Deformation measurement method and measurement device

Abstract

A deformation measurement method and a measurement device. The method comprises: when an antenna feeder is located at a first position, acquiring first carrier phases of a plurality of reference points and a first carrier phase of a point to be measured; when the antenna feeder is located at a second position, acquiring second carrier phases of the plurality of reference points and a second carrier phase of the point to be measured; determining antenna feeder sway displacement on the basis of position information of the plurality of reference points, the first carrier phases of the plurality of reference points, and the second carrier phases of the plurality of reference points; on the basis of the antenna feeder sway displacement and position information of the point to be measured, determining an antenna feeder sway phase of the point to be measured; and on the basis of the first carrier phase of the point to be measured, the second carrier phase of the point to be measured, and the antenna feeder sway phase of the point to be measured, determining a deformation phase of the point to be measured. The deformation measurement method can improve the accuracy of deformation measurement.

Description

A deformation measurement method and detection device

[0001] This application claims priority to Chinese Patent Application No. 202411605314.4, filed on November 11, 2024, entitled "A Deformation Measurement Method and Detection Device", the entire contents of which are incorporated herein by reference. Technical Field

[0002] This application relates to the field of deformation measurement technology, and more specifically, to a deformation measurement method and a detection device. Background Technology

[0003] Currently, integrated inductive and sensor base stations can be used for deformation measurement. However, these base stations commonly suffer from antenna sway, which severely affects the accuracy of deformation measurements. To address this issue, an IMU (inertial measurement unit) sensor can be used to measure the antenna sway displacement, thereby calibrating the antenna sway. However, due to the limited measurement accuracy of IMU sensors, sub-millimeter level accuracy requirements cannot be met. Alternatively, a camera placed on a deformation measurement platform can be used to acquire image data, thereby calibrating the platform's sway displacement. However, since camera image data acquisition requires high meteorological conditions, it also cannot meet the required measurement accuracy under adverse conditions.

[0004] Therefore, how to calibrate antenna sway to improve the accuracy of deformation measurement in integrated sensing base stations has become an urgent problem to be solved. Summary of the Invention

[0005] This application provides a deformation measurement method and a detection device. Furthermore, the method can be understood as an optimized deformation measurement method, which can estimate and compensate for the sway amplitude of the detection device during deformation measurement, thereby improving the accuracy of deformation measurement.

[0006] In a first aspect, a method for measuring deformation is provided, which can be applied to a detection device, which may be a detection equipment, or the detection device may be a unit / module / component (e.g., a chip or chip system or logic circuit or software) configured in (or used for) the detection equipment.

[0007] Among them, the detection equipment is, for example, a sensor-integrated base station or a radar installed on a tower or pole that can transmit electromagnetic wave signals. The following description takes a sensor-integrated base station (referred to as a base station) as an example.

[0008] The method includes: when the antenna feeder is in a first position, obtaining the first carrier phase of multiple reference points based on the position information of multiple reference points, and obtaining the first carrier phase of the test point based on the position information of the test point; when the antenna feeder is in a second position, obtaining the second carrier phase of multiple reference points based on the position information of multiple reference points, and obtaining the second carrier phase of the test point based on the position information of the test point; determining the displacement between the first position and the second position (i.e., antenna feeder sway displacement) based on the position information of multiple reference points, the first carrier phase of multiple reference points, and the second carrier phase of multiple reference points; determining the antenna feeder sway phase of the test point based on the displacement between the first position and the second position, and the position information of the test point, wherein the antenna feeder sway phase of the test point refers to the phase change caused by the antenna feeder moving from the first position to the second position; and determining the phase change of the test point due to deformation based on the first carrier phase of the test point, the second carrier phase of the test point, and the antenna feeder sway phase of the test point.

[0009] Optionally, the method further includes: determining the first position of the antenna feeder, multiple reference points, and the position information of the point to be measured.

[0010] The first position of the antenna feeder refers to the position of the antenna feeder when the base station acquires the first carrier phase of multiple reference points and the first carrier phase of the point to be measured.

[0011] Among these, multiple reference points are points whose absolute positions remain unchanged (or, in other words, points whose absolute positions are fixed). This allows us to use the position information of the reference points to determine whether the antenna feeder is shaking. It should be understood that the position information of the reference points remains unchanged relative to the object being measured (e.g., the antenna feeder). When the same reference points are used to measure different objects, the position information of the reference points can change depending on the object being measured.

[0012] Based on the above scheme, since multiple reference points are all points with unchanging absolute positions, the base station can determine the antenna feed sway displacement based on the carrier phase obtained by measuring multiple reference points twice and the position information of multiple reference points. It can also determine the antenna feed sway phase of the test point based on the antenna feed sway displacement and the position information of the test point, thereby achieving antenna feed sway calibration and improving the accuracy of deformation measurement by the base station.

[0013] In conjunction with the first aspect, in some implementations of the first aspect, regarding the method for determining the position information of the first position of the antenna feeder, the method further includes: the position information of the first position of the antenna feeder is the position information of the initial position of the antenna feeder, where the initial position of the antenna feeder refers to the position of the antenna feeder when it does not shake.

[0014] Based on the above scheme, when the base station cannot determine the location information of the first position of the antenna feeder, the location information of the initial position of the antenna feeder is used as the location information of the first position of the antenna feeder for subsequent measurements. This improves the accuracy of the base station in deformation measurement while reducing the complexity of the deformation measurement scheme.

[0015] In conjunction with the first aspect, in some implementations of the first aspect, for the deployment of multiple reference points, the method further includes: at least two of the multiple reference points are deployed on both sides of the point to be measured (or, at least two of the multiple reference points are deployed in different directions of the point to be measured).

[0016] Based on the above scheme, if the deployment of multiple reference points meets the above requirements, the antenna sway displacement determined by the location information of multiple reference points will be more accurate, thereby improving the accuracy of the base station in deformation measurement.

[0017] In conjunction with the first aspect, in some implementations of the first aspect, depending on the type of reference point, the method further includes: the reference point being an artificial reference point; or, the reference point being a natural reference point.

[0018] Based on the above scheme, the reference point can be a reference point existing in nature, or it can be a reference point deployed artificially. This increases the flexibility of the deformation measurement scheme, allowing it to be applied to various scenarios with different conditions. For example, in some scenarios, the deployment of artificial reference points is difficult, so some natural reference points can be selected to implement the scheme proposed in this application.

[0019] In conjunction with the first aspect, in some implementations of the first aspect, the method for obtaining the location information of the reference points includes: sending signals to multiple reference points, determining the location information of the multiple reference points based on the measurement results of the signals and the location information of the first position of the antenna feeder; or, the base station directly obtains the location information of the multiple reference points from the stored data.

