Lattice parameter extraction method and apparatus for conductive carbon black, and computer device

Abstract

The present application relates to the technical field of image processing. Disclosed are a lattice parameter extraction method and apparatus for a conductive carbon black, and a computer device. The method comprises: acquiring an original electron-microscope image of a conductive carbon black, and acquiring a binarized image on the basis of the original electron-microscope image; traversing pixel points, the values of which are 0, in the binarized image, and acquiring effective pixel points, which meet a preset condition; executing a compensation operation on the binarized image, which involves: traversing the effective pixel points, and for each effective pixel point, if the proportion of pixel points, the values of which are I, in a preset region corresponding to the effective pixel point is less than a first threshold value, assigning the pixel points, the values of which are 1, in the preset region the value of 0, and if adjacent main body regions meet a preset condition, bridging the adjacent main body regions; and on the basis of the binarized image, which has been subjected to the compensation operation, extracting lattice fringes and acquiring shape parameters of the lattice fringes. By means of the method, the accuracy of parameter extraction performed on lattice fringes can be improved. In addition, the present application also relates to the field of computers.

Description

Conductive carbon black lattice parameter extraction method, device and computer equipment

[0001] This application claims priority to the Chinese patent application filed with the China Patent Office on October 31, 2023, with application number 2023114327323 and application name “Method, device and computer equipment for extracting lattice parameters of conductive carbon black”, the entire contents of which are incorporated by reference into this application. Technical Field

[0002] The present application relates to the field of image processing technology, and in particular to a method, device and computer equipment for extracting lattice parameters of conductive carbon black. Background Art

[0003] Conductive carbon black is a typical specialty carbon black with specialized electrical conductivity. Due to its excellent conductivity and high cost-performance ratio, it is widely used in a variety of fields, including electronic devices, mining pipes, cable shielding materials, aerospace, petrochemicals, and power storage. Furthermore, compared to highly conductive fillers such as graphene and carbon nanotubes, conductive carbon black is increasingly favored in the energy sector due to its excellent cost-performance ratio. For example, it is used as a conductive agent in (power) lithium-ion batteries, lead-acid batteries, and supercapacitors.

[0004] Existing evaluation methods for conductive carbon black include high-resolution transmission electron microscopy (HRTEM), Raman spectroscopy, XRD (X-ray diffraction), infrared spectroscopy, DBP (dibutyl phthalate) oil absorption value and other basic property characterization methods. Currently, high-resolution transmission electron microscopy has been widely used in the analysis of microscopic physical and chemical structural characteristics such as aromatic hydrocarbon layers of carbon-based materials.

[0005] However, the inventors realized that high-resolution transmission electron microscopy technology is an important tool for characterizing the microstructure of carbon-based materials. In addition to morphological observation, the information obtained from its images is very limited. Usually, only qualitative analysis is performed, and theoretical calculations are complicated. In quantitative analysis, the relevant parameters calculated by the basic characterization methods of conductive carbon black by current technology are limited. For example, the number of stacked layers and interlayer spacing of the conductive carbon black aromatic hydrocarbon layers calculated using XRD are not accurate, and the gap between different types of conductive carbon black materials (such as furnace black and acetylene black) is more obvious, but the difference between the same type of materials is relatively small, which is difficult to use as a reference. Therefore, the accuracy of quantitative analysis needs to be improved.

[0006] Summary of the Invention

[0007] According to various embodiments disclosed in the present application, a method, apparatus, and computer device for extracting lattice parameters of conductive carbon black are provided, which can improve the accuracy of stripe extraction.

[0008] A method for extracting lattice parameters of conductive carbon black includes:

[0009] Obtaining an electron microscope original image of the conductive carbon black, and obtaining a binary image based on the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0;

[0010] Traverse the pixels assigned a value of 0 in the binary image and obtain valid pixels that meet the preset rules;

[0011] Performing a compensation operation on the binary image: traversing valid pixels, for each valid pixel, if the proportion of pixels assigned a value of 1 in a preset area corresponding to the valid pixel is less than a first threshold, assigning a value of 0 to the pixels assigned a value of 1 in the preset area; if adjacent main areas meet preset conditions, bridging the adjacent main areas; wherein the preset area is a fixed-shape area including a preset number of pixels, and the preset area contains valid pixels corresponding to the preset area; the main area is composed of continuous valid pixels; and

[0012] Lattice fringes are extracted from the binarized image after compensation and the shape parameters of the lattice fringes are obtained.

[0013] A conductive carbon black lattice parameter extraction device comprises:

[0014] An image processing module is used to obtain an electron microscope original image of the conductive carbon black and obtain a binary image based on the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0;

[0015] The initial screening module is used to traverse the pixels assigned with a value of 0 in the binary image and obtain valid pixels that meet the preset rules;

[0016] A compensation module is used to perform a compensation operation on the binary image: traverse the valid pixel points, and for each valid pixel point, if the proportion of pixel points assigned a value of 1 in a preset area corresponding to the valid pixel point is less than a first threshold, then the pixel points assigned a value of 1 in the preset area are assigned a value of 0; if adjacent main areas meet preset conditions, then the adjacent main areas are bridged; wherein the preset area is a fixed-shape area including a preset number of pixels, and the preset area contains valid pixels corresponding to the preset area; the main area is composed of continuous valid pixels; and a parameter acquisition module is used to extract lattice fringes based on the binary image after the compensation operation and obtain shape parameters of the lattice fringes.

[0017] A computer device includes a memory and one or more processors, wherein the memory stores computer-readable instructions, and when the computer-readable instructions are executed by the processors, the one or more processors perform the following steps:

[0018] Obtaining an electron microscope original image of the conductive carbon black, and obtaining a binary image based on the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0;

[0019] Traverse the pixels assigned a value of 0 in the binary image and obtain valid pixels that meet the preset rules;

[0020] Performing a compensation operation on the binary image: traversing valid pixels, for each valid pixel, if the proportion of pixels assigned a value of 1 in a preset area corresponding to the valid pixel is less than a first threshold, assigning a value of 0 to the pixels assigned a value of 1 in the preset area; if adjacent main areas meet preset conditions, bridging the adjacent main areas; wherein the preset area is a fixed-shape area including a preset number of pixels, and the preset area contains valid pixels corresponding to the preset area; the main area is composed of continuous valid pixels; and

[0021] Lattice fringes are extracted from the binarized image after compensation and the shape parameters of the lattice fringes are obtained.

[0022] One or more computer-readable storage media storing computer-readable instructions, which, when executed by one or more processors, cause the one or more processors to perform the following steps:

[0023] Obtaining an electron microscope original image of the conductive carbon black, and obtaining a binary image based on the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0;

[0024] Traverse the pixels assigned a value of 0 in the binary image and obtain valid pixels that meet the preset rules;

[0025] Performing a compensation operation on the binary image: traversing valid pixels, for each valid pixel, if the proportion of pixels assigned a value of 1 in a preset area corresponding to the valid pixel is less than a first threshold, assigning a value of 0 to the pixels assigned a value of 1 in the preset area; if adjacent main areas meet preset conditions, bridging the adjacent main areas; wherein the preset area is a fixed-shape area including a preset number of pixels, and the preset area contains valid pixels corresponding to the preset area; the main area is composed of continuous valid pixels; and

[0026] Lattice fringes are extracted from the binarized image after compensation and the shape parameters of the lattice fringes are obtained.

