiles, are inadequate due to the three-dimensional nature of these defects and their angle-dependent appearance, making it difficult to accurately assess their size and shape using conventional tools like dot gauges.
A reference sample is created by forming pseudo-defect portions on a substrate with specific geometric variations in diameter, height, and inclination angle, coated with the same paint as the product, allowing for accurate evaluation by mimicking the appearance and size of actual defects.
The reference sample enables precise evaluation of coating defects by aligning with human visual standards, facilitating accurate comparison and correction of defects on the product surface.
Smart Images

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Abstract
Description
Technical Field
[0001] This invention relates to a reference sample for coating defects used to evaluate the size and the like of convex and / or concave coating defects occurring on the coated surface of products such as automobiles, and a method for manufacturing the same.
Background Art
[0002] In order to enhance the reliability of products and also to enhance the design quality, coating the surface of products is often carried out. At this time, foreign matters such as dust floating in the air land on the surface to be coated and are coated thereon, resulting in convex coating defects called bumps on the coating surface, which may reduce the design quality of the product. Also, when oil adheres to the coating surface and coating is applied thereon, the coating does not adhere, resulting in concave defects.
[0003] In terms of design, the acceptable limits for convex and concave coating defects are often defined by the size of the defect diameter visible to the naked eye. Although it is desirable to clean the production environment to zero foreign matters so that convex and concave coating defects do not occur, foreign matters of a certain size are tolerated in relation to the countermeasure costs. Therefore, foreign matters such as machine dust and sebum from the human body are generated to a certain extent. Due to these foreign matters, certain convex and concave defects occur in the production process. The size of the coating defect is determined from the size of the foreign matter, the amount of oil adhesion, the viscosity of the paint, etc., and widely distributed in the range of about 0.2 mm to 2.0 mm. For the coating defects thus generated, inspection of acceptable product specifications corresponding to the grade of the product is carried out, and repairs are made for defects larger than the standard.
[0004] Conventionally, as a means for measuring the size of convex and concave coating defects occurring on such a coating surface, a dot gauge displaying a large number of black circles of different sizes is simply used, and quality control is carried out by comparing the size of the coating defect with the black circles of the dot gauge.
[0005] Furthermore, Patent Document 1 discloses a technique for quantitatively inspecting the depth and width of scratches and feeding the results back into the semiconductor device manufacturing process to improve product yield. This technique involves quantifying the depth and width of scratches using standard samples of simulated processing marks created by processing methods such as ion beams, and calibrating the scratch detection capability of a scattered light detection device used for semiconductor inspection. [Prior art documents] [Patent Documents]
[0006] [Patent Document 1] Japanese Patent Publication No. 2000-58606 [Overview of the Initiative] [Problems that the invention aims to solve]
[0007] However, the convex and concave shapes of painted surfaces are three-dimensional, and their appearance depends on the angle of the defect and the lighting. For this reason, dot gauges were not sufficient for proper evaluation.
[0008] Furthermore, the technology described in Patent Document 1 is for evaluating scratches that occur in semiconductor device manufacturing processes and could not be applied to evaluating coating defects.
