Electrical Testing TRIZ Cases
- Oscillator Circuit for Battery Aging Status Determination
Self-powered oscillator circuits determine battery aging via time-dependent voltage changes, eliminating complex laboratory equipment requirements.
- Angle Sensor Correction Using Adaptive Signal Processing
A correction apparatus for angle sensors uses adaptive signal processing to reduce angular errors in detection signals.
- Battery Capacity Detection Using Delta V Over Delta C Ratio
Algorithm calculates voltage to capacity ratio changes for accurate battery state monitoring.
- Back Gate Tuning Circuits for Random Telegraph Noise Reduction
A back gate tuning circuit applies voltage to deactivate traps within an insulating layer of semiconductor devices.
- Storage Battery Diagnosis via dV/dt Peak Separation
A calculation device differentiates total voltage to separate characteristic peaks for individual batteries.
- Battery SOC Estimation Using Voltage Recovery Slope Monitoring
A battery state of charge estimation method monitors voltage recovery slope to enable rapid open-circuit voltage measurement.
- Probe Position Inspection Using Transparent Plate and Camera
Transparent plate and camera detect probe contact position, eliminating deformable body regeneration to improve inspection accuracy.
- Battery Pack Full-Charge Capacity Estimation via Dynamic Voltage Curves
Dynamic voltage curves enable accurate full-charge capacity estimation for battery cells without requiring static rest periods.
- Capacitive ECG Sensor with Active Shielding for X-Ray Transparency
A capacitive ECG sensor uses a layered thin film structure with an active shielding layer to detect bioelectrical signals.
- Communication Circuitry Integrity Assessment via Reduced Voltage Testing
Reduced differential voltage test signals expose weak connections in wire harnesses that standard levels miss, enabling proactive maintenance.
- Probe Socket Conductive Plate Parallel Pin Redundancy
Conductive plate electrically connects power and ground pins in parallel within a probe socket support block.
- Lithium Sulfur Battery State of Charge Estimation via Memory Effect Compensation
A lithium sulfur battery model predicts electrical characteristics using a memory effect module and Kalman filtering for accurate state estimation.
- Control Apparatus Sensor Failure Compensation
A control apparatus calculates a tentative target value and correction value to maintain system operation.
- Battery Capacity Display Using Dynamic OCV-SOC Curve Calibration
A battery management system generates an open circuit voltage state of charge curve to display capacity accurately.
- Current Circuit Breaker Bypass Reduces Semiconductor Count
A current circuit breaker bypasses fault currents using fast switches and a surge arrester to protect semiconductor modules.
- Scan Flip-Flop Loopback Circuit for Memory Test Routing
A scan flip-flop circuit loops data directly between stages to bypass memory during capture.
- Masking Scan Chain Outputs for IC Testing
Dynamic masking of unknown values in compressed scan chains improves fault coverage while maintaining data bandwidth efficiency.
- Battery Cell Capacity Loss Detection via Size Expansion
A measuring unit detects battery cell size expansion during charge cycles to determine capacity loss using specific expansion profiles.
- Battery Model Using Taylor Series for Dynamic Parameter Estimation
A mathematical battery model uses Taylor series expansions to approximate time-varying circuit parameters.
- Semiconductor Equipment Breakdown Assessment via Process Flow Trend Analysis
A measurement device captures process flows and sensing data to generate local features for automated equipment breakdown status determination.
- Clock Control Circuitry for Dynamic Test Pulse Selection
Clock control circuitry selects one or two clock pulses based on polarity requirements, resolving the trade-off between test time and defect coverage.
- Battery Sensing Voltage Controller for High Current Safety
A dedicated sense FET isolates voltage measurement from power switching, resolving the contradiction between rapid charging speeds and safe battery operation.
- Magnetic Field Structure With Vertical Optical Positioning
Vertical optical positioning eliminates spatial collision and angular parallax during strong magnetic field semiconductor testing.