Fixed-target sample scanning method and system based on x-ray free electron laser

Abstract

The present application provides a fixed-target sample scanning method and system based on an X-ray free electron laser. The method comprises: acquiring a fixed target sample image of an X-ray free electron laser; performing sample identification on the basis of the fixed target sample image to obtain an identified sample image; acquiring a pulse point of the X-ray free electron laser, and sorting sample coordinates in the identified sample image on the basis of coordinates of the pulse point, to determine a scanning path of a fixed target sample; and performing fixed-point scanning on the fixed target sample on the basis of the scanning path. The present application realizes the identification and fixed-point scanning of a fixed target sample of an X-ray free electron laser, thereby improving the utilization rate, and further improving the experimental efficiency and the quality of data.

Description

Fixed-target sample scanning method and system for X-ray free-electron laser Technical Field

[0001] This application belongs to the field of free-electron laser technology, and in particular relates to a fixed target sample scanning method and system for X-ray free-electron laser. Background Technology

[0002] X-ray free electron lasers (XFELs) are advanced large-scale scientific research devices capable of generating high-brightness, high spatial and temporal resolution X-ray pulses. With their powerful performance and broad application potential, X-ray free electron laser technology is gradually becoming an important tool in scientific research.

[0003] In XFEL experiments, the goal of fixed-target sample scanning is to ensure the sample is within the focal region of the laser beam and to precisely position and manipulate it for multi-angle, multi-position X-ray irradiation, thereby obtaining sufficient sample information for structural analysis. During the experiment, a fixed-target sample transport device is used to place the sample at the focal point of the XFEL pulse. The XFEL pulse irradiates the thin film point by point, and a downstream detector records the diffraction pattern of each pulse. However, this simple periodic point-by-point scanning method leads to random irradiation and a low effective hit rate. Summary of the Invention

[0004] The purpose of this application is to provide a method, system, device and storage medium for scanning fixed target samples using X-ray free electron laser, which can realize the identification and fixed-point scanning of fixed target samples, improve utilization rate while also improving experimental efficiency and data quality.

[0005] In a first aspect, this application provides a method for scanning a fixed target sample using an X-ray free-electron laser, the method comprising:

[0006] Acquire images of a stationary target sample using X-ray free electron laser;

[0007] Sample identification is performed based on the fixed target sample image to obtain a sample identification image;

[0008] The pulse points of the X-ray free electron laser are obtained, and the sample coordinates in the sample identification image are sorted based on the coordinates of the pulse points to determine the scanning path of the fixed target sample.

[0009] The fixed target sample is scanned at specific points based on the scanning path.

[0010] In one implementation of the first aspect, acquiring an image of a stationary target sample using an X-ray free-electron laser includes:

[0011] Acquire images of the appearance of a fixed target sample for X-ray free electron laser;

[0012] The acquired appearance images are stitched together to obtain a complete image of the fixed target sample;

[0013] The complete fixed target sample image is preprocessed to obtain the fixed target sample image.

[0014] In one implementation of the first aspect, sample identification is performed based on the fixed target sample image, and obtaining the sample identification image includes:

[0015] Acquire multiple template images of a fixed target sample;

[0016] The region matching degree between each template image and the fixed target sample image is calculated using a normalized matching method to obtain the sample target box, and the overlapping sample target boxes are filtered based on non-maximum suppression.

[0017] Add the sample target bounding box to the fixed target sample image to obtain the sample recognition image.

[0018] In one implementation of the first aspect, determining the scanning path of the fixed target sample by sorting the coordinates of sample points in the sample recognition image based on the pulse points includes:

[0019] The coordinates of the pulse point are added to the sample recognition image, and the coordinates of the pulse point are used as the original starting point to sort the sample coordinates in the sample recognition image using a nearest neighbor sorting algorithm;

[0020] Two-dimensional scanning coordinate points are obtained based on the sorted sample coordinates to determine the scanning path of the fixed target sample.

[0021] In one implementation of the first aspect, performing point scanning of the fixed target sample based on the scanning path includes:

[0022] Based on the scanning path, the two-dimensional scanning coordinate points are read to move the fixed target sample in two dimensions to achieve fixed-point scanning.

[0023] Secondly, this application provides a fixed target sample scanning system for X-ray free-electron lasers, the system comprising:

[0024] The acquisition module is configured to acquire images of a stationary target sample subjected to X-ray free electron lasers.