[0009] This invention has been made in view of the above technical background, and aims to provide a standard sample of paint defects and a method for manufacturing the same that can properly evaluate the size of convex and concave paint defects on the painted surface of products subject to defect evaluation. [Means for solving the problem]
[0010] The above objectives will be achieved by the following means: (1) A coating layer is formed on a substrate having one or more pseudo-defect portions having a convex shape and / or concave shape on its surface, covering at least the pseudo-defect portions and their surrounding areas. Occasionally, The defect region of the pseudo-defect is determined based on the inclination angle in the cross-section of the pseudo-defect.A standard sample of paint defects. (2) The coating layer is formed of the same paint used in the product subject to defect evaluation, as described in paragraph 1 above. (3) The color of the coating layer is the same as the color of the paint used on the product subject to defect evaluation, as described in paragraph 1 above. (4) A reference sample of a paint defect according to any one of paragraphs 1 to 3 above, wherein the pseudo-defect portion includes a plurality of pseudo-defect portions that differ in at least one of the diameter, height and / or depth and inclination angle in a plan view. (5) A reference sample of a paint defect as described in paragraph 4 above, wherein at least one of the diameter, height and / or depth, or inclination angle in a plan view changes geometrically among a number of pseudo-defect areas. ( 6 In the cross-section of the convex pseudo-defect portion, the portion that protrudes with an absolute inclination angle of 0.5 degrees is defined as the defect region, and in the cross-section of the concave pseudo-defect portion, the portion that is recessed with an absolute inclination angle of 0.5 degrees is defined as the defect region. 1 Reference sample of paint defects as described. ( 7 After manufacturing a substrate on which one or more pseudo-defect areas of a convex and / or concave shape are formed on the surface, paint is applied to at least the pseudo-defect areas and their surrounding areas of the substrate. death, The defect area of the pseudo-defect is determined based on the inclination angle in the cross-section of the pseudo-defect. A method for manufacturing a reference sample for paint defects. ( 8 The preceding paragraph describes how the pseudo-defect portion is formed by machining the substrate. 7 A method for manufacturing a reference sample of the paint defect described above. ( 9 The preceding paragraph describes how to machine the pseudo-defect portion by moving the tool in a straight line and, when moving to the next machining position, moving it in a direction parallel to the previous movement direction. 8 A method for manufacturing a reference sample of the paint defect described above. ( 10By performing resin molding using a mold having one or more concave portions and / or convex portions for forming pseudo defects on the surface, a resin substrate having one or more pseudo defect portions having a convex shape and / or a concave shape on the surface is produced. The method for manufacturing a reference sample for coating defects described in the previous paragraph 7 The manufacturing method of the reference sample for coating defects described in (11) A method for manufacturing a reference sample of a paint defect as described in paragraph 7, wherein in the cross-section of the convex pseudo-defect portion, the portion that protrudes with an inclination angle of 0.5 degrees in absolute value is defined as the defect region, and in the cross-section of the concave pseudo-defect portion, the portion that is recessed with an inclination angle of 0.5 degrees in absolute value is defined as the defect region. [[Effect of the Invention]]
[0011] According to the invention described in the previous paragraph (1), since the reference sample for coating defects covers at least the pseudo defect portion and its peripheral portion of a substrate on which one or more pseudo defect portions having a convex shape and / or a concave shape are formed on the surface, and a coating film layer is formed, the pseudo defect portion covered with the coating film layer looks the same as the convex or concave coating defects on the surface of the defect evaluation target product such as a product to which coating is applied. By comparing the size of the coating defect of the defect evaluation target product with the reference sample for coating defects, it can be easily and appropriately evaluated. Furthermore, since the defect area of the pseudo-defect is determined based on the inclination angle in the cross-section of the pseudo-defect, the size of the pseudo-defect can be adjusted to match the visual inspection standard of a human.
[0012] According to the invention described in the previous paragraph (2), since the coating film layer is formed of the same paint as the paint used for the defect evaluation target product, the size of the coating defect of the defect evaluation target product can be evaluated more accurately.
[0013] According to the invention described in the previous paragraph (3), since the color of the coating film layer is the same as the color of the paint used for the defect evaluation target product, the size of the coating defect of the defect evaluation target product can be evaluated more accurately.
[0014] According to the invention described in the previous paragraph (4), since the pseudo defect portion includes a plurality of pseudo defect portions having at least one of the diameter, height and / or depth, and inclination angle different in plan view, even if the sizes of the coating defects of the defect evaluation target product are variously different, these can be evaluated with one reference sample for coating defects.
[0015] According to the invention described in the preceding paragraph (5), among a plurality of pseudo defect portions, at least one of the diameter, height and / or depth, and inclination angle in a plan view changes in a geometric progression. Therefore, the differences between the plurality of pseudo defect portions can be easily distinguished by the human eye. Thus, by comparing with the pseudo defect portions, the size and the like of the coating defect of the defect evaluation target product can be accurately evaluated.
[0017] According to the invention described in the preceding paragraph ( 6 ) in the cross section of the convex-shaped pseudo defect portion, the portion where the inclination angle protrudes with an absolute value of 0.5 degrees as a boundary is defined as the defect region, and in the cross section of the concave-shaped pseudo defect portion, the portion where the inclination angle is recessed with an absolute value of 0.5 degrees as a boundary is defined as the defect region. Therefore, the size of the pseudo defect portion can be accurately adjusted to the human visual standard.