[0020] Based on the above scheme, the base station can determine the location information of the reference point through signal measurement, or it can directly obtain the location information of the reference point from existing data. For example, while manually deploying reference points, the location information of these manually deployed reference points can be recorded and stored for the base station to access at any time. This method increases the flexibility of the deformation measurement scheme.

[0021] In conjunction with the first aspect, in some implementations of the first aspect, the method for obtaining the location information of the point to be tested includes: the base station obtaining the location information of the point to be tested from stored data.

[0022] Secondly, a method for measuring deformation is provided, which can be applied to a detection device, which can be a detection equipment, or the detection device can be a unit / module / component (e.g., a chip or chip system or logic circuit or software) configured in (or used for) the detection equipment.

[0023] Among them, the detection equipment is, for example, a sensor-integrated base station or a radar installed on a tower or pole that can transmit electromagnetic wave signals. The following description takes a sensor-integrated base station (referred to as a base station) as an example.

[0024] The method includes: when the antenna feeder is in a first position, obtaining a first carrier phase of the reference point based on the position information of the reference point, and obtaining a first carrier phase of the test point based on the position information of the test point, wherein the deployment of the reference point satisfies a first condition; when the antenna feeder is in a second position, obtaining a second carrier phase of the reference point based on the position information of the reference point, and obtaining a second carrier phase of the test point based on the position information of the test point; determining the antenna feeder wobbling phase of the test point based on the first carrier phase and the second carrier phase of the reference point, wherein the antenna feeder wobbling phase of the test point refers to the phase change caused by the antenna feeder moving from the first position to the second position; and determining the phase change of the test point due to deformation based on the first carrier phase, the second carrier phase, and the antenna feeder wobbling phase of the test point.

[0025] Optionally, the method further includes: determining the first position of the antenna feeder, the reference point, and the position information of the point to be measured.

[0026] The first position of the antenna feeder refers to the position of the antenna feeder when the base station acquires the first carrier phase of multiple reference points and the first carrier phase of the point to be measured.

[0027] Among these, multiple reference points are points whose absolute positions remain unchanged (or, in other words, points whose absolute positions are fixed). This allows us to use the position information of the reference points to determine whether the antenna feeder is shaking. It should be understood that the position information of the reference points remains unchanged relative to the object being measured (e.g., the antenna feeder). When the same reference points are used to measure different objects, the position information of the reference points can change depending on the object being measured.

[0028] Based on the above scheme, since the reference point is a point with an absolute fixed position and the deployment of the reference point satisfies the first condition, the base station can determine the antenna feed wobbling phase of the point to be measured based on the carrier phase obtained by measuring the reference point twice, thereby realizing the calibration of the antenna feed wobbling and improving the accuracy of the base station in deformation measurement.

[0029] In conjunction with the second aspect, in some implementations of the second aspect, regarding the method for determining the position information of the first position of the antenna feeder, the method further includes: the position information of the first position of the antenna feeder is the position information of the initial position of the antenna feeder, where the initial position of the antenna feeder refers to the position of the antenna feeder when it does not shake.

[0030] Based on the above scheme, when the base station cannot determine the location information of the first position of the antenna feeder, the location information of the initial position of the antenna feeder is used as the location information of the first position of the antenna feeder for subsequent measurements. This improves the accuracy of the base station in deformation measurement while reducing the complexity of the deformation measurement scheme.

[0031] In conjunction with the second aspect, in some implementations of the second aspect, the method further includes, in relation to the first condition, the difference between the horizontal angle of the reference point relative to the antenna feed and the horizontal angle of the point to be measured relative to the antenna feed is less than a first threshold, and the difference between the pitch angle of the reference point relative to the antenna feed and the pitch angle of the point to be measured relative to the antenna feed is less than a second threshold.

[0032] Based on the above scheme, if the deployment of the reference point meets the first condition, the phase change caused by the antenna sway is the same or similar to that of the reference point and the point to be measured. In this way, the measurement scheme of calibrating the antenna sway using a single reference point can be realized, thereby reducing the complexity of the deformation measurement scheme.

[0033] In conjunction with the second aspect, in some implementations of the second aspect, depending on the type of reference point, the method further includes: the reference point being an artificial reference point; or, the reference point being a natural reference point.

[0034] Based on the above scheme, the reference point can be a reference point existing in nature, or it can be a reference point deployed artificially. This increases the flexibility of the deformation measurement scheme, allowing it to be applied to various scenarios with different conditions. For example, in some scenarios, the deployment of artificial reference points is difficult, so some natural reference points can be selected to implement the scheme proposed in this application.

[0035] In conjunction with the second aspect, in some implementations of the second aspect, regarding the method for obtaining the location information of the reference point, the method further includes: sending a signal to the reference point, determining the location information of the reference point based on the measurement results of the signal and the location information of the first position of the antenna feeder; or, the base station directly obtains the location information of the reference point from the stored data.

[0036] Based on the above scheme, the base station can determine the location information of the reference point through signal measurement, or it can directly obtain the location information of the reference point from existing data. For example, while manually deploying reference points, the location information of these manually deployed reference points can be recorded and stored for the base station to access at any time. This method increases the flexibility of the deformation measurement scheme.

[0037] In conjunction with the second aspect, in some implementations of the second aspect, regarding the method for obtaining the location information of the point to be tested, the method includes: the base station obtaining the location information of the point to be tested from stored data.

[0038] Thirdly, a detection apparatus is provided for performing the method provided in either the first or second aspect. Specifically, the apparatus may include units and / or modules for performing the method provided in any of the above-described implementations of the first or second aspect, such as processing units and / or communication units.

[0039] In one implementation, the device is a detection device. When the device is a detection device, the communication unit can be a transceiver, or an input / output interface; the processing unit can be at least one processor. Optionally, the transceiver can be a transceiver circuit. Optionally, the input / output interface can be an input / output circuit.

[0040] In another implementation, the device is a chip, chip system, or circuit configured in (or used for) a testing device. When the device is a chip, chip system, or circuit used in a testing device, the communication unit may be an input / output interface, interface circuit, output circuit, input circuit, pin, or related circuit on the chip, chip system, or circuit; the processing unit may be at least one processor, processing circuit, or logic circuit.

[0041] Among them, the detection equipment is, for example, a sensor-integrated base station or a radar installed on a tower or pole that can transmit electromagnetic wave signals.

[0042] Fourthly, a detection apparatus is provided, the apparatus comprising: a memory for storing a program; and at least one processor for executing the computer program or instructions stored in the memory to perform the method provided by any of the above implementations of the first or second aspect.

[0043] The detection device may be a detection equipment, or it may be a unit / module / component (e.g., a chip, chip system, logic circuit, or software) configured in (or used for) the detection equipment.

[0044] Among them, the detection equipment is, for example, a sensor-integrated base station or a radar installed on a tower or pole that can transmit electromagnetic wave signals.

[0045] Fifthly, this application provides a processor for performing the methods provided in the above aspects.