[0025] The identification module is configured to perform sample identification based on the fixed target sample image and obtain a sample identification image;

[0026] The path determination module is configured to acquire the pulse points of the X-ray free electron laser, sort the sample coordinates in the sample identification image based on the pulse point coordinates, and determine the scanning path of the fixed target sample.

[0027] The scanning module is configured to perform point scanning of the fixed target sample based on the scanning path.

[0028] In one implementation of the second aspect, the acquisition module is configured as follows:

[0029] Acquire images of the appearance of a fixed target sample for X-ray free electron laser;

[0030] The acquired appearance images are stitched together to obtain a complete image of the fixed target sample;

[0031] The complete fixed target sample image is preprocessed to obtain the fixed target sample image.

[0032] In one implementation of the second aspect, the identification module is configured as follows:

[0033] Acquire multiple template images of a fixed target sample;

[0034] The region matching degree between each template image and the fixed target sample image is calculated using a normalized matching method to obtain the sample target box, and the overlapping sample target boxes are filtered based on non-maximum suppression.

[0035] Add the sample target bounding box to the fixed target sample image to obtain the sample recognition image.

[0036] In one implementation of the second aspect, the path determination module is configured to include:

[0037] The coordinates of the pulse point are added to the sample recognition image, and the coordinates of the pulse point are used as the original starting point to sort the sample coordinates in the sample recognition image using a nearest neighbor sorting algorithm;

[0038] Two-dimensional scanning coordinate points are obtained based on the sorted sample coordinates to determine the scanning path of the fixed target sample.

[0039] In one implementation of the second aspect, the scanning module is configured as follows:

[0040] Based on the scanning path, the two-dimensional scanning coordinate points are read to move the fixed target sample in two dimensions to achieve fixed-point scanning.

[0041] As described above, the fixed target sample scanning method and system for X-ray free electron lasers described in this application have the following beneficial effects: This application realizes the identification and fixed-point scanning of fixed target samples for X-ray free electron lasers, which improves utilization rate, experimental efficiency and data quality, and has wide applications in the field of X-ray free electron laser experiments. Attached Figure Description

[0042] Figure 1A shows a schematic diagram of an application scenario of the fixed target sample scanning method of X-ray free electron laser described in this application.

[0043] Figure 1B shows a schematic diagram of the mid-cloud interaction scenario in these implementation methods.

[0044] Figure 2 shows a flowchart of a fixed target sample scanning method for X-ray free electron lasers according to an embodiment of this application.

[0045] Figure 3 shows a flowchart of a fixed target sample scanning method for X-ray free electron lasers according to an embodiment of this application.

[0046] Figure 4 shows a flowchart of a fixed target sample scanning method for X-ray free electron lasers according to an embodiment of this application.

[0047] Figure 5 shows a schematic diagram of the fixed target sample scanning system of the X-ray free electron laser described in this application in one embodiment. Detailed Implementation

[0048] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. This application can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that, unless otherwise specified, the following embodiments and features in the embodiments can be combined with each other.

[0049] It should be noted that the illustrations provided in the following embodiments are only schematic representations of the basic concept of this application. Therefore, the drawings only show the components related to this application and are not drawn according to the actual number, shape and size of the components in the actual implementation. In the actual implementation, the form, quantity and proportion of each component can be arbitrarily changed, and the layout of the components may also be more complex.

[0050] Furthermore, the use of terms such as "first" and "second" in this application is for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the technical solutions of the various embodiments can be combined with each other, but only on the basis of being achievable by those skilled in the art. If the combination of technical solutions is contradictory or impossible to implement, such a combination of technical solutions should be considered non-existent and not within the scope of protection claimed in this application.

[0051] Fixed-target scanning in XFEL experiments is a highly precise process involving meticulous control and transformation of the sample position, including translation, rotation, and scaling. These operations ensure that the sample is in the correct position with each X-ray pulse irradiation to obtain optimal experimental data. Currently, a simple periodic grid scanning method is commonly used for fixed-target scanning. This method scans within a predetermined area at uniform grid intervals (i.e., a grid). For example, the coordinates of each scan point within a certain area can be arranged according to a specific step size and interval, forming a grid-like scanning path. This scanning method is prone to random irradiation and low effective hit rate, which not only reduces the utilization rate of the fixed-target sample but also affects the efficiency and data quality of XFEL experiments.