[0027] A computer program product, comprising a computer program, which, when executed by a processor, implements the following steps:

[0028] Obtaining an electron microscope original image of the conductive carbon black, and obtaining a binary image based on the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0;

[0029] Traverse the pixels assigned a value of 0 in the binary image and obtain valid pixels that meet the preset rules;

[0030] Performing a compensation operation on the binary image: traversing valid pixels, for each valid pixel, if the proportion of pixels assigned a value of 1 in a preset area corresponding to the valid pixel is less than a first threshold, assigning a value of 0 to the pixels assigned a value of 1 in the preset area; if adjacent main areas meet preset conditions, bridging the adjacent main areas; wherein the preset area is a fixed-shape area including a preset number of pixels, and the preset area contains valid pixels corresponding to the preset area; the main area is composed of continuous valid pixels; and

[0031] Lattice fringes are extracted from the binarized image after compensation and the shape parameters of the lattice fringes are obtained.

[0032] The above-mentioned conductive carbon black lattice parameter extraction method, device, and computer equipment obtain a binary image corresponding to the original electron microscope image of the conductive carbon black, then identify valid pixels based on the binary image, perform compensation operations on the binary image for the valid pixels, and compensate for pixels that could have been assigned a value of 0 but were assigned a value of 1, thereby obtaining a binary image that is closer to the crystal fringe characteristics in the original electron microscope image. Finally, the fringe parameter characteristics are obtained based on this binary image. This application improves the accuracy of lattice fringe parameter extraction by compensating for the crystal fringe characteristic information lost during the conversion of the original electron microscope image into a binary image.

[0033] The details of one or more embodiments of the present application are set forth in the accompanying drawings and the description below. Other features and advantages of the present application will become apparent from the description, drawings, and claims. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0035] FIG1 is a diagram illustrating an application environment of a method for extracting lattice parameters of conductive carbon black according to one or more embodiments;

[0036] FIG2 is a schematic flow chart of a method for extracting lattice parameters of conductive carbon black according to one or more embodiments;

[0037] FIG3 is a diagram showing parameter definitions of lattice fringes in one embodiment;

[0038] FIG4 is a schematic diagram showing a comparison before and after an iterative operation in one embodiment;

[0039] FIG5 is a schematic diagram of the interim results of electron microscope raw image processing in one embodiment;

[0040] FIG6 is a histogram showing the relationship between the length parameters of lattice fringes and the frequency after skeleton extraction in one embodiment;

[0041] FIG7 is a histogram showing the relationship between curvature parameters and frequency of lattice fringes after skeleton extraction in one embodiment;

[0042] FIG8 is a structural block diagram of a device for extracting lattice parameters of conductive carbon black according to one or more embodiments;

[0043] FIG9 is a diagram illustrating the internal structure of a computer device according to one or more embodiments. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0045] The conductive carbon black lattice parameter extraction method provided in the embodiment of the present application can be applied to the application environment shown in Figure 1. The terminal 102 communicates with the server 104 through the network. The data storage system can store the data that the server 104 needs to process. The data storage system can be integrated on the server 104, or it can be placed on the cloud or other network servers. The terminal 102 can be, but is not limited to, various personal computers, laptops, smart phones, tablets, Internet of Things devices and portable wearable devices. The Internet of Things devices can be smart speakers, smart TVs, smart air conditioners, smart car-mounted devices, etc. Portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc. The server 104 can be implemented as an independent server or a server cluster consisting of multiple servers.

[0046] In one embodiment, as shown in FIG2 , a method for extracting lattice parameters of conductive carbon black is provided. The method is described by taking the terminal 102 in FIG1 as an example, and includes the following steps:

[0047] Step 202: Obtain an original electron microscope image of the conductive carbon black, and obtain a binary image based on the original electron microscope image; each pixel in the binary image is assigned a value of 1 or 0.

[0048] Among them, the original electron microscope image is obtained by preparing a dispersion of conductive carbon black and ethanol in a certain ratio, and then performing HRTEM testing after sample preparation.

[0049] Obtaining a binary image from an original electron microscope image primarily utilizes binarization technology. Binarization involves representing image pixels with grayscale values ​​of 0 and 255, essentially creating a distinct black and white image. A common method for binarization is the threshold method. When a pixel's grayscale value exceeds a threshold, the pixel's grayscale value is set to a maximum of 255, resulting in a white image. Conversely, if the pixel's grayscale value is below the threshold, the pixel's grayscale value is set to a minimum of 0, resulting in a black image. Each pixel in a binary image can only be black or white. For ease of calculation, black pixels are assigned a value of 0, and white pixels are assigned a value of 1. This converts the original electron microscope image into a binary image composed of 0s and 1s.

[0050] In this example, the area formed by the black pixels is the lattice fringes. By converting the original electron microscope image into a binary image, the image representation can be simplified based on pre-processing, while highlighting the outline features of the lattice fringes and reducing interference from other irrelevant information, making the image easier to analyze.

[0051] Step 204 , traverse the pixels assigned a value of 0 in the binary image to obtain valid pixels that meet a preset rule.

[0052] All pixels assigned a value of 0 in the binary image are traversed in a certain order to select valid pixels. In this embodiment, the method mainly determines whether the area surrounding the pixel assigned a value of 0 has more pixels assigned a value of 0 than pixels assigned a value of 1, that is, if the surrounding area is mainly black, the area can be identified as the main valid area, and the pixel is the valid pixel.

[0053] Step 206, performing a compensation operation on the binary image: traverse the valid pixel points, for each valid pixel point, if the proportion of pixels assigned a value of 1 in the preset area corresponding to the valid pixel point is less than a first threshold, then assign a value of 0 to the pixels assigned a value of 1 in the preset area; if the adjacent main area meets the preset conditions, then bridge the adjacent main area; wherein the preset area is a fixed-shape area including a preset number of pixels, and the preset area contains valid pixels corresponding to the preset area; the main area is composed of continuous valid pixels.

[0054] Because some fringe feature information is lost during the conversion of the electron microscope raw image into a binary image, resulting in distortion in subsequent fringe extraction, this embodiment uses a compensation operation to compensate for the lost fringe feature information, thereby reducing the distortion rate and improving the accuracy of subsequent fringe extraction.

[0055] Step 206 traverses all valid pixels in the same order as step 204. The common traversal order is from left to right and from top to bottom. After traversing one row, traversal continues from the next row.

[0056] The main area is an area composed of continuous valid pixels, that is, the main area is a whole black area in space.