[0046] Unless otherwise specified, or if it does not contradict its actual function or internal logic in the relevant description, the transmission and acquisition / reception operations involved in the processor can be understood as processor output and input operations, or as transmission and reception operations performed by radio frequency circuits and antennas. This application does not limit them in this regard.

[0047] In a sixth aspect, a computer-readable storage medium is provided for program code executed by a device, the program code including a method for performing any of the above-described implementations of the first or second aspect.

[0048] In a seventh aspect, a computer program product comprising instructions is provided, which, when executed by a processor on a computer, causes the computer to perform the method provided by any of the above-described implementations of the first or second aspect.

[0049] Eighthly, a chip is provided, the chip including a processor and a communication interface, the processor reading instructions stored in a memory through the communication interface and executing the method provided by any of the above implementations of the first or second aspect.

[0050] Optionally, as one implementation, the chip also includes a memory storing computer programs or instructions. The processor is used to execute the computer programs or instructions stored in the memory. When the computer programs or instructions are executed, the processor is used to execute the method provided by any of the above implementations of the first or second aspect.

[0051] The beneficial effects of aspects three through eight and their possible implementations can be found in the descriptions of aspects one and two, and will not be repeated here. Attached Figure Description

[0052] Figure 1 is a schematic diagram of the basic principle of measuring deformation using carrier phase.

[0053] Figure 2 is a schematic diagram of the structure of a micro-deformation measurement system 200 provided in an embodiment of this application.

[0054] Figure 3 is a schematic diagram of the deployment method of the reference point provided in the embodiment of this application.

[0055] Figure 4 is a schematic diagram of a micro-deformation measurement scenario provided in an embodiment of this application.

[0056] Figure 5 is a flowchart of the micro-deformation measurement scheme 500 provided in an embodiment of this application.

[0057] Figure 6 is a schematic diagram of another micro-deformation measurement scenario provided in an embodiment of this application.

[0058] Figure 7 is a schematic diagram of the micro-deformation measurement scheme 700 provided in an embodiment of this application.

[0059] Figure 8 is a schematic block diagram of a detection device 800 provided in an embodiment of this application.

[0060] Figure 9 is a schematic diagram of another detection device 900 provided in an embodiment of this application.

[0061] Figure 10 is a schematic block diagram of a chip system 1000 provided in an embodiment of this application. Detailed Implementation

[0062] The technical solutions in this application will now be described with reference to the accompanying drawings.

[0063] Before introducing the scheme of this application, the following points should be noted.

[0064] (1) In this application, the expression " / " is used to indicate that the objects before and after are in an "or" relationship; for example, A / B can mean: A or B. The expression "and / or" is used to indicate that the objects before and after are in a relationship of either "and" or "or"; for example, A and / or B can mean the following: A exists alone, B exists alone, A and B exist simultaneously, where A and B can be single or multiple. "At least one of the following" or similar expressions are used to indicate any combination of the listed items; for example, at least one of A, B and / or C can mean the following: A exists alone, B exists alone, C exists alone, A and B exist simultaneously, B and C exist simultaneously, A and C exist simultaneously, A, B and C exist simultaneously, where A, B, and C can be single or multiple.

[0065] (2) In this application, "send" and "receive" indicate the direction of signal transmission. For example, "send information to XX" can be understood as the destination of the information being XX, which may include direct transmission via the air interface or indirect transmission via the air interface by other units or modules. "Receive information from YY" can be understood as the source of the information being YY, which may include direct reception from YY via the air interface or indirect reception from YY via the air interface by other units or modules. "Send" can also be understood as the "output" of the chip interface, and "receive" can also be understood as the "input" of the chip interface. In other words, sending and receiving can occur between devices, such as between network devices and terminal devices, or within a device, such as between components, modules, chips, software modules, or hardware modules within the device via a bus, wiring, or interface.

[0066] (3) In the various embodiments of this application, unless otherwise specified or logically conflicting, the terms and / or descriptions of different embodiments are consistent and can be referenced by each other. The technical features of different embodiments can be combined to form new embodiments according to their inherent logical relationship.

[0067] (4) In this application, "first," "second," and "#1," "#2," and "#A" are merely for descriptive convenience and are used to distinguish objects, and are not intended to limit the scope of the embodiments of this application. They are not used to describe the order or sequence of features. It should be understood that such described objects can be interchanged where appropriate so as to describe solutions other than those in the embodiments of this application.

[0068] (5) In this application, the words “exemplary,” “for example,” etc., are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as an “example” in this application should not be construed as being more preferred or advantageous than other embodiments or designs. Rather, the term “example” is used to present concepts in a specific manner.

[0069] (6) In this application, “of”, “corresponding, relevant”, “corresponding”, and “related” can sometimes be used interchangeably. It should be noted that when the distinction is not emphasized, they have the same meaning.

[0070] (7) In this application, “when…”, “if” and “if” all refer to the device making a corresponding processing under certain objective circumstances, and are not limited to a time, nor do they require the device to make a judgment when it is implemented, nor do they mean that there are other limitations.

[0071] (8) In this application, the term "base station" is mentioned multiple times. It should be understood that the term "base station" in this application can broadly cover or be replaced by various names such as: NodeB, evolved NodeB (eNB), next-generation NodeB (gNB), relay station, access point, transmitting and receiving point (TRP), transmitter point, master station, auxiliary station, motor slide retainer (MSR) node, home base station, network controller, access node, wireless node, access point (AP), transmission node, transceiver node, baseband unit (BBU), remote radio unit (RRU), active antenna unit (AAU), remote radio head (RRH), central unit (CU), distributed unit (DU), positioning node, etc. A base station can be a macro base station, micro base station, relay node, donor node, or the like, or a combination thereof. A base station can also refer to a module, modem, or chip installed within the aforementioned equipment or device. A base station can also be a mobile switching center, equipment that performs base station functions in D2D, V2X, and M2M communications, and equipment that performs base station functions in future communication systems.

[0072] The purpose of deformation measurement is to monitor the degree of deformation of the object being measured, such as bridges, buildings, slopes, and mines. To achieve sub-millimeter accuracy, a sensor-integrated base station can be used for deformation measurement. However, sensor-integrated base stations generally suffer from antenna sway, which severely affects the accuracy of deformation measurement. Therefore, this application proposes a scheme to calibrate the antenna sway of the base station to improve the accuracy of deformation measurement using a sensor-integrated base station.

[0073] The method provided in this application embodiment utilizes the basic principle of carrier phase measurement of deformation to perform micro-deformation measurement on the object to be measured. The basic principle of carrier phase measurement of deformation is briefly introduced below.

[0074] Figure 1 is a schematic diagram of the basic principle of measuring deformation using carrier phase.

