Pulsed DC plasma source with hollow electrode

The plasma-enhanced chemical vapor deposition system with a hollow electrode and separate biasing means addresses the challenge of uniformity and rate in PECVD, enabling efficient large-area coating and integration with surface treatments.

WO2026114616A1PCT designated stage Publication Date: 2026-06-04SMOLTEK AB

Patent Information

Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
SMOLTEK AB
Filing Date
2025-11-06
Publication Date
2026-06-04

AI Technical Summary

Technical Problem

Existing plasma-enhanced chemical vapor deposition (PECVD) systems face challenges in achieving uniform large-area plasma and high deposition rates, particularly in large-scale applications.

Method used

A system comprising a plasma source with a first hollow electrode, separate source and target biasing means, and a conductive platform, allowing independent control of plasma and deposition parameters, including pulsed DC bias voltage, to generate uniform plasma and optimize deposition rates.

Benefits of technology

The system achieves uniform deposition over large areas with enhanced deposition rates, supporting conductive and non-conductive substrates, and facilitates integration with additional surface treatments through a cluster tool.

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Abstract

A system (300) for plasma enhanced chemical vapor deposition, PECVD, comprising a plasma source (100, 200). The plasma source comprises at least a first hollow electrode (110a, 110b, 110c), the first hollow electrode (110a, 110b, 110c) being arranged to generate a hollow electrode plasma (111). The plasma source also 5 comprises a first supply means (112a, 112b, 112c) arranged to supply a plasma gas to the first hollow electrode (110a, 110b, 110c), a second supply means (141a, 141b) arranged to supply a precursor gas, a source biasing means (150) connected to the first hollow electrode (110a, 110b, 110c), and a target biasing means (130) arranged to be connectable to a conductive platform (120).
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