[0018] According to the invention described in the preceding paragraph ( 7 ) a reference sample of a coating defect can be manufactured in which at least the pseudo defect portion and its peripheral portion of a substrate having one or more convex-shaped and / or concave-shaped pseudo defect portions formed on its surface are covered with a coating film layer.
[0019] According to the invention described in the preceding paragraph ( 8 ) by machining the substrate, pseudo defect portions can be easily formed.
[0020] According to the invention described in the preceding paragraph ( 9 ) by moving the tool so that its moving direction is linear and parallel, the pseudo defect portion is machined. Therefore, the pseudo defect portion can be manufactured without leaving machining marks, and in particular, the boundary portion between the pseudo defect portion and the peripheral portion can be machined smoothly.
[0021] According to the invention described in the preceding paragraph ( 10According to the invention described above, a resin substrate can be manufactured by molding resin using a mold having one or more recesses and / or protrusions for forming pseudo-defects on its surface, thereby forming one or more pseudo-defects in a convex and / or concave shape on its surface. [Brief explanation of the drawing]
[0022] [Figure 1] (A) is a plan view of a substrate used as a reference sample for a coating defect according to one embodiment of the present invention, (B) is a plan view of a pseudo-defect formed on the same substrate, and (C) is a cross-sectional view of a pseudo-defect. [Figure 2] (A) is a cross-sectional view of the substrate in Figure 1(A) when cut along the line IIA-IIA, and (B) is a cross-sectional view of the same substrate when cut along the line IIB-IIB. [Figure 3] This is a cross-sectional view of a reference sample of a painting defect according to one embodiment of this invention, using the substrate shown in Figure 1. [Figure 4] (A) is a plan view of a substrate used as a reference sample for a painting defect according to another embodiment of the present invention, (B) is a plan view of a pseudo-defect formed on the same substrate, and (C) is a cross-sectional view of a pseudo-defect. [Figure 5] (A) is a cross-sectional view of the substrate shown in Figure 4(A) when cut along the line IIA-IIA, and (B) is a cross-sectional view of the same substrate when cut along the line IIB-IIB. [Figure 6] Figure 4 is a cross-sectional view of a reference sample of a painting defect according to another embodiment of this invention using the substrate. [Figure 7] (A) and (B) are diagrams illustrating one method of manufacturing a circuit board. [Figure 8] (A) is a graph showing the longitudinal cross-sectional contour of a convex-shaped defect, and (B) is a graph showing the inclination angle (slope) of each part of the contour in figure (A). [Figure 9] This graph compares the size of defects defined by the angle of inclination with the size of defects based on visual inspection. [Figure 10]This graph shows the change in the degree of agreement with the visual reference when the slope is varied from ±0.2 degrees to ±2 degrees. [Modes for carrying out the invention]
[0023] Hereinafter, embodiments of this invention will be described based on the drawings.
[0024] Figure 1(A) is a plan view of a substrate 10 used in a reference sample of a paint defect according to one embodiment of the present invention (hereinafter also simply referred to as the reference sample), (B) is a plan view of a pseudo-defect portion 11 formed on the same substrate 10, and (C) is a cross-sectional view of a pseudo-defect portion 11.
[0025] The substrate 10 shown in Figure 1 has a thickness of approximately 2 mm, and on one side of the substrate 10, multiple convex pseudo-defect portions 11 are formed integrally with the substrate 10 and aligned with spacing in the vertical and horizontal directions. As shown in Figures (B) and (C), the pseudo-defect portions 11 are formed in a frustoconical shape where the bottom diameter (lower diameter) D1 is larger than the top diameter (upper diameter) D2. The shape of the convex portion of the pseudo-defect portion 11 is not limited to a frustoconical shape, and may be a cone, cylinder, frustoconical, pyramidal, or prism shape, but a frustoconical shape is preferable because it more closely resembles the appearance of convex paint defects in the defective product, such as an automobile, that is subject to defect evaluation.