[0057] When traversing each valid pixel, if the proportion of pixels assigned a value of 1 within the preset area corresponding to the valid pixel is less than a first threshold, all pixels within the preset area need to be filled with 0. That is, pixels within the preset area that were originally assigned a value of 1 are assigned a value of 0, and pixels that were originally assigned a value of 0 are retained. At the same time, all pixels within the preset area are marked as valid pixels. If the newly marked valid pixel is adjacent to a main area, the main area is updated and expanded to include the valid pixel.

[0058] For example, each valid pixel corresponds to a 3×3 preset area centered on the valid pixel, and the first threshold is set to 4. If the number of pixels in the preset area assigned a value of 1 is less than 4, all pixels in the preset area are assigned a value of 0. If the number of pixels in the preset prefetched area assigned a value of 1 is less than 4, no change is made.

[0059] Adjacent subject regions are assessed for similarity, specifically to determine whether they meet pre-defined criteria. This similarity assessment is based on the following underlying logic: During the conversion of the original electron microscope image into a binary image, if feature loss results in a complete black region being split into two, forming two independent subject regions, then the environments surrounding the fractured ports of these two subject regions are generally similar and relatively close to each other. Based on this logic, if the similarity is high, meaning the pre-defined criteria are met, the two adjacent subject regions are bridged to create a single subject region.

[0060] In this embodiment, the purpose of filling is to prune the stripes to facilitate the subsequent clustering of black pixel clusters and ensure the accuracy of subsequent stripe extraction. The purpose of bridging is to connect two adjacent main body areas that originally belong to the same main body area, which also ensures the accuracy of subsequent stripe extraction.

[0061] Step 208 : extracting lattice fringes from the binarized image after the compensation operation and obtaining shape parameters of the lattice fringes.

[0062] The shape parameters of crystal fringes include their curvature, length, and area. Figure 3 shows a schematic diagram of the shape parameter definitions for crystal fringes. Since fringes are composed of curved lines, the curvature and length of the curves can be calculated. The curvature calculation formula is curvature = R / L, where R represents the length of the curve and L represents the distance between the curve's endpoints. The fringing area is the surface area enclosed by the curves.

[0063] Lattice fringe extraction from a binary image is mainly to remove noise pixels. The parameters of the lattice fringe are obtained by using skeleton extraction technology to obtain the fringe skeleton and then obtaining the parameters of the lattice fringe based on the scale of the binary image.

[0064] Skeleton extraction is also called image thinning. This method can thin a connected area into a pixel width and is mainly used for stripe feature extraction.

[0065] The scale of the binary image and the pixels is obtained according to the number of pixels in the binary image, the length of a single pixel is calibrated according to the scale, and the parameters of the lattice fringes are obtained by counting the number of pixels in the skeleton.

[0066] This embodiment obtains a binary image corresponding to the original electron microscope image of conductive carbon black, then identifies valid pixels based on the binary image. Compensation is performed on the binary image for the valid pixels, compensating for pixels that could have been assigned a value of 0 but were assigned a value of 1. This results in a binary image that more closely resembles the crystal fringe characteristics in the original electron microscope image. Finally, fringe parameter characteristics are obtained based on this binary image. This application improves the accuracy of lattice fringe parameter extraction by compensating for crystal fringe characteristic information lost during the conversion of the original electron microscope image to the binary image.

[0067] In one embodiment, obtaining a binary image based on the electron microscope original image in step 202 includes: cropping the electron microscope original image, enhancing the image black and white contrast and performing noise reduction processing based on the cropped electron microscope original image to obtain a first image; performing Fourier-inverse Fourier transform on the first image to obtain a second image; performing grayscale processing on the second image to obtain a third image; performing image black and white contrast enhancement processing on the third image to obtain a fourth image; and performing binarization processing on the fourth image to obtain a binary image.

[0068] The acquisition of the first, second, third, and fourth images all constitutes pre-processing. Pre-processing involves processing the original electron microscope image using image processing software or drawing software to remove the background and retain and enhance the lattice fringe features of the conductive carbon black to facilitate subsequent extraction of lattice parameters.

[0069] The first step is to import the original electron microscope image into Adobe Photoshop. Select an area with minimal overlap of carbon black primary particles, minimal interlayering between aromatic hydrocarbon layers, and as complete as possible. This area is cropped into a square, the specific size depending on the particle size in the image, for example, 512×512 pixels. The image's black-and-white contrast is enhanced by adjusting the contrast, saturation, and threshold to enhance the streak features. The image is then converted to a format supported by Digital Micrograph software. This converted image is then imported into Digital Micrograph software for noise reduction and secondary enhancement of the streak features, resulting in the first image.

[0070] The second step is to use Digital Micrograph software to convert the first image's data format to binary. This changes the image's red, green, and blue channels to grayscale thumbnails, which remain blurry. The pixel color parameter ranges from 0 to 255. A Fourier-inverse Fourier transform is then performed to extract the blurred crystal fringes, yielding the second image.

[0071] The purpose of this step is to convert the multi-channel color image into a single-channel grayscale image after the data format is changed to binary format, making it easier to subsequently use the ratio of "0" and "1" to form different grayscale levels, thereby adjusting the proportion of red, green, and blue in the image.

[0072] In the third step, the second image is grayscaled using floating-point operations, and the characteristics of the crystal stripes are enhanced three times to retain the original structural information as much as possible and highlight the stripe characteristics to obtain the third image.

[0073] The grayscale processing formula is I(x,y)=0.3*I R (x,y)+0.59*I G (x,y)+0.11*I B (x,y), where I R (x, y) represents the red component of a pixel, I G (x, y) represents the green component of a pixel, I B (x,y) represents the blue component of a pixel, and I(x,y) is the grayscale value. This step can be implemented using OpenCV programming.

[0074] In the fourth step, the grayscaled third image is imported into Adobe Photoshop again to adjust the threshold, enhance the black and white contrast of the image, enhance the stripe features four times, and filter out the noise to obtain the fourth image.

[0075] In the fifth step, the fourth image is binarized using Open CV to convert the fourth image into a binary image.

[0076] Traditional semi-automated extraction methods based on computer language processing suffer from uncontrollable post-processing effects and lack flexibility in image processing. Due to varying image characteristics, such as brightness and shading, filtering and threshold noise reduction processes can easily result in significant information loss and unrecoverable distortion, leading to a high grayscale signal-to-noise ratio. This embodiment employs a pre-processing method that manually enhances stripe features multiple times to maximize the preservation and prominence of stripe features, ensuring the accuracy of subsequent stripe extraction. Pre-processing paves the way for subsequent stripe extraction, offering greater flexibility and serving as a prerequisite for reducing distortion.

[0077] In one embodiment, the method further includes dividing the binary image into blocks to determine the locations of the main stripes, and focusing the stripe extraction on the area where the stripes are clearer. The block size can be selected based on actual needs. For example, if the binary image has a size of 512×512 pixels, the block size can be 64×64 pixels.

[0078] In one embodiment, step 204 includes: traversing the pixel points assigned a value of 0 in the binary image, and for each pixel point assigned a value of 0, if the number of pixel points assigned a value of 1 in the corresponding preset area is not greater than a second threshold, then assigning a value of 0 to the pixel points assigned a value of 1 in the preset area, and marking each pixel point in the preset area as a valid pixel point.