[0052] To at least address the aforementioned issues, embodiments of this application provide a fixed target sample scanning method for X-ray free electron lasers, which enables the identification and point-to-point scanning of fixed target samples for X-ray free electron lasers, improving utilization while also enhancing experimental efficiency and data quality.

[0053] In some embodiments, the fixed target sample scanning method for X-ray free electron lasers provided in this application can be applied to the fixed target sample scanning device for X-ray free electron lasers shown in FIG1A. As shown in FIG1A, the fixed target sample scanning device 1 for X-ray free electron lasers includes a processor 11 and a database 12. The fixed target sample scanning method for X-ray free electron lasers provided in this application can be applied to the processor 11.

[0054] In Figure 1A, processor 11 can be a single processor, a processor cluster consisting of multiple processors, or a cloud computing center, etc., and is not limited here. Although only one processor 11 and one database 12 are shown in Figure 1A, it should be understood that the example in Figure 1A is only for understanding this scheme, and the specific number of processors 11 and databases 12 should be flexibly determined according to the actual situation.

[0055] In some other embodiments, the fixed target sample scanning device 1 for X-ray free electron lasers may not include the database 12, but only a processor 11 with storage function. The fixed target sample scanning method for X-ray free electron lasers provided in this application embodiment can be applied to the processor 11. The processor 11 with storage function may include a computer, mobile phone, etc., and is not limited here.

[0056] In some other embodiments, the fixed target sample scanning method of X-ray free electron laser described in this application can be applied to an end-to-cloud interaction scenario. Figure 1B shows a schematic diagram of the structure of an end-to-cloud interaction scenario in these implementations. As shown in Figure 1B, the end-to-cloud interaction system 2 includes a terminal 20 and a cloud server 21. The terminal 20 and the cloud server 21 can communicate with each other, and the communication method is not limited to wired or wireless methods.

[0057] The terminal 20 can be mobile or fixed. For example, it can be a wireless terminal or a wired terminal. A wireless terminal can refer to a device with wireless transceiver capabilities, which can be deployed in the XFEL experimental environment. The terminal 20 can be a mobile phone, a laptop computer, etc., and is not limited thereto. The cloud server 21 can include one or more servers, or one or more processing nodes, or one or more virtual machines running on the server. The cloud server 21 can also be referred to as a server cluster, a management platform, a fixed target sample scanning center for X-ray free electron laser, etc., and is not limited thereto in this embodiment.

[0058] The technical solutions in the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0059] The following embodiments of this application provide a method for scanning a fixed target sample using an X-ray free-electron laser. This method can be implemented, for example, by the processor 11 shown in FIG. 1A or the cloud server 21 shown in FIG. 1B. FIG. 2 shows a schematic flowchart of the method for scanning a fixed target sample using an X-ray free-electron laser according to an embodiment of this application. As shown in FIG. 2, the method for scanning a fixed target sample using an X-ray free-electron laser includes steps S1 to S4.

[0060] S1. Obtain images of the fixed target sample from X-ray free electron laser.

[0061] Specifically, acquiring images of a fixed target sample for an X-ray free electron laser includes: acquiring an external image of the fixed target sample for the X-ray free electron laser; stitching the acquired external image together to obtain a complete image of the fixed target sample; and preprocessing the complete image of the fixed target sample to obtain an image of the fixed target sample with more distinct sample features.

[0062] In some embodiments, a fixed target sample can be photographed using a high-resolution CCD camera or a 3D profilometer to obtain the sample's appearance features as an appearance image. Then, the captured appearance images are stitched together to obtain a complete image of the fixed target sample, including sample coordinate points used for positioning calculations. Furthermore, image denoising and enhancement techniques are applied to preprocess the complete fixed target sample image to make the sample features more prominent and clear, thus obtaining the fixed target sample image.

[0063] S2. Based on the fixed target sample image, perform sample identification to obtain a sample identification image.

[0064] Specifically, Figure 3 shows a flowchart of the fixed target sample scanning method of X-ray free electron laser according to the embodiment of this application. As shown in Figure 3, step S2 includes steps S21 to S23.

[0065] S21. Obtain multiple template images of the fixed target sample.