[0075] As shown in Figure 1, the base station first performs a first measurement on the object to be measured to obtain the carrier phase of the object to be measured. Then, the base station performs a second measurement on the object to be measured to obtain the carrier phase of the object to be measured. When the object to be measured undergoes deformation, the magnitude of the deformation (or, the distance change / displacement caused by the deformation of the object to be measured) can be calculated based on the phase change between the two measurements, which specifically satisfies formula (1).

[0076] Where d represents the change in distance / displacement caused by the deformation of the object being measured, and λ represents the wavelength. Characterizes the carrier phase acquired by the base station during the first measurement of the object to be measured. It characterizes the carrier phase obtained by the base station when performing a second measurement on the object to be measured.

[0077] Figure 2 is a schematic diagram of a micro-deformation measurement system 200 provided in an embodiment of this application. As shown in Figure 2, the micro-deformation measurement system includes a base station 201, an object to be measured 202 (e.g., a bridge, building, slope, mine, etc.), and one or more reference points (or reference points, such as reference point #1, reference point #2, and reference point #3).

[0078] Among them, base station 201 is a sensing and communication integrated base station (e.g., a 5G-A sensing and communication integrated base station). In the following description, the sensing and communication integrated base station will be referred to as a base station.

[0079] The object to be measured is described below.

[0080] The object to be measured includes the points to be measured, which are used to characterize the degree of deformation of the object to be measured.

[0081] In one possible implementation, the point to be measured is a deformation target. For example, if the object to be measured is a bridge, in order to observe the downward deformation of the bridge, a deformation target is deployed on the bridge (e.g., deployed on the side of the bridge). As the bridge vibrates up and down, the deformation target will deform.

[0082] The following introduces reference points.

[0083] A reference point is a point whose absolute position remains unchanged under ideal conditions, or a point that does not move relative to the ground. In other words, the reference point will not shake due to external vibrations, geological settlement of the installation base, or other factors.

[0084] Optionally, the reference point can be an artificial reference point; or, the reference point can be a natural reference point.

[0085] Among them, artificial reference points refer to reference points that are manually deployed, such as deploying artificial reference points on the object to be measured.

[0086] For example, if the object to be measured is a bridge, since the bridge piers are more stable than the abutments, spans and decks, artificial reference points can be deployed on the piers.

[0087] Natural reference points refer to reference points that exist in nature, such as buildings or rocks.

[0088] The embodiments of this application do not limit the selection criteria for the natural reference point. In one possible implementation, the natural reference point is selected based on amplitude deviation and phase stability.

[0089] This application does not limit the number of reference points included in the micro-deformation measurement system 200, nor the deployment method of the reference points in the micro-deformation measurement system 200. Several possible deployment methods are given below.

[0090] (1) Deployment Method 1

[0091] The micro-deformation measurement system 200 includes multiple reference points, such as reference point #1, reference point #2 and reference point #3 in Figure 2.

[0092] In this method, at least two of the multiple reference points are deployed on different sides of the point to be measured, or in other words, at least two of the multiple reference points are deployed in different directions from the point to be measured. This approach ensures that the point to be measured is approximately located at the center of the multiple reference points, thereby further improving measurement accuracy.

[0093] Figure 3 is a schematic diagram of the deployment method of the reference point provided in the embodiment of this application.

[0094] As shown in Figure 3(a), for baseline #1, reference point #2 and reference point #3 are deployed on the same side, and reference point #1 is deployed on the other side; for baseline #2, reference point #1 and reference point #3 are deployed on the same side, and reference point #2 is deployed on the other side; for baseline #3, reference point #1 and reference point #2 are deployed on the same side, and reference point #3 is deployed on the other side.

[0095] As shown in Figure 3(b), reference points #1, #2 and #3 are deployed in three different directions of the point to be measured.

[0096] (2) Deployment Method 2

[0097] The micro-deformation measurement system 200 includes a reference point, wherein the deployment of the reference point satisfies a first condition.

[0098] Specifically, when the deployment of the reference point satisfies the first condition, the phase change caused by the antenna feed wobbling is the same or similar relative to the reference point and the point to be measured. The specific content of the first condition is not limited in the embodiments of this application, and the following is an exemplary description.

[0099] For example, the first condition is that the difference between the horizontal angle of the reference point relative to the antenna feed and the horizontal angle of the point to be measured relative to the antenna feed is less than a first threshold, and the difference between the pitch angle of the reference point relative to the antenna feed and the pitch angle of the point to be measured relative to the antenna feed is less than a second threshold; or, the first condition is that the antenna feed, the point to be measured, and the reference point are approximately located on a straight line.

[0100] In this application embodiment, the specific values ​​of the first threshold and the second threshold are not limited, as long as the phase change caused by the antenna wobbling is the same or similar relative to the reference point and the point to be measured.

[0101] In some possible implementations, deployment method 1 and deployment method 2 can be used in combination, that is, in the micro-variable measurement system 200, there are at least two reference points deployed on different sides of the point to be measured, and there is at least one reference point whose deployment satisfies the first condition.

[0102] Based on different deployment methods, this application provides two micro-deformation measurement schemes.

[0103] Option 1: Deploy reference points using deployment method 1. The following describes Option 1 in detail with reference to Figures 4 and 5.

[0104] Figure 4 is a schematic diagram of a micro-deformation measurement scenario provided in an embodiment of this application.

[0105] The scenario shown in Figure 4 includes an antenna feed, three reference points (referred to as reference point #1, reference point #2, and reference point #3), and the point to be measured. The reference points can be natural or artificial, and there is no limitation.

[0106] As shown in Figure 4, at least two of the three reference points are deployed on both sides of the point to be measured.

[0107] Figure 5 is a flowchart of a micro-deformation measurement scheme 500 provided in an embodiment of this application. Specifically, for the scenario shown in Figure 4, the method in scheme 500 is used to perform micro-deformation measurement.

[0108] S501 determines the first position of the antenna feeder, multiple reference points, and the position information of the point to be measured.

[0109] The first position of the antenna feeder refers to the position of the antenna feeder when the base station performs its first measurement. The details of the base station's first measurement are described in S502.

[0110] In this embodiment of the application, the specific form of the position information of the first position of the antenna feeder, multiple reference points, and the point to be measured is not limited. For example, the position information may be three-dimensional coordinate information.

[0111] For the scenario shown in Figure 4, assuming the position information of the first antenna feed is denoted as (x0, y0, z0), the position information of reference point #1 is denoted as (x1, y1, z1), the position information of reference point #2 is denoted as (x2, y2, z2), the position information of reference point #3 is denoted as (x3, y3, z3), and the position information of the point to be measured is denoted as (x... t y t , z t ).

[0112] This application does not limit the specific implementation method of the base station determining the first position of the antenna feeder, the reference point, and the position information of the point to be measured. Several possible implementation methods are given below.

[0113] (1) Regarding the first position of the antenna feeder

[0114] In one possible implementation, the position information of the first position of the antenna feeder is the position information of the initial position of the antenna feeder, where the initial position of the antenna feeder refers to the position of the antenna feeder when it is not shaking.

