Time domain reflectometry (TDR) controlled-impedance testing systems for significantly low impedance applications
The TDR system with ultra-wide traces and balanced multilayer PCBs addresses the challenge of measuring low impedances, achieving accurate and sensitive impedance characterization in high-frequency applications.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- BRILLOUIN ENERGY CORP
- Filing Date
- 2025-12-11
- Publication Date
- 2026-06-18
AI Technical Summary
Conventional TDR testing systems struggle with accurately measuring significantly low impedances below 10 ohms due to reduced signal-to-noise ratio and difficulty distinguishing very low impedances, especially in less sensitive instruments.
A TDR controlled-impedance testing system with ultra-wide traces and ultra-low characteristic impedance, utilizing multilayer PCBs with specialized dielectric materials and copper layers, and a testing channel configured to handle impedances less than 10 ohms, employing ultra-wide traces and balanced stack-ups to maintain low impedance across a wide frequency range.
Enables accurate and sensitive measurements of ultra-low impedances by improving signal transmission and reducing noise interference, allowing for precise impedance characterization in high-frequency applications.
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