[0026] Figure 2(A) is a cross-sectional view of the substrate 10 in Figure 1(A) when cut along the line IIA-IIA, and Figure 2(B) is a cross-sectional view of the same substrate when cut along the line IIB-IIB. In this embodiment, as shown in Figure 2(A), the pseudo-defect portions 11 (for example, pseudo-defect portions 11a1, 11a2, 11a3...) in vertical columns (vertical columns in Figure 1(A)) have lower diameters D1 and upper diameters D2 that increase from the leading edge (upper side of Figure 1(A)) to the end edge (lower side of Figure 1(A)), but the maximum height H of the pseudo-defect portion 11 remains constant. On the other hand, as shown in Figure 2(B), in the row of pseudo-defects 11 (for example, pseudo-defects 11a1, 11b1, 11c1, etc.) (rows in the left-right direction in Figure 1(A)), the lower diameter D1 and upper diameter D2 are constant, but the height H of the pseudo-defect increases from the front of the row (left side in Figure 1(A)) to the end (right side in Figure 1(A)).
[0027] Table 1 shows an example of the dimensions of the lower diameter D1, upper diameter D2, and height H of the pseudo-defect portion 11. In Table 1, 1 to 8 are row numbers, numbered sequentially from 1 from the top to the bottom of Figure 1(A). Also, a to e are column symbols, numbered sequentially from a from the left to the right of Figure 1(A).
[0028] [Table 1]
[0029] As can be seen from Table 1 above, the lower diameter D1 and upper diameter D2 of the pseudo-defect areas 11 in the vertical columns, and the maximum height H of the pseudo-defect areas 11 in the horizontal columns, all change geometrically. By changing them geometrically, the differences between each pseudo-defect area 11 can be easily distinguished by human visual inspection. As a result, by comparing the convex-shaped paint defects of the product to be evaluated with the pseudo-defect areas 11 of the reference sample 1, the size of the convex-shaped paint defects on the surface of the product to be evaluated can be evaluated with high accuracy.
[0030] Furthermore, at least one of the lower diameter D1, upper diameter D2, and maximum height H may be changed geometrically. Alternatively, the inclination angle of the slope of the pseudo-defect portion 11 may be changed geometrically.
[0031] As shown in Figures 1 and 2, the side of the substrate 10 on which the pseudo-defect portion 11 is formed is coated over its entire surface, and as shown in Figure 3, a coating layer 12 is formed that covers the entire surface of one side of the substrate 10.
[0032] In this embodiment, the coating layer 12 has a three-layer structure consisting of a primer layer 12a, a base layer 12b, and a clear layer 12c, in that order from the substrate 10 side.
[0033] It is desirable that the coating layer 12 be formed under the same painting conditions as the product being evaluated for defects, as this allows for accurate defect evaluation by making it look identical to the product being evaluated for defects. Specifically, it is desirable that the paint used, layer composition, color, thickness, etc., be the same as those of the product being evaluated for defects.
[0034] The coating layer 12 does not need to be formed over the entire surface of the substrate 10; it is sufficient if it is formed at least over the pseudo-defect area 11 and its surrounding area. However, for ease of painting, it is preferable to form it over the entire surface of the substrate 10.
[0035] Figure 4(A) is a plan view of the substrate 20 in a reference sample 1 according to another embodiment of the present invention, (B) is a plan view of a pseudo-defect portion 21 formed on the substrate 20, and (C) is a cross-sectional view of the pseudo-defect portion 21.
[0036] The substrate 20 shown in Figure 4 has a thickness of approximately 2 mm, and on one side of the substrate 20, multiple concave pseudo-defect areas 21 are formed integrally with the substrate 20 and aligned with spacing in the vertical and horizontal directions. As shown in Figures (B) and (C), the pseudo-defect areas 21 are formed in the shape of an inverted frustocone, where the upper diameter (D3) is larger than the lower diameter (D4). Note that the shape of the concave area of the pseudo-defect area 21 is not limited to an inverted frustocone, and may be an inverted cone, cylinder, inverted pyramidal frustocone, inverted pyramidal prism, prismatic, etc., but an inverted frustocone shape is preferable because it more closely resembles the concave paint defects of the product being evaluated.