[0066] In some embodiments, multiple different template images are loaded to represent possible fixed target samples. These templates can be target images at different scales and angles (rotations) to enhance the flexibility of template matching, enabling it to adapt to targets of different positions, orientations, and sizes in the image. Furthermore, to accommodate the different sizes and angles of the target (fixed target sample) in the image, the template images are scaled (at different scales) and rotated (at different angles). This processing improves the accuracy of template matching and increases the likelihood of target detection.

[0067] S22. Calculate the region matching degree between each template image and the fixed target sample image using a normalized matching method to obtain the sample target box, and filter the overlapping sample target boxes based on non-maximum suppression.

[0068] Specifically, a sliding window template matching method is used on the fixed target sample image, and normalized correlation is calculated. That is, the matching degree between each template and different regions in the fixed target sample image is calculated. This method reduces the impact of illumination changes on the matching results by eliminating differences in image brightness. Furthermore, during the matching process, multiple locations and templates may match the target, i.e., there are overlapping sample target boxes. Therefore, the non-maximum suppression (NMS) method is used to filter out repeatedly detected targets (overlapping sample target boxes). That is, among multiple overlapping detection boxes, the detection box with the highest score is retained, and boxes with lower scores or excessive overlap with high-scoring boxes are deleted, thereby removing redundancy.

[0069] S23. Add the sample target bounding box to the fixed target sample image to obtain the sample recognition image.

[0070] Specifically, for the matched regions, target boxes are used to mark them, and these sample target boxes are added to the fixed target sample image to obtain the sample recognition image.

[0071] S3. Obtain the pulse points of the X-ray free electron laser, and sort the sample coordinates in the sample identification image based on the pulse point coordinates to determine the scanning path of the fixed target sample.

[0072] Specifically, Figure 4 shows a flowchart of the fixed target sample scanning method of X-ray free electron laser according to the embodiment of this application. As shown in Figure 4, step S3 includes steps S31 to S32.

[0073] S31. Add the coordinates of the pulse point to the sample recognition image, and use the coordinates of the pulse point as the original starting point to sort the sample coordinates in the sample recognition image using a nearest neighbor sorting algorithm.

[0074] Specifically, XFEL pulse points are marked and added to the sample recognition image. Using the coordinates of these pulse points as the initial starting point, the sample coordinates in the image are sorted using a nearest neighbor sorting algorithm. Nearest Neighbor Sorting is a common sorting method typically used to process coordinate data in two-dimensional or high-dimensional spaces. The core idea of ​​the algorithm is to start from a starting point (usually the coordinates of a pulse point) and progressively select the next point for sorting according to its nearest neighbor until all points have been traversed.

[0075] In some embodiments, the XFEL pulse point is selected as the starting point. Starting from the current point, the Euclidean distance between all unsorted sample coordinate points and the current point is calculated. The point closest to the current point is selected and added to the sorting list. This process is repeated until all sample coordinates are sorted.

[0076] S32. Obtain two-dimensional scanning coordinate points based on the sorted sample coordinates to determine the scanning path of the fixed target sample.

[0077] Furthermore, it is necessary to generate a scanning path for the fixed target sample by determining the scanning order of the samples. This guides the scanning equipment or laser beam to scan various regions of the sample in a reasonable order, thereby ensuring efficient and comprehensive data acquisition. The sorted sample coordinates are then used to calculate the two-dimensional scanning coordinate points of the sample through methods such as coordinate translation, rotation, and scaling, thus determining the scanning path for the fixed target sample.

[0078] In practice, after sorting the sample coordinates, each sample can be directly connected; that is, adjacent samples can be simply connected according to the sorted coordinate order to form a path. Alternatively, path optimization can be considered, using a path planning algorithm to obtain the optimal scanning path. In this case, the scanning path needs to be defined as a series of two-dimensional coordinate points, representing the movement trajectory of the device or the irradiation sequence of the beam during the scanning process.

[0079] S4. Perform fixed-point scanning on the fixed target sample based on the scanning path.

[0080] Specifically, based on the scanning path, the two-dimensional scanning coordinate points are read to move the fixed target sample in two dimensions to achieve fixed-point scanning.

[0081] In some embodiments, a high-precision motor-driven two-dimensional scanning platform can be used as a motion scanning device for a fixed target sample. It achieves precise two-dimensional positional movement of the fixed target sample by reading the two-dimensional scanning coordinate points, and uses XFEL pulses to irradiate the sample point by point, thereby achieving high-precision fixed-point scanning of the fixed target sample and avoiding interference and repeated irradiation between samples.