[0115] In other words, when the base station cannot determine the location information of the first position of the antenna feeder, the location information of the initial position of the antenna feeder is used as the location information of the first position of the antenna feeder for subsequent measurements. Since the deformation measurement scheme proposed in this application focuses on the relative displacement generated by the antenna feeder from the first position to the second position, the location information of the initial position of the antenna feeder is used as the location information of the first position of the antenna feeder for subsequent measurements. This improves the accuracy of the base station in performing deformation measurements while reducing the complexity of the deformation measurement scheme.

[0116] The embodiments of this application do not limit the method for determining the initial position information of the antenna feeder. For example, the base station determines the initial position information of the antenna feeder based on the measurement results of the GPS installed on the antenna feeder. The embodiments of this application do not require high measurement accuracy of the initial position of the antenna feeder. For example, if the initial position information of the antenna feeder determined by the base station based on the measurement results of the GPS installed on the antenna feeder has a centimeter-level error, it will not affect the solution proposed in this application.

[0117] (2) Regarding reference points

[0118] In one possible implementation, the base station obtains the location information of the reference point from stored data. For example, assuming the reference point is a man-made reference point, and its location information is stored when it is deployed, the base station can directly obtain the reference point's location information from the stored data.

[0119] In another possible implementation, the base station measures the location information of the reference point. For example, assuming the reference point is a natural reference point, the base station can send a signal to the reference point and determine the location information of the reference point based on the measurement results of the signal and the location information of the first position of the antenna feeder.

[0120] Specifically, the signal measurement results include information such as the distance between the antenna feeder and the reference point, the horizontal angle of the reference point relative to the antenna feeder, and the elevation angle of the reference point relative to the antenna feeder. The base station can then determine the location information of the reference point based on the location information of the first position of the antenna feeder and the signal measurement results.

[0121] (3) Regarding the points to be measured

[0122] The base station obtains the location information of the test point from the stored data. For example, when deploying the test point (such as a deformable target), the location information of the test point is stored, and the base station can directly obtain the location information of the test point from the stored data.

[0123] S501 is an optional step. This application embodiment does not exclude the possibility that the base station obtains the first position of the antenna feeder, multiple reference points, and the position information of the point to be measured in other ways.

[0124] S502, when the feeder is in the first position, the base station performs the first measurement on multiple reference points and the point to be tested, and obtains the carrier phase corresponding to the multiple reference points and the carrier phase corresponding to the point to be tested.

[0125] For the scenario shown in Figure 4, assume Used to characterize the carrier phase of the reference point or the point under test acquired by the base station during the first measurement; that is, during the first measurement, the carrier phase acquired by the base station includes the carrier phase of reference point #1. Carrier phase of reference point #2 Carrier phase of reference point #3 and the carrier phase of the point to be measured

[0126] This application does not limit the specific implementation method of the base station acquiring three reference points and the carrier phase corresponding to the point to be measured.

[0127] As one possible implementation, after determining the location information of three reference points, the base station sends sensing signals to the three reference points. The sensing signals are reflected at the three reference points, and the base station determines the carrier phase corresponding to the three reference points based on the received echo signals. Similarly, after determining the location information of the point to be measured, the base station sends sensing signals to the point to be measured. The sensing signals are reflected at the point to be measured, and the base station determines the carrier phase corresponding to the point to be measured based on the received echo signals.

[0128] S503, when the feeder is in the second position, the base station performs a second measurement on multiple reference points and the point to be tested to obtain the carrier phase corresponding to the multiple reference points and the carrier phase corresponding to the point to be tested.

[0129] The position information of the second position is denoted as (x0+dx, y0+dy, z0+dz). The second position is different from the first position, indicating that the position of the antenna feeder has moved from the first position to (or updated to) the second position; or, the second position is the same as the first position, indicating that the antenna feeder has not shaken.

[0130] For the scenario shown in Figure 4, assume This is used to characterize the carrier phase of the reference point or the point under test acquired by the base station during the second measurement. That is, during the second measurement, the carrier phase acquired by the base station includes the carrier phase of reference point #1. Carrier phase of reference point #2 Carrier phase of reference point #3 and the carrier phase of the point to be measured

[0131] The specific implementation of S503 can be found in S502, and will not be repeated here.

[0132] S504, based on the position information of multiple reference points and the phase change of multiple reference points measured twice, determine the antenna feed wobbling displacement (or, the displacement of the antenna feed from the first position to the second position).

[0133] Specifically, for the scenario shown in Figure 4, after the first measurement in S502, the base station acquires the carrier phase corresponding to the three reference points. After the second measurement in S503, the base station acquires the carrier phase corresponding to the three reference points. Based on the phase changes of the three reference points and their position information, the base station can determine the antenna feeder sway displacement.

[0134] The embodiments of this application do not limit the specific implementation of determining the antenna feeder sway displacement based on the phase changes of multiple reference points. The following is an exemplary description.

[0135] The specific process by which the base station determines the antenna feeder sway displacement (dx, dy, dz) satisfies formulas (2) to (4).

[0136] Where λ represents the wavelength. Characterizes the carrier phase of reference point #1 obtained by the base station during the second measurement. Characterizes the carrier phase of reference point #1 obtained by the base station during the first measurement. Characterizes the carrier phase of reference point #2 obtained by the base station during the second measurement. Characterizes the carrier phase of reference point #2 obtained by the base station during the first measurement. The carrier phase at reference point #3, acquired by the base station during the second measurement, is characterized. The carrier phase of reference point #3, which is obtained by the base station during the first measurement, is characterized.

[0137] That is, by combining formulas (2) to (4), the sway displacement (dx, dy, dz) of the antenna feeder can be determined.

[0138] It should be understood that formulas (2) to (4) are merely illustrative examples, and this application does not exclude other calculation methods for determining the antenna feed sway displacement based on the phase changes of multiple reference points.

[0139] S505: The base station determines the antenna sway phase of the point to be measured based on the antenna sway displacement and the location information of the point to be measured.

[0140] Specifically, the antenna wobble phase of the test point refers to the phase change caused by the change in the position of the antenna relative to the test point. The antenna wobble phase of the test point will reduce the accuracy of micro-deformation measurement, so it is necessary to calibrate the antenna wobble phase of the test point.

[0141] For example, the specific process of determining the antenna sway phase of the test point based on the antenna sway displacement satisfies formula (5).

[0142] Where, φ t The phase of the antenna feed wobble at the measured point is represented by λ, and the wavelength is represented by λ.

[0143] S506, based on the phase change of the measured point in two measurements, and the phase change caused by the deformation of the measured point due to the antenna wobbling phase (or deformation phase, i.e., the phase change caused by the deformation of the measured point relative to the antenna), the deformation of the measured object is further determined.