[0079] For pixels assigned a value of 0, if the number of pixels assigned a value of 1 within the corresponding preset area is no greater than a second threshold, the corresponding preset area is considered the valid portion of the subject; otherwise, the corresponding preset area is considered the non-valid portion of the subject. Pixels assigned a value of 1 within the valid portion of the subject are assigned a value of 0 to fill the corresponding preset area, marking all pixels in the valid portion of the subject as valid pixels. The second threshold acts as a pre-screening condition for the first threshold and is typically greater than the first threshold.

[0080] Take the example where each pixel assigned a value of 0 corresponds to a 3×3 preset area centered on the pixel, and the second threshold is set to 5. All pixel points assigned a value of 0 in the image are identified. If the number of pixel points assigned a value of 1 in the corresponding preset area is greater than 5, the preset area is identified as a non-valid part of the subject and is determined to be noise. If the number of pixel points assigned a value of 1 in the preset pre-fetch is not greater than 5, the preset area is identified as a valid part of the subject. The pixel points with a value of 1 in the valid part of the subject are filled, that is, the pixel points originally assigned a value of 1 are assigned a value of 0 and marked as valid pixels.

[0081] This embodiment, by identifying and determining the valid portion of the subject, compensates for any feature information that may have been lost during preprocessing, improving the accuracy of subsequent crystal fringe feature extraction. Furthermore, this embodiment can filter out noise to a certain extent, focusing on valid pixels for further processing, thereby reducing errors caused by subsequent compensation.

[0082] In one embodiment, the preset condition in step 206 is that the number of interval pixel points between two adjacent main body areas is not greater than a third threshold; or there are island pixel points between two adjacent main body areas, and the number of interval pixel points between the two adjacent main body areas is not greater than a fourth threshold; the interval pixel points are two adjacent pixel points that are respectively located between the valid pixel points of the adjacent main body areas in the traversal order of the valid pixel points; the island pixel points are two adjacent pixel points that are respectively located between the valid pixel points of the adjacent main body areas in the traversal order of the valid pixel points and are assigned a value of 0.

[0083] In this embodiment, the third threshold is greater than the fourth threshold. An island pixel refers to a pixel that is located between two adjacent main body areas and is assigned a value of 0 and does not belong to any main body area, usually one or two pixels. An interval pixel refers to a pixel between two adjacent valid pixels that belong to two different main body areas along the traversal order, regardless of the pixel assignment value. For example, if a valid pixel is traversed to main body area A, and another valid pixel is traversed in the same row along the traversal order from left to right, and belongs to main body area B, main body area A and main body area B are adjacent, and the number of pixels between the two valid pixels is the number of interval pixels; if there is a pixel with a value of 0 between the two adjacent valid pixels, and the pixel does not belong to any main body area, then the pixel is an island pixel.

[0084] For this example, each pixel corresponds to a 3×3 preset area centered on that pixel, with the third threshold set to 10 and the fourth threshold set to 4. For the circled area in Figure 4, if the number of pixels separating two adjacent main body areas is no greater than 4, the two main body areas are considered similar and can be bridged. If there are isolated pixels between two adjacent main body areas, and the number of pixels separating the two adjacent main body areas is no greater than 10, the two main body areas are also similar and can be bridged.

[0085] This embodiment evaluates the distance between two adjacent main body areas by the number of interval pixels and island pixels, thereby completing the preset similarity determination conditions of the two main body areas, and then performing the next bridging operation based on the preset conditions.

[0086] In one embodiment, after assigning a value of 0 to the pixel points assigned to 1 in the preset area in step 206, the method further includes: marking the pixel points in the preset area that were originally assigned a value of 1 and then assigned to 0 as valid pixel points, and updating the main area; bridging adjacent main areas includes: assigning a value of 0 to the pixel points assigned to 1 between two adjacent main areas, and marking them as valid pixel points.

[0087] After assigning a value of 0 to the pixels in the preset area that were assigned a value of 1, the pixels with the changed values ​​are marked as valid pixels. That is, all pixels in the preset area corresponding to the valid pixels are marked as valid pixels, and the main area is updated at the same time. The bridge is determined based on the updated main area.

[0088] Bridging is to merge two main areas by assigning the value of 0 to the interval pixels between them, making them a larger main area. At the same time, the interval pixels between the two bridged main areas are marked as valid pixels.

[0089] This embodiment reduces the distortion effect generated during the process of converting the original electron microscope image into a binary image through bridging, thereby improving the accuracy of subsequent crystal fringe extraction.

[0090] In one embodiment, the method further includes: iteratively performing the compensation operation, updating the lattice fringes after each iteration, and stopping the iteration when the lattice fringes remain unchanged; and obtaining shape parameters of the lattice fringes based on the lattice fringes corresponding to the lattice fringes when the iteration stops.

[0091] Based on the previous iteration, all valid pixels are traversed again, and filling and bridging operations are performed. When the lattice fringes remain unchanged, the iteration is stopped, and the lattice fringes at this time are the lattice fringes to be extracted in step 208.

[0092] By continuously compensating the lattice fringes through iterative operations, the range of the lattice fringes will become larger and more coherent, thereby obtaining a reliable lattice fringing area, which is conducive to the subsequent extraction of parameters with higher accuracy.

[0093] In one embodiment, after the iterations are complete, it is possible that color blocks near the stripes may still remain in the binarized image, similar to miniature "islands" generated during the conversion of the original electron microscope image to the binary image. These blocks are not considered valid pixels and do not belong to any main area. Therefore, these blocks are stripped and identified as noise to achieve segmentation. These noise blocks are then ignored during the subsequent lattice fringe extraction process.

[0094] In one embodiment, the lattice fringes corresponding to when the iteration stops are input into Adobe Photoshop again to adjust the threshold to enhance the fringing features, and then imported into Digital Micrograph for noise reduction processing to reduce noise interference, and skeleton extraction is performed based on the lattice fringes after noise reduction.

[0095] In one embodiment, in step 208 , OpenCV is used to extract the skeleton of the lattice fringes.

[0096] Traditional manual extraction methods involve grayscaling and binarizing the original electron microscope image, then manually skeletonizing the stripes and extracting the stripe parameters using analytical mapping software such as ArcGIS or ImageJ. This is time-consuming and labor-intensive, and manual extraction can result in large errors. This embodiment, based on the binarized image after compensation, already obtains relatively accurate stripe features. Therefore, automatic skeleton extraction using OpenCV programming can effectively ensure the accuracy of parameter extraction, making it more convenient, faster, and more accurate than manual extraction methods.

[0097] In one embodiment, step 208 skeletonizes the crystal fringes, calibrating the length of individual pixels proportionally to the image scale. Since the length of lattice fringes is characteristically (0.3 nm to 2.86 nm), the binarized image obtained by iterative processing in step 206 is used to determine whether the pixel clusters in the blurred portion are fringes or noise. Pixels smaller than 0.3 nm are deleted as noise, and pixel clusters larger than 0.28 nm are deemed invalid fringes. All pixels are traversed in the same order as steps 204 and 206. For example, if the current pixel coordinates are (X, Y), the next pixel coordinates traversed are calculated by adding one to the current pixel coordinates (X, Y), or by adding one to the Y coordinates if the pixel is at the edge of the image). This process is repeated until no lattice fringes exist in the entire image domain that exceed the range of 0.3 nm to 2.86 nm. The lattice fringing parameters are then determined.