[0082] Therefore, this application can identify and match multiple targets in the image of the fixed target sample, and plan the scanning path accordingly to avoid interference and repeated irradiation between fixed target samples. This application realizes the identification and point scanning of fixed target samples of X-ray free electron laser, which improves utilization rate, experimental efficiency and data quality.

[0083] The scope of protection for the fixed target sample scanning method of X-ray free electron laser described in this application is not limited to the execution order of the steps listed in this embodiment. Any solution implemented by adding, subtracting, or replacing steps in the prior art based on the principles of this application is included within the scope of protection of this application.

[0084] This application also provides a fixed target sample scanning system for X-ray free electron lasers. The fixed target sample scanning system for X-ray free electron lasers can realize the fixed target sample scanning method for X-ray free electron lasers described in this application. However, the implementation device of the fixed target sample scanning system for X-ray free electron lasers described in this application includes, but is not limited to, the structure of the fixed target sample scanning system for X-ray free electron lasers listed in this embodiment. All structural modifications and substitutions of the prior art made based on the principles of this application are included within the protection scope of this application.

[0085] Figure 5 shows a schematic diagram of the fixed target sample scanning system of the X-ray free electron laser according to an embodiment of this application. As shown in Figure 5, the fixed target sample scanning system 4 of the X-ray free electron laser includes an acquisition module 41, an identification module 42, a path determination module 43, and a scanning module 44.

[0086] Acquisition module 41 is configured to acquire images of a stationary target sample from an X-ray free electron laser.

[0087] The identification module 42 is configured to perform sample identification based on the fixed target sample image and obtain a sample identification image;

[0088] The path determination module 43 is configured to acquire the pulse points of the X-ray free electron laser, sort the sample coordinates in the sample recognition image based on the coordinates of the pulse points, and determine the scanning path of the fixed target sample.

[0089] The scanning module 44 is configured to perform point scanning on the fixed target sample based on the scanning path.

[0090] The acquisition module 41 is configured as follows:

[0091] An external image of a fixed target sample subjected to X-ray free electron laser is acquired; the acquired external images are stitched together to obtain a complete image of the fixed target sample; the complete image of the fixed target sample is preprocessed to obtain the final image of the fixed target sample. The final image of the fixed target sample exhibits more distinct and clear sample features.

[0092] The identification module 42 is configured as follows:

[0093] Multiple template images of a fixed target sample are acquired; the region matching degree between each template image and the fixed target sample image is calculated using a normalized matching method to obtain the sample target box, and overlapping sample target boxes are filtered based on non-maximum suppression; the sample target box is added to the fixed target sample image to obtain the sample recognition image.

[0094] The path determination module 43 is configured to include:

[0095] The coordinates of the pulse point are added to the sample recognition image, and the coordinates of the pulse point are used as the original starting point to sort the sample coordinates in the sample recognition image using a nearest neighbor sorting algorithm; based on the sorted sample coordinates, two-dimensional scanning coordinate points are obtained to determine the scanning path of the fixed target sample.

[0096] The scanning module 44 is configured as follows:

[0097] Based on the scanning path, the two-dimensional scanning coordinate points are read to move the fixed target sample in two dimensions to achieve fixed-point scanning.

[0098] It should be noted that the structure and principle of the acquisition module 41, the identification module 42, the path determination module 43 and the scanning module 44 correspond one-to-one with the steps in the fixed target sample scanning method of X-ray free electron laser described above, so they will not be described in detail here.

[0099] In the embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, or methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of modules / units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple modules or units may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection of apparatuses or modules or units may be electrical, mechanical, or other forms.

[0100] The modules / units described as separate components may or may not be physically separate. The components shown as modules / units may or may not be physical modules; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules / units can be selected to achieve the objectives of the embodiments of this application, depending on actual needs. For example, the functional modules / units in the various embodiments of this application may be integrated into one processing module, or each module / unit may exist physically separately, or two or more modules / units may be integrated into one module / unit.

[0101] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0102] The descriptions of the processes or structures corresponding to the above figures each have their own emphasis. For parts of a process or structure that are not described in detail, please refer to the relevant descriptions of other processes or structures.