[0144] Specifically, for the scenario shown in Figure 4, after the first measurement in S502, the base station acquires the carrier phase corresponding to the point under test. After the second measurement in S503, the base station acquires the carrier phase corresponding to the point under test. Based on the phase change of the point under test in the two measurements, as well as the antenna feeder wobbling phase of the point under test, the base station can determine the phase change of the point under test caused by deformation.

[0145] Its specific process satisfies formula (6).

[0146] Where, θ t Characterizing the deformation phase of the point to be measured. Characterizes the carrier phase of the test point obtained by the base station during the second measurement. φ represents the carrier phase of the test point acquired by the base station during the first measurement. t Characterizes the phase of the antenna feed wobble at the point to be measured.

[0147] Furthermore, the base station determines the deformation of the object to be measured based on the deformation phase of the point to be measured, and the specific process satisfies formula (7).

[0148] Where d represents the distance change / displacement caused by the deformation of the object being measured, λ represents the wavelength, and θ t Characterizes the deformation phase of the point to be measured.

[0149] Option 2: Deploy reference points using deployment method 2. The following describes Option 2 in detail with reference to Figures 6 and 7.

[0150] Figure 6 is a schematic diagram of another micro-deformation measurement scenario provided in an embodiment of this application.

[0151] The scenario shown in Figure 6 includes an antenna feed, a reference point (denoted as reference point #1), and a point to be measured. The reference point can be a natural reference point or an artificial reference point, without limitation.

[0152] As shown in Figure 6, the deployment of reference point #1 satisfies the first condition.

[0153] Figure 7 is a schematic diagram of the micro-deformation measurement scheme 700 provided in the embodiment of this application. Specifically, for the scenario shown in Figure 6, the method in scheme 700 is used to perform micro-deformation measurement.

[0154] S701, determine the first position of the antenna feeder, a reference point (i.e., reference point #1), and the position information of the point to be measured.

[0155] The first position of the antenna feeder refers to the position of the antenna feeder when the base station performs its first measurement. The details of the base station's first measurement are described in S702.

[0156] In this embodiment of the application, the specific form of the position information of the first position of the antenna feeder, the reference point #1, and the point to be measured is not limited. For example, the position information can be three-dimensional coordinate information.

[0157] For the scenario shown in Figure 6, assuming the position information of the first position of the antenna feed is denoted as (x0, y0, z0), the position information of the reference point #1 is denoted as (x1, y1, z1), and the position information of the point to be measured is denoted as (x0, y0, z0). t y t , z t ).

[0158] The specific implementation method for the base station to determine the first position of the antenna feeder, reference point #1, and the position information of the point to be measured can be found in S501, and will not be repeated here.

[0159] S701 is an optional step. This application embodiment does not exclude the possibility that the base station obtains the first position, reference point, and position information of the antenna feeder in other ways.

[0160] S702, when the feeder is in the first position, the base station performs the first measurement on the reference point #1 and the point to be tested, and obtains the carrier phase corresponding to the reference point #1 and the carrier phase corresponding to the point to be tested.

[0161] For the scenario shown in Figure 6, assume Used to characterize the carrier phase of the reference point or the point under test acquired by the base station during the first measurement; that is, during the first measurement, the carrier phase acquired by the base station includes the carrier phase of reference point #1. and the carrier phase of the point to be measured

[0162] The embodiments of this application do not limit the specific implementation method of the base station obtaining the carrier phase corresponding to reference point #1 and the point to be measured.

[0163] As one possible implementation, after determining the location information of reference point #1, the base station sends a sensing signal to reference point #1. The sensing signal is reflected at reference point #1, and the base station determines the carrier phase corresponding to reference point #1 based on the received echo signal. Similarly, after determining the location information of the point to be measured, the base station sends a sensing signal to the point to be measured. The sensing signal is reflected at the point to be measured, and the base station determines the carrier phase corresponding to the point to be measured based on the received echo signal.

[0164] S703, when the feeder is in the second position, the base station performs a second measurement on reference point #1 and the point to be measured to obtain the carrier phase corresponding to reference point #1 and the carrier phase corresponding to the point to be measured.

[0165] The second position is different from the first position, indicating that the position of the antenna feeder has moved from the first position to (or updated to) the second position; or, the second position is the same as the first position, indicating that the antenna feeder has not shaken.

[0166] For the scenario shown in Figure 6, assume This is used to characterize the carrier phase of the reference point or the point under test acquired by the base station during the second measurement. That is, during the second measurement, the carrier phase acquired by the base station includes the carrier phase of reference point #1. and the carrier phase of the point to be measured

[0167] The specific implementation of S703 can be found in S702, and will not be repeated here.

[0168] S704, determine the antenna wobbling phase of the test point based on the phase change of reference point #1 between two measurements.

[0169] Specifically, since the deployment of reference point #1 satisfies the first condition, the phase change caused by the antenna feeder sway is the same or similar to that of reference point #1 and the point to be measured. Therefore, the base station can determine the antenna feeder sway phase of the point to be measured based on the phase change of reference point #1 measured twice. The specific process satisfies formula (8).

[0170] Where, φ t Characterizing the phase of the antenna feed wobble at the point to be measured. Characterizes the carrier phase of reference point #1 obtained by the base station during the second measurement. Characterizes the carrier phase of reference point #1 obtained by the base station during the first measurement.

[0171] S705, based on the phase change of the measured point in two measurements, and the phase change caused by the deformation of the measured point due to the antenna wobbling phase (or deformation phase, i.e., the phase change caused by the deformation of the measured point relative to the antenna), the deformation of the measured object is further determined.

[0172] Specifically, for the scenario shown in Figure 6, after the first measurement in S702, the base station acquires the carrier phase corresponding to the point under test. After the second measurement in S703, the base station acquires the carrier phase corresponding to the point under test. Based on the phase change of the point under test in the two measurements, as well as the antenna feeder wobbling phase of the point under test, the base station can determine the phase change of the point under test caused by deformation.

[0173] The specific process satisfies formula (9).

[0174] Where, θ tCharacterizing the deformation phase of the point to be measured. Characterizes the carrier phase of the test point obtained by the base station during the second measurement. φ represents the carrier phase of the test point acquired by the base station during the first measurement. t Characterizes the phase of the antenna feed wobble at the point to be measured.

[0175] Furthermore, the base station determines the deformation of the object to be measured based on the deformation phase of the point to be measured, and the specific process satisfies formula (10).

[0176] Where d represents the distance change / displacement caused by the deformation of the object being measured, λ represents the wavelength, and θ t Characterizes the deformation phase of the point to be measured.

[0177] Figure 8 is a schematic block diagram of a detection device 800 provided in an embodiment of this application. The detection device includes a transceiver unit 810. The transceiver unit 810 can be used to implement corresponding communication functions (e.g., the transceiver unit 810 is used to send / or receive sensing signals). The transceiver unit 810 can also be referred to as a communication interface or communication unit. Optionally, the detection device 800 further includes a processing unit 820. The processing unit 820 can be used to implement processing operations.