[0098] The present invention uses carbon black as the analysis object and performs quantitative analysis of the lattice fringes of conductive carbon black based on a high-resolution transmission electron microscope. The image processing method has higher flexibility, a high level of automation, and a simple operation process. At the same time, it optimizes the noise screening method, optimizes the distortion effect of the binarized image caused by grayscale and binarization and multiple enhancements of crystal fringes characteristics, and ensures the accuracy of crystal fringes extraction, effectively avoiding the loss of a large amount of useful information. It can meet the requirements of fast, accurate and flexible processing of HRTEM images and ensure the accuracy of aromatic hydrocarbon lamellae crystal fringes extraction.

[0099] The method proposed in the present invention takes conductive carbon black as the starting point and is applicable to various carbon-based materials with microcrystalline structures or ordered layering characteristics of aromatic hydrocarbon sheets, and can quantitatively analyze effective information on the distribution of aromatic hydrocarbon sheets in carbon-based materials.

[0100] As shown in Figure 5, the partial stripe feature image of the conductive carbon black obtained by the image processing method of the present invention has a good background stripping effect. It is worth noting that the extracted lattice stripes have a high degree of contrast overlap with the original electron microscope image. At the same time, the structure of the lattice stripe edge is clear, with few burrs and adhesions, indicating that the technical method of the present invention has excellent feature stripe extraction and background stripping effects and effectively avoids the influence of distortion caused by the image processing process.

[0101] As shown in Figure 6, the frequency of the lattice fringe length extracted by the image processing method provided by the present invention in the range of 0 to 0.25 nm and the range of 3.00 nm and above is 0, indicating that the present invention can effectively filter noise; the lattice fringe length frequency is mainly concentrated in the range of 0.28 to 1.50 nm, while the lattice fringe length frequency in the range of 1.5 to 2.86 nm is low, among which the frequency of 0.28 to 0.75 nm is high and the frequency of 0.75 to 1.5 nm is relatively high, indicating that the region corresponding to the HRTEM image fragment of the embodiment selected by the present invention is mainly composed of stacking of naphthalene rings and carbon 2×2 aromatic rings, followed by stacking of carbon 3×3 aromatic rings and carbon 4×4 aromatic rings, and stacking of carbon 5×5 and above aromatic rings accounts for a relatively small proportion, indicating that in the production process of this conductive carbon black embodiment, the crystal nuclei and multiple crystal nuclei of the conductive carbon black are mainly composed of naphthalene rings and carbon 2×2 aromatic rings, and some aromatic rings will grow and further generate carbon 3×3 aromatic rings and carbon 4×4 aromatic rings.

[0102] As shown in Figure 7, the lattice fringe curvature extracted by the image processing method provided by the present invention is mainly concentrated in the range of 0.10 to 0.45 and the frequency proportion of each interval is not much different, indicating that the aromatic fringe curvature distribution in the corresponding area in the HRTEM image segment of the embodiment selected by the present invention is not concentrated, which means that the layered structure uniformity between the aromatic hydrocarbon layers in this area of ​​the conductive carbon black corresponding to the HRTEM image segment of the embodiment selected by the present invention is not high.

[0103] It should be understood that the cropping size, shape size of the preset area, and the values ​​of the first threshold, the second threshold, the third threshold, and the fourth threshold used in all the above embodiments can all be set according to actual conditions. The specific values ​​disclosed in the present invention are only a feasible solution and are not a limitation on the solution itself.

[0104] It should be understood that, although the various steps in the flowcharts involved in the various embodiments described above are displayed in sequence according to the instructions of the arrows, these steps are not necessarily executed in sequence in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps can be executed in other orders. Moreover, at least a portion of the steps in the flowcharts involved in the various embodiments described above can include multiple steps or multiple stages, and these steps or stages are not necessarily executed and completed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a portion of steps or stages in other steps.

[0105] Based on the same inventive concept, embodiments of the present application also provide a conductive carbon black lattice parameter extraction device for implementing the aforementioned conductive carbon black lattice parameter extraction method. The solution provided by this device is similar to the solution described in the aforementioned method. Therefore, the specific limitations of one or more of the following embodiments of the conductive carbon black lattice parameter extraction device can be found in the aforementioned limitations of the conductive carbon black lattice parameter extraction method and will not be further elaborated here.

[0106] In one embodiment, as shown in FIG8 , a conductive carbon black lattice parameter extraction device is provided, comprising: an image processing module 802 , a primary screening module 804 , a compensation module 806 , and a parameter acquisition module 808 , wherein:

[0107] The image processing module 802 is used to obtain an electron microscope original image of the conductive carbon black and obtain a binary image based on the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0;

[0108] The primary screening module 804 is used to traverse the pixels assigned a value of 0 in the binary image and obtain valid pixels that meet the preset rules;

[0109] The compensation module 806 is configured to perform a compensation operation on the binary image by traversing valid pixels and, for each valid pixel, assigning a value of 0 to the pixels assigned a value of 1 within a preset region corresponding to the valid pixel if the proportion of pixels assigned a value of 1 within the preset region corresponding to the valid pixel is less than a first threshold; bridging the adjacent main regions if the adjacent main regions meet a preset condition; wherein the preset region is a fixed-shape region including a preset number of pixels, and the preset region contains valid pixels corresponding to the preset region; and the main region is composed of continuous valid pixels; and

[0110] The parameter acquisition module 808 is used to extract lattice fringes and acquire fringe parameters of the lattice fringes according to the binarized image after the compensation operation.

[0111] The image processing module 802 is also used to crop the original electron microscope image, enhance the black and white contrast of the image and perform noise reduction processing based on the cropped original electron microscope image to obtain a first image; perform Fourier-inverse Fourier transform on the first image to obtain a second image; perform grayscale processing on the second image to obtain a third image; perform black and white contrast enhancement processing on the third image to obtain a fourth image; and perform binarization processing on the fourth image to obtain a binary image.

[0112] The initial screening module 804 is also used to traverse the pixel points assigned to 0 in the binary image. For each pixel point assigned to 0, if the number of pixel points assigned to 1 in the corresponding preset area is not greater than the second threshold, the pixel points assigned to 1 in the preset area are assigned to 0, and each pixel point in the preset area is marked as a valid pixel point.

[0113] The preset conditions in the compensation module 806 are that the number of interval pixel points between two adjacent main body areas is not greater than the third threshold; or there are island pixel points between two adjacent main body areas, and the number of interval pixel points between the two adjacent main body areas is not greater than the fourth threshold; the interval pixel points are two adjacent pixel points that are respectively located between the effective pixel points of the adjacent main body areas in the traversal order of the effective pixel points; and the island pixel points are two adjacent pixel points that are respectively located between the effective pixel points of the adjacent main body areas in the traversal order of the effective pixel points and are assigned a value of 0.