[0037] Figure 5(A) is a cross-sectional view of the substrate 21 in Figure 4(A) when cut along the VA-VA line, and Figure 5(B) is a cross-sectional view of the same substrate when cut along the VB-VB line. In this embodiment, as shown in Figure 5(A), the pseudo-defect portions 21 (for example, pseudo-defect portions 21a1, 21a2, 21a3...) in vertical columns (vertical columns in Figure 4(A)) have upper diameters D3 and lower diameters D4 that increase from the leading edge (upper side of Figure 4(A)) to the end edge (lower side of Figure 4(A)), but the maximum depth D5 of the pseudo-defect portion 21 remains constant. On the other hand, as shown in Figure 5(B), in the pseudo-defect portions 21 (for example, pseudo-defect portions 21a1, 21b1, 21c1, etc.) in the horizontal rows (rows in the left-right direction in Figure 4(A)), the upper diameter D3 and lower diameter D4 are constant, but the depth D5 of the pseudo-defect portion 21 increases from the front of the row (left side in Figure 4(A)) to the end (right side in Figure 4(A)).
[0038] Table 2 shows an example of the dimensions of the upper diameter D3, lower diameter D4, and depth D5 of the pseudo-defect portion 21. In Table 2, 1 to 8 are row numbers, numbered sequentially from 1 from top to bottom in Figure 4(A). a to e are column symbols, numbered sequentially from a from left to right in Figure 4(A).
[0039] [Table 2]
[0040] As can be seen from Table 2 above, the upper diameter D3 and lower diameter D4 of the pseudo-defect areas 21 in the vertical column, and the maximum depth D5 in the horizontal column, all change geometrically. By changing them geometrically, the differences between each pseudo-defect area 21 can be easily distinguished by human visual inspection. As a result, by comparing the concave paint defects of the product to be evaluated with the pseudo-defect areas 21 of the reference sample 1, the size of the concave paint defects on the surface of the product to be evaluated can be evaluated with high accuracy.
[0041] Furthermore, at least one of the upper diameter D3, lower diameter D4, and maximum depth D5 may be changed geometrically. Alternatively, the inclination angle of the slope of the pseudo-defect portion 21 may be changed geometrically.
[0042] Similar to the substrate 11 shown in Figures 1 and 2, the entire surface of the substrate 20 on the side where the pseudo-defect portion 21 is formed is coated, and as shown in Figure 6, a coating layer 22 is formed that covers the entire surface of one side of the substrate 20. The coating layer 22 has a three-layer structure, consisting of a primer layer 22a, a base layer 22b, and a clear layer 22c, in that order from the substrate 20 side. It should be noted that the coating layer 22 is formed under the same coating conditions as the product to be evaluated for defects, and it is desirable that the paint used, layer configuration, color, and thickness are also the same as the product to be evaluated for defects. Furthermore, the coating layer 22 does not need to be formed on the entire surface of the substrate 20, but it is sufficient if it is formed at least on the pseudo-defect portion 21 and its surrounding area, which is the same as in the case of the reference sample 1 having the convex-shaped pseudo-defect portion 11 shown in Figure 3.
[0043] In the embodiments described above, a case was explained in which multiple pseudo-defect portions 11 and 21 are formed on the substrates 10 and 20, but it is sufficient to have at least one pseudo-defect portion 11 or 21. Also, although a reference sample 1 having only convex pseudo-defect portions 11 and a reference sample 1 having only concave pseudo-defect portions 21 were shown, a reference sample 1 having a mixture of convex pseudo-defect portions 11 and concave pseudo-defect portions 21 is also acceptable.
[0044] Next, we will describe the manufacturing method for reference sample 1.
[0045] First, substrates 10 and 20 are manufactured by forming one or more convex and / or concave pseudo-defect areas 11 and 21 on their surfaces. One method for manufacturing the substrates 10 and 20 is to form the pseudo-defect areas 11 and 21 by machining the surface of the substrate material 5 using a rotary machine tool (end mill) 3, as shown in Figures 7(A) and (B). Figures 7(A) and (B) show the case where convex pseudo-defect areas 11 are formed, but the same applies when concave pseudo-defect areas 21 are present. The substrate material 5 may be metal or resin. In Figure 7(B), the area 4 shown by the dashed line indicates the part that has been removed by machining.
[0046] In this machining process, when machining at least the pseudo-defect areas 11 and 21 and their surrounding areas, the tool 3 is moved linearly as indicated by arrow F in Figure 7(A). Furthermore, the tool 3 is made to make a U-turn at the edge of the substrate material 5 that does not affect the pseudo-defect areas 11 and 21, and when moving to the next machining position, it is moved in a direction parallel to the previous movement direction. By moving the tool 3 linearly and parallel in this way, no characteristic machining marks remain near the boundary between the pseudo-defect areas 11 and 21 and their surrounding areas, resulting in a standard sample 1 for painting defects with pseudo-defect areas 11 and 21 that are clean even after painting.