[0178] It should be understood that the detection device in this application refers to a device with communication and sensing functions. The detection device can be a detection equipment, or it can be a unit / module / component (e.g., a chip, chip system, logic circuit, or software) configured in (or used for) a detection equipment.

[0179] Among them, the detection equipment is, for example, a sensor-integrated base station or a radar installed on a tower or pole that can transmit electromagnetic wave signals.

[0180] Optionally, the detection device 800 may further include a storage unit, which can be used to store instructions and / or data, and the processing unit 820 can read the instructions and / or data in the storage unit to enable the device to implement the aforementioned method embodiments.

[0181] In one possible design, the device 800 is an integrated sensing and communication base station. The transceiver unit and processing unit can be used to implement the relevant operations of the integrated sensing and communication base station.

[0182] One possible implementation is as follows: Transceiver unit 810 is configured to, when the antenna feeder is in a first position, acquire the first carrier phase of multiple reference points based on the position information of multiple reference points, and acquire the first carrier phase of the test point based on the position information of the test point; transceiver unit 810 is further configured to, when the antenna feeder is in a second position, acquire the second carrier phase of multiple reference points based on the position information of multiple reference points, and acquire the second carrier phase of the test point based on the position information of the test point; processing unit 820 is further configured to, based on the position information of multiple reference points, the first carrier phase of multiple reference points, and the second carrier phase of multiple reference points, determine the displacement between the first position and the second position; processing unit 820 is further configured to, based on the displacement between the first position and the second position, and the position information of the test point, determine the antenna feeder wobbling phase of the test point, where the antenna feeder wobbling phase refers to the phase change caused by the antenna feeder moving from the first position to the second position; processing unit 820 is further configured to, based on the first carrier phase of the test point, the second carrier phase of the test point, and the antenna feeder wobbling phase of the test point, determine the phase change caused by deformation of the test point.

[0183] Optionally, the processing unit 810 is also used to determine the first position of the antenna feeder, multiple reference points, and the position information of the point to be measured.

[0184] The first position of the antenna feeder refers to the position of the antenna feeder when the base station acquires the first carrier phase of multiple reference points and the first carrier phase of the point to be measured.

[0185] Optionally, the position information of the first position of the antenna feeder is the position information of the initial position of the antenna feeder, which refers to the position of the antenna feeder when it is not shaking.

[0186] Optionally, at least two of the multiple reference points are deployed on either side of the point to be measured (or, at least two of the multiple reference points are deployed in different directions of the point to be measured, such that the point to be measured is located at the center of the multiple reference points).

[0187] Optionally, the reference point can be an artificial reference point; or, the reference point can be a natural reference point.

[0188] Optionally, the transceiver unit 810 is further configured to send a signal to the reference point, and the processing unit 820 is further configured to determine the position information of the reference point based on the measurement result of the signal and the position information of the first position; or, the transceiver unit 810 is further configured to directly obtain the position information of the reference point from the stored data.

[0189] In a second possible design, the device 800 is an integrated sensing and communication base station. The transceiver unit and processing unit can be used to implement the relevant operations of the integrated sensing and communication base station.

[0190] One possible implementation is as follows: Transceiver unit 810 is configured to, when the antenna feeder is in a first position, acquire a first carrier phase of a reference point based on the position information of a reference point, and acquire a first carrier phase of a point under test based on the position information of the point under test, wherein the deployment of the reference point satisfies a first condition; transceiver unit 810 is further configured to, when the antenna feeder is in a second position, acquire a second carrier phase of the reference point based on the position information of the reference point, and acquire a second carrier phase of the point under test based on the position information of the point under test; processing unit 820 is configured to, based on the first carrier phase and the second carrier phase of the reference point, determine the antenna feeder jitter phase of the point under test, where the antenna feeder jitter phase refers to the phase change caused by the antenna feeder moving from the first position to the second position; processing unit 820 is further configured to, based on the first carrier phase, the second carrier phase, and the antenna feeder jitter phase of the point under test, determine the phase change of the point under test caused by deformation.

[0191] Optionally, the processing unit 810 is also used to determine the first position of the antenna feeder, multiple reference points, and the position information of the point to be measured.

[0192] The first position of the antenna feeder refers to the position of the antenna feeder when the base station acquires the first carrier phase of multiple reference points and the first carrier phase of the point to be measured.

[0193] Optionally, the position information of the first position of the antenna feeder is the position information of the initial position of the antenna feeder, which refers to the position of the antenna feeder when it is not shaking.

[0194] Optionally, the first condition is that the difference between the horizontal angle of the reference point relative to the antenna feed and the horizontal angle of the point to be measured relative to the antenna feed is less than a first threshold, and the difference between the pitch angle of the reference point relative to the antenna feed and the pitch angle of the point to be measured relative to the antenna feed is less than a second threshold.

[0195] Optionally, the reference point can be an artificial reference point; or, the reference point can be a natural reference point.

[0196] Optionally, the transceiver unit 810 is further configured to send a signal to the reference point, and the processing unit 820 is further configured to determine the position information of the reference point based on the measurement result of the signal and the position information of the first position; or, the transceiver unit 810 is further configured to directly obtain the position information of the reference point from the stored data.

[0197] It is understood that the division of units in the above-described device is merely a logical functional division. Each function can correspond to a functional unit, or two or more functions can be integrated into one functional unit. In actual implementation, all or some units can be integrated into a single physical entity, or they can be distributed across different physical entities. Furthermore, the aforementioned functional units can be implemented in hardware, software, or a combination of both. Whether a function is executed in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0198] In one example, the functional unit in any of the above devices may be one or more integrated circuits configured to implement the above methods, such as: one or more application-specific integrated circuits (ASICs), or one or more central processing units (CPUs), one or more microcontroller units (MCUs), one or more digital signal processors (DSPs), or one or more field-programmable gate arrays (FPGAs), or a combination of at least two of these integrated circuit forms.

[0199] In one example, the storage unit may include random access memory, flash memory, read-only memory, programmable read-only memory, or electrically erasable programmable memory and / or registers, etc.

[0200] Figure 9 is a schematic diagram of another detection device 900 provided in an embodiment of this application. The detection device 900 includes a processor 910, which is coupled to a memory 920. The memory 920 is used to store computer programs or instructions and / or data. The processor 910 is used to execute the computer programs or instructions stored in the memory 920, or to read the data stored in the memory 920, in order to execute the methods in the above method embodiments.

[0201] Optionally, there may be one or more processors 910.

[0202] Optionally, the memory 920 may be one or more.

[0203] Alternatively, the memory 920 can be integrated with the processor 910, or it can be set separately.