[0114] The compensation module 806 is also used to mark the pixel points in the preset area that were originally assigned to 1 and then assigned to 0 as valid pixel points after assigning the pixel points assigned to 1 to 0, and update the main area; and assign the pixel points between two adjacent main areas that were assigned to 1 to 0 and mark them as valid pixel points.

[0115] The compensation module 806 is further configured to iteratively perform compensation operations, update the lattice fringes after each iteration, and stop the iteration when the lattice fringes remain unchanged; and the parameter acquisition module 808 acquires the shape parameters of the lattice fringes based on the corresponding lattice fringes when the iteration stops.

[0116] Each module in the conductive carbon black lattice parameter extraction device can be implemented in whole or in part through software, hardware, or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in hardware form, or stored in a computer device memory in software form, so that the processor can call and execute the corresponding operations of each module.

[0117] In one embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be shown in Figure 9. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. The processor, the memory and the input / output interface are connected via a system bus, and the communication interface is connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile or volatile storage medium and an internal memory. The non-volatile or volatile storage medium stores an operating system, computer-readable instructions and a database. The internal memory provides an environment for the operation of the operating system and computer-readable instructions in the non-volatile or volatile storage medium. The database of the computer device is used to store federated learning data. The network interface of the computer device is used to communicate with an external terminal via a network connection. When the computer-readable instructions are executed by the processor, a method for extracting lattice parameters of conductive carbon black is implemented.

[0118] Those skilled in the art will understand that the structure shown in Figure 9 is merely a block diagram of a portion of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.

[0119] A computer device includes a memory and one or more processors, wherein the memory stores computer-readable instructions, and when the computer-readable instructions are executed by the processors, the one or more processors perform the following steps:

[0120] Obtaining an electron microscope original image of the conductive carbon black, and obtaining a binary image based on the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0;

[0121] Traverse the pixels assigned a value of 0 in the binary image and obtain valid pixels that meet the preset rules;

[0122] Performing a compensation operation on the binary image: traversing valid pixels, for each valid pixel, if the proportion of pixels assigned a value of 1 in a preset area corresponding to the valid pixel is less than a first threshold, assigning a value of 0 to the pixels assigned a value of 1 in the preset area; if adjacent main areas meet preset conditions, bridging the adjacent main areas; wherein the preset area is a fixed-shape area including a preset number of pixels, and the preset area contains valid pixels corresponding to the preset area; the main area is composed of continuous valid pixels; and

[0123] Lattice fringes are extracted from the binarized image after compensation and the shape parameters of the lattice fringes are obtained.

[0124] One or more computer-readable storage media storing computer-readable instructions, which, when executed by one or more processors, cause the one or more processors to perform the following steps:

[0125] Obtaining an electron microscope original image of the conductive carbon black, and obtaining a binary image based on the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0;

[0126] Traverse the pixels assigned a value of 0 in the binary image and obtain valid pixels that meet the preset rules;

[0127] Performing a compensation operation on the binary image: traversing valid pixels, for each valid pixel, if the proportion of pixels assigned a value of 1 in a preset area corresponding to the valid pixel is less than a first threshold, assigning a value of 0 to the pixels assigned a value of 1 in the preset area; if adjacent main areas meet preset conditions, bridging the adjacent main areas; wherein the preset area is a fixed-shape area including a preset number of pixels, and the preset area contains valid pixels corresponding to the preset area; the main area is composed of continuous valid pixels; and

[0128] Lattice fringes are extracted from the binarized image after compensation and the shape parameters of the lattice fringes are obtained.

[0129] A computer program product, comprising a computer program, which, when executed by a processor, implements the following steps:

[0130] Obtaining an electron microscope original image of the conductive carbon black, and obtaining a binary image based on the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0;

[0131] Traverse the pixels assigned a value of 0 in the binary image and obtain valid pixels that meet the preset rules;

[0132] Performing a compensation operation on the binary image: traversing valid pixels, for each valid pixel, if the proportion of pixels assigned a value of 1 in a preset area corresponding to the valid pixel is less than a first threshold, assigning a value of 0 to the pixels assigned a value of 1 in the preset area; if adjacent main areas meet preset conditions, bridging the adjacent main areas; wherein the preset area is a fixed-shape area including a preset number of pixels, and the preset area contains valid pixels corresponding to the preset area; the main area is composed of continuous valid pixels; and

[0133] Lattice fringes are extracted from the binarized image after compensation and the shape parameters of the lattice fringes are obtained.

[0134] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with the relevant laws, regulations and standards of relevant countries and regions.

[0135] Those skilled in the art will appreciate that all or part of the processes in the above-mentioned embodiment methods can be implemented by instructing the relevant hardware through computer-readable instructions. The computer-readable instructions can be stored in a non-volatile computer-readable storage medium. When the computer-readable instructions are executed, they can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application may include at least one of non-volatile and volatile memory. Non-volatile memory may include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory may include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in the various embodiments provided herein may include at least one of a relational database and a non-relational database. Non-relational databases may include, but are not limited to, distributed databases based on blockchains. The processor involved in the various embodiments provided herein may be, but are not limited to, a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic unit, a data processing logic unit based on quantum computing, and the like.

[0136] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0137] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. A method for extracting lattice parameters of conductive carbon black, comprising: Acquire an original electron microscope image of the conductive carbon black, and acquire a binary image according to the original electron microscope image; Each pixel in the binary image is assigned a value of 1 or 0; Traversing the pixel points assigned a value of 0 in the binary image to obtain valid pixel points that meet a preset rule; Performing a compensation operation on the binary image: traversing the valid pixel points, for each valid pixel point, if the proportion of the pixel points assigned a value of 1 in the preset area corresponding to the valid pixel point is less than a first threshold, assigning a value of 0 to the pixel points assigned a value of 1 in the preset area; if the adjacent main area meets the preset condition, bridging the adjacent main area; wherein the preset area is a fixed shape area including a preset number of the pixel points, and the preset area contains the valid pixel points corresponding to the preset area; the main area is composed of continuous valid pixel points; and Lattice fringes are extracted according to the binarized image after the compensation operation and shape parameters of the lattice fringes are obtained.

2. The method according to claim 1, wherein: The step of obtaining a binary image according to the electron microscope original image comprises: The electron microscope original image is cropped, and based on the cropped electron microscope original image, image black and white contrast enhancement and noise reduction processing are performed to obtain a first image; Performing Fourier-inverse Fourier transform on the first image to obtain a second image; Performing grayscale processing on the second image to obtain a third image; Performing image black-and-white contrast enhancement processing on the third image to obtain a fourth image; and The fourth image is binarized to obtain the binarized image.

3. The method according to claim 1, wherein: The traversing the pixel points assigned a value of 0 in the binary image to obtain valid pixel points that meet a preset rule comprises: The pixel points assigned a value of 0 in the binary image are traversed. For each pixel point assigned a value of 0, if the number of the pixel points assigned a value of 1 in the corresponding preset area is not greater than a second threshold, the pixel points assigned a value of 1 in the preset area are assigned a value of 0, and each pixel point in the preset area is marked as the valid pixel point.