[0047] Generally, when machining convex or concave shapes like these pseudo-defect areas, the tool 3 is moved in a circular motion around the convex or concave shape, and then moved linearly as it moves away from the convex or concave shape. This type of movement is desirable for minimizing shape errors in the convex or concave shape. However, in the production of reference sample 1, the connection between the pseudo-defect areas 11 and 21 and the surrounding area is important, and machining marks are likely to occur if the direction of movement of the tool 3 intersects at this point. Therefore, linear and parallel movement of the tool 3 is suitable.
[0048] Another method for manufacturing the substrates 10 and 20 is to use a mold to manufacture the resin substrates. Specifically, a metal base plate is manufactured that has recesses corresponding to the convex pseudo-defect portion 11 and convex portions corresponding to the concave pseudo-defect portion 21. Using this base plate as a mold, resin substrates 10 and 20 having the convex pseudo-defect portion 11 and the concave pseudo-defect portion 21 are produced by vacuum casting or injection molding. This method allows for the efficient production of a large number of resin substrates 10 and 20, and consequently, a large number of reference samples 1.
[0049] The substrates 10 and 20 thus fabricated are then coated with primer, base coat, and clear coat in order on the side having the pseudo-defect areas 11 and 21 to obtain reference sample 1 covered with coating layers 12 and 22. Note that if the substrates 10 and 20 are made of metal, electrodeposition coating is performed before the primer coating, but since its thickness is very thin, it has almost no effect on the appearance of the pseudo-defect areas 11 and 21.
[0050] Next, we will explain the definition of defect diameter.
[0051] The inclination of convex and concave defects approaches zero as it extends towards the periphery. Therefore, it is difficult to determine where the defect ends and what the defect diameter is. To address this, Figure 8 shows how the inclination angle was determined by defining the defect region as the part of the cross-section of a convex defect where the inclination angle is 0.5 degrees in absolute value, or the part of the cross-section of a concave defect where the inclination angle is 0.5 degrees in absolute value, and then determining the inclination angle.
[0052] Figure 8(A) is a graph showing the longitudinal cross-sectional contour of a convex defect, and Figure 8(B) is a graph showing the inclination angle (also called slope) of each part of the contour in Figure 8(A). As shown in Figure 8(B), the area that protrudes when the absolute value of the slope is 0.5 degrees (indicated as "deg" in the figure) is defined as the defect region. In the example in Figure 8, the diameter of the defect is approximately 0.9 mm.
[0053] Figure 9 is a graph comparing the size of defects according to the above definition with the size of defects based on visual inspection. The vertical axis shows the size of defects defined with an absolute slope of 0.5 degrees (±0.5 degrees), and the horizontal axis shows the size of defects based on visual inspection. It can be seen that there is a high correlation between the two.
[0054] Figure 10 is a graph showing the change in the degree of agreement with the visual reference when the slope is varied from ±0.2deg to ±2deg, with the vertical axis representing the degree of agreement and the horizontal axis representing the slope. From the graph in Figure 10, it can be said that the correlation with the visual reference is highest when the slope is 0.5deg, and that the correlation with the visual reference is relatively high in the range of ±0.3deg to ±1.0deg.
[0055] The points explained in Figures 8 to 10 also apply to concave defects.
[0056] Therefore, it is desirable to determine the defect area of the pseudo-defect areas 11 and 21 based on the inclination angle in the cross-section of the pseudo-defect areas 11 and 21, as this allows the size of the pseudo-defect areas 11 and 21 to be aligned with human visual standards. In particular, it is most desirable to define the defect area as the part that protrudes with an absolute inclination of 0.5 degrees in the cross-section of the convex pseudo-defect area 11, and as the defect area as the part that is recessed with an absolute inclination angle of 0.5 degrees in the cross-section of the concave pseudo-defect area 21. However, instead of an absolute value of 0.5 degrees, it is also acceptable to define whether or not an area is a defect area using an absolute value range of 0.3 to 1.0 degrees as the boundary.