[0204] Optionally, as shown in FIG9, the detection device 900 further includes a transceiver 930 for receiving and / or transmitting signals. For example, the processor 910 is used to control the transceiver 930 to receive and / or transmit signals.

[0205] As one approach, the detection device 900 is used to implement the operations performed by the detection device in the various method embodiments described above.

[0206] For example, processor 910 is used to execute computer programs or instructions stored in memory 920 to implement relevant operations of the apparatus (e.g., computing unit, main control board, or central unit) in the various method embodiments described above.

[0207] It should be understood that the processor mentioned in the embodiments of this application can be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), microprocessor units (MPUs), microcontroller units (MCUs), graphics processing units (GPUs), artificial intelligence processors (AI processors) or neural processing units (NPUs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor can be a microprocessor or any conventional processor.

[0208] It should also be understood that the memory mentioned in the embodiments of this application can be volatile memory and / or non-volatile memory. Non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. Volatile memory can be random access memory (RAM). For example, RAM can be used as an external cache. By way of example and not limitation, RAM includes the following forms: static random access memory (SRAM), dynamic random access memory (DRAM), synchronous dynamic random access memory (SDRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous linked dynamic random access memory (SLDRAM), and direct rambus RAM (DR RAM).

[0209] It should be noted that when the processor is a general-purpose processor, DSP, ASIC, FPGA, or other programmable logic device, discrete gate or transistor logic device, or discrete hardware component, the memory (storage module) can be integrated into the processor.

[0210] It should also be noted that the memory described herein is intended to include, but is not limited to, these and any other suitable types of memory.

[0211] Figure 10 is a schematic block diagram of a chip system 1000 provided in an embodiment of this application. The chip system 1000 (or may also be referred to as a processing system) includes logic circuitry 1010 and an input / output interface 1020.

[0212] The logic circuit 1010 can be a processing circuit in the chip system 1000. The logic circuit 1010 can be coupled to a memory unit, calling instructions from the memory unit, enabling the chip system 1000 to implement the methods and functions of the embodiments of this application. The input / output interface 1020 can be an input / output circuit in the chip system 1000, outputting processed information from the chip system 1000, or inputting data or signaling information to be processed into the chip system 1000 for processing.

[0213] As one approach, the chip system 1000 is used to implement the operations performed by the detection device (e.g., a sensing-integrated base station) in the various method embodiments described above.

[0214] For example, logic circuit 1010 is used to implement processing-related operations performed by the detection device in the above method embodiments; input / output interface 820 is used to implement sending and / or receiving-related operations performed by the detection device in the above method embodiments.

[0215] This application also provides a computer-readable storage medium storing computer instructions for implementing the methods executed by the detection device in the above-described method embodiments.

[0216] For example, when the computer program is executed by the computer, it enables the computer to implement the methods performed by the detection device in the various embodiments of the above methods.

[0217] This application also provides a computer program product comprising instructions which, when executed by a computer, implement the methods performed by the detection device in the above-described method embodiments.

[0218] The explanations and beneficial effects of the relevant contents in any of the devices provided above can be found in the corresponding method embodiments provided above, and will not be repeated here.

[0219] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces, and the indirect coupling or communication connection of apparatus or units may be electrical, mechanical, or other forms.

[0220] In the above embodiments, implementation can be achieved entirely or partially through software, hardware, firmware, or any combination thereof. When implemented using software, it can be implemented entirely or partially in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, all or part of the processes or functions described in the embodiments of this application are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. For example, the computer can be a personal computer, a server, or a network device, etc. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that integrates one or more available media. The available media can be magnetic media (e.g., floppy disks, hard disks, magnetic tapes), optical media (e.g., DVDs), or semiconductor media (e.g., solid-state disks, SSDs). For example, the aforementioned available media include, but are not limited to, USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks, and other media capable of storing program code.

[0221] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A deformation measurement method, characterized in that, The method includes: When the antenna feed is in the first position, the first carrier phase of the multiple reference points is obtained based on the position information of the multiple reference points, and the first carrier phase of the point to be measured is obtained based on the position information of the point to be measured. When the antenna feed is in the second position, the second carrier phase of the multiple reference points is obtained based on the position information of the multiple reference points, and the second carrier phase of the point to be measured is obtained based on the position information of the point to be measured. Based on the position information of the plurality of reference points, the first carrier phase of the plurality of reference points, and the second carrier phase of the plurality of reference points, the displacement between the first position and the second position is determined; Based on the displacement between the first position and the second position, and the position information of the point to be measured, the antenna wobbling phase of the point to be measured is determined; Based on the first carrier phase of the point under test, the second carrier phase of the point under test, and the antenna wobbling phase of the point under test, the phase change caused by the deformation of the point under test is determined.

2. The method according to claim 1, characterized in that, include: At least two of the plurality of reference points are deployed on either side of the point to be measured.

3. The method according to claim 1 or 2, characterized in that, include: The plurality of reference points are artificial reference points; or, the plurality of reference points are natural reference points.

4. The method according to any one of claims 1 to 3, characterized in that, The method further includes: Signals are sent to the plurality of reference points, and the position information of the plurality of reference points is determined based on the measurement results of the signals and the position information of the first position.

5. A deformation measurement method, characterized in that, The method includes: When the antenna feeder is located in the first position, the first carrier phase of the reference point is obtained based on the location information of the reference point, and the first carrier phase of the test point is obtained based on the location information of the test point, wherein the deployment of the reference point satisfies the first condition. When the antenna feed is in the second position, the second carrier phase of the reference point is obtained based on the position information of the reference point, and the second carrier phase of the test point is obtained based on the position information of the test point. Based on the first carrier phase and the second carrier phase of the reference point, the antenna wobbling phase of the point to be measured is determined; Based on the first carrier phase of the point under test, the second carrier phase of the point under test, and the antenna wobbling phase of the point under test, the phase change caused by the deformation of the point under test is determined.

6. The method according to claim 5, characterized in that, include: The first condition is that the difference between the horizontal angle of the reference point relative to the antenna feed and the horizontal angle of the point to be measured relative to the antenna feed is less than a first threshold, and the difference between the pitch angle of the reference point relative to the antenna feed and the pitch angle of the point to be measured relative to the antenna feed is less than a second threshold.

7. The method according to claim 5 or 6, characterized in that, include: The reference point is an artificial reference point; or, the reference point is a natural reference point.

8. The method according to any one of claims 5 to 7, characterized in that, The method further includes: A signal is sent to the reference point, and the position information of the reference point is determined based on the measurement result of the signal and the position information of the first position.

9. A detection device, characterized in that, The detection device includes a processor for calling and running a computer program from a memory, such that the method as described in any one of claims 1 to 8 is executed.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program or instructions that, when executed on a computer, cause the method as described in any one of claims 1 to 8 to be performed.

11. A computer program product, characterized in that, When the computer program product is run on a computer, the method as described in any one of claims 1 to 8 is performed.

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