4. The method according to claim 1, wherein: The preset condition is that the number of interval pixels between two adjacent main areas is not greater than a third threshold; or there are island pixels between two adjacent main areas, and the number of interval pixels between two adjacent main areas is not greater than a fourth threshold; the interval pixels are two adjacent pixels located respectively between the valid pixels of the adjacent main areas in the traversal order of the valid pixels; and the island pixels are two adjacent pixels assigned a value of 0 located respectively between the valid pixels of the adjacent main areas in the traversal order of the valid pixels.

5. The method according to claim 1, wherein: After assigning a value of 0 to the pixel points assigned a value of 1 in the preset area, the method further includes: Mark the pixel points in the preset area that were originally assigned a value of 1 and then assigned a value of 0 as the valid pixel points, and update the main area; The bridging of adjacent main body areas comprises: and The pixel points assigned a value of 1 between two adjacent main regions are assigned a value of 0 and are marked as valid pixel points.

6. The method according to any one of claims 1 to 5, wherein: The method further comprises: Iteratively perform the compensation operation, update the lattice fringes after each iteration, and stop the iteration when the lattice fringes remain unchanged; and obtain the shape parameters of the lattice fringes based on the lattice fringes corresponding to the lattice fringes when the iteration stops.

7. A conductive carbon black lattice parameter extraction device, characterized in that: The device comprises: An image processing module is used to obtain an electron microscope original image of the conductive carbon black, and obtain a binary image according to the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0; A primary screening module, used for traversing the pixel points assigned with a value of 0 in the binary image to obtain valid pixel points; A compensation module is used to perform a compensation operation on the binary image: traverse the valid pixel points, and for each valid pixel point, if the proportion of the pixel points assigned a value of 1 in the preset area corresponding to the valid pixel point is less than a first threshold, then the pixel points assigned a value of 1 in the preset area are assigned a value of 0; if the adjacent main area meets the preset condition, then the adjacent main area is bridged; wherein the preset area is a fixed shape area including a preset number of the pixel points, and the preset area contains the valid pixel points corresponding to the preset area; the main area is composed of continuous valid pixel points; The parameter acquisition module is used to extract lattice fringes according to the binary image after the compensation operation and obtain shape parameters of the lattice fringes.

8. The device according to claim 1, wherein: The image processing module is also used to crop the electron microscope original image, enhance the image black and white contrast and reduce noise based on the cropped electron microscope original image to obtain a first image; and perform Fourier-inverse Fourier transform on the first image to obtain a second image; grayscale the second image to obtain a third image; Performing image black-and-white contrast enhancement processing on the third image to obtain a fourth image; And performing binarization processing on the fourth image to obtain a binarized image.

9. The device according to claim 1, wherein: The initial screening module is also used to traverse the pixel points assigned to 0 in the binary image. For each pixel point assigned to 0, if the number of pixel points assigned to 1 in the corresponding preset area is not greater than the second threshold, the pixel points assigned to 1 in the preset area are assigned to 0, and each pixel point in the preset area is marked as a valid pixel point.

10. The device according to claim 1, wherein: The preset conditions in the compensation module are that the number of interval pixels between two adjacent main areas is not greater than a third threshold; or there are island pixels between two adjacent main areas, and the number of interval pixels between two adjacent main areas is not greater than a fourth threshold; the interval pixels are two adjacent pixels located between the valid pixels of the adjacent main areas in the traversal order of the valid pixels; and the island pixels are two adjacent pixels with a value of 0 located between the valid pixels of the adjacent main areas in the traversal order of the valid pixels.

11. The device according to claim 1, wherein: The compensation module is also used to mark the pixels in the preset area that were originally assigned to 1 and then assigned to 0 as valid pixels after assigning the pixels assigned to 1 to 0, and update the main area; and assign the pixels between two adjacent main areas that were assigned to 1 to 0 and mark them as valid pixels.

12. The device according to any one of claims 7 to 11, wherein: The compensation module is also used to iteratively perform compensation operations, update the lattice fringes after each iteration, and stop the iteration when the lattice fringes remain unchanged; and the parameter acquisition module 808 acquires the shape parameters of the lattice fringes based on the corresponding lattice fringes when the iteration stops.

13. A computer device comprising a memory and one or more processors, wherein the memory stores computer-readable instructions, and when the computer-readable instructions are executed by the one or more processors, the one or more processors perform the following steps: Acquire an electron microscope original image of the conductive carbon black, and acquire a binary image according to the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0; Traversing the pixel points assigned a value of 0 in the binary image to obtain valid pixel points that meet a preset rule; Performing a compensation operation on the binary image: traversing the valid pixel points, for each valid pixel point, if the proportion of the pixel points assigned a value of 1 in the preset area corresponding to the valid pixel point is less than a first threshold, assigning a value of 0 to the pixel points assigned a value of 1 in the preset area; if the adjacent main area meets the preset condition, bridging the adjacent main area; wherein the preset area is a fixed shape area including a preset number of the pixel points, and the preset area contains the valid pixel points corresponding to the preset area; the main area is composed of continuous valid pixel points; and Lattice fringes are extracted according to the binarized image after the compensation operation and shape parameters of the lattice fringes are obtained.

14. The computer device of claim 13, wherein: The step of obtaining a binary image according to the electron microscope original image comprises: The electron microscope original image is cropped, and based on the cropped electron microscope original image, image black and white contrast enhancement and noise reduction processing are performed to obtain a first image; Performing Fourier-inverse Fourier transform on the first image to obtain a second image; Performing grayscale processing on the second image to obtain a third image; Performing image black-and-white contrast enhancement processing on the third image to obtain a fourth image; and The fourth image is binarized to obtain the binarized image.

15. The computer device of claim 13, wherein: The traversing the pixel points assigned a value of 0 in the binary image to obtain valid pixel points that meet a preset rule comprises: The pixel points assigned a value of 0 in the binary image are traversed. For each pixel point assigned a value of 0, if the number of the pixel points assigned a value of 1 in the corresponding preset area is not greater than a second threshold, the pixel points assigned a value of 1 in the preset area are assigned a value of 0, and each pixel point in the preset area is marked as the valid pixel point.

16. The computer device of claim 13, wherein: The preset condition is that the number of interval pixels between two adjacent main areas is not greater than a third threshold; or there are island pixels between two adjacent main areas, and the number of interval pixels between two adjacent main areas is not greater than a fourth threshold; the interval pixels are two adjacent pixels located respectively between the valid pixels of the adjacent main areas in the traversal order of the valid pixels; and the island pixels are two adjacent pixels assigned a value of 0 located respectively between the valid pixels of the adjacent main areas in the traversal order of the valid pixels.

