1.-3. Measuring device for x-ray emission spectrochemical analysis

WO244170SActive Publication Date: 2025-02-21RIGAKU CORP
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Patent Information

Application Number
WO244170
Authority / Receiving Office
WO · WO
Patent Type
Designs
Current Assignee / Owner
Priority Date
2024-06-25
Filing Date
2024-11-27
Publication Date
2025-02-21
Estimated Expiration
2044-11-27

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Abstract

1. The ornamental design for a measuring device for x-ray emission spectrochemical analysis, as shown and described; in a front perspective view, the thin lines shown on the edges in the reproduction are not lines that represent a pattern, but lines that represent the shape of a three-dimensional surface; in a reference view 1.10 showing a translucent part, the part colored withlight black has translucency; 1.9: enlarged cross-sectional view taken along the C-C line in the top plan view for the portion defined by the A-A line in the front view and the B-B line in the top plan view.; 2. The ornamental design for a measuring device for x-ray emission spectrochemical analysis, as shown and described; parts shown by solid lines are the parts for which protection is sought; in a front perspective view, the thin lines shown on the edges in the reproduction are not lines that represent a pattern, but lines that represent the shape of a three-dimensional surface; in each figure, dash-dotted lines indicate only a boundary between the part for which protection is sought and other parts.; 3. The ornamental design for a measuring device for x-ray emission spectrochemical analysis, as shown and described; parts shown by solid lines are parts for which protection is sought; in a front perspective view, the thin lines shown on the edges in the reproduction are not lines that represent a pattern, but lines that represent the shape of a three-dimensional surface; in each figure, dash-dotted lines indicate only a boundary between the part for which protection is sought and other parts; in a reference view 3.12 showing a transparent part, the part colored with light black has transparency; 3.9: enlarged cross-sectional view taken along the B-B line in the top plan view for the portion defined by the A-A line in the front view and the E-E line in the top plan view; 3.10: enlarged cross-sectional view taken along the C-C line in the top plan view for the portion defined by the A-A line in the front view and the E-E line in the top plan view; 3.11: enlarged cross-sectional view taken along the A-A line in the front view and the F-F line in the top plan view; 3.13 is a reference view showing that a glove can be attached to the hole provided in the transparent part when using the measuring device for x-ray emission spectrochemical analysis that is this article and forms no part of the claimed design.
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