Plating device and plating method
The plating apparatus and method address the challenge of non-uniform bump height by employing a controlled plating current with adjusted pause periods to manage accelerator molecule adsorption, ensuring consistent bump formation despite variations in photoresist layer openings.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- EBARA CORP
- Filing Date
- 2024-12-10
- Publication Date
- 2026-06-18
AI Technical Summary
Existing plating technologies struggle to form multiple bumps on a substrate at a uniform height due to variations in the height of the bumps caused by differences in the size and density of openings in the photoresist layer.
A plating apparatus and method that utilizes a controlled plating current with a repeating cycle of positive, reverse, and pause periods, adjusting the length of the pause period to maintain a predetermined fluctuation range of the plating voltage, ensuring uniform bump height by managing the adsorption and desorption of accelerator molecules.
The solution effectively maintains uniform bump height by controlling the plating current pause period, compensating for variations in the photoresist layer openings, resulting in consistent bump formation throughout the plating process.
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