Systems and methods of beam control and monitoring

Abstract

A system can include a beam former to deliver a radiation beam, a beam controller coupled to the beam former to start and stop the radiation beam, a beam detector coupled to the beam former, the beam detector to measure time resolved signals of the radiation beam, a signal analyzer to digitize the time resolved signals received from the beam detector, and a computing system including one or more processors communicatively coupled to the beam controller to start and stop the radiation beam and to the signal analyzer to extract beam parameter data from a digitized beam signal, the computing system to stop the radiation beam responsive to determining that the beam parameter data exceeds a threshold.

Description

Atty. Dkt. No. 642631-0108 (MDA24-1 17PC)SYSTEMS AND METHODS OF BEAM CONTROL AND MONITORINGCROSS-REFERENCE TO RELATED APPLICATION

[0001] The present application claims priority to U.S. Provisional Patent App. No. 63 / 728,573 filed on December 5, 2024, the disclosure of which is incorporated herein by reference in its entirety for all purposes.BACKGROUND

[0002] Radiotherapy (RT) is a cancer treatment method which damages cancer tissue by exposing it to ionizing radiation. The efficacy and safety of RT is limited by the exposure of nearby normal tissue to the radiation, which leads to toxicity to the patient. Many RT modalities have been developed to maximize the radiation exposure of cancer tissue while minimizing the radiation exposure of normal tissue. Conventional RT beam formers, such as electron linear accelerators (linacs) and proton cyclotrons, can deliver radiation at mean dose rates on the order of 10 milli Gray per second (mGy / s). Thus, conventional RT treatments last a few minutes to achieve clinical doses on the order of a few Gray.SUMMARY

[0003] One aspect of the present disclosure is directed towards a system. The system can include a beam former to deliver a radiation beam, a beam controller coupled to the beam former to start and stop the radiation beam, a beam detector coupled to the beam former, the beam detector to measure time resolved signals of the radiation beam, a signal analyzer to digitize the time resolved signals received from the beam detector, and a computing system including one or more processors communicatively coupled to the beam controller to start and stop the radiation beam and to the signal analyzer to extract beam parameter data from the digitized beam signal, the computing system to stop the radiation beam responsive to determining that the beam parameter data exceeds a threshold.

[0004] In some embodiments, the computing system includes at least one algorithm to process and analyze the digitized beam signal. The computing system can be configured to determine at least one of charge-per-pulse, a full-width at half maximum, a maximum signal height, a start time, a mean signal intensity, and a baseline signal intensity for each of the pulses of the radiation beam. The computing system can detect individual pulses within the digitized beam signal by comparing signal intensity of the digitized beam signal with aAtty. Dkt. No. 642631-0108 (MDA24-117PC) threshold value, the threshold value based on at least one of user input or a noise level of the digitized beam signal. The computing system can detect pulses from the digitized beam signal and fits a square wave pulse form for each pulse and in response to the square wave pulse form exceeding a threshold, generates a notification to a user.

[0005] In some embodiments, the beam detector continuously measures time resolved signals for the signal analyzer to digitize and the computing system to store and process. The beam parameter data can include at least one of detector signal noise level, number of bunches, number of pulses, duty cycle, full -width at half maximum of bunch, full-width at half maximum of pulse, signal integral of bunch, signal integral of pulse, bunch fluence, pulse fluence, bunch intensity, pulse intensity, bunch charge, pulse charge, bunch dose, pulse dose, bunch current, pulse current, bunch dose rate, pulse dose rate, mean current, mean dose rate, bunch shape, pulse shape, noise level within bunch, noise level within pulse, bunch repetition rate, pulse repetition rate, cumulative dose, cumulative exposure time, and total delivery time, or any combination thereof. The digitized beam signal can be negative. The digitized beam signal can be positive. The signal analyzer can generate multichannel digitized beam signal data responsive to two or more channels of the signal analyzer being used concurrently to receive the time resolved signals. The beam former can include a linear accelerator.

[0006] Another aspect of the present disclosure is directed towards a method. The method can include causing, by one or more processors, a beam former to generate a radiation beam, measuring, by a beam detector, time resolved signals from the radiation beam, transforming, by a signal analyzer, the time resolved signals into a digitized beam signal, extracting, by the one or more processors, beam parameter data from the digitized beam signal to detect each of the plurality of pulses of the radiation beam, comparing, by the one or more processors, each of the plurality of pulses to a threshold defined by a computed value of each of the plurality of pulses, and causing, by the one or more processors, the beam former to stop generating the radiation beam responsive to at least one of the plurality of pulses exceeding the threshold. The one or more processors can detect individual pulses within the digitized beam signal by comparing signal intensity of the digitized beam signal with a threshold value, the threshold value based on at least one of user input or a noise level of the digitized beam signal.

[0007] In some embodiments, the beam parameter data is extracted by an algorithm, the algorithm to analyze the digitized beam signal to extract at least one of charge-per-pulse, aAtty. Dkt. No. 642631-0108 (MDA24-117PC) full-width at half maximum, a maximum signal height, a start time, a mean signal intensity, and a baseline signal intensity for each of the pulses of the radiation beam. The one or more processors can fit a square wave pulse form to the electron beam to determine that at least one of the plurality of pulses exceeds a threshold. The beam parameter data can include at least one of detector signal noise level, number of bunches, number of pulses, duty cycle, full-width at half maximum of bunch, full-width at half maximum of pulse, signal integral of bunch, signal integral of pulse, bunch fluence, pulse fluence, bunch intensity, pulse intensity, bunch charge, pulse charge, bunch dose, pulse dose, bunch current, pulse current, bunch dose rate, pulse dose rate, mean current, mean dose rate, bunch shape, pulse shape, noise level within bunch, noise level within pulse, bunch repetition rate, pulse repetition rate, cumulative dose, cumulative exposure time, and total delivery time, or any combination thereof. The digitized beam signal can be negative. The digitized beam signal can be positive. The digitized beam signal can be multi-channel data responsive to two or more channels of the digital oscilloscope being used concurrently to receive the time resolved signals. The method can also include generating, by the one or more processors, a notification to a user indicating that at least one of the plurality of pulses exceeds a threshold.BRIEF DESCRIPTION OF THE DRAWINGS

[0001] FIG. 1 depicts a schematic diagram of an example of a beam control and monitoring system.