[0103] The above embodiments are merely illustrative of the principles and effects of this application and are not intended to limit this application. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of this application. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in this application should still be covered by the claims of this application.

Claims

1. A method for scanning a fixed target sample using an X-ray free-electron laser, characterized in that, The method includes: Acquire images of a stationary target sample using X-ray free electron laser; Sample identification is performed based on the fixed target sample image to obtain a sample identification image; The pulse points of the X-ray free electron laser are obtained, and the sample coordinates in the sample identification image are sorted based on the coordinates of the pulse points to determine the scanning path of the fixed target sample. The fixed target sample is scanned at specific points based on the scanning path.

2. The fixed target sample scanning method of X-ray free electron laser according to claim 1, characterized in that, Obtaining images of a stationary target sample for X-ray free-electron laser includes: Acquire images of the appearance of a fixed target sample for X-ray free electron laser; The acquired appearance images are stitched together to obtain a complete image of the fixed target sample; The complete fixed target sample image is preprocessed to obtain the fixed target sample image.

3. The fixed target sample scanning method of X-ray free-electron laser according to claim 1, characterized in that, Sample identification based on the fixed target sample image includes obtaining the sample identification image as follows: Acquire multiple template images of a fixed target sample; The region matching degree between each template image and the fixed target sample image is calculated using a normalized matching method to obtain the sample target box, and the overlapping sample target boxes are filtered based on non-maximum suppression. Add the sample target bounding box to the fixed target sample image to obtain the sample recognition image.

4. The fixed target sample scanning method of X-ray free electron laser according to claim 1, characterized in that, Sort the sample coordinates in the sample recognition image based on the coordinates of the pulse points to determine the scanning path of the fixed target sample, including: The coordinates of the pulse point are added to the sample recognition image, and the coordinates of the pulse point are used as the original starting point to sort the sample coordinates in the sample recognition image using a nearest neighbor sorting algorithm; Two-dimensional scanning coordinate points are obtained based on the sorted sample coordinates to determine the scanning path of the fixed target sample.

5. The fixed target sample scanning method of X-ray free electron laser according to claim 4, characterized in that, Performing point-to-point scanning of the fixed target sample based on the scanning path includes: Based on the scanning path, the two-dimensional scanning coordinate points are read to move the fixed target sample in two dimensions to achieve fixed-point scanning.

6. A fixed target sample scanning system using an X-ray free-electron laser, characterized in that, The system includes: The acquisition module is configured to acquire images of a stationary target sample subjected to X-ray free electron lasers. The identification module is configured to perform sample identification based on the fixed target sample image and obtain a sample identification image; The path determination module is configured to acquire the pulse points of the X-ray free electron laser, sort the sample coordinates in the sample identification image based on the coordinates of the pulse points, and determine the scanning path of the fixed target sample. The scanning module is configured to perform point scanning of the fixed target sample based on the scanning path.

7. The fixed target sample scanning system for X-ray free-electron lasers according to claim 6, characterized in that, The acquisition module is configured as follows: Acquire images of the appearance of a fixed target sample for X-ray free electron laser; The acquired appearance images are stitched together to obtain a complete image of the fixed target sample; The complete fixed target sample image is preprocessed to obtain the fixed target sample image.

8. The fixed target sample scanning system for X-ray free-electron lasers according to claim 6, characterized in that, The identification module is configured as follows: Acquire multiple template images of a fixed target sample; The region matching degree between each template image and the fixed target sample image is calculated using a normalized matching method to obtain the sample target box, and the overlapping sample target boxes are filtered based on non-maximum suppression. Add the sample target bounding box to the fixed target sample image to obtain the sample recognition image.

9. The fixed target sample scanning system for X-ray free-electron lasers according to claim 6, characterized in that, The path determination module is configured to include: The coordinates of the pulse point are added to the sample recognition image, and the coordinates of the pulse point are used as the original starting point to sort the sample coordinates in the sample recognition image using a nearest neighbor sorting algorithm; Two-dimensional scanning coordinate points are obtained based on the sorted sample coordinates to determine the scanning path of the fixed target sample.

10. The fixed target sample scanning system for X-ray free-electron lasers according to claim 9, characterized in that, The scanning module is configured as follows: Based on the scanning path, the two-dimensional scanning coordinate points are read to move the fixed target sample in two dimensions to achieve fixed-point scanning.

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