[0057] Furthermore, orange peel texture occurs on the painted surfaces of products such as automobiles as an unavoidable manufacturing noise. For this reason, it is desirable to generate orange peel texture on the surface of the paint film layer of reference sample 1, as this allows for more accurate reproduction of the paint defects of the product being evaluated for defects. In this case, similar to the orange peel texture of the product being evaluated for defects, it is desirable that the inclination angle of the orange peel texture be greater than half the inclination angle of the simulated defect areas 11 and 21.
[0058] As described above, in this embodiment, the reference sample 1 has one or more pseudo-defect portions 11, 21 formed on the surface of the substrates 10, 20, and at least the pseudo-defect portions 11, 21 and their surrounding areas are covered by the coating layers 12, 22. Therefore, the pseudo-defect portions 11, 21 covered by the coating layers 22 look similar to the convex and concave paint defects that occur on the surface of the product to be evaluated for defects, such as painted goods. This allows for easy and accurate evaluation of the size of the paint defects on the product to be evaluated for defects by comparing it with the reference sample 1.
[0059] This application is accompanied by a priority claim from Japanese Patent Application No. 2021-121485, filed on 26 July 2021, and the disclosures thereof constitute a part of this application. [Industrial applicability]
[0060] This invention can be used, for example, to evaluate the size of convex and / or concave paint defects that occur on the painted surface of products such as automobiles. [Explanation of Symbols]
[0061] 1. Standard sample of paint defects 10, 20 circuit boards 11(11a1~11a3, 11b1, 11c1) Convex pseudo-defect area 21(21a1~21a3, 21b1, 21c1) Concave pseudo-defect area 3 tools 4 Processing section 12, 22 Coating layer 12a, 22a Primer layer 12b, 22b base layer 12c, 22c clear layer
Claims
1. A coating layer is formed on a substrate having one or more pseudo-defect portions with a convex and / or concave shape on its surface, covering at least the pseudo-defect portions and their surrounding areas. A reference sample of a paint defect in which the defect area of a pseudo-defect is determined based on the inclination angle of the cross-section of the pseudo-defect.
2. The reference sample for paint defects according to claim 1, wherein the aforementioned paint film layer is formed of the same paint used on the product subject to defect evaluation.
3. The reference sample for paint defects according to claim 1, wherein the color of the paint film layer is the same as the color of the paint used on the product subject to defect evaluation.
4. A reference sample of a paint defect according to any one of claims 1 to 3, wherein the pseudo-defect portion includes a plurality of pseudo-defect portions that differ in at least one of the diameter, height and / or depth and inclination angle in a plan view.
5. A reference sample of a paint defect according to claim 4, wherein at least one of the diameter, height and / or depth, and inclination angle in a plan view changes geometrically among a plurality of pseudo-defect areas.
6. A reference sample of a paint defect according to claim 1, wherein in the cross-section of the convex pseudo-defect portion, the portion that protrudes with an inclination angle of 0.5 degrees in absolute value is defined as the defect region, and in the cross-section of the concave pseudo-defect portion, the portion that is recessed with an inclination angle of 0.5 degrees in absolute value is defined as the defect region.
7. After manufacturing a substrate on which one or more pseudo-defect areas in a convex and / or concave shape are formed on the surface, paint is applied to at least the pseudo-defect areas and their surrounding areas of the substrate. A method for manufacturing a reference sample of a paint defect, wherein the defect area of the pseudo-defect is determined based on the inclination angle of the cross-section of the pseudo-defect.
8. A method for manufacturing a reference sample of a paint defect according to claim 7, wherein the pseudo-defect portion is formed by machining the substrate.
9. A method for manufacturing a reference sample of a paint defect according to claim 8, wherein the tool is moved linearly, and when moving to the next processing position, the tool is moved in a direction parallel to the previous direction of movement to process the pseudo-defect portion.
10. A method for manufacturing a reference sample of a paint defect according to claim 7, wherein a resin substrate having one or more pseudo-defect portions in a convex shape and / or concave shape formed on its surface is manufactured by resin molding using a mold having one or more recesses and / or protrusions for forming pseudo-defects on its surface.
11. A method for manufacturing a reference sample of a paint defect according to Claim 7, wherein in the cross-section of the convex pseudo-defect portion, the portion that protrudes with an inclination angle of 0.5 degrees in absolute value is defined as the defect region, and in the cross-section of the concave pseudo-defect portion, the portion that is recessed with an inclination angle of 0.5 degrees in absolute value is defined as the defect region.