Statics correction of seismic data using refraction arrival times to determine short and long wavelength statics
The method separates and corrects for short-wavelength and long-wavelength statics in seismic data using refraction arrival times, improving seismic data accuracy and reducing computational costs in seismic data analysis.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- DOWNUNDER GEOSOLUTIONS (AMERICA) LLC
- Filing Date
- 2025-07-03
- Publication Date
- 2026-06-04
AI Technical Summary
Existing seismic data analysis methods struggle to accurately separate and correct for short-wavelength and long-wavelength statics, particularly in noisy land-based seismic data, leading to distorted images of the Earth's subsurface and inefficiencies in Full Waveform Inversion (FWI) due to unpredictable near-surface velocities.
A method that separates long-wavelength and short-wavelength statics components from refraction arrival times, using wavelength filtering and refraction analysis to generate a velocity model, which is then refined through iterative processes to improve the accuracy of seismic data correction.
This approach enhances the efficiency and accuracy of seismic data correction, reducing computational intensity and improving the convergence of FWI by providing a more precise Earth velocity model, thereby enhancing subsurface imaging.
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