[0002] FIG. 2 depicts an example user interface for the beam control and monitoring system.

[0003] FIG. 3 is a graph of example digitized beam signal including a trigger value.

[0004] FIG. 4 is a graph of example beam signal analysis.

[0005] FIG. 5 depicts a block diagram of an example method for a beam control and monitoring system.DETAILED DESCRIPTION

[0006] Following below are more detailed descriptions of various concepts related to, and implementations of, methods, apparatuses, and systems of beam control and monitoring systems. The various concepts introduced above and discussed in greater detail below can be implemented in any of numerous ways.Atty. Dkt. No. 642631-0108 (MDA24-117PC)

[0007] To achieve precise and reliable delivery of radiation, beam formers typically house a beam detector and a beam monitoring and control system. This system records beam signals in real-time from the beam detector, extracts beam parameter data such as the mean dose rate and total dose, and controls (e.g. stops) the beam once the prescribed dose has been delivered, or if the measured parameters surpass a set threshold or deviate too far from a set value. In certain implementations, the system can also log information of the beam delivery, such as the time of delivery, the desired and measured beam parameters, and any errors that may have occurred. This logging step is critical for retrospective review of patient treatments, measurement of machine performance over time, and quality assurance in case of any errors.

[0008] The FLASH effect refers to a mean dose rate of RT treatment of greater than 40 Gray per second (Gy / s), which may lead to reduced normal tissue damage without sacrificing damage to cancer tissue. The use of ultra-high dose rates (UHDRs) to elicit this effect has become known as FLASH-RT. FLASH-RT holds great potential to improve RT in comparison to conventional RT (CONV-RT) by a) reducing toxic side effects, b) increasing the ability of RT to damage cancer tissue, c) reducing treatment times and thereby allowing for more patients to be treated and improved patient experience, and d) reducing the adverse effects of patient or patient organ movement during treatment. Although the definition of FLASH-RT is often stated as any mean dose rate greater than 40Gy / s, this has not proven to reliably elicit the FLASH effect, and it has been demonstrated that complex dependencies of the effect reply on a large variety of beam parameters besides just the mean dose rate.

[0009] Moreover, the technologies required to a) create new or modify existing beam formers to deliver radiation at UHDRs and b) detect UHDR radiation beams are still imperfect and developing, posing yet another challenge to FLASH-RT. The fulfillment of FLASH-RT’s potential in clinical settings depends on reliable control of UHDR beams, a robust understanding of how UHDR beam parameters affect FLASH-RT, and consistent and complete reporting of relevant information of FLASH-RT. The safety requirements for FLASH-RT are also necessarily higher than for CONV-RT (e.g., conventional radiotherapy) due to the short duration of radiation delivery. CONV-RT is usually delivered, in the case of electron linear accelerators, over thousands of pulses lasting minutes, where manual interruption of the beam by the observing treatment team is possible and variations in the radiation delivered per pulse is acceptable. On the other hand, FLASH-RT typicallyAtty. Dkt. No. 642631-0108 (MDA24-117PC) comprises only one or a few pulses delivered faster than human reaction time, where the parameters of each pulse should be strictly controlled.

[0010] This strongly motivates the development of a beam monitoring and control (BM&C) system for UHDR beams. The existing systems for CONV-RT are inadequate for UHDR beam formers because a) conventional beam detectors do not function at UHDRs and b) many new parameters besides the mean dose rate and total dose must be included. Beam control and monitoring systems in accordance with the present disclosure can a) receive desired beam parameters set by the user, b) record beam data live from an UHDR beam detector, c) extract all relevant beam parameters from the beam data, to make and execute beam control decisions based on the measured beam parameters and the user-set beam parameters, e) present all information to the user in a user-friendly format, and f) save the beam data, the beam parameters, and any information relevant to the beam delivery. The UHDR BM&C system should also function on a conventional beamline, as experiments at UHDR typically require reference measurements at conventional dose rates.

[0011] UDHRs can include beams with mean dose rates greater than about 40Gy / s. A beam former capable of delivering radiation beams at UHDRs is an UHDR beam former. A UHDR beam former may also be capable of delivering conventional dose rate beams as well. A beam detector capable of measuring an UHDR radiation beam while maintaining a signal proportional to the output of the beam former is a UHDR beam detector. An UHDR beam detector may also be capable of measuring conventional dose rate beams as well.

[0012] Beam control and monitoring systems in accordance with the present disclosure can automatically capture and archive beam parameter data from each beam delivery of any beam former such as, but not limited to, a linear accelerator, ultra-high dose rate pulsed electron linear accelerator (UDHR LINAC) or a CONV-RT modality. The beam parameter data can include, but not limited to, beam current, total charge, charge-per-pulse, pulse width, pulse repetition frequency, and the number of pulses. The beam control and monitoring system can provide an interface for the user to input beam control parameters for the beam former, can automatically save the beam parameter data received and captured from each beam delivery, and also provide an interface to display for the user the beam parameter data of the beam delivery. The beam control and monitoring system allows the user to monitor and view pulse data in real-time (e.g., while the beam former is delivering the beam). To do so, the beam control and monitoring system can process signals to retrieve beam parameter data for the user to review and also alert the user to any errors in delivery,Atty. Dkt. No. 642631-0108 (MDA24-117PC) variances in beam output, etc. The beam control and monitoring system can also make decisions based on the measured beam parameter data to control the beam former, e.g., to stop the beam or to modify subsequent pulses in the beam delivery.

