Pulsed DC plasma source with hollow electrode
The plasma-enhanced chemical vapor deposition system with a hollow electrode and separate biasing means addresses the challenge of uniformity and rate in PECVD, enabling efficient large-area coating and integration with surface treatments.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- SMOLTEK AB
- Filing Date
- 2025-11-06
- Publication Date
- 2026-06-04
AI Technical Summary
Existing plasma-enhanced chemical vapor deposition (PECVD) systems face challenges in achieving uniform large-area plasma and high deposition rates, particularly in large-scale applications.
A system comprising a plasma source with a first hollow electrode, separate source and target biasing means, and a conductive platform, allowing independent control of plasma and deposition parameters, including pulsed DC bias voltage, to generate uniform plasma and optimize deposition rates.
The system achieves uniform deposition over large areas with enhanced deposition rates, supporting conductive and non-conductive substrates, and facilitates integration with additional surface treatments through a cluster tool.
Smart Images

Figure EP2025082141_04062026_PF_FP_ABST