17. The computer device of claim 13, wherein: After assigning a value of 0 to the pixel points assigned a value of 1 in the preset area, the method further includes: Mark the pixel points in the preset area that were originally assigned a value of 1 and then assigned a value of 0 as the valid pixel points, and update the main area; The bridging of adjacent main body areas comprises: and The pixel points assigned a value of 1 between two adjacent main regions are assigned a value of 0 and are marked as valid pixel points.

18. The computer device according to any one of claims 13 to 17, wherein: The computer device also performs: Iteratively perform the compensation operation, update the lattice fringes after each iteration, and stop the iteration when the lattice fringes remain unchanged; and obtain the shape parameters of the lattice fringes based on the lattice fringes corresponding to the lattice fringes when the iteration stops.

19. One or more computer-readable storage media storing computer-readable instructions, which, when executed by one or more processors, cause the one or more processors to perform the following steps: Acquire an electron microscope original image of the conductive carbon black, and acquire a binary image according to the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0; Traversing the pixel points assigned a value of 0 in the binary image to obtain valid pixel points that meet a preset rule; Performing a compensation operation on the binary image: traversing the valid pixel points, for each valid pixel point, if the proportion of the pixel points assigned a value of 1 in the preset area corresponding to the valid pixel point is less than a first threshold, assigning a value of 0 to the pixel points assigned a value of 1 in the preset area; if the adjacent main area meets the preset condition, bridging the adjacent main area; wherein the preset area is a fixed shape area including a preset number of the pixel points, and the preset area contains the valid pixel points corresponding to the preset area; the main area is composed of continuous valid pixel points; and Lattice fringes are extracted according to the binarized image after the compensation operation and shape parameters of the lattice fringes are obtained.

20. The computer device of claim 19, wherein: The step of obtaining a binary image according to the electron microscope original image comprises: The electron microscope original image is cropped, and based on the cropped electron microscope original image, image black and white contrast enhancement and noise reduction processing are performed to obtain a first image; Performing Fourier-inverse Fourier transform on the first image to obtain a second image; Performing grayscale processing on the second image to obtain a third image; Performing image black-and-white contrast enhancement processing on the third image to obtain a fourth image; and The fourth image is binarized to obtain the binarized image.

21. The computer device of claim 19, wherein: The traversing the pixel points assigned a value of 0 in the binary image to obtain valid pixel points that meet a preset rule comprises: The pixel points assigned a value of 0 in the binary image are traversed. For each pixel point assigned a value of 0, if the number of the pixel points assigned a value of 1 in the corresponding preset area is not greater than a second threshold, the pixel points assigned a value of 1 in the preset area are assigned a value of 0, and each pixel point in the preset area is marked as the valid pixel point.

22. The computer device of claim 19, wherein: The preset condition is that the number of interval pixels between two adjacent main areas is not greater than a third threshold; or there are island pixels between two adjacent main areas, and the number of interval pixels between two adjacent main areas is not greater than a fourth threshold; the interval pixels are two adjacent pixels located respectively between the valid pixels of the adjacent main areas in the traversal order of the valid pixels; and the island pixels are two adjacent pixels assigned a value of 0 located respectively between the valid pixels of the adjacent main areas in the traversal order of the valid pixels.

23. The computer device of claim 19, wherein: After assigning a value of 0 to the pixel points assigned a value of 1 in the preset area, the method further includes: Mark the pixel points in the preset area that were originally assigned a value of 1 and then assigned a value of 0 as the valid pixel points, and update the main area; The bridging of adjacent main body areas comprises: and The pixel points assigned a value of 1 between two adjacent main regions are assigned a value of 0 and are marked as valid pixel points.

24. A computer device according to any one of claims 19 to 24, wherein: The computer readable instructions further perform: Iteratively perform the compensation operation, update the lattice fringes after each iteration, and stop the iteration when the lattice fringes remain unchanged; and obtain the shape parameters of the lattice fringes based on the lattice fringes corresponding to the lattice fringes when the iteration stops.

25. A computer program product comprising a computer program, wherein: When the computer program is executed by a processor, the following steps are implemented: Acquire an electron microscope original image of the conductive carbon black, and acquire a binary image according to the electron microscope original image; each pixel in the binary image is assigned a value of 1 or 0; Traversing the pixel points assigned a value of 0 in the binary image to obtain valid pixel points that meet a preset rule; Performing a compensation operation on the binary image: traversing the valid pixel points, for each valid pixel point, if the proportion of the pixel points assigned a value of 1 in the preset area corresponding to the valid pixel point is less than a first threshold, assigning a value of 0 to the pixel points assigned a value of 1 in the preset area; if the adjacent main area meets the preset condition, bridging the adjacent main area; wherein the preset area is a fixed shape area including a preset number of the pixel points, and the preset area contains the valid pixel points corresponding to the preset area; the main area is composed of continuous valid pixel points; and Lattice fringes are extracted according to the binarized image after the compensation operation and shape parameters of the lattice fringes are obtained.

26. A computer program according to claim 25, wherein: The step of obtaining a binary image according to the electron microscope original image comprises: The electron microscope original image is cropped, and based on the cropped electron microscope original image, image black and white contrast enhancement and noise reduction processing are performed to obtain a first image; Performing Fourier-inverse Fourier transform on the first image to obtain a second image; Performing grayscale processing on the second image to obtain a third image; Performing image black-and-white contrast enhancement processing on the third image to obtain a fourth image; and The fourth image is binarized to obtain the binarized image.

27. A computer program according to claim 25, wherein: The traversing the pixel points assigned a value of 0 in the binary image to obtain valid pixel points that meet a preset rule comprises: The pixel points assigned a value of 0 in the binary image are traversed. For each pixel point assigned a value of 0, if the number of the pixel points assigned a value of 1 in the corresponding preset area is not greater than a second threshold, the pixel points assigned a value of 1 in the preset area are assigned a value of 0, and each pixel point in the preset area is marked as the valid pixel point.

28. The computer program of claim 25, wherein: The preset condition is that the number of interval pixels between two adjacent main areas is not greater than a third threshold; or there are island pixels between two adjacent main areas, and the number of interval pixels between two adjacent main areas is not greater than a fourth threshold; the interval pixels are two adjacent pixels located respectively between the valid pixels of the adjacent main areas in the traversal order of the valid pixels; and the island pixels are two adjacent pixels assigned a value of 0 located respectively between the valid pixels of the adjacent main areas in the traversal order of the valid pixels.

29. The computer program of claim 25, wherein: After assigning a value of 0 to the pixel points assigned a value of 1 in the preset area, the method further includes: Mark the pixel points in the preset area that were originally assigned a value of 1 and then assigned a value of 0 as the valid pixel points, and update the main area; The bridging of adjacent main body areas comprises: and The pixel points assigned a value of 1 between two adjacent main regions are assigned a value of 0 and are marked as valid pixel points.

30. A computer program according to any one of claims 25 to 29, wherein: The computer readable instructions further perform: Iteratively perform the compensation operation, update the lattice fringes after each iteration, and stop the iteration when the lattice fringes remain unchanged; and obtain the shape parameters of the lattice fringes based on the lattice fringes corresponding to the lattice fringes when the iteration stops.

Images