[0013] In some implementations, a highly time-resolved current transformer (e.g., a type of beam detector) is coupled to a signal analyzer (e.g., a digital oscilloscope) which receives the time-resolved beam detector signals and generates a digitized beam signal for a computing system to process. The computing system then analyzes the beam signal and extracts beam parameter data for the user to view.

[0014] In some implementations, the computing system may first store beam signal received from the signal analyzer and then analyze the beam signal. The computing system can detect and extract beam parameter data from the beam signal provided by the signal analyzer for view on an interface. The computing system may display results as the results (e.g., charge-per-pulse) are calculated from the beam signal. In some implementations, the computing system may notify the user of any issues. For example, responsive to at least one of the values of the beam parameter data exceeding a threshold, the computing system provides a notification to the interface for the user to view. The computing system may run continuously without user input to store and process data. The user can also store notes on the pulse data as well as extract historic data (e.g. data form previous beam deliveries) from the computing system. Stored data in the computing system may include the beam parameter data as well as metadata, such as time and date of beam signal analysis and measurement.

[0015] FIG. 1 depicts an example of a system 100 for controlling and monitoring beams The system 100 can be used, for example, to perform more effective control of beam generation, output, monitoring, and / or signal processing, such as to allow for time-resolved beam parameter data to be detected and processed.

[0016] The system 100 includes one or more processors 102 and memory 104, which can be implemented as one or more processing circuits. The processor 102 may be a general purpose or specific purpose processor, an application specific integrated circuit (ASIC), one or more field programmable gate arrays (FPGAs), a group of processing components, or other suitable processing components. The processor 102 may be configured to execute computer code or instructions stored in memory 104 (e.g., fuzzy logic, etc.) or received from other computer readable media (e.g., CDROM, network storage, a remote server, etc.)Atty. Dkt. No. 642631-0108 (MDA24-117PC) to perform one or more of the processes described herein. The processor 102 can be implemented as a hardware processor including a Central Processing Unit (CPU), an Application-Specific Integrated Circuit (ASIC), an Application-Specific Instruction-Set Processor (ASIP), a Graphics Processing Unit (GPU), a Physics Processing Unit (PPU), a Digital Signal Processor (DSP), a Field Programmable Gate Array (FPGA), a Programmable Logic Device (PLD), a Controller, a Microcontroller unit, a Processor, a Microprocessor, an ARM, or the like, or any combination thereof. The memory 104 may include one or more data storage devices (e.g., memory units, memory devices, computer- readable storage media, etc.) configured to store data, computer code, executable instructions, or other forms of computer-readable information. The memory 104 may include random access memory (RAM), read-only memory (ROM), hard drive storage, temporary storage, non-volatile memory, flash memory, optical memory, or any other suitable memory for storing software objects and / or computer instructions. The memory 104 may include database components, object code components, script components, or any other type of information structure for supporting the various activities and information structures described in the present disclosure. The memory 104 may be communicably connected to the processor 102 and may include computer code for executing (e.g., by processor 102) one or more of the processes described herein. The memory 104 can include various modules (e.g., circuits, engines) for completing processes described herein. The one or more processors 102 and memory 104 may include various distributed components that may be communicatively coupled by wired or wireless connections; for example, various portions of system 100 may be implemented using one or more client devices remote from one or more server devices.

[0017] The system 100 includes at least one beam former 106. The beam former 106 can generate a beam, such as an electron beam. The beam former 106 can generate the beam to include one or more pulses (e.g., according to control parameters provided to the beam former 106). The beam former 106 can be a device capable of generating a beam of radiation by accelerating one or more temporally separated bunches of radiation, such as but not limited to, an electron linac (e.g., radiation temporally separated into macro-pulses, which each include temporally separated micro-pulses), a photon beam from a linac (e.g., similar temporal structure as an electron linac), a proton synchrotron (e.g., radiation is delivered in a spill including single bunch which may be multiple seconds in duration). A bunch is a component of the microstructure of a beam. A cluster of particles with a lengthAtty. Dkt. No. 642631-0108 (MDA24-117PC) typically femtosecond to nanosecond is generated by an electron or ion source. The pulse includes a series of bunches, with a frequency related to that of the accelerating radiofrequency or the emitting particle source. A pulse is a component of a macrostructure of a beam. The pulse corresponds to a train of bunches (e.g., bunch train) with a length usually in the range from microseconds to milliseconds. Depending on the characteristics of the beam former 106, the delivery of a beam can include a single or multiple pulses. Cyclotrons (CYC) (e.g., a type of the beam former 106), for example, provide a quasi- continuous beam (“bunch train”) due to very high bunch repetition frequency (e.g., pulse repetition frequency (PRF) of about 70 megahertz (MHz)) and a delivered beam consists of a single pulse. Similarly, synchrotrons (S) (e.g., a type of the beam former 106) accelerate particles that can be extracted continuously during a time frame from milliseconds to seconds.

[0018] The beam former 106 can include, for example and without limitation, a linear accelerator (linac) and / or ultra-high dose rate linac (UHDR LINAC). The beam former 106 can perform FLASH radiotherapy (FLASH-RT). The beam former 106 can be a conventional electron linac modified to generate UDHRs.

[0019] The beam former 106 can use electromagnetic waves to accelerate charged particles to form beams. These beams can be used, for example, to destroy cancer cells while mitigating damage to surrounding healthy tissue. The beam former 106 can form beams at ultra-high dose rates (e.g., 40 Gray per second (Gy / s)) in a short delivery time (e.g., milliseconds).

[0020] The beam former 106 can be communicatively coupled to the processor 102. The processor 102 can control operation of the beam former 106, such as based on retrieving parameters for operation of the beam former 106 from a protocol or other data structured maintained in memory 104, or responsive to user input. For example, a user may input parameters for the beam former 106 which are then communicated by the processor 102. The parameters can include, for example, a number of pulses, a time period, dose rate, etc. In some implementations, the user directly inputs the parameters onto the beam former 106 via a user interface coupled to the beam former 106.

[0021] The system 100 includes at least one beam controller 108. The beam controller 108 may be communicatively coupled to the processor 102 and coupled to the beam former 106,Atty. Dkt. No. 642631-0108 (MDA24-117PC) such as to allow for a user to control the beam former 106 via the beam controller 108. The processor 102 can control operation of the beam controller 108.

[0022] The beam controller 108 can include one or more electronic and / or mechanical components that can control generation and / or output of the beam by the beam former 106. For example, the beam controller 108 can include a gating box configured to modify the generation and / or output of the beam. The gating box may be external of the beam former 106 and can include one or more circuits to allow the beam former 106 to deliver radiation responsive to the one or more circuits being turned on. The beam controller 108 can include a microcontroller coupled to the one or more circuits, and communicatively coupled to the processor 102. The one or more circuits may be set to off as default, and the microcontroller can switch the one or more circuits to on responsive to instruction by the processor 102 to allow radiation from the beam former 106. The beam controller 108 can thus allow the beam former 106 to output beams and stop the beam former 106 from outputting beams.

[0023] The system 100 includes at least one beam detector 110. The beam detector 110 is a device capable of generating a temporally resolved (e.g., time-resolved, etc.) electrical signal proportional to the particle flux of the radiation beam the beam detector 110 is measuring from the beam former 106. The temporally resolved electrical signal measures how the signal changes over time, such as the signal changes being proportional to changes in the particle flux of the radiation beam over the time of measurement. Temporally resolved thus refers to a time revolution of the signal, or how the signal changes over time. The beam detector 110 can include, but not limited to, a current transformer, an ionization chamber, a semiconductor, a photodiode, a scintillator. The beam detector 110 may measure any beam, such as but not limited to UDHR beams. The time resolution (e.g., shortest time interval which the beam detector 110 can distinguish two events, such as fluctuations of the beam current) of the beam detector 110 can be less than half the duration of the temporal structure of interest of the beam. In some implementations, the time resolution of the beam detector 110 is at least 10 times less than the duration of the temporal structure of interest in the beam (e.g. responsive to the structure of interest being an electron pulse about 1 microseconds (us), then time resolution is less than O.lus).

[0024] The beam detector 110 may be a highly time-resolved (e.g., time resolution on an order of nanoseconds or picoseconds) beam current transformer (BCT) to measure the beam generated by the beam former 106. The beam detector 110 may be coupled to the beam former 106. For example, the beam former 106 may, instead of including an internal ionAtty. Dkt. No. 642631-0108 (MDA24-117PC) chamber to detect beam parameter data such as the total charge and control the beam, include the beam detector 110 to measure the beam signal and the beam controller 108 to start and / or stop the beam. The beam detector 110 generates a signal proportional to the current or number of charged particles passing through the beam detector 110. The beam detector 110 outputs highly-time resolved signals representative of the temporal structure of the beam. In some embodiments, the beam detector 110 includes an aperture. The beam formed by the beam former 106 travels through the aperture, allowing the beam detector 110 to measure the beam.

[0025] The beam controller 108 may make control decisions (e.g., switch on or off) based on output from the beam detector 110. For example, the beam controller 108 receives beam information and based on the beam information, stops the beam former 106. The beam controller 108 can make the control decision based on any number of beam parameters, such as number of pulses and timing of pulses.

[0026] The system 100 includes at least one signal analyzer 112 (e.g., oscilloscope, digitizer, etc.) The signal analyzer 112 is a device capable of converting an analog signal from the beam detector 110 to a digital signal. For example, the signal analyzer 112 can digitize the signal from the beam. The signal analyzer 112 is coupled to the beam detector 110 to receive the highly-time resolved signals from the beam detector 110, and digitizes (e.g., converts) the highly-time resolved signals into the pulse information for the processor 102 to store, process, and analyze.

[0027] The beam detector 110 and the signal analyzer 112 may continuously (e.g., at a high rate of predetermined sampling) provide the processor 102 with the beam signal as the beam former 106 is forming and delivering beams. The signal analyzer 112 may be triggered responsive to the beam detector 110 surpassing a threshold trigger value for a threshold trigger duration. Upon triggering, the signal analyzer 112 saves digitized beam signal to, for example, the memory 104. The signal analyzer 112 may save the digitized beam signal for each pulse measured by the beam detector 110 or once a first pulse of a train of pulses is measured by the beam detector 110. The signal analyzer 112 may include one or more channels, enabling a plurality of the beam detector 110 to be coupled to the signal analyzer 112. In some implementations, the system 100 includes a second beam detector. In this case, both beam detectors are coupled to the signal analyzer 112 through a first channel and a second channel. The beam detectors may be placed at different locations along the beamAtty. Dkt. No. 642631-0108 (MDA24-117PC) path. Output from both of the beam detectors may be received and analyzed by the signal analyzer 112 and provided to the processor 102.

[0028] The processor 102 and / or the memory 104 may store the beam signal (e.g., in the memory 104) as the beam signal is being received from the signal analyzer 112. Following storage of the beam signal, the processor 102 can analyze the beam signal and while analyzing, display extracted beam parameter data on a user interface. For example, the beam former 106 may continuously generate pulses with time periods (e.g., milliseconds) in between each pulse. The beam detector 110 can be continuously measuring the signal over a time the beam former 106 is generating pulses. As such, the beam signal may include times where no pulse is being generated. To extract the pulse data for each of the pulses, the processor 102 can detect each of the pulses within the beam signal.Responsive to processing of the beam signal, the processor 102 can cause presentation of the beam parameter data (e.g., to allow for real-time or near real-time display). The processor 102 may be communicative coupled to a beam control interface 114. The beam control interface 114 may include a user interface and receive inputs from the user to view the beam parameter data and control the beam detector 110. The beam control interface 114 may include a display, such as a tablet, a mobile phone, a television, or a laptop, among others. The user can also control the beam controller 108 via the beam control interface 114. For example, the beam control interface 114 can allow a user to view the pulse data as it is being output (e.g., on a graph). The beam parameter data can include at least one of dose rate, number of pulses, pulse rate frequency, pulse width, a calibration factor, time, and date of the electron beam as seen in Table 1. The beam control interface 114 can also allow the user to input parameters for the beam. For example, the processor 102 can record signal data to include one or more parameters as represented in Table 1, such as to facilitate detecting greater information and / or more precise information due to use of the beam detector 110.Table 1 : Example of Measured Beam Parameter Data of Multiple Beam DeliveriesAtty. Dkt. No. 642631-0108 (MDA24-117PC)

[0029] The processor 102 may continually monitor for beam signal data files saved by the signal analyzer 112. The pulse information is included in the beam signal data files. Upon detecting a new file, the processor 102 can extract the beam parameter data (e.g., pulse data, beam data) from the beam signal data file and update the beam control interface 114 with the beam parameter data. The processor 102 may include a rule-based algorithm to extract the data.

[0030] For example, the processor 102 may open a beam signal data file, and detect channels within the beam signal data file. Once the channels are detected, the processor 102 can identify individual pulses in the data by searching contiguous segments of signal intensity above a threshold value. The threshold value may be predetermined or input by the user. In some implementations, the processor 102 determines the threshold value by detecting a noise level of the signal and determining the threshold value based on the noise level. The processor 102 then records a number of pulses identified. For each pulse, the processor 102 can record and determine the maximum signal height, the full-width at halfmaximum (FWHM), start time, regions beyond the FWHM on either side of the pulse, mean signal intensity of the regions (e.g., to define a baseline signal about the pulse), a mean baseline signal value and its variation, and a baseline signal value subtracted from the pulse signal. The processor 102 can also fit the pulse to an analytical form to describe a square pulse (e.g., an expected shape) and its deviation from the fit is determined and recorded as well as an integral of the baseline-subtracted pulse signal.

[0031] The processor 102 can determine any number of beam parameter data from the beam signal data files, including but not limited to, detector signal noise level, number of bunches, number of pulses, duty cycle, FWHM of bunch (e.g., bunch width), FWHM of pulse, signal integral of bunch, signal integral of pulse, bunch fluence, pulse fluence, bunchAtty. Dkt. No. 642631-0108 (MDA24-117PC) intensity, pulse intensity, bunch charge, pulse charge, bunch dose, pulse dose, bunch current, pulse current, bunch dose rate, pulse dose rate, mean current, mean dose rate, bunch shape (e.g. deviation from square shape), pulse shape, noise level within bunch, noise level within pulse, bunch repetition rate, pulse repetition rate, cumulative charge / dose, cumulative exposure time, and total delivery time.

[0032] The processor 102 also determines and records the mean time between subsequent pulses and its variation (e.g., PRF) and a variation in FWHM and an integral per pulse over all the identified pulses. Based on user-specified calibration values (e.g., the threshold value), the integral of each pulse’s signal can be converted into a charge per pulse or a dose per pulse. For example, the user may specify a gain of the beam detector 110 as 300 milliamp per volt (mA / V), which can then be used to convert the integrated signal intensity of each pulse into the charge per pulse. Additionally, the user may have measured the dose delivered to a target and deduced a calibration value of dose per charge (Gy / C), which can then be used to convert the charge per pulse into a dose per pulse. With such calibration factors in place, the user can specify a desired dose threshold (e.g., lOGy), and the system 100 controls the beam to achieve the desired dose threshold.

[0033] From the per-pulse parameters (e.g., charge per pulse or dose per pulse), the pulse current or pulse dose rate of each pulse can be calculated. Additionally, parameters relating to the mean current, mean dose rate, or a duty cycle of the beam can be calculated from the beam data files. Based on the user-specified thresholds, the user may be warned of any deviations of recorded parameters from a set value. For example, responsive to the recorded parameter surpassing a deviation threshold related to the set value, the processor 102 generates a notification for display to the beam control interface 114. Responsive to any of the measured values exceeding the user-specified values (e.g. number of pulses, total dose), or surpassing the deviation threshold, a signal is sent from the processor 102 to the beam controller 108 to halt the beam delivery of the beam former 106. Additionally, a timer can be employed, such that responsive to the expected number of pulses not being detected within a predetermined time frame, the beam delivery is terminated. This serves as a protective measure in the case of failures in beam detection. After each delivery, all recorded parameters, as well as any warnings, are saved in a table and a log file and the beam control interface 114 is updated. The beam controller 108 may halt the beam delivery between pulses and / or bunches depending on the temporal structure of the beam based on the beam information extracted by the processor 102. In some implementations, instead ofAtty. Dkt. No. 642631-0108 (MDA24-117PC) halting the beam delivery, the delivery parameters of the beam former 106 can be adjusted by the beam controller 108 to ensure the subsequent pulses are turned to achieve the desired parameters.

[0034] In some implementations, the system 100 does not include the signal analyzer 112. In this case, the beam controller 108 receives and processes beam data from the beam detector 110. The beam controller 108 can include a signal analyzer (e.g., oscilloscope) and can directly execute control decisions for the beam former 106. The beam controller 108 can be directly coupled to the processor 102 and receive user-input via the beam control interface 114, display beam parameter data on the beam control interface 114, and save beam parameter data into the memory 104.

[0035] FIG. 2 depicts an example of a user interface 200 for the beam control and monitoring system. The user interface 200 may be displayed on the beam control interface 114. The user interface 200 can be generated responsive to operation of the system 100. For example, the system 100 can generate the user interface 200 to represent at least one of parameters of the beam as generated by the beam former 106 and / or parameters of the signal data detected using the beam detector 110. The system 100 can generate the user interface 200 automatically, such as to update the user interface 200 to present a subset of most recent detected data (e.g., to process beam signal from the beam delivery and display results as a running table). The system 100 can monitor the signal data relative to one or more alert conditions and cause the user interface 200 to present an alert responsive to the one or more alert conditions being satisfied. The system 100 can map each entry in the user interface 200 to a corresponding data structure, such as to retrieve the data structure responsive to detecting a selection of the entry (e.g., this can allow the user to make notes on any delivery, which can be archived, and to retrieve, using the system 100, more specific data and / or charts regarding a given past delivery).

[0036] FIG. 3 depicts examples of charts 300 of beam signal. The charts 300 may be presented by the beam control interface 114. As depicted in FIG. 3, the beam signal can be represented as signal values over time. The system 100 can process the beam signal to detect pulses. In some implementations, the system 100 can detect pulses automatically, e.g., by applying one or more signal processing operations to detect a noise floor of the beam signal, and to detect the pulses responsive to detecting the noise floor. In some implementations, the system 100 can detect pulses responsive to receiving a trigger value (e.g., dashed line as depicted in FIG. 3) indicative of distinguishing pulse data from noiseAtty. Dkt. No. 642631-0108 (MDA24-117PC) data. For example, this can allow a user to specify a trigger value, or ‘auto-detect’ may be selected, in which case the system 100 can identify the noise floor and can determine a trigger value to use to detect pulses.

[0037] Referring further to FIG. 1 and to FIGS. 3 and 4, the system 100 can process data from multiple channels of signal analyzer 112 (e.g., the digital oscilloscope), including to allow for concurrent processing. For example, the system 100 can include or be coupled with a plurality of beam detectors 110 or other detectors, which can be useful for detector characterization. The system 100 can detect pulses from the beam signal that may be positive or negative.

[0038] Responsive to detection of pulses in multi-channel delivery data, the system 100 (e.g., signal analyzer 112) can analyze each pulse (e.g., using an algorithm) to determine, for example, the charge per pulse and the full-width at half maximum. This can account for noise within the signal and for any baseline noise the pulse signal may be riding upon. In some implementations, as depicted in chart 400 of FIG. 4, the system 100 applies (e.g., fits) a square wave pulse form to the pulse and the values of the pulse (e.g., compared with the computed values of the pulse). As such, any significant mismatches may indicate a problematic pulse form, which the system 100 can generate the alert to indicate to notify the user.

[0039] FIG. 5 depicts an example method 500 for beam monitoring and / or control. The method 500 can be performed using any of various systems and devices described herein, including but not limited to the system 100. The method 500 can be used to generate beams, to control output of beams, and / or to process signal data received responsive to output of beams. For example, the method 500 can be performed to mitigate reliability and / or parameter reporting issues, such as to allow for more effective beam control and / or time- resolved beam signal detection.

[0040] At 502, a beam former can be caused to generate a beam (e.g., a radiation beam, that includes a plurality of charged particles). The beam can be generated responsive to initiation of a testing or treatment protocol. The beam former can be triggered responsive to user input indicative of the protocol. For example, one or more control parameters for operation of the beam former can be included in a control signal provided to the beam former, which can cause the beam former or to operate according to the one or more control parameters.Atty. Dkt. No. 642631-0108 (MDA24-117PC)

[0041] At 504, a signal associated with the beam can be measured. For example, a beam detector, such as a current transformer, can be arranged to measure a time-resolved signal from the beam. This can allow for more precise evaluation of data represented by the beam.

[0042] At 506, the signal can be processed to generate digitized beam signal. For example, a signal analyzer, such as a digital oscilloscope, can receive the signal (e.g., the time- resolved signal) from the beam detector, and can generate beam signal data as a digital representation of the signal. The beam signal can include, for example, data representative of magnitude of the beam current as a function of time. The beam signal can correspond to parameters of the protocol for generation and / or output of the beam, as well as detected features of the beam, such as pulses, charge, pulse repetition frequency, and / or full width at half maximum (FWHM), among other signal processing statistics.

[0043] At 508, the beam signal can be analyzed. For example, the beam signal can be processed to detect one or more parameters represented by the beam signal, such as beam parameter data. This can include, for example, detecting pulses and / or statistics regarding pulses such as charge per pulse and / or FWHM. In some implementations, multiple channels of beam data (e.g., based on operation of multiple detectors) can be used, such as for detector characterization.

[0044] At 510, in the case of a pulsed beam from the beam former, the pulses can be evaluated according to pre-defined conditions. For example, a square wave can be fit to each pulse in the beam signal and can be used to detect a condition for alerting problematic pulse form. In other implementations, the threshold is input by a user.

[0045] At 512, the operation of the beam former can be terminated. For example, responsive to completion of the protocol and / or an instruction (e.g., received via user input), the operation can be terminated. As another example, responsive to the beam parameter data exceeding a pre-defined threshold, the operation can be terminated.

[0046] References herein to the positions of elements (e.g., “top,” “bottom,” “above,” “below”) are merely used to describe the orientation of various elements in the FIGURES. The orientation of various elements can differ according to other illustrative implementations, and that such variations are intended to be encompassed by the present disclosure. References herein to the order of elements (e.g., “first,” “second,” “third,” “fourth,” “fifth,” “sixth,” “seventh”) are merely used for ease of description relative to each element in the FIGURES.Atty. Dkt. No. 642631-0108 (MDA24-117PC)

[0047] While operations are depicted in the drawings in a particular order, such operations are not required to be performed in the particular order shown or in sequential order, and all illustrated operations are not required to be performed. Actions described herein can be performed in a different order.

[0048] Having now described some illustrative implementations, it is apparent that the foregoing is illustrative and not limiting, having been presented by way of example. In particular, although many of the examples presented herein involve specific combinations of method acts or system elements, those acts, and those elements can be combined in other ways to accomplish the same objectives. Acts, elements and features discussed in connection with one implementation are not intended to be excluded from a similar role in other implementations.

[0049] The phraseology and terminology used herein is for the purpose of description and should not be regarded as limiting. The use of “including” “comprising” “having” “containing” “involving” “characterized by” “characterized in that” and variations thereof herein, is meant to encompass the items listed thereafter, equivalents thereof, and additional items, as well as alternate implementations consisting of the items listed thereafter exclusively. In one implementation, the systems and methods described herein consist of one, each combination of more than one, or all of the described elements, acts, or components.

[0050] Any references to implementations or elements or acts of the systems and methods herein referred to in the singular can also embrace implementations including a plurality of these elements, and any references in plural to any implementation or element or act herein can also embrace implementations including only a single element. References in the singular or plural form are not intended to limit the presently disclosed systems or methods, their components, acts, or elements to single or plural configurations. References to any act or element being based on any information, act or element can include implementations where the act or element is based at least in part on any information, act, or element.

[0051] Any implementation disclosed herein can be combined with any other implementation or embodiment, and references to “an implementation,” “some implementations,” “one implementation” or the like are not necessarily mutually exclusive and are intended to indicate that a particular feature, structure, or characteristic described in connection with the implementation may be included in at least one implementation orAtty. Dkt. No. 642631-0108 (MDA24-117PC) embodiment. Such terms as used herein are not necessarily all referring to the same implementation. Any implementation may be combined with any other implementation, inclusively or exclusively, in any manner consistent with the aspects and implementations disclosed herein.

[0052] References to “or” may be construed as inclusive so that any terms described using “or” may indicate any of a single, more than one, and all of the described terms. References to at least one of a conjunctive list of terms may be construed as an inclusive OR to indicate any of a single, more than one, and all of the described terms. For example, a reference to “at least one of ‘A’ and ‘B’” can include only ‘A’, only ‘B’, as well as both ‘A’ and ‘B’. Such references used in conjunction with “comprising” or other open terminology can include additional items.

[0053] Where technical features in the drawings, detailed description or any claim are followed by reference signs, the reference signs have been included to increase the intelligibility of the drawings, detailed description, and claims. Accordingly, neither the reference signs nor their absence have any limiting effect on the scope of any claim elements. Modifications of described elements and acts such as variations in sizes, dimensions, structures, shapes and proportions of the various elements, values of parameters, mounting arrangements, use of materials, colors, orientations can occur without materially departing from the teachings and advantages of the subject matter disclosed herein. For example, elements shown as integrally formed can be constructed of multiple parts or elements, the position of elements can be reversed or otherwise varied, and the nature or number of discrete elements or positions can be altered or varied. Other substitutions, modifications, changes and omissions can also be made in the design, operating conditions and arrangement of the disclosed elements and operations without departing from the scope of the present disclosure.

[0054] The present disclosure contemplates methods, systems and program products on any machine-readable media for accomplishing various operations. The implementations of the present disclosure may be implemented using existing computer processors, or by a special purpose computer processor for an appropriate system, incorporated for this or another purpose, or by a hardwired system. Implementations within the scope of the present disclosure include program products comprising machine-readable media for carrying or having machine-executable instructions or data structures stored thereon. Such machine- readable media can be any available media that can be accessed by a general purpose orAtty. Dkt. No. 642631-0108 (MDA24-117PC) special purpose computer or other machine with a processor. By way of example, such machine-readable media can comprise RAM, ROM, EPROM, EEPROM, CD-ROM or other optical disk storage, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to carry or store desired program code in the form of machine-executable instructions or data structures and which can be accessed by a general purpose or special purpose computer or other machine with a processor. When information is transferred or provided over a network or another communications connection (either hardwired, wireless, or a combination of hardwired or wireless) to a machine, the machine properly views the connection as a machine-readable medium. Thus, any such connection is properly termed a machine-readable medium. Combinations of the above are also included within the scope of machine-readable media. Machine-executable instructions include, for example, instructions and data which cause a general-purpose computer, special purpose computer, or special purpose processing machines to perform a certain function or group of functions.

[0055] Systems and methods described herein may be embodied in other specific forms without departing from the characteristics thereof. Further relative parallel, perpendicular, vertical or other positioning or orientation descriptions include variations within + / -10% or + / -10 degrees of pure vertical, parallel or perpendicular positioning. References to “approximately,” “about” “substantially” or other terms of degree include variations of + / - 10% from the given measurement, unit, or range unless explicitly indicated otherwise. Coupled elements can be electrically, mechanically, or physically coupled with one another directly or with intervening elements. Scope of the systems and methods described herein is thus indicated by the appended claims, rather than the foregoing description, and changes that come within the meaning and range of equivalency of the claims are embraced therein.

Claims

Atty. Dkt. No. 642631-0108 (MDA24-117PC)WHAT IS CLAIMED IS:

1. A system comprising: a beam former to deliver a radiation beam; a beam controller coupled to the beam former to start and stop the radiation beam; a beam detector coupled to the beam former, the beam detector to measure time resolved signals of the radiation beam; a signal analyzer to digitize the time resolved signals received from the beam detector; and a computing system comprising one or more processors communicatively coupled to the beam controller to start and stop the radiation beam and to the signal analyzer to extract beam parameter data from a digitized beam signal, the computing system to stop the radiation beam responsive to determining that the beam parameter data exceeds a threshold.

2. The system of claim 1, wherein the computing system comprises at least one algorithm to process and analyze the digitized beam signal.

3. The system of claim 1, wherein the computing system is configured to determine at least one of charge-per-pulse, a full-width at half maximum, a maximum signal height, a start time, a mean signal intensity, and a baseline signal intensity for each pulse of the radiation beam.

4. The system of claim 1, wherein the computing system detects individual pulses within the digitized beam signal by comparing signal intensity of the digitized beam signal with a threshold value, the threshold value based on at least one of user input or a noise level of the digitized beam signal.

5. The system of claim 1, wherein the computing system detects pulses from the digitized beam signal and fits a square wave pulse form for each pulse and responsive to the square wave pulse form exceeding a threshold, generates a notification to a user.

6. The system of claim 1, wherein the beam detector continuously measures time resolved signals for the signal analyzer to digitize and the computing system to store and process.Atty. Dkt. No. 642631-0108 (MDA24-117PC)7. The system of claim 1, wherein the beam parameter data includes at least one of detector signal noise level, number of bunches, number of pulses, duty cycle, full-width at half maximum of bunch, full-width at half maximum of pulse, signal integral of bunch, signal integral of pulse, bunch fluence, pulse fluence, bunch intensity, pulse intensity, bunch charge, pulse charge, bunch dose, pulse dose, bunch current, pulse current, bunch dose rate, pulse dose rate, mean current, mean dose rate, bunch shape, pulse shape, noise level within bunch, noise level within pulse, bunch repetition rate, pulse repetition rate, cumulative dose, cumulative exposure time, and total delivery time, or any combination thereof.

8. The system of claim 1, wherein the digitized beam signal is negative.

9. The system of claim 1, wherein the digitized beam signal is positive.

10. The system of claim 1, wherein the signal analyzer generates multi-channel digitized beam signal data responsive to two or more channels of the signal analyzer being used concurrently to receive the time resolved signals.

11. The system of claim 1, wherein the beam former comprises a linear accelerator.

12. A method compri sing : causing, by one or more processors, a beam former to generate a radiation beam; measuring, by a beam detector, time resolved signals from the radiation beam; transforming, by a signal analyzer, the time resolved signals into a digitized beam signal; extracting, by the one or more processors, beam parameter data from the digitized beam signal to detect each of a plurality of pulses of the radiation beam; comparing, by the one or more processors, each of the plurality of pulses to a threshold defined by a computed value of each of the plurality of pulses; and causing, by the one or more processors, the beam former to stop generating the radiation beam responsive to at least one of the plurality of pulses exceeding the threshold.

13. The method of claim 12, wherein the one or more processors detect individual pulses within the digitized beam signal by comparing signal intensity of the digitized beamAtty. Dkt. No. 642631-0108 (MDA24-117PC) signal with a threshold value, the threshold value based on at least one of user input or a noise level of the digitized beam signal.

14. The method of claim 12, wherein the beam parameter data is extracted by an algorithm, the algorithm to analyze the digitized beam signal to extract at least one of charge-per-pulse, a full-width at half maximum, a maximum signal height, a start time, a mean signal intensity, and a baseline signal intensity for each of the pulses of the radiation beam.

15. The method of claim 14, wherein the one or more processors fit a square wave pulse form to the radiation beam to determine that at least one of the plurality of pulses exceeds a threshold.

16. The method of claim 14, wherein the beam parameter data includes at least one of detector signal noise level, number of bunches, number of pulses, duty cycle, full-width at half maximum of bunch, full-width at half maximum of pulse, signal integral of bunch, signal integral of pulse, bunch fluence, pulse fluence, bunch intensity, pulse intensity, bunch charge, pulse charge, bunch dose, pulse dose, bunch current, pulse current, bunch dose rate, pulse dose rate, mean current, mean dose rate, bunch shape, pulse shape, noise level within bunch, noise level within pulse, bunch repetition rate, pulse repetition rate, cumulative dose, cumulative exposure time, and total delivery time, or any combination thereof.

17. The method of claim 12, wherein the digitized beam signal is negative.

18. The method of claim 12, wherein the digitized beam signal is positive.

19. The method of claim 12, wherein the digitized beam signal is multi-channel data responsive to two or more channels of the signal analyzer being used concurrently to receive the time resolved signals.

20. The method of claim 12, further comprising generating, by the one or more processors, a notification to a user indicating that at least one of the plurality of pulses exceeds